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C om parison of O ptical Properties of G lass
M odi ed by Surface Ion Exchange and C hem ical
Etching
O lga N . Sidelnikova
1
, G eorge A . Pozdnyakov
2
, A leksey N . Salanov
3
1
Institute of Solid State C hem istry and M echanochem istry, Laboratory of Electrochem istry,
str. Kutateladze, 18, N ovosibirsk, 630128, Russia, tel. +7-383-2621953, e-m ail ol_sideln@ m ail.ru, olsi@ solid.nsc.ru
2
Khristianovich Institute of Theoretical and A pplied M echanics, str. Institutskaja, 4/1, N ovosibirsk, 630090, Russia
3
Boreskov Institute of C atalysis, Laboratory of Structural M ethods of Investigation, pr. Lavrentieva, 5, N ovosibirsk, 630090,
Russia
Keywords
1=G lass 2=Surface 3=Light scattering 4=Ion exchange 5=O ptical properties 6=C hem ical etching
Abstract
The results of the com parative optical
investigation of soda lim e silica glass
w ith the surface layer m odi ed by
surface ion exchange process and
by chem ical etching are presented in
a report. The exchange of N a
+
ions
in the glass surface layer for Li
+
ions
diffusing from the surface ion exchange
paste has been chosen as a surface ion
exchange process. A chem ical etching
has been carried out w ith an etching
com position containing hydro uoric
acid. It w as show n that the glass
surface m orphology form ed after a
treatm ent by referred above m ethods
is an essential factor de ning glass
optical properties. It w as found that
such m easured optical characteristics
as scattered light spectrum s, screen
illum ination by the light passed through
a glass and light depolarization in soda
lim e silica glass w ith the surface layer
m odi ed by surface ion exchange
process and by chem ical etching differ
essentially from each other. Thus,
screen illum ination by the light passed
through glass m odi ed by surface ion
exchange process is approxim ately in
three tim es higher than the analogous
screen illum ination characteristic of
chem ical etched glass. O btained optical
data are com pared w ith analogous data
of the m odi ed glass w ith thin surface
A u layer. In authorsopinion, presented
results m ay be im portant in illum inating
engineering for technical or decorative
application.
Introduction glass surface
treatment by ion exchange gives
new technical and decorative
possibilities for lightening
D espite of long-term period (m ore than
2000 years) of use and investigation of
glasses, the grandiose developm ent of
glass industry in the direction of scaled
increasing of the glasses production
volum e and broadening of the glasses
application spectrum is observed in
last decades. In this connection, new
tasks of research and controllable
change of the glassesphysical and
chem ical properties determ ined by the
com position, structure and surface
state are set under scientists (for
exam ple, such glasses properties as
hydrophobicity, optical and m echanical
properties).
In the present w ork, it w as set a
task of the com parative investigation of
soda lim e silica glass optical properties
depending on the m ethod of the glass
surface m odi cation, particularly,
surface ion exchange or chem ical
etching. Earlier, w e have published
in [1] the experim ental results on the
scattering indicatrix, the size distribution
function of heterogeneous scattering
centres and the partial depolarization in
soda lim e silica glass w ith the m odi ed
surface. A nd now w e w ould like to
present new results of com parative
optical research of scattered light
spectrum s, screen illum ination by
the light passed through a glass and
the light depolarization in soda lim e
silica glass w ith the m odi ed surface
and w ith/w ithout the thin surface A u
layer; m ore detail presented optical
results have been described in [2, 3]. In
authorsopinion, such optical data m ay
be useful in illum inating engineering for
the technical or decorative application
of glasses.
Experimental part
The study of optical properties of the
m odi ed glass w as carried out on
soda lim e silica glass sam ples (G O ST
111-2001) 4 -6 m m thick. The glass
surface m odi cation by N a
+
/Li
+
ion
exchange process w ith the surface ion
exchange paste (SIEP) includes [4, 5]
next stages: glass surface degreesing
and w ashing; laying of the SIEP layer
on the glass surface; therm al treatm ent
of the glass w ith the SIEP layer at ~
300 C for 15-20 m in and the rem oval
of the dry paste layer by w ashing w ith
w ater. The chem ical etching of glass
sam ples w as carried out for 5 m in. w ith
a paste containing hydro uoric acid in
according to [6]. The thin A u layer (5 -
45 nm thick) w as deposed on the glass
surface by the special device JVC -1600
(Jeol, Japan). The surface m orphology of
glass sam ples has been m easured by the
scanning electron m icroscope JSM -6460
(Joel, Japan). The investigated sam ples
w ere nam ed in the follow ing w ay:
G IE glass sam ples m odi ed by SIEP;
G IE-A u glass sam ples m odi ed by
SIEP and covered by the thin surface
A u layer;
G C E - glass sam ples m odi ed by
chem ical etching;
G C E-A u - glass sam ples m odi ed by
chem ical etching and covered by the
thin surface A u layer.
The m easurem ent of the illum ination
area of a screen and the uniform ity
of illum ination for investigated glass
sam ples (Figure 1) has been carried out
w ith the use of the w hite LED as a light
source. A part of the light ux from a
light source has passed through the
glass sam ple and the scattered light has
fall onto a w hite screen. Light spots on
a screen have been photographed by a
cam era type C A N O N D 20.
The measurement of the scattered
light spectrum has been carried out
w ith set show n in Figure 2. The halogen
lam p 1 has been used as a light source
w ith the intensive blue com ponent up
to U V light (~ 390 nm ). The collim ator 2
Figures 1 and 2. Experimental sets for optical
measurements
Figure 1. 1 light source, white LED; 2 aper-
ture; 3 sample; 4 screen; 5 - camera
Figure 2. 1 light source, halogen lamp; 2
collimator; 3 aperture; 4 sample; 5 ro-
tation mechanism; 6 light guide; 7 spec-
trophotometer S100, SOLAR Laser System;
8 computer
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has form ed the parallel light beam ; the
part of the light beam has been cut by
the aperture 3 w ith the holes diam eter
2 m m . The light has been scattered in
the m odi ed surface layer of the glass
sam ple 4 and the part of the lum inous
ux has gotten to guide 6 located on
the rotate m echanism 5 w ith the rotate
angle registration. The scattered light
has cam e through the light guide into
spectrom eter 7 (S100, SO LA R Laser
System ) connected w ith a com puter 8.
O ptical data have been m easured for
each sam ple at a various position of the
light guide.
The measurement of the scattered
light intensity at light propagation
through the glass plate in the full
internal reection regime has been
realized w ith set show n in Figure 3.
O ne side of the glass plate 1 had a
scattering surface in the form of pattern
w ith surface areas m odi ed by surface
ion exchange or by chem ical etching.
The light from the lum inescent lam p 2
w ith a cylindrical re ector 3 has passed
into the glass plate through its side
surface and has re ected from the plate
surfaces as show n in the part 5 of Figure
3. The light scattering has occurred from
the m odi ed surface areas. The im age
of the glass sam ple at various angles
has been registered by a cam era 4.
Positive angles have corresponded to
forw ard scattering.
Degree of the depolarization during
light scattering forward has been
determ ined for the linearly polarized
light ( = 488 nm ) by the m easurem ent
of the intensity dependence of the
light passed through the polaroid at a
de nite angle of the polaroid rotation
[1]. A s the initial laser light beam has
been linearly polarized, the light w as
absorbed by a polaroid com pletely at
the crossed polaroid position w ith the
corresponding angle 90. In the case
of the linearly polarized light, the angle
dependence graph of the intensity of
the passed light is a half period of a
function cos
2
. For the no polarized
light the intensity of the passed light
has not depended on polaroid angle
. D egree of depolarization is equal
= I
n
/I
p
, w here I
n
is the intensity of the
norm ally polarized light and I
p
is the
intensity of the parallel polarized light.
Results and discussion
It is w ell know n that the surface
m odi cation of glasses used in the
different elds of practice (for exam ple,
the decoration of glasses by chem ical
etching, sand blasting, surface layer/
layers covering) leads to the essential
change of optical properties of glasses.
The present w ork is concern w ith
research of optical properties of soda
lim e silica glass m odi ed by tw o types
of treatm ent: chem ical etching w ith
com position containing hydro uoric
acid and surface ion exchange of N a
+

ions in the glass surface layer for ions
Li
+
diffusing from a SIEP. In the case of
chem ical etching (sam ples G C E), the
surface m orphology is characterized by
a num ber of hills, hollow s, steps and
kink sites form ed during deleting of
glass com ponents w ith the different rate
from different glass surface areas (see
schem e in Figure 4, right part) [7]. In the
case of surface ion exchange N a
+
/Li
+

(sam ples G IE), a system of m icroblocks
and m icrocracks (Figure 4, left part)
[7] is form ed due to m echanical
stresses conditioned by the reduction
of a product volum e in com parison
w ith the initial glass volum e w ith the
contraction coef cient ~ 5 % [8]. The
surface m orphology of m odi ed glass
sam ples (G IE-A u and G C E-A u) w ith the
thin surface A u layer (5 45 nm thick)
is practically the sam e as the surface
m orphology of the glass substrate
w ithout the surface A u layer.
Light loss characteristics (extinction)
and uniformity of screen
illumination
The m easurem ent of the screen
illum ination by the light passed through
m odi ed glass sam ples has been
carried out as described above in an
experim ental part (the source of light
a w hite LED ).
C urves of the angular distribution
of a screen illum ination along the spot
diam eter are presented in Figure 5.
The m easured experim ental curves
are near to G aussian curves therefore
the corresponding analytic curves in
logarithm ical coordinates are show n in
this gure. The m easured values of the
half-w idth of the screen illum ination
distribution,

; the relative total

lum inous ux, S
i
, de ned as the
areas under the curve of the angular
distribution; the factor of the reduction
of the initial total lum inous ux, S
1
/S
i

and the fractional light losses, (S
1
-S
i
)/
S
1
are presented in Table 1 for all four
types of an investigated glass sam ples.
The thin surface A u layers thickness on
glass sam ples G IE-A u and G C E-A u w as
10 nm .
A s can be seen from Figure 5
and Table 1, the sim ultaneous light
transm ission and light scattering occur
m ore effective for the glass sam ple G IE
w ithout A u layer m odi ed by surface
ion exchange w ith the least fractional
light losses and the factor of the
reduction of the initial total lum inous
ux 0.52 and 2.08, respectively. A t the
sam e tim e, the values of the half-w idth
of the screen illum ination distribution,

, for glass sam ple G IE and G C E differ

from each other not so m uch: 8.7
and 11.9, respectively. Thus, it can be
concluded, that the glass m odi cation
by the surface ion exchange w ith SIEP is
m ore preferable than chem ical etching,
as m odi ed glass (sam ple G IE) is
characterized by low er light absorption.
The glass m odi cation by the surface
ion exchange process has also a very
im portant advantage - it allow s avoid
the use of com positions containing
hydro uoric acid, very hazardous for a
health.
In authorsopinion, the difference
of glass sam ples G IE and G C E in the
fractional light losses is conditioned by
their glass surface layer structure (see
the schem e in Figure 4). The sam ple G IE
is characterized by the sm ooth outer
Figure 3. Scheme of set for measuring of the scattering of the light propa-
gated through the glass plate in the full internal reection regime: 1 glass
plate with one scattering surface; 2 light source, luminescent lamp with
reector 3; 4 camera; 5 schematic diagram of the light scattering .
Figure 4. Schematic diagram of light scattering in the glass surface layer of
glass samples modied by the surface ion exchange process (GIE) and glass
samples modied by the surface chemical etching process (GCE).
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surface of m icroblocks and by the net
of m icrocracks intersecting the outer
surface and occupying only a sm all
part of the outer surface area. In this
case, norm ally incident lum inous ux
penetrates fully into the glass and then
experiences scattering. The part of the
lum inous ux re ected from the glass
surface (R) m ay be calculated by Frenels
form ula [9] R = [(n-1)/(n+1)]
2
, w here n is
the refractive index. So, R is equal to
4 % for the glass w ith the refractive
index 1.5; the other 96 % of the
lum inous ux penetrates in the glass
sam ple volum e. Further, additional
lum inous ux losses arise in the glass
surface layer from partial back scattering
of the light and the lum inous ux
absorption during m ultiple crossing
of an interfacial boundaries betw een
m icrocracks and m icroblocks. In fact,
w e observe the light scattering process
in the turbid m edium gas/solid state
accom panied by a light absorption.
The surface m orphology of
the sam ple G C E is rough and is
characterized by a num ber of hills,
hollow s, steps and kink sites form ed
during chem ical etching. Therefore
in actual fact, the norm ally incident
lum inous ux crosses locally the etched
glass surface at various angles. This
leads to an increase of the re ected part
of the lum inous ux as com pared w ith
the sam ple G IE according to Frenels
form ula describing light re ection for
dielectrics taking into account locally
various angles of incidence [9]. The
additional lum inous ux losses for the
sam ple G C I are conditioned by the
partial lum inous ux absorption during
light passing through the bulk glass
layer but, in this case, the m ultiple
scattering is absent in contrast to the
sam ple G IE.
A s can be seen in Table 1, the glass
sam ples w ith the thin surface A u layer
(G IE-A u and G C E-A u) are characterized
by sm all values of the relative total
lum inous ux passed through the
sam ples: 0.012 and 0.089, respectively.
These light losses are connected w ith
the light absorption in the thin A u
layer, m oreover, in the case of the glass
sam ple G IE-A u, the light re ection
and absorption occur m any tim es on
boundaries m icrocracks / boundaries
of m icroblocks covered w ith the thin
A u layer (see the schem e in Figure 6).
Therefore the light transm ission for
m odi ed glass sam ples w ith the thin A u
layer is substantially less effective than
the light transm ission for sam e m odi ed
glass sam ples w ithout the thin A u layer.
Scattered light spectrums
The part of experim ental w ork has
concerned of spectral m easurem ents of
the scattered light for glass sam ples G IE
and G C E because the structural special
features of the glass surface m ay lead
to changes of the spectral dependence
of the scattered light as, for exam ple, in
Rayleighs light scattering on scattering
centres w ith size characteristics m uch
less than w avelength of light.
The relative spectral decaying
coef cient has been m easured as
described in [2];
= I
0
I
s
(600)/(I
s
I
0
(600)), w here I
0

the light intensity for the light source
(halogen lam p); I
0
(600) the light
intensity of halogen lam p at = 600
nm ; I
s
the scattered light intensity for
glass sam ples G IE and G C E, I
s
(600)
the scattered light intensity for glass
sam ples G IE and G C E at = 600 nm .
A s can be seen in Figures 7 and
8, the spectral dependence of ()
for the glass sam ple G C E w ith and
w ithout the thin A u layer is very strong
especially at m inor angles (curves 1 and
2). Increasing of the A u layer thickness
leads to increasing of in the short-
w ave spectrum range ( < 600 nm ),
therefore it has been observed an
increasing yellow coloration of the light
scattered in the m odi ed glass surface
layer of sam ples G IE and G IE-A u. It is
necessary bear in m ind also, that the
increase of the A u layer thickness leads
to the increase of due to the partial
local overgrow th of m icrocracks w ith
the deposed A u and to the increase of
the light re ection from the A u layer.
A nother spectral dependence of ()
has been observed for the glass sam ple
G C E w ith and w ithout the thin A u layer:
it is very w eak in com parison w ith ()
for sam ples G IE and G IE-A u; () varies
in range 0.8 - 1.2 (see Figure 9 and 10 a
- c). The observed curves are very sim ilar
the curve for no m odi ed glass sam ple
w ith the 10 nm A u layer (Figure 10, d).
Light scattering in the full internal
re ection regime
It w as interesting to com pare the light
scattering in the full internal re ection
regim e for m odi ed glass sam ples
G IE and G C E. In this regim e the light
propagating in a m edium w ith the index
of refraction n
1
(the glass m edium )
falls on the boundary w ith m edium ,
w hich has the index of refraction
n
2
(air), w here n
2
< n
1
. A s described
by Shubnikov [10], the full internal
Figure 5. The angular distribution of the screen illumination intensity: 1
initial total luminous ux (no glass sample), S
1
=1.0; 2 - glass sample
GIE, S
2
=0.48; 3 - glass sample GCE, S
3
=0.16; 4 - glass sample GIE-Au,
Au layer 10 nm thick, S
4
=0.012; 5 - glass sample GCE-Au, Au layer 10
nm thick, S
5
=0.089
Figure 6. Schematic diagram of light scattering in the glass surface layer of glass
samples covered by the thin Au layer (GIE-Au in the left part) and (GCE-Au in the
right part)
TABLE 1.
Type of sample

(i)
the half-width
of the screen
illumination
distribution
S
i

The relative
total luminous
flux
S
1
/S
i
the factor of
the reduction
of the initial
total luminous
flux
(S
1
-S
i
)/S
1
the fractional
light losses
light has not passed through
glass sample (curve 1);
5.7 1.00 1.00 0
glass sample GIE (curve 2) 8.7 0.48 2.08 0.52
glass sample GCE (curve 3) 11.9 0.16 6.25 0.84
glass sample GIE-Au (curve 4) 8.8 0.012 83.33 0.99
glass sample GCE-Au (curve 5) 11.8 0.089 11.24 0.91
Table1.
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re ection regim e m ay be realized by the
lighting of a glass plate through a lateral
surface at the angle of incidence
f
>
4148, i.e. at sin
f
> n
2
/n
1
. This m eans,
that areas of no m odi ed glass are dark
and m odi ed glass surface areas w ith
rough surface relief are bright (Figure
11). The description and schem e of
experim ental set-up for m easurem ents
in the full internal re ection regim e (see
also Figure 3) have been given above in
the experim ental part.
A view of the glass plate w ith im ages
corresponding to the angle of the
scattering direction = 0 is presented
in Figure 11. The m ore bright im ages
(as stars im age 1, G IE) w ere m ade by
surface ion exchange; the other im ages
(as stars im age 2, G C E) correspond to
glass surface areas m odi ed by chem ical
etching. The glass plate m ay be
turned around axis O O . A light source
(lum inescent lam p) w ith the cylindrical
re ector is located below . Im ages (1 and
2) indicated in a rectangle are show n
also in nine sm all photos below at the
angle -70 < < 70. Q uantitative
com parison of effectiveness of light
scattering for star 1, G IE, and star 2,
G C E, w as carried out by photom etry
m ethod.
The norm alized intensities I
1
and I
2
of
im ages 1 (G IE) and 2 (G C E) are show n
in Figure 12. Both curves are norm alized
to the m axim um values of im age
brightness of the stars im ages 1 and 2,
respectively. The intensity I
1
of the stars
im age 1 is practically constant at any
m easurem ent angles. The intensity I
2
of
the stars im age 2 has broad m inim um
at the angle range - 45 < < 45 and
achieves I
2m in
~ 0.03 at - 10 < < 10.
A dependence I
1
/I
2
w ith the angle has
m axim um and achieves (I
1
/I
2
)
m ax
= 16.0
at sm all angles - 10 < < 10.
In fact, these results allow us to m ake
a conclusion that the im age form ation
in the full internal re ection regim e
occurs substantially m ore effective for
the glass sam ple w ith surface areas
m odi ed by the surface ion exchange
process in com parison w ith the glass
sam ple m odi ed by chem ical etching.
Depolarization of a scattered light
The partial depolarization of the
linearly polarized light occurs ow ing to
light scattering in m edium w ith sm all
dielectric particles. W e assum ed that
the analogous process of the light
depolarization m ay occurs also in the
m odi ed glass surface layer of sam ples
G IE, G IE-A u, G C E and G C E-A u. D ata
on the depolarization param eter of
the linearly polarized light for sam ples
w ithout A u layer G IE and G IE have
been published by us earlier [11]. In the
present w ork, new experim ental data on
the dependence of the depolarization
param eter on the coating thickness
are presented (Figure 13); an
experim ental set-up has been described
above in the experim ental part and in
detail in [11].
The depolarization param eter
of the scattered light is substantially
sm aller for glass sam ples G IE-A u and
G C E-A u than that param eter for glass
sam ples G IE and G C E w ithout A u layer.
This difference m ay be explained by the
w eak change of the electrom agnetic
w aves polarization during the re ection
from the conducting m etal surface in
contrast to the electrom agnetic w aves
re ection from the dielectric surface
[12]. Therefore, in authoursopinion,
the difference of the depolarization
param eter of the scattered light
is conditioned by the different glass
surface layers structure. Thus, the
light depolarization in the glass sam ple
G IE-A u occurs as the re ection from
m etallized, chaotically oriented broken
m icroblockssurfaces. In the case of
glass sam ple G C E-A u, the A u layer is
com plete and envelops the surface
m icrorelief. Therefore the light re ection
occurs from the entire conducting
m etallized surface w ith the little change
of the light polarization, analogously
to the light re ection from the sm ooth
glass surface w ith the deposited m etal
layer.
Conclusions
The presented research results allow
conclude that investigated optical
properties depend considerably on the
type of glass surface treatm ent (by the
surface ion exchange process and by
chem ical etching).
Thus, glass sam ple m odi ed by the
surface ion exchange is characterized
by the m ore effective (in tree tim es)
sim ultaneous light transm ission and
light scattering taking place in the
m odi ed glass surface layer; by the
m ore strongly pronounced spectral
dependence of the scattered light and
by the stronger dependence of the
scattered light on an angle. The light
intensity of the scattered light in the full
internal re ection regim e is noticeably
greater (up to 16 tim es) in com parison
w ith the chem ical etched glass sam ple.
Therefore, in authorsopinion, the
use of the surface ion exchange process
for the glass surface treatm ent is very
attractive for the lighting technology
w ith technical, decorative and artistic
purposes [13]. A s exam ple, w e w ould
like to present glass sam ple (Figure 14)
decorated by the ion surface exchange
treatm ent and illum inated by coloured
LED s, w hich w as exhibit on the fair
SIBPO LYTEC H -2009 (ITE Siberian Fair,
N ovosibirsk, Russia); this developm ent
w as aw arded w ith a gold m edal.
O ptical properties of m odi ed glass
sam ples w ith the thin A u surface layer
depend also substantially on the type
of the glass surface treatm ent and have
interesting special features.
Figure 8. Spectrum of the relative spectral de-
caying coefcient for the glass sample with
the thin Au layer (GIE-Au) measured at angles:
1 =0; 2 =5; 3 =20; 4 =45;
(nm) the Au layer thickness
Figure 7. Spectrum of the relative spectral de-
caying coefcient for the glass sample GIE
measured at angles: 1 =0; 2 =5; 3
=20; 4 =45 .
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References
[1] O .N . Sidelnikova, G .A . Pozdnyakov, A .N .
Salanov, E.A . Suprun, E.M . Pozdnyakova The
light scattering by glass surface layer m odi ed
w ith surface ion exchange paste (SIEP).
Proceeding Book of A bstracts of International
C onference G lass Perform ance D ays 2009
(G PD 2009), Tam pere, Finland, June 12-15,
2009, p. 216-220.
[2] G .A . Pozdnyakov, O .N . Sidelnikova, A .N .
Salanov Light scattering in a surface glass layer
produced by a surface ion exchange process.
G lass Technology: European Journal of G lass
Science and Technology Part A , D ecem ber
2010, vol. 51, 6, p. 241-247.
[3] O .N . Sidelnikova, G .A . Pozdnyakov, A .N .
Salanov, A .N . Serkova Light scattering in a
surface glass layer produced by a surface ion
exchange process and coated w ith thin gold
layers. G lass Technology: European Journal of
G lass Science and Technology Part A , Fabruary
2011, vol. 52, 1, p. 15-22.
[4] A .A . Sidelnikov, D .V. Svistunov, O .N .
Sidelnikova Frosting paste. Patent RF
2238919, reg. O ctober, 2004.
[5] O .N . Sidelnikova, A .N . Salanov Surface
structure of the glass surfaces treated w ith
the new frosting paste. G lass Technology:
European Journal of G lass Science and
Technology Part A , vol. 49, 2008, A ug. 4,
p.179-182.
[6] E.K. Lazareva, T.M . C helsova, A .A . Vernyj,
Inventors serti cate U SSR 948926 A , 29,
reg. 07.08.1982.
[7] O .N . Sidelnikova, A .N . Salanov Properties of a
glass surface m odi ed by a new frosting paste.
Surface m orphology. G lass and C eram ics,
2007, vol. 64, N r 11-12, p. 425 428
(translated paper).
[8] S.A . C hizhik, A .A . Sidelnikov Kinetics of
solid state reactions w ith a positive feedback
betw een the reaction and fracture. Part 2. The
kinetics of ion exchange in an alkaline-silicate
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610-614.
[9] M . Born, E. W olf Principles of O ptics. Fourth
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[11] O .N . Sidelnikova, G .A . Pozdnyakov, A .N .
Salanov, E.A . Suprun, E.M . Pozdnyakova
Surface properties of glass m odi ed w ith new
frosting paste. Light scattering in the surface
layer of the glass. G lass and C eram ics, 2008,
vol. 65, N r 11-12, p. 384 389 (translated
paper).
[12] L.D . Landau, E.M . Lifshitz C ourse of Theoretical
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Lyakhov Patent pending RF, 2009

Figure 10. Spectrum of the relative spectral
decaying coefcient for the glass sample with
the thin Au layer (GCE-Au, a-c) and for no modi-
ed glass sample (d) measured at angles: 1
=0; 2 =20; 3 =50; (nm) the Au
layer thickness
Figure 9. Spectrum of the relative spectral de-
caying coefcient for the glass sample GCE
measured at angles: 1 =0; 2 =20;
3 =50
Figure 11. Light scattering in the glass in the
full internal reection regime. 1 the stars im-
age 1 made by surface ion exchange (GIE area);
2 the stars image 2 made by chemical etching
(GCE area); 3 the light source (luminescent
lamp) with the cylindrical reector. Low stars
images are indicated at angle -70 < <70
Figure 12. The light dependences of the stars
images with the angle of the scattering direc-
tion: 1 the normalized intensity I
1
of the image
1; 2 the normalized intensity I
2
of the image 2;
3 the dependence I
1
/I
2
with the angle of the
scattering direction
Figure 14. The glass sample decorated with the
surface ion exchange paste (SIEP) and illumi-
nated by coloured LEDs; the development was
awarded with a gold medal on the fair SIBPOLY-
TECH-2009, ITE Siberian Fair, Novosibirsk, Russia
Figure 13. Dependence of the scattered light
depolarisation parameter on the thin Au layer
thickness : 1 glass sample GIE-Au; 2 - glass
sample GCE-Au; no lled square and circle are
concerned to glass samples without the thin Au
layer GIE and GCE, respectively.
a)
b)
c)
d)
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