Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
, 2014
http://dx.doi.org/10.5370/JEET.2014.9.?.742
742
Method to Prevent the Malfunction Caused by the Transformer
Magnetizing Inrush Current using IEC 61850-based IEDs
and Dynamic Performance Test using RTDS Test-bed
Hae-Gweon Kang*, Un-Sig Song