OPTICAL FREQUENCY DOMAIN REFLECTOMETER FOR CHARACTERIZATION OF OPTICAL NETWORKS AND
DEVICES
B. Huttner, B. Gisin, O. Guinnard and N. Gisin (1)
R. Passy and J.P. von der Weid (2) (1) Group of Applied Physics University of Geneva 20 Rue de L'Ecole de Medecine, CH1211, Geneva 4, Switzerland (2) Center for Telecommunication Studies Pontificia Universidade Catolica do Rio de Janeiro Rua Marques de Sao Vincente 225, Rio de Janeiro, 22453-900 Brazil
High resolution optical frequency domain reflectometry for characterization of components
and assemblies Brian J. Soller, Dawn K. Gifford, Matthew S.Wolfe and Mark E. Froggatt Luna Technologies Incorporated, 2020 Kraft Drive Suite 2000 Blacksburg, VA 24060
Experimental investigations of coherent optical-frequency domain reflectometry
K. Yksel1, M. Wuilpart1, and P. Mgret1 1 Faculty of Engineering, Mons, Electromagnetism and Telecommunication Department, Boulevard Dolez 31, 7000-BE Mons, Belgium
Handbook of Optoelectronics, Second Edition - Applied Optical Electronics (Volume Three) (Series in Optics and Optoelectronics) (Volume 3) (PDFDrive) PDF