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Phase
Complex amplitude distribution at any plane for
monochromatic waves can be written as
U(P)=A(P) exp[i (P)] (A- amplitude, -phase)
Phase contains spatial and temporal information on
changes in surface shape (height), optical path
length etc.
Holography
Inventor Dennis Gabor in 1948
Holo entire graphien write
Means for recording amplitude and phase of a wave
field.
Hologram is the recorded micro-interference pattern
between an object beam and a coherent known
background.
Object is reconstructed by illuminating the hologram
with reference beam
Main difference with photography is that phase
information is recorded.
Hologram
Hologram is an interference pattern between the
wavefront of interest and a known background.
Usually recorded on a flat surface but contains
information about the entire 3D wavefield.
It can then be envisioned as a randomly oriented
phase or amplitude grating.
Hologram diffracts any light incident upon it.
So reconstructed by illuminating it by the reference
beam.
It diffracts the reference beam in the direction of the
object, 3D object can be observed.
Hologram Formation
Hologram Formation
Object wave
Reference wave
Rx, y r x, y expi R x, y
Holographic fringes
Recording
Medium
O x, y R x, y O x, y R x, y *
R x , y R * x, y O x , y O * x , y O x, y R * x, y R x, y O * x, y
(1)
Holograms are reconstructed by illuminating them with
the reference beam.
This is equivalent to multiplying the recorded
holographic interference pattern (intensity pattern) with
the complex amplitude of the reference wave.
Hologram Reconstruction
Hologram Reconstruction
Amplitude transmittance of the developed photographic
plate is
(2)
Undiffracted reference beam
(zero diffraction order)
Hologram
(intensity pattern)
R x, y h x, y h0 r 2 o 2 R x, y
(3)
r 2O x, y R 2 x, y O * x, y
Reference wave
complex amplitude
Reconstructed object
wave (virtual image)
Hologram Reconstruction
Object wave
(virtual image)
Object wave
(real image)
Reference wave
Rx, y r x, y expi R x, y
Undiffracted
reference beam
Recording setups
In-line hologram
recording setup
(Gabor)
Recording setups
off-axis hologram
recording setup
Holographic interferometry
One of the advantages of holography is that it can
compare wavefronts existing at two time instances.
This is holographic interferometry.
Finds application in varying fields.
Coherent wavefield from the medium of interest at
two time instances interfere.
In conventional holography this can be realized in
two ways 1) double exposure and 2) Real time.
The interference phase between these two states will
manifest as intensity fringes and can be analyzed to
gain information about the object.
Holographic interferometry
Complex amplitude of the object in the initial state
O1 x, y o x, y exp i x, y
(4)
O2 x, y o x, y exp i x, y x, y
(5)
I x, y O1 O2 O1 O2 O1 O2 * 2o 2 1 cos
2
(6)
Digital Holography
Holography is a two step process 1) formation by
interference and 2) reconstruction by diffraction.
Hologram recording using semiconductors photodetector arrays and their numerical reconstruction
using diffraction theory is Digital Holography.
The recording process eliminates the need of wet
process as in conventional holography.
Numerical reconstruction provides both phase and
amplitude of the object wavefront directly.
Conventional interferometry including holography
require phase shifting techniques to obtain the
phase information.
, h( x, y ) R ( x, y )
cos dxdy (7)
r
2 2
Hologram
(transmittance)
Reference wave
complex amplitude
x
rd
2d
(8)
2d
i 2
2
R
x
y
h
x
y
x
y
,
,
exp
(9)
expi 2d x y dxdy
i 2
2
x y
R x, y h x, y exp
d
(10)
(9)
(11)
Im ,
Re ,
(12)
Reconstructed
Object
Undiffracted
reference
Phase
corresponding to
reconstructed
object
Holographic interferometry
Reconstructed
intensity before tilt
Reconstructed
intensity after tilt
Holographic
interference
pattern
y (cm)
x (cm)
-1
-1
-1
y (cm)
x (cm)
-1
-1
2 -1
-1
Unwrapped
y (cm)
y
x (cm)
x
Measured tilt
Along x-direction
Along y-direction
Deformation measurement
Deformation of a cantilever
x (cm)
0
Cantilever deformation
Unwrapped
Change in deformation
along x-direction
Complex deformation
x (cm)
0
0 z
c (deformation + tilt)
deform = c- t
x
z
t (tilt)
x
z
x
z
Deformation
Sampling criteria
d/2
d/2
Sampling criteria
This is also the maximum spatial frequency to be
imaged/resolved.
Sampling criteria
Nyquist sampling criteria states that each fringe should
occupy at least 2 pixels in the sensor.
If the sensor pixel size is x, then the spatial frequency of
the sensor is 1/x
The sampling frequency (1/x) should be at least greater
than or equal to twice the signal frequency (1/d) for the
fringes to be resolved.
This leads to 1/(2 x)=1/d
Means
This leads to
When the angles involved are small
And the maximum possible angle between the object and
reference beam is max=/(2 x)