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Identification of Crystal
Theory of diffraction of X-rays.
Powder and single crystal X-ray methods
Output of X-ray diffraction
Structure Determination
The peak intensities of the various reflections in an X-ray diffraction
experiment are controlled by atom types and their distribution in the unit
cell. Measurement of these intensities allows the crystallographer to work
out the structure of the crystalline material which produced them.
Principle of XRD
X-Ray beams collide with a solid and interaction
with electrons of the particular solid takes place.
Interference is possible when the wavelength of
the incoming X-ray is comparable to the
separation between the atoms.
When an ordered array of scattering centres are
present, the reflected X-rays will show
interference maxima and minima. Typical
wavelengths used for X-ray experiments lie
between 0.6 and 1.9.
Principle of XRD
Braggs Law
n 2d sin
For CUBIC structures we can now show that:
Mineral identification
Determination of Unit Cell
Parameters
Modal (phase percentage)
Analysis
Crystal Structure Determination
Thin Film-
n 2d sin
Example of XRD
Cu
Example of XRD