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4.2
Acceptance Test Manual
Product code P42022-A5248-H420
1 (72)
The information in this document is subject to change without notice and describes only the product
defined in the introduction of this documentation. This documentation is intended for the use of Nokia
Siemens Networks customers only for the purposes of the agreement under which the document is
submitted, and no part of it may be used, reproduced, modified or transmitted in any form or means
without the prior written permission of Nokia Siemens Networks. The documentation has been
prepared to be used by professional and properly trained personnel, and the customer assumes full
responsibility when using it. Nokia Siemens Networks welcomes customer comments as part of the
process of continuous development and improvement of the documentation.
The information or statements given in this documentation concerning the suitability, capacity, or
performance of the mentioned hardware or software products are given as is and all liability arising
in connection with such hardware or software products shall be defined conclusively and finally in a
separate agreement between Nokia Siemens Networks and the customer. However, Nokia Siemens
Networks has made all reasonable efforts to ensure that the instructions contained in the document
are adequate and free of material errors and omissions. Nokia Siemens Networks will, if deemed
necessary by Nokia Siemens Networks, explain issues which may not be covered by the document.
Nokia Siemens Networks will correct errors in this documentation as soon as possible. IN NO EVENT
WILL NOKIA SIEMENS NETWORKS BE LIABLE FOR ERRORS IN THIS DOCUMENTATION OR
FOR ANY DAMAGES, INCLUDING BUT NOT LIMITED TO SPECIAL, DIRECT, INDIRECT,
INCIDENTAL OR CONSEQUENTIAL OR ANY LOSSES, SUCH AS BUT NOT LIMITED TO LOSS
OF PROFIT, REVENUE, BUSINESS INTERRUPTION, BUSINESS OPPORTUNITY OR DATA,THAT
MAY ARISE FROM THE USE OF THIS DOCUMENT OR THE INFORMATION IN IT.
This documentation and the product it describes are considered protected by copyrights and other
intellectual property rights according to the applicable laws.
The wave logo is a trademark of Nokia Siemens Networks Oy. Nokia is a registered trademark of
Nokia Corporation. Siemens is a registered trademark of Siemens AG.
Other product names mentioned in this document may be trademarks of their respective owners, and
they are mentioned for identification purposes only.
Copyright Nokia Siemens Networks 2007. All rights reserved.
Statements of compliance
CE statement
The CE conformity declaration for the product is fulfilled when the system is built and cabled in line with the
information given in the manual and the documentation specified within it, such as installation instructions, cable
lists or the like. Where necessary project-specific documentation should be taken into consideration. Deviations
from the specifications or independent modifications to the layout, such as use of cable types with lower
screening values for example, can lead to violation of the CE protection requirements. In such cases the
conformity declaration is invalidated. The responsibility for any problems which subsequently arise rests with the
party responsible for deviating from the installation specifications.
3 (72)
hiT7035 R4.2L4.xx
Number of Pages:
Remarks:
4 (72)
Summary of changes
Contents
1 Preface 8
2 Test Preparation ..................................................................................9
2.1 Inventory List.......................................................................................9
2.1.1 Circuit Pack List of hiT7035..............................................................9
2.1.2 Load number of hiT7035 and hiT7035 LCT...................................10
2.2 Tools and Test Equipment List..........................................................10
3 Test result...........................................................................................11
4 Acceptance test procedure................................................................13
4.1 Interface Test....................................................................................13
4.1.1 Test of Battery Voltage...................................................................13
4.1.2 Check of the Management port.......................................................14
4.1.3 Function Test of User Channel (F1)................................................15
4.1.4 Function Test of EOW channels.....................................................16
4.1.5 Function Test of MDI/MDO.............................................................17
4.1.6 E1 (75ohm) Cabling Test................................................................18
4.1.7 E1 (120ohm) Cabling Test..............................................................20
4.1.8 E3/DS3 Cabling Test......................................................................22
4.1.9 STM-1E Cabling Test.....................................................................23
4.1.10 STM-1 Optical Mean Launch Power.............................................25
4.1.11 STM-4 Optical Mean Launch Power.............................................26
4.1.12 STM-16 Optical Mean Launch Power...........................................28
4.1.13 STM-1 Optical Receive Power......................................................30
4.1.14 STM-4 Optical Receive Power......................................................32
4.1.15 STM-16 Optical Receive Power....................................................34
4.1.16 BOA Transmit Power....................................................................36
4.1.17 POA Transmit Power....................................................................37
4.1.18 Ethernet Performance Test RFC2544 test for 8xFE/T...............39
4.1.19 Ethernet Performance Test RFC2544 test for 8xFE/L2.............44
4.1.20 Ethernet Performance Test RFC2544 Test for 1xGE/T.............49
4.1.21 IMA Function Test........................................................................54
4.2 Network Test.....................................................................................55
4.2.1 Bit Error Test on E1 (12h)...............................................................55
4.2.2 Bit Error Test on E3 (12h)...............................................................57
4.2.3 Bit Error Test on DS3 (12h)............................................................58
4.2.4 Bit Error Test on Line Side (12h, STM-1 trib)..................................60
4.2.5 Bit Error Test on Line Side (12h, STM-1E trib)...............................61
4.2.6 Bit Error Test on Line Side (12h, STM-4 trib)..................................63
4.2.7 Bit Error Test on Line Side (12h, STM-16 trib)................................64
4.2.8 Packet Loss Test on Ethernet Card (12h, 8xFE/T).........................66
4.2.9 Packet Loss Test on Ethernet Card (12h, 8xFE/L2)........................67
4.2.10 Packet Loss Test on Ethernet Card (12h, 1xGE/T Card)..............69
5 (72)
Abbreviations.......................................................................................71
`
6 (72)
Summary of changes
Summary of changes
Re-issue date
Reason
Modified by
Version
2007-7-13
Wang Xiaowei
01
2007-7-24
Yan Junhua
02
2007-7-31
Yan Junhua
03
2007-8-6
Yan Junhua
04
7 (72)
Preface
The purpose of this manual is to provide the necessary test steps and their
explanations for an acceptance test of hiT7035 R4.2.
The System-acceptance personnel of the customer and/or of the
manufacturer will carry out the acceptance tests after installation and
commissioning.
If the system user wishes to perform the acceptance test procedures,
however, he must meet the following conditions:
8 (72)
PC operation knowledge,
Test Preparation
2.1
Inventory List
2.1.1
CP Type
CP Code
S/N number
SC
PWR1
PWR2
CC1_LC
CC2_LC
LC1
LC2
LC3
LC4
LC5
LC6
LC7
LC8
LC9
LC10
LC11
IO1
9 (72)
Slot name
CP Type
CP Code
S/N number
IO2
IO3
IO4
IO5
IO6
IO7
ST-CLK
2.1.2
2.2
Equipment
Type
Recommendation
SDH/PDH Analyzer
ATM Analyzer
Ethernet test
set
IEEE802.3 data
Analyzer
Range 40+10dBm
Cleaning material
Fiber cables
Multimeter
Actual Type
ESD wristband
10 (72)
Test result
Test Item
Test result
Pass
Fail
Memo
11 (72)
Test Item
Test result
Pass
Fail
Memo
12 (72)
4.1
Interface Test
4.1.1
4.1.1.1
Test Purpose:
Test Setup:
Connect Multimeter with Power Distribution Panel, located on the top of the
rack
4.1.1.3
Test diagram:
NA
4.1.1.4
Multimeter
4.1.1.5
Test procedure:
Use the Multimeter to check DC voltage at the Power Distribution Panel of the
rack for both power supply feeders.
4.1.1.6
Expected Result:
-40V to 72V
13 (72)
4.1.1.7
Result Record
DC Voltage
Input1
Input2
4.1.1.8
Not Complied
Complied
Not Complied
0.1 hour
4.1.2
4.1.2.1
Test Purpose:
Test Setup:
Test diagram:
PC/Laptop computer
MGMT
Port
NE
4.1.2.4
14 (72)
Test procedure:
1.
2.
4.1.2.5
Expected result:
Result Record:
C omplied
4.1.2.7
Not Complied
0.5 hour
4.1.3
4.1.3.1
Test Purpose:
Note
This test is only done as field acceptance test if the User channel is used.
4.1.3.2
Test Setup:
Loop with
1.
Connect a SDH analyzer to one optical interface of NE;
RJ45
2.
Loop EOW port with a RJ45 connector.
connetor
3.
R
J
4
5
C
o
n
n
e
c
t
o
r
Product code P42022-A5248-H420
Issue 2.0
EOW
Nokia Siemens Networks
Port
o
o
p
w
15 (72)
4.1.3.3
Test diagram:
R
J
4
5
C
o
n
n
e
c
t
o
r
o
r
t
Line
Port
SDH Analyzer
4.1.3.4
L
o
Recommended Test Analyzer:
o
p
SDH Analyzer
4.1.3.5
Test procedure:
1.
2.
4.1.3.6
4.1.3.7
4.1.3.8
w
i
t one line port such as STM-1 port by LCT.
Create OHCC to
h
3.
4.
O at SDH analyzer.
Check for error free transmission
4
5
C
P
o
o
The overhead BER should
run errorr free
n
n
t
e
Result Record:
c
t Complied
F1 Byte
Not Complied
o
r
Estimated Time consumption
Expected Result:
0.5 hour
p
4.1.4
w
Function Test of EOW
channels
4.1.4.1
Test Purpose:
i
t
h
This procedure tests Rthat EOW-Channels (E1 and E2) are working correctly.
Note
16 (72)
J
4
5
4.1.4.2
4.1.4.3
Test Setup:
1.
2.
Test diagram:
EOW
BOX
EOW
Port
Line
Port
4.1.4.4
4.1.4.5
Line
Port
EOW
Port
EOW
BOX
Test procedure:
1.
2.
3.
Expected Result:
4.1.4.7
Result Record:
E1 byte
Complied
Not Complied
E2 byte
Complied
Not Complied
1 hour
4.1.5
4.1.5.1
Test Purpose:
17 (72)
Note
This test is only done, if MDI/MDO is connected to a distributor (external equipment).
4.1.5.2
Test Setup:
Test Diagram:
NA
4.1.5.4
Test procedure:
1.
2.
4.1.5.6
4.1.5.7
Expected Result:
1.
2.
Result Record
MDO
Complied
Not Complied
MDI
Complied
Not Complied
1 hour
4.1.6
4.1.6.1
Test Purpose:
This test gives the steps required to check the E1 (75ohm) port cabling of the
hiT7035 63xE1 75ohm card.
18 (72)
4.1.6.2
Test Setup:
1.
2.
Loop Line port with external fiber, using a 10dB attenuator if needed.
4.1.6.3
Test diagram:
4.1.6.4
SDH/PDH Analyzer
4.1.6.5
4.1.6.6
Test procedure:
1.
2.
Do a short (few seconds) bit error test with the SDH/PDH analyzer for all
E1 ports;
3.
Expected Result:
No bit errors.
L
i
n
19 (72)
4.1.6.7
Result record:
C omplied
4.1.6.8
Not Complied
1 hour
4.1.7
4.1.7.1
Test Purpose:
This test gives the steps required to check the E1 (120ohm) port cabling of the
hiT7035 63xE1 120ohm card.
4.1.7.2
20 (72)
Test Setup:
1.
2.
Loop Line port with external fiber, using a 10dB attenuator if needed.
4.1.7.3
4.1.7.4
Test diagram:
SDH/PDH Analyzer
4.1.7.5
4.1.7.6
Test procedure:
L
i
n
e
1.
2.
Do a short (few seconds) bit error test with the SDH/PDH analyzer for all
E1 ports;
3.
Expected Result:
No bit errors.
4.1.7.7
Result record:
Complied
4.1.7.8
Not Complied
1 hour
21 (72)
4.1.8
4.1.8.1
Test Purpose:
This test gives the steps required to check the E3/DS3 port cabling of the
hiT7035 E3/DS3 card.
4.1.8.2
4.1.8.3
4.1.8.4
Test Setup:
1.
2.
Loop Line port with external fiber, using a 10dB attenuator if needed.
Test diagram:
SDH/PDH Analyzer
4.1.8.5
22 (72)
Test procedure:
L
i
n
e
1.
2.
Do a short (few seconds) bit error test with the SDH/PDH analyzer for all
E3/DS3 ports;
3.
4.1.8.6
Expected Result:
No bit errors.
4.1.8.7
Result record:
Complied
4.1.8.8
Not Complied
1 hour
4.1.9
4.1.9.1
Test Purpose:
This test gives the steps required to check the STM-1E port cabling of the
hiT7035 STM-1E card.
4.1.9.2
Test Setup:
1.
2.
Loop Line port with external fiber, using a 10dB attenuator if needed.
23 (72)
4.1.9.3
Test diagram:
4.1.9.4
SDH/PDH Analyzer
4.1.9.5
4.1.9.6
Test procedure:
1.
2.
Do a short (few seconds) bit error test with the SDH/PDH analyzer for all
STM-1E ports;
3.
Expected Result:
No bit errors.
4.1.9.7
Result record:
Complied
4.1.9.8
1 hour
24 (72)
Not Complied
L
i
n
e
4.1.10
4.1.10.1
Test Purpose:
The test verifies that the optical mean launched power of STM1 port is within
specification. The specification is based on the recommendations ITU-T
G.957.
4.1.10.2
Test setup:
Test diagram:
PC/Laptop computer
MGMT Port
L
i
n
e
L
i
n
e
STM -1
optical.
NE
ODF
Power Meter
4.1.10.4
Test procedure:
1.
2.
25 (72)
4.1.10.6
4.1.10.7
Expected Result:
SFP Type
ITU
Order number
S1.1
S42025-L5135A1
-15dBm . -8dBm
L1.1
S42025-L5134A1
-5dBm . 0dBm
L1.2
S42025-L5133A1
-5dBm . 0dBm
V.1.2
S42025-L5149-A1
0dBm . 4dBm
Result Record:
Mean launch Power in dBm
Slot
4.1.10.8
Port1
Port2
Port3
Port4
Complied
Not Complied
Complied
Not Complied
0.1 hour
4.1.11
4.1.11.1
Test Purpose:
The test verifies that the optical mean launched power of STM-4 port is within
specification. The specification is based on the recommendations ITU-T
G.957.
4.1.11.2
Test setup:
26 (72)
4.1.11.3
Test diagram:
4.1.11.4
4.1.11.6
Test procedure:
1.
2.
Expected Result:
SFP Type
ITU
Order number
Mean launch
power
S4.1
S42025-L5132A1
-15dBm . -8dBm
L4.1
S42025-L5131A1
-3dBm . 2dBm
L4.2
S42025-L5130A1
-3dBm . 2dBm
V4.2
S42025-L5148A1
0dBm . 4dBm
27 (72)
4.1.11.7
Result Record:
Mean launch Power in dBm
Slot
4.1.11.8
Port1
Port2
Port3
Port4
Complied
Not Complied
Complied
Not Complied
0.1 hour
4.1.12
4.1.12.1
Test Purpose:
The test verifies that the optical mean launched power of STM-16 port is within
specification. The specification is based on the recommendations ITU-T
G.957.
4.1.12.2
Test setup:
28 (72)
4.1.12.3
Test diagram:
4.1.12.4
4.1.12.6
Test procedure:
1.
2.
Expected Result:
SFP Type
ITU
Order number
Mean launch
power
S16.1
S42025-L5129A1
-5dBm . 0dBm
L16.1
S42025-L5128A1
-2dBm . 3dBm
L16.2
S42025-L5127A1
-2dBm . 3dBm
V16.2
S42025-L5141A1
-2dBm . 3dBm
U16.2
S42025-L5142A1
-2dBm . 3dBm
29 (72)
4.1.12.7
Result Record:
Mean launch Power in dBm
Slot
4.1.12.8
Port1
Port2
Port3
Port4
Complied
Not Complied
Complied
Not Complied
0.1 hour
4.1.13
4.1.13.1
Test Purpose:
The test verifies that the optical receive power of STM1 port is within
specification. The specification is based on the recommendations ITU-T
G.957.
4.1.13.2
Test setup:
30 (72)
4.1.13.3
Test diagram:
4.1.13.4
4.1.13.6
Test procedure:
1.
2.
Expected Result:
SFP Type
ITU
Order number
Receiving power
S1.1
S42025-L5135A1
-28dBm . -8dBm
L1.1
S42025-L5134A1
-34dBm . -10dBm
31 (72)
4.1.13.7
SFP Type
ITU
Order number
Receiving power
L1.2
S42025-L5133A1
-34dBm . -10dBm
V1.2
S42025-L5149-A1
-34dBm . -10dBm
Expected Result:
Receive Power in dBm
Slot
4.1.13.8
Port1
Port2
Port3
Not Complied
Complied
Not Complied
0.1 hour
4.1.14
4.1.14.1
Test Purpose:
The test verifies that the optical receive power of STM-4 port is within
specification. The specification is based on the recommendations ITU-T
G.957.
4.1.14.2
Test setup:
32 (72)
4.1.14.3
Test diagram:
4.1.14.4
4.1.14.6
Test procedure:
1.
2.
Expected Result:
SFP Type
ITU
Order number
S4.1
S42025-L5132A1
L4.1
S42025-L5131A1
L4.2
S42025-L5130A1
V4.2
S42025-L5148A1
PC/Lapto
Receiving power
-28dBm . -8dBm
-28dBm . -8dBm
-28dBm . -8dBm
-34dBm . -18dBm
33 (72)
4.1.14.7
Result Record:
Receive Power in dBm
Slot
4.1.14.8
Port1
Port2
Port3
Not Complied
Complied
Not Complied
0.1 hour
4.1.15
4.1.15.1
Test Purpose:
The test verifies that the optical receive power of STM-16 port is within
specification. The specification is based on the recommendations ITU-T
G.957.
4.1.15.2
Test setup:
34 (72)
4.1.15.3
Test diagram:
4.1.15.4
4.1.15.6
Test procedure:
1.
2.
Expected Result:
PC/Lapto
SFP Type
ITU
Order number
S16.1
S42025-L5129A1
L16.1
S42025-L5128A1
L16.2
S42025-L5127A1
V16.2
S42025-L5141A1
-28dBm . -9dBm
U16.2
S42025-L5142A1
-28dBm . -9dBm
Receiving power
-18dBm . 0dBm
-27dBm . -9dBm
-28dBm . -9dBm
35 (72)
4.1.15.7
Result Record:
Receive Power in dBm
Slot
4.1.15.8
Port1
Port2
Port3
Not Complied
Complied
Not Complied
0.1 hour
4.1.16
4.1.16.1
Test Purpose:
Test setup:
Connect one optical card Tx into BOA Rx. If necessary, add an adjustable
attenuator to make the received optical power of BOA card in the allowed
range.
4.1.16.3
Test diagram:
Line card
Rx
Attenuator
Tx
Local station
4.1.16.4
36 (72)
4.1.16.5
Test procedure:
1.
2.
13dBm BOA
-10dBm . 3dBm
15dBm BOA
-10dBm . 3dBm
18dBm BOA
3.
4.1.16.6
4.1.16.7
Expected Result:
BOA Type
Order number
launch power
13dBm BOA
S42024-L5465-A1
13dBm
15dBm BOA
S42024-L5466-A1
15dBm
18dBm BOA
S42024-L5467-A1
18dBm
Result Record:
BOA Type
launch power
13dBm BOA
15dBm BOA
18dBm BOA
4.1.16.8
0.1 hour
4.1.17
4.1.17.1
Test Purpose:
37 (72)
4.1.17.2
Test setup:
Connect one optical card Tx into POA Rx. If necessary, add an adjustable
attenuator to make the received optical power of POA card in the allowed
range.
4.1.17.3
Test diagram:
Rx
Line card
Attenuator
Tx
Local station
4.1.17.4
Test procedure:
4.
5.
6.
4.1.17.6
38 (72)
POA Type
20dB POA
-35dBm . -15dBm
Expected Result:
BOA Type
Order number
launch power
20dB POA
S42024-L5468-A1
-15dBm . 5dBm
4.1.17.7
Result Record:
POA Type
launch power
20dB POA
4.1.18
4.1.18.1
Test Purpose:
This test gives the steps required to measure the Ethernet performance of the
8xFE/T card of hiT 7035.
4.1.18.2
Test setup:
Connect the port1 and port2 of Data analyzer to port1 and port2 of FE card on
local station.
4.1.18.3
Test diagram:
4.1.18.4
Data Analyzer
4.1.18.5
Test procedure:
Set up a 100M Ethernet traffic according to the test diagram, the step is as
followed:
1.
2.
3.
39 (72)
4.1.18.6
4.
5.
Reference Result:
Throughput:
Frame Size
P1 to P2(pks /sec)
Total
64
100
148810
148810
128
100
84459
84459
256
100
45290
45290
512
100
23496
23496
1024
100
11973
11973
1280
100
9615
9615
1518
100
8127
8127
1522
100
8106
8106
1536
100
8033
8033
Number of trials: 1
Back-to-Back:
40 (72)
Frame Size
P1 to P2(Frames)
Total
64
100
1488100
1488100
128
100
844590
844590
256
100
452900
452900
512
100
234960
234960
1024
100
119730
119730
1280
100
96150
96150
1518
100
81270
81270
1522
100
81060
81060
1536
100
80330
80330
Number of trials: 1
Latency
Frame Size
P1 to P2(us)-S&F
Average
64
100
526.2
526.2
128
100
532.0
532.0
256
100
541.3
541.3
512
100
564.5
564.5
1024
100
606.4
606.4
1280
100
625.0
625.0
1518
100
640.7
640.7
1522
100
641.5
641.5
1536
100
641.9
641.9
Number of pairs: 1
P1 to P2 (%)
Average
64
100
0.000
0.000
128
100
0.000
0.000
256
100
0.000
0.000
512
100
0.000
0.000
1024
100
0.000
0.000
1280
100
0.000
0.000
1518
100
0.000
0.000
1522
100
0.000
0.000
1536
100
0.000
0.000
Number of trials: 1
Initial rate:100 %
41 (72)
4.1.18.7
Result Record:
Throughput:
Frame
Size
Passed
Rate(%)
P1 to P2
(pks/sec)
Total
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
Back-to-Back:
Frame
Size
Passed
Rate(%)
P1 to P2
(Frames)
Total
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
42 (72)
Latency
Frame
Size
Rate
Tested (%)
P1 to P2(us)S&F
Average
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
Rate
Tested (%)
P1 to P2 (%)
Average
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
4.1.18.8
4 hours
43 (72)
4.1.19
4.1.19.1
Test Purpose:
This test gives the steps required to measure the Ethernet performance of the
8xFE/L2 card of hiT 7035.
4.1.19.2
Test setup:
Connect the port1 and port2 of Data analyzer to port1 and port2 of FE card on
local station.
4.1.19.3
Test diagram:
4.1.19.4
Data Analyzer
4.1.19.5
Test procedure:
Set up a 100M Ethernet traffic according to the test diagram, the step is as
followed:
44 (72)
1.
2.
3.
4.
Configure both LAN1 and WAN1 with the same PVID such as 11, and in
the same VLAN list 11.
5.
Configure both LAN2 and WAN2 with the same PVID such as 22, and in
the same VLAN list 22.
6.
4.1.19.6
7.
8.
9.
10.
Reference Result:
Throughput:
Frame Size
P1 to P2(pks /sec)
Total
64
100
148810
148810
128
100
84459
84459
256
100
45290
45290
512
100
23496
23496
1024
100
11973
11973
1280
100
9615
9615
1518
100
8127
8127
1522
100
8106
8106
1536
100
8033
8033
Number of trials: 1
Back-to-Back:
Frame Size
P1 to P2(Frames)
Total
64
100
1488100
1488100
128
100
844590
844590
256
100
452900
452900
512
100
234960
234960
1024
100
119730
119730
1280
100
96150
96150
1518
100
81270
81270
1522
100
81060
81060
1536
100
80330
80330
Number of trials: 1
45 (72)
Latency
Frame Size
P1 to P2(us)-S&F
Average
64
100
304.4
304.4
128
100
319.1
319.1
256
100
349.3
349.3
512
100
404.6
404.6
1024
100
528.4
528.4
1280
100
589.5
589.5
1518
100
647.8
647.8
1522
100
649.2
649.2
1536
100
650.4
650.4
Number of pairs: 1
46 (72)
Frame Size
P1 to P2 (%)
Average
64
100
0.000
0.000
128
100
0.000
0.000
256
100
0.000
0.000
512
100
0.000
0.000
1024
100
0.000
0.000
1280
100
0.000
0.000
1518
100
0.000
0.000
1522
100
0.000
0.000
1536
100
0.000
0.000
Number of trials: 1
Initial rate:100 %
4.1.19.7
Result Record:
Throughput:
Frame
Size
Passed
Rate(%)
P1 to P2
(pks/sec)
Total
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
Throughput:
Frame
Size
Passed
Rate(%)
P1 to P2
(Frames)
Total
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
47 (72)
Latency
Frame
Size
Rate
Tested (%)
P1 to P2(us)S&F
Average
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
Rate
Tested (%)
P1 to P2 (%)
Average
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
4.1.19.8
4 hours
48 (72)
4.1.20
4.1.20.1
Test Purpose:
This test gives the steps required to measure the Ethernet performance of the
GE card (1xGE/T) of hiT 7035.
4.1.20.2
Test setup:
Test diagram:
4.1.20.4
Data Analyzer
4.1.20.5
Test procedure:
2.
3.
4.
Configure the local station Ethernet card , then we can confirm the traffic
can transfer along GE(local)CC_LC1 port(local)CC_LC2 port(local)
GE(local).
5.
49 (72)
4.1.20.6
Reference Result:
Throughput:
Frame Size
P1 to P2(pks /sec)
Total
64
68.85
1024590
1024590
128
64.91
548246
548246
256
62.44
282805
282805
512
61.29
144009
144009
1024
60.63
72590
72590
1280
59.96
57657
57657
1518
59.98
48752
48752
1522
60.00
48638
48638
1536
59.43
47746
47746
Number of trials: 1
Initial rate: 50 %
Maximum rate: 70 %
Back-to-Back:
50 (72)
Frame Size
P1 to P2(Frames)
Total
64
100.00
29061
29061
128
100.00
16493
16493
256
100.00
9946
9946
512
100.00
5161
5161
1024
100.00
2336
2336
1280
100.00
1874
1874
1518
100.00
1583
1583
1522
100.00
1582
1582
1536
100.00
1565
1565
Number of trials: 1
Latency
Frame Size
P1 to P2(us)-S&F
Average
64
60
60.7
60.7
128
60
62.7
62.7
256
60
65.7
65.7
512
60
67.5
67.5
1024
60
75.7
75.7
1280
60
80.6
80.6
1518
60
85.4
85.4
1522
60
86.0
86.0
1536
60
89.0
89.0
Number of pairs: 1
Initial rate: 60 %
Maximum rate: 60 %
P1 to P2 (%)
Average
64
60
0.000
0.000
128
60
0.000
0.000
256
60
0.000
0.000
512
60
0.000
0.000
1024
60
0.000
0.000
1280
60
0.000
0.000
1518
60
0.000
0.000
1522
60
0.000
0.000
1536
60
0.000
0.000
Number of trials: 1
Initial rate: 60 %
Maximum rate: 60 %
51 (72)
4.1.20.7
Result Record:
Throughput:
Frame
Size
Passed
Rate(%)
P1 to P2
(pks/sec)
Total
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
Back-to-Back:
Frame
Size
Passed
Rate(%)
P1 to P2
(Frames)
Total
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
52 (72)
Latency
Frame
Size
Rate
Tested (%)
P1 to P2(us)S&F
Average
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
Initial rate: 60 %
Maximum rate: 60 %
Rate
Tested (%)
P1 to P2 (%)
Average
64
Complied
Not Complied
128
Complied
Not Complied
256
Complied
Not Complied
512
Complied
Not Complied
1024
Complied
Not Complied
1280
Complied
Not Complied
1518
Complied
Not Complied
1522
Complied
Not Complied
1536
Complied
Not Complied
Number of trials: 1
4.1.20.8
4 hours
53 (72)
4.1.21
4.1.21.1
Test Purpose:
Test setup:
Connect the ATM analyzer 155M optical port to IMA IO port 1. Use fiber to
loop the line card such as STM-1 port.
Notes: Please restart the correlative IMA group, after the loop is removed.
4.1.21.3
Test diagram:
4.1.21.4
ATM analyzer
4.1.21.5
54 (72)
Test procedure:
1.
2.
Create a point to point VP/VC connection between IMA group and IMA
uplink. Such as IMA group related VPI/VCI is 255/300; IMA uplink
related VPI/VCI is 255/400
3.
Create VC-12 cross connections between the IMA group related 8 IMA
E1 ports and line card stm-1 port.
4.
Set up an ATM stream with VPI/VCI 255/400 on ATM analyzer, and run
with 16M bandwidth.
4.1.21.6
Expected Result:
Result Record:
Complied
4.1.21.8
Not Complied
30minutes
4.2
Network Test
4.2.1
4.2.1.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Bit error measurement of E1 (12hours)
4.2.1.2
Test Setup:
1.
2.
55 (72)
4.2.1.3
Test diagram:
PC/Laptop computer
Q-F
Remote Station
NE
NE
L
i
n
e
Local Station
L
i
n
e
L
i
n
e
L
i
n
e
Remote Station
E1
E1
DDF
DDF
SDH Analyser
4.2.1.4
SDH/PDH Analyzer
4.2.1.5
4.2.1.6
Test procedure:
1.
2.
Expected Result
Error free.
4.2.1.7
Result Record
Complied
4.2.1.8
Not Complied
13 hours
56 (72)
4.2.2
4.2.2.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Bit error measurement of E3 (12hours)
4.2.2.2
4.2.2.3
Test Setup:
1.
2.
Test diagram:
PC/Laptop computer
Q-F
Remote Station
NE
NE
L
i
n
e
L
i
n
e
Local Station
L
i
n
e
L
i
n
e
Remote Station
E3
E3
DDF
DDF
SDH Analyser
4.2.2.4
SDH/PDH Analyzer
4.2.2.5
Test procedure:
1.
2.
57 (72)
4.2.2.6
Expected Result
Error free.
4.2.2.7
Result Record
Complied
4.2.2.8
Not Complied
13 hours
4.2.3
4.2.3.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Bit error measurement of DS3
(12hours)
4.2.3.2
58 (72)
Test Setup:
1.
2.
4.2.3.3
Test diagram:
PC/Laptop computer
Q-F
Remote Station
NE
NE
L
i
n
e
Local Station
L
i
n
e
L
i
n
e
L
i
n
e
Remote Station
DS 3
DS 3
DDF
DDF
SDH Analyser
4.2.3.4
SDH/PDH Analyzer
4.2.3.5
4.2.3.6
Test procedure:
1.
2.
Expected Result
Error free.
4.2.3.7
Result Record
Complied
4.2.3.8
Not Complied
13 hours
59 (72)
4.2.4
4.2.4.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Bit error measurement of line side
(12hours, measured via STM-1trib)
4.2.4.2
4.2.4.3
Test Setup:
1.
2.
Test diagram:
PC/Laptop computer
Q-F
Remote Station
NE
L
i
n
e
Local Station
L
i
n
e
STM - 1
L
i
n
e
NE
L
i
n
e
Remote Station
STM - 1
DDF
SDH Analyser
4.2.4.4
SDH/PDH Analyzer
4.2.4.5
60 (72)
Test procedure:
1.
2.
4.2.4.6
Expected Result
Error free.
4.2.4.7
Result Record
Complied
4.2.4.8
Not Complied
13 hours
4.2.5
4.2.5.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Bit error measurement of line side
(12hours, measured via STM-1E trib)
4.2.5.2
Test Setup:
1.
2.
61 (72)
4.2.5.3
Test diagram:
PC/Laptop computer
Q-F
Remote Station
NE
L
i
n
e
Local Station
L
i
n
e
L
i
n
e
NE
L
i
n
e
Remote Station
STM - 1E
STM - 1E
DDF
DDF
SDH Analyser
4.2.5.4
SDH/PDH Analyzer
4.2.5.5
4.2.5.6
Test procedure:
1.
2.
Expected Result
Error free.
4.2.5.7
Result Record
Complied
4.2.5.8
Not Complied
13 hours
62 (72)
4.2.6
4.2.6.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Bit error measurement of line side
(12hours, measured via STM-4 trib)
4.2.6.2
4.2.6.3
Test Setup:
1.
2.
Test diagram:
PC/Laptop computer
Q-F
Remote Station
NE
L
i
n
e
L
i
n
e
Local Station
STM - 4
L
i
n
e
NE
L
i
n
e
Remote Station
STM - 4
ODF
SDH Analyser
4.2.6.4
SDH/PDH Analyzer
4.2.6.5
Test procedure:
1.
63 (72)
2.
4.2.6.6
Expected Result
Error free.
4.2.6.7
Result Record
Complied
4.2.6.8
Not Complied
13 hours
4.2.7
4.2.7.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Bit error measurement of line side
(12hours, measured via STM-16 trib)
4.2.7.2
64 (72)
Test Setup:
1.
2.
Loop STM-16 port with external fiber on remote station, if necessary add
a 10dB attenuator when loop the STM-16 port.
4.2.7.3
Test diagram:
PC/Laptop computer
Q-F
Remote Station
NE
L
i
n
e
L
i
n
e
Local Station
STM - 16
L
i
n
e
NE
L
i
n
e
Remote Station
STM - 16
ODF
SDH Analyser
4.2.7.4
SDH/PDH Analyzer
4.2.7.5
4.2.7.6
Test procedure:
1.
2.
Expected Result
Error free.
4.2.7.7
Result Record
Complied
4.2.7.8
Not Complied
13 hours
65 (72)
4.2.8
4.2.8.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Packet Loss measurement of line side
(12hours, measured via 8xFE/T)
4.2.8.2
Test Setup:
Connect Data Analyzer port1 and port2 with hiT 7035 8xFE/T card FE port1
and port2 on Local station.
4.2.8.3
Test diagram:
PC/Laptop computer
MGMT Port
Remote Station
NE
L
i
n
e
L
i
n
e
Local Station
FE1
FE2
L
i
n
e
NE
L
i
n
e
Remote Station
FE1
FE2
Data Analyzer
4.2.8.4
Data Analyzer
4.2.8.5
66 (72)
Test procedure:
1.
2.
3.
4.2.8.6
Expected Result
No Packet Loss
4.2.8.7
Result Record
Complied
4.2.8.8
Not Complied
13 hours
4.2.9
4.2.9.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Packet Loss measurement of line side
(12hours, measured via 8xFE/L2)
4.2.9.2
Test Setup:
Connect Data Analyzer port1 and port2 with hiT 7035 8xFE/L2 card FE port1
and port2 on Local station.
67 (72)
4.2.9.3
Test diagram:
PC/Laptop computer
MGMT Port
Remote Station
NE
L
i
n
e
L
i
n
e
Local Station
FE1
L
i
n
e
NE
L
i
n
e
Remote Station
FE2
FE1
FE2
Data Analyzer
4.2.9.4
Data Analyzer
4.2.9.5
68 (72)
Test procedure:
1.
2.
3.
4.
Configure both LAN1 and WAN1 with the same PVID such as 11, and
both LAN1 and WAN1 are in the same VLAN list such as 11.
5.
Configure both LAN2 and WAN2 with the same PVID such as 22, and
both LAN2 and WAN2 are in the same VLAN list such as 22.
6.
7.
8.
4.2.9.6
Expected Result
No Packet Loss
4.2.9.7
Result Record
Complied
4.2.9.8
Not Complied
13 hours
4.2.10
4.2.10.1
Test Purpose:
This test gives the steps required to measure the line between two terminal
NEs. The following item will be tested: Packet Loss measurement of line side
(12hours, measured via 1GE/T)
4.2.10.2
Test Setup:
1.
Connect Data Analyzer with hiT 7035 GE card GE port on Local station.
2.
69 (72)
4.2.10.3
Test diagram:
PC/Laptop computer
MGMT Port
NE
NE
L
i
n
e
L
i
n
e
Local Station
L
i
n
e
L
i
n
e
Remote Station
GE
GE
Data Analyzer
4.2.10.4
Data Analyzer
4.2.10.5
4.2.10.6
Test procedure:
1.
2.
3.
Expected Result
No Packet Loss
4.2.10.7
Result Record
Complied
4.2.10.8
Not Complied
13 hours
70 (72)
Abbreviations
Abbreviations
ACO
Bw7R
Style 7R
CD-ROM
DB
Data Base
DC
Direct Current
DCC
EGB
EMC
Electromagnetic Compatibility
EN
European Standard
EOW
ESD
ETS
ETSI
FAULT
FO
Fiber Optic
GMT
GND
Ground
GUI
GUIMN
HS
Handset
HW
Hardware
IEC
LCAS
LCT
LED
LWL
MSP
NCT
NUBAT
OK
Service LED
OSN
71 (72)
Abbreviations
72 (72)
PE
PPP
PUBAT
RAM
Rx
Received signal
SDI
SEC
SELV
SFP
SNCP
SW
Software
T3
Clock input
T4
Clock output
TIF
Telemetry Interface
TNMS
Tx
Transmitted signal
UMN
User Manual
VCDB