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STANDARD
JESD65B
(Revision of JESD65-A)
SEPTEMBER 2003
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PLEASE!
DONT VIOLATE
THE
LAW!
Scope
This standard defines skew specifications and skew testing for standard logic devices.
The purpose is to provide a standard for specifications to achieve uniformity, multiplicity of sources,
elimination of confusion, and ease of device specification and design by users.
lock ()
tL
tL()
trecL()
nL
ODC
Notes
1
1
1, 4
2, 5
2, 5
1, 3, 5
Symbol
tjit(cc)
tjit(per)
tjit()
Unit
ps
ps
ps
Notes
5, 6
5, 6
5, 6
NOTE 5 Test Loads and Conditions are shown in Clause 4 Standard test circuits for skew testing for the designated
voltage range.
NOTE 6 Operating frequency range is 10 MHz to 100 MHz.
OUTPUT 1
OUTPUT 2
INPUT
OUTPUT 3
OUTPUT 4
OUTPUT 1
OUTPUT 2
INPUT
OUTPUT 3
OUTPUT 4
Vtest
Vref
0V
INPUT
VOH
Vref
VOL
OUTPUT 1
tsk(o)
tsk(o)
VOH
Vref
VOL
OUTPUT 3
Each input-to-output delay time is tested individually, and the difference is the skew.
OUTPUT 1
INPUT 1
OUTPUT 2
OUTPUT 3
INPUT 2
OUTPUT 4
INPUT 1
OUTPUT 1
INPUT 2
OUTPUT 2
INPUT 3
OUTPUT 3
INPUT 4
OUTPUT 4
Vtest
Vref
0V
INPUT
OUTPUT 1
tPLH(1)
tPHL(1)
VOH
Vref
VOL
tPHL(3)
VOH
Vref
VOL
tPLH(3)
OUTPUT 3
tsk(LH)
tPLH(1)
- tPLH(3)
tsk(HL)
tPHL(1)
- tPHL(3)
EXAMPLE 2
LOGIC DEVICE 1
LOGIC DEVICE 2
OUTPUT 1
INPUT
OUTPUT 2
OUTPUT 1
INPUT
OUTPUT 2
OUTPUT 3
OUTPUT 3
OUTPUT 4
OUTPUT 4
Vtest
Vref
0V
OUTPUT 1, PART 1
VOH
Vref
VOL
tsk(pr)
tsk(pr)
OUTPUT 1, PART 2
VOH
Vref
VOL
INPUT
LOGIC DEVICE 2
OUTPUT 1
OUTPUT 1
OUTPUT 2
OUTPUT 2
OUTPUT 3
OUTPUT 4
OUTPUT 3
INPUT
OUTPUT 4
Vtest
Vref
0V
OUTPUT 1, PART 1
VOH
Vref
VOL
tsk(pp)
tsk(pp)
OUTPUT 3, PART 2
VOH
Vref
VOL
OUTPUT 1
INPUT
OUTPUT 2
OUTPUT 3
OUTPUT 4
Vtest
Vref
0V
INPUT
VOH
Vref
VOL
BANK 1 OUTPUT 1
tsk(b)
tsk(b)
BANK 1 OUTPUT 2
VOH
Vref
VOL
OUTPUT 2
OUTPUT 3
OUTPUT 4
INPUT
Vtest
Vref
0V
OUTPUT 1
VOH
Vref
VOL
tPLH
tsk(p) =
tPHL
tPLH
tPHL
OUTPUT 1
OUTPUT 2
INPUT
OUTPUT 3
OUTPUT 4
Vtest
Vref
0V
INPUT
VOH
Vref
VOL
OUTPUT 1
tsk(inv)
tsk(inv)
OUTPUT 3
VOH
Vref
VOL
VOH
Vref
VOL
tsk()
VOH
Vref
VOL
Vtest
Vref
0V
VOH
Vref
VOL
FEEDBACK INPUT
)
t(()
An example of input waveforms
dynamic phase offset (t()dyn): The incremental phase offset between the input reference clock and the
feedback input signal of a PLL resulting from modulation of the input reference clock.
total phase offset (t()TOT): The sum of static phase offset, dynamic phase offset, and phase jitter.
cycle-to-cycle period jitter (tjit(cc)): The variation in cycle time of a signal between adjacent cycles, over
a random sample of adjacent cycle pairs.
VOH
Vref
VOL
OUTPUT
tcycle n
tcycle n+1
where tcycle n and tcycle n+1 are any two adjacent cycles
measured on controlled edges.
where tcycle n and tcycle n+1 are any two adjacent cycles
measured on controlled edges, and the period of tcycle n+1
is longer than or equal to the period of tcycle n.
where tcycle n and tcycle n+1 are any two adjacent cycles
measured on controlled edges, and the period of tcycle n is
longer than or equal to the period of tcycle n+1.
IDEAL OUTPUT
1
fo
VOH
Vref
VOL
ACTUAL OUTPUT
tcycle n
tjit(per) =
tcycle n
1
fo
t hp(m)
1 |
t jit(hper) = | t hp(m) - t hp(n)
2 fo
t hp(n)
where t hp(m) is the duration of any half cycle within the sample
and t hp(n) is the duration of any other half cycle
Vtest
Vref
0V
FEEDBACK INPUT
)
t(()
VOH
Vref
VOL
phase locked [lock ()]: The condition of a PLL device where the reference input and the feedback input
remain within the designated static phase offset.
NOTE
This definition requires the reference input to remain stable within a designated tolerance.
power-up PLL lock time (tL): During PLL power up, the time required for the PLL to lock after achieving
the minimum specified operating voltage.
PLL lock time after frequency change (tL()): The time required for a PLL to lock after the input
reference clock frequency changes.
NOTE The PLL lock time after frequency change is measured from the time the new input reference clock frequency
is stable, to the time the PLL locks.
PLL recovery time (trecL()): The time interval required for a PLL to recover phase lock after the input
cycles to acquire PLL lock (nL): The number of input clock cycles required for a PLL to lock when
operating in the guaranteed operating range with a stable input reference clock frequency.
PLL output duty cycle (ODC): The ratio of (1) the time interval from the PLL-controlled edge to the
noncontrolled edge to (2) the time interval between PLL-controlled edges, expressed as a percentage (%).
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JESD65B
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