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IPC/JEDEC-9702
Monotonic Bend Characterization
of Board-Level Interconnects
IPC/JEDEC-9702
June 2004
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IPC/JEDEC-9702
ASSOCIATION CONNECTING
ELECTRONICS INDUSTRIES
Monotonic Bend
Characterization
of Board-Level
Interconnects
JEDEC
Solid State Technology Association
2500 Wilson Boulevard
Arlington, VA 22201-3834
Tel 703 907.7559
Fax 703 907.7583
June 2004
IPC/JEDEC-9702
Acknowledgment
Members of the JEDEC Reliability Test Methods for Packaged Devices Committee (JC-14.1) and the SMT Attachment
Reliability Test Methods Task Group (6-10d) of the Product Reliability Committee (6-10) have worked together to develop
this document. We would like to thank them for their dedication to this effort. Any document involving a complex technology draws material from a vast number of sources. While the principal members of the SMT Attachment Reliability Test
Methods Task Group are shown below, it is not possible to include all of those who assisted in the evolution of this standard. To each of them, the members of the JEDEC and IPC extend their gratitude.
Product Reliability
Committee
Chair
Reza Ghaffarian, Ph.D.
Jet Propulsion Laboratory
Chair
Jack McCullen
Intel Corporation
Chair
Reza Ghaffarian, Ph.D.
Jet Propulsion Laboratory
Vice-Chair
Werner Engelmaier
Engelmaier Associates, L.C.
Peter Bigelow
IMI Inc.
Sammy Yi
Flextronics International
SMT Attachment Reliability Test Methods Task Group
IPC/JEDEC-9702
June 2004
Table of Contents
1
FOREWORD ............................................................. 1
ANNEX A
...................................................................... 9
INTRODUCTION ....................................................... 1
ANNEX B
.................................................................... 12
SCOPE ...................................................................... 1
SAMPLING ................................................................ 2
APPARATUS ............................................................. 2
Figures
Figure 7-1
Figure 8-1
Figure 8-2
Figure 8-3
Figure 8-4
7.1
7.2
Figure 9-1
7.3
Figure A.1
PROCEDURE ............................................................ 3
Figure A.2
Figure A.3
8.1
8.2
8.3
8.4
3
3
3
4
8.5
8.6
8.7
8.8
8.9
8.10
8.11
6
6
6
6
Tables
Table 7-1
Table 8-1
Recommended Test
Board Thickness & Layer Count .......................... 3
Table 8-2
Table 8-3
Table B.1
Table B.2
Table B.3
iv
June 2004
IPC/JEDEC-9702
Strain:
length)
Strain Gage:
2 INTRODUCTION
Semiconductor devices are assembled in a variety of package configurations, and are used in a multitude of applications. Given the diversity of package constructions and
end-use conditions, it is not feasible to establish a single
qualification requirement relating to bend testing; however,
definition of a uniform test methodology and a standard
reliability characterization reporting process are increasingly necessary to ensure adequate product quality.
3 SCOPE
This publication specifies a common method of establishing the fracture resistance of board-level device interconnects to flexural loading during non-cyclic board assembly
and test operations. Monotonic bend test qualification pass/
fail requirements are typically specific to each device application and are outside the scope of this document.
Monotonic Test:
Anvil:
Support Span:
Component:
IPC/JEDEC-9702
June 2004
Unit
board thickness
crosshead travel distance
crosshead speed
degree Celsius
degree Fahrenheit
Hertz
load span
microstrain
second (time)
strain
strain-rate
support span
Symbol
t
C
F
Hz
LL
or Strain
s
LS
Term
ball grid array
chip scale (size) package
intermetallic compound
organic solderability preservative
printed wiring board
surface mount
small outline package
Abbreviation
BGA
CSP
IMC
OSP
PWB
SMT
SOP
6 SAMPLING
A statistically relevant sample size is required. It is recommended that several manufacturing lots be sampled to
evaluate lot-to-lot variability. Depending on failure distribution, desired sensitivity, confidence limits, etc., sample
quantities such as 23, 30, 45, etc., may be appropriate.
7 APPARATUS
7.1 Universal Tester A universal tensile tester incorporating a deflection measuring device shall be used to generate a controlled board deflection rate. The tester shall
include a four-point bending fixture (see Figure 7-1) to
apply a theoretically uniform bending moment across the
load span.
Description
Requirement
Anvil/roller radius
3 mm
[0.12 in.], min.
Anvil/roller length
Ambient temperature
23 C 2 C
[73 F 4 F]
IPC/JEDEC-9702-7-1
Figure 7-1
Universal Tester
June 2004
IPC/JEDEC-9702
where
LS
LL
t
=
=
=
=
=
Equation 2
Continuity monitoring is preferably performed by the same high scan frequency equipment used for strain measurements, allowing
simultaneous recording of net resistance and strain.
Copper
Layers,
min.
PWB Thickness,
min. (mm) [in.]
Small: X 15 [0.59]
1.00
[0.039]
8 PROCEDURE
Medium: 15 [0.59]
< X <40 [1.58]
1.55
[0.062]
Large: X 40 [1.58]
2.35
[0.093]
IPC/JEDEC-9702
8.5 Test Board Land Pads The test board land pads
should match the configuration of the actual end-use PWB,
typically non-solder mask defined (NSMD). If the end-use
configuration is unknown, NSMD land pads should be used
with exposed PWB land pad diameters that are 80-100% of
the package solder-wetted pad diameters.
Finite element simulations support the testing of multiple packages on a test board (see
Figure 8-1) given the specific test board layout requirements detailed in Table 8-2; however, variations in PWB
and solder strain are typically greater for test boards with
multiple components.
8.6 Test Board Layout
June 2004
Table 8-2
Description
Requirement
Package quantity
per board
Distribution
Symmetry
Package-topackage separation
(x-y directions)
Package-to-anvil
separation
Package-to-board
separation
Package orientation
Connector location
IPC/JEDEC-9702-8-1
Figure 8-1
June 2004
IPC/JEDEC-9702
IPC/JEDEC-9702-8-2
Figure 8-2
IPC/JEDEC-9702-8-3
Figure 8-3
IPC/JEDEC-9702
June 2004
June 2004
IPC/JEDEC-9702
IPC/JEDEC-9702-8-4
Figure 8-4
Table 8-3
Parameter
Value
PWB pre-load,
Minimum crosshead
speed,
Maximum crosshead
travel distance,
Depending on board configuration and warpage, the preload level shown in Table 8-3 may not always result in
proper seating of the PWB against the anvils/rollers. The
test board assembly should be returned to an unloaded condition immediately upon conclusion of the test.
In-situ monitoring of the daisy-chain nets is preferably conducted using the same equipment used to measure strain,
with strain and net resistance recorded simultaneously.
9 FAILURE CRITERIA AND ANALYSIS
IPC/JEDEC-9702
June 2004
nique) of one representative solder joint or lead, at a minmum. Example failure modes for solder ball array style
packages are illustrated in Figure 9-1. Failure modes for
leaded style packages include lead cracking, package body
cracking, and cracking between the various lead, IMC, solder and PWB metal pad interfaces.
IPC/JEDEC-9702-9-1
Figure 9-1
June 2004
IPC/JEDEC-9702
IPC/JEDEC-9702-a1
Figure A.1
IPC/JEDEC-9702
June 2004
IPC/JEDEC-9702-a2
Figure A.2
10
June 2004
IPC/JEDEC-9702
IPC/JEDEC-9702-a3
Figure A.3
11
IPC/JEDEC-9702
June 2004
Category
Description
Equipment
Four-point bend
test fixture
load span
support span
anvil/roller radius
anvil/roller length
Component
Test board
Strain gage
Category
Board assembly
Description
preheat temperature, ramp rate, critical peak temperatures (solder, package surface, board, etc.) duration
above solder liquidus temperature and cooling rate
solder composition
solder paste metal percentage, particle mesh size type and flux type
reflow atmosphere
nominal solder paste volume
nominal solder joint geometry
component/PWB storage and/or bake-out conditions prior to board assembly
storage conditions and duration following board assembly
Table B.3
Category
Description
Set-up data
Resistance data
(each test board)
Failure distribution
Failure mode
12
ASSOCIATION CONNECTING
ELECTRONICS INDUSTRIES
IPC/JEDEC-9702
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