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Lab #9
ME 59700-19
Spring 2015
Professor Hansung Kim
Intorduction :
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Gwyddion is a modular program for SPM (scanning probe microscopy) data visualization
and analysis. Primarily it is intended for analysis of height fields obtained by scanning
probe microscopy techniques (AFM, MFM, STM, SNOM/NSOM) and it supports many SPM
data formats. However, it can also be used for general height field and image processing,
for instance for analysis of profilometry data.
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3. Non-contact Mode: (attractive VdW) The probe does not contact the sample surface,
but oscillates above the adsorbed fluid layer on the surface during scanning. (Note: all
samples unless in a controlled UHV or environmental chamber have some liquid
adsorbed on the surface). Using a feedback loop to monitor changes in the amplitude
due to attractive VdW forces the surface topography can be measured. Advantages:
VERY low force exerted on the sample(10-12 N), extended probe lifetime
Disadvantages: generally lower resolution; contaminant layer on surface can interfere
with oscillation; usually need ultra-high vacuum (UHV) to have best imaging
Modes of Operation
There are 3 primary imaging modes in AFM:
(1) Contact AFM
< 0.5 nm probe-surface separation
(2) Intermittent contact (tapping mode AFM)
0.5-2 nm probe-surface separation
(3) Non-contact AFM
0.1-10 nm probe-surface separation
contacts. A more involved theory (the DMT theory) also considers Van der Waals
interactions outside the elastic contact regime, which give rise to an additional load. The
theory simplifies to Bradley's Van der Waals model if the two surfaces are separated and
significantly apart. In Bradley's model any elastic material deformations due to the effect
of attractive interaction forces are neglected. Bradley's non-contact model and the JKR
contact model are very special limits explained by the Tabor coefficient.
Assumptions
Restrictions
Hertz
No surface forces
DMT
JKR
Maugis
values.
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Results
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Conclusion
The primary goal of this lab was to gain experience working with an AFM by measuring a
variety of sources. We measured a step-height standard to get initial experience, and
later returned to that data to correct our CD stamper data. We measured a CD stamper
under the AFM as well as by diffraction. Our diffraction value of 1.58 microns is close to
the accepted value of 1.6 microns. However our AFM measurement was 0.51 microns.
This was most likely due to faulty correction/calibration. Additionally, our calibration
measurement was less than ideal, making it difficult to get an accurate correction. Our
Lycopodium scans produced no meaningful results. For further research, we could
rigorously calibrate the AFM using the step-height standard. Additionally, compressed air
could be used to eliminate excess Lycopodium grains. Improved mounting techniques
would probably be necessary.
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