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1232
20 -
TFIANSlElCT DIPOLE
LAYER
- %I
d5-
INTRODUCTION
We report a new mode of operation, the hybrid mode [l], using the
bulk differential negative resistance associated with the GUM effect [2].
This mode is characterized by having the domain formation time (T,) the
same order of magnitude as the active portion of the RF period. Thus it
represents a cross between the domain and LSA modes in that the sample
has a growing, but not a mature, dipole layer over a large portion of the
active RF period. In contrast with the LSA mode, where the growth of
space charge is limited, the traveling domain may form underhybrid
mode operation and it is subsequently annihilated during thepassive portion of the RF interval. The hybrid mode has the advantages of frequency
tunability over a broad band, and it can be operated in a very wide range
of R F circuits and load conditions.
g2
0-
-5.0
5-
ne / t
Fig. 1 .
IO
(s/cU~)
Eficicncy and negative conductance versus RF bias voltage for hybrid mode.
Same curves for LSA mode (dashedline) are also shown for comparison.
I
MODEL
The calculation of negative conductance and efficiency was done by
first finding a dynamic I,V characteristic for each set of operating conditions (no, L,V,, &,A, where 5 is the total current less the capacitive current. For a time less than T,, it can be shown that an exponentially growing
dipole layer is present, and the Ze-V characteristic is the same as the
(n,ev)-(EL) curve if a linear *E curve is used. For the hybrid mode, it is
a good approximation to take T, to be the time when the low field outside
the growing domain drops to the threshold field. For a time greater than
T, one can assume that the domain will readjust itself instantly after a
change of external voltage provided that [3] N o / f z 5 x IO4 s/cm. Then
the 4-V characteristic for t > T, can be described by the model proposed
by Butcher et al. [4]. Once the I,- V characteristic is obtained, the RF output power and efficiency can be easily calculated.
RESULTS OF CALCULATIONS
AND COMPARISONS
WITH
I
\
I
I
EXPERIMENT
around 12 percent are commonly obtained.Epitaxial GaAs n+-n-n+ sandwich structures prepared by F. V. Williams of Monsanto were used for
these tests. Data given in Fig. 3 were obtained from wafer 647298-5 with
~ , a low-field
active layer 10.3 pn thick, doping density 1.4 x 10 ~ m - and
mobility of 6500 cm2/v.s. The operating bias voltage is eight times the
threshold voltage. Theoretical efficiency curves of the hybrid mode and
the LSA mode are also included in Fig. 3. It is clearly seen that the no/
values of these experimental points alllie outside therange ofthe allowable
LSA operation, yet they agree fairly well with the hybrid mode theory.
1233
PROCEEDINGSLETTERS
The experimentally obtained efficiency is slightly less than what this theory
predicts. This may be due to the W circuit loss.
30
A
ACKNOWLEDGMENT
The authorswish to thankJ. B. GUM, C. A. Lee, and L. F. Eastman for
many valuable discussions.
HD-CHIJNGHUANC
LE A. MACKENZIE
Monsanto Company
St. Louis, Mo.
20
10
REFERENCI3
[ I ] At the time this work was completed the authors notiad that a numerical calculation
for the hybrid mode was carried on independently in Englatldby W. Fawcett and I. Boa.
[Z] J. B. Gunn, Microwave oscillationsof Current in 111-V semiconductors, Solid-Sfufe
[3]
March 1967.
Ytg
-D
T z0.2 V S , T = 0 . 4 U s , T = @ . 6 G S , T =@.8 p s
1
fa)
July 1%7.
(CJ
Fig. I . Typical I- Y characteristics of bulk n-InSb under magnetic lield. (a) Time depcndence. Applied pulse width =I p : T,=sampling time after the application of pulse
voltage. Applied magnetic field (IO LC) is parallel to the current flow. (b) Mapetic field
dependence. Applied magnetic field is parallel to the current flow. (c)Andepmdence, with 0 as an angkbetween the current flow in the bulk and the applied magnetic
field (6 LG).
begins to occur with the increasing magnetic field, and the average conductivity of the bulk is increased during the instabilities. The curves obtained show an S-type differential negative resistance during the transition
from stable to unstable I-V characteri~tics.~~~
Fig. l(c) shows the angular
dependence of I-V characteristics, 0 being an angle between the applied