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G. T. Heydt
Electrical and Communications Systems
National Science Foundation
Washington, DC 20550
Abstract
This paper
I. T h e Hartley Transform
00
X(Y)=
x(t) cas(t) d t
(1)
-03
- sine function
This paper
cas(t) = cos(t)
+ sin(t) .
periodic
switching
surges
and
transformer
inrush
or
to be a product,
oc,
Z(t) = x
=z
* i(t).
* y(t) = J
x(t -.)Y(T)dT
--M
Z ( V ) = -2[ X ( U ) Y ( V )
+ X(-V)Y(Y) + X(Y)Y(-Y)
- X(-U).(-@].
N-1
X(kAv) =
x(iAT) cas(ikATAv)
(3)
i=O
tial.
is an exact calculation of the DHT (in the same way that the
Fourier transform).
v(t) = z
1
V(U)= (Z(v)I(v)
- Z(-U)I(Y)
2
* i(t)
- Z(U)I(-U) - Z ( - l ~ ) I ( - L ~ ) ~ )
Equation (4) is purely real, a fact which suggests computational convenience over the Fourier transform. However, the
several terms in (4) are clearly less convenient than the
and the discrete Hartley and Fourier transform pairs
X(kAv)
X(kAR)
++
++
Fourier analog,
x(iAT)
For this reason, special cases and symmetries are studied to
x(iAT)
are related by
gested the use of (4) for the calculation of bus voltages due to
nonsinusoidal injection currents in [5]. The main application
Im(X(kAR))]An = A y
X(kAv) = Re(X(kAn) -I-
X(w)
loads. These loads typically have load currents i(t) which are
[Ev(X(v)) - jOd(X(v))]v=L,
For example,
X(kAR) = [Ev(X(kAv)) - j O d ( X ( k i \ u ) ) ] ~ , = ~ n
frequencies above 20 K H z .
parts are
The symmetry properties of I(kAv) are readily found
1
Ev(X(v)) = 5 ( X ( Y )
+ X(-Y))
1
Od(X(v)) = - (X(Y) X(-U)).
2
x(nAT) = x(-nAT)
-+
X(n4v) = X(-nAL/).
x(nAT) = -x(-nAT)
-+ X(nAu) = X(-nAu).
These results are also shown using (3) directly along with the
steps:
the case
z(nAT) = x
= nAT.
i(t) at
* y(nAT)
ii.
iii.
at
Z(lir)
w =nAn.
iv.
v.
(5)
(6)
+ (N/2)),
v(nAT) =
Z(w)I(w) eJwnATdlir
(7)
e(nAT) = - (x(nAT)
2
+ x(-nAT))
1
o(nAT) = - (x(nAT) - x(-nAT))
2
x(nAT) = e(nAT)
+ o(nAT).
Then E(nAu) and O(nAu) are purely even and odd respec-
of
Au=-.
shown in the figure for illustrative convenience; however,
2n
NAT
0.
samples.
+ Z(-nAv)I(nAu)
+ Z(nAu)I(-nAv)
- (n-Av)I(-nAv)
Use of samples of
time domain aliasing. Reference t o the DFT will help illustrate this point: it is necessary to sample Z(W) at
1815
U=-
27r
NAT
iii.
iv.
Leakage [SI
,-
i.
ii.
iii.
Fig. 1.
wave, e.g.,
smoothing. Finally, the inverse DFT of the product of samples is taken to form i(nAT).
i(t) = sin f i t
+ sin V i t,
method are identical to those of the use of the DFT for this
i.
ii.
1816
Power Delivery.
V.
A. A. Girgis, F. M. Ham, "A Quantitative Study of Pitfalls in the FFT," IEEE Trans. on Aerospace and Elec-
Conclusions
439.
Analysis of
VI. A c k n o w l e d g e m e n t
References
PI
121
131
141
151
G. Heydt, K. Olejniczak, R. Sparks, E. Viscito, "Application of the Hartley Transform for the Analysis of the
1817
Electromagnetic
Transients
on Non-