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Smiths Interconnect
Kaelus is a new name company within the Smiths Interconnect group We are a global company that designs and manufactures complex and technically sophisticated RF products for use in the rapidly growing wireless communications market. Kaelus is the consolidation of four leading industry brands within Wireless Telecoms: Triasx, Summitek, Allrizon and the commercial division of TRAK Microwave Ltd.
AMERICAS:
EMEA:
APAC:
PIM = Noise generated by the interaction between the multiple Tx signals and passive non-linear junctions in the RF path. Desired Interference
f2-f1 4f1-3f2 2f1-f2 3f1-2f2
Interference
f1 f2 2f2-f1 3f2-2f1 4f2-3f1
2f1
f1+f2
2f2
PIM generated products will affect received band (UL) by Increasing the received Noise floor thus reducing base station sites coverage and capacity.
PS PS Ant
PS
PS
Ant PS Ant
Networks evolution towards: Indoor or outdoor complex DAS systems (shared by several operators)
Triplexer
Ant
PS
Ant
Ant
Outdoor area
Indoor Area 4 PS
PS
RF Output ports
Site sharing with multiple transmit carriers (same RF infrastructure for multiple operators)
Combining Unit
WCDMA GSM 1800 GSM 900
OP 3 Node B
OP 2 Node B
OP 1 Node B
OP 1 BTS
OP 3 BTS
OP 2 BTS
OP 3 BTS
Multi-technology sites (GSM 900 MHz, GSM 1800 MHz, UMTS 2100 and 900 MHz, CDMA 450, ...LTE)
OP 2 BTS
OP 1 BTS
PIM Sources
Non-linear metal-to-metal contacts:
Loose RF connectors. Poorly prepared RF cable terminations Improperly mated / misaligned parts Cracked / cold solder joints Loose mechanical fasteners (screws, rivets)
Traditional sweep (RL or DTF) testing many times does not identify these problems.
Dirt / trash
Cable damage
Incident signals
Non-Linear Infrastructure
Transmitted signals
Reflections caused by changes in impedance are measured using sweep test equipment. (Efficiency of the signal propagation) Interference caused by non-linear junctions are measured by PIM test equipment (Interference created by the signal propagation)
TX 1 TX 2
TX 1 TX 2
TX 1 TX 2
PI M
PI M
PIM Source
PIM Test equipment transmits 2 frequencies at high power into the system under test and measures the magnitude of the interference generated at the known IM3 frequency.
The fault location is found by tapping on interconnections and components (dynamic test) during the test looking for spikes in PIM magnitude.
Dynamic Testing:
Fault locations are found by gently tapping on connections or components Tapping on a bad junction causes PIM to spike Dynamic PIM testing is very important! Finds the location of static PIM failures Stresses all connections to make sure that the feed system is robust and will not fail prematurely due to environmental exposure (Hot, Cold, wind loading, vibration, etc.)
PIM Severity
5th Order 11th Order -93 dBm 9th Order 7th Order 3rd Order -60 dBm
Metal flake
GSM900
915 MHz
960 MHz
GSM1800
3rd order
5th order
1710MHz 1800GSM Rx band 1785MHz 1805MHz 1800GSM Tx Band 1880MHz
7th order
UMTS2100
1980MHz
2170MHz
3rd order
5th order
1880MHz
1980MHz
Summitek Instruments has been producing bench top PIM test systems for more than a decade Summitek has delivered more than 800 BPIM systems worldwide These systems have been used by RF equipment manufacturers to reduce PIM in their component designs
17 18
13 20 19
10
11
12
Time Trace
Frequency Sweep
Spectrum Analyzer
Build final site report as you go No post processing of data required Output finished report from the iQA in .PDF format Screen shot pictures available for engineering reports
iQA RTF
iQA RTF
iQA RTF
The DCR was logged over a period of time and plotted in. There was a significant increase when the CDMA equipment at the site was switched on.
Developed factory PIM test systems for RF Equipment manufacturers in 1996. >800 Factory PIM test systems in service
Developed Portable PIM systems for wireless operators in 2004. >2000 Portable PIM test systems in service
Contact Us: Eduardo Aires Sales Director, EU/ME/India eduardo.aires@kaelus.com Mob:+351 733 03 55
www.kaelus.com
Thank you
www.kaelus.com