Assessment of power swing blocking functions of line protecti e rel!"s for ! ne!r scen!rio of t#e $rugu!"!

n s"stem
C. %en!, &. 'r!nco, A. (iusto.
Instituto )e Ingenier*! El+ctric! '!cult!) )e Ingenier*! $ni ersi)!) )e l! &ep,blic! - $rugu!"
(r!nt .DT /0102 3inisterio )e E)uc!ci4n " Cultur! - $rugu!"

2008 IEEE T&D LA Conference, Aug. 2008

.l!n
5 Intro)uction 5 .ower s"stem st!bilit" !n) )ist!nce protection 5 .ower swing )etection met#o)s 5 %imul!tions 5 Tests 5 &esults !n) conclusions

2008 IEEE T&D LA Conference

Intro)uction
E ents t#!t c!use signific!nt tr!nsient response7
5 5 5 5 5 loss or !pplic!tion of l!rge blocks of lo!), line switc#ing, gener!tor )isconnection, f!ults, etc.

2008 IEEE T&D LA Conference

.ower s"stem st!bilit" s )ist!nce protection

5 .ower oscill!tions7 b!l!nce) e ents 5 .ower swings !ffect t#e tr!nsmission lines rel!"s 5 Dist!nce rel!"s elements m!" oper!te )uring ! power swing, if t#e impe)!nce locus enters t#e )ist!nce oper!ting c#!r!cteristic

2008 IEEE T&D LA Conference

.ower s"stem st!bilit" s )ist!nce protection

Impe)!nce seen b" ! )ist!nce rel!" loc!te) !t t#e bus C7 8in c!se | EA | 9 | E: |)
ZC =

(ZA +

ZB + ZL ) 1 j cot 2 2
2008 IEEE T&D LA Conference 2

Tr!)ition!l power swing )etection

5 C#!r!cteristics7
- positi e-se<uence impe)!nce - me!suring t#e time t#!t t#e tr!=ector" rem!ins between t#e inner !n) outer c#!r!cteristic

2008 IEEE T&D LA Conference

Tr!)ition!l power swing )etection

5 Time o er setting time )el!"
- power swing tripping of t#e rel!" is blocke) )uring ! cert!in time

5 Time s#orter
- s#ort circuit tripping of t#e rel!" is !llowe)

2008 IEEE T&D LA Conference

3o)ern met#o)s for power swing )etection

5 C#!r!cteristics7
- bec!use of numeric!l rel!"s implement!tion - >perm!nent? me!surements

5 E !lu!tion of tr!=ector"7
- spee) - monoton" - @ones of ste!)" st!te inst!bilit"

5 Electric!l s"stem centre estim!tion 5 etc.

2008 IEEE T&D LA Conference 8

$rugu!"!n electric!l power s"stem

$rugu!". 5 3!B. )ist!nce ;00 km 5 .opul!tion7 6./ millions Electric!l power. 5 Inst!lle) gener!tion7 2.6 (C 5 .e!k lo!)7 D./ (C Tr!nsmission lines. 5 200 kE7 000 km 5 D20 kE7 6 220 km 5 F")ro 8D./ (CG !n) T#erm!l 80.A (CG gener!tion

200; )!t!

Hew $rugu!"!n ne!r scen!rio

Incorpor!tion of new consumer wit# gener!tion c!p!cit" 5 T#erm!l units for D/03C 8D0I of m!B. lo!)G 5 in=ecting t#e surplus to t#e $rugu!"!n power s"stem

It c!n le!) to out-of-step con)itions !n) misoper!tion of )ist!nce rel!"s

2008 IEEE T&D LA Conference

D0

%imul!tions !n) tests performe)

%tu)" of t#e be#! ior of line protection rel!"s of t#e tr!nsmission lines ne!r t#e new consumer )uring power swings7 5 numeric!l in estig!tions 5 eBperiment!l in estig!tions

2008 IEEE T&D LA Conference

DD

%imul!tions !n) tests performe)

Time-)om!in simul!tions 8D%AT, AT.G J D%AT
Disturb!nce simul!tions in D20 kE lines ne!r 'r!" :entos
T#ree p#!se s#ort circuits 8worst c!sesG C!lcul!tion of critic!l cle!ring times 8CCTG %u))en line openings $neBpecte) loss of gener!tion !n) lo!) s#e))ing

%election of t#e set of p!irs >contingenc" J protection line rel!"s of interest? to be simul!te) furt#er in AT.
2008 IEEE T&D LA Conference D2

%imul!tions !n) tests performe)

X

IX

AT. 8AT.-E3T. Altern!ti e Tr!nsients .rogr!mG

Contingencies
!G bG cG )G t#ree p#!se s#ort-circuit o er critic!l time, wit#out !utom!tic reclosing, in ':E-%KA D20 kE line, ne!r ':E, t#ree p#!se s#ort-circuit o er critic!l time, wit#out !utom!tic reclosing, in 3E&-LM$ D20 kE line, ne!r 3E&, su))en tot!l lo!) s#e))ing in :MT, su))en loss of one of two gener!tors in :MT.
2008 IEEE T&D LA Conference D6

%imul!tions !n) tests performe)

L!bor!tor" e<uipment
- %IE3EH% 0%A;DD 82DG !n) 0%D222 880L12DG line rel!"s - M3IC&MH C3C22;-; test set 8secon)!r" in=ection of t#ree p#!se olt!ges !n) currentsG

2008 IEEE T&D LA Conference

D/

%imul!tions !n) tests performe)

EBperiment!l in estig!tions
5 Es !n) Is sign!ls in selecte) lines were gener!te) !n) store) wit# AT. in pl/ form!t 5 Eolt!ges !n) currents gener!te) wit# t#e test set were in=ecte) to re!l )ist!nce protections

2008 IEEE T&D LA Conference

D2

%imul!tions !n) tests performe)

EBperiment!l in estig!tions &esults of simul!tion
EB!mple7 c!se bG
Eolt!ges !n) currents 8':E %KA G simul!te) !n) in=ecte) 82 secG

5 t#ree p#!se s#ort-circuit in 3E&-LM$ D20 kE line 8ne!r 3E&G 5 o er critic!l time 5 wit#out !utom!tic reclosing
2008 IEEE T&D LA Conference D;

%imul!tions !n) tests performe)

8rel!"Ns oscilogr!p#ic registersG
':E%KA rel!" .icks-up7 5 t#e re erse time-)el!"e) @one !n) 5 t#e non-)irection!l time)el!"e) @one 5 onl" !t t#e en) of s#ort-circuit %KA':E rel!" .icks-up7 5 t#e forw!r) time-)el!"e) @one !n) 5 t#e non-)irection!l time)el!"e) @one 5 &el!"Ns >.ower %wing? sign!l is set on )uring most of t#e f!ult
2008 IEEE T&D LA Conference D0

%imul!tions !n) tests performe)

8rel!"Ns oscilogr!p#ic registersG

':E%KA rel!" .icks-up7 5 t#e re erse time-)el!"e) @one !n) 5 t#e non-)irection!l time-)el!"e) @one 5 onl" !t t#e en) of s#ort-circuit

Currents
I/A

10

0 -0.10 -10 0.00 0.10 0.20 0.30 0.40 0.50

t/s

-20

iL1

iL2

iL3

iE

Voltages
U/V
50

0 -0.10 0.00 0.10 0.20 0.30 0.40 0.50

t/s

-50

&el!"s fl!gs7

uL1 "o%er &%ing #is. "IC$U" Relay !RI"

uL2

uL3

5 >.ower %wing? 5 >.ickup?

-0.10

0.00

0.10

0.20

0.30

0.40

0.50

2008 IEEE T&D LA Conference

D8

t/s

Conclusions

%imul!tions !n) tests un)er )ifferent s"stem con)itions #! e s#own7 5 line )ist!nce protections loc!te) ne!r t#e new consumer oper!te properl" un)er power swing con)itions, blocking t#e rel!"s ! oi)ing t#em to oper!te !n) le!) to m!=or out!ges.
2008 IEEE T&D LA Conference DA

T#!nks for "our !ttention

2008 IEEE T&D LA Conference

20