Routine Test

Routine Test
1- LST RTTST
List Routine Test Task (LST RTTST)

Function
Use this command to list the information about all the started routine tests.
Note
None.
Parameters
ID
Name
Description
TID Task ID Meaning: Indicates the ID of the task.

GUI value range: 0~4294967295
Unit: None
Actual value range: 0~4294967295
MML Default value: None
Recommended value: None
Parameter Relationship: None
Service Interrupted After Modification: Not involved
Impact on Radio Network Performance: None
Example
Example 1: To list the information about the routine E1/T1 test whose task ID
is 2, run the following command:
LST RTTST:TID=2;
The result is shown as follows:
+++
HUAWEI
2008-05-17 12:05:39
O&M
#28
%% LST RTTST:TID=2;%%
RETCODE = 0 Operation succeeded
Routine Test Task
-----------------
Task ID
Task State
Test Item
Cabinet No.
Subrack No.
Slot No.
Subboard Type
Port No.
Start Time
End Time
Test Period(min)
Test Duration(min)
=
=
=
=
=
=
=
=
=
=
=
=
2
IDLE
E1T1 Test
0
0
0
E1 Cover Board
0
2008-05-01 22:00:00
2008-06-01 22:30:00
40
1
(Number of results = 1)
---
END
Example 2: To list the information about the routine RTWP test whose task ID
LST RTTST:TID=255;
LST RTTST: TID=255;
+++
HUAWEI
2010-04-07 11:15:03
O&M
#182
%%LST RTTST: TID=255;%%
RETCODE = 0 Operation succeeded.
Routine Test Task
----------------Task ID
Task State
Test Item
Detection Type
Change Time (S)
Increase/Decrease Range (0.1dB)
Upper Limit (0.1dBm)
Lower Limit (0.1dBm)
---
=
=
=
=
=
=
=
=
255
TESTING
RTWP Test
Change Threshold
5
10
-720
-1120
END
Output Description
Field
Description
Task ID
Indicates the ID of the task.
Task State
Indicates the status of the task.
Test Item
Indicates the type of the routine test.
Cabinet No.
Indicates the cabinet number.
Subrack No.
Indicates the subrack number.
Slot No.
Indicates the slot number.
Subboard Type
Indicates the type of the sub-board.
Port No.
Indicates the port number.
Test Start Time
Indicates the start time of the test.
Test End Time
Indicates the end time of the test.
Test Period(min)
Indicates the interval at which the test is conducted.
Test Duration(min)
Indicates the test duration.
Detection Type
Indicates the detection type.
Change Time(s)
Indicates the size of the time window. This parameter is valid when
Detection Type includes CHANGE or THRESHOLD.
Increase/Decrease
Range(0.1dB)
Indicates the range in which the RTWP changes.
Upper Limit(0.1dBm)
Indicates the upper limit.
Lower Limit(0.1dBm)
Indicates the lower limit.
Huawei Proprietary and Confidential

Copyright Huawei Technologies Co., Ltd.
List Routine Test Result (LST

RTTSTRESULT)
Function
Use this command to list the results of the executed routine test. The system actively reports each
result of the routine test, before reporting the command execution success message, which
indicates the number of results of the executed routine test.
Note
All routine test results saved on an NE will be lost when the NE restarts.
The number of RTWP routine test result executed is fixed to 0, but this data cannot be
used for the analysis of the RTWP performance test result. To view the actual RTWP,
upload the routing RTWP test log file from the base station.
Parameters
ID
Name
Description

Unit: None
Example
Example 1: To list the results of the routine E1/T1 test whose task ID is 2,
run the following command:
LST RTTSTRESULT: TID=2;
+++
HUAWEI
2008-05-17 12:05:39
O&M
#28
%% LST RTTSTRESULT:TID=2;%%
RETCODE = 0 Succeed.
E1T1 Test Result
---------------Task ID = 2
Cabinet No. = 0
Subrack No. = 0
Slot No. = 0
Subboard Type = E1 Cover Board
Port No. = 1
Execution Result = Succeeded
Test Start Time = 2008-05-03 18:30:00
Test End Time = 2008-05-03 18:40:00
Line Conflicting Error Rate = 0.002
Framing Error Rate = 0.001
CRC Error Rate = 0.0001
EBit Error Rate(E1)/Error Block Rate(T1) = 0.05
To be continued...
---
END
+++
HUAWEI
2008-05-17 12:05:39
O&M
#28
%% LST RTTSTRESULT:TID=2;%%
Number of Test Result Executed

-----------------------------Number of Test Result Executed
2 reports in total
--END
Example 2: To list the results of the routine optical port test whose task ID
+++
HUAWEI
2010-04-07 11:24:29
O&M
#223
%%LST RTTSTRESULT: TID=4;%%
STM1 Test Result
---------------Task ID
Cabinet No.
Subrack No.
Slot No.
Subboard Type
STM No.
Test Mode
Test Start Time
Test End Time
Execution Result
Out of Frame Event Rate
Regenerator Section Block Error Rate
Multiplex Section Block Error Rate
Multiplex Section Far End Block Error Rate
High Order Path Block Error Rate
High Order Path Far End Block Error Rate
Loss of Cell Delineation Event Rate
Rx Corrected HEC Error Rate
Rx Uncorrectable HEC Error Rate
Nonmatched Cell Rate
Tx Cell Number
Rx Cell Number
Lower Order Path Block Error Rate
Lower Order Path Far End Block Error Rate
To be continued...
---
END
+++
HUAWEI
2010-04-07 11:24:29
O&M
#223
%%LST RTTSTRESULT: TID=4;%%
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
4
0
0
0
Unchannelled Cover Board
0
Group Type
2010-04-07 11:23:17
2010-04-07 11:24:17
Succeeded
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
1000
2000
0.3000000001
0.3000000001

2 reports in total
--END
Output Description
Field
Description
Task ID
Cabinet No.
Subrack No.
Slot No.
Subboard Type
Port No.
Test Start Time
Test End Time
Execution Result
Indicates the result of the routine test.
Line Conflicting Error Rate
Indicates the proportion of line code type conflicts.
Framing Error Rate
Indicates the proportion of framing errors.
CRC Error Rate
Indicates the proportion of CRC errors.
EBit Error Rate(E1)/Error Block

Rate(T1)
Indicates the proportion of erroneous Ebits.
STM No.
Indicates the number of the optical port.
Test Mode
Indicates the test mode.
Framing Error Rate
Indicates the out-of-frame rate.
Section BIP Rate
Indicates the proportion of erroneous blocks on the

regenerator section.
Line BIP Rate

multiplex section.
Line FEBE Rate
Indicates the proportion of erroneous blocks at the far end of

the multiplex section.
Path BIP Rate
Indicates the proportion of erroneous blocks on the higher

order path.
Path FEBE Rate

the higher order path.
Locd Event Ratio
Indicates the proportion of cell delineation losses.
Hec Correctable Error Ratio
Indicates the proportion of corrected HEC errors.
Hec Uncorrectable Error Ratio
Indicates the proportion of uncorrectable HEC errors.
Non Matching Ratio
Indicates the proportion of mismatched cells.
Number of Tx Cells
Indicates the number of cells transmitted.
Number of Rx Cells
Indicates the number of cells received.
Lower Order Path Block Error

Rate
Indicates the proportion of erroneous blocks on the lower

order path.
Lower Order Path Far End Block

Error Rate

the lower order path.
Indicates the number of results of the executed routine test.

Start E1/T1 Routine Test (STR E1T1RTTST)

Function
Use this command to start the routine test of E1/T1 performance. After the test is started, the ID
of the task is reported.
Note
The test has no impact on services.

A routine test is not conducted for a single user but effective to all users.
A routine test cannot be started by different users at the same time.
When an E1/T1 performance test is started, all users can query or stop the test, but no
user can start the test again.
A maximum of 20 routine tests can be conducted at the same time in the system,
including the E1/T1 performance routine test, optical port line performance routine test,
and RTWP routine test.
The time and date parameters indicate the time and date of the BS rather than the time
and date of the LMT.
Parameters
ID
Name
Description
CN
Cabinet No.
Meaning: Indicates the cabinet number.

Unit: None
MML Default value: 0
Recommended value: 0
SRN Subrack No.
Meaning: Indicates the subrack number.

Unit: None
MML Default value: 0
SN
Meaning: Indicates the slot number.

Unit: None
Slot No.
CLS Subboard
Type
Meaning: Indicates the type of the sub-board.

GUI value range: BASE_BOARD(Base Board), E1_COVERBOARD(E1
Cover Board)
Unit: None
Actual value range: BASE_BOARD, E1_COVERBOARD
PN
Port No.
Meaning: Indicates the port number.

Unit: None
SD
Start Date
Meaning: Indicates the start date.

GUI value range: 2000-01-01~2099-12-31
Unit: None
Actual value range: 2000-01-01~2099-12-31
ST
Start Time
Meaning: Indicates the start time.

GUI value range: 00:00:00~23:59:59
Unit: None
Actual value range: 00:00:00~23:59:59
ED
End Date
Meaning: Indicates the end date.

GUI value range: 2000-01-01~2099-12-31
Unit: None
Actual value range: 2000-01-01~2099-12-31
ET
End Time
Meaning: Indicates the end time.

GUI value range: 00:00:00~23:59:59
Unit: None
Actual value range: 00:00:00~23:59:59

TP
Test Period
Meaning: Indicates the interval at which the test is conducted.

Unit: min
Parameter Relationship: TP in the RTTST MO should be more than TP.
TD
Test Duration Meaning: Indicates the test duration.

Unit: min
Parameter Relationship: TD in the RTTST MO should be less than TP.
Example
To start the routine E1/T1 performance test with the parameters as follows:
Cabinet No.: 0, Subrack No.: 0, Slot No.: 0, Subboard Type: E1 Cover Board,
Port No.: 0, Start Date: 2010&07&01, Start Time: 00&00&00, End Date:
2010&07&02, End Time: 00&00&00, Test Period: 60, Test Duration: 5, run the
following command:
STR E1T1RTTST: CN=0, SRN=0, SN=0, CLS=E1_COVERBOARD,PN=0, SD=2010&07&01,
ST=00&00&00, ED=2010&07&02, ET=00&00&00, TP=60, TD=5;
+++
HUAWEI
2008-05-17 12:05:39
O&M
#28
%%STR E1T1RTTST: CN=0, SRN=0, SN=0, CLS=E1_COVERBOARD, PN=0, SD=2010&07&01,
ST=00&00&00, ED=2010&07&02, ET=00&00&00, TP=60, TD=5;%%
Start E1T1 Routine Test Report
-----------------------------Task ID = 2
---
END
Output Description
Field
Description
Task ID Indicates the ID of the task.

Start RTWP Routine Test (STR

RTWPRTTST)
Function
Use this command to start the routine test of RTWP. When the conditions specified by the user
are met, the system records the observed RTWP and save it in the routine test log, which can be
uploaded and viewed by the user. The system records the RTWP by the following methods:
1. RTWP change: When the RTWP variation occurring in a time window exceeds a specified
range, an event is reported, and the system records the RTWP within 30s before and 30s after the
event, with a sampling interval of 1s.
2. Based on the RTWP threshold: When the RTWP is higher than the specified upper threshold
or lower than the specified lower threshold, an event is reported, and the system records the
RTWP values within 30s before and 30s after the event, with a sampling interval of 1s.
3. Periodic: The RTWP values are automatically recorded once per second.
Users can select the following modes:
1. Only based on the RTWP change: Set Detection Type to CHANGE, and set Change Time and
Increase/Decrease Range properly.
2. Only based on the RTWP threshold: Set Detection Type to THRESHOLD, and set Upper
Limit and Lower Limit properly.
3. Based on the RTWP change and the RTWP threshold simultaneously: Set Detection Type to
CHANGE_THRESHOLD, and set Change Time, Increase/Decrease Range, Upper Limit, and
Lower Limit properly.
4. Periodic: Set Detection Type to AUTO.
Note
When a RTWP routine test is started, all users can query or stop the test, but no user can
start the test again.
A maximum of 20 routine tests can be conducted at the same time in the system,
including the E1/T1 performance routine test, optical port line performance routine test,
and RTWP routine test.
A routine test is not conducted for a single user but effective to all users.
Parameters
ID
Name
Description
TYPE
Detection Type
Meaning: Indicates the detection type.

GUI value range: CHANGE(CHANGE),
THRESHOLD(THRESHOLD),
CHANGE_THRESHOLD(Change Threshold), AUTO(Auto)
Unit: None
Actual value range: CHANGE, THRESHOLD,
CHANGE_THRESHOLD, AUTO
CHT
Change Time
Meaning: Indicates the size of the time window. This parameter

is valid when Detection Type includes CHANGE or
THRESHOLD.
Unit: s
RANGE Increase/Decrease
Range
Meaning: Indicates the range in which the RTWP changes.

Unit: 0.1dB
UPL
Meaning: Indicates the upper limit.
Upper Limit
GUI value range: -1120~-720

Unit: 0.1dBm
Actual value range: -1120~-720
LOWL
Lower Limit
Meaning: Indicates the lower limit.

GUI value range: -1120~-720
Unit: 0.1dBm
Actual value range: -1120~-720
Example
To start the routine RTWP performance test with the parameters as follows:
Detection Type: CHANGE, Change Time: 300, Increase/Decrease Range: 100, run
the following command:
STR RTWPRTTST:TYPE=CHANGE,CHT=300,RANGE=100;
+++
HUAWEI
2008-05-17 12:05:39
O&M
#28
%% STR RTWPRTTST:TYPE=CHANGE,CHT=300,RANGE=100;%%
Start RTWP Routine Test Report
-----------------------------Task ID = 2
--END
Output Description
Field
Description
Task ID Indicates the ID of the task.

top Routine Test (STP RTTST)
Function
Use this command to stop the specified routine test. The system actively reports each result of
the routine test, before reporting the command execution success message, which indicates the
number of results of the executed routine test.
Note
None.
Parameters
ID
Name
Description

Unit: None
Example
Example 1: To stop the routine E1/T1 test whose task ID is 2, run the
following command:
STP RTTST:TID=2;
+++
HUAWEI
2008-05-17 12:05:39
O&M
#28
%%STP RTTST:TID=2;%%
RETCODE = 0 Succeed.
E1T1 Test Result
---------------Task ID
Cabinet No.
Subrack No.
Slot No.
Subboard Type
Port No.
Execution Result
Test Start Time
Test End Time
Framing Error Rate
=
=
=
=
=
=
=
=
=
=
=
2
0
0
0
E1 Cover Board
1
Succeeded
2008-05-03 18:30:00
2008-05-03 18:40:00
0.002
0.001
CRC Error Rate

EBit Error Rate(E1)/Error Block Rate(T1)
=
=
0.0001
0.05
To be continued...
---
END
+++
HUAWEI
2008-05-17 12:05:39
O&M
#28
%%STP RTTST:TID=2;%%
2 reports in total
--END
Example 2: To stop the routine optical port test whose task ID is 4, run the
following command:
STP RTTST:TID=4;
STP RTTST: TID=4;
+++
HUAWEI
2010-04-07 11:24:49
O&M
#226
%%STP RTTST: TID=4;%%
STM1 Test Result
---------------Task ID
Cabinet No.
Subrack No.
Slot No.
Subboard Type
STM No.
Test Mode
Test Start Time
Test End Time
Execution Result
Out of Frame Event Rate
Regenerator Section Block Error Rate
Multiplex Section Block Error Rate
Multiplex Section Far End Block Error Rate
High Order Path Block Error Rate
High Order Path Far End Block Error Rate
Loss of Cell Delineation Event Rate
Rx Corrected HEC Error Rate
Rx Uncorrectable HEC Error Rate
Nonmatched Cell Rate
Tx Cell Number
Rx Cell Number
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
4
0
0
0
Unchannelled Cover Board
0
Group Type
2010-04-07 11:23:17
2010-04-07 11:24:17
Succeeded
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
0.3000000001
1000
2000
Lower Order Path Block Error Rate

Lower Order Path Far End Block Error Rate
=
=
0.3000000001
0.3000000001
To be continued...
---
END
+++
HUAWEI
2010-04-07 11:24:49
O&M
#226
%%STP RTTST: TID=4;%%
2 reports in total
--END
Output Description
Field
Description
Task ID
Cabinet No.
Subrack No.
Slot No.
Subboard Type
Port No.
Test Start Time
Test End Time
Execution Result
Indicates the result of the routine test.
Indicates the proportion of line code type conflicts.
Framing Error Rate
Indicates the proportion of framing errors.
CRC Error Rate
Indicates the proportion of CRC errors.
EBit Error Rate(E1)/Error Block

Rate(T1)
Indicates the proportion of erroneous Ebits.
STM No.
Indicates the number of the optical port.
Test Mode
Indicates the test mode.
Framing Error Rate
Indicates the out-of-frame rate.
Section BIP Rate

regenerator section.
Line BIP Rate

multiplex section.
Line FEBE Rate

the multiplex section.
Path BIP Rate
Indicates the proportion of erroneous blocks on the higher

order path.
Path FEBE Rate

the higher order path.
Locd Event Ratio
Indicates the proportion of cell delineation losses.
Hec Correctable Error Ratio
Indicates the proportion of corrected HEC errors.
Hec Uncorrectable Error Ratio
Indicates the proportion of uncorrectable HEC errors.
Non Matching Ratio
Indicates the proportion of mismatched cells.
Number of Tx Cells
Indicates the number of cells transmitted.
Number of Rx Cells
Indicates the number of cells received.
Lower Order Path Block Error

Rate
Indicates the proportion of erroneous blocks on the lower

order path.
Lower Order Path Far End Block

Error Rate

the lower order path.
Indicates the number of results of the executed routine test.


Routine Test

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Routine Test

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Routine Test

List Routine Test Task (LST RTTST)

TID Task ID Meaning: Indicates the ID of the task.

Indicates the ID of the task.

Indicates the status of the task.

Indicates the type of the routine test.

Indicates the cabinet number.

Indicates the subrack number.

Indicates the slot number.

Indicates the type of the sub-board.

Indicates the port number.

Test Start Time

Indicates the start time of the test.

Test End Time

Indicates the end time of the test.

Indicates the interval at which the test is conducted.

Indicates the test duration.

Indicates the detection type.

Indicates the range in which the RTWP changes.

Indicates the upper limit.

Indicates the lower limit.

Huawei Proprietary and Confidential

List Routine Test Result (LST

TID Task ID Meaning: Indicates the ID of the task.

Number of Test Result Executed

Number of Test Result Executed

Indicates the ID of the task.

Indicates the cabinet number.

Indicates the subrack number.

Indicates the slot number.

Indicates the type of the sub-board.

Indicates the port number.

Test Start Time

Indicates the start time of the test.

Test End Time

Indicates the end time of the test.

Indicates the result of the routine test.

Line Conflicting Error Rate

Indicates the proportion of line code type conflicts.

Framing Error Rate

Indicates the proportion of framing errors.

CRC Error Rate

Indicates the proportion of CRC errors.

EBit Error Rate(E1)/Error Block

Indicates the proportion of erroneous Ebits.

Indicates the number of the optical port.

Indicates the test mode.

Framing Error Rate

Indicates the out-of-frame rate.

Section BIP Rate

Indicates the proportion of erroneous blocks on the

Line BIP Rate

Indicates the proportion of erroneous blocks on the

Line FEBE Rate

Indicates the proportion of erroneous blocks at the far end of

Path BIP Rate

Indicates the proportion of erroneous blocks on the higher

Path FEBE Rate

Indicates the proportion of erroneous blocks at the far end of

Locd Event Ratio

Indicates the proportion of cell delineation losses.

Hec Correctable Error Ratio

Indicates the proportion of corrected HEC errors.

Hec Uncorrectable Error Ratio