C101-E114A

Measurement of
Transmission
and Reflectance of
PV Materials and Cells
Shimadzu
UV-VIS-NIR Spectrophotometers

SolidSpec-3700/UV-3600 Play Important Roles in

Solar cell manufacturing plants are constantly seeking higher conversion efficiency. For this reason, the evaluation
of transmission and reflectance by a spectrophotometer at a specific wavelength region is required.
The SolidSpec-3700/UV-3600 are held in high regard by major solar cell manufacturers around the world for their
role in the development of solar cell materials, cells and modules, and also for ensuring of consistent quality in
mass production.

T hi n - F i l m Si S o lar C ell

a-Si/uc-Si spectral absorption coefficient

Transmission of glass substrates with TCO

Cryst alline Si Cell Solar Cel ls

Verification of effectiveness of anti-reflective film

Front
electrode

Front
electrode

Anti-reflective film
n-type Si
p-type Si substrate
Back electrode
p+ layer

Back electrode
n-type microcrystalline Si
i-type microcrystalline Si
p-type microcrystalline Si
n-type a-Si
i-type a-Si
p-type a-Si
TCO
Glass substrate

C I G S S o l a r C ells

ZnO (Al or B doped)

Buffer layer
CIGSS
Mo back electrode
Glass substrate

Transmission of transparent conducting film (ZnO: Al or B doped)

Spectral absorption coefficient of photoelectric transfer layer

D y e - S e n s i t i z ed S o la r C ell

Spectral absorption coefficient of TiOz electrodes after dye adsorption

Transmission of glass or polymer substrates with transparent
conducting film

Glass or polymer film

Transparent conducting film
Platinum
Electrolyte
Titanium oxide electrode
TCO
Glass or polymer film

T r a n s mi s s i o n a n d R eflec tan ce M easurement of Solar Cell M at erials

Glass or polymer substrate with TCO

Cover glass

EVA film

Solar Cell Manufacturing Processes

SolidSpec-3700 Reduces Measurement Workload and Achieves More Efficient Analysis.

(1 ) Sa m p l e s a re e a s y to p lac e .

The large sample compartment enables non-destructive measurement of large samples up to

700mmx560mm.

560mm

700mm

(2 ) M e a s u re me n t wo rklo ad at mult iple specif ied point s can be reduce d .

The optional Automatic X-Y Stage enables samples to be moved to specified positions so that multiple points
can be measured automatically.
SolidSpec
Conventional
methods

(3 ) Workload when changing measurement angle of incidence can be reduced.

Attachment of the Variable Angle Absolute Specular Reflectance Measuring Device enables samples to be
measured at any angle of incidence without swapping accessories.

to

Ideal for Evaluations of Solar Cell Manufacturing Processes and Materials

Large Sample Compartment Model

SolidSpec-3700

Hi g h Se n s i t i vity Wo rld s F irst* UV- VIS- NIR

Sp e c t ro p h o t o meter with T h re e Det ect ors
A photomultiplier tube (PMT) detector is used for the ultraviolet and visible
regions, while an InGaAs detector and a cooled PbS detector are used for the
near-infrared region. Use of the InGaAs and PbS detectors makes the sensitivity
in the near-infrared region significantly high.

Ul tr a - L a rg e S amp le C o mp artment
Wi d e V a ri e t y o f S amp les H an d le d
A 3D optical system and ultra-large sample compartment allow extra large
samples up to 700 mm x 560 mm in size to be placed flat, making large sample
setting easier. And, the Automatic X-Y Stage enables automatic multi-point
measurement of samples up to 310 mm x 310 mm to be measured with nitrogen
gas purged.
* As of February 2005, in-house report

SolidSpec-3700
Sample Compartment

I nte gr a ting
sphe r e

Detectors Optical System

Integrating
sphere

PbS det e c t o r

M o n oc hr om e t e r

Monochr om et er

Dir ec t Dete ctio n Uni t

(DDU: optional)

WI la m p
D 2 l a mp

I nG aAs d e t e c t o r
PMT

Three Dimensional Optical Path

Relationship Between Detectors and Measurable Range

(Common to Both SolidSpec-3700 and UV-3600)

190nm

380nm
UV

PMT
InGaAs
PbS

780nm

3300nm

Visible

NIR

190 to 1000 nm
700 to 1800 nm
1600 to 3300 nm

The PMT detector can be switched to the InGaAs detector in the range of 700 nm to 1000 nm (the default switching wavelength is 870 nm).
The InGaAs detector can be switched to the PbS detector in the range of 1600 nm to 1800 nm (the default switching wavelength is 1650 nm).

Desktop Model

UV-3600

H i gh S e n s i t i vity
This instrument incorporates a PMT (photomultiplier tube) detector
for the ultraviolet and visible regions and an InGaAs detector, and
a cooled PbS detector for the near-infrared region. With
conventional instruments, there is a drop in sensitivity at the
crossover wavelength between the regions covered respectively by
the PMT and PbS detectors. Using an InGaAs detector to cover
this region, however, ensures high sensitivity across the entire
measurement wavelength range. The 1500-nm noise level does
not rise above 0.00003 Abs.

High Resolution, Ultra-Low Stray Light and Wide Measurement Wavelength Range
Using a high-performance double monochromator makes it possible to attain an ultra-low stray light level (0.00005% max. at 340 nm) with a
high resolution (max. 0.1 nm). The wide wavelength range of 185 nm to 3300 nm enables measurements over the ultraviolet, visible and nearinfrared regions, allowing spectrophotometry to be performed in a variety of different fields.

Accessories for Film Measurement

Film Holder (P/N 204-58909) Standard Type

Applicable sample size: Minimum 16 (W) x 32 (H) mm
Maximum 80 (W) x 40 (H) x 20 (t) mm

Film Holder (Special Order)

This accessory is mounted in the instrument's sample
compartment, and enables rotation of the sample and attachment
of a polarizer.
It is particularly suited to the measurement of transmission
characteristics of polarized film. There are many other accessories
available for the UV-3600.

Optical System
InGaAs

PbS detector
InGaAs detector

PbS

PMT

PMT detector

Optical System Around Detectors

SolidSpec-3700 Accessories

Automatic X-Y Stage

This stage enables automatic multi-point measurement of samples
of a maximum size of 310 mm x 310 mm.

Mounted on Instrument

In-Plane Mapping Measurement of Transmittance at 5 Points in a Glass Substrate Surface with TCO at Specific Wavelengths
Wavelength (nm)
Wavelength (nm)

Measurement Point 1

Measurement Point 2

Measurement Point 3

Measurement Point 4

Measurement Point 5

300

6.68

6.3

6.52

7.1

6.52

700

77.8

77.77

76.25

75.44

76.78

1000

69.96

71.99

70.88

69.62

70.34

1500

31.38

35.61

34.02

30.95

31.68

The Automatic X-Y Stage enables automatic in-plane mapping measurement of crystalline Si solar cells as they
are, and even thin-film Si or CIGS solar cells of a maximum size of 310 mm x 310 mm. The results of measuring a
glass substrate with TCO (SnO) for thin-film solar cells shown above indicate that an in-plane transmittance error
6

Variable Angle Absolute Specular Reflectance Measuring

Device (Special Order)
Reference light

Sample

Reference side
integrating sphere

Each of the sample

holder and sample type
detector angles can be
set independently.

Mounted in Sample Compartment

The angle of incidence of the light irradiating the sample can be
changed with ease thanks to a goniometer system that allows
rotation of the sample and detector (integrating sphere) on the
same axis. The integrating sphere can also be installed on the
transmitting side to enable measurement of transmission at a
variable angle of incidence and measurement of the distribution of
the scattered angle of transmission.

Mask

Sample light

Sample side
integrating sphere

Moving parts

Structure of Variable Angle Absolute Specular Reflectance

Measuring Device

Specifications
Applicable sample size
Measurement wavelength range
Absolute specular incidence angle, Variable in range
Transmittance detection angle, Variable in range

50 (W) x 50 (H) x 2 (t) mm

300 to 2600 nm
5 to 70
0 to 90

Sol a r C e l l M a t eria l, C e ll a n d Mo d ule Analysis and Evaluat ion Inst rument s

Energy Dispersive X-Ray
Fluorescence Spectrometer

FTIR Spectrophotometer

IRPrestige-21

GCMS-QP2010 Plus

[Applications]
Non-destructive composition analysis and film
thickness measurement of CIGSS/CIGS, buffer l
ayers, TCO thin films, and electrodes

[Applications]
Analysis of ultraviolet light and thermal
degradation of EVA and other transparent
bonding film, evaluation of Si-H bonding strength

[Applications]
Analysis of chemical changes and deterioration of EVA
in the optical, thermal and oxidation degradation
phases by combining UV irradiation and pyrolysis

EDX Series

XPS Imaging Spectrometer

ESCA-3400

Single Nano Particle Size Analyzer

UV/PY (UV Irradiation/Pyrolysis)

Universal Testing Machine

IG-1000

AG-X

[Applications]
Particle size and particle-size-distribution
measurements of nano-size metal particles
in range 0.5 nm to 200 nm

[Applications]
Module compression and tensile testing, end-sealing
material and back sheet peeling testing, evaluation of
bonding strength of interconnections

(Kratos Amicus)

[Applications]
Chemical bonding analysis of CIGSS/CIGS thin
films and buffer layers in depth direction

JQA-0376

Founded in 1875, Shimadzu Corporation, a leader in the

development of advanced technologies, has a distinguished
history of innovation built on the foundation of contributing to
society through science and technology. We maintain a global
network of sales, service, technical support and applications
centers on six continents, and have established long-term
relationships with a host of highly trained distributors located
in over 100 countries. For information about Shimadzu, and to
contact your local office, please visit our Web site at

www.shimadzu.com

SHIMADZU CORPORATION. International Marketing Division

3. Kanda-Nishikicho 1-chome, Chiyoda-ku, Tokyo 101-8448, Japan
Phone: 81(3)3219-5641 Fax. 81(3)3219-5710

URL http://www.shimadzu.com

The contents of this brochure are subject to change without notice.

Printed in Japan 3295-08901-30AIT