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BUILT-IN SELF-TEST
Chapter 11 - BIST
page 2 of 24
December 1997
TEST
PATTERN
GENERATOR
(TPG)
CIRCUIT
UNDER
TEST
(CUT)
OUTPUT
DATA
COMPRESSOR
(ODC)
Test Controller
Chapter 11 - BIST
page 3 of 24
December 1997
Pseudoexhaustive patterns
hardware: constant-weight counter, LFSR and XOR, LFSR and SR
circuit must be partitioned or segmented into exhaustively tested blocks
almost complete
Chapter 11 - BIST
page 4 of 24
December 1997
Algorithmic patterns
hardware: finite state machines (sequencers)
used to test circuits with regular structures
Pseudo-deterministic patterns
hardware: modified LFSR to also generate specified vectors
Chapter 11 - BIST
page 5 of 24
December 1997
internal-XOR LFSR
D
C
page 6 of 24
D
C
December 1997
December 1997
Example
1
0
0
1
0
1
1
1
1
1
0
0
1
0
1
1
1
1
1
0
0
1
0
1
Chapter 11 - BIST
page 8 of 24
December 1997
Chapter 11 - BIST
page 9 of 24
December 1997
BIST Design
1. Analyze the logic and partition the circuit
Unstructured (Random) logic
Regular structures (RAM, ROM, Register file, FIFO,...)
4. Controller design
5. Integrate with boundary-scan (BIST controlled from the
boundary-scan bus)
Chapter 11 - BIST
page 10 of 24
December 1997
Chapter 11 - BIST
page 11 of 24
December 1997
CUT1
TPG
D
I
S
T
D
I
S
T
ODC
CUTn
Test Controller
page 12 of 24
December 1997
TPG1
TPGn
CUT1
CUTn
ODC1
ODCn
Chapter 11 - BIST
page 13 of 24
December 1997
BIST Hierarchy
Chapter 11 - BIST
page 14 of 24
December 1997
BIST Hierarchy
System
TI
TI
IC
TI
...
IC
TI
ATE
or
Maintenance
Processor
Board
...
TI
IC
TI
...
IC
TI
Board
Chapter 11 - BIST
page 15 of 24
December 1997
Chapter 11 - BIST
page 16 of 24
December 1997
...
Input Reg.
Operations:
Read/Write: RAM, FIFO, Register file,
CAM
Read only: ROM, PLA
.
.
.
D
e
c
o
d
e
r
Cell array
Output Reg.
...
page 17 of 24
December 1997
December 1997
0 ...
1 ...
j
(good)
j
(faulty)
initially
write i 1
read j
Chapter 11 - BIST
page 19 of 24
December 1997
Board-level:
use existing components supporting BIST
use a programmable chip able to implement different test algorithms
Chapter 11 - BIST
page 20 of 24
December 1997
BIST interface:
BIST = start self-test
BC = BIST complete (done)
BF = BIST flag (GO/NOGO test
result)
BFC = BIST flag check (initiate
test to check that BF is not stuck at 0)
may be controlled by boundary scan
Chapter 11 - BIST
page 21 of 24
December 1997
1. W0
2. (R0, W1, W0, W1)
3. (R1, W0, R0, W1)
4. (R1, W0, W1, W0)
5. (R0, W1, R1, W0)
6. (W0, R0)
7. (W1, R1)
Chapter 11 - BIST
page 22 of 24
December 1997
Functional inputs
Functional outputs
BIST
Macrocell
BC
BF
BFC
BIST
1149.1
control inputs
BIST
Resource
Interface
Controller
(BSBRIC)
1149.1
control outputs
TCK
Chapter 11 - BIST
page 23 of 24
December 1997
December 1997