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FQP11N40C/FQPF11N40C

400V N-Channel MOSFET


Features

Description

10.5 A, 400V, RDS(on) =

0.5 @VGS = 10 V

These N-Channel enhancement mode power field effect transistors are produced using Fairchilds proprietary, planar stripe,
DMOS technology.

Low gate charge ( typical 28 nC)


Low Crss ( typical 85pF)

This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and
commutation mode. These devices are well suited for high efficiency switched mode power supplies, active power factor correction, electronic lamp ballasts based on half bridge topology.

Fast switching
100% avalanche tested
Improved dv/dt capability

D
!

G!

TO-220

G DS

FQP Series

TO-220F

GD S

FQPF Series

Absolute Maximum Ratings


Symbol

Parameter

VDSS

Drain-Source Voltage

ID

Drain Current

FQP11N40C

FQPF11N40C
400

Units
V

- Continuous (TC = 25C)

10.5

10.5 *

- Continuous (TC = 100C)

6.6

6.6 *

42 *

IDM

Drain Current

VGSS

Gate-Source Voltage

EAS
IAR

- Pulsed

(Note 1)

42
30

Single Pulsed Avalanche Energy

(Note 2)

360

mJ

Avalanche Current

(Note 1)

11

EAR

Repetitive Avalanche Energy

(Note 1)

13.5

mJ

dv/dt

Peak Diode Recovery dv/dt

(Note 3)

4.5

V/ns

PD

Power Dissipation (TC = 25C)


- Derate above 25C

TJ, TSTG

Operating and Storage Temperature Range

TL

Maximum lead temperature for soldering purposes,


1/8" from case for 5 seconds

135

44

1.07

0.35

W/C

-55 to +150

300

* Drain current limited by maximum junction temperature

Thermal Characteristics
Symbol

Parameter

FQP11N40C

FQPF11N40C

Units

0.93

2.86

C/W

RJC

Thermal Resistance, Junction-to-Case

RCS

Thermal Resistance, Case-to-Sink Typ.

0.5

--

C/W

RJA

Thermal Resistance, Junction-to-Ambient

62.5

62.5

C/W

2005 Fairchild Semiconductor Corporation

FQP11N40C/FQPF11N40C Rev. C

www.fairchildsemi.com

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

QFET

Device Marking

Device

Package

Reel Size

Tape Width

Quantity

FQP11N40C

FQP11N40C

TO-220

--

--

50

FQPF11N40C

FQPF11N40C

TO-220F

--

--

50

Electrical Characteristics
Symbol

TC = 25C unless otherwise noted

Parameter

Test Conditions

Min.

Typ.

Max.

Units

400

--

--

--

V/C

Off Characteristics
BVDSS

Drain-Source Breakdown Voltage

VGS = 0 V, ID = 250 A

BVDSS/
TJ

Breakdown Voltage Temperature


Coefficient

ID = 250 A, Referenced to 25C

--

0.54

IDSS

Zero Gate Voltage Drain Current

VDS = 400 V, VGS = 0 V

--

--

VDS = 320 V, TC = 125C

--

--

10

IGSSF

Gate-Body Leakage Current, Forward

VGS = 30 V, VDS = 0 V

--

--

100

nA

IGSSR

Gate-Body Leakage Current, Reverse

VGS = -30 V, VDS = 0 V

--

--

-100

nA

On Characteristics
VGS(th)

Gate Threshold Voltage

VDS = VGS, ID = 250 A

2.0

--

4.0

RDS(on)

Static Drain-Source
On-Resistance

VGS = 10 V, ID = 5.25 A

--

0.43

0.53

gFS

Forward Transconductance

VDS = 40 V, ID = 5.25 A

--

7.1

--

(Note 4)

Dynamic Characteristics
Ciss

Input Capacitance

Coss

Output Capacitance

Crss

Reverse Transfer Capacitance

VDS = 25 V, VGS = 0 V,
f = 1.0 MHz

--

840

1090

pF

--

250

325

pF

--

85

110

pF

--

14

40

ns

Switching Characteristics
td(on)

Turn-On Delay Time

tr

Turn-On Rise Time

td(off)

Turn-Off Delay Time

tf

Turn-Off Fall Time

Qg

Total Gate Charge

Qgs

Gate-Source Charge

Qgd

Gate-Drain Charge

VDD = 200 V, ID = 10.5 A,


RG = 25

(Note 4, 5)

VDS = 320 V, ID = 10.5 A,


VGS = 10 V
(Note 4, 5)

--

89

190

ns

--

81

170

ns

--

81

170

ns

--

28

35

nC

--

--

nC

--

15

--

nC

--

--

10.5

Drain-Source Diode Characteristics and Maximum Ratings


IS

Maximum Continuous Drain-Source Diode Forward Current

ISM

Maximum Pulsed Drain-Source Diode Forward Current

--

--

42

VSD

Drain-Source Diode Forward Voltage

VGS = 0 V, IS = 10.5 A

--

--

1.4

trr

Reverse Recovery Time

--

290

--

ns

Qrr

Reverse Recovery Charge

VGS = 0 V, IS = 10.5 A,
dIF / dt = 100 A/s

--

2.4

--

(Note 4)

Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 5.7 mH, IAS = 10.5A, VDD = 50V, RG = 25 , Starting TJ = 25C
3. ISD 10.5A, di/dt 200A/s, VDD BVDSS, Starting TJ = 25C
4. Pulse Test : Pulse width 300s, Duty cycle 2%
5. Essentially independent of operating temperature

FQP11N40C/FQPF11N40C Rev. C

www.fairchildsemi.com

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

Package Marking and Ordering Information

Figure 1. On-Region Characteristics

Figure 2. Transfer Characteristics

VGS
Top :

ID, Drain Current [A]

10

150C

ID, Drain Current [A]

10

15.0 V
10.0 V
8.0 V
7.0 V
6.0 V
5.5 V
5.0 V
Bottom : 4.5 V

10

-55C

25C
0

10

Notes :
1. 250s Pulse Test
2. TC = 25C

Notes :
1. VDS = 40V
2. 250s Pulse Test

-1

-1

10

10

10

10

10

VGS, Gate-Source Voltage [V]

VDS, Drain-Source Voltage [V]

Figure 3. On-Resistance Variation vs.


Drain Current and Gate Voltage

Figure 4. Body Diode Forward Voltage


Variation vs. Source Current
and Temperatue

VGS = 10V

IDR, Reverse Drain Current [A]

RDS(ON) [],
Drain-Source On-Resistance

2.0

1.5

1.0

VGS = 20V
0.5
Note : TJ = 25C

10

10

150C
Notes :
1. VGS = 0V

25C

2. 250s Pulse Test


-1

10

15

20

25

30

35

10

40

0.2

0.4

ID, Drain Current [A]

Figure 5. Capacitance Characteristics


2000

1.2

1.4

12

Crss = Cgd

Ciss

1200

Coss

1000
800
600

VDS = 100V

10

VGS, Gate-Source Voltage [V]

1400

Capacitance [pF]

1.0

Coss = Cds + Cgd

1600

Notes ;
1. VGS = 0 V

Crss

400

2. f = 1 MHz

200
0
-1
10

0.8

Figure 6. Gate Charge Characteristics

Ciss = Cgs + Cgd (Cds = shorted)

1800

0.6

VSD, Source-Drain voltage [V]

VDS = 250V
8

VDS = 400V
6

2
Note : ID = 10.5A

0
0

10

10

FQP11N40C/FQPF11N40C Rev. C

10

15

20

25

30

QG, Total Gate Charge [nC]

VDS, Drain-Source Voltage [V]

www.fairchildsemi.com

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

Typical Performance Characteristics

Figure 7. Breakdown Voltage Variation


vs. Temperature

Figure 8. On-Resistance Variation


vs. Temperature
3.0

RDS(ON), (Normalized)
Drain-Source On-Resistance

BVDSS, (Normalized)
Drain-Source Breakdown Voltage

1.2

1.1

1.0

Notes :
1. VGS = 0 V

0.9

2. ID = 250A

0.8
-100

-50

50

100

2.5

2.0

1.5

1.0
Notes :
1. VGS = 10 V

0.5

2. ID = 5.25 A

150

0.0
-100

200

Figure 9-1. Maximum Safe Operating Area


of FQP3N50C

50

100

10 s

ID, Drain Current [A]

ID, Drain Current [A]

10 s
100 s
1 ms

200

Operation in This Area


is Limited by R DS(on)

10

10

150

Figure 9-2. Maximum Safe Operating Area


of FQPF3N50C

Operation in This Area


is Limited by R DS(on)

10

-50

TJ, Junction Temperature [C]

TJ, Junction Temperature [C]

10 ms
100 ms
DC
0

10

Notes :
1. TC = 25C

100 s
1

1 ms

10

10 ms
100 ms
DC

10

Notes :
1. TC = 25C

2. TJ = 150C

2. TJ = 15C

3. Single Pulse

3. Single Pulse

-1

-1

10

10

10

10

10

10

10

VDS, Drain-Source Voltage [V]

10

10

10

VDS, Drain-Source Voltage [V]

Figure 10. MaximumDrain Current


12

ID, Drain Current [A]

10

0
25

50

75

100

125

150

TC, Case Temperature [C]

FQP11N40C/FQPF11N40C Rev. C

www.fairchildsemi.com

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

Typical Performance Characteristics (Continued)

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

Typical Performance Characteristics (Continued)


Figure 11-1. ransient Thermal Response Curve of FQP3N50C
10

0 .2
10

N o te s :
1 . Z J C ( t) = 0 .9 3 C /W M a x .

0 .1

-1

2 . D u ty F a c to r , D = t 1 /t 2

0 .0 5

3 . T J M - T C = P D M * Z J C ( t)

0 .0 2

PDM

0 .0 1

JC

(t), Thermal Response

D = 0 .5

s i n g le p u ls e
10

t1

-2

10

-5

10

-4

10

-3

10

-2

10

-1

t2

10

10

t 1 , S q u a r e W a v e P u ls e D u r a t io n [ s e c ]

Z JC(t), Thermal Response

Figure 11-2. ransient Thermal Response Curve of FQPF3N50C

10

D = 0 .5

0 .2

N o te s :
1 . Z J C( t) = 2 .8 6 /W M a x .
2 . D u t y F a c to r , D = t 1 /t 2
3 . T J M - T C = P D M * Z J C( t)

0 .1
0 .0 5
10

-1

0 .0 2
0 .0 1

10

t1

s in g le p u ls e

-2

10

PDM

-5

10

-4

10

-3

10

-2

10

-1

t2

10

10

t 1 , S q u a r e W a v e P u ls e D u r a t io n [ s e c ]

FQP11N40C/FQPF11N40C Rev. C

www.fairchildsemi.com

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

Gate Charge Test Circuit & Waveform

VGS

Same Type
as DUT

50K
200nF

12V

Qg

10V

300nF

VDS

VGS

Qgs

Qgd

DUT
3mA

Charge

Resistive Switching Test Circuit & Waveforms

VDS
RG

RL

VDS

90%

VDD

VGS

VGS

DUT

10V

10%

td(on)

tr

td(off)

t on

tf
t off

Unclamped Inductive Switching Test Circuit & Waveforms

BVDSS
1
EAS = ---- L IAS2 -------------------2
BVDSS - VDD

L
VDS
BVDSS
IAS

ID
RG

VDD

tp

FQP11N40C/FQPF11N40C Rev. C

VDS (t)

VDD

DUT

10V

ID (t)

tp

Time

www.fairchildsemi.com

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

Peak Diode Recovery dv/dt Test Circuit & Waveforms

DUT

+
VDS
_

I SD
L
Driver
RG

VGS

VGS
( Driver )

Same Type
as DUT

VDD

dv/dt controlled by RG
ISD controlled by pulse period

Gate Pulse Width


D = -------------------------Gate Pulse Period

10V

IFM , Body Diode Forward Current

I SD
( DUT )

di/dt

IRM
Body Diode Reverse Current

VDS
( DUT )

Body Diode Recovery dv/dt

VSD

VDD

Body Diode
Forward Voltage Drop

FQP11N40C/FQPF11N40C Rev. C

www.fairchildsemi.com

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

Mechanical Dimensions

TO - 220

Dimensions in Millimeters

FQP11N40C/FQPF11N40C Rev. C

www.fairchildsemi.com

(Continued)

3.30 0.10

TO-220F
10.16 0.20

2.54 0.20

3.18 0.10

(7.00)

(1.00x45)

15.87 0.20

15.80 0.20

6.68 0.20

(0.70)

0.80 0.10
)
0

(3

9.75 0.30

MAX1.47

#1
+0.10

0.50 0.05

2.54TYP
[2.54 0.20]

2.76 0.20

2.54TYP
[2.54 0.20]

9.40 0.20

4.70 0.20

0.35 0.10

Dimensions in Millimeters

FQP11N40C/FQPF11N40C Rev. C

www.fairchildsemi.com

FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

Mechanical Dimensions

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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.

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FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
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(a) are intended for surgical implant into the body, or (b) support
or sustain life, or (c) whose failure to perform when properly used
in accordance with instructions for use provided in the labeling,
can be reasonably expected to result in significant injury to the
user.

2. A critical component is any component of a life support device


or system whose failure to perform can be reasonably expected
to cause the failure of the life support device or system, or to
affect its safety or effectiveness.

PRODUCT STATUS DEFINITIONS


Definition of Terms
Datasheet Identification

Product Status

Definition

Advance Information

Formative or In
Design

This datasheet contains the design specifications for


product development. Specifications may change in
any manner without notice.

Preliminary

First Production

This datasheet contains preliminary data, and


supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.

No Identification Needed

Full Production

This datasheet contains final specifications. Fairchild


Semiconductor reserves the right to make changes at
any time without notice in order to improve design.

Obsolete

Not In Production

This datasheet contains specifications on a product


that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.

Rev. I15

10
FQP11N40C/FQPF11N40C Rev. C

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FQP11N40C/FQPF11N40C 400V N-Channel MOSFET

TRADEMARKS

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