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PD - 95835

Applications
l High Frequency Synchronous Buck
Converters for Computer Processor Power

IRF3709Z
IRF3709ZS
IRF3709ZL

HEXFET Power MOSFET

VDSS RDS(on) max


6.3m:

30V
Benefits
l Low RDS(on) at 4.5V VGS
l Low Gate Charge
l Fully Characterized Avalanche Voltage
and Current

D2Pak
IRF3709ZS

TO-220AB
IRF3709Z

Qg
17nC

TO-262
IRF3709ZL

Absolute Maximum Ratings


Parameter

Max.

Units

30

VDS

Drain-to-Source Voltage

VGS

Gate-to-Source Voltage

20

ID @ TC = 25C

Continuous Drain Current, VGS @ 10V

87

ID @ TC = 100C

Continuous Drain Current, VGS @ 10V

62

IDM

Pulsed Drain Current

350

PD @TC = 25C

Maximum Power Dissipation

79

PD @TC = 100C

Maximum Power Dissipation

40

TJ

Linear Derating Factor


Operating Junction and

TSTG

Storage Temperature Range

h
h

0.53
-55 to + 175

Soldering Temperature, for 10 seconds


Mounting Torque, 6-32 or M3 screw

W/C
C

300 (1.6mm from case)

10 lbf in (1.1N m)

Thermal Resistance
Parameter

RJC

Junction-to-Case

RJA

Junction-to-Ambient (PCB Mount)

Typ.

Max.

Units

1.89

C/W

40

Notes through are on page 12

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1
1/16/04

IRF3709Z/S/L
Static @ TJ = 25C (unless otherwise specified)
Parameter

Min. Typ. Max. Units

BVDSS

Drain-to-Source Breakdown Voltage

30

VDSS/TJ

Breakdown Voltage Temp. Coefficient

0.021

RDS(on)

Static Drain-to-Source On-Resistance

Conditions
VGS = 0V, ID = 250A

5.0

6.3

mV/C Reference to 25C, ID = 1mA


m VGS = 10V, ID = 21A

6.2

7.8

VGS = 4.5V, ID = 17A

e
e

VGS(th)

Gate Threshold Voltage

1.35

2.25

VGS(th)/TJ

Gate Threshold Voltage Coefficient

-5.5

mV/C

IDSS

Drain-to-Source Leakage Current

1.0

VDS = 24V, VGS = 0V

150

IGSS

Gate-to-Source Forward Leakage

100

nA

VGS = 20V

Gate-to-Source Reverse Leakage

-100

Forward Transconductance

88

Total Gate Charge

17

26

Qgs1

Pre-Vth Gate-to-Source Charge

4.4

Qgs2

Post-Vth Gate-to-Source Charge

1.7

Qgd

Gate-to-Drain Charge

6.0

ID = 17A

Qgodr

4.9

See Fig. 14a&b

Qsw

Gate Charge Overdrive


Switch Charge (Qgs2 + Qgd)

7.7

Qoss

Output Charge

11

td(on)

Turn-On Delay Time

13

VDD = 15V, VGS = 4.5V

tr

Rise Time

41

ID = 17A

td(off)

Turn-Off Delay Time

16

tf

Fall Time

4.7

Ciss

Input Capacitance

2130

Coss

Output Capacitance

450

Crss

Reverse Transfer Capacitance

220

gfs
Qg

VDS = VGS, ID = 250A

VDS = 24V, VGS = 0V, TJ = 125C


VGS = -20V
S

VDS = 15V, ID = 17A

nC

VGS = 4.5V

VDS = 15V

nC

VDS = 16V, VGS = 0V

ns

Clamped Inductive Load

pF

VDS = 15V

VGS = 0V
= 1.0MHz

Avalanche Characteristics
EAS

Parameter
Single Pulse Avalanche Energy

IAR

Avalanche Current

EAR

Repetitive Avalanche Energy

c

Typ.

Units
mJ

Max.
60

17

7.9

mJ

Diode Characteristics
Parameter

Min. Typ. Max. Units

Conditions

IS

Continuous Source Current

87

ISM

(Body Diode)
Pulsed Source Current

350

showing the
integral reverse

VSD

(Body Diode)
Diode Forward Voltage

1.0

p-n junction diode.


TJ = 25C, IS = 17A, VGS = 0V

trr

Reverse Recovery Time

16

24

ns

Qrr

Reverse Recovery Charge

6.2

9.3

nC

c

MOSFET symbol
A

G
S

TJ = 25C, IF = 17A, VDD = 15V


di/dt = 100A/s

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IRF3709Z/S/L
1000

1000

BOTTOM

TOP

ID, Drain-to-Source Current (A)

ID, Drain-to-Source Current (A)

TOP

VGS
10V
9.0V
7.0V
5.0V
4.5V
4.0V
3.5V
3.0V

100

100

3.0V

BOTTOM

VGS
10V
9.0V
7.0V
5.0V
4.5V
4.0V
3.5V
3.0V

3.0V

10

60s PULSE WIDTH

60s PULSE WIDTH

Tj = 175C

Tj = 25C
10

1
0.1

10

100

0.1

V DS, Drain-to-Source Voltage (V)

Fig 1. Typical Output Characteristics

10

100

Fig 2. Typical Output Characteristics

1000

2.0

RDS(on) , Drain-to-Source On Resistance


(Normalized)

ID, Drain-to-Source Current ()

V DS, Drain-to-Source Voltage (V)

T J = 175C

100

10

T J = 25C
VDS = 15V
60s PULSE WIDTH

0.1

ID = 42A
VGS = 10V

1.5

1.0

0.5

VGS, Gate-to-Source Voltage (V)

Fig 3. Typical Transfer Characteristics

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-60 -40 -20 0

20 40 60 80 100 120 140 160 180

T J , Junction Temperature (C)

Fig 4. Normalized On-Resistance


vs. Temperature

IRF3709Z/S/L
10000

6.0

VGS = 0V,
f = 1 MHZ
C iss = C gs + Cgd, C ds SHORTED
C rss = C gd

VGS, Gate-to-Source Voltage (V)

ID= 17A

C, Capacitance(pF)

C oss = C ds + Cgd

Ciss
1000

Coss

Crss

5.0

VDS= 24V
VDS= 15V

4.0

3.0

2.0

1.0

0.0

100
1

10

100

10

1000.00

20

25

ID, Drain-to-Source Current (A)

10000
OPERATION IN THIS AREA
LIMITED BY R DS(on)

1000

100.00

T J = 175C

10.00

100

T J = 25C

100sec

10
1msec
1

Tc = 25C
Tj = 175C
Single Pulse

VGS = 0V
1.00

10msec

0.1
0.0

0.5

1.0

1.5

2.0

VSD, Source-to-Drain Voltage (V)

Fig 7. Typical Source-Drain Diode


Forward Voltage

15

Fig 6. Typical Gate Charge vs.


Gate-to-Source Voltage

Fig 5. Typical Capacitance vs.


Drain-to-Source Voltage

ISD, Reverse Drain Current (A)

QG Total Gate Charge (nC)

VDS, Drain-to-Source Voltage (V)

2.5

10

100

1000

VDS, Drain-to-Source Voltage (V)

Fig 8. Maximum Safe Operating Area

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IRF3709Z/S/L
90
80

VGS(th) Gate threshold Voltage (V)

2.5

Limited By Package

ID, Drain Current (A)

70
60
50
40
30
20
10

2.0

1.5

ID = 250A
1.0

0.5

0
25

50

75

100

125

150

-75 -50 -25

175

25

50

75 100 125 150 175 200

T J , Temperature ( C )

T C , Case Temperature (C)

Fig 9. Maximum Drain Current vs.


Case Temperature

Fig 10. Threshold Voltage vs. Temperature

Thermal Response ( Z thJC )

10

D = 0.50
0.20
0.10
0.05

0.1

0.02
0.01
0.01

R1
R1
J
1

R2
R2
2

Ri (C/W) i (sec)
0.832
0.000221
1.058

0.001171

Ci= i/Ri
Ci i/Ri

SINGLE PULSE
( THERMAL RESPONSE )

Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc

0.001
1E-006

1E-005

0.0001

0.001

0.01

0.1

t1 , Rectangular Pulse Duration (sec)

Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case

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RDS(on), Drain-to -Source On Resistance (m )

RDS(on), Drain-to -Source On Resistance ( m)

IRF3709Z/S/L
9.00

Vgs = 10V
8.00

T J = 125C
7.00

6.00

T J = 25C
5.00

4.00
10.0

20.0

30.0

40.0

50.0

60.0

70.0

16
ID = 21A

14
12
10

T J = 125C
8
6
T J = 25C

4
2
0
2

ID, Drain Current (A)

10

VGS, Gate -to -Source Voltage (V)

Fig 12. On-Resistance vs. Drain Current

Fig 13. On-Resistance vs. Gate Voltage

Current Regulator
Same Type as D.U.T.
Id
Vds
50K

Vgs

.2F

12V

250

.3F

EAS , Single Pulse Avalanche Energy (mJ)

D.U.T.

+
V
- DS
Vgs(th)

VGS
3mA

IG

ID

Current Sampling Resistors

Qgs1 Qgs2

Qgd

Qgodr

Fig 14a&b. Basic Gate Charge Test Circuit


and Waveform
15V

V(BR)DSS
tp

VDS

D.U.T

RG

IAS
20V

I AS

tp

DRIVER

+
V
- DD

0.01

Fig 15a&b. Unclamped Inductive Test circuit


and Waveforms

ID
5.4A
8.0A
BOTTOM 17A
TOP

200

150

100

50

0
A

25

50

75

100

125

150

175

Starting T J , Junction Temperature (C)

Fig 16. Maximum Avalanche Energy


vs. Drain Current

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IRF3709Z/S/L
D.U.T

Driver Gate Drive

D.U.T. ISD Waveform


Reverse
Recovery
Current

RG

dv/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test

P.W.
Period
VGS=10V

Circuit Layout Considerations


Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer

D=

Period

P.W.

VDD

Body Diode Forward


Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt

Re-Applied
Voltage

Body Diode

VDD

Forward Drop

Inductor Curent
Ripple 5%

ISD

* VGS = 5V for Logic Level Devices


Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET Power MOSFETs
LD
VDS

+
VDD D.U.T
VGS
Pulse Width < 1s
Duty Factor < 0.1%

Fig 18a. Switching Time Test Circuit

VDS
90%

10%

VGS
td(on)

tr

td(off)

tf

Fig 18b. Switching Time Waveforms

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IRF3709Z/S/L
Power MOSFET Selection for Non-Isolated DC/DC Converters
Control FET

Synchronous FET

Special attention has been given to the power losses


in the switching elements of the circuit - Q1 and Q2.
Power losses in the high side switch Q1, also called
the Control FET, are impacted by the Rds(on) of the
MOSFET, but these conduction losses are only about
one half of the total losses.

The power loss equation for Q2 is approximated


by;
*
Ploss = Pconduction + Pdrive + Poutput

Ploss = Irms Rds(on)

Power losses in the control switch Q1 are given


by;

+ (Qg Vg f )

Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput

+ oss Vin f + (Qrr Vin f )

This can be expanded and approximated by;

*dissipated primarily in Q1.

Ploss = (Irms Rds(on ) )


2


Qgs 2
Qgd
+I
Vin f + I
Vin
ig
ig

+ (Qg Vg f )
+

Qoss
Vin f
2

This simplified loss equation includes the terms Qgs2


and Qoss which are new to Power MOSFET data sheets.
Qgs2 is a sub element of traditional gate-source
charge that is included in all MOSFET data sheets.
The importance of splitting this gate-source charge
into two sub elements, Qgs1 and Qgs2, can be seen from
Fig 16.
Qgs2 indicates the charge that must be supplied by
the gate driver between the time that the threshold
voltage has been reached and the time the drain current rises to Idmax at which time the drain voltage begins to change. Minimizing Qgs2 is a critical factor in
reducing switching losses in Q1.
Qoss is the charge that must be supplied to the output capacitance of the MOSFET during every switching cycle. Figure A shows how Qoss is formed by the
parallel combination of the voltage dependant (nonlinear) capacitances Cds and Cdg when multiplied by
the power supply input buss voltage.

For the synchronous MOSFET Q2, Rds(on) is an important characteristic; however, once again the importance of gate charge must not be overlooked since
it impacts three critical areas. Under light load the
MOSFET must still be turned on and off by the control IC so the gate drive losses become much more
significant. Secondly, the output charge Qoss and reverse recovery charge Qrr both generate losses that
are transfered to Q1 and increase the dissipation in
that device. Thirdly, gate charge will impact the
MOSFETs susceptibility to Cdv/dt turn on.
The drain of Q2 is connected to the switching node
of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and off there is
a rate of change of drain voltage dV/dt which is capacitively coupled to the gate of Q2 and can induce
a voltage spike on the gate that is sufficient to turn
the MOSFET on, resulting in shoot-through current .
The ratio of Qgd/Qgs1 must be minimized to reduce the
potential for Cdv/dt turn on.

Figure A: Qoss Characteristic

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IRF3709Z/S/L
TO-220AB Package Outline
Dimensions are shown in millimeters (inches)

2.87 (.113)
2.62 (.103)

10.54 (.415)
10.29 (.405)

-B-

3.78 (.149)
3.54 (.139)

4.69 (.185)
4.20 (.165)

-A-

1.32 (.052)
1.22 (.048)

6.47 (.255)
6.10 (.240)

4
15.24 (.600)
14.84 (.584)

LEAD ASSIGNMENTS
1.15 (.045)
MIN
1

4- DRAIN

14.09 (.555)
13.47 (.530)

1.40 (.055)
1.15 (.045)

4- COLLECTOR

4.06 (.160)
3.55 (.140)

3X
3X

LEAD ASSIGNMENTS
IGBTs, CoPACK
1 - GATE
2
DRAIN
1- GATE
1- GATE
3 - SOURCE 2- COLLECTOR
2- DRAIN
3- EMITTER
3- SOURCE
4 - DRAIN

HEXFET

0.93 (.037)
0.69 (.027)

0.36 (.014)

3X
M

B A M

0.55 (.022)
0.46 (.018)

2.92 (.115)
2.64 (.104)

2.54 (.100)
2X
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
2 CONTROLLING DIMENSION : INCH

3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB.


4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS.

TO-220AB Part Marking Information


(;$03/( 7+,6,6$1,5)
/27&2'(
$66(0%/('21::
,17+($66(0%/</,1(&
Note: "P" in assembly line
position indicates "Lead-Free"

,17(51$7,21$/
5(&7,),(5
/2*2
$66(0%/<
/27&2'(

www.irf.com

3$57180%(5
'$7(&2'(
<($5 
:((.
/,1(&

IRF3709Z/S/L
D2Pak Package Outline
Dimensions are shown in millimeters (inches)

D2Pak Part Marking Information


7+,6,6$1,5)6:,7+
/27&2'(
$66(0%/('21::
,17+($66(0%/</,1(/

,17(51$7,21$/
5(&7,),(5
/2*2
$66(0%/<
/27&2'(

10

3$57180%(5
)6
'$7(&2'(
<($5 
:((.
/,1(/

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IRF3709Z/S/L
TO-262 Package Outline

Dimensions are shown in millimeters (inches)

1- GATE

IGBT

2- COLLECTOR

TO-262 Part Marking Information

/

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1
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7+

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IRF3709Z/S/L
D2Pak Tape & Reel Information
Dimensions are shown in millimeters (inches)
TRR
1.60 (.063)
1.50 (.059)
4.10 (.161)
3.90 (.153)

FEED DIRECTION 1.85 (.073)


1.65 (.065)

1.60 (.063)
1.50 (.059)

11.60 (.457)
11.40 (.449)

0.368 (.0145)
0.342 (.0135)

15.42 (.609)
15.22 (.601)

24.30 (.957)
23.90 (.941)

TRL
10.90 (.429)
10.70 (.421)

1.75 (.069)
1.25 (.049)

4.72 (.136)
4.52 (.178)

16.10 (.634)
15.90 (.626)

FEED DIRECTION

13.50 (.532)
12.80 (.504)

27.40 (1.079)
23.90 (.941)
4

330.00
(14.173)
MAX.

60.00 (2.362)
MIN.

NOTES :
1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.

30.40 (1.197)
MAX.
26.40 (1.039)
24.40 (.961)
3

Notes:
Repetitive rating; pulse width limited by
This is applied to D2Pak, when mounted on 1" square PCB (FR4 or G-10 Material). For recommended footprint and soldering
max. junction temperature.
techniques refer to application note #AN-994.
Starting TJ = 25C, L = 0.42mH, RG = 25,
Calculated continuous current based on maximum allowable
IAS = 17A.
junction temperature. Package limitation current is 42A.
Pulse width 400s; duty cycle 2%.
Coss eff. is a fixed capacitance that gives the same R is measured at TJ of approximately 90C.
charging time as Coss while VDS is rising from 0 to
80% VDSS.

Data and specifications subject to change without notice.


This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IRs Web site.

IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 01/04

12

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Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/

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