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DOI 10.1007/s11468-008-9055-1
Received: 26 June 2007 / Accepted: 17 January 2008 / Published online: 27 February 2008
# Springer Science + Business Media, LLC 2008
Introduction
Surface plasmon resonance (SPR) is a very sensitive
technique for determining small refractive index changes
at the interface between a metallic layer and a dielectric
medium (analyte) [1]. This technique is widely used as a
detection principle for many sensors that operate in
different areas such as gas detection or bio- and chemicalsensing [2, 3]. SPR has shown great potential for
biomolecular interaction study, allowing real-time analysis
M. Kanso : S. Cuenot : G. Louarn (*)
Institut des Matriaux Jean Rouxel, UMR 6502,
CNRS-Universit de Nantes,
BP 32229, 44322 Nantes, France
e-mail: guy.louarn@cnrs-imn.fr
50
a)
a
Mirror
b)
b
Gold layer
c)
c
Fig. 2 Illustration (non exhaustive) of a few typical OF-SPR sensors. a
Retro-reflecting OF-SPR, b tip tapered OF-SPR, c decladded OF-SPR
Theory background
Surface plasmon is a charge-density oscillation, which can
exist at the interface between metallic and dielectric media.
This electronic oscillation is associated with a surface
electromagnetic wave, a so-called SPW, of which the
electric field is maximum at the interface and decreases
evanescently into both media. Under certain specific
conditions, the energy carried by photons arriving at the
metal/dielectric interface can be transferred to the surface
plasmons. If this transfer is achieved, part of the light is
absorbed and the phenomenon is called SPR. More
precisely, considering a system of three superposed layers,
the first (layer 1) corresponds to a dielectric
medium
(prism
or optical fiber) of refractive index n0 n20 "0 , the second
(layer 2) is a metallic layer characterized by a dielectric
51
bsp kx )
w r
" "
m s
"m "s
p w
" sin q
c
"Au w "1
w2p
ww i w
G1 w G2 w
s
Evanescent field
k
kx
m
0
52
Values
"1
wp rad=s
w rad=s
C1
w1 rad=s
w1 rad=s
C2
w2 rad=s
w2 rad=s
1.37
1.171016
1.531014
0.76
4.011015
8.271014
1.22
5.601015
2.10 1015
3 2qes 2qem w
qes 3 qem w
Experimental section
Acquisition set-up
Ro
Rotary
peristaltic Pump
Buffer
Analyte
Pseudo
layer
Optical fiber sensor
metal
Fig. 4 Schematic representation of the pseudolayer used in roughness
modeling. The corresponding effective dielectric function was
obtained from the adapted MaxwellGarnett theory
Light
source
Optical
detection unit
Flow channel
Waste
53
Pin (in )
in
Metallic layer
Ptrans(, 0 )
tance is obtained by adding 50% of light reflectance for a ppolarization, Rp, with 50% of light reflectance for spolarization, Rs, (Eqs. 12 and 13):
hR
N ;;
=2
Ptrans l; eN / crit Rp l; 0 ; eN ref
i
6
R =2
P0 d0 crit Rs l; 0 ; eN Nref ;; P0 d0
where crit sin1 ncl =n0 is the critical fiber angle and
where Nref L=D tan 0 is the number of reflections
within the active area of the sensor, with D and L
representing the core diameter and the length of the active
area, respectively (Fig. 6).
Until recently, only meridional rays have been considered. Of course, complete modeling should account for the
skew ray trajectory [16, 29], but in this case, the study
would be more complex. However, in agreement with
Sharma et al. [19], the approximation considering only
meridional rays is sufficient for a complete understanding
of sensor performance.
Moreover, it should be noticed that the Gos Haenchen
effect is not considered in the calculus of Nref. However,
because this effect is very small, especially in the case of a
dielectricmetal interface, it is usually neglected. Indeed,
the lateral beam displacement of the totally reflective light
beam at the dielectricmetal interface is estimated to be
several micrometers. Consequently, this displacement has
no effect on the simulated curves of this work [30, 31].
The experimental response curves represent the transmittance T(l) through the fiber as a function of the
wavelength. The transmittance is defined (Eq. 7) as the
ratio between the transmitted power Psens through the fiber,
which is immersed into the analyte, and the transmitted
power Pref obtained for a blank medium.
2 R
3
N
=2
sens
sens N
R
R
P
d
p
s
crit
7
Psens l 6
7
T l
6
4
5
N
N
R
Pref l
=2
ref
ref
P
d
R
R
p
s
crit
7
Numerical calculations for theoretical SPR curves were
performed using Matlab software. For these calculations,
the dielectric constant of fused silica was analytically
determined using Eq. 2. The parameters were adjusted on
experimental data, which were obtained from a handbook
900
850
-Tmin
800
750
-Tmin
600
700
800
900
Wavelength (nm)
1000
700
650
simulated curve
experimental values
600
550
1.32
1.34
1.36
1.38
1.40
1.42
refractive index
Fig. 7 Numerical predictions and experimental values of lTmin as a
function of the refractive index. lTmin values correspond to the
minimum of the transmitted power (in the inset, typical response curve
is presented)
@lres
@ns
nm=RIU
950
54
simulated curves
experimental results
1.0
0.5
0.0
a
600
700
800
900
1000
Wavelength (nm)
Fig. 8 Simulated (straight lines) and experimental (dashed lines) SPR
response curves as a function of the wavelength of four refractive
indices: a) 1.3335 (black lines), b) 1.3668 (red lines), c) 1.3844 (blues
lines), and d) 1.4018 (green lines)
55
Table 2 Signal-to-noise ratio and sensitivity values of an optical fiber, obtained for three refractive indices
ns (RIU)
Indices (RIU)
1.3335
1.3668
1.3844
1.4018
lTmax (nm)
0.0333
0.0509
0.0683
SNR
Sln (nm/RIU)
Expt.
Theo.
Expt.
Theo.
Expt.
Theo.
594
647
715
798
592
645
698
796
0.404
0.924
1.557
0.379
0.757
1.457
1.592103
2.043103
2.987103
1.592103
2.082103
2.987103
1.0
simulated curves
experimental results
1.0
0.5
0.0
0.6
0.8
-0.5
a
b
0.4
0.2
experimental data
numerical calculation
-1.0
600
700
800
900
1000
Wavelength (nm)
Fig. 9 Simulated and experimental T curves (straight and dashed
lines, respectively) as a function of the wavelength of three refractive
indices: a) 1.3668 (red lines), b) 1.3844 (blue lines), and c) 1.4018
(green lines)
0.0
1.34
1.36
1.38
1.40
1.42
Refractive index
Fig. 10 Simulated and experimental T data as a function of the
refractive index at a wavelength of 582 nm
56
Conclusion
This paper presents a comparison between numerical simulations and experimental SPR response curves obtained for
optical fiber-based sensors. The numerical calculations, based
on the transfer matrix formalism, were realized by modeling
the analyte/metallic layer interface with a multilayer system.
Good agreement was observed for the resonance wavelength
location, as well as the whole shape of the response curve.
Then, for a given sensor geometry, the experimental and
predicted sensitivities of sensors were compared and discussed.
Finally, the best working conditions of sensors, i.e., those for
which the optical fiber sensor offered the best sensitivities of
detection, were determined. Although these sensors were not
geometrically optimized, optical fiber-based sensors remain
particularly interesting as remote sensors. Because of the good
agreement, numerical simulations could be used to predict
better functioning conditions of such sensors, but also to
determine their ideal geometrical parameters.
E 0i
H 0i
k
E 0r
N
x
z
0
H
d1
r
0
dk
1=2
2
2dk
ek n20 sin2 0
nk cos k zk zk1
l
l
Appendix
Transfer matrix formalism for a multilayer system
In this appendix, we briefly explain the concept employed to
realize the numerical modeling. The reflectance R of the light
on our multilayer system was computed using the transfer
matrix formalism. This formalism, which is based on the
calculation of light propagation through a multilayer medium
consisting of (N1) isotropic and homogeneous layers, has
already been extensively described [28]. A computer
simulation was performed on three- and four-layer systems
(optical fibermetalanalyte), as depicted in Fig. 3.
This electromagnetic analysis of light reflection on a
multilayer system was solved by the Maxwells equations
subjected to boundary conditions. The Maxwells equation
states that the relationships between fundamental electromagnetic quantities, as the electric field vector E and the
magnetic field vector H. A schematic illustration of the
system is presented in Fig. 11. The amplitude of E and H
vectors are related to the formula within the framework of
transfer matrix formalism, Eq. 11:
E0
EN
M
11
H0
HN
where [M] is the characteristic matrix of the layered system
defined by the following:
NY
1
i sin k
M11 M12
cos k
k
M
M21 M22
ik sin k cos k
k1
k, the phase factor of the kth layer is a function of the
refractive index nk ek k 1=2 , the thickness dk
57
dq0
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