BS 1134 1 1988

British Standard
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BRITISH STANDARD
Assessment of surface
texture
Part 1: Methods and instrumentation
UDC 621.9.015:620.179.118:001.4
BS 1134-1:
1988
BS 1134-1:1988
Committees responsible for this

British Standard
The preparation of this British Standard was entrusted by the General
Mechanical Engineering Standards Committee (GME/-) to Technical
Committee GME/10, upon which the following bodies were represented:
Department of Trade and Industry (National Engineering Laboratory)

Department of Trade and Industry (National Physical Laboratory)
GAMBICA (BEAMA Ltd.)
Gauge and Tool Makers Association
Institution of Production Engineers
Loughborough University of Technology
University of Warwick
Coopted member
This British Standard, having

been prepared under the
direction of the General
Mechanical Engineering
Standards Committee, was
published under the authority
of the Board of BSI and comes
into effect on
29 February 1988
BSI 11-1999
BS 1134 first published
December 1950
First revision April 1961
First published as BS 1134-1
August 1972
First revision February 1988
The following BSI references
relate to the work on this
standard:
Committee reference GME/10
Draft for comment 85/74262 DC
ISBN 0 580 16269 9
Amendments issued since publication

Amd. No.
Date of issue
Comments
BS 1134-1:1988
Contents
Page
Committees responsible
Inside front cover
Foreword
iii
Section 1. General
1
Scope
1
2
Definitions
1
Section 2. Determination of surface roughness
3
Sampling lengths
12
4
Graphical determination of parameter values
12
5
Statements of surface roughness
16
Section 3. Instrumentation
6
Stylus-type measuring instruments
17
7
Accuracy
20
Appendix A Parameter values
23
Appendix B Method divergence of instrument reading
24
Appendix C Factors affecting the statement of accuracy
25
Figure 1 Surface characteristics and terminology
3
Figure 2 Traversed length
4
Figure 3 Profile departure
5
Figure 4 Local peak of the profile
5
Figure 5 Spacing of local peaks of the profile
6
Figure 6 Local valley of the profile
6
Figure 7 Profile peaks
7
Figure 8 Profile valleys
7
Figure 9 Spacing of profile irregularities
8
Figure 10 Profile section level
8
Figure 11 Profile bearing length
9
Figure 12 Arithmetical mean deviation of the profile (Ra)
9
Figure 13 Maximum height of the profile (Ry)
10
Figure 14 Graphical determination of Ra values
13
Figure 15 Graphical determination of Rz values
13
Figure 16 Graphical determination of Sm values
14
Figure 17 Graphical determination of S values
15
Figure 18 Graphical determination of tp values
15
Figure 19 Stylus acting midway between two skids
17
Figure 20 Profile instrument frequency response
19
Figure 21 Permissible deviations of the transmission coefficient
21
Figure 22 Symbols for the direction of lay
22
Figure 23 Centre arithmetical mean lines (A) and electrical
mean lines (B)
25
Table 1 Sampling lengths
12
Table 2 Static measuring force of the stylus
17
Table 3 Evaluation lengths
18
Table 4 Nominal sinusoidal frequency response characteristics for
a profile instrument
19
Table 5 Upper and lower limits of transmission coefficients
20
Table 6 Preferred nominal values for arithmetical mean deviation
of the profile (Ra)
23
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Page
Table 7 Preferred nominal values for ten point height of
irregularities (Rz), and maximum height of the profile (Ry)
23
Table 8 Preferred nominal values for mean spacing of profile
irregularities (Sm), and mean spacing of local peaks of the profile (S)
24
Table 9 Comparison of Ra values obtained by graphical and
instrumental means
24
Publications referred to
Inside back cover
ii
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BS 1134-1:1988
Foreword
This Part of BS 1134 has been prepared under the direction of the General
Mechanical Engineering Standards Committee and is a revision of
BS 1134-1:1972, which is withdrawn.
The definitions given in this Part of BS 1134 supersede those given in BS 6741-1
and BS 6741-2. BS 6741-1 and BS 6741-2 are accordingly withdrawn.
BS 1134 was first issued in 1950 and revised in 1961 and 1972. This revision
takes account of the 1982 edition of ISO 468 Surface roughness Parameters,
their values and general rules for specifying requirements published by the
International Organization for Standardization.
BS 1134-1:1972 dealt with two parameters, Ra and Rz, whereas this edition covers
the additional parameters Ry, Sm, S and tp.
Additional parameters may be found in ISO 4287-1:1984 Surface roughness
Terminology Part 1: Surface and its parameters and in ISO 4287-2:1984
Surface roughness Terminology Part 2: Measurement of surface roughness
parameters.
BS 1134-2 gives general information and guidance.
A British Standard does not purport to include all the necessary provisions of a
contract. Users of British Standards are responsible for their correct application.
Compliance with a British Standard does not of itself confer immunity
from legal obligations.
Summary of pages
This document comprises a front cover, an inside front cover, pages i to iv,
pages 1 to 26, an inside back cover and a back cover.
This standard has been updated (see copyright date) and may have had
amendments incorporated. This will be indicated in the amendment table on the
inside front cover.
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iii
iv
blank
BS 1134-1:1988
Section 1. General
1 Scope
This Part of BS 1134 describes methods for the assessment of surface texture of machined, self-finished and
other surfaces and describes the characteristics and parameters standardized for use in industry.
It embraces the following.
a) The terminology to be employed in statements relating to surface texture and measurement of surface
texture.
b) Preferred values for the grading of surface texture (see Appendix A).
c) Sampling lengths and cut-off values to be used in graphical procedures and instrument construction.
d) The graphical determination of the following parameters:
1) Ra, arithmetical mean deviation of the profile;
2) Rz, ten point height of irregularities;
3) Ry, maximum height of the profile;
4) Sm, mean spacing of profile irregularities;
5) S, mean spacing of local peaks of the profile;
6) tp, profile bearing length ratio.
e) The determination of parameter values by instrumental means.
f) The essential instrument requirements to ensure repeatability of performance.
g) The information to be given in statements relating to surface texture requirements.
NOTE
The titles of the publications referred to in this standard are listed on the inside back cover.
2 Definitions
For the purposes of this Part of BS 1134 the following definitions apply.
2.1 Terms relating to the surface, profile and datum
2.1.1
real surface
the surface limiting the body, separating it from surrounding space
2.1.2
real profile
the profile that results from the intersection of the real surface by a plane conventionally defined with
respect to the geometrical surface (see Figure 1)
2.1.3
geometrical surface
the surface determined by the design, and defined by the drawing and/or other technical document,
neglecting errors of form and surface roughness (see Figure 1)
2.1.4
geometrical profile
the profile that results from the intersection of the geometrical surface by a plane conventionally defined
with respect to this surface (see Figure 1)
2.1.5
effective surface
the close representation of a real surface obtained by instrumental means (see Figure 1)
2.1.6
effective profile
the profile that results from the intersection of the effective surface by a plane conventionally defined with
respect to the geometrical surface (see Figure 1)
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2.1.7
profile transformation
an action (operation) that results intentionally or unintentionally in the transformation of a profile at any
stage in the process of measurement, e.g. traversing with a stylus, filtering, recording
2.1.8
transformed profile
a profile produced as a result of transformation
2.1.9
intentional profile transformation
a profile transformation that is made in order that measurements are performed in accordance with the
specified requirements for a given measurement
NOTE The following are examples of intentional profile transformations.
a) Transformation of the surface profile into an electric signal to make it possible to use electronic measuring instruments.
b) Transformation of the effective profile by defined filter means of suppressing those undulations of the real profile that are not
or are not fully to be included in the measured roughness parameters of the surface.
2.1.10
unintentional profile transformation
a profile transformation arising from the imperfection of the measuring instrument or of its separate parts
and usually seen as distortions of the information about the profile
NOTE An example of an unintentional profile transformation is the distortion of the information about the profile when traversing
it with a stylus having a finite tip radius.
2.1.11
surface texture
those irregularities with regular or irregular spacing that tend to form a pattern or texture on the surface
NOTE
This texture may contain components of roughness (see 2.1.12) and waviness (see 2.1.13).
2.1.12
roughness
the irregularities in the surface texture that are inherent in the production process but excluding waviness
and errors of form (see Figure 1)
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Figure 1 Surface characteristics and terminology
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2.1.13
waviness
that component of surface texture upon which roughness is superimposed (see Figure 1)
NOTE Waviness may result from such factors as machine or work deflections, vibrations, chatter, heat treatment or warping
strains.
2.1.14
lay
the direction of the predominant surface pattern, ordinarily determined by the production method used
(see Figure 1)
2.1.15
traversed length
the complete length of the pick-up movement along the surface being measured (see Figure 2)
2.1.16
reference line
the line chosen by convention as a reference to serve for the quantitative evaluation of the roughness of the
effective profile (see Figure 2)
2.1.17
sampling length, l
the length of the reference line used for identifying the irregularities characterizing the surface roughness
(see Figure 2). The sampling length is measured in the general direction of the profile
Figure 2 Traversed length

2.1.18
evaluation length, ln
the length over which the profile is assessed. It may contain one or more sampling lengths (see Figure 2)
2.1.19
profile departure, y
the distance between a profile point and the reference line in the direction of measurement (see Figure 3)
2.1.20
mean line system, system M
the calculation system used for the profile evaluation in which a mean line is taken as a reference line
2.1.21
least-squares mean line of the profile
a reference line having the form of the geometrical profile and dividing the profile so that, within the
sampling length, the sum of the squares of the profile departures from this line is the minimum
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2.1.22
centre arithmetical mean line of the profile
a reference line representing the form of the geometrical profile and parallel to the general direction of the
profile throughout the sampling length, such that the sums of the areas contained between it and those
parts of the profile that lie on each side of it are equal
NOTE The centre line (centre arithmetical mean line) is defined and used for graphical convenience. When the centre line has a
distinguishable periodicity and its general direction is therefore determinate, the equal area centre line is unique. When the profile
is irregular, the assessment of the general direction becomes uncertain over a certain range. Within this range a family of equal area
centre lines can be drawn, one of which will be identical with the least-squares mean line.
2.1.23
electrical mean line
in an electrical instrument, a reference line that is established by the circuits determining the meter
cut-off and which divides equally those parts of the transformed profile lying above and below it
2.1.24
local peak of the profile
a part of the profile between two adjacent minima of the profile (see Figure 4)
NOTE Figure 3 represents a profile graph which, due to the difference in the vertical and horizontal magnifications, is a distorted
representation of the real profile. For this reason, the profile departures should be measured in the same direction as that used to
determine the real profile. On the real profile, the angles, , between the reference line and the general direction of the profile within
the evaluation length are very small. Thus, the difference between the profile departures measured perpendicular to the reference
line and those measured perpendicular to the general direction of the profile may be negligible. Hence, on the real surface, the profile
departures should be considered perpendicular to the reference line.
Figure 3 Profile departure
Figure 4 Local peak of the profile
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2.1.25
spacing of local peaks of the profile
the length of a mean line section between the two highest points of adjacent local peaks of the profile
projected on the mean line (see Figure 5)
Figure 5 Spacing of local peaks of the profile

2.1.26
local valley of the profile
a part of the profile between two adjacent maxima of the profile (see Figure 6)
Figure 6 Local valley of the profile

2.1.27
local irregularity
a local peak and the adjacent local valley
2.1.28
profile peak
an outwardly directed (from material to surrounding medium) portion of the profile connecting two
adjacent points of the intersection of the profile with the mean line (see Figure 7)
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NOTE The outwardly directed portion of the profile at the beginning or end of the sampling length should always be considered
as a profile peak.
Figure 7 Profile peaks

2.1.29
profile valley
an inwardly directed (from surrounding medium to material) portion of the profile connecting two adjacent
points of the intersection of the profile with the mean line (see Figure 8)
NOTE The inwardly directed portion of the profile at the beginning or end of the sampling length should always be considered as
a valley.
Figure 8 Profile valleys

2.1.30
profile irregularity
a profile peak and the adjacent profile valley
2.1.31
spacing of profile irregularities
the length of a mean line section containing a profile peak and the adjacent profile valley (see Figure 9)
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Figure 9 Spacing of profile irregularities

2.1.32
line of profile peaks
a line parallel to the mean line and passing through the highest point of the profile within the sampling
length (see Figure 7)
2.1.33
line of profile valleys
a line parallel to the mean line and passing through the lowest point within the sampling length
(see Figure 8)
2.1.34
profile section level, c
the distance between the line of profile peaks and a line intersecting the profile, the latter being parallel to
the line of profile peaks (see Figure 10)
NOTE
The profile section level can be determined in micrometres or in percent of Ry, the maximum height of the profile (see 2.2.2).
Figure 10 Profile section level
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2.1.35
profile bearing length, p
the sum of the section lengths obtained by cutting the profile peaks by a line parallel to the mean line
within the sampling length (see Figure 11)
Figure 11 Profile bearing length

2.2 Terms associated with surface roughness parameters
2.2.1
arithmetical mean deviation of the profile, Ra
the arithmetical average value of the departure of the profile above and below the mean line (centre or
electrical mean line) throughout the specified sampling length (see Figure 12). The arithmetical mean
deviation is given by the equations:
or approximately:
where
l is the sampling length;
y is the profile departure;
n is the number of profile departures.
NOTE In practice, the values of Ra are determined within the evaluation length which includes several sampling lengths. The
sampling length is equal to the cut-off.
Figure 12 Arithmetical mean deviation of the profile (Ra)
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2.2.2
maximum height of the profile, Ry
the distance between the line of profile peaks and the line of profile valleys within the sampling length
(see Figure 13)
Figure 13 Maximum height of the profile (Ry)

2.2.3
ten point height of irregularities, Rz
the average distance between the five highest profile peaks and the five deepest profile valleys within the
sampling length, measured from a line parallel to the mean line and not crossing the profile (see Figure 15)
2.2.4
mean spacing of profile irregularities, Sm
the mean value of the spacing of the profile irregularities within the sampling length (see Figure 16)
2.2.5
mean spacing of local peaks of the profile, S
the mean value of the local peak spacing of the profile within the sampling length (see Figure 17)
2.2.6
profile bearing length ratio, tp
the ratio of the profile bearing length to the sampling length
2.3 Terms associated with instruments for the measurement of surface roughness by the profile
method
2.3.1
profile recording instrument
an instrument recording the coordinates of the profile of the surface texture
2.3.2
profile instrument
an instrument used for the measurement of surface roughness parameters
2.3.3
contact profile instrument, system M
a contact (stylus) instrument of consecutive profile transformation used for the measurement of surface
roughness parameters according to system M (the mean line system)
NOTE
See ISO 3274:1975.
2.3.4
modified profile
the effective profile defined by the combination of a stylus and profile filter, the filter being used for
selecting a part of the spectrum of the real profile to be taken into consideration in the measurement of
surface roughness parameters
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2.3.5
profile instrument with predetermined evaluation length
an instrument in which the length used for measurement has a defined beginning and end
NOTE These instruments generally indicate and hold the reading of the measured parameter obtained at the end of the stated
measuring length.
2.3.6
profile instrument with running evaluation length
a profile instrument with running evaluation length giving a running average
2.3.7
static measuring force
the force which the stylus exerts along its axis on the examined surface without taking into account the
dynamic components that arise from the traversing of the surface by the stylus
2.3.8
rate of change of the static measuring force
the change of the static measuring force per unit displacement of the stylus along its axis
2.3.9 cut-off, 2B
the value of the wavelength 2 numerically equal to the sampling length and conventionally taken as the
upper limit of transmission of the instrument
NOTE The given upper limit conventionally separates the nominally transmitted components of the effective profile spectrum from
those that are nominally suppressed.
2.3.10
vertical magnification of a profile record, Vv
the ratio of the recorded horizontal displacement to the displacement of the stylus along the surface
2.3.11
horizontal magnification of a profile record, Vh
the ratio of the recorded length of the recorder chart to that of the stylus displacement along the surface
2.3.12
error of vertical magnification of a profile record
the percentage difference between the nominal and the actual values of the vertical magnification referred
to the nominal value
2.3.13
error of horizontal magnification of a profile record
the percentage difference between the nominal and the actual values of the horizontal magnification
referred to the nominal value
2.3.14
basic error of a profile instrument reading
the percentage difference between the instrument reading and the value of the surface roughness
parameter as defined by the stylus and cut-off (without skid) of the instrument
2.3.15
method divergence of the instrument reading
for a given measured profile, the percentage difference between the value of the surface roughness
parameter determined with respect to the electrical mean line of the defined wave filter and a succession
of straight centre arithmetical mean lines each equal in length to the cut-off, both determinations being
referred to the same part and overall length of the same cross section (see Appendix B)
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Section 2. Determination of surface roughness

3 Sampling lengths
Normally the appropriate sampling length of surface, which determines the corresponding cut-off to be
used (see 6.3), shall be selected from the range of sampling lengths given in Table 1.
In special cases which require the choice of values of sampling length other than those specified
in Table 1, sampling and evaluation lengths shall be stated on all records of the test.
Table 1 Sampling lengths
mm
0.08
0.25
0.8
2.5
8.0
in
0.003
0.01
0.03
0.1
0.3
4 Graphical determination of parameter values

4.1 Graphical determination of Ra values

4.1.1 Observe the procedure in 4.1.2 to 4.1.8 when determining Ra values from graphical recordings.
NOTE If the surface is intentionally curved, the curvature will generally be neutralized, prior to recording, by some form of guiding
or filter device.
4.1.2 Assume the surface is nominally flat, and that the record is produced in rectilinear coordinates in
which a truly flat surface is represented by a straight line.
4.1.3 First determine the centre arithmetical mean line of the profile for each successive sampling length,
l, contained within the evaluation length of the record, as given in 4.1.4 to 4.1.6.
4.1.4 Draw a straight line AB through the lowest profile valley and parallel to the general course of the
record over the sampling length l [see Figure 14a)].
NOTE 1 The slope of the line AB can usually be determined by eye with sufficient accuracy.
NOTE 2 Where the texture has a distinguishable periodicity it is essential that the sampling length should be chosen to include a
whole number of wavelengths.
4.1.5 Determine the area, P, between the profile and the line AB either by measuring equally-spaced
ordinates or by the use of a planimeter, through the chosen sampling length.
4.1.6 The height, Hm, of the centre arithmetical mean line above AB (the line of profile valleys) is given
by the equation:
Hm = P
---l
where
P
is the area between the profile and line of profile valleys (AB);
is the sampling length.
4.1.7 Draw the centre arithmetical mean line AB parallel to the line of profile valleys (AB) at the height
Hm above it [see Figure 14a)].
4.1.8 Determine the areas r1, r2, r3 ... and s1, s2 ... above and below the centre arithmetical mean line
[see Figure 14b)]. The value of Ra (in 4m) is calculated from the equation:
where
ri
is the area (in mm2) of the ith profile peak;
si
is the area (in mm2) of the ith profile valley;
is the sampling length (in mm);
Vv is the vertical magnification of the profile record.

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4.1.9 The required value of Ra over the evaluation length is taken as the mean of the successive values of
the sampling length.
Figure 14 Graphical determination of Ra values

4.2 Graphical determination of Rz and Ry values
For some purposes it is convenient to have an assessment of average peak-to-valley height of surface
irregularities. The Rz or ten point height method (see Figure 15) is an arbitrary way of avoiding the effect
of exceptional peaks and valleys in the final computation, and is used in determining average
peak-to-valley values. Rz values are generally from four to seven times the corresponding Ra values, the
ratio depending upon the shape of the profile.
Figure 15 Graphical determination of Rz values

Measure the five highest peaks and five deepest valleys from an arbitrary base line AB drawn parallel to
the centre arithmetical mean line AB of the chosen sampling length l. Rz (in 4m) is then given by the
equation:
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where
Y1, Y2, . . . Y10
Vv
is the distance (in mm) of peaks and valleys from the arbitrary base line AB;
is the vertical magnification of the profile record.
The value of Ry (in 4m) is calculated from the equation:
where
Yy is the maximum height (in mm) of the profile record;
Vv
is the vertical magnification of the profile record.
4.3 Graphical determination of Sm values
Draw the centre arithmetical mean line AB (see Figure 16) for the sampling length, l, and identify the
profile peaks, noting that the minimum height of the profile peaks to be taken into consideration is
specified as 10 % of Ry. The mean spacing of the profile irregularities Sm (in 4m) is calculated from the
equation:
where
Smn is the length (in mm) of mean line section containing the nth profile peak and the adjacent profile
valley;
n is the number of sections included in the determination;
Vh is the horizontal magnification of the profile record.
Figure 16 Graphical determination of Sm values

4.4 Graphical determination of S values
Draw the centre arithmetical mean line AB (see Figure 17) for the sampling length, l, and identify the local
peaks, noting that the minimum spacing of the local peaks that is to be taken into consideration is specified
as 1 % of the sampling length, while the minimum height of the local peaks that is to be taken into
consideration is specified as 10 % of Ry. The mean spacing of local peaks of the profile, S, (in 4m) is
calculated from the equation:
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where
S1 . . . Sn
are the spacing of local peaks of the profile (in mm);
n is the number of spacings included;

Vh is the horizontal magnification of the profile record.
Figure 17 Graphical determination of S values

4.5 Graphical determination of tp values
Determine the profile bearing length, p, which is the sum of the section lengths obtained by cutting the
profile peaks by a line (AB in Figure 18) parallel to the arithmetical mean line within the sample length,
l, at the profile section level, c, below the line of profile peaks. The profile bearing length, p, is given by the
equation:
p + a + b + c + d + e
where
a, b, c . . . are the section lengths.
The profile bearing length ratio, tp, expressed as a percentage, is given by the equation:
where
ppp and l are in the same units.
Figure 18 Graphical determination of tp values
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5 Statements of surface roughness

5.1 General
The following information is that which shall be given in statements relating to surface roughness.
5.2 Surface roughness values
For requirements specified by the maximum value (in 4m) of the surface roughness parameter, none of the
measured values of the parameter of the whole surface being inspected shall exceed the value specified on
the drawings or in technical documents. In such cases, the suffix max shall be added to the parameter
symbol, as shown in the following example:
Ry max 12.5
5.3 Limiting values
When both lower and upper limit values need to be specified, these shall be expressed (in 4m) as shown in
the following examples:
Ra 0.8
Rz 12.5
Ra 0.4
Rz 6.3
If a single value is stated it shall be the upper limit value and shall be expressed (in 4m) as shown in the
following examples:
Ra 0.8, Rz 12.5
NOTE Variations in the value of the surface roughness parameter in most engineering surfaces are found to approximate
sufficiently closely to the normal (Gaussian) distribution for the properties of the normal distribution to be applied. Thus, the lower
and upper limits of the roughness parameter values are the limits between which 68 % of all the measured values of the parameter
are expected to fall.
For requirements specified by the upper limit of the surface roughness parameter, the surface is considered to be acceptable if not
more than 16 % of all the measured values of the parameter exceed the value specified on the drawings or in technical documents. In
cases where the lower limit is specified, the surface is considered to be acceptable if not more than 16 % of all the measured values of
the roughness parameter can be exceeded by the specified value.
5.4 Cut-off values

When the cut-off value is other than 0.8 mm the value shall be indicated in parentheses following the
surface roughness value (in 4m), as shown in the following example:
Ra 0.2 (2.5)
NOTE Apart from indicating the cut-off to be used in assessment, the cut-off value denotes that dominant peak spacings greater
than the cut-off are not present on a surface.
5.5 Lay
It is sometimes necessary to specify the direction of lay, in which case it shall be as defined as in Figure 22
and expressed in accordance with the following example:
Ra 0.8 C
NOTE C refers to the symbol for lay which is circular (see Figure 22). Unless otherwise specified, the implication is that the surface
roughness should be measured across the direction of the lay.
5.6 Production process

When production of a surface is to be limited to the use of one particular process, the process shall be stated.
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Section 3. Instrumentation
6 Stylus-type measuring instruments
6.1 Stylus
6.1.1 Tip radius of the stylus. The nominal value of the tip radius of the stylus shall be one of the following:
a) 2 0.5 4m;
b) 5 1 4m;
c) 10 2.5 4m.
See also Appendix C.
6.1.2 Stylus angle. The nominal value of the stylus angle shall be one of the following:
a) 1.57 radians (90);
b) 1.05 radians (60).
6.1.3 Static measuring force. The static measuring force shall be sufficient to ensure continuous contact
between the stylus and the surface being measured and shall be not greater than that given in Table 2.
Table 2 Static measuring force of the stylus
Nominal tip
Maximum static
radius of stylus measuring force at mean
level of stylus
Maximum rate of
change of
measuring force
mN
4m
N/m
2 0.5
0.7
35
51
4.0
200
10 2.5
16.0
800
6.2 Skid
6.2.1 Skid dimensions. If a skid is employed, its radius in the direction of the traverse shall be not less
than 50 times the meter cut-off used.
If two simultaneously operative skids, as shown in Figure 19, are used, their radii shall be not less than
eight times the meter cut-off.
NOTE Although the use of the skid may, when applied under suitable conditions, introduce no error of any great practical
significance, external datum units should be used in all serious metrological work such as, for example, calibration procedures, and
in the case of surfaces of limited area or requiring the use of cut-off values of 2.5 mm or greater.
Figure 19 Stylus acting midway between two skids

6.2.2 Skid surface roughness. The surface roughness of the skid as determined by the ten point height of
irregularities, Rz, shall be not greater than 0.1 4m when measured in the direction of traverse.
6.2.3 Skid force. The force exerted by the skid on the surface to be measured shall be not greater than 0.5 N.
6.3 Traverse
In profile instruments with predetermined or running evaluation lengths, the length shall depend on the
meter cut-off value 2B within the limits given in Table 3.
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Table 3 Evaluation lengths

Type of profile meter
Cut-off
2B
mm
Predetermined evaluation length
Running evaluation length
Evaluation length
Min.
Max.
mm
mm
0.08
0.25
0.8
2.5
8
0.4
1.25
2.4
5
16
2
5
8
15
40
0.25
0.8
2.5
5
16
16
6.4 Values of vertical and horizontal magnification

The values of vertical and horizontal magnification for profile recording instruments shall be selected from
the following series:
Vertical (Vv): 100, 200, 500, 1 000, 2 000, 5 000, 10 000, 20 000, 50 000, 100 000, 200 000, 500 000,
1 000 000.
Horizontal (Vh): 10, 20, 50, 100, 200, 500, 1 000, 2 000, 5 000, 10 000, 20 000, 50 000.
6.5 Transmission characteristics in the long wavelength
6.5.1 Rate of attenuation. The rate of attenuation shall be equivalent to that produced by two independent
C-R networks of equal time constant in series. This describes a system in which the maximum slope of the
transmission curve is 12 dB per octave and in which the phase shift at the 75 % cut-off 2B is 60.
The transmission coefficient of such a system shall be given by the equation:
where
j = 1;
2 is the wavelength;
2B is the meter cut-off.
The effective cut-off wavelengths shall be taken at 75 % transmission. These are deemed to be equivalent
to the sampling lengths in Table 1.
NOTE In a practical determination, the values of the transmission coefficients for the characteristics shown are measured relative
to the flat part of the transmission curve (see Figure 20).
6.5.2 Cut-off values. The cut-off values (in mm) to be used in instrument construction shall be selected from
the following series:
0.08, 0.25, 0.8, 2.5, 8.0.
NOTE 1 A cut-off of 0.8 mm is found adequate for most of the finer surfaces.
NOTE 2 Nominal sinusoidal frequency response characteristics for a profile instrument are shown by the ratios given in Table 4
(see also Figure 20).
The permitted deviations from the nominal values of the transmission coefficients shall be as given
in Table 5, and graphically presented in Figure 21, and these allow the cut-off to be assessed at
between 70 % and 80 % of maximum transmission.
18
BSI 11-1999
BS 1134-1:1988
Figure 20 Profile instrument frequency response

Table 4 Nominal sinusoidal frequency response
characteristics for a profile instrument
Wavelength
Percentage transmission
Cut-off
0.25 mm
Cut-off
0.8 mm
Cut-off
2.5 mm
Cut-off
8.0 mm
mm
0.025
0.05
0.08
99.7
98.7
96.7
99.7
0.10
0.25
0.5
94.9
75.0
42.9
99.5
96.8
88.5
99.7
98.7
0.8
1.0
2.5
22.7
15.8
2.9
75.0
65.8
23.5
96.7
94.9
75.0
99.7
99.5
96.8
5.0
8.0
10.0
0.75
7.1
2.9
1.8
42.9
22.7
15.8
88.5
75.0
65.8
25.0
50.0
80.0
2.9
0.75
23.5
7.1
2.9
NOTE Because of practical difficulties in measurement at the very short

wavelengths involved, the electrical transmission characteristic for 0.08 mm
cut-off, although nominally of the same form as for the longer cut-off values, has
not been tabulated.
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19
BS 1134-1:1988
7 Accuracy
7.1 Statement of basic error of calibration of Ra instruments
The basic error of profile instrument reading (as defined in 2.3.14) given within the cut-off by an
instrument in optimum adjustment and use (see C.5), and expressed as a percentage of the designated
value of the surface roughness parameter of an instrument calibration specimen complying with BS 6393,
shall be determined from the formula:
p
--- + q
x
where
x is the fraction of the range indicated by the instrument;
p is a percentage of full range;
q is a percentage of reading.
NOTE The admissible basic error of calibration thus expressed does not include the effect of deviations in the transmission
characteristic which will be additional thereto.
7.2 Deviations of transmission coefficients

The permissible deviations of the amplitude transmission coefficient (see Table 5 and Figure 21) of a profile
instrument from the nominal transmission coefficient shall be given by the equations:
where
2 is the wavelength;
2B is the meter cut-off.
Table 5 Upper and lower limits of transmission coefficients
Wavelength, 2
Transmission coefficient
Cut-off, 2B
Lower limit
%
Upper limit
dB
dB
0.1
0.2
0.3
0.5
96.6
95.5
93.7
88.4
0.30
0.40
0.56
1.07
102.7
101.8
100.4
96.0
0.23
+ 0.15
+ 0.03
0.26
0.7
1.0
1.5
2.0
81.4
69.8
51.7
37.9
1.78
3.13
5.74
8.43
90.2
79.8
62.3
47.7
0.90
1.96
4.12
6.44
3.0
5.0
10.0
21.5
9.0
2.4
13.5
20.9
32.3
28.5
12.5
3.4
10.9
18.1
29.3
NOTE An explanation of the method divergence of the instrument reading (see 2.3.15) is
given at Appendix B, and factors affecting the statement of accuracy are explained at
Appendix C.
20
BSI 11-1999
BS 1134-1:1988
Figure 21 Permissible deviations of the transmission coefficient
BSI 11-1999
21
BS 1134-1:1988
Symbol
Interpretation
Parallel to the plane of projection of the

view in which the symbol is used
Perpendicular to the plane of

projection of the view in which the
symbol is used
Crossed in two slant directions relative

to the plane of projection of the view in
which the symbol is used
Multi-directional
Approximately circular relative to the

centre of the surface to which the
symbol is applied
Approximately radial relative to

the centre of the surface to which
the symbol is applied
NOTE Should it be necessary to specify a direction of lay not clearly defined by these symbols, this may be done by a suitable note
on the drawing.
Figure 22 Symbols for the direction of lay
22
BSI 11-1999
BS 1134-1:1988
Appendix A Parameter values

Values are normally determined as mean results from the measurement of several sampling lengths taken
consecutively along the profile. These may be determined graphically in accordance with clause 4 or by
direct reading instruments. The direction in which the measurement is made should in general be
approximately at right angles to the lay if the surface texture has a directional quality (see Figure 22). The
parameter values specified should be selected from the ranges of preferred values given in Table 6,
Table 7 and Table 8.
Table 6 Preferred nominal values for
arithmetical mean deviation of the profile (Ra)
4m
4in
400
200
100
50
25
12.5
6.3
3.2
1.6
0.8
0.4
0.2
0.1
0.05
0.025
0.0125
16 000
8 000
4 000
2 000
1 000
500
250
125
63
32
16
8
4
2
1
0.5
Table 7 Preferred nominal values for

ten point height of irregularities (Rz),
and maximum height of the profile (Ry)
4m
4in
1 600
800
400
200
100
50
25
12.5
6.3
64 000
32 000
16 000
8 000
4 000
2 000
1 000
500
250
BSI 11-1999
4m
3.2
1.6
0.8
0.4
0.2
0.1
0.05
0.025
4in
125
63
32
16
8
4
2
1
23
BS 1134-1:1988
Table 8 Preferred nominal values for mean

spacing of profile irregularities (Sm), and
mean spacing of local peaks of the profile (S)
mm
12.5
6.3
3.2
1.6
0.8
0.4
in
0.500
0.250
0.125
0.062
0.032
0.016
mm
0.2
0.1
0.05
0.025
0.0125
0.006
in
0.008
0.004
0.002
0.001
0.0005
0.0003
NOTE The values given in Table 6, Table 7 and Table 8 are expressed as preferred in order to discourage unnecessary variation
of the values expressed on drawings. It should be realized that in some circumstances, other values may be specified.
Appendix B Method divergence of instrument reading

B.1 General
When two methods of measurement which are both standardized give results which are nominally but not
precisely equal, the numerical difference is referred to as method divergence.
Thus the two methods referred to in this standard for selecting the texture to be measured (by sampling
length and cut-off), although deemed to be acceptable equivalents of each other, treat the profile in different
ways that may lead to slightly different numerical evaluations.
B.2 Effective cut-off
Reference to Figure 20 will show that transition occurs gradually from the fully transmitting to the
substantially rejecting part of the standardized characteristic. From consideration of filter theory,
experimental results and various practices, the effective cut-off has now become rated, by accepted
convention, at the wavelength for which there is 75 % of the full transmission of a pure sinusoidal
waveform, with a tolerance permitting a range from 70 % to 80 %. This means that for a sine wave having
a wavelength equal to the sampling length, an instrument calibrated in the usual way for a sine wave
occurring on the flat part of the characteristic would indicate an Ra value equal to 75 % of the value
obtained from the profile graph by planimetry. For short wavelengths and most machined surfaces the
divergence is usually small, and this is generally the case for random profiles. It is usual to accept the
instrument reading as the operative basis for grading workpieces in the workshop, and to avoid extreme
divergences by use of a sufficient cut-off.
B.3 Range of method divergence
The typical and extremes of method divergence found by comparing metered Ra values with the values
computed from the least squares mean line are shown in Table 9.
Table 9 Comparison of Ra values obtained by
graphical and instrumental means
Type of
surface
Cut-off
Ra from least squares

mean line of graph
mm
Milled
Milled
End-milled
Turned
Turned
Ground
Ground
Lapped
2.5
2.5
2.5
2.5
2.5
0.8
0.8
0.8
Ra from
instrument
4m
0.80
2.66
0.90
6.74
0.83
0.71
0.48
0.02
Method
divergence
%
4m
0.86
2.67
0.81
6.86
0.81
0.66
0.53
0.02
+7
0
11
+2
2
8
+9
0
NOTE Mean method divergence for 2.5 mm cut-off: 0 %; standard deviation: 4 %.

Mean method divergence for 0.8 mm cut-off: 1 %; standard deviation: 7 %.
These mean method divergences and standard deviations were obtained from measurements
on 22 surfaces.
24
BSI 11-1999
BS 1134-1:1988
B.4 Electrical mean line

A further point concerns the shape of the self-determined electrical mean line found by the filter. This is
generally not a straight line but an undulating one which weaves its way through the profile as shown
in Figure 23. The undulations account for the method divergence. Equations and computing tables for the
electrical mean line found by the standard filter are available from manufacturers, and these can serve as
a basis for determining precisely, by computation from digitized profile records, the errors of instruments
complying with this standard.
In practice, however, it is generally only in the case of precise instrument calibration that it is necessary
to take the details of filter behaviour fully into account.
Figure 23 Centre arithmetical mean lines (A) and electrical mean lines (B)
Appendix C Factors affecting the statement of accuracy

C.1 General
Many instruments are responsive to a single variable (e.g. length, angle, electric current) and have few
sources of error. These errors can be expressed simply, and it is a normal expectation that this should be
done.
Surface instruments are more complicated, for the quantity to be measured has generally to be derived
from a fluctuating signal representing the profile of a sample of the surface. Errors can arise from different
sources having quite different error laws, and the total error does not lend itself to expression in a simple
yet meaningful way.
C.2 Calibration
Workshop calibration is generally effected with the aid of instrument calibration specimens complying with
BS 6393. Ideally, in addition to being marked with substantially its full value, assuming negligible
instrument losses, each specimen should be accompanied by a statement of the reading that should be
obtained from it by an instrument having given stylus dimensions and for each mean transmission
characteristic. This is a refinement that has still to be treated in a formal way.
The overall amplification is left as an adjustment for the user to make by means of one or more
potentiometers which have to be set in conjunction with an instrument calibration specimen or with a
calibrated test specimen. The attainable accuracy therefore starts with the calibration specimen and the
users skill in allowing for its characteristics and in securing with it the best overall adjustment of the
instrument. It is envisaged that the use of more than one test specimen will become normal practice.
BSI 11-1999
25
BS 1134-1:1988
C.3 Instrument error

If the instrument is set up to give the correct reading for the calibration specimen allowing for all relevant
characteristics, the basic instrument error at this point in its range of operation will be that of the
specimen, often assumed to be zero. However, the working range of the instrument may be considerable,
extending vertically from around 0.025 4m to several micrometres, and horizontally from around 2 4m to
several millimetres. Even if there is, after initial adjustment, no error in the calibrated region of the range,
there may be errors in other regions unless all parts of the instrument function perfectly. These errors
would be revealed by other precisely calibrated specimens. It is to the expression of the error throughout
the range, relative to the setting-up point, that 7.1 refers.
Instrument errors can arise from the condition of the stylus and datum device, various electronic sources,
and the errors inherent in the output behaviour and reading.
Assuming that the stylus is in good order, the radius of its tip may influence the indication. Differences
between a 2 4m and a 10 4m tip, while negligible for many surfaces, may be quite significant for others,
and especially for very fine ones. It does not follow that the blunter tip will always give the lower reading,
for on some surfaces (e.g. turned surfaces with sharp peaks) its own radius added to the radii of the peaks
may more than compensate for the losses in the valleys.
Instrument errors, apart from an error in overall amplification, may include errors due to electrical and
mechanical noise, to residual non-linearity, to ratio errors in range switching and, where applicable, to
errors in the transmission characteristic.
C.4 Noise
The effect of noise depends mainly on its proportion to the value of the signal. For most purposes, the noise
can be taken as the reading given by a well-polished optical flat, free from scratches. When the proportion
of noise in the reading is small, say less than one-third, the noise can be neglected. When the two are equal
(as can happen with smooth surfaces) it can account for 70 % to 80 % of the reading. When it is twice as
great as the signal, it becomes dominant. The noise cannot be allowed for by simple subtraction, for if the
two signals have values of en and es, the nearest simple assessment of their combination will be given
by ( e n 2 + e s 2 ) . The actual value of the noise, for a given instrument, may vary over a wide range according
to the rigidity of the set-up and the amount of vibration in the instrument and its environment.
C.5 Optimum adjustment
The reference in 7.1 to optimum adjustment and use may call for qualification. If an instrument were
required to give maximum accuracy over a small range of operation, its adjustment would naturally be
optimized for that range. On the other hand, if the instrument were required to perform as well as possible
over a wide range without readjustment, the adjustment would be optimized so as to minimize the residual
errors throughout the range.
The concept of optimum use will refer to environmental conditions, rigidity of workpiece mounting, and the
fact that readings near the top of the scale will generally be less subject to error than those near the bottom.
C.6 Statement of accuracy
If it is accepted that a useful statement of accuracy should neither under-rate nor over-rate the capability
of an instrument, it becomes clear that no single figure can be expected to give fair information. On the
other hand, a specification attempting to cover all possible combinations would become impossibly complex
and again meaningless.
26
BSI 11-1999
BS 1134-1:1988
Publications referred to
BS 308, Engineering drawing practice.

BS 308-2, Recommendations for dimensioning and tolerancing of size.
BS 1134, Method for the assessment of surface texture1).
BS 1134-2, General information and guidance.
BS 6393, Specification for calibration of stylus instruments.
ISO 468, Surface roughness Parameters, their values and general rules for specifying requirements.
ISO 3274, Instruments for the measurement of surface roughness by the profile method Contact (stylus)
instruments of consecutive profile transformation Contact profile meters, system M.
ISO 4287, Surface roughness Terminology.
ISO 4287-1, Surface and its parameters1).
ISO 4287-2, Measurement of surface roughness parameters1).
1) Referred
to in the foreword only.
BSI 11-1999
BS 1134-1:
1988
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Part 1: Methods and instrumentation

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This British Standard, having

Amendments issued since publication

Figure 1 Surface characteristics and terminology

Figure 2 Traversed length

Figure 3 Profile departure

Figure 4 Local peak of the profile

Figure 5 Spacing of local peaks of the profile

Figure 6 Local valley of the profile

Figure 7 Profile peaks

Figure 8 Profile valleys

Figure 9 Spacing of profile irregularities

Figure 10 Profile section level

Figure 11 Profile bearing length

Figure 12 Arithmetical mean deviation of the profile (Ra)

Figure 13 Maximum height of the profile (Ry)

See ISO 3274:1975.

Section 2. Determination of surface roughness

4 Graphical determination of parameter values

4.1 Graphical determination of Ra values

is the sampling length.

is the area (in mm2) of the ith profile peak;

is the area (in mm2) of the ith profile valley;

is the sampling length (in mm);

Vv is the vertical magnification of the profile record.

Figure 14 Graphical determination of Ra values

Figure 15 Graphical determination of Rz values

is the vertical magnification of the profile record.

The value of Ry (in 4m) is calculated from the equation:

is the vertical magnification of the profile record.

4.3 Graphical determination of Sm values

Figure 16 Graphical determination of Sm values

are the spacing of local peaks of the profile (in mm);

n is the number of spacings included;

Figure 17 Graphical determination of S values

Figure 18 Graphical determination of tp values

5 Statements of surface roughness

5.4 Cut-off values

5.6 Production process

Figure 19 Stylus acting midway between two skids

Table 3 Evaluation lengths

Predetermined evaluation length

Running evaluation length

6.4 Values of vertical and horizontal magnification

Figure 20 Profile instrument frequency response

NOTE Because of practical difficulties in measurement at the very short

7.2 Deviations of transmission coefficients

Figure 21 Permissible deviations of the transmission coefficient

Parallel to the plane of projection of the

Perpendicular to the plane of

Crossed in two slant directions relative

Approximately circular relative to the

Approximately radial relative to

Figure 22 Symbols for the direction of lay

Appendix A Parameter values

Table 7 Preferred nominal values for

Table 8 Preferred nominal values for mean

Appendix B Method divergence of instrument reading

Ra from least squares