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) (1)
Subbing in the value of Cpk gives us the following:
Page 3 of 7
So the sigma level of the process is:
5. What is the fraction nonconforming for this
process?
To the fraction nonconforming is used to
find out how many parts per million can be
expected to be nonconforming. The equation is:
(2)
The Minitab output from the capability
chart of the final output, y300, provides us with a
PPM estimation (see Appendix 1C). Having this
PPM (Observed PPM Total = 41000), we can use
the equation and back out the fraction
nonconforming, p. The equation becomes:
(3)
This calculation returns a p value of .041.
Expressed as a percentage, the fraction
nonconforming for the entire process is 4.1%.
Conclusion:
Using y300, the final output, it is determined that
the entire process is not in statistical control and
also not capable:
Y300 has one point that plots above the
upper control limit on the Xbar chart, and
is thus deemed out of control.
The Cp being less than one showed that
the process was not capable.
Using the Cpk, the process is currently
operating at a sigma level of 3.51.
Using the PPM, the fraction
nonconforming, p, is found to be 4.1%.
References:
Montgomery, Douglas C., Introduction to Statistical
Quality Control, sixth edition, Hoboken, NJ:
Wiley, 2009.
"Watfactory Login." Faculty of Mathematics. Web.
<http://www.student.math.uwaterloo.ca/~stat4
35/login.htm>
Page 4 of 7
Appendix 1A: Output Variable Histograms
15 10 5 0 -5 -10 -15
60
45
30
15
0
18 12 6 0 -6 -12 -18
150
100
50
0
18 12 6 0 -6 -12 -18
120
90
60
30
0
y100
F
r
e
q
u
e
n
c
y
y200
y300
Mean -0.3147
StDev 6.329
N 1000
y100
Mean -1.716
StDev 6.478
N 1000
y200
Mean -0.9975
StDev 6.639
N 1000
y300
Histogram of y100, y200, y300
Normal
Page 5 of 7
Appendix 1B: Control Charts for Out of Control Output Variable Processes
Test Results for Xbar Chart of y200
19 17 15 13 11 9 7 5 3 1
0
-2
-4
Sample
S
a
m
p
l
e
M
e
a
n
_
_
X=-1.716
UC L=0.978
LCL=-4.410
19 17 15 13 11 9 7 5 3 1
8
7
6
5
4
Sample
S
a
m
p
l
e
S
t
D
e
v
_
S=6.316
UC L=8.235
LCL=4.397
1
1
Xbar-S Chart of y200
TEST 1. One point more than 3.00 standard deviations from center line.
Test Failed at points: 16, 20
Test Results for Xbar Chart of y300
19 17 15 13 11 9 7 5 3 1
2
0
-2
-4
Sample
S
a
m
p
l
e
M
e
a
n
_
_
X=-0.998
UC L=1.760
LCL=-3.755
19 17 15 13 11 9 7 5 3 1
8
7
6
5
4
Sample
S
a
m
p
l
e
S
t
D
e
v
_
S=6.467
UC L=8.432
LCL=4.502
1
Xbar-S Chart of y300
TEST 1. One point more than 3.00 standard deviations from center line.
Test Failed at points: 20
Page 6 of 7
Test Results for S Chart of x3
19 17 15 13 11 9 7 5 3 1
2.7
2.4
2.1
1.8
1.5
Sample
S
a
m
p
l
e
M
e
a
n
_
_
X=2.159
UCL=2.798
LCL=1.520
19 17 15 13 11 9 7 5 3 1
2.00
1.75
1.50
1.25
1.00
Sample
S
a
m
p
l
e
S
t
D
e
v
_
S=1.498
UCL=1.954
LCL=1.043
1
Xbar-S Chart of x3
TEST 1. One point more than 3.00 standard deviations from center line.
Test Failed at points: 13
Page 7 of 7
Appendix 1C: Best Fit Plots and Capability Charts
20 0 -20
99.99
99
90
50
10
1
0.01
y300
P
e
r
c
e
n
t
520 500 480 460
99.99
99
90
50
10
1
0.01
y300 - Threshold
P
e
r
c
e
n
t
100 10 1 0.1 0.01 0.001
99.99
90
50
10
1
0.01
y300 - Threshold
P
e
r
c
e
n
t
100 10 1
99.99
90
50
10
1
0.01
y300 - Threshold
P
e
r
c
e
n
t
2-Parameter Exponential
AD = 205.941
P-V alue < 0.010
3-Parameter Weibull
AD = 0.743
P-V alue = 0.032
Goodness of Fit Test
Normal
AD = 0.240
P-V alue = 0.776
3-Parameter Lognormal
AD = 0.216
P-V alue = *
Probability Plot for y300
Normal - 95% CI 3-Parameter Lognormal - 95% CI
2-Parameter Exponential - 95% C I 3-Parameter Weibull - 95% CI
0 -30 -60
99.99
90
50
10
1
0.01
y300
P
e
r
c
e
n
t
60 30 0
99.99
99
90
50
10
0.01
y300
P
e
r
c
e
n
t
100 10
99.99
99
90
50
10
1
0.01
y300 - Threshold
P
e
r
c
e
n
t
40 0 -40
99.99
99
90
50
10
1
0.01
y300
P
e
r
c
e
n
t
3-Parameter Gamma
A D = 0.369
P-V alue = *
Logistic
A D = 0.911
P-V alue = 0.010
Goodness of Fit Test
Smallest Extreme V alue
A D = 13.222
P-V alue < 0.010
Largest Extreme V alue
A D = 11.133
P-V alue < 0.010
Probability Plot for y300
Smallest Extreme V alue - 95% CI Largest Extreme V alue - 95% CI
3-Parameter Gamma - 95% CI Logistic - 95% CI
18 12 6 0 -6 -12 -18
LSL USL
LSL -14
Target *
USL 14
Sample Mean -0.9975
Sample N 1000
StDev (Within) 6.50025
StDev (Ov erall) 6.63886
Process Data
Cp 0.72
CPL 0.67
CPU 0.77
Cpk 0.67
Pp 0.70
PPL 0.65
PPU 0.75
Ppk 0.65
Cpm *
Ov erall Capability
Potential (Within) Capability
PPM < LSL 26000.00
PPM > USL 15000.00
PPM Total 41000.00
Observ ed Performance
PPM < LSL 22733.49
PPM > USL 10521.29
PPM Total 33254.78
Exp. Within Performance
PPM < LSL 25083.08
PPM > USL 11940.20
PPM Total 37023.28
Exp. Ov erall Performance
Within
Overall
Process Capability of y300