JCM-6000

NeoScope

Large Depth of Field

Bridging the Gap between Optical and
Electron Microscopy

Silica Crystals
Depth of Field
Mag

Optical
Microscopy

SEM

10X

~250 m

~1000 m

1200X

~0.08 m

10,000X

~10 m

High Resolution
Realistic Magnification up to 60,000X

Zinc Oxide

Tin on Carbon

Features & Specifications

GUI incorporates Windows 7 multi touch gestures that leverage

the highly successful JSM-6010 InTouchScope

Magnification from 10X to 60,000X

Secondary and Backscatter Electron Imaging

3 Accelerating Voltages (5kV, 10kV and 15kV)

Sample Stage: X=35mm, Y=35mm

Maximum Sample Size: 70mm Diameter x 50mm Height

Fully automated gun alignment

Elemental Analysis (EDS) is optionally available

It may be retrofitted in the field.
Functions in both HV and LV modes.
Configuration and specifications available at end of May.

JCM-6000 NeoScope II
Easy Maintenance

Cartridge electron source for easy filament

exchange.
Cleaning and centering are not required and
axis alignment is automatic!

NeoScope II
Load Sample
Automatic Evacuation
Automatic Filament Saturation
Auto Adjust and Image!

JCM-6000 NeoScope
Intuitive Software with Multi Touch Control
Filament
On/Off
Image list
in current
directory
Auto
Functions

Manual
Control

User Defined
Pre-set Mags

Observation Conditions

Sample Introduction
Automatic step-by-step guide to sample exchange after
pressing the vent button

Full Auto
Automatic Filament Saturation, Gun Alignment, Focus,
Brightness/Contrast, Astigmatism Correction

Generation of a Focused Live Image within Minutes

Automatic and Manual Control

Auto Gun Alignment

Auto Focus, Auto Astigmatism Correction,

Auto Brightness/Contrast Functions Built in

Manual Control on Main Window

Manual Gun Alignment

Live histogram to aid centering with manual alignment

Fine Shift

Beam shift built in with one

button reset to center

File Settings

Save as BMP, TIFF or JPEG

Select Imaging Conditions to be

Displayed on the Image

Setup

User can define startup conditions

Dual View

Live Image

Stored Image

Dual View to Compare Live Image with Stored Images

Set Scan Speeds

Quick access to scan

speed settings

Observation Conditions

Easy access for changing observation conditions

Scan Rotation Built in

Adjust in 1 increments via arrows

or 90 Steps

Search Data Handling

(

Review Data, Create Recipes/Condition

Files and Quick Printing of selected
Images in Directory

Search Data Handling

Conditions saved with image file for recall

Recipes can be created and stored

Search Data Handling

(

Search data
based on
image
conditions
Create custom
recipe files

Search Data Handling

(

Quick Print Template

Measurement Function
(

On Image and CSV Data

NeoScope - Accessories
Tilt = -15 to +45
Rotation = 360

Optional Tilt Rotation Motorized Holder

(TRMH)

NeoScope - Accessories
EDS Option JEOL EDS System

EDS Port Location

Elemental Analysis (EDS)

EDS Detector
SDD (Silicon Drift Detector) does not require liquid nitrogen.
The detector is integrated. (Foot print is small)
Full functions of elemental analysis are built in.

EDS Port Location

26

Elemental Analysis (EDS)

Qualitative Analysis
All elements are detected simultaneously.
Elements are identified automatically during acquisition.
Typical acquisition time for one spectrum is 30 sec to 1 min.

Elemental Analysis (EDS)

Quantitative Analysis
Automatic Qualitative Analysis
Standard-less ZAF Corrected Quantitative Analysis Built In
Normalized to 100% based on elements detected

Elemental Analysis (EDS)

Elemental Maps
Full Spectral Mapping in Minutes.
Elements are identified automatically and element maps are displayed.

Specimen: Cutting tool

20kV

x4,000

30,000cps

Elemental Analysis (EDS)

The Active Map Line shows X-ray counts of elements along a line defined by a user on
an Active Map. Assign any elements for the Active Map Line.

Line profile over multiple elemental

mapping images.

Active map l Averaged profile

30

Elemental Analysis (EDS)

Line Scan
Elemental analysis along a line set on the
SEM image is acquired. The electron
probe moves along the analysis line and
a spectrum is acquired. The line profiles
of elements found by the automatic
qualitative analysis are displayed. It is not
necessary to specify elements prior to line
analysis. Elements can be added after the
acquisition of line analysis.

NeoScope - Accessories

JN-1 Sample Demonstration Standard

Geller MicroAnalytical Laboratory, Inc.

NeoScope - Accessories
Ted Pella, Inc Has a Universal Stage Adapter Kit and Offers a Variety of Holders

Variable Tilt

Pin Mount

Stage Adapter
Metallographic
Mount

Vise
Bulk Holder

Combination
45/90 Tilt

JCM-6000 NeoScope
Compact footprint
Plugs into standard wall outlet
Power supply and rotary pump
sit outside main unit

430mm
TRMH Option

330mm

490mm

NeoScope Applications
BSE Images of Li Battery at 15kV

NeoScope Applications

Fractured Concrete

NeoScope Applications
Diatoms SE Images

NeoScope Applications

Instant Coffee SE Images

NeoScope Applications

Shale BSE Image at 15kV

Shale SE Image at 15kV

NeoScope Applications

Mineral Filled Neoprene

Cloth

NeoScope - Applications

Semiconductor

NeoScope - Applications

Polymer Nanofibers
Sample courtesy of Scott Forbey, Virginia Tech

NeoScope - Applications

Paper Fibers with CaCO3

Ink on Paper

NeoScope - Applications

Pollen

Powdery Mildew

NeoScope - Applications

Mullite

Boron Clusters

NeoScope Applications

Metal Ductile Fracture

Metal Particles

NeoScope - Summary

As Easy to use as an Automatic Digital Camera

Small Footprint, Fits on a Common Laboratory Bench
High Performance Electron Optics (W Source)
Real Magnification up to 60,000X
Both High Vacuum and Low Vacuum
Takes Routine Work Load off of High Resolution SEMS
EDS Option Now Available