Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
Year
2010
Hillhouse, Beard
2009
Warner, Heckenberg,
Rubinsztein-Dunlop
2006
Mozafari, Moztarzadeh
2010
PbS 0.41 Eg
PbS core gelatin shell
PbS Eg 0.41 eV
PbSe Eg 0.27 eV
PbS 0.41
PbSe 0.28
PbTe 0.31
Quantum confinement
region 0.5-1.1 eV, 0.7eVideal
Dispersion on carbon
coated grid
PL: fluorescence and
emission spectra acquired
at right angles
The instrument
parameters affecting
photoluminescence
intensity
are as follows.
Measurement type:
wavelength scan, scan
mode: excitation/emission,
data mode: fluorescence,
ex. slit: 5.0 nm, em. slit:
5.0 nm, PMT voltage: 950
V.
Sashschiuk, Langof,
Chaim, Lifshitz
2002
Graph reported as PL
intensity vs. Energy (eV)
and
1400-600 for corecoreshell
1100-600 for core shell 23 monolayers
Ye, Ye, Ni, Wu
2005
1D PbS NC
UV-Vis dispersed in alcohol
PL spectra taken with
Hitachi 850-Fluorescence
spectrophotometer with
Xe lamp at room temp,
excitation 250nm
UV-vis 300-800nm
Graph Intensity vs 250500nm
PbSe NC thermally
deposited
UV-vis 400-1100 nm
PL excitation wavelength
of 350, 400, 450 nm
Intensity vs graph
Shyju, Anandhi,
Sivakumar, Garg,
Gopalakrishnan
2012
2013
2009
2009
Ferrer, Salinas-Castillo,
Alonso, de Avila, Mallavia
2010
1998
2011
Salavati-Niasari, Ghanbari,
Loghman-Estarki
2012
2011
Romcevic, Romcevic,
Klopotowski, Kossut
2008
2012
2009
2010
2007
2013
PbS qd
Mean rad 2.4nm
Time resolved PL LOTIS II
255 nm
System provided
spectrally tunable pulses
with duration 25 ns at
repetition rate of 10 Hz
Samples were excited to
the maz at 1.025 eV. PL
collected by lenses and
spectrally selected using
monochromator to a
bandwidth of 9.6 nm
PL decay rates measured
along whole emission
band with 20 nm interval
Steady state temp PL
spectral width 5 nm 400
nm excitation wavelength
Graph of intensity vs
photon energy
2010