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Introduction
Objective
1 | Page
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
Cystallograpic
Determination
SAMPLE 1
Measurement Conditions:
Dataset Name
5
Goniometer=PW3050/60 (Theta/Theta); Minimum step
size 2Theta:0.001; Minimum step size Omega:0.001
Sample stage=Reflection-Transmission Spinner
PW3064/60; Minimum step size Phi:0.1
Measurement Date / Time 11/9/2016 10:42:11 AM
Scan Axis
Gonio
Start Position [2Th.]
20.0066
End Position [2Th.]
79.9886
Step Size [2Th.]
0.0130
Scan Step Time [s]
38.8871
Scan Type
Continuous
PSD Mode
Scanning
PSD Length [2Th.]
3.35
Offset [2Th.]
0.0000
Divergence Slit Type
Automatic
Irradiated Length [mm]
10.00
Specimen Length [mm]
10.00
Measurement Temperature [C] 25.00
Anode Material
Cu
K-Alpha1 []
1.54060
Generator Settings
40 mA, 45 kV
Diffractometer Type
0000000011059259
Diffractometer Number
0
Goniometer Radius [mm] 240.00
Dist. Focus-Diverg. Slit [mm]
100.00
Incident Beam Monochromator No
Spinning
Yes
2 | Page
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
20000
10000
0
30
40
50
60
Position [2Theta]
Peak List:
Pos.
[2Th.]
43.3617
50.4206
74.1234
Height
[cts]
20234.01
7378.70
3545.32
FWHM [2Th.]
0.2303
0.2047
0.1872
d-spacing
[]
2.08507
1.80846
1.27813
Rel. Int.
[%]
100.00
36.47
17.52
Pattern List:
Document History:
Default properties:
- Measurement step axis = "None"
- Internal wavelengths used from anode material: Copper (Cu)
- Original K-Alpha1 wavelength = "1.54060"
- Used K-Alpha1 wavelength = "1.54060"
- Original K-Alpha2 wavelength = "1.54443"
- Used K-Alpha2 wavelength = "1.54443"
- Original K-Beta wavelength = "1.39225"
- Used K-Beta wavelength = "1.39225"
- Incident beam monochromator = "No"
- Fixed div. slit size = "1.00000"
- Receiving slit size = "0.10000"
3 | Page
T H A PA R U N I V E R S I T Y
70
X - r a y d i ff r a c t i o n E x p e r i m e n t
Strip K-Alpha2:
- Method = "Rachinger"
- Intensity ratio = "0.50"
- Delta wavelength ratio = "0.000000"
- Modification time = "2/1/2006"
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
2*theta
theta
Sin2(theta)
Ratio
of
Sin2(theta)
Approx.
whole
number
43.3617
21.68085
0.976121
3.0000
50.4206
25.21
03
37.06
17
0.001503
3.9879
0.098181
7.9838
74.1234
4
8
FCC:-
3 : 4 : 8 : 11 : 12 : 16 : 19
sample-1
experimental error
5 | Page
T H A PA R U N I V E R S I T Y
crystal
is a
X - r a y d i ff r a c t i o n E x p e r i m e n t
SAMPLE 2
Measurement Conditions: (Bookmark 1)
Dataset Name
Chalk
Goniometer=PW3050/60 (Theta/Theta); Minimum step
size 2Theta:0.001; Minimum step size Omega:0.001
Sample stage=Reflection-Transmission Spinner
PW3064/60; Minimum step size Phi:0.1
Diffractometer system=XPERT-PRO
Creation date=2/5/2010 5:38:09 PM
Measurement Date / Time 11/9/2016 11:17:38 AM
Raw Data Origin
XRD measurement (*.XRDML)
Scan Axis
Gonio
Start Position [2Th.]
15.0066
End Position [2Th.]
79.9936
Step Size [2Th.]
0.0130
Scan Step Time [s]
38.8852
Scan Type
Continuous
PSD Mode
Scanning
PSD Length [2Th.]
3.35
Offset [2Th.]
0.0000
Divergence Slit Type
Automatic
Irradiated Length [mm]
10.00
Specimen Length [mm]
10.00
Measurement Temperature [C] 25.00
Anode Material
Cu
K-Alpha1 []
1.54060
Generator Settings
40 mA, 45 kV
Diffractometer Type
0000000011059259
Diffractometer Number
0
Goniometer Radius [mm] 240.00
Dist. Focus-Diverg. Slit [mm]
100.00
Incident Beam Monochromator No
Spinning
Yes
6 | Page
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
Counts
Chalk
6000
4000
2000
0
20
30
40
50
60
70
Position [2Theta]
Height
[cts]
363.56
FWHM [2Th.]
0.3070
d-spacing
[]
3.84068
Rel. Int.
[%]
6.85
29.4737
36.0446
39.4943
43.2185
47.5656
48.5707
56.6211
57.4462
64.6842
65.6499
73.0341
5304.41
737.59
1073.60
859.29
981.23
993.25
159.48
407.04
253.81
152.96
115.85
0.1535
0.1791
0.2047
0.2047
0.2047
0.2303
0.2558
0.3070
0.3070
0.2558
0.4992
3.02815
2.48976
2.27987
2.09165
1.91013
1.87293
1.62425
1.60286
1.43988
1.42102
1.29449
100.00
13.91
20.24
16.20
18.50
18.73
3.01
7.67
4.78
2.88
2.18
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
2*the
Sin2(th
theta
ta
eta)
Ratio
2
Sin (theta)
of
Approx.
whole
number
23.13
98
29.47
37
36.04
46
39.49
43
43.21
85
47.56
56
48.57
07
11.569
9
14.736
85
18.022
3
19.747
15
21.609
25
23.782
8
24.285
35
0.70485
9
0.68147
4
0.54180
9
0.61125
7
0.13889
3
0.95201
1
0.56183
4
3.0000
3
4.8260
5
7.1388
7
8.5137
8
10.1149
10
12.1286
12
12.6153
FCC:-
3 : 4 : 8 : 11 : 12 : 16 : 19
sample-2
crystal
is a
9 | Page
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
SAMPLE 3
Measurement Conditions: (Bookmark 1)
Dataset Name
1
File name
C:\Users\Dell\Desktop\1.xrdml
Comment
Configuration=Spinner Reflection-Transmission,
Owner=User-1, Creation date=6/25/2009 11:03:49 AM
Goniometer=PW3050/60 (Theta/Theta); Minimum step
size 2Theta:0.001; Minimum step size Omega:0.001
Sample stage=Reflection-Transmission Spinner
PW3064/60; Minimum step size Phi:0.1
Diffractometer system=XPERT-PRO
Measurement program=Thapar_Spinner Stage,
Owner=User-1, Creation date=2/5/2010 5:38:09 PM
Measurement Date / Time 11/9/2016 11:01:45 AM
Operator
Administrator
Raw Data Origin
XRD measurement (*.XRDML)
Scan Axis
Gonio
Start Position [2Th.]
15.0066
End Position [2Th.]
79.9936
Step Size [2Th.]
0.0130
Scan Step Time [s]
38.8852
Scan Type
Continuous
PSD Mode
Scanning
PSD Length [2Th.]
3.35
Offset [2Th.]
0.0000
Divergence Slit Type
Automatic
Irradiated Length [mm]
10.00
Specimen Length [mm]
10.00
Measurement Temperature [C] 25.00
Anode Material
Cu
K-Alpha1 []
1.54060
Generator Settings
40 mA, 45 kV
Diffractometer Type
0000000011059259
Diffractometer Number
0
Goniometer Radius [mm] 240.00
Dist. Focus-Diverg. Slit [mm]
100.00
Incident Beam Monochromator No
Spinning
Yes
10 | P a g e
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
Counts
8000
6000
4000
2000
0
20
30
40
50
60
Position [2Theta]
Height
[cts]
7091.19
3807.97
1604.94
1559.67
FWHM [2Th.]
0.2303
0.2558
0.2303
0.3432
d-spacing
[]
2.33804
2.02523
1.43274
1.22127
Rel. Int.
[%]
100.00
53.70
22.63
21.99
T H A PA R U N I V E R S I T Y
70
X - r a y d i ff r a c t i o n E x p e r i m e n t
12 | P a g e
T H A PA R U N I V E R S I T Y
X - r a y d i ff r a c t i o n E x p e r i m e n t
theta
ta
38.47
24
44.71
09
65.04
63
78.20
87
19.236
2
22.355
45
32.523
15
39.104
35
Sin2(th
Ratio
eta)
Sin2(theta)
number
0.14219
1
0.12694
7
3.0000
of
Approx.
3.9983
7.9890
whole
0.80006
10.9951
11
0.97284
FCC:-
3 : 4 : 8 : 11 : 12 : 16 : 19
sample-3
experimental error
13 | P a g e
T H A PA R U N I V E R S I T Y
crystal
is a