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PHASED ARRAY INSPECTIONS

Phased Array Probes and Wedges

Matched to Rexolite Probes Matched to Water Probes Integrated Wedge Curved Array Probes Wedges

920-165D-EN

The Company
Olympus Corporation is an international company operating in industrial, medical, and consumer markets, specializing in optics, electronics, and precision engineering. Olympus instruments contribute to the quality of products and add to the safety of infrastructure and facilities. Olympus is a world-leading manufacturer of innovative nondestructive testing and measurement instruments that are used in industrial and research applications ranging from aerospace, power generation, petrochemical, civil infrastructure, and automotive to consumer products. Leading-edge testing technologies include ultrasound, ultrasound phased array, eddy current, eddy current array, microscopy, optical metrology, and X-ray fluorescence. Its products include flaw detectors, thickness gages, industrial NDT systems and scanners, videoscopes, borescopes, high-speed video cameras, microscopes, probes, and various accessories. Olympus NDT is based in Waltham, Massachusetts, USA, and has sales and service centers in all principal industrial locations worldwide. Visit www.olympus-ims.com for applications and sales assistance.

Basic Concepts

Understanding Phased Array Technology


Acquisition unit Phased array unit
Probe elements

Examples of focal laws


Delay (ns) PA probe

The distinguis hing feature of phased array elements in a ultrasonic testing multielement probe. The excitation possibility of is the computer dynamically modifying -controlled excitation of multiple piezocom a beam in phase beam paramete (amplitude and by means of rs such as angle, posite elements can generate delay) constructive Similarly, the focal a focused ultrasonicof individual interference, echo the various active distance, and focal spot by each element from the desired focal point beam with the size through transduce are time-shift hits the various software. To desired focal ed transducer elements r elements are pulsed point and attenuate before being summed at slightly differentgenerate with a computab together. The s echoes from times. resulting le time shift. other points The echoes received in the test piece. sum is an A-scan that emphasiz es the response from the

Emitting

Trigger

Pulses

Incident wave

front

Transmitting delays

Flaw

Receiving

Echo signals

Reflected wave

front

Receiving delays and sum

Probe Types

Flaw

Delay (ns)

140

120

FD = 15

Angle steering

PA probe
Time delay [ns]

100

80

FD = 15
FD = 30

Incident wave

front Incident wave front

60

FD = 30

Illustration of

40

a single focal of active elements; law is multiplexe scanning is performe d across a group phased array d at a constant probe angle and along ultrasonic transducelength (aperture). This the is equivalent r performing to a conventio or shear-wav a raster scan nal e inspection. If an angled wedge for corrosion mapping compensate for different time delays inside is used, the focal laws the wedge.

Electronic linear scanning With electronic scanning,

Scanning Patterns

beam focusing

FD = 60
20

Illustration of

beam steering

FD = 60
0 0 4 8 12 16 20 24

Element number

28

32

Delay values (left) and depth scanning principles (right ) probe focusing for a 32-element linear array at 15-mm, 30-mm, longitudinal and 60-mm waves.

With sectorial scanning (also called azimuthal beam is moved through a sweep or angular scanning) same elements; range for a specific , the other added. The angular sweep ranges with different focal depth, using the sectors may have focal different values. depths may be

Sectorial scanni ng

Angle Beam
Angle beam probes wedge to transmit are used with a removabl e or integrate a refracted shear d test piece. They or longitudinal are designed wave into a for a wide and can be used to vary the refracted range of applications of the beam, beam angle depending on the wedge orientatio or the skew face is acoustica lly matched to n. the wedge material. The probe

Active group
1 16 128

(DDF) is a programm on-reception accomplished able, real-time by modifying each element array responsethe delay, gain, as a function of time. DDF and excitation the same focal replaces multiple of range created focal by beams at the receiving stage. the emitted beam with separate laws for the focal distance In other words, focused DDF dynamica as the signal significantly returns to the lly changes increases the phased array depth of field probe. DDF and signal-to-n oise ratio. Emission
Reception
Delay (ns) PA probe

Dynamic depth focusin g Dynamic depth focusing

Pulse-echo

Scanning direction

t0 t1 t2 t3 tn

=
This variation of an the probe housing. angle beam probe integrate s the wedge into The wedge configura smaller overall tion is fixed but dimensions. offers

Acquisition time

Integrated Wedg e

Electronic linear

scanning Sectorial scanning Acquisition without

Phased Array Prob es

DDF

Acquisition with

DDF

Linear arrays are the important features most commonly used phased array of linear arrays probes for industrial is the active probe The active aperture applications. aperture. Thus, one of (A) is the total the active probe A = (n1)p length. Aperture +e length is given by the following where n = Number formula: of elements in the PA probe p = Elementar y pitchdistance between the e = Element widthw centers of two idth of a single adjacent elements g = Gap between piezocomposite adjacent elements element (a practical =v value is e < f /2) where = Waveleng th v = Material sound velocity f = Frequency
70 60

Phased array probes are made applications. A few types are in a variety of shapes and sizes for different illustrated here:
e
Linear

Near Wall
The near wall probe is specifical dead zone at ly designed to probe ends by minimize the reducing the the last available distance element and the external edge between This probe type is useful for composit of the housing. inspections, or e radius and corner any using a 0 wedge. application requiring close contact to a wall

Wpassive n=8

1.5-D array

2-D array

Convex

p A

Concave Annular Internal focus

Time-Corrected Gain
70 60 45 60 45 70 60 45 45 60 60

45

Skewing

In order to support the growing NDT community, Olympus has published the Understanding Phased Array Technology poster. This poster has been designed by field experts to present phased array inspection technology in a concise and clearly illustrated manner. Get your free poster at www.olympus-ims.com.

Variable angle

Dual linear

Dual 1.5-D
60 45

70

70

70 60 45 70 45 70 60 70

Immersion
Immersion probes or in an immersio are designed to be used with a water wedge n tank when the test part is immersed. The partially or wholly water acts as a uniform couplant Immersion probes and delay line. are longitudinal-wave up for refracted probes that can shear-wave inspectio be set probes are mostly n under water. intended for automated inspectio Immersion ns.

70 60 45

Distance-amplitude curves (DAC) the time-corre used to create cted gain (TCG)
70 60 45

In order to cover 45 the whole volume each focal law has to be calibrated of the part with consisten spread. This time-corrected-gain for attenuation and beam cy, performed with (TCG) calibration a calibration can be block reflectors (for example, side-drille having several identical Using a sectorial 70 d holes) at 60 scan, the probe is moved different depths. that each beam 45 back and forth hits so is recorded (DAC) each reflector. The amplitude and used to construct of each signal focal law. one TCG curve per

70 60 45 45 45 60 60 70 70

70 60 45 45 60 70

Defect Positioning

Once the TCG calibration is completed, each reflector will always yield the focal law has 70 one individual same signal amplitude that detected it. A defect at TCG curve. , regardless of 60 3 mm amplitude as its position inside As a consequence, a if 45 it were at 10 mm in depth detected with an the part and angle of 45 degrees and detected at 60 degrees. will provide the of the beam same signal

Two-dimensional arrays have multiple allow electronic strips of linear focusing and arrays to steering in both arrays have the probe axes. 2-D same number of elements in whereas 1.5-D both dimensio identifies probes ns, uneven numbers with any combinat of ion of achieving optimal elements. The probes can be used for focusing capability without probe or to cover a movement. defined area

2-D and 1.5-D Array s

Top

B0 45

Bottom

RA PA DA

T1

Top

SA

For manual inspection s, real-time readings respect to the are essential part geometry to quickly position and/or probe location. the

reflected signal

source with

RA, PA, DA, and SA readings allow position the the user to accurately defect in real time during an inspection.

RA Reference point to the indication PA Probe front in face to the indication gate A DA Depth of in gate A the indication in gate A SA Sound-pa th length to the indication in gate A

Two linear or two 1.5-D array probes can be a roof-angled positioned on wedge with a transmitting probe. paired with a receiving equivalen The probe is in noisy materials t for such as austenitic optimal performance is a phased-a steel. This configura rray equivalen tion t to a conventional UT and is widely dual- element probe in used in the power-ge industry. neration

Dual Arrays

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Copyright 2011 by Olympus 920-242A_EN NDT. - Poster_PA_EN_A1_2All rights reserved. 01111. Printed in the USA.

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Table of Contents
Introduction to Phased Array Technology. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Custom Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Phased Array Probes Application Matrix. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 7 7 8

Phased Array Probes


A10, A11, A12, and A14 Universal Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 A3, A4, and A5 Deep Penetration Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 PWZ1, PWZ2, PWZ3, and A16 Weld Inspection Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 A00, A0, and A15 Small-footprint Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 NW1, NW2, and NW3 Near-wall Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 I1, I2, I3, and I4 Immersion Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 DGS1, SW1, and AWS1 Integrated Wedge and Code Compliant Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 R1, R4, and R5 Curved Array Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15

Wedges
Wedges for Angle Beam Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Immersion Corner Wedges for Curved Array Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Wedge Offset Parameters. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

Options
Probe Options and Spare Parts. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Wedge Options. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 A1 and A2 Legacy Probe Specifications and Dimensions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

Testing, Documentation, and Support


Testing and Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Training . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Introduction to Phased Array Technology


The distinguishing feature of phased array ultrasonic testing is the computer-controlled excitation (amplitude and delay) of individual elements in a multielement probe. The excitation of multiple piezocomposite elements generates a focused ultrasonic beam allowing the dynamic modification of beam parameters such as angle, focal distance, and focal spot size through software. To generate a beam in phase by means of constructive interference, the various active transducer elements are pulsed at slightly different times. Similarly, the echo from the desired focal point hits the various transducer elements with a computable time shift. The echoes received by each element are time-shifted before being summed together. The resulting sum is an A-scan that emphasizes the response from the desired focal point and attenuates echoes from the other points in the test piece. All Olympus phased array systems offer the following capabilities:

Software Control of Beam Angle, Focal Distance, and Focal Spot Size
To generate a beam, the various probe elements are pulsed at slightly different times. By precisely controlling the delays between the probe elements, beams of various angles, focal distances, and focal spot sizes can be produced. The echo from the desired focal point hits the various probe elements with a computable time shift. The signals received at each probe element are time-shifted before being summed together. The resulting sum is an A-scan emphasizing the response from the desired focal point and attenuating various other echoes from other points in the material.
Acquisition unit Phased array unit
Probe elements
Pulses Trigger Incident wave front

Multiple-Angle Inspection with a Single, Small, Electronically Controlled, Multielement Probe


A conventional UT inspection requires a number of different transducers. A single phased array probe can be made to sequentially produce the various angles and focal points required by the application.

Delay (ns) PA probe


Angle steering

Incident wave front

Emitting

Transmitting delays

Flaw

Inspection of Complex Shapes


Reflected wave front Echo signals

Receiving

Receiving delays and sum

Flaw

The capacity to produce at will, and under computer control, various beam angles and focal lengths is used to inspect parts with complex shapes such as turbine discs, turbine blade roots, reactor nozzles, and other complex shapes.

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High-Speed Scans with No Moving Parts


While phased arrays imply handling the many signals from multielement probes, it is important to note that the resulting signal is a standard RF signal (or A-scan) comparable to that of any conventional system with a fixed-angle transducer. This signal can be evaluated, processed, filtered, and imaged just as any A-scan from a conventional UT system. B-scans, C-scans, and D-scans built from the A-scan are also identical to that of a conventional system. The difference is that a multiple-angle inspection can be handled with a single transducer. Multiplexing also allows motionless scanning: a focused beam is created using a few of the many elements of a long phasedarray probe. The beam is then shifted (or multiplexed) to the other elements to perform a high-speed scan of the part with no probe movement along that axis. More than one scan may be performed with various inspection angles. The principle can be applied to flat parts using a linear phased array probe or to tubes and rods using a circular phased array probe.

Defect Positioning
For manual inspections, real-time readings are essential to quickly position the reflected signal source with respect to the parts geometry and/or probe location. RA, PA, DA, and SA readings allow the user to accurately position the defect in real time during an inspection. RA: Reference point to the indication in gate A PA: Probe front face to the indication in gate A DA: Depth of the indication in gate A SA: Sound path length to the indication in gate A

Top

B0

Bottom

45 T1 Top

Active group
16 1 128

Scanning direction
High-speed linear scan: Olympus phased array systems can also be used to inspect flat surfaces such as steel plates. Compared to a wide, single-element transduceroften referred to as a paint brushphased array technology offers a much higher sensitivity due to the use of a small focused beam.

RA PA DA SA

Phased Array Probes


Phased array probes are made in a variety of shapes and sizes for different applications. A few types are illustrated here. Typical array probes have a frequency ranging from 1MHz to 17 MHz and have between 10 and 128 elements. Olympus offers a wide variety of probes using piezocomposite technology for all types of inspections. This catalog shows Olympus standard phased array probes, which are divided into three types: angle beam probes, integrated wedge probes, and immersion probes.

Linear

1.5-D array

2-D array

Convex

Concave

Annular

Internal focus

Skewing

Variable angle

Dual linear

Dual 1.5-D

Other types of probes can be designed to suit the needs of your application. Linear arrays are the most commonly used phased array probes for industrial applications. One of the important features that defines phased array probes is the active probe aperture.

The active aperture (A) is the total active probe length. Aperture length is calculated by the following formula: A = np where n = number of elements in the PA probe p = elementary pitchdistance between the centers of two adjacent elements A more precise way of finding the active aperture is calculated by this formula: A = (n1)p + e where e = element widthwidth of a single piezocomposite element (a practical value is e < /2)
e

The near-field (N) value gives the maximum depth of usable focus for a given array. This value is given by the following formula: N= D2f 4c where D = element diameter f = frequency c = material velocity To calculate the near-field value in the active (primary) axis of a phased array probe: D = n p, where n is number of elements per group in the focal law. To calculate the near-field value in the passive (secondary) axis of a phased array probe: D = Wpassive, which is often called elevation.

Wpassive

n=8

p A
6

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Custom Probes
Olympus can manufacture custom phased array probes to suit specific applications and geometries. To develop your custom probe, we will need to know: Application Probe type (angle beam, immersions, integrated wedge, matrix) Comparable UT single element transducer Cable jacket required Frequency Cable length Number of elements, pitch, and elevation Connector style Array shape (flat, curve) Housing restrictions and/or size constraints -- Curved in active dimension -- Curved in passive dimension (focused)

Ordering Information
Numbering System Used to Order Standard Phased Array Probes

5L16-9.6x10-A1-P-2.5-OM
Frequency Array type Number of elements Active aperture Elevation Cable length Cable type Casing type Probe type Connector type

Glossary Used to Order Phased Array Probes (Typical options shown)


Frequency
1.5 = 1.5 MHz 2.25 = 2.25 MHz 3.5 = 3.5 MHz 5 = 5MHz 7.5 = 7.5MHz 10 = 10MHz

Number of elements
Example: 16 = 16 elements

Casing type
Casing type for a given probe type

Cable type
P = PVC outer M = metal armor outer

Active Aperture
Active aperture in mm. Refer to page 6 for details.

Elevation
Elevation in mm Example: 10 = 10 mm

Cable length
Cable length in m 2.5 = 2.5 m 5= 5m 10 = 10 m

Array type
L = linear A = annular M = matrix probe (1.5D, 2D) CV (ROC) = convex in azimuth CC (ROC) = concave in azimuth CCEV (ROC) = elevation focused

Probe type
A = angle beam with external wedge NW = near-wall PWZ = weld inspection angle beam W = angle beam with integrated wedge I = immersion DGS = DGS inspection/Atlas (AVG probe) AWS = AWS inspection

Connector type
OM = OmniScan connector HY = Hypertronics connector OL = OmniScan Connector with conventional UT channel on element 1 (LEMO 00 connector)

ROC: radius of curvature (mm) 7

Phased Array Probes Application Matrix


Deep Penetration General Purpose Small Footprint Composite Immersion Corrosion Probe Model Weld Typical Application Use Scan Type Additional information

Manual A00 A0 A1 A2 A3 A4 A5 A10 A11

Automated Sectorial Sectorial Developed for scribe mark applications Small access, reduced footprint A10 recommended for weld applications A12 recommended for weld applications

Sectorial Sectorial and Linear Sectorial Sectorial Sectorial Sectorial Sectorial

Developed for OmniScan 32:128 shear wave and L-wave manual S-scan crack sizing applications Primary probe for carbon steel weld inspection for thickness up to 50 mm (16:128) and 70 mm (32:128)

A12

Sectorial and Linear Sectorial and Linear Sectorial Linear Linear Linear Sectorial and Linear Sectorial Sectorial Sectorial and Linear Sectorial and Linear Sectorial and Linear

A14 AWS NW1 NW2 NW3 PWZ1 PWZ3 DGS1 I1 I2 I3 I4

AWS weld inspection

Designed for near-wall and close access applications

Primary probe for carbon steel weld inspection for thickness over 50 mm (16:128)

DGS applications

HydroFORM corrosion mapping solution

This table is only a general application guideline. Please consult your Olympus sales representative prior to ordering.

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A10, A11, A12, and A14 Universal Probes

10L32-A10

5L64-A12

5L60-A14

Advantages
Probes are designed to have a low-profile probe/wedge combination for easier access in restricted areas. Wave layers with acoustic adaptation to Rexolite Captive anchoring screws are provided with the probe. A wide selection of wedges is available to suit any angle beam application.
H
H

L W

Typical Applications
A10, A11, and A12 Probes
Manual or automated inspection of 6.35 mm to 38 mm (0.25in. to 1.5 in.) thick welds Detection of flaws and sizing Inspections of castings, forgings, pipes, tubes, and machined and structural components for cracks and welding defects

A10, A11 casing A12 casing

A14 casing

H
W

Probe Specifications and Dimensions


Part Number 5L16-A10 10L32-A10 5L32-A11 5L64-A12 5L60-A14 7.5L60-A14 Item Number U8330595 U8330251 U8330274 U8330593 U8330785 U8330804 Frequency (MHz) 5.0 10.0 5.0 5.0 5.0 7.5 Number of Elements 16 32 32 64 60 60 Pitch (mm) 0.60 0.31 0.60 0.60 1.0 1.0 Active Aperture (mm) 9.6 9.9 19.2 38.4 60.0 60.0 Elevation (mm) 10.0 7.0 10.0 10.0 10.0 10.0 External Dimensions mm (in.) L 23 (0.91) 23 (0.91) 25 (0.98) 45 (1.77) 68 (2.68) 68 (2.68) W 16 (0.63) 16 (0.63) 23 (0.91) 23 (0.91) 23 (0.91) 23 (0.91) H 20 (0.79) 20 (0.79) 20 (0.79) 20 (0.79) 20 (0.79) 20 (0.79)

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially fitted with other connectors and cable lengths. 9

A3, A4, and A5 Deep Penetration Probes

A3

A4

A5

Advantages
Wave layers with acoustic adaptation to Rexolite Captive anchoring screws are provided with the probe. A wide selection of wedges is available to suit any angle beam application.

Typical Applications
A3, A4, and A5 Probes
Deep penetration applications Thick plates and welds Forging Noisy or granular material
H H L W
A5 casing

W
A3 casing

W
A4 casing

Probe Specifications and Dimensions


Part Number 3.5L16-A3 5L16-A3 1.5L16-A4 2.25L16-A4 2.25L32-A5 5L32-A5 Item Number U8330094 U8330092 U8330098 U8330692 U8330141 U8330139 Frequency (MHz) 3.5 5.0 1.5 2.25 2.25 5.0 Number of Elements 16 16 16 16 32 32 Pitch (mm) 1.60 1.20 2.80 2.00 0.75 0.60 Active Aperture (mm) 25.6 19.2 44.8 32.0 24.0 19.2 Elevation (mm) 16.0 12.0 26.0 20.0 24.0 20.0 External dimensions mm (in.) L 36 (1.42) 36 (1.42) 57 (2.24) 57 (2.24) 29 (1.14) 29 (1.14) W 36 (1.42) 36 (1.42) 46 (1.81) 46 (1.81) 43 (1.69) 43 (1.69) H 25 (0.98) 25 (0.98) 30 (1.18) 30 (1.18) 24 (0.94) 24 (0.94)

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially fitted with other connectors and cable lengths. 10

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PWZ1, PWZ2, PWZ3, and A16 Weld Inspection Probes

7.5L60-PWZ1

7.5LCCEV100-60-A16

Laterally Focused Arrays (CCEV)


Advantages
Low-profile housing Front-exit cable to avoid interference with the scanner probe holder Fits special PipeWIZARD wedges designed for automated inspections of girth welds (sophisticated irrigation channels, locking carbide wear pins) Can be ordered with CE-certified Hypertronics connector Suitable for manual and automated inspections Available laterally focused probes improve defect length sizing (7.5CCEV100-60-A16) These new probes for girth weld inspection used with the PipeWIZARD system or COBRA scanner have curved elements in the passive plane, focusing the beam in the lateral direction. An integrated lens permits the use of standard wedges. These cylindrically focused probes significantly reduces oversizing and excessive repairs. Their capacity to discriminate small indications is a major advantage when sizing the length of an intermittent defect using interaction rules. In addition, beam energy is better maintained in small pipe/thin wall applications.

Typical Applications
Automated inspection of girth welds with PipeWIZARD systems Manual or automated inspection of thick welds Detection of flaws and sizing Inspection of castings, forgings, pipes, tubes, and machined and structural components for cracks and welding defects

H L W

Probe Specifications and Dimensions


Part Number 5L60-PWZ1 7.5L60-PWZ1 7.5L60-PWZ1* 5L48-PWZ2 5L32-PWZ3 7.5L32-PWZ3 10L32-PWZ3 7.5CCEV100-60-A16 7.5CCEV100-60-A16** Item Number U8330164 U8330144 U8330086 U8330964 U8330770 U8330209 U8330221 U8330958 U8330796 Frequency (MHz) 5.0 7.5 7.5 5.0 5.0 7.5 10.0 7.5 7.5 Number of Elements 60 60 60 48 32 32 32 60 60 Pitch (mm) 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 Active Aperture (mm) 60.0 60.0 60.0 48.0 32.0 32.0 32.0 60.0 60.0 Elevation (mm) 10.0 10.0 10.0 10.0 10.0 10.0 10.0 18.0 18.0

PWZ1 and A16 casing

External Dimensions mm (in.) L 68 (2.68) 68 (2.68) 68 (2.68) 56 (2.20) 40 (1.57) 40 (1.57) 40 (1.57) 68 (2.68) 68 (2.68) W 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 29 (1.14) 29 (1.14) H 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18)

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially fitted with other connectors and cable lengths. * Designed for PipeWIZARD system, this probe comes with a CE Hypertronics connector and a 0.6m (2ft) cable. ** Designed for PipeWIZARD system, this probe comes with a CE Hypertronics connector and a 0.75m (2.5ft) cable. 11

A00, A0, and A15 Small-footprint Probes NW1, NW2, and NW3 Near-wall Probes

7.5CCEV35-A15

10L16-A00

10L16-A00 with SA00-N60S wedge

5L10-A0-TOP

5L64-NW1

Advantages of Small-footprint Probes


Access to confined areas (A00 probe has an 88 mm footprint) Cable connector can come out from either the side or the top (A0 only). Special-design small-footprint wedge 10L16-A00 is used for aerospace scribe-mark applications.
H H

Advantages of Near-wall Probes


Shortened dead zone at both ends (1.5 mm between center of first or last element and housing edge) Well suited for composite channel inspections Used for C-scan inspections of composites (delamination, disbonding, and porosity)

A00 casing Dimensions are without the strain relief.

A0 casing

H L W

NW1 casing

Probe Specifications and Dimensions


Part Number Item Number Frequency (MHz) Number of Elements Pitch (mm) Active Aperture (mm) 5.0 6.0 6.0 6.0 6.0 8.0 Elevation (mm) External Dimensions mm (in.) L W H

Small-Footprint Probes 10L16-A00 5L10-A0-SIDE 5L10-A0-TOP 10L10-A0-SIDE 10L10-A0-TOP 7.5CCEV35-A15 U8330145 U8330080 U8330075 U8330110 U8330111 U8330826 10.0 5.0 5.0 10.0 10.0 7.5 16 10 10 10 10 16 0.31 0.60 0.60 0.60 0.60 0.50 5.0 6.0 6.0 6.0 6.0 10.0 8 (0.31) 13 (0.51) 13 (0.51) 13 (0.51) 13 (0.51) 26 (1.02) 8 (0.31) 10 (0.39) 10 (0.39) 10 (0.39) 10 (0.39) 22 (0.87) 23 (0.91) 23 (0.91) 23 (0.91) 23 (0.91) 23 (0.91) 9.7 (0.38)

Near-Wall Probes 3.5L64-NW1 5L64-NW1 3.5L24-NW2 5L24-NW2 3.5L128-NW3 5L128-NW3 U8330148 U8330134 U8330965 U8330155 U8330695 U8330647 3.5 5.0 3.5 5.0 3.5 5.0 64 64 24 24 128 128 1.0 1.0 1.0 1.0 1.0 1.0 64.0 64.0 24.0 24.0 128.0 128.0 7.0 7.0 7.0 7.0 7.0 7.0 66 (2.60) 66 (2.60) 26 (1.02) 26 (1.02) 130 (5.12) 130 (5.12) 19 (0.75) 19 (0.75) 19 (0.75) 19 (0.75) 21 (0.83) 21 (0.83) 25 (0.98) 25 (0.98) 30 (1.18) 30 (1.18) 35 (1.38) 35 (1.38)

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially fitted with other connectors and cable lengths. 12

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I1, I2, I3, and I4 Immersion Probes

10L128-I2

7.5L64-I4

Immersion probes are designed to be used with a water wedge or in an immersion tank when the test part is partially or wholly immersed. They are longitudinal wave probes that can be set up for refracted shear-wave inspections using a Rexolite wedge.

Advantages
Acoustic impedance matches water Design allows fitting on water wedges for easier coupling on many surfaces and an adjustable water path (when the part to be inspected cannot be immersed in a tank). Linear scanning allows coverage of 30mm to 90mm in one line, with very high accuracy. Corrosion-resistant stainless steel case Waterproof guaranteed up to 1m (3.28 ft) under water

Typical Applications
Inspection of thin plate or tubing (steel, aluminum, or other) Composite inspection for delamination, disbonding, etc. Inline thickness gaging Automated scanning
W

I3 casing

L W

I4 casing

Probe Specifications and Dimensions


Part Number 5L64-I1 10L64-I1 5L128-I2 10L128-I2 2.25L128-I3 5L128-I3 7.5L60-I4 Item Number U8330323 U8330012 U8330031 U8330004 U8330351 U8330379 U8330955 Frequency (MHz) 5.0 10.0 5.0 10.0 2.25 5.0 7.5 Number of Elements 64 64 128 128 128 128 64 Pitch (mm) 0.60 0.50 0.60 0.50 0.75 0.75 1.0 Active Aperture (mm) 38.4 32.0 76.8 64.0 96.0 96.0 64.0 Elevation (mm) 10.0 7.0 10.0 7.0 12.0 10.0 7.0 External Dimensions mm (in.) L 50 (1.97) 50 (1.97) 83 (3.27) 83 (3.27) 102 (4.02) 102 (4.02) 73 (2.87) W 19 (0.75) 19 (0.75) 21 (0.83) 21 (0.83) 21 (0.83) 21 (0.83) 24 (0.94) H 25 (0.98) 25 (0.98) 35 (1.38) 35 (1.38) 35 (1.38) 35 (1.38) 25 (0.98)

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially fitted with other connectors and cable lengths. 13

DGS1, SW1, and AWS1 Integrated Wedge and Code Compliant Probes

4L16-DGS1

2.25L16-AWS1

Advantages
Probe and wedge in the same housing The lowest-profile probe-and-wedge combination for contact angle beam inspection Coupling always good between probe and wedge interfaces, no need for couplant between the probe and wedge Very small assembly for easy access in restricted areas Inspections of 30 to 70 in steel, SW or LW Easy to handle Probes with an internal wedge can be specially ordered to fit a specific curvature radius.

DGS1 casing
H

Typical Applications
Manual weld inspection of 6.35mm to 19mm (0.25in. to 0.75in.) thick surfaces (butt joints, corner joints, tee joints), using 40 to 70 simultaneously Manual inspection of stress-corrosion cracking AWS and DGS code compliant applications
H
L W

AWS1 casing

SW1 and LW1 casings

Probe Specifications and Dimensions


Number of Elements Frequency (MHz) Pitch (mm) Active Aperture (mm) 8.0 8.0 12.0 12.0 9.6 9.6 16.0 Nominal Refracted Beam Angle in Steel 58SW 58SW 45SW 45LW 45SW 45LW N/A Integrated Wedge Elevation (mm) External Dimensions mm (in.) L 27 (1.06) 27 (1.06) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 25 (0.98) W 17 (0.67) 17 (0.67) 15 (0.59) 15 (0.59) 15 (0.59) 15 (0.59) 38 (1.50) H 22 (0.87) 22 (0.87) 31 (1.22) 31 (1.22) 31 (1.22) 31 (1.22) 18 (0.71)

Part Number

Item Number

2L8-DGS1 4L16-DGS1 2.25L16-45SW1 2.25L16-45LW1 5L16-45SW1 5L16-45LW1 2.25L16-AWS1

U8330598 U8330597 U8330014 U8330495 U8330496 U8330497 U8330660

2.0 4.0 2.25 2.25 5.0 5.0 2.25

8 16 16 16 16 16 16

1.0 0.5 0.75 0.75 0.60 0.60 1.0

9.0 9.0 12.0 12.0 10.0 10.0 16.0

Yes Yes Yes Yes Yes Yes No

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially fitted with other connectors and cable lengths 14

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R1, R4, and R5 Curved Array Probes

3.5CC10.2-R1

3.5CC25-R4

3.5CC50-R5

Advantages
Acoustic impedance matches water. High circumferential resolution around the radius Corrosion-resistant stainless steel case Waterproof guaranteed up to 1 m (3.28 ft) underwater Compatible with adjustable immersion wedges (shown on page 19)

Typical Applications
Inspection of carbon fiber reinforced polymers (CFRP) corners Composite inspection for delamination

R A

R casing

Probe Specifications and Dimensions


Part Number 3.5CC10.2-16-R1 5CC10.2-16-R1 3.5CC25-32-R4 5CC25-32-R4 3.5CC50-64-R5 5CC50-64-R5 Item Number U8330453 U8330709 U8330629 U8330479 U8330630 U8330636 Casing Type R1 R1 R4 R4 R5 R5 Frequency (MHz) 3.5 5.0 3.5 5.0 3.5 5.0 Number of Element 16 16 32 32 64 64 Pitch (mm) 1.0 1.0 1.32 1.32 1.65 1.65 Elevation (mm) 5.0 5.0 6.0 6.0 6.0 6.0 Radius (mm) (R) 10.2 10.2 25.0 25.0 50.0 50.0 Angle () (A) 90 90 90 90 121 121 Inspection Type ID ID ID, OD ID, OD OD OD

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially fitted with other connectors and cable lengths. 15

Wedges for Angle Beam Probes

SA2-0L

SA00-N60S

SA10-N55S

SA11-N55S

SA12-N55S

Advantages
Available in standard refracted angles of 0, 45, 55, and 60 in steel for angle-beam inspections from 30 to 70, SW or LW Stainless steel screw receptacles provide a firm anchoring of probes to wedges. Lateral electronic scanning replaces the hand-skewing movement (with lateral wedges). The IHC wedge option can be ordered to improve the quality of the inspection: irrigation, mounting holes for the wedge holder to work with any Olympus scanner, and carbide pins to increase wear resistance. Wedges are designed to perform manual or automated scans. Custom wedges with specific refracted angles can be ordered; wedge shape and contour can also be customized.

Numbering System Used to Order Wedges for Angle Beam probes

SA1-N60S-IHC-AOD8
Wedge type Probe mounting Options Wave type Refracted angle in steel Pipe diameter Curvature type

Glossary Used to Order Wedges


Wedge type
SA = wedge SAWS = wedge SNW = wedge SPWZ = wedge for for for for probe type A probe type AWS near-wall probe type NW PipeWIZARD probe type PWZ

Wave type

S = shear wave L = longitudinal wave

Options

Probe mounting

N = normal L = lateral (90 skew) = 0 = 45 = 55 = 60

Refracted angle in steel


0 45 55 60

IHC = Irrigation, scanner attachment points, and carbide wear pins IHC-C = Irrigation, scanner attachment points, and composite wear pins WP5 = Water pocket (0.005in.) WP40 = Water pocket (0.040 in.)

Curvature type

AOD = Axial outside diameter (circumferential scan) COD = Circumferential outside diameter (axial scan)

Pipe diameter

Measured external pipe diameter in in.

16

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Wedge Specifications and Dimensions


Part Number SA00-0L SA00-N45S SA00-N60S SA0-0L SA0-N45S SA0-N60S SA1-0L SA1-N60S SA1-N60L SA1-L45S SA2-0L SA2-N60L SA2-N55S SA3-0L SA3-N45S SA3-N45L SA3-N60S SA3-N60L SA4-0L SA4-N45S SA4-N45L SA4-N60S SA4-N60L SA5-0L SA5-N45S SA5-N60S SA5-N60L SA10-0L SA10-N55S SA10-N60L SA11-0L SA11-N55S SA11-N60L SA12-0L SA12-N55S SA12-N60L SA14-0L SA14-N55S SA15-N60S SA16-N55S-IHC SAWS1-N60S SAWS1-0L SNW1-0L SNW1-0L-WP5 SNW1-0L-IHC-C SNW2-0L SNW2-0L-WP5 SNW3-0L SNW3-0L-WP5 Item Number U8720002 U8720006 U8720008 U8720004 U8720012 U8720014 U8720016 U8720036 U8720032 U8720024 U8720082 U8720135 U8720096 U8720139 U8720143 U8720141 U8720147 U8720145 U8720149 U8720153 U8720151 U8720157 U8720155 U8720159 U8720163 U8720169 U8720167 U8720544 U8720545 U8720546 U8720553 U8720547 U8720548 U8720549 U8720550 U8720551 U8721079 U8720997 U8721094 U8721469 U8720552 U8720706 U8700264 U8720637 U8700266 U8720924 U8720596 U8721184 U8721219 Probe Type A00 A00 A00 A0 A0 A0 A1 A1 A1 A1 A2 A2 A2 A3 A3 A3 A3 A3 A4 A4 A4 A4 A4 A5 A5 A5 A5 A10 A10 A10 A11 A11 A11 A12 A12 A12 A14 A14 A15 A16 AWS1 AWS1 NW1 NW1 NW1 NW2 NW2 NW3 NW3 Nominal Refracted Beam Angle (in Steel) 0 LW 45 SW 60 SW 0 LW 45 SW 60 SW 0 LW 60 SW 60 LW 45 SW 0 LW 60 LW 55 SW 0 LW 45 SW 45 LW 60 SW 60 LW 0 LW 45 SW 45 LW 60 SW 60 LW 0 LW 45 SW 60 SW 60 LW 0 LW 55 SW 60 LW 0 LW 55 SW 60 LW 0 LW 55 SW 60 LW 0 LW 55 SW 60 LW 55 SW 60 SW 0 LW 0 LW 0 LW 0 LW 0 LW 0 LW 0 LW 0 LW Recommended Sweep () 30 to 30 30 to 60 45 to 70 30 to 30 30 to 60 45 to 70 30 to 30 30 to 70 45 to 70 30 to 30 30 to 30 30 to 70 30 to 70 30 to 30 30 to 60 30 to 60 45 to 70 45 to 70 30 to 30 30 to 60 30 to 60 45 to 70 45 to 70 30 to 30 30 to 60 45 to 70 45 to 70 30 to 30 30 to 70 30 to 70 30 to 30 30 to 70 30 to 70 30 to 30 30 to 70 30 to 70 30 to 30 30 to 70 35 to 70 30 to 70 45 to 70 -30 to 30 N/A N/A N/A N/A N/A N/A N/A Probe Orientation Normal Normal Normal Normal Normal Normal Normal Normal Normal Lateral Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Wedge Dimensions (mm) L 16 21 21 23 32 32 29 30 28 45 65 79 69 38 55 55 58 53 59 90 88 86 83 38 57 46 39 25 23 26 35 41 43 62 58 61 80 96 18 85 45 38 66 66 66 26 26 130 130 W 12 12 14 12 18 18 30 30 30 35 30 30 30 37 37 37 37 37 47 47 47 47 47 45 47 43 50 23 23 23 23 23 23 23 23 23 23 23 22 31 38 38 32 32 32 32 32 32 32 W* N/A N/A N/A N/A N/A N/A 10 40 40 45 40 40 40 50 50 50 50 50 55 55 55 55 55 55 55 55 55 40 40 40 40 40 40 40 40 40 40 40 N/A 40 N/A N/A 32 32 32 32 32 32 32 H 12 13 13 11 20 21 20 16 21 27 20 50 43 20 30 49 32 40 20 51 85 45 68 20 37 25 41 20 14 30 23 29 53 20 23 53 20 49 12 44 32 40 22 22 22 22 22 22 22
17

Part Number SPWZ1-0L SPWZ1-N55S SPWZ3-0L SPWZ3-N55S SPWZ3-N60L


*: Width with IHC wedge option

Item Number U8700336 U8700338 U8700361 U8700365 U8721399

Probe Type PWZ1 PWZ1 PWZ3 PWZ3 PWZ3

Nominal Refracted Beam Angle (in Steel) 0 LW 55 SW 0 LW 55 SW 60 LW

Recommended Sweep () -30 to 30 30 to 70 -30 to 30 30 to 70 45 to 70

Probe Orientation Normal Normal Normal Normal Normal

Wedge Dimensions (mm) L 75 87 40 65 64 W 30 30 30 30 30 W* 40 40 40 40 40 H 20 45 20 38 35

L
W

L W

SA00-N60S

SA0-0L

SPWZ1-N55S-IHC

Standard AOD Wedge Curvature Values


External Pipe Diameter in. Curvature Range Minimum mm (in.) Maximum mm (in.) External Pipe Diameter in. 3.5 4 4.5 5.563 6.625 8.625 10.75 12.75 Flat 2 2.25 2.5 3 3.5 4 5 6 8 12 16 60.3 (2.375) 73.0 (2.875) 22 Flat Curvature Range Minimum mm (in.) 73.0 (2.875) 88.9 (3.5) 101.6 (4) 114.3 (4.5) 141.3 (5.563) 168.3 (6.625) 219.0 (8.625) 273.0 (10.75) 323.8 (12.75) 44.4 (1.75) 50.8 (2) 57.1 (2.25) 63.5 (2.5) 76.2 (3) 88.9 (3.5) 101.6 (4) 127.0 (5) 152.4 (6) 203.2 (8) 304.8 (12) 406.4 (16) 555.8 (22) Maximum mm (in.) 88.9 (3.5) 101.6 (4) 114.3 (4.5) 141.3 (5.563) 168.3 (6.625) 219.0 (8.625) 273.0 (10.75) 323.8 (12.75) up to flat 50.8 (2) 51.7 (2.25) 63.5 (2.5) 76.2 (3) 88.9 (3.5) 101.6 (4) 127.0 (5) 152.4 (6) 203.2 (8) 304.8 (12) 406.4 (16) 558.8 (22) up to flat

Wedge Type: SA1, SA2, SA3, SA4, SA5, SPWZ1, SPWZ3, SI1, SI2, SI3
2 2.25 2.5 3 3.25 3.5 4 4.5 5 6 7 8 10 12 16 22 30 Flat 2.375 2.875
18

45.7 (1.8) 50.8 (2) 57.1 (2.25) 63.5 (2.5) 76.2 (3) 82.5 (3.25) 88.9 (3.5) 101.6 (4) 114.3 (4.5) 127.0 (5) 152.4 (6) 177.8 (7) 203.2 (8) 254.0 (10) 304.8 (12) 406.4 (16) 558.8 (22) 762.0 (30) 50.8 (2) 60.3 (2.375)

50.8 (2) 57.1 (2.25) 63.5 (2.5) 76.2 (3) 82.5 (3.25) 88.9 (3.5) 101.6 (4) 114.3 (4.5) 127.0 (5) 152.4 (6) 177.8 (7) 203.2 (8) 254.0 (10) 304.8 (12) 406.4 (16) 555.8 (22) 762.0 (30) up to flat

Wedge Type: ST and SPE

Wedge Type: SA10, SA11, SA12, SA14

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Immersion Corner Wedges for Curved Array Probes

SR1-I81-ADJ

SR4-IE90-ADJ

Advantages
Available in specific radius and angle and also with adjustable radius to fit on various components to be inspected Wedges are designed to perform manual scans. Designed to be used with the Mini-Wheel encoder

Numbering System Used to Order Wedges for Curved Array Probes

SR1-I90-0.125
Wedge type Inspection type Radius Angle of inspected part

Glossary Used to Order Wedges


Wedge type
SR1 = wedge for curved probe type R1 SR4 = wedge for curved probe type R4 SR5 = wedge for curved probe type R5 Inspection type I = internal E = external

Angle of inspected part ()


81 = 81 90 = 90 98 = 98 Custom angles can be ordered.

Radius

Radius in in. ADJ = adjustable radius Note: Not all angles or radii are available, as such, many angle and radii combinations are not available. Please consult your Olympus representative to discuss your specific application.

Wedge Specifications and Dimensions


Part Number SR1-I81-ADJ SR1-I90-ADJ SR1-I98-ADJ SR4-IE90-ADJ Item Number U8720659 U8720638 U8720660 U8720608 Probe Type R1 R1 R1 R4 Angle of the Inspected Part () 81 90 98 90 Radius Range mm (in.) 4 to 14 3 to 14 3 to 13 3 to 20 (0.16 to 0.55) (0.12 to 0.55) (0.12 to 0.51) (0.12 to 0.79) Inspection Type ID ID ID OD/ID
19

Wedge Offset Parameters

Angle

Center of first element

H
Z X XT Y

A Wedge Specification Sheet is provided with every wedge. This sheet presents the wedge offset parameters of a phased array probes first element for both OmniScan and TomoView software. It is important to note that the values given are only applicable for the wedge and probe combinations listed.
Olympus NDT Canada 505, boul. du Parc-Technologique Qubec (Qubec) G1P4S9 Canada Web site: Tel.: 1-418-872-1155 Fax: 1-418-872-5431 www.olympus-ims.com

Wedge parameters with OmniScan


X Y Z Primary offset Secondary offset (0 when probe is centered) Height

Wedge parameters with TomoView


XT Y Z Primary axis offset of the middle of the first element (mm) Secondary axis offset of the middle of the first element (mm) (measured from the side of the wedge) Height at the middle of the first element (mm)

Wedge Speci cation Sheet


Wedge: Pr obe:
SA1-N60S-IHC 2L16-A1,5L16-A1 AND 10L32-A1

OmniScan Wedge Parameters

Wedge Parameters
Model Wedge Angle Serial Number SA1-N60S-IHC Orientation Normal Sec. Offset 0,00

Velocity 2330,00 Height 5,00

Close Browse New Edit Manage Save


39,00 Angle:
(deg)

39,00 Pri. Offset mm -27,30

m/s mm

How to Find the Wedge Parameters


1. Find the appropriate wedge in either the OmniScan or TomoView Wedge Database. Parameters are automatically set once the wedge model is chosen. 2. If the wedge is not already in the database, you may download the latest database update from the Service & Support section of www.olympus-ims.com. 3. Enter the parameters manually using the values provided on the Wedge Specification Sheet accompanying the wedge. 4. Call your local sales representative.

mm

Normal Orientation:

2330,00 Velocity:
(m s)

-27,30 Pri. Offset:


(mm)

0,00 Sec. Offset:


(mm)

5,00 Height:
(mm)

TomoView Wedge Parameters Wedge


SA1-N60S-IHC
Footprint Wedge angle (deg) Roof angle (deg) Sound velocity (m/s) Height at the middle of the first element (mm) Primary axis offset of the middle of the first element (mm) Secondary axis offset of the middle of the first element (mm) Primary axis position of wedge reference (mm) Secondary axis position of wedge reference (mm) Wedge length (mm) Wedge width (mm)

Flat

39,000 0,000 2330,00 5,000 3,000 20,000 -30,300 -20,000 30,300 40,000

Note that if the word reverse appears on the header of the Wedge Specification Sheet, it means that the probe is mounted backwards on the wedge.

20

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Probe Options and Spare Parts


OL OmniScan Connector
Additional conventional UT channel (LEMO 00 connector) directly on the OmniScan Connector of the phased array probe Allows simultaneous or alternate use of phased array and pulse-echo using a single setup. To order this option, for the Instrument Connector code of the extension cable part number, replace OM with OL.

Metal Armor Outer


Offers mechanical protection against cut, wear, and harsh environments Available for most standard probes and extension cables

PA Probe Connector Spare Parts Kit


P/N: PAPROBE-SP-KIT01 [U8901867]
3

Spare parts kit consists of: 1. 2. 3. 4. 5. M2, 6 mm screws (6) Gasket (1) M1.6, 8 mm screws (2), M1.6, 4 mm screws (2) Spring and nylon insert (2) M3 captive thumbscrews (2)

Wedge Options
Basic
Designed for manual inspection using gel couplant or water (not fed from an irrigation system).

IHC (irrigation, holes, and carbides)


Same as Basic but with irrigation, scanner yoke attachment points, and four adjustable carbide wear pins.

New removable IHC ring for SA10, SA11, SA12, and SA14 wedges offers great flexibility.

21

WP
The water pocket option adds a shallow cavity at the base of the wedge to improve the quality of coupling by restricting the flow of couplant. WP option offers irrigation and scanner yoke attachment points. This option is only available for SNW wedges.

0,113 mm (0.005 in.)

A1 and A2 Legacy Probe Specifications and Dimensions


Part Number 2.25L16-A1 5L16-A1 10L32-A1 2.25L64-A2 5L64-A2 10L64-A2 Item Number U8330624 U8330070 U8330633 U8330580 U8330072 U8330658 Frequency (MHz) 2.25 5.0 10.0 2.25 5.0 10.0

Number of Elements 16 16 32 64 64 64

Pitch (mm) 0.75 0.60 0.31 0.75 0.60 0.60

Active Aperture (mm) 12.0 9.6 9.9 48.0 38.4 38.4

Elevation (mm) 12.0 10.0 7.0 12.0 10.0 7.0

External Dimensions mm (in.) L 17 (0.67) 17 (0.67) 17 (0.67) 53 (2.09) 53 (2.09) 53 (2.09) W 29 (1.14) 29 (1.14) 29 (1.14) 29 (1.14) 29 (1.14) 29 (1.14) H 25 (0.98) 25 (0.98) 25 (0.98) 35 (1.38) 35 (1.38) 35 (1.38)

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially fitted with other connectors and cable lengths.

A1 casing

5L16-A1

5L64-A2

L W

A2 casing

22

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Testing and Documentation


All Olympus phased array probes are rigorously tested to ensure conformance to the highest standards. An extensive database, containing characterization records for each probe sold, is maintained by Olympus. This information can be accessed to compare probe properties. If you have any special testing requirements, please contact Olympus.

Standard Test Form


A Probe Test Data Sheet is supplied with the purchase of any probe. This form presents the following information:
Olympus NDT Ultrasonic Transducers 60 Decibel Road, Suite 300, State College, PA 16801 USA Tel.: (1) (814) 689-1390 Fax: (1) (814) 689-1395
__________________________________________________________________________

Median Waveform
The median waveform graph displays a median pulse-echo response (typical) from the test target. Half of the return pulses from the probe elements will have a peak-peak voltage greater than (or equal to) this median element, and the other half will have a smaller value. Return pulse duration is shown on the horizontal axis (in microseconds) and amplitude is shown on the vertical axis (in V). The number of the median element is shown above the graph (in parentheses).

PROBE TEST DATA SHEET


Part Number: XAAB-0004 Description: ARRAY, 5-L-64-38.4X10-A2-P-2.5-OM Serial Number: D0259
Probe Information Summary ___________________________________________________________________________ Frequency : Probe Type : Element Count : 5.0 Mhz Linear Array 64 Housing : Cable Jacket : Cable Length : Connector Type : Active Area Dimensions Length : Elevation : 38.4 mm (1.51 in) 10.0 mm (0.39 in) Matching Medium : Rexolite Pitch : 0.60 mm (0.024 in) Angle Beam PVC 2.5 m (8.2 ft) Omniscan

Median Waveform FFT


The median waveform FFT graph shows the calculated spectrum for the median waveform (see above) over a range of zero MHz to twice the probes nominal frequency.
Pass Pass Pass [ [ [ ] ] ]

Probe Conformance Summary ___________________________________________________________________________ Parameter Measurement Specification Conformance ___________________________________________________________________________ Average Center Frequency (MHz) Average -6dB Bandwidth (%) Overall Vp-p Sensitivity (dB) Probe Cable Order Checked and Verified Probe Uncoupled Response Checked and Verified Probe Programmable Parameters Checked and Verified 5.03 Mhz 81.8 % 1.4 dB +/- 10.0% (band) > 60% (typical)

< 4.0dB (range)

6dB Center Frequency


The 6dB center frequency bar graph displays a calculated center-frequency value for each of the probes elements. This value is calculated by using the halfway point (in frequency) of an imaginary line intersecting a given elements spectrum (FFT) data at the 6db level. The average value of all the probes elements is displayed at the top of the graph.

Tester Signature __________________________ June 19, 2006

-6dB Center Freq., Avg = 5. MHz 5.6

Freq. (MHz)

6dB Percent Bandwidth


1 Elements -6dB % Bandwidth, Avg = 81.8 % 64

________________________________________ Part Number: XAAB-0004 Description: ARRAY, 5-L-64-38.4X10-A2-P-2.5-OM Serial Number: D0259

4.5

Median Waveform (Element 28) 0.5 100

-0.5 18 Time (us) Median Waveform FFT 0 Magnitude (dB) 19

50 1 Elements 64

Bandwidth (%)

Amplitude (V)

The 6dB percent bandwidth bar graph displays a calculated percent bandwidth value for each of the probes elements. This value is determined by using the length (in frequency) of an imaginary line intersecting a given elements spectrum (FFT) data at the 6db level and calculated as a percentage of the center frequency. The average value of all the probes elements is displayed at the top of the graph.

Pk-to-Pk Sensitivity, Avg = -45.9 dB 3.0 Magnitude (dB)

Peak-to-Peak Sensitivity
The peak-to-peak sensitivity bar graph displays a value for each of the probes elements, representing the sensitivity of the probe. This value is calculated by using the magnitude of the excitation (test) pulse sent to each element and the peak-to-peak voltage measurement of that elements pulse-echo return (from the test target). The reported value is 20 multiplied by the log of the ratio of these two magnitudes. The average value of all the probes elements is displayed at the top of the graph.

-48 0 Frequency (MHz) 10

-3.0 1 Elements 64

____________________________________________

AVG MAX MIN RANGE ______________________________ Center Frequency (MHz) -6dB Bandwidth (%) Vp-p Sensitivity (dB) -20dB Pulse Width (ns) -40dB Pulse Width (ns) 5.03 81.8 -45.9 355 765 5.08 83.4 -45.1 360 880 4.96 79.9 -46.5 346 678
Page 2 of 3

1.4

Pulse Width
The various pulse-width bar graphs display values representing the axial resolution of the elements pulse-echo returns at various levels, such as 20dB, 30dB and 40dB. These values are calculated by measuring the return pulses width (in nanoseconds) at the desired level. Axial resolution is an important measure of the ability to distinguish individual pulse returns from one another during a normal transducer operation. The average value of all the probes elements is displayed at the top of the graph.

R/D Tech Ultrasonic Transducers 60 Decibel Road, Suite 300, State College, PA 16801 USA Tel.: (1) (814) 689-1390 Fax: (1) (814) 689-1395

__________________________________________________________________________ Part Number: XAAB-0004 Description: ARRAY, 5-L-64-38.4X10-A2-P-2.5-OM Serial Number: D0259

Test Conditions
_________________
600

-20dB Pulse Width, Avg = 355 ns

Pulser Voltage : 70 V Pulse Width : 50 ns Primary Gain : 8 dB Secondary Gain : 37 dB Scope Delay : 18.7 us

Date : 6/19/2006 Time : 8:25:37 AM Pulse Type : Negative


Time (ns) 0 1 Elements -40dB Pulse Width, Avg = 765 ns 1600 64 Time (ns) 0 1

System : FOCUS

Scope Volts per Division : 0.127 V Test Medium : Testing on 2cm Rexolite Block

-30dB Pulse Width, Avg = 649 ns 1200

Time (ns) 0 1 Elements 64

Elements

64

Warranty Information

_____________________

R/D Tech Ultrasonic Transducers offers a one-year warranty on all the phased-array transducers sold by R/D Tech. These products are guaranteed against all defects in materials and manufacturing. All products covered by this warranty must be examined by R/D Tech Ultrasonic transducers and receive their approval in advance before any repairs or replacement are made. Any shipping costs are at the expense of the customer. The warranty excludes defects and deterioration due to normal wear and tear, or caused by an external accident such as: - Incorrect assembly - Poor maintenance - Incorrect usage including, but not limited to, the firing of the probe in air (WARNING : This will damage the probe) - Exposition to temperatures out of the range of -20 C to +60 C for storage or 10 C to 40 C for operation - Excessive voltage (max. 180 V for 7.5 Mhz and below, max. 100 V for 10 Mhz and above) - Use of unqualified couplant - Unforeseen modifications of the product Page 3 of 3

23

Training
Olympus has recently developed its unique Training Academy, which is a partnership with major training companies in an effort to offer comprehensive courses in phased array technology and applications. Courses range from a two-day Introduction to Phased Array program to an in-depth, two-week LevelII Phased Array course. In both cases, students experience practical training utilizing the portable OmniScan phased array unit. Courses lead either to recognized certification or to certificates of attendance. Courses are currently being offered at the training facilities of participating companies as well as at customer-determined locations worldwide. Customized courses can also be arranged. Check the latest course schedule at www.olympus-ims.com.

How to Order
For pricing or for further information, consult the ordering information outlined on page 7 and call your local sales representative. To locate the nearest Olympus office, please visit www.olympus-ims.com

Phased Array Testin


Basic Theory for ns Industrial Applicatio

Olympus has introduced the new Phased Array Testing field guide as a convenient resource for customers and anyone else interested in phased array technology. It is designed to be an easy-to follow introduction to ultrasonic phased array testing, both for newcomers and for more experienced users who wish to review basic principles. This guide begins by explaining what phased array testing is and how it works, then outlines some considerations for selecting probes and instruments, and concludes with further reference information and a Phased Array Glossary. This free field guide is available from your local sales representative. To locate the nearest Olympus office, please visit www.olympus-ims.com
s NDT Field Guide

is ISO 9001 and 14001 certified.

Shinjuku Monilith, 3-1Nishi-Shinjuku2-chome, Shinjuku-ku, Tokyo 163-0914, Japan, Tel: 81(0)3-6901-4039 48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-3900

www.olympus-ims.com
info@olympusNDT.com

Stock Road, Southend-on-Sea, Essex, SS2 5QH, UK, Tel.: (44) (0) 1702 616333 505, boul. du Parc-Technologique, Qubec (Qubec) G1P 4S9, Tel.: (1) 418-872-1155 31 Gilby Road, Mount Waverly, Victoria, 3149, Tel.: (61) 130-013-2992 Valley Point Office Tower, 248373, Tel: (65) 68-34-00-10 PA_Probe_Catalog_EN_201304 Printed in Canada Copyright 2010 by Olympus NDT. *All specifications are subject to change without notice. All brands are trademarks or registered trademarks of their respective owners and third party entities.

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