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Assignment -1
ECE 442
Q.1
Plot the Current Voltage (I-V) characteristic of the following p-n structure
using ATLAS.
Also plot the Electric field for the p-n junction at both forward and reverse
biases.
Q.2
a) 300K
b) 350K
c) 400K
d) 450 K
350
400
450
a) 300K
b) 350K
c) 400K
d) 450 K
Fig. 8 Breakdown Voltage
350
400
450
Q.3
record the change in built-in potential. Do the same with changing the
doping concentration of n-region. Plot Vbi
vs NAND. Compare the simulation results with theoretical results.
a) 1e14
b) 1e16
c) 1e20
d) 1e22
NA
1e14
1e16
1e20
1e22
NB
1e16
1e16
1e16
1e16
Vib(calculated)
0.538
0.644
0.855
1.09
Vib(simulated)
0.2
0.5
0.7
0.8
Error
0.38
0.144
0.155
0.161
a) 1e14
b) 1e16
c) 1e20
d) 1e22
NA
1e17
1e17
1e17
1e17
NB
1e14
1e16
1e20
1e22
Vib(calculated)
0.591
0.697
0.908
1.01
Vib(simulated)
0.4
0.625
0.8
0.825
Error
0.191
0.072
0.108
0.185
Q.4. What is the breakdown voltage of this structure? What change do you
observe in the
breakdown voltage if you insert a 5 micron intrinsic layer in between the P
and N region of the
same device? Give analytical explanation of your observation.
Fig. 11
Breakdown voltage of the structure increases by adding intrinsic layer in between P
and N region. The new value of breakdown voltage is 110 V.
Analytical Explanation
Breakdown Voltage (PIN) > Breakdown Voltage (PN)
In a PIN diode, the depletion region exists almost completely within the
intrinsic region. This depletion region is much larger than in a PN diode.
High breakdown voltage: Thus, the wide depletion layer caused by the
intrinsic layer ensures that PIN diodes have a high reverse breakdown
characteristic