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= =
Y=Young module
P E E D + = =
0
In case an electric field is applied to a dielctric material
Where
D is the elctric displacement vector and
P is the polarization
The relationship between mechanical Stress and Strain
In case of a piezoelectric the mutual
effects come to play:
stress constant a for constant dielectric
dE T s S
E dT D
T
E
T
+ =
+ =
Electric field Stress
Polarization
Strain
Modelling..
Piezoelectric transducers
9
constant ric Piezoelect (C/N)
field E constant a for softness
d
s
E
In real devices 6 possible axis must be
considered:
3 for stress due to
compression/expansion
3 for torsional stress
Piezoelectric transducers
10
The matrix form of equations are:
[ ] [ ][ ]
[ ] [ ][ ] 3 , 2 , 1 ,
6 ,.., 1
3 , 2 , 1
= =
=
=
=
j i E D
j
i
T s S
j ij i
j ij i
[ ] [ ][ ] [ ][ ] + = E d T s S
k ik j ij i
Piezoelectric transducers
11
[ ] [ ][ ] [ ][ ]
[ ] [ ][ ] [ ][ ]
= =
= =
+ =
+ =
m i for m k i
d d n j
T d E D
E d T s S
im
ji ij
n in m im i
k ik j ij i
0 3 , 2 , 1 , ,
6 ..., , 1 ,
T
=600
o
;
g=-8(mV/m)/(N/m
2
);
We are looking for the Voltage (open
circuit) due to a force of 1000 N applied
to a cube with a 1 cm side.
Piezoelectric transducers
19
to a cube with a 1 cm side.
SOLUTION:
Open circuit operation:
( )( )
V 829 10 1 * 10 9 . 82
kV/m 9 . 82
10 85 . 8 600
) 01 /(. 1000 10 44
0
2 3
12
2 12
= = =
=
=
= =
=
h E V
T
d
E
D
T
EXAMPLE 2:
Requirements:
The strain due to an applied voltage
V=1kV (no mechanical load).
SOLUTION
0 = T
Piezoelectric transducers
20
( )
( )
nm 44
10 4 . 4 01 . 0 10 4 . 4
4 . 4
10 4 . 4
01 . 0
1000 10 44
0
8 6
6
12
=
= = =
=
= =
= =
=
h
dE S
T
A method for the estimation of the d parameter
dt
dF
d
dt
dQ
I
F d Q
T d D
33
33
33
= =
=
=
sCR R
R
s
, C
s
sensor
C
c
wires
R
a
, C
a
voltage amplifier.
Piezoelectric transducers
21
sCR
sCR
I
sC
R
R
I I
C
+
=
+
=
1
1
RC con
s
s
C
F d
sCR
sRC
C
F d
sCR
R
sF d
sCR
R
I
sCR
sCR
I
sC
I
sC
V
C
=
+
=
+
=
+
=
=
+
=
+
= =
1 1 1
1 1
1 1
33 33
33
In the high frequency domain the relationship between V and F is
frequency independent
Forcing the device with a known force and measuring V it is
possible to estimate d
33
In case of a unknown C a high value capacitor can be added in parallel.
dt
dF
d
dt
dQ
I
F d Q
T d D
33
33
33
= =
=
=
RC
s d V
= =
con
33
R
s
, C
s
del sensore
C
c
del cavo
R
a
, C
a
dellampl. di tens.
A method for the estimation of the d parameter
Piezoelectric transducers
22
RC
s C F
=
+
=
con
1
33
The circuit is a high pass filter .
Ex: In case of C=0.1pF, R=1T :
F
t,Amp
=1/(2RC)=3Hz
Moreover, the high output impedance of the
piezoelectric can cause coupling problem with
the amplifier
sCR
R
+ 1
V
I
I
eq
I
2
5
'
10
=
A
A
V
V
The Charge Amplifier
Piezoelectric transducers
23
sCR + 1
( )
( ) ( )
A sRC
sRC
C
Ad
F
V
A C C sR
sRC
C
Ad
F
V
F sd
A
sC
sC
R
sCR
A
V
sC ' V V
R
sRC
V F sd
I I I
f
f
f
f
f
f
f
f
f
'
eq
+
+ + +
=
=
|
|
\
|
+ +
+
= +
+
= + +
1
1 1
1 1
0
1
0
33
33
33
33
2
Amp , t
f
ChA , t
f
A RC
f <<
=
2
1
R
V
I
I
eq
I
2
A
V
V =
'
A method for the estimation of the d parameter
The Drift problem!!
Piezoelectric transducers
24
Ex: if C
f
=10pF, C=0.1pF, R=1T, R
f
=1T si ha:
f
t,Amp
=1/(2RC)=3Hz
f
t, ChA
=1/(2R
f
C
f
)=0.03Hz
sCR
R
+ 1
Amp t
f f
ChA t
f
C R
f
, ChA t,
,
f
: obtain to allow can parameters feedback suitbale
2
1
<
=
PZT characterization
Target: a new low cost strategy to characterize the behaviour of
piezoelectric bimorphs in a cantilever configuration, envisaged for
research and educational activities.
Methodology: a contact-less measurement system based on
coupled Infra-Red (IR) sensors and a CCD based calibration
facility.
Piezoelectric
IR Receiver
IR Transmitter
Reference
point
EL-23G/ST-23G
Plexiglas
Physik Instrument
Amplifier
Piezoelectric
bimorph
DAQ Card
PCI-6052E
Infrared
Diode
Waveform
generator
Conditioning
circuit
Piezoelectric
bimorph
IR sensors
Piezoelectric bimorphs
PZT characterization
The calibration strategy for the IR system.
The system is composed of:
a CCD sensor
an image processing tool estimating the position of a marker
deposited on the top of the piezoelectric actuator (LabVIEW, IMAQ
Vision).
To this aim the actuator is activated by a low frequency stimulus (lower
than 200 mHz) (compatible with the 30 frames/s rate of the video
acquisition system).
Deflection
The virtual instrument for
calibration of the IR tool.
Deflection
Conversion factor [mm/pixel]
Environment developed to process
frames recorded by the CCD device.
PZT characterization
The calibration strategy for the IR system.
out
V 02162 . 0 =
u =6 m u
=6 m
CCD conversion factor: 13.7 m/pixel
PZT characterization
Hysteresis
Inverse piezoelectric effect.
Rate-dependent memory
dominates at high
frequencies due to a phase-
lag effect.
Rate-independent memory
prevails at low frequencies.
S
Among Piezoelectric, some materials
exist which show a spontaneous
polarization: these materials are called
Piroelectrics and shows a relationship
between the polarization and the
temperature.
Pyroelectric materials
29
DP = A DT
Ferroelectric materials are a special
class of non linear Piroelectric materials
where the spontaneous polarization can
be reversed by an external electric field.
Ferroelectric materials
Domain wall
Dipoles inertia!
DV
P
-
P
+
V(P)
Ferroelectric materials
DV
P
-
P
+
V(P)
VIDEO
Sumarizing
32
Perovskite:
(BaTiO
3
);
(PbTiO3);
(CaTiO3);
PZT;
PLZT;
ceramics
Ex. Barium Titanate:
Ceramics
Piezoelectric transducers
33
The Curie point is about 130C. Above 130C, a nonpiezoelectric
cubic phase is stable, where the center of positive charge (Ba2+
and Ti4+) coincides with the center of the negative charge (O2)
(Figure a).
When cooled below the Curie point, a tetragonal structure (shown
in Figure b) develops where the center of positive charge is
displaced relative to the O2ions, leading to the formation of
electric dipoles.
(a) Cubic lattice (above Curie temperature). (b) Tetragonal lattice (below Curie temperature).