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GATE 2017 Online Test Series Schedule ECE EE ME CE Mock Test ...

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http://onlinetestseriesmadeeasy.in/GATE2017/Electronics-Engineering-ECE

Test

Time Table - EC
EC

CE

ME

EE

CS

IN

PI

GATE 2017 Online Test Series : Electronics & Communication Engineering

Tests Test Activation Date Test Closing Date

Test Syllabus

No. of Ques. Marks Timing Negative Marks

Basic Level Test - 1 : Part Syllabus

Networks

33

50

90 min

1/3 Marks

Basic Level Test - 2 : Part Syllabus

Control Systems

33

50

90 min

1/3 Marks

1- Aug - 2016

12 - Feb - 2017

Basic Level Test - 3 : Part Syllabus

Electronic Devices

33

50

90 min

1/3 Marks

Basic Level Test - 4 : Part Syllabus

Engineering Mathematics

33

50

90 min

1/3 Marks

Basic Level Test - 5 : Part Syllabus

Electromagnetics

33

50

90 min

1/3 Marks

Basic Level Test - 6 : Part Syllabus

General Aptitude

33

50

90 min

1/3 Marks

Basic Level Test - 7 : Part Syllabus

Signals & Systems

33

50

90 min

1/3 Marks

Basic Level Test - 8 : Part Syllabus

Analog Communication Systems

33

50

90 min

1/3 Marks

Basic Level Test - 9 : Part Syllabus

Digital Communication Systems

33

50

90 min

1/3 Marks

Basic Level Test - 10 : Part Syllabuss

Digital Electronics

33

50

90 min

1/3 Marks

16- Aug - 2016

12 - Feb - 2017

10
1- Sep - 2016

Quick Enquiry

Test Type

12 - Feb - 2017

11

Basic Level Test - 11: Part Syllabus

Analog Electronics

33

50

90 min

1/3 Marks

12

Basic Level Test - 12: Part Syllabus

Microprocessors

33

50

90 min

1/3 Marks

13

Basic Level Test - 13: Full Syllabus

Full Syllabus Test-1

65

100

180 min

1/3 Marks

14

Basic Level Test - 14: Full Syllabus

Full Syllabus Test-2

65

100

180 min

1/3 Marks

Basic Level Test - 15: Full Syllabus

Full Syllabus Test-3

65

100

180 min

1/3 Marks

16

Basic Level Test - 16: Full Syllabus

Full Syllabus Test-4

65

100

180 min

1/3 Marks

17

Advance Level Test - 1 : Part Syllabus

Networks

33

50

90 min

1/3 Marks

16- Sep - 2016

12 - Feb - 2017

15

18

Advance Level Test - 2 : Part Syllabus

Control Systems

33

50

90 min

1/3 Marks

19

Advance Level Test - 3 : Part Syllabus

Electronic Devices

33

50

90 min

1/3 Marks

20

Advance Level Test - 4 : Part Syllabus

Engineering Mathematics

33

50

90 min

1/3 Marks

21

Advance Level Test - 5 : Part Syllabus

Electromagnetics

33

50

90 min

1/3 Marks

22

Advance Level Test - 6 : Part Syllabus

General Aptitude

33

50

90 min

1/3 Marks

1- Oct - 2016

16- Oct - 2016

12 - Feb - 2017

12 - Feb - 2017

23

Advance Level Test - 7 : Part Syllabus

Signals & Systems

33

50

90 min

1/3 Marks

24

Advance Level Test - 8 : Part Syllabus

Analog Communication Systems

33

50

90 min

1/3 Marks

25

Advance Level Test - 9 : Part Syllabus

Digital Communication Systems

33

50

90 min

1/3 Marks

26

Advance Level Test - 10 : Part Syllabuss

Digital Electronics

33

50

90 min

1/3 Marks

27

Advance Level Test - 11: Part Syllabus

Analog Electronics

33

50

90 min

1/3 Marks

28

Advance Level Test - 12: Part Syllabus

Microprocessors

33

50

90 min

1/3 Marks

29

Advance Level Test - 13: Full Syllabus

Full Syllabus Test-1

65

100

180 min

1/3 Marks

Advance Level Test - 14: Full Syllabus

Full Syllabus Test-2

65

100

180 min

1/3 Marks

1- Nov - 2016

12 - Feb - 2017

30
16- Nov - 2016

12 - Feb - 2017

31

Advance Level Test - 15: Full Syllabus

Full Syllabus Test-3

65

100

180 min

1/3 Marks

32

Advance Level Test - 16 : Full Syllabus

Full Syllabus Test-4

65

100

180 min

1/3 Marks

Candidate should upload their GATE 2017 admit card to access below mention tests
33
34
35
36

After
availability
of GATE - 2017
Admit Card

GATE Mock Test - 1 : Full Syllabus

GATE Mock Test 1

65

100

180 min

1/3 Marks

GATE Mock Test - 2 : Full Syllabus

GATE Mock Test 2

65

100

180 min

1/3 Marks

GATE Mock Test - 3 : Full Syllabus

GATE Mock Test 3

65

100

180 min

1/3 Marks

GATE Mock Test - 4 : Full Syllabus

GATE Mock Test 4

65

100

180 min

1/3 Marks

12/10/2016 1:13 PM

GATE 2017 Online Test Series Schedule ECE EE ME CE Mock Test ...

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http://onlinetestseriesmadeeasy.in/GATE2017/Electronics-Engineering-ECE

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Practice Test Series (30 Tests)

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Network Theory- Part 1

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2014. ALL RIGHTS RESERVED: MADE EASY.
1

Practice Test-1

Network solution methods: nodal and mesh analysis;

Network theorems: superposition, Thevenin and Nortons,
maximum power transfer; Wye-Delta transformation.

Network Theory- Part 2

Practice Test-2

Practice Test-3

Time domain analysis of simple linear circuits; Solution of

network equations using Laplace transform; Frequency
domain analysis of RLC circuits.

Practice Test-4

Linear 2-port network parameters: driving point and

transfer functions; State equations for networks.

Practice Test-5

Steady state sinusoidal analysis using phasors.

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

16

25

45 min

1/3 Marks

Network Theory- Part 3

Network Theory- Part 4

Signals & Systems- Part 1

LTI systems: definition and properties, causality, stability,
impulse response, convolution, poles and zeros, parallel
and cascade structure, frequency response, group delay,
phase delay.

Signals & Systems- Part 2

6

20- Aug - 2016

12 - Feb - 2017

Practice Test-6

Sampling theorem and applications; Continuous-time

signals: Fourier series and Fourier transform
representations.

Practice Test-7

Discrete-time signals: discrete-time Fourier transform

(DTFT), DFT, FFT. Ztransform, interpolation of
discrete-time signals. Digital filter design techniques.

Signals & Systems- Part 3

7

Electronic Devices - Part 1

Energy bands in intrinsic and extrinsic silicon; Carrier
transport: diffusion current, drift current, mobility and
resistivity; Generation and recombination of carriers;
Poisson and continuity equations; P-N junction, Zener
diode. LED, photo diode and solar cell.

Practice Test-8

Practice Test-9

10

Practice Test-10

11

Practice Test-11

BJT biasing, bias stability; Small signal equivalent circuits

of BJTs. Single-stage BJT amplifiers, Mid-frequency small
signal analysis and frequency response.

12

Practice Test-12

FET biasing; Small signal equivalent circuits of FET.

Single-stage FET amplifiers. Amplifiers: multi-stage,
feedback, power.

13

Practice Test-13 filters; Sinusoidal oscillators: criterion for oscillation, single-

Quick Enquiry

Electronic Devices- Part 2

BJT, MOS capacitor, MOSFET. Integrated circuit
fabrication process: oxidation, diffusion, ion implantation,
photolithography and twin-tub CMOS process.

Analog Circuits - Part 1

Simple diode circuits: clipping, clamping and rectifiers.
Voltage reference circuits; Power supplies: ripple removal
and regulation. Wave-shaping circuits. Small signal
equivalent circuits of diodes.

Analog Circuits - Part 2

Analog Circuits - Part 3

Analog Circuits - Part 4

Operational amplifier; Simple op-amp circuits; Active

transistor and op-amp configurations; Function generators,

555 timers, differential amplifier.

Digital Circuits- Part 1

14

Practice Test-14

15

Practice Test-15

Number systems; Combinatorial circuits: Boolean algebra,

minimization of functions using Boolean identities and
Karnaugh map, logic gates and their static CMOS
implementations, arithmetic circuits, code converters,
multiplexers, decoders and PLAs.

Digital Circuits- Part 2

15- Sep - 2016

12 - Feb - 2017

Sequential circuits: latches and flip-flops, counters, shiftregisters and finite state machines; Data converters:
sample and hold circuits, ADCs and DACs;
Semiconductor memories: ROM, SRAM, DRAM.

Microprocessor
16

Practice Test-16

8-bit microprocessor (8085): architecture, programming,

memory and I/O interfacing.

17

Practice Test-17

Basic control system components; Feedback principle;

Transfer function; Block diagram representation; Signal
flow graph.

18

Control Systems - Part 2

Practice Test-18 Transient and steady-state analysis of LTI systems. Routh-

Control Systems - Part 1

Hurwitz. Root-locus plots.

Control Systems - Part 3

Lag, lead and lag-lead compensation; Frequency

12/10/2016 1:13 PM