~7)

')

SELF-DAMPING MEASUREMENTS

IEEE
Std 563-1978

j
)

)
)
)
)
)
)'
~

}
Figure 5 - Electro-dynamic Vibration Generator

the driver, should be corrected so that it is equivalent to the antinode velocity. Excessive generator mass

changes the length of the loop to which it is attached and is indicative of localized damping. The effect of

attaching the vibration generator to the conductor should not change the loop length in which the attachment

is made by more than 10 percent. Otherwise, it should be accounted for in the determination of the self
. damping of the conductor. A generator mass of less than 10 perccnt of the mass per unit length of conductor

is normally satisfactory. The method of attachment of the driver to the conductor should be noted in the table
ofresults.
The alternating force provided by the generator should be simple harmonic with a distortion level of less
than 5 percent.

6. Test Method

, I

The method used to drive the conductor to vibrate at resonance in one of its principal mod~s should be
briefly described. Information should be given on the type of driving device and on the mechanical connec
tions between the device and the conductor.
The method used to assess resonance conditions and the accuracy of frequency, force, displacement or
velocity measurements, etc., should be stated.
The motion of the conductor must be simple harmonic. The amount of distortion can be determined directly
from either the displacement or velocity signal. Alternatively, the distortion is acceptable if the difference
between the maximum and minimum antinode amplitudes, compared with the average throughout the span,
is equal or less than 5 percent.
Tests should be performed to check that the conductor test arrangement is stable and the results are repeat
able, such as by making measurements twice with both increasing and decreasing amplitudes. Steady-state
condition stability is acceptable if four or five readings of the energy dissipated per cycle or of power, per
formed at a few seconds intervals, do not show a definite increase or decrease of value and the variations are

II::EE

Std 563-1978

I[[E GUIDE 01\1 CONDUCTOR

)
)

kept within 10 percent. These conditions can be obtained only if, in the same length of time, frequency vari
ations are kept below 0.1 percent and amplitude variations are practically nil.

)
)

7. Power Measurements

The parameters which are actually measured to obtain the power dissipated should be clearly stated.

Preference should be given to the simpler and more direct methods, such as velocity and displacement mea
surements by means of transducers directly connected to the cable and force measurements by means of suit
able dynamometers or transducers placed between the drive unit and the conductor.

If the harmonic force applied to the conductor is being measured, together with the displacement of the con
ductor at its connecting point to the drive unit, the energy dissipated per cycle should be obtained from the
hysteresis loops which ca'n be photographed from an oscilloscope or tape recorded and subsequently dis
played on an x-y recorder. Power is then calculated.

If the harmonic force and the velocity are being measured, then the power measurements can
direcLly with a wattmeter or suitable instrumentation.

be made

B. Recommended Values of T, I, f, Y
The value of tensile load Tto be used in the test, if not specifically required by a particular conductor appli
cation, should be suitably chosen in order to be representative of normal conductor loadings. The following
loadings, expressed as percentages of the conductor RfS3 are preferred: 15 (17.5),20 (22.5), 25 (27.5),30
(35),40 (50). (The values in brackets are optional.)
A minimum of three different tensile loads Tshould be used, the medium value of which should correspond
to the most common, conductor loading on the line.
A minimum of five different loop lengths e should be tested. The maximum and minimum loop lengths
should correspond to the minimum and maximum frequencies that are generated in the wind velocity range
of 3 to 30 kilometres per hour for the particular conductor diameter of interest. The relationship between fre
quency, wind velocity and conductor diameter is as follows:

3Rated tensile strength,

IEEE
Std 563-1978

SELF-DAMPING MEASUREMENTS

Table 1-Specimen Table of Results Conductor Power Dissipation

Frequency

Loop

(Hz)

Length (m)

(mm)

(m/s)

(ftis)

17

0.45

( 1.47)

11

0.29

4.4

.
9.3

13.9

19.7

26

4.6

3.4

2.7

.P

l1LJ

(Ib)

mW/m

5.15

(1.14)

48

0.42

(0.96)

1.45

(0.32)

8.6

0.27

0.11

(0.39)

0.56

(0.13)

1.34

0.11

1.5

0.51

(1.66)

8.2

(1.84)

86

0.28

7.2

0.32

(1.01)

3.58

(0.8)

23

0.18

(0.25)

2.4

0.06

1/

2.4

0.1

(034)

1.13

9.6

. 0.59

(1.96)

25.16

(5.6) .

310

0.24

5.1

0.32

(1.01)

6.29

(1.4)

41

0.12

2.8

0.17

(0.34)

2.78

(0.62)

10

0.07

6.8

0.56

( 1.84)

41.51

(9.3)

480

-0.17

4.1

0.33

(1.08)

16.35

(3.7)

112

0.1

1.7

0.14

(0.46)

3.9

(0.86)

11

0.042
--

32.5

2.1

.. _.

5.6

0.57

(1.9)

69.19

. (15.6)

825

0.14

3.8

0.39

(1.28)

31.45

(7.1)

256

0.094

1.7

0.17

(0.56)

13.84

(3.1)

49

0.041

NarES

1- Yfreeloop double amplitude (mm)

2-F single amplitude exciting force at vibration generator (N)

3-P power dissipated per unit length (mW/m)

4-.0 diameter of conductor (mm) vibration generator directly connected to conductor in center of span

5- Vsingle amplitude velocity at vibration generator (m/s)

f(Hz) = 50 x wind velocity (km/hr)

conductor diameter (mm)

The test frequencies must be within the capability of the test span and the tension sufficiently high for the
conductor to have a natural mode at the desired frequency.
A minimum of three different antinode double amplitudes for each loop length should be tested and the val
25
150
ues should be between T and f .

IEEE
SId 563-1978

IEEE GUIDE ON CONDUCTOR

It is recommended that the loop lengths chosen be common to all the tensile loads Tused. It is also recom

mended that, within the previously suggested range values of Y, a number of antinode displacement ampli
tudes be selected that are common to all the loop lengths used.

It is recommended that the results of the tests for each tension be tabulated as shown for the "power method"

in Table I and presented in diagrams as illustrated in Fig 6 showing the power dissipated per unit conductor
length, as a function of ihe ratio of the antinode displacement amplitude yto conductor diameter, for each
loop length eand corresponding frequency /and tensile load T. On the same diagram, the data referring to
the different loop lengths and frequencies can be shown provided different symbols are used. It is preferable
to present different diagrams for each tensile load, unless required for specific comparison purposes.
/000
i

CONDUCTOR:

i ..

DIAMETER 40.6 mm
STRANDS
AI-72 St.-7
MASS/UNIT LENGTH 2.9/ kg/?"
RATED
TENSILE
200.6 kN
. STRENGTH
(RTS)
TENSION

20% RTS .

LEGEND:
FREQUENCY Hz LOOP LENGTH m
(I)
8.3
8

In}

100 I

(2)

13.9

(3)

19.7

(4)

26.0
32.5

(5)

4.6
3.4
2.7

2.1

10

"

0.01

..,

}I

y,

0.1

.
NORMAL IZED AMPLITUDE

10

Figure 6 - Conductor Power Dissipation Characteristics

Diagrams should clearly show, for each value of 7; e,./. Y, all the actually measured values of P. The units
shall be as indicated in the list of symbols.

10

SELF-DAMPING MEASUREMENTS

IEEE ..
Std 563-1978

9. References
[1] CLAREN, R. and DIANA, G. Mathematical Analysis of Transmission Line Vibration. /EEE 7hmsac

tiollSonPowerApparatllsandSyslems, vol PAS-88, no 12, pp 1741-1767.

[2] TOMKINS, J. S., MERRILL, L. L., JONES, B. L. Quantitative Relationships in Conductor Vihration
Damping. A/EE, 7Tansactions, pl//J; (PowerApparatus alld$yslem,IJ, vol 75, pp 879-884, October 1956.
[3] SEPPA, T. O. Self-Damping Measurement and Energy Balance of ACSR DRAKE. Presented at the 1971
Winter Power Meeting, New York, N.Y. January 3I-February 5,1971.
[4] Aeolian Vibratiolloll Overhead Lines, ClGRE Paper 22-11 (1970).

11

;: .
~

IEEE
Std 563-1978

IEEE GUIDE ON CONDUCTOR

Annex

(informative)
Appendix
(This Appendix IS nora parr 0.//Srd50.1-/978, GHkle on CO~/dHcroTSe(/-lJamping MetlSHTemenrs.)

In addition to the information given in IEEE Std 563-1978, it may be useful to present the results as a plotof
conductor velocity against force per unit length for different frequencies and associated loop lengths, for
each tension, as illustrated in Fig Al Fig Al from the results in Table 1 . This presentation allows, by simple
calculation, the determination of the power dissipated, conductor amplitUde, and the mechanical resistance
of the conductor, that is, the ratio of the force to the conductor velocity, fora wide variety of conditions. The
test arran~ement with the vibration generator located at the center of the span provides information in the
most suitable form for this type presentation since it is a requirement that the conductor be excited at an anti
node, that is, the center of a loop.

II

r--..

12

IEEE
Std 563-1978

SELF-DAMPING MEASUREMENTS

. 2x 3 CYCLES

CONDUCTOR:
DIAMETER
STRANDS
MASS/UNIT
RATED -
TENSILE
STRENGTH
(RTS)
TENSION

LEGEND:

40.6 mm
AI-72 SI.-7
LENGTH 2.91 kg/m

FREQUENCY Hz LOOP LENGT

(')
8.3
8
(2)
13.9
4.6
(3)
19.7
3.4

200.6 kN

(4)
(5)

26.0
32.5

2.7

2.1

20% RTS
~

01

0.1 -

SINGLE AMPLITUDE EXCITING FORCE IUNIT LENGTH N/m

Figure A1 - Conductor Velocity vs. Exciting Force

13

::J

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NORME

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,----"

eEl
lEe

INTE.RNATIONALE

61395

INTERNATIONAL
STANDARD

Premiere edition
First edition
1998-03

5.
)
)

Conducteurs pour lignes electriques aeriennes

Procedures d'essai de fluage
pour cond ucteu'rscabh~s
.

)
)

).
)

10

Overhead electrical conductors

Creep test procedures for stranded conductors

\,

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-,

lEG 199B Droits de reproduction reserves Aucune partie de celie publication no peul etre reprodulla ni
ulllls!!e. 80US qualque 10rme Que ce soli el per auaun
procode, eJeclronlque au mecanlque, y camprll; Ie photo
cople el las mlcrolilms, sans I'aceord eerlt de l'odUaur.

Copyright - all rights reserved

No part of this pUbliCll1lon may be reproducad or ullll2:ed in

any form ar by any means, electronic or mechanical,
Including photocopying and microfilm, without permission In
writing tram 1he publisher.

Intemational Electrotechnical Commission

3, rue de Varembe Geneva, Switzerland
e-mail: inmail@lec.chIEC web site http://wvroJec.ch
Telelax: +41 229190300

(:\
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II

Commission Electrotechnique Internationale

I nternatlonal.:Electrotechnical Commission
Me"'J1VHapoJ1H:lR 81lelfTpOTeXHH4ecKaR HOMHCCIolR

==============~=====.

CODE PRIX
PRICE CODE

Pour prix, voir r;etaloglle en vlgllel

For prlr;e. sr;e r;urrenr catalogue

)-,
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-3

61395 lEG:1998

. "

),()

CONTENTS

Page

FOREWORD

Clause

Scope.......................................................................................................................

Normative reference

Definitions

Units, instrumentation and calibration.........................................................................

Sample selection and .

preparation
.

;~

:........................................................................

: .

;'

'

" . . .

5.. 1 Sample selection

)

iO

"

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,.....
:

Temperature and temperature variations

, "l~..............
.....
;.;................. .
~~

11

11

6.1 Temperature variations

_.

13

6.2 Accuracy of temperature measuring devices

:..

13

;..........................................................................

13

,.................................................................................................................

13

7.1 Tes1Joad...........................................................................................................

13

7.2 Strain measurement.

13

Load

Test procedure

Data acquisition

,.......................................................................
~.......................................................

.15

~.....................................

15

19

/~.

),

()

--- _ ' _ - ' - _..

'."

13

;.........

Annex A (informative) . Practice

'"-, ../

'g

:..............................

10 Data interpretation

!l

.7

:..............................................................

6.3 Temperature compensation

7

5.2 Sample preparation

6

..

_--_.. - - - - - - - - - , - - - - - -

..
~

.'
61395

l-

-5

IEC:199B

(~)

INTERNATIONAL ELECTROTECHNICAL COMMISSION

,.

OVERHJ:AD ELECTRICAL CONDUCTORS

CREEP TEST PROCEDURES FOR STRANDED CONDUCTORS

FOREWORD
.

)
)

.---.

.-.".

_ . .

1) The lEe (International Electrotechnical Commission) Is a worldwide or~anization for standardization comprIsing
all national electrotechnlcal committees (IEC Natlonal Committees). The object of the IEC .Is to promote
. international co-opera1fon on all questions concerning standardization In the electrical and electronic fields. To
this end and in addItion to other activities, the IEC pUblishes International Standjards. Their preparation is
entrusted to technical committees; any lEe National Committee interested in the sUbject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborateS closely with the InternationalOrganization
for Standardization (ISO) in accordance with conditions determined by agreement between the. two
organizations.
.
2) The formal decisions or agreements of the IEC on technical matters express. as nearly as possible, an
interna,lional consensus of opinion on the relevant SUbjects since each technical committee has representation
from all interested National Committees.
.
3) The documents produced have the form of recommendations for international use and are pUblished In the form
of standards, technical reports or guides and they Bre accepted by the National Committees In that sense.

4) In order to promote international unification, IEC National Committees undertake to apply IEC lntii/national
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated In the latter.
5) The lEe provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of Its standards.
6) Atlention is drawn to the possibility that some of the elements of this International Standard rnay be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 61395 has been prepared by IEC technical committee 7: Overhead
electrical conductors.

The text of this standard is based on the following documents:

FDIS

Report on voting

7/515/FDIS

7/516/RVD

'Ii

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table:
Annex "A is for information only.

c}

,.;;

.' .

-7

61395 IEC:1998

OVERHEAD El..,ECTRJCAL CONDUCTORS.

CREEP TEST PROCEDURES FOR STRANDED CONDUCTORS

I ()

1 Scope
This International Standard is primarily applica,ble to non-interrupted creep-testing of strande!:!
conductors for overhead lines such as. those specified by lEe B1089~ Procedures for
in~erpreting the results are also included.
.
The object of the test is prinCipally to calculate creep for any purpose and to compare creep of
different conductors.
The requirement of this standard aims at an accuracy of 1 %. However. itshouid be recognized
that due to variations occurring in the manufacturing process, the creep obtained in the test is
not a precise value for all conductors of the type tested.
.
)

2 Normative reference

The following normative document contains provisions which, through reference in this text,
cons1itute provisions of this International Standard. At the time of pUblication, the edition
indicated was valid. All normative documents are subject to revision, and parties to agreements
made on this International Standard are encouraged to investigate the possibility of applying
the most recent edition of the normative document indicated below. Members of IEC and ISO
maintain registers of currently valid International Standards.

lEe 61089:1991, Round wire concentric Jay overhead electrical stranded conductors

3 Definitions
For the purpose of this International Standard, the following definitions apply..
i

-'.

".

3.1
semple length

total length of the conductor between the end fittings

3.2
9puge length

distance of the conductor over which the creep is measured

3.3

(~\

testternperature
mean temperature taken at the three pre-specified positions along the gauge length or, when
more than three measuring positions are used, the mean temperature take.n at equal distances
along the gauge length
.:.

--- ..

_-

_.. - -

------_..

__

.- - - - - -

- - - - - _ . _ - --------_._---

,.

~"

;0
)

61395 IEC:1998

-9

3.4

test load

constant load acting on the conductor during the test

NOTE - ThIs caUSel! the permiinent time d~p~n!:lent elongation known as creep.

3.5
loading time

time requirel;! either from preload when preload is applied to test load or from no load to test
load

3.6
duration of test

time span between reaching test load and the end cif the test .

3.7
creep test machine
oomplete equipment by means of which the conductor sample is tensioned during the test

3.8
end fitting
hardware that maintains the ele(;trlcaJ and/or the mechanical continuity of the oonductor

r\,

) ("-.-/i

4 Units, instrumentation and caHbratlon

Units of the International System of Units (SI-units)shall be used.
To ensure traceable accuracy of the test, calibration r~cords of all instruments. used in the test
shall be kept. The equipment shall be calibrated in accordance with nationally recognized
standards. Where no such standards exist, the basis used for calibration shall be documented.

) .

5 Sample selection and preparation

5.1 Sample selection

The sample shall be taken at least 20 m from the end of the conductor on the drum. It shall be
undamaged during removal and preparation. At least three strong hoseclips shall be placed on
hoth ends of the sample to prevent interlayer movement, before it is cut from the drum.
The minimum sample length between the end fittings shall be:

100 x.d+ 2 x a
where

100 x d is the minimum gauge length;

C)
.

dj~meter;

is the conductor

is the distance between the end fitting and the gauge length. 1}

./

...

1) These minimum soeclflcatlons are onlv correct when the ends are olaced in resin.
_ - - - - .. - . _ - - - -

1,'

S)

61395

lEC:199B

-11

The distance, a, shall be at least 25 % of the gauge length or 2 m whichever is the smaller. The
total hmgth cut from the conductor shall include the neoessary length to provide for the grips at
the two e~ds of the sample. Figure 1 shows a typical set-up.
The sample and the gauge lengths have been chosen with due weight being given to the'
greater accuracy with which qreep tests are conducted in comparison with tensile tests.
Once the ~ample has been taken from the drum, it sh;;l1J be kept as straight as possible. If this
is impractical the following procedure shall be adopted.
.
a) Twice the sample length shall be removed from the drum, and the central part shall be used
as the sample length.
b} When recoiling for transporta~ion, a coil diameter of 1,5 m minimum shall be used.

/1

I
"'-_e"

4
lEe

468/98

Key
1

Gauge length

End fitting

Reference bar

Sample

Grip

Figure 1 - Typical creep test arrangement

5.2 Sample preparation

"

End fittings, such as low melting point metals and resin bonding etc., attached to test samples
shall not pllow slippage or interlayer movement.
These end fittings shall be installed when the strands of the conductor are concentric. Where
grease is appl.ied to the conductor, the part of the conductor which is held in the grips shall be
degreased prior to the installation of the end fittings.

6 Temperature and temperature variations

,
C
... /

The conductor temperature shall be measured in the middle and at both ends of the gauge
length, dur.ing the test. The measuring devices shall be in good contact with the conductor
sample and be insulated against the effects of air movements 'outside the conductor. If not
otherwise spe.cified, 1he temperature of the test shall be 20 cC.
,.;;

_. -----

.-.~----

----_._------_._. __ ...._.

I'

...

')
,1.1

-13

61395 IEC:199B

(''1

6.1

Temperature variations

Conductor temperature variation Cllong the gauge length shall be less than 2,0 DC; Conductor
t!;!mperature variation during the test shall be less than 2,D bC. It Is important to ensure that
greater deviations than those stated above ,do not take place. A means of continuously
monitoring the air or cond\..lctor temperature is recommended.

6.2 Accuracy of temperature measuring devices

I
I

The accuracy of the equipment used for temperature measurements shall be witjlin O,~ DC.
The accuracy pf the temperature measuring device used on the gauge length shall beclearly
stated in the test report. The method used for temperature control 'and measurement shall ~Jso
be fully documented.
6.3 Temperature compensation

Temperature variations shall be compensated, either by using a thermal reference with the
same coefficient of thermal expansion as the sample, called reference bars in figure 1, or by
using a thermocouple reference. In the latter case, the strain variation is calculated and
subtracted from the elongation measurements. Three temperature measuring devices are
used, the accuracy of which shall be within 0,5 "C. It shall be clearly understood that the
temperature compensation is to reduce the scatter in the measurement arising from the length
change of the conductor sample due to thermal elongation only. The effect of temperature
change on the creep rate cannot be compensated.

,.
7 Load

--\

7.1 Test load

The accuracy of the test load shall be within 1 % or 120 N whichever is the greater. Load
cells shall be used during the test.
.
7.2 Strain measurement

The accuracy and the set up of the strain measuring device shall be sufficient to determine the
conductor sample strain to the nearest 5 x 10-6 . The measuring devices may be of any suitable
type such as micrometer dial gauges, low voltage displacement transducers or optical systems.
Uncontrolled rotation during the test, especially of long samples may take place and shall be
avoided or compensated for.

>,1
I

i
i
r

8 Test procedure
The sample prepared in accordance with the procedure desc;;ribed in clause 5 shall be placed in
the creep test machine. Some machines may require a preload in order to attach the strain
measuring devices. In such casep a preload of up to 2 % of the rated tensile strength of the
conductor may be allowed. Prolonged period at preload shall be avoided in order not to
influence the shape of the creep curve. Usually not more than 5 min at preload can be
accepted.

(i~)
!
.,./

,,;;

-------.

--_.-.--------_._------_.

--------_._----....... _----

, '.

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.....

61395 IEC:1998

,:'.~lO.'~,\;{",-/'.,?~"__.:,C.~.:..:...:..::,:

-15

The loading time shall be 5 min 10 s. The loading should be applied evenly up to the tes1
load, without overload. Where it is necessary to load in steps, incremental steps shall not be
greater than 20 % of the test load 2). When step loading is utilised, care should be taken to
ensure that the area under the load graph (in a stress vsrsus time dia,gram) equals that of the
straight line from preload or zero load to the test load. The load shall be kept constant during
the duration of the test. 3)

9 Data acquisition

I
I

o
1

Creep and conductor temperature measurements shall. be taken from the mornent the full load
isapplied.Le. at the end of the 5 min allowed for the loading time. Thereafter, conductor
temperature and readings to calculate the creep elongations shall be evenly spaced on the
logarithmic time sC;:lle 4). The n~mber of these readings shall be at least three in each interval,
with ten times increase of the 1ime. The first reading corresponds to zero time and creep. The
second reading, which is the first value of the creep. shall be taken not later than 0,02 h after
the first reading. When a thermocolJple reference is used for the temperature compensation,
readings of ~rongation and temperature shall be made at the same moment. The duration of
the test shall be at least 1 000 h, which would predict the long time creep sufficiently
accurately.
.
Most of the creep data available are based on 1 000 h creep tests. Longer times give greater
accuracy, but due to the logarithmic presentation, very long times are needed to increase the
effect significantly. It is recognized that due to the unmeasured creep at the beginning of the
test, the curvature will result in lower time creep the longer the test continues.

10 Data interpretation
When the conductor elongates according to power law creep, the creep measured for each
equal time interval on the logarithmic scale will usually be close to equal, Le. the. creep
between 1 hand 10 h is of the same magnitude as that between 100 h a,nd l' 000 h. The
regression line which is fitted to the values minimizes the sum of squares of the distances to
the straight line. Concentrations of values therefore torce the line to pass closer to the centre
of the concentrations 5). To make possible an unbiased linear regression to the creep formula,
the method requires values to be evenly spaced along the fitted line.
The creep equation Ec =

a x tbean be transformed to
Jog LC

= log a+ bx log t

where

is the elongation in % due to power law creep,

. t
is the time in hours

a and b are constants.

E:.c

()

2)

This procedure has been chosen so that all samples experience the same amount of creep time beiore the
measurement commences.
,.;

3)

Vibration 11 not isolated can affect results.

4)

Other readings can be taken but should not be Included in the calculation.

5)

The reading intervals can unintentionally influence the derived creep equation due to the double logarithmic
scale of the creep diagram and the usual slight curvature of the graph.

. ,..

_--_ ..

"'

---_ ..... _._------_ ..

__

...

_-_ .

61395 IEC:1998

-17

In a graph of elongation versus time plotted on a log-Ipg scale, the measured creep values will
form a curve which approaches a straight line for longer times. When the line is fitted to the
values, a is the intercept with the creep axis for t = 1 hand b is the slope of the straight line.

()

A ,linear regression shall be made using the values between 1 hand 1 000 h to calculate the
creep equation. Creep values at less thiln 1 h are taken for information purposes only.

()
()

o
C)

(J

The constants a and b togethfH with the calculated long time creep fpr 10 years for purposes- of
comparison shall be presented in the report. together with nominal agreed temperature and
actual temperature variation. A log-log diagram shall be made with elongation versus time up
to 100 ODD h with the fitted straight line plotted together with the nominal and average
. temperatures &nd actual temperature variation. Any further information such asa plot of the
creep' curve and any additional information shall be agreed upon by the supplier and the
purchaser.

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61395 IEG:1998

-19

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Annex A
(informative)

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Practice

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A.1 Recommended testing parameters

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The following t~sting parameters are recommended:

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A.2 Testing procedure

When long conductor samples are used, the preload will not be sufficient to lift the conductor.
In such cases the conductor sample should be supported at regular intervals, either by a
balanced weights and lever arms system or by trolleys underneath the sample.

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A.3 Sample selection and preparation

The sample preparation aims to prepare a sample for the creep test in which all strands are
stressed as equally as possible during the test.. Thereby the same tensile conditio.ns are
obtained as naturally occur in the very long spans of transmission lines in use. Unnecessary
recoiling and bending of the conductor should therefore be avoided.

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If a complete characterization of the creep behaviour of ,8 conductor is needed, tests should be

carried out at least at two different loads and two different temperatures.

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the temperature of the test should be 20 DC;

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Moulded end fittings (e.g. rl:lsin or low melting metal) are recommended both to reduce the risk
of slippage and to avoid disturbing the layers and thereby causing the layers to take stresses
unequally.
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A.4 Temperature and temperature variations

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The creep rate of the conductor increases by around 4 % for every 1 DC the temperature is
increased. The creep temperature is therefore the single parameter which has the greatest
influence on the accuracy by which the test can be carried out. A difference. in temperature
betvveen the two ends of the gauge length is therefore not as large a problem as an error in the
true mean temperature during the test. As the rate by which the creep rate increases with
temperature is unknown it, is' not possible to compensate for this effect. In order to do so,
measurements on single wires or a conductor built using the same wires have first to be
carried out at different temperatures to determine the effect.

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In real life, conductors elongate when the effects of creep and thermal elongation are taken
into account. The effect of both these Items would be to decrease the tension on the conductor
and therefore the increase in creep rate would not be as pronounced.

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61395 IEC:1SS8

-21

Different pountries may have a different mean temperature at which the test can most
appropriately be carried owl. Due to the different creep rates obtained at Gifferent
templ3ratures, two mepsurements at two different temperatures Olinnot be directly compared.

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A pimple arri3ngement for the temperature compen~ation ponslsts of two aluminium bars, called
r~ference bars in figure 1 t which are fitted on oPPP!3ite side!'> of the conductor at one end of the
gauge length. The other end of the alwmlnium bars extends to the other eoo of the gauge
length. At this end the bars are free and the distance is melisured between the gauge mark and
, tHe free end of the aluminium blim. The measured distancl;l is the elongation which takes place
over the gauge length. When the' length of the conductor changes, the length of the
compensating bars changes with the same distance. and thereby the influence from the
th.ermal elongation is neutralized.

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A.5 Data interpretation

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Increasing time intervals can be used according to the formula

t::: 10n

where
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is the time in hours from the beginning of the measurement;

n is a number series with constant increment. such that n m+1

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= n m + A,

where

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A is a constant, i.e. if 10 readings are to be made for each increase of time by 10 times
(e.g. from 10 h to 100 h) and the first reading is made at 10 h (10' h), the next readings
will be made at 101+ 0 ,1, 10 1+0 2 , .. (12,6 h; 15,8 h; 20,0 h...). On the logarithmic scale
these points will be evenly spaced.

The derived creep equation will always be pessimistic and result in larger long time creep than
the true creep. It is not possible to obtain better values by starting the measurement late and
thereby exclude some creep at the beginning. _Such a procedure will move the creep curve
towards smaller creep and therefore -decrease the short time creep. but on the other hand
result in a higher creep exponent and ther~by increase the long ~ime creep.

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