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Gu-Yeon Wei Division of Engineering and Applied Sciences Harvard University guyeon@eecs.harvard.edu
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Overview
Reading Chapter 6 Supplemental Reading Sedra&Smith: Chapter 5.1~5.4 Background Now that we have a basic understanding of semiconductors and PN junctions, we will build on that knowledge to look at a transistor device called a MOSFET. This is the first of two transistors types that we will be studying in this course. Most modern ICs are built using these transistors. While they are commonly used to implement digital circuits, we will look at their analog characteristics and talk about how to build amplifiers with them. We begin with the physical structure and a qualitative understanding of how MOSFETs operate. We will derive some current-voltage equations for the transistor. We will also use band diagrams to provide some theoretical rigor to our initial qualitative understanding. Then, we will look at some non-ideal characteristics of the transistor. Lastly, we will analyze the DC operation of MOSFETs.
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Enhancement-Type MOSFET
Most widely used field effect transistor (enhancement type) Lets look at its structure and physical operation
3 terminal device (gate, source, drain) Additional body (or bulk) terminal (generally at DC and not used for signals) Two types:
nMOS and pMOS
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nMOS Transistor
Four terminal device: gate, source, drain (and body) No connection between the gate and drain/source (separated by oxide) Voltage on gate controls current flow between source and drain Gate-oxide-body stack looks like a capacitor Gate and body are conductors SiO2 (oxide) is a good insulator Called Metal-Oxide-Semiconductor (MOS) capacitor
Gate no longer made out of metal, but poly
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pMOS Transistor
Similar to nMOS, but doping and voltages reversed Body tied to high voltage (Vdd) Gate low: transistor is ON
inverted channel of positively charged holes
Gate high: transistor is OFF Bubble indicates inverted behavior of the pMOS
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Depletion
Repels positive charge
Inversion
Inversion layer forms under the gate
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Ef Ei
metal oxide
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semiconductor
N-type semiconductor
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charge
+Q
position
-Q M O S
We will use band diagrams and block charge diagrams to better understand how MOS devices work
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+Q -Q
+Q -Q M O S
M O
+Q -Q M O S
holes +Q -Q M O S
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Terminal Voltages
The modes of operation depend on terminal voltages Vg, Vd, and Vs Vgs = Vg - Vs Vgd = Vg - Vd Vds = Vd - Vs = Vgs - Vgd Source and drain are symmetric diffusion terminals (transistors are symmetric devices) By convention, source is the terminal at the lower (higher) voltage for the nMOS (pMOS) transistor Hence, Vds > 0 nMOS body is grounded. First assume that source is grounded as well Three regions of operation Cutoff Linear Saturation
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I-V Characteristics
In the Linear region of moderation, Ids depends on How much charge is in the channel How fast the charge is moving
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Channel Charge
MOS structure looks like a parallel plate capacitor while operating in inversion Gate-oxide-channel
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Carrier Velocity
Charge is carried by eCarrier velocity v is proportional to the lateral E-field between source and drain
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As vGS increases, electrons start to gather at the surface underneath the gate (onset of inversion) When vGS is high enough, a n-type channel is induced underneath the gate oxide where there are more electrons than holes (strong inversion)
This induced region is called an inversion layer (or channel) and forms when vGS > some threshold voltage Vt and current can flow between S & D Transistor is in inversion mode When vDS = 0, no current flows between source and drain
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Linear Operation
iD vGS = Vt + 3 V
vGS = Vt + 2 V
With vGS large enough to induce a channel, apply a small potential vDS Causes current to flow between source and drain (electrons flow from source to drain) Magnitude of iD depends on density of electrons in channel which depends on vGS (larger vGS = higher density of electrons) Conductance of channel is proportional to vGS-Vt (called excess gate voltage or effective voltage or gate overdrive) Current is proportional to vGS-Vt and vDS that causes current to flow i-v curve shows the transistor operates like a voltage-controlled linear resistor Notice iD = iS and iG = 0 due to the gate oxide
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Assume vGS is at a constant value > Vt and increase vDS vDS appears as a voltage drop across the channel and at different points along the channel, the voltage is different Voltages between the gate and points along the channel are also different ranging from vGS at the source to vGS-vDS at the drain
Induced channel is a function of voltage across the oxide at the different points and so channel depth varies across the length of the transistor
i-v curve bends over as vDS increases due to the smaller channel depth At vDS = vGS-Vt channel depth is almost zero at the drain side
Current stays flat for higher voltages vDS > vGS-Vt The transistor is said to now operate in the saturation region (not to be confused with the saturation region in BJTs)
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Saturation Region
vDS >= vGS - Vt source channel vDS drain
vDS = 0
As vDS increases, the channel gets smaller and smaller on the drain side until vDS = vGS Vt at which point the channel is said to be pinched off Increasing vDS beyond this point as little (ideally no) effect on the channel shape Current remains constant and said to saturate Transistor enters saturation at vDSsat = vGS Vt
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First consider the linear (triode) region of operation vDS < vGS - Vt (vGS > Vt is assumed) Consider a point along the channel of infinitesimal width dx at x and voltage v(x) The electron charge at this point is: where Cox is the parallel-plate cap formed by the gate electrode and the channel
vDS produces as electric field along the channel (in the negative x direction)
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The electric field causes electron charge dq(x) to drift with a velocity dx/dt
Where n is the electron mobility in the channel Current is the movement of charge and so
Rearrange the equation and integrate along the length of the channel
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Linear
Saturation
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ids
saturation starts
Vg = 2.0V
Vg = 1.5V Vg = 1.0V
Vds
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Weve just seen how current flows in nMOS devices. A complementary version of the nMOS device is a pMOS shown above pMOS operation and current equations are the same except current is due to drift of holes The mobility of holes (p) is lower than the mobility of electrons (n) Current is lower in pMOS devices given the same dimension and voltages.
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Circuit Symbols
nMOS or nFET pMOS or pFET
We represent MOSFETs with the following symbols The book specifies nMOS vs. pMOS with arrows (direction of current flow) I will use bubbles b/c they are easier to distinguish quickly
a digital circuit designers way of drawing symbols
These are symmetric devices and so drain and source can be used interchangeably
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i-v Characteristics
For small values of vDS, vDS2 is small and so near the origin, we can approximate the transistor as a linear resistor
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We can get a relationship between iD and vGS when the transistor is in saturation Let vGS-Vt = VDS
MOS vs. BJT Current is quadratic with voltage in MOS vs. exponential relationship in BJT
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Channel-Length Modulation
Like the Early effect in BJTs, there is an effect in MOSFETs that causes drain current to vary with vDS in saturation (finite output resistance) As vDS increases beyond vDSsat, the pinch off point moves away from the drain by L and has the effect of changing the effective channel length in the transistor Account for this effect with a (1+vDS) term in the saturation current equation
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Body Effect
So far, we have been ignoring the substrate (or bulk or body) of the transistor and assumed that is it tied to the source. However, we cannot always make that assumption. In integrated circuits, the body is common to many MOS transistors and is connected to the most negative (positive) supply for nMOS (pMOS) transistors. The resulting reverse-bias voltage between the source and substrate affects device operation. Reverse bias will widen the depletion region and reduces channel depth which can be modeled as changing the threshold voltage
where Vth0 is the threshold voltage when VSB=0, f is a physical parameter, is a fabrication-process parameter
is typically 0.5-V1/2 As VSB increases, Vt increases which affects the transistors i-v characteristics
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Temperature Effects
Vt and mobility n,p are sensitive to temperature Vt decreases by 2-mV for every 1C rise in temperature mobility n,p decreases with temperature Overall, increase in temperature results in lower drain currents
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Velocity Saturation
So far, the saturation current equation is quadratic with overdrive voltage (vGS-Vth) and said to obey the square law which is valid for long channel length (>1-m) devices As transistor dimensions decrease, gate oxide gets thinner and there is a higher vertical and horizontal electrical field that the electrons moving through the channel experience Causes electrons to bounce up to the oxide (more scattering) and saturates the velocity at which current flows across the channel Can approximate the effect of velocity saturation with the following powerlaw equation for saturation current
ranges from 1 to 2 depending on process technology (transistor length) This approximation is not rigorous, but convenient to use. More accurate models of the velocity saturation equation can be found in more advanced courses that cover MOS devices and circuits
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Depletion-type MOSFETs
Depletion-type MOSFETs have a channel with zero vGS (symbol is drawn with channel) must apply negative vGS to turn off device Can be used as resistor loads (will see later)
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MOSFET at DC Example
Current Mirror What is vGS? How is ID related to ISRC? What is ID vs. VD?
ID ISRC VD vGS
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MOSFET Amplifier
The MOSFET can be configured to operate as an amplifier. One of the simplest amplifier configurations one can build with a MOSFET is a common-source amplifier. Requirements for proper operation MOSFET must operate in saturation
Depends on RD and voltage biasing VGS
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Load Line
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Use a load line to see the operating point of the transistor w.r.t. RD and VGS
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DC Biasing
There are many ways to bias the CS nMOS Amp. Here are two ways
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What is VIN (or VGS) for the circuit on the right? What is the cap for?
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DC Bias
First bias MOSFET in saturation region (equivalent to active region in BJTs) to operate as an amplifier set vgs = 0 and find ID (for now, assume =0)
To be in saturation,
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Three components of iD
First term = DC current Second term = current proportional to vgs Third term = undesired nonlinear distortion Make vgs small to reduce effect of third term
This is the small-signal condition and lets us use the following approximation
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This gain equation hold for small signals Notice that the output is 180 out of phase w.r.t. the input Again, we can separate out the DC bias conditions and the small-signal operation of the circuit Look at the small-signal equivalent circuit for a MOSFET biased in the saturation region
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Like the Early effect in the BJT, channel length modulation results in an output resistance, ro
where VA = 1/ When using small-signal equivalent circuits, all DC sources are set to 0 since they do not change
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Transconductance
Lets take a closer look at transconductance, gm
DC bias VGS
making VGS large increases gm, but can limit voltage range on drain
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T-Model
Sometimes easier to analyze circuits using a different model T-Model and -Model are equivalent circuits Resistance looking into the source is 1/gm Resistance looking into G is still since ig=0
T-Model
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-Model
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Body Effect
D G vgs gmvgs ro gmbvbs vbs B
Body Effect We saw that the substrate bias VBS affects Vt which has the effect of influencing current like another gate
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RD vDS
R1 Rs
Lets look at another CS amplifier example What does the mid-band small-signal equivalent circuit look like? What is vbs? What is Rin seen by the source? What is Rout?
Rs gmvgs gmbvbs ro RD vds
vin
R2
vin
R1||R2
vgs
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Example 1 contd
Use the small-signal equivalent circuit to figure out small-signal gain, Rin and Rout
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Biasing so that Q2 in saturation and its output resistance is the effective resistor load for Q1 Combine the I-V curves
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Look at the Voltage Transfer Characteristics (VTC) of the circuit Operates like a high-gain amplifier (steep slope) in region III
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vi
vgs
ro1
ro2
vo
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metal
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Fabrication Steps
Start with blank wafer Build inverter from bottom up First step will be form the nwell Cover wafer with protective layer of SiO2 (oxide) Remove layer where nwell should be Implant or diffuse n dopants into exposed portion of wafer Strip off SiO2 Grow SiO2 on top of Si wafer 900-1200 C with H2O or O2 in oxidation furnace
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Photoresist
Spin on photoresist Photoresist is a light-sensitive organic polymer Softens where exposed to light
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Lithography
Expose photoresist through nwell mask Strip off exposed photoresist
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Etch
Etch oxide with hydrofluoric acid (HF) Seeps through skin and eats bone not something you want to have around in your bathroom Only attacks oxide where photoresist has been exposed
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Strip Photoresist
Strip off remaining photoresist Use mixture of acids called piranah etch Needed so that resist doesnt melt in next step
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nwell
Nwell is formed with diffusion or ion implantation Diffusion Place wafer in a furnace with arsenic gas Heat until As atoms diffuse into exposed Si Ion implantation Blast wafer with beams of As ions Ions blocked by SiO2, only enter where Si exposed
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Strip Oxide
Strip off the remaining oxide with HF Back to bare wafer with nwell Subsequent steps involve similar series of steps
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Polysilicon
Depost very thin later of gate oxide < 20 angstoms (6-7 atomic layers) Chemical vapor deposition (CVD) of silicon layer Place wafer in furnace with Silane gas (SiH4) Forms many small Si crystals called polysilicon Heavily doped to be a good conductor
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Polysilicon patterning
Use same lithography process to pattern polysilicon
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Self-Aligned Process
Use oxide and masking to expose where n+ dopants should be diffused or implanted N-diffusion forms nMOS source, drain, and nwell contact
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N-diffusion
Pattern oxide and form n+ regions Self-aligned process where gate blocks diffusion Polysilicon is better than metal for self-aligned gates b/c it doesnt melt during later processing
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N-diffusion contd
Historically, dopants were diffused Usually ion implantation is used today But regions still called diffusion
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N-diffusion contd
Strip off oxide to complete patterning step
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P-Diffusion
Similar set of steps to form p+ diffusion regions for pMOS source and drain and substrate contact
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Contacts
Now we need to wire the devices together Cover chip with thick field oxide Etch oxide where contact cuts are needed
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Metalization
Sputter on aluminum over entire wafer Patter to remove excess metal, leaving wires
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Layout
Chips are specified with set of masks Minimum dimensions of masks determine transistor size (and hence speed, cost, and power) Feature size f = distance between source and drain Set by minimum width of polysilicon (minimum channel length) Feature size improves 30% every three years or so Normalize for feature size when describing design rules Express rules in terms of = f/2 We will use \lambda = 0.3m in 0.6 m process (actually a 0.5 m process but drawn as 0.6 m) Next time: Learn SUE and Magic to draw your own layouts!
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