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1. General description
The 74AHC00; 74AHCT00 is a high-speed Si-gate CMOS device and is pin compatible with Low-power Schottky TTL (LSTTL). They are specied in compliance with JEDEC standard JESD7-A. The 74AHC00; 74AHCT00 provides the quad 2-input NAND function.
2. Features
I I I I I I Balanced propagation delays All inputs have a Schmitt-trigger action Inputs accepts voltages higher than VCC For 74AHC00 only: operates with CMOS input levels For 74AHCT00 only: operates with TTL input levels ESD protection: N HBM JESD22-A114E exceeds 2000 V N MM JESD22-A115-A exceeds 200 V N CDM JESD22-C101C exceeds 1000 V I Multiple package options I Specied from 40 C to +85 C and from 40 C to +125 C
3. Ordering information
Table 1. Ordering information Package Temperature range 74AHC00D 74AHCT00D 74AHC00PW 74AHCT00PW 74AHC00BQ 74AHCT00BQ 40 C to +125 C 40 C to +125 C TSSOP14 40 C to +125 C Name SO14 Description plastic small outline package; 14 leads; body width 3.9 mm plastic thin shrink small outline package; 14 leads; body width 4.4 mm Version SOT108-1 SOT402-1 SOT762-1 Type number
DHVQFN14 plastic dual in-line compatible thermal enhanced very thin quad at package; no leads; 14 terminals; body 2.5 3 0.85 mm
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
4. Functional diagram
1 1 1A 2 1B 4 2A 5 2B 9 3A 10 3B 12 4A 13 4B 1Y 3 2 4 2Y 6 5 9 10 12 13
mna212
&
&
3Y 8
&
8
A
4Y 11
&
mna246
11
B
Y
mna211
5. Pinning information
5.1 Pinning
terminal 1 index area 1A 1B 1Y 2A 2B 2Y GND 1 2 3 4 5 6 7 14 VCC 13 4B 12 4A 1B 1Y 2A 2B 2Y 2 3 4 5 6 7 GND 3Y 8 14 VCC 13 4B 12 4A 11 4Y 10 3B 9 3A
001aac939
00
11 4Y 10 3B 9 8 3A 3Y
GND (1)
001aac938
(1) The die substrate is attached to this pad using conductive die attach material. It can not be used as a supply pin or input.
Pin description Pin 1 2 3 4 5 6 7 Description data input data input data output data input data input data output ground (0 V)
NXP B.V. 2008. All rights reserved.
1A
00
2 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
Pin description continued Pin 8 9 10 11 12 13 14 Description data output data input data input data output data input data input supply voltage
6. Functional description
Table 3. Input nA L X H
[1]
7. Limiting values
Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V). Symbol VCC VI IIK IOK IO ICC IGND Tstg Ptot Parameter supply voltage input voltage input clamping current output clamping current output current supply current ground current storage temperature total power dissipation SO14 package TSSOP14 package DHVQFN14 package
[1] [2] [3] [4]
Conditions
Unit V V mA mA mA mA mA C mW mW mW
VI < 0.5 V VO < 0.5 V or VO > VCC + 0.5 V VO = 0.5 V to (VCC + 0.5 V)
[1] [1]
20 75 65
Tamb = 40 C to +125 C
[2] [3] [4]
The input and output voltage ratings may be exceeded if the input and output current ratings are observed. Ptot derates linearly with 8 mW/K above 70 C. Ptot derates linearly with 5.5 mW/K above 60 C. Ptot derates linearly with 4.5 mW/K above 60 C.
74AHC_AHCT00_3
3 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
9. Static characteristics
Table 6. Static characteristics Voltages are referenced to GND (ground = 0 V). Symbol Parameter For type 74AHC00 VIH HIGH-level input voltage VCC = 2.0 V VCC = 3.0 V VCC = 5.5 V VIL LOW-level input voltage VCC = 2.0 V VCC = 3.0 V VCC = 5.5 V VOH HIGH-level VI = VIH or VIL output voltage IO = 50 A; VCC = 2.0 V IO = 50 A; VCC = 3.0 V IO = 50 A; VCC = 4.5 V IO = 4.0 mA; VCC = 3.0 V IO = 8.0 mA; VCC = 4.5 V VOL LOW-level VI = VIH or VIL output voltage IO = 50 A; VCC = 2.0 V IO = 50 A; VCC = 3.0 V IO = 50 A; VCC = 4.5 V IO = 4.0 mA; VCC = 3.0 V IO = 8.0 mA; VCC = 4.5 V II ICC CI input leakage current VI = 5.5 V or GND; VCC = 0 V to 5.5 V 1.5 2.1 3.85 1.9 2.9 4.4 2.58 3.94 2.0 3.0 4.5 0 0 0 3.0 0.5 0.9 1.65 0.1 0.1 0.1 0.36 0.36 0.1 2.0 10 1.5 2.1 3.85 1.9 2.9 4.4 2.48 3.8 0.5 0.9 1.65 0.1 0.1 0.1 0.44 0.44 1.0 20 10 1.5 2.1 3.85 1.9 2.9 4.4 2.4 3.7 0.5 0.9 1.65 0.1 0.1 0.1 0.55 0.55 2.0 40 10 V V V V V V V V V V V V V V V V A A pF Conditions Min 25 C Typ Max 40 C to +85 C 40 C to +125 C Unit Min Max Min Max
74AHC_AHCT00_3
4 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
Table 6. Static characteristics continued Voltages are referenced to GND (ground = 0 V). Symbol Parameter For type 74AHCT00 VIH VIL VOH HIGH-level input voltage LOW-level input voltage VCC = 4.5 V to 5.5 V VCC = 4.5 V to 5.5 V 2.0 0.8 2.0 0.8 2.0 0.8 V V Conditions Min 25 C Typ Max 40 C to +85 C 40 C to +125 C Unit Min Max Min Max
HIGH-level VI = VIH or VIL; VCC = 4.5 V output voltage IO = 50 A IO = 8.0 mA LOW-level VI = VIH or VIL; VCC = 4.5 V output voltage IO = 50 A IO = 8.0 mA input leakage current VI = 5.5 V or GND; VCC = 0 V to 5.5 V
4.4 3.94 -
4.5 0 -
4.4 3.8 -
4.4 3.7 -
V V V V A A mA
VOL
II ICC ICC
supply current VI = VCC or GND; IO = 0 A; VCC = 5.5 V additional per input pin; supply current VI = VCC 2.1 V; IO = 0 A; other pins at VCC or GND; VCC = 4.5 V to 5.5 V input capacitance
CI
3.0
10
10
10
pF
Conditions Min
25 C Typ[1] Max
ns ns ns ns pF
74AHC_AHCT00_3
5 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
Table 7. Dynamic characteristics continued GND = 0 V; For test circuit see Figure 7. Symbol Parameter For type 74AHCT00 tpd propagation delay nA, nB to nY; see Figure 6 VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF CPD power CL = 50 pF; fi = 1 MHz; dissipation VI = GND to VCC capacitance
[3] [2]
Conditions Min
25 C Typ[1] Max
6.9 7.9 -
1.0 1.0 -
8.0 9.0 -
1.0 1.0 -
9.0 10.0 -
ns ns pF
Typical values are measured at nominal supply voltage (VCC = 3.3 V and VCC = 5.0 V). tpd is the same as tPLH and tPHL. CPD is used to determine the dynamic power dissipation (PD in W). PD = CPD VCC2 fi N + (CL VCC2 fo) where: fi = input frequency in MHz, fo = output frequency in MHz CL = output load capacitance in pF VCC = supply voltage in Volts N = number of inputs switching (CL VCC2 fo) = sum of the outputs.
11. Waveforms
VI nA, nB input GND tPLH VOH nY output VOL VM
001aah088
VM
tPHL
Measurement points are given in Table 8. VOL and VOH are typical voltage output levels that occur with the output load.
Fig 6. The input (nA, nB) to output (nY) propagation delays Table 8. Type 74AHC00 74AHCT00 Measurement points Input VM 0.5VCC 1.5 V Output VM 0.5VCC 0.5VCC
74AHC_AHCT00_3
6 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
VI negative pulse 0V
tW 90 % VM 10 % tf tr tr tf 90 % VM 10 % tW VM VM
VI positive pulse 0V
VCC
VCC
PULSE GENERATOR
VI
VO
RL
S1
DUT
RT CL
open
001aad983
Test data is given in Table 9. Denitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch.
Fig 7. Load circuit for switching times Table 9. Type 74AHC00 74AHCT00 Test data Input VI VCC 3.0 V tr, tf 3.0 ns 3.0 ns Load CL 15 pF, 50 pF 15 pF, 50 pF RL 1 k 1 k S1 position tPHL, tPLH open open tPZH, tPHZ GND GND tPZL, tPLZ VCC VCC
74AHC_AHCT00_3
7 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
A X
c y HE v M A
Z 14 8
2.5 scale
5 mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm A max. 1.75 A1 0.25 0.10 A2 1.45 1.25 A3 0.25 0.01 bp 0.49 0.36 c 0.25 0.19 D (1) 8.75 8.55 E (1) 4.0 3.8 0.16 0.15 e 1.27 0.05 HE 6.2 5.8 L 1.05 Lp 1.0 0.4 Q 0.7 0.6 0.028 0.024 v 0.25 0.01 w 0.25 0.01 y 0.1 Z (1) 0.7 0.3
8 o 0
Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. OUTLINE VERSION SOT108-1 REFERENCES IEC 076E06 JEDEC MS-012 JEITA EUROPEAN PROJECTION
8 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
TSSOP14: plastic thin shrink small outline package; 14 leads; body width 4.4 mm
SOT402-1
c y HE v M A
14
Q A2 pin 1 index A1 Lp L (A 3) A
1
e bp
7
w M detail X
2.5 scale
5 mm
DIMENSIONS (mm are the original dimensions) UNIT mm Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic interlead protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT402-1 REFERENCES IEC JEDEC MO-153 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-18 A max. 1.1 A1 0.15 0.05 A2 0.95 0.80 A3 0.25 bp 0.30 0.19 c 0.2 0.1 D (1) 5.1 4.9 E (2) 4.5 4.3 e 0.65 HE 6.6 6.2 L 1 Lp 0.75 0.50 Q 0.4 0.3 v 0.2 w 0.13 y 0.1 Z (1) 0.72 0.38 8 o 0
o
9 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
DHVQFN14: plastic dual in-line compatible thermal enhanced very thin quad flat package; no leads; SOT762-1 14 terminals; body 2.5 x 3 x 0.85 mm
A A1 E c
detail X
e1 b 6 v M C A B w M C y1 C
C y
1 Eh 14
7 e 8
13 Dh 0
9 X 2.5 scale 5 mm
DIMENSIONS (mm are the original dimensions) UNIT mm A(1) max. 1 A1 0.05 0.00 b 0.30 0.18 c 0.2 D (1) 3.1 2.9 Dh 1.65 1.35 E (1) 2.6 2.4 Eh 1.15 0.85 e 0.5 e1 2 L 0.5 0.3 v 0.1 w 0.05 y 0.05 y1 0.1
Note 1. Plastic or metal protrusions of 0.075 mm maximum per side are not included. OUTLINE VERSION SOT762-1 REFERENCES IEC --JEDEC MO-241 JEITA --EUROPEAN PROJECTION ISSUE DATE 02-10-17 03-01-27
10 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
13. Abbreviations
Table 10. Acronym CMOS LSTTL ESD HBM MM CDM TTL Abbreviations Description Complementary Metal Oxide Semiconductor Low-power Schottky Transistor-Transistor Logic ElectroStatic Discharge Human Body Model Machine Model Charge Device Model Transistor-Transistor Logic
The format of this data sheet has been redesigned to comply with the new identity guidelines of NXP Semiconductors. Legal texts have been adapted to the new company name where appropriate. Section 3: DHVQFN14 package added. Section 8: derating values added for DHVQFN14 package. Section 12: outline drawing added for DHVQFN14 package. Product specication Product specication 74AHC_AHCT00_1 -
74AHC_AHCT00_2 74AHC_AHCT00_1
19990923 19981209
74AHC_AHCT00_3
11 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
Denition This document contains data from the objective specication for product development. This document contains data from the preliminary specication. This document contains the product specication.
Please consult the most recently issued document before initiating or completing a design. The term short data sheet is explained in section Denitions. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
15.2 Denitions
Draft The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales ofce. In case of any inconsistency or conict with the short data sheet, the full data sheet shall prevail.
malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customers own risk. Applications Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specied use without further testing or modication. Limiting values Stress above one or more limiting values (as dened in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/prole/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
15.3 Disclaimers
General Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or
15.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners.
74AHC_AHCT00_3
12 of 13
NXP Semiconductors
74AHC00; 74AHCT00
Quad 2-input NAND gate
17. Contents
1 2 3 4 5 5.1 5.2 6 7 8 9 10 11 12 13 14 15 15.1 15.2 15.3 15.4 16 17 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 1 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 2 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 2 Functional description . . . . . . . . . . . . . . . . . . . 3 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3 Recommended operating conditions. . . . . . . . 4 Static characteristics. . . . . . . . . . . . . . . . . . . . . 4 Dynamic characteristics . . . . . . . . . . . . . . . . . . 5 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 8 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 11 Legal information. . . . . . . . . . . . . . . . . . . . . . . 12 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 12 Denitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Contact information. . . . . . . . . . . . . . . . . . . . . 12 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section Legal information.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 8 January 2008 Document identifier: 74AHC_AHCT00_3