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Layout of Analog
CMOS
Integrated Circuit
Part 3
Outline
Introduction
Process and Overview Topics
Transistors and Basic Cells Layout
Passive components: Resistors, Capacitors
System level Mixed-signal Layout
Integrated Capacitors
Capacitors in IC are parallel plate capacitors
No fringing effect
C=
0 r
WL
t ox
Material
SiO2 Dry Oxide
SiO2 Plasma
Si3N4 LPCVD
Si3N4 Plasma
Rel. Permittivity
3.9
4.9
6-7
6-9
Diel. Strength
11 V/nm
3-6 V/nm
10 V/nm
5 V/nm
Sandwich
Lateral plates
(flux capacitor)
Poly- diffusion
Poly-channel
F. Maloberti - Layout of Analog CMOS IC
Extra mask
0 r
C=
WL
t ox
2
C r t ox
+
=
C r t ox
F. Maloberti - Layout of Analog CMOS IC
L 2 W 2
+
+
L W
Impurities
t ox
t ox
Grow rate
Bias condition
Bias history (for CVD)
Stress
Temperature
L W
L W
Etching
Alignment
Layout of Capacitors
poly 1
metal
contact
poly 2
poly 2
on thick
oxide
area without
poly 1
(thick oxide)
poly 1
contact
C1
TC1
C2
TC2
C3
TC3
C 2 = C1
C3 = 2C1
C4 = 4C1
C5 = 8C1
C4
TC4
C5
TC5
Matching of Capacitors
Matching accuracy is better than matched resistors, because :
<<
W
W
<
W cap W res
t ox
t ox
x j
<
x j
10
Undercut Effect
W = W - 2x
L = L - 2x
Effective area :
A = WL = WL - 2(L + W)x
A= A - Px
The undercut effect gives the
same proportional reduction if
the perimeter-area ratio is kept
constant
11
12
Fringing Effect
Equation
C=
0 r
WL
t ox
is an approximation
tox
tox
Fringing
field
0 r
C=
(W tox )( L tox ) + C fring
tox
13
Type
tox
nm
Voltage
Accuracy Temperature
Coefficient Coefficient
ppm/V
ppm/oC
%
7 - 14
20 - 50
60 - 300
poly - diff.
15 - 20
poly I - poly II
15 -25
6 - 12
20 - 50
40 - 200
metal - poly
500 - 700
6 - 12
50 - 100
40 - 200
metal - diff.
1200 - 1400
6 - 12
50 - 100
60 - 300
6 - 12
50 - 100
40 200
14
Parasitic Capacitances
diffusion
poly-poly or poly-metal
Cp,b
0.05C
0.02 C
Cp,t
0.01C
0.005 C
15
High impedance
node connected
to the top plate
16
Integrated Capacitors
Issues to remember
Use unit capacitors
Make bigger capacitors integer multiples of the
unit capacitor
Use common centroid layout to match capacitors
Use multiple contacts to lower series resistance
17
L
R = 2R cont + R
W
The endings resistance can be significant!
18
Diffused Resistances
a,b) diffusion
d) Pinched well
19
Polysilicon Resistances
Conductive layers
can be used to shield
the conductor-oxideconductor structure
20
21
22
Prevents
lateral leakage
F. Maloberti - Layout of Analog CMOS IC
23
Features of Resistors
Type
of layer
n + diff
Sheet
Voltage
Accuracy Temperature
Resistance
Coefficient Coefficient
ppm/V
ppm/oC
/0
%
30 - 50
20 - 40
200 - 1K
50 - 300
p + diff
50 -150
20 - 40
200 - 1K
50 - 300
n - well
2K - 4K
15 - 30
5K
10K
p - well
3K - 6K
15 - 30
5K
10K
pinched n - well
6K - 10K
25 - 40
10K
20
pinched p - well
9K - 13K
25 - 40
10K
20
first poly
20 - 40
25 - 40
500 - 1500
20 - 200
second poly
15 - 40
25 - 40
500 - 1500
20 - 200
24
Resistors Accuracy
R=
L
L
R =
W
W xj
R L W x j
+
=
+
+
R L W x j
L
W
<<
L
W
25
Accuracy :
Absolute accuracy is poor because of the large parameter drift
Ratio (or matching) accuracy is better because it depends on the local
variation of parameters.
26
L W
L W Etching
Boundary
Side diffusivity
F. Maloberti - Layout of Analog CMOS IC
27
x j
xj
Implant dose
Side diffusivity
Deposition rate
Other Elements
Plastic packages cause a large pressure on the die (= 800 Atm.). It determines
a variation of the resistivity.
For <100> material the variation is unisotropic, so the minimum is get if the
resistance have a 45o orientation.
compensated
Temperature :
Temperature gradient on the
chip may produce thermal
induced mismatch.
uncompensated
28
Effect of Etching
Wet etching : isotropic (undercut effect)
HF for SiO2 ; H3PO4 for Al
x for polysilicon may be 0.35 - 0.5 with
standard deviation 0.02 .
Reactive ion etching (R.I.E.)(plasma etching
associated to bombardment) : unisotropic.
x for polysilicon is 0.2 with standard deviation 0.015
Boundary :
The etching depends on the
boundary conditions
Use of dummy strips
F. Maloberti - Layout of Analog CMOS IC
29
Side Diffusion
Contribution of Endings
30
R1
R2
R2
R1
121212212121
Exercise: draw a 121212121212 connection and compare the two solutions
Exercise: draw a common centroid structure (12 elements per resistor)
F. Maloberti - Layout of Analog CMOS IC
31
Resistor Guidelines
For matching :
For good TC :
Use of n+ or p+ layers
Use of poly layers
32
Simple Model
Field oxide
T1
Poly
T2
Deposited
oxide (ILO)
Substrate
R1
T1
C1
C2
SUBS
(A)
33
R2
C1
C2
SUBS
R1
T1
T2
(B)
T2
C3
Metal Resisitors
The sheet resistance of Al metallization is around 100 m/
Current
lead
Ld
Sense
lead
Wd
Sense lead
Current lead
(MTL-1)
Wd
Ld
34
(B)
Sliding contact:
requires to change the
contact mask only
(A)
Trimpad
Metal fuse
and
Poly-fuse
Trimpad
Metal
Nitride
opening
Nitride
opening
(A)
35
Low-sheet
poly
(B)
Rx
F1
4Rlsb
F1
F2
F3
2Rlsb
Rmsb
F3
F2
Rmsb/2
Rmsb/4
Rlsb
(B)
(A)
36
Rx
37
Integrated Resistors
Issue to remember
38