TY - JOUR T1 - One-shot dual-wavelength in-line digital holographic microscopy JF - Optics and Lasers in Engineering VL - 51 IS - 7 SP - 883 EP - 889 PY - 2013/// AU - Len-Rodrguez,

M. AU - Rodrguez-Vera, R. AU - Rayas, J.A. AU - Flores-Moreno, J.M. AD - Centro de Investigaciones en ptica, A.C. Loma del Bosque 115, C.P. 37150, L en-Guanajuato, Mexico AB - In this work, we propose a dual-wavelength in-line digital holographic mic roscopy (DHM) configuration in order to eliminate the conjugate image and reach the maximum resolution of CCD. By using this configuration, two holograms are ac quired in one shot. Our method is based not only on the recordings of two hologr ams at slightly different planes, but also on the diffraction patterns formed wi th two wavelengths. With this experimental setup, we are able to analyze fast dy namic processes at the microscopic scale in real time. Theoretical evaluation, c omputer simulations and experimental results validate our proposal. The experime ntal results are obtained using a phase-amplitude object and compared with those calculated from the well-established phase-shifting interferometry technique. A s far as we know, in-axis configuration with a single exposure has not been used in DHM, as we present in this paper. 2013 Elsevier Ltd. KW - Digital holographic microscopy (DHM) KW - Dual wavelength KW - Metrology KW - Microscopy KW - Phase-contrast imaging N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optlaseng.2013.02.005 N1 - Correspondence Address: Len-Rodrguez, M.; Centro de Investigaciones en ptica, A.C. Loma del Bosque 115, C.P. 37150, Len-Guanajuato, Mexico; email: migue@cio.m x UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84875759081&partnerID=4 0&md5=7b09e2751e66ae85c458625579c09b67 ER TY T1 T2 ad JF VL IS SP EP PY AU AU AU AU AD AD AD AD AB de JOUR A magnetic suspension system for measuring liquid density Desarrollo de un sistema de suspensin magntica para la determinacin de densid lquidos Ingenieria e Investigacion 33 1 46 51 2013/// Centeno, L.M. Castillo, E. Becerra, L.O. Rochin, A. Centro Nacional de Metrologa, Mexico CICATA, Instituto Politcnico Nacional, Mexico Centro Nacional de Metrologa, Mexico UNAM, Mexico Density is a derived quantity of mass and length; it is defined as mass pe

r volume unit and its SI unit is kg/m3. National metrology institutes have been designing and building their own magnetic suspension systems during the last 5 d ecades for making fluid density measurements; this has allowed them to carry out research into liquids and gases' physical characteristics. This paper was aimed at designing and developing a magnetic suspension system for a magnetic balance used in determining liquid density to be used in CENAM's metrology density labo ratories. KW - Density KW - Hydrostatic weighing KW - Magnetic suspension N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Centeno, L. M.; Centro Nacional de MetrologaMexico; email: lcenteno@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84875982885&partnerID=4 0&md5=f78f72528d79daa14d8ea37e21242ba1 ER TY - INPR T1 - Pulmonary function in ankylosing spondylitis: association with clinical va riables JF - Rheumatology International SP - 1 EP - 8 PY - 2013/// AU - Brambila-Tapia, A.J.L. AU - Rocha-Muoz, A.D. AU - Gonzalez-Lopez, L. AU - Vzquez-Del-Mercado, M. AU - Salazar-Pramo, M. AU - Dvalos-Rodrguez, I.P. AU - De la Cerda-Trujillo, L. AU - Diaz-Toscano, M.L. AU - Hernandez-Cuervo, P. AU - Diaz-Rizo, V. AU - Sanchez-Mosco, D. AU - Vazquez-Jimenez, J.C. AU - Cardona-Muoz, E.G. AU - Gamez-Nava, J.I. AD - Centro de Investigacin Biomdica de Occidente, Instituto Mexicano del Seguro Social (IMSS), Guadalajara, Mexico AD - Centro Universitario de Ciencias de la Salud (CUCS), Instituto de Gentica H umana, Universidad de Guadalajara, Guadalajara, Mexico AD - Programa Nacional de Post-doctorado del Consejo Nacional de Ciencia y Tecn ologa (CONACYT), Guadalajara, Mexico AD - Doctorado en Farmacologa, Centro Universitario de Ciencias de la Salud (CUC S), Universidad de Guadalajara, Guadalajara, Mexico AD - Hospital General Regional No. 110, Instituto Mexicano del Seguro Social (I MSS), Guadalajara, Mexico AD - Doctorado en Salud Pblica, Centro Universitario de Ciencias de la Salud (CU CS), Universidad de Guadalajara, Guadalajara, Mexico AD - Centro Universitario de Ciencias de la Salud (CUCS), Instituto de Investig acion en Reumatologia y de, Universidad de Guadalajara, Guadalajara, Mexico AD - Unidad de Investigacion en Epidemiologia Clinica, Hospital de Especialidad es Centro Medico Nacional, Instituto Mexicano del Seguro Social, Guadalajara, Me xico AD - Departamento de Fisiologa, Centro Universitario de Ciencias de la Salud, Un iversidad de Guadalajara, Guadalajara, Mexico AD - Centro Universitario de Investigacin Biomdica, Universidad de Colima, Colima , Mexico

AD - Salto del Agua 2192, Col. Jardines del Country, Guadalajara, CP. 44210, Me xico AB - To evaluate the association between pulmonary function and clinical variab les in ankylosing spondylitis (AS) and to compare the pulmonary function of pati ents with AS with that of healthy controls, 61 AS patients and 74 healthy contro ls were included. In AS, we assessed clinical disease indices (BASDAI, BASFI, BA SG), morning stiffness, number of hypersensitive entheses, metrology measures, 6 -min walking test, acute phase reactants, radiological presence of "bamboo spine ," and severity of radiological involvement in sacroiliac and vertebral joints. AS and healthy controls had similar age and gender. All the parameters of pulmon ary function were significantly diminished in AS than in healthy controls (p<0.001 ), with a higher proportion of restrictive pattern (57.4 vs. 5.4%). In AS, pulmon ary function correlated negatively with BASDAI, BASFI, BASG, morning stiffness, number of hypersensitive entheses, occiput-wall distance, and ESR, and positivel y with 6-min walking test. There was no association between pulmonary function w ith radiological stage of vertebral joints and sacroiliac joints, "bamboo spine, " disease duration, or chest expansion. A higher frequency of AS patients had a decreased pulmonary function and results of the 6-min walking test. These abnorm alities in AS were more related with disease activity than with mobility limitat ion. 2013 Springer-Verlag Berlin Heidelberg. KW - Anti-TNF agents KW - Disease activity KW - Functioning KW - Pulmonary function tests KW - Spondyloarthritis N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Article in Press N1 - :doi 10.1007/s00296-013-2723-2 N1 - Correspondence Address: Gamez-Nava, J.I.Salto del Agua 2192, Col. Jardines del Country, Guadalajara, CP. 44210, Jalisco, Mexico; email: drivangamez@prodig y.net.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84875293928&partnerID=4 0&md5=efc983c3f37f182c04bf20eb7f7666dd ER TY - CONF T1 - Aseguramiento metrolgico para equipos mdicos JF - IFMBE Proceedings VL - 33 IFMBE SP - 491 EP - 494 PY - 2013/// AU - Rodrguez-Denis, E.B. AD - Sociedad Cubana de Bioingeniera, SCB, La Habana, Cuba AD - Universidad Autnoma de Occidente, Cali, Colombia AB - Indubitably a serious commitment with the health services includes metrolo gical insurance, for the control and continuous improvement of the quality. The metrological insurance is the process that establishes unambiguously all which m ust be measured, as it must be measured and how good the measure must to be. Unf ortunately owing to different causes, that the author will not approach in this work, too much lending services institutions of health care are walking in field undermined regarding to the metrology. Some recommendations are suggested in th is work, based in the international standards in use, to the interested professi onals in the continuous quality's improvement, with emphasis in metrological ins urance and focused toward that the lending services unit of health must make. Al though, it will probably require some modification as standardized data gatherin g and gain working experience. This work pretends that this approach becomes gen erally accepted within the health care institutions. 2013 Springer. KW - Continuous improvements

KW - Data gathering KW - Health services KW - In-field KW - International standards KW - Health care N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/978-3-642-21198-0_126 N1 - Correspondence Address: Rodrguez-Denis, E.B.; Sociedad Cubana de Bioingenie ra, SCB, La Habana, Cuba UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84875254517&partnerID=4 0&md5=b2d6512f36591c36a8afc018b451d421 ER TY - JOUR T1 - In-plane displacement measurement in vortex metrology by synthetic network correlation fringes JF - Journal of the Optical Society of America A: Optics and Image Science, and Vision VL - 30 IS - 30 SP - 462 EP - 469 PY - 2013/// AU - Angel-Toro, L. AU - Sierra-Sosa, D. AU - Tebaldi, M. AU - Bolognini, N. AD - Grupo de ptica Aplicada, Departamento de Ciencias Bsicas, Universidad EAFIT, Medelln (7023), Colombia AD - Centro de Investigaciones pticas, CIOp, OPTIMO Departamento Ciencias Bsicas, Universidad Nacional de la Plata (UNLP), P.O. Box 3 (1987), M. B. Gonnet, Argen tina AD - Facultad de Ciencias Exactas, Universidad Nacional de la Plata, La Plata, Argentina AB - Recently we proposed an alternative method of displacement analysis in vor tex metrology, based on the application of the Fourier optics techniques, that i s suitable for an intermediate range of displacement measurements ranging below the resolution of speckle photography and above that of the conventional vortex metrology. However, for smaller displacements, we introduce an approach to perfo rm the Fourier analysis from vortex networks. In this work, we present an enhanc ed method for measuring uniform in-plane displacements, taking advantage of the capability of determining the subpixel locations of vortices and having the abil ity to track the homologous vortices onto a plane. It is shown that high-quality fringe systems can be synthesized and analyzed to accurately measure in an exte nded range of displacements and for highly decorrelated speckle patterns. Experi mental results supporting the validity of the method are presented and discussed . 2013 Optical Society of America. KW - Alternative methods KW - Displacement analysis KW - In-plane displacement KW - In-plane displacement measurement KW - Speckle patterns KW - Speckle Photography KW - Sub-pixel locations KW - Synthetic networks KW - Displacement measurement KW - Fourier analysis KW - Speckle KW - Units of measurement

KW - Vortex flow N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Angel-Toro, L.; Grupo de ptica Aplicada, Departamen to de Ciencias Bsicas, Universidad EAFIT, Medelln (7023), Colombia; email: langel@ eafit.edu.co UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84875533674&partnerID=4 0&md5=d2f06331c215eb87378f319874581a6b ER TY - JOUR T1 - Digital holographic microscopy through a Mirau interferometric objective JF - Optics and Lasers in Engineering VL - 51 IS - 3 SP - 240 EP - 245 PY - 2013/// AU - Len-Rodrguez, M. AU - Rodrguez-Vera, R. AU - Rayas, J.A. AU - Calixto, S. AD - Centro de Investigaciones en ptica, A.C. Loma del Bosque 115, Len, Guanajuat o, Mexico AB - Digital Holographic Microscopy (DHM) typically uses either Michelson or Ma ch-Zehnder interferometers as interferometric tools to attain digital holograms. These interferometers need not only good optical alignment in order to compensa te the spherical aberration, but also a special optical path difference compensa tion system when a low coherence illumination source is used. A Mirau interferom etric objective appears as an alternative to overcome these difficulties and ach ieve reduced quadratic aberration in DHM. We show experimental results of the fe asibility to perform DHM using this kind of objective; the tests conducted were in-line and off-axis configurations. In addition, we show not only the unique fe ature of the refocusing capability of DHM in a NBS 1963A resolution card showing its corresponding amplitude and phase images, but also a profile phase comparis on of a 4.2 m high micro lens using interferometry and DHM, extending the depth o f focus of the microscope objective as proof of the proposal. As far as we know, this device has not been used in DHM. 2012 Elsevier Ltd. KW - Digital holography microscopy (DHM) KW - Metrology KW - Microscopy KW - Phase-contrast imaging KW - Compensation systems KW - Depth of focus KW - Digital holograms KW - Digital holographic microscopy KW - Digital holography microscopies KW - Low coherence illumination KW - Michelson KW - Micro lens KW - Microscope objective KW - Off-axis KW - Optical alignments KW - Optical path difference KW - Phase comparison KW - Phase image KW - Phase-contrast imaging KW - Spherical aberrations KW - Unique features KW - Computer generated holography

KW - Measurements KW - Microscopic examination KW - Phase measurement KW - Interferometry N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optlaseng.2012.10.006 N1 - Correspondence Address: Len-Rodrguez, M.; Centro de Investigaciones en ptica, A.C. Loma del Bosque 115, Len, Guanajuato, Mexico; email: migue@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84870537235&partnerID=4 0&md5=d49b3a2020f8cabef09f3ca5c8ebbb00 ER TY - CONF T1 - Experience of primary surface alignment for the LMT using a laser tracker in a non-metrology environment JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8444 PY - 2012/// AU - Gale, D.M. AD - Laboratorio de Superficies Asfricas, Instituto Nacional de Astrofsica, ptica y Electrnica, Luis Enrique Erro 1, Tonantzintla, Puebla, CP72840, Mexico AB - The 50-metre Large Millimeter Telescope (LMT) successfully completed first light observations in June 2011, operating with an initial 32.5-metre diameter collecting area. This reduced-area primary surface consists of 84 reflector pane ls measuring approximately 3x5m. During the construction phase, individual panel s were assembled and adjusted to the specified rms surface error off-site, then installed and aligned on the antenna using a total station. Prior to first-light observations, panels were fine-tuned in piston, tip-tilt and twist using full-s urface holography measurements to direct the movement of electromechanical actua tors located at the four corners of each panel. In preparation for the next obse rving season the 32.5m primary is being refurbished and re-aligned on-site, usin g a commercial laser tracker for surface adjustment of each panel. For this task we have opted for the transfer of panels from the antenna surface to the telesc ope basement for adjustment, offering an enclosed environment with stable temper ature, followed by reinstallation and measurement on the open-air antenna surfac e at night. In this paper we present our experiences on the use of a laser track er to conduct panel surface measurement and adjustment on-site, at an isolated l ocation 4,700m (15,000ft) above sea level and in the absence of dedicated metrol ogy facilities. In section 2 we present the primary surface concept deployed at the LMT. Section 3 discusses the laser tracker equipment and data processing for panel surface measurement. Section 4 describes the panel adjustment process car ried out in the site basement and presents examples of indoor panel metrology us ing the laser tracker. In section 5, we present our experiences to date of openair measurement of panels installed on the antenna. Some conclusions are offered in section 6. 2012 SPIE. KW - Composite panels KW - Large Millimeter Telescope KW - Laser tracker KW - LMT KW - Reflector surface alignment KW - Rms surface error KW - Composite panels KW - Large Millimeter Telescope KW - Laser tracker KW - LMT KW - Reflector surfaces KW - Surface error KW - Airborne telescopes

KW - Alignment KW - Antennas KW - Buildings KW - Data processing KW - Electromechanical devices KW - Radio telescopes KW - Space telescopes KW - Surface measurement KW - Units of measurement KW - Lasers N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 844453 N1 - :doi 10.1117/12.926695 N1 - Correspondence Address: Gale, D.M.; Laboratorio de Superficies Asfricas, In stituto Nacional de Astrofsica, ptica y Electrnica, Luis Enrique Erro 1, Tonantzint la, Puebla, CP72840, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871758710&partnerID=4 0&md5=4b19b7f81b0515f1cd2ceae976f9d32d ER TY - CONF T1 - Dose received by occupationally exposed workers at a nuclear medicine depa rtment JF - AIP Conference Proceedings VL - 1494 SP - 73 EP - 75 PY - 2012/// AU - vila, O. AU - Snchez-Uribe, N.A. AU - Rodrguez-Laguna, A. AU - Medina, L.A. AU - Estrada, E. AU - Buenfil, A.E. AU - Brandan, M.E. AD - Instituto Nacional de Investigaciones Nucleares, AP 18-1027, 11801, DF, Me xico, Mexico AD - Facultad de Ciencias, Universidad Nacional Autnoma de Mxico, AP 70-542, 0451 0, DF, Mexico, Mexico AD - Instituto Nacional de Cancerologa (INCan), Av. San Fernando No.22, C.P. 140 80, Mexico, Mexico AD - Instituto de Fsica, Universidad Nacional Autnoma de Mxico, AP 20-364, 01000 D F, Mexico, Mexico AD - Unidad de Investigacin Biomdica en Cncer INCan-UNAM, Av. San Fernando No.22, C.P. 4080, Mexico, Mexico AB - Personal Dose Equivalent (PDE) values were determined for occupational exp osed workers (OEW) at the Nuclear Medicine Department (NMD) of "Instituto Nacion al de Cancerologa" (INCan), Mexico, using TLD-100 thermoluminescent dosemeters. O EW at NMD, INCan make use of radiopharmaceuticals for diagnosis and treatment of diseases. Radionuclides associated to a pharmaceutical compound used at this De partment are 131I, 18F, 68Ga, 99mTc, 111In and 11C with main gamma emission ener gies between 140 and 511 keV. Dosemeter calibration was performed at the metrolo gy department of "Instituto Nacional de Investigaciones Nucleares" (ININ), Mexic o. Every occupational worker used dark containers with three dosimeters which we re replaced monthly for a total of 5 periods. Additionally, control dosemeters w ere also placed at a site free of radioactive sources in order to determine the background radiation. Results were adjusted to find PDE/day and estimating annua l PDE values in the range between 2 mSv (background) and 9 mSv. The mean annual value is 3.51 mSv and the standard deviation SD is 0.78 mSv. Four of the 16 OEW

received annual doses higher than the average +1 SD (4.29 mSv). Results depend o n OEW daily activities and were consistent for each OEW for the 5 studied period s as well as with PDE values reported by the firm that performs the monthly serv ice. All obtained values are well within the established annual OEW dose limit s tated in the "Reglamento General de Seguridad Radiolgica", Mxico (50 mSv), as well as within the lower limit recommended by the "International Commission on Radia tion Protection" (ICRP), report no.60 (20 mSv). These results verify the adequat e compliance of the NMD at INCan, Mexico with the norms given by the national re gulatory commission. 2012 American Institute of Physics. KW - Nuclear medicine KW - Radiation Protection KW - Thermoluminescent Dosimetry N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1063/1.4764602 N1 - Correspondence Address: vila, O.; Instituto Nacional de Investigaciones Nuc leares, AP 18-1027, 11801, DF, Mexico, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84873681529&partnerID=4 0&md5=2a3128181b3e26d175ab619d91f550ce ER TY - JOUR T1 - An experimental study of process variables in turning operations of Ti-6Al -4V and Cr-Co spherical prostheses JF - International Journal of Advanced Manufacturing Technology VL - 63 IS - 9-12 SP - 887 EP - 902 PY - 2012/// AU - Abelln-Nebot, J.V. AU - Siller, H.R. AU - Vila, C. AU - Rodrguez, C.A. AD - Department of Industrial Systems Engineering and Design, Universitat Jaume I, Castelln de la Plana, 12071 Castelln, Spain AD - Centre for Innovation in Design and Technology, Tecnolgico de Monterrey, Mo nterrey 64700, Mexico AB - Abstract Ti-6Al-4V and Cr-Co alloys are extensively used in manufacturing prostheses due to their biocompatibility, high strength-to-weight ratio and high resistance to corrosion and wear. However, machining operations involving Ti-6A l-4V and Cr-Co alloys face a series of difficulties related to their low machina bility which complicate the process of controlling the quality levels required i n these parts. The main objective of this paper is to study the influence of cut ting parameters, machine tool control accuracy and metrology procedures on surfa ce roughness parameters and form errors in contouring operations of Ti-6Al-4V an d Cr-Co workpieces. The machining performance of the two biocompatible materials is compared, focusing the study on part quality at low feed per revolution and the stochastic nature of plastic deformations at this regime. The results showed a better surface roughness control for Ti-6Al-4V, whereas for Cr-Co alloys, the performance presents high variability. In the case of form errors (sphericity), contouring errors and metrology procedures are important factors to be consider ed for quality assurance. In addition, the study analyses the correlation of the machining performance with different sensor signals acquired from a low cost no n-intrusive multi-sensor, showing a high correlation of signals from acoustic em ission sensors and accelerometers in the machining of spherical features on Ti-6 Al-4V parts. The findings of this research work can be taken into account when d esigning prostheses components and planning their manufacturing processes. Spring er-Verlag London Limited 2012. KW - Cr-Co alloys

KW - Process parameters KW - Prostheses KW - Ti-6Al-4Valloys KW - Turning KW - Acoustic emission sensors KW - Contouring error KW - Contouring operations KW - Cutting parameters KW - Experimental studies KW - Form errors KW - High resistance KW - High variability KW - Low costs KW - Machine tool control KW - Machining operations KW - Machining performance KW - Manufacturing process KW - Multi sensor KW - Non-intrusive KW - Part quality KW - Process parameters KW - Process Variables KW - Quality levels KW - Sensor signals KW - Stochastic nature KW - Strength to weight ratio KW - Surface roughness control KW - Surface roughness parameters KW - Ti-6al-4v KW - Ti-6Al-4Valloys KW - Turning operations KW - Aluminum KW - Biocompatibility KW - Biological materials KW - Cobalt alloys KW - Errors KW - Prosthetics KW - Quality assurance KW - Sensors KW - Surface roughness KW - Titanium alloys KW - Turning KW - Units of measurement KW - Wear resistance KW - Process control N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s00170-012-3955-0 N1 - Correspondence Address: Siller, H.R.; Centre for Innovation in Design and Technology, Tecnolgico de Monterrey, Monterrey 64700, Mexico; email: hector.sille r@itesm.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84870056646&partnerID=4 0&md5=50837cba419b96d4f7f148710161d377 ER TY - JOUR T1 - Estimation of PSD shifts for high-resolution metrology of thickness microchanges with possible applications in vessel walls and biological membrane chara cterization JF - Sensors (Switzerland)

VL - 12 IS - 11 SP - 15394 EP - 15423 PY - 2012/// AU - Ramos, A. AU - Bazn, I. AU - Negreira, C. AU - Brum, J. AU - Gmez, T. AU - Cals, H. AU - Ruiz, A. AU - de la Rosa, J.M. AD - Laboratorio Seales, Sistemas y Tecnologas Ultrasnicas, Consejo Superior de In vestigaciones Cientficas (CSIC), 28006 Madrid, Spain AD - ESIME, Instituto Politcnico Nacional (IPN), 07738 Mxico DF, Mexico AD - Departamento de Materiales, Facultad de Ciencias, Universidad de la Republ ica, 11400 Montevideo, Uruguay AB - Achieving accurate measurements of inflammation levels in tissues or thick ness changes in biological membranes (e.g., amniotic sac, parietal pleura) and t hin biological walls (e.g., blood vessels) from outside the human body, is a pro mising research line in the medical area. It would provide a technical basis to study the options for early diagnosis of some serious diseases such as hypertens ion, atherosclerosis or tuberculosis. Nevertheless, achieving the aim of non-inv asive measurement of those scarcely-accessible parameters on patient internal ti ssues, currently presents many difficulties. The use of high-frequency ultrasoni c transducer systems appears to offer a possible solution. Previous studies usin g conventional ultrasonic imaging have shown this, but the spatial resolution wa s not sufficient so as to permit a thickness evaluation with clinical significan ce, which requires an accuracy of a few microns. In this paper a broadband ultra sonic technique, that was recently developed by the authors to address other non -invasive medical detection problems (by integrating a piezoelectric transducer into a spectral measuring system), is extended to our new objective; the aim is its application to the thickness measurement of sub-millimeter membranes or laye rs made of materials similar to some biological tissues (phantoms). The modeling and design rules of such a transducer system are described, and various methods of estimating overtones location in the power spectral density (PSD) are quanti tatively assessed with transducer signals acquired using piezoelectric systems a nd also generated from a multi-echo model. Their effects on the potential resolu tion of the proposed thickness measuring tool, and their capability to provide a ccuracies around the micron are studied in detail. Comparisons are made with typ ical tools for extracting spatial parameters in laminar samples from echo-wavefo rms acquired with ultrasonic transducers. Results of this advanced measurement s pectral tool are found to improve the performance of typical cross-correlation m ethods and provide reliable and high-resolution estimations. 2012 by the authors ; licensee MDPI, Basel, Switzerland. KW - High-resolution KW - Non-invasive estimation KW - PSD shifts KW - Spectral metrology KW - Systems integration KW - Transducer systems KW - Wall and membranes thickness N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.3390/s121115394 N1 - Correspondence Address: Ramos, A.; Laboratorio Seales, Sistemas y Tecnologas Ultrasnicas, Consejo Superior de Investigaciones Cientficas (CSIC), 28006 Madrid, Spain; email: aramos@ia.cetef.csic.es UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84870490976&partnerID=4

0&md5=f50efd9a32fd7f506d67c1dd440ba983 ER TY - JOUR T1 - Vortex metrology using Fourier analysis techniques: Vortex networks correl ation fringes JF - Applied Optics VL - 51 IS - 30 SP - 7411 EP - 7419 PY - 2012/// AU - Angel-Toro, L. AU - Sierra-Sosa, D. AU - Tebaldi, M. AU - Bolognini, N. AD - Grupo de ptica Aplicada, Departamento de Ciencias Bsicas, Universidad EAFIT, Medelln (7023), Colombia AD - Centro de Investigaciones pticas, Departamento Ciencias Bsicas, Universidad Nacional de la Plata (UNLP), P.O. Box 3 (1897), M.B. Gonnet, Argentina AD - Facultad de Ciencias Exactas, UNLP, La Plata, Argentina AB - In this work, we introduce an alternativemethod of analysis in vortexmetro logy based on the application of the Fourier optics techniques. The first part o f the procedure is conducted as is usual in vortexmetrology for uniformin-plane displacement determination. On the basis of two recorded intensity speckled dist ributions, corresponding to two states of a diffuser coherently illuminated, we numerically generate an analytical signal fromeach recorded intensity pattern by using a version of the Riesz integral transform. Then, fromeach analytical sign al, a two-dimensional pseudophase map is generated in which the vortices are loc ated and characterized in terms of their topological charges and their core's st ructural properties. The second part of the procedure allows obtaining Young's i nterference fringes when Fourier transforming the light passing through a diffra cting mask with multiple apertures at the locations of the homologous vortices. In fact, we use the Fourier transformas amathematical operation to compute the f ar-field diffraction intensity pattern corresponding to themultiaperture set. Ea ch aperture fromthe set is associatedwith a rectangular hole that coincides both in shape and size with a pixel from recorded images.We show that the fringe ana lysis can be conducted as in speckle photography in an extended range of displac ement measurements. Effects related with speckled decorrelation are also conside red. Our experimental results agree with those of speckle photography in the ran ge in which both techniques are applicable. 2012 Optical Society of America. KW - Analysis techniques KW - Analytical signals KW - Correlation fringes KW - Decorrelations KW - Extended range KW - Far-field diffraction KW - Fourier KW - Fringe analysis KW - Integral transform KW - Intensity patterns KW - Multiple apertures KW - Pseudo-phase KW - Rectangular holes KW - Shape and size KW - Speckle Photography KW - Topological charges KW - Two-state KW - Young's interference KW - Fourier analysis

KW - Integral equations KW - Photography KW - Signal analysis KW - Speckle KW - Vortex flow N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1364/AO.51.007411 N1 - Correspondence Address: Angel-Toro, L.; Grupo de ptica Aplicada, Departamen to de Ciencias Bsicas, Universidad EAFIT, Medelln (7023), Colombia; email: langel@ eafit.edu.co UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84868028803&partnerID=4 0&md5=76d4051421c5e18e6e5e005194c54e17 ER TY - CONF T1 - International time and frequency comparisons in real time: Recent results JF - CPEM Digest (Conference on Precision Electromagnetic Measurements) SP - 694 EP - 695 PY - 2012/// AU - Lpez-Romero, J.M. AU - Lombardi, M.A. AU - Diaz-Muoz, N. AU - De Carlos-Lpez, E. AD - CENAM, Centro Nacional de Metrologa, Mexico AD - NIST, National Institute of Standards and Technology, United States AB - Within the Sistema Interamericano de Metrologia (SIM) region, a time compa rison network, SIMTN, has been developed. The SIMTN continuously compares the ti me scales of SIM members and publishes measurement results in near real-time. Th e measurements are made with Global Positioning System (GPS) common-view and all -in-view techniques, and data are exchanged and published via the Internet every 10 minutes. As of January 2012, the time scales of national metrology institute s (NMIs) located in 17 nations have joined the SIMTN. The resources of these loc al time scales are combined to generate the SIM Time Scale (SIMT), which publish es new data every hour via the Internet. These hourly updates show the current t ime difference between SIMT and the local time scales maintained by each SIM NMI , known as SIMT(k). 2012 IEEE. KW - Clock comparison KW - time scales KW - Clock comparisons KW - Local time KW - Measurement results KW - National metrology institutes KW - Real time KW - Time comparison KW - Time- and frequency comparisons KW - Time-differences KW - Time-scales KW - Electromagnetism KW - Internet KW - Time measurement N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 6251119 N1 - :doi 10.1109/CPEM.2012.6251119 N1 - Correspondence Address: Lpez-Romero, J.M.; CENAM, Centro Nacional de Metrol ogaMexico; email: mauricio.lopez@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84866789798&partnerID=4

0&md5=743eba071343b7b341f45449c3a13a30 ER TY - CONF T1 - An international comparison of 50/60 Hz reactive power meter calibrations between NRC, NIST, CENAM, NIM, and KRISS JF - CPEM Digest (Conference on Precision Electromagnetic Measurements) SP - 205 EP - 206 PY - 2012/// AU - So, E. AU - Angelo, D. AU - Nelson, T. AU - Waltrip, B.C. AU - Campos, S. AU - Castruita, A. AU - Carranza, R. AU - Wang, L. AU - Li, M. AU - Lu, Z. AU - Park, Y.T. AU - Wijesinghe, W.M.S. AD - National Research Council of Canada, Canada AD - National Institute of Standards and Technology, United States AD - Centro Nacional de Metrologia, Mexico, Mexico AD - National Institute of Metrology, China AD - Korea Research Institute of Standard and Science, South Korea AB - A number of international comparisons of active power meter calibrations w ere conducted in the past. This paper addresses the international comparison of reactive power meter calibrations at 120 V, 5 A, 50/60 Hz, and power factors 0.5 lead/lag, and zero lead/lag, between 5 NMIs; 3 from the SIM metrology region (N RC, NIST, CENAM) and 2 from the APMP metrology region (NIM and KRISS). 2012 IEEE . KW - International comparison KW - reactive power meter calibrations KW - Active power KW - International comparison KW - Power factors KW - Electric power factor KW - Electromagnetism KW - Reactive power KW - Units of measurement KW - Calibration N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 6250873 N1 - :doi 10.1109/CPEM.2012.6250873 N1 - Correspondence Address: So, E.; National Research Council of CanadaCanada UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84866783525&partnerID=4 0&md5=1330afe837168ec5ee6c1f5005bc74cc ER TY T1 y JF VL IS SP EP - JOUR - Speckle decorrelation influence on measurements quality in vortex metrolog Optics Communications 285 21-22 4312 4316

PY - 2012/// AU - Angel-Toro, L. AU - Sierra-Sosa, D. AU - Tebaldi, M. AU - Bolognini, N. AD - Grupo de ptica Aplicada, Departamento de Ciencias Bsicas, Universidad EAFIT, Medelln, Colombia AD - Centro de Investigaciones pticas, CIOp (CONICET CIC), OPTIMO (Dpto. Ciencia s Bsicas, Facultad Ingeniera, UNLP), P.O. Box 3, 1987 M.B. Gonnet, Argentina AD - Facultad de Ciencias Exactas, UNLP, La Plata, Argentina AB - We study speckle decorrelation effects in connection with conventional vor tex metrology techniques. Our proposal is based on processing speckled images re corded by using two different experimental set-ups. In both schemes two laterall y displaced patterns are generated: one scheme allows for obtaining undecorrelat ed speckle distributions and the other for decorrelated ones. Vortex networks as sociated with speckle patterns are analyzed by employing the usual tools develop ed for vortex metrology. For each recorded image, a 2D pseudo-phase map is gener ated on the basis of the Reisz transform. Then the vortices are located, and par ameterized in terms of their topological charge, eccentricity, vorticity and ang les between the zero crossing lines from the real and the imaginary parts of the analytical signal. After tracking the homologous vortices onto the maps, the hi stograms corresponding to the coordinate displacements are analyzed. We show tha t histograms interpretation is prone to failure due to its high sensitivity to d ecorrelation. Experimental evidences are presented to support the restrictions i mposed by decorrelation of actual speckles due to uniform in-plane displacements . 2012 Elsevier B.V. All rights reserved. KW - Decorrelation KW - Fourier optics KW - Optical processing KW - Reisz transform KW - Speckle KW - Vortex metrology KW - Analytical signals KW - Decorrelations KW - Experimental evidence KW - High sensitivity KW - Imaginary parts KW - In-plane displacement KW - Optical processing KW - Parameterized KW - Pseudo-phase KW - Set-ups KW - Speckle decorrelation KW - Speckle distribution KW - Speckle patterns KW - Speckled images KW - Topological charges KW - Zero-crossings KW - Fourier optics KW - Graphic methods KW - Measurements KW - Speckle KW - Units of measurement KW - Vortex flow N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optcom.2012.07.021 N1 - Correspondence Address: Angel-Toro, L.; Grupo de ptica Aplicada, Departamen to de Ciencias Bsicas, Universidad EAFIT, Medelln, Colombia; email: langel@eafit.e

du.co UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84865695715&partnerID=4 0&md5=67e65ec5f059fd05ddf48f5f45d70aab ER TY - JOUR T1 - Analysis and synthesis of phase shifting algorithms based on linear system s theory JF - Optics and Lasers in Engineering VL - 50 IS - 8 SP - 1009 EP - 1014 PY - 2012/// AU - Servin, M. AU - Estrada, J.C. AD - Centro de Investigaciones en ptica A. C., 37150 Len Guanajuato, Mexico AB - We review and update a recently published formalism for the theory of line ar Phase Shifting Algorithms (PSAs) based on linear filtering (systems) theory, mainly using the Frequency Transfer Function (FTF). The FTF has been for decades the standard tool in Electrical Engineering to analyze and synthesize their lin ear systems. Given the well defined FTF approach (matured over the last century) , it clarifies, in our view, many not fully understood properties of PSAs. We pr esent easy formulae for the spectra of the PSAs (the FTF magnitude), their Signa l to Noise (S/N) power-ratio gain, their detuning robustness, and their harmonic rejection in terms of the FTF. This paper has more practical appeal than previo us publications by the same authors, hoping to enrich the understanding of this PSAs theory as applied to the analysis and synthesis of temporal interferometry algorithms in Optical Metrology. 2012 Elsevier Ltd. All rights reserved. KW - Digital interferometry KW - Optical metrology KW - Phase evaluation KW - Phase shifting interferometry KW - Analysis and synthesis KW - Detunings KW - Frequency transfer KW - Harmonic rejection KW - Linear filtering KW - Linear phase KW - Optical Metrology KW - Phase evaluation KW - Phase shifting Interferometry KW - Phase-shifting algorithm KW - Signal to noise KW - Standard tools KW - Electrical engineering KW - Interferometry KW - Linear systems KW - Phase shift KW - Algorithms N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optlaseng.2011.12.012 N1 - Correspondence Address: Servin, M.; Centro de Investigaciones en ptica A. C ., 37150 Len Guanajuato, Mexico; email: mservin@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84860674408&partnerID=4 0&md5=cdd1b628c07a45165c387beb3c32a0b0 ER TY - JOUR

T1 - 2D simultaneous phase unwrapping and filtering: A review and comparison JF - Optics and Lasers in Engineering VL - 50 IS - 8 SP - 1026 EP - 1029 PY - 2012/// AU - Estrada, J.C. AU - Servin, M. AU - Vargas, J. AD - Centro de Investigaciones en Optica A.C., Loma del Bosque 115, Col. Lomas del Campestre, 37150 Leon Guanajuato, Mexico AD - Biocomputing Unit, Centro Nacional de Biotecnologa-CSIC, C/Darwin 3, 28049 Cantoblanco, Madrid, Spain AB - In optical metrology, most phase demodulation methods recover the phase wr apped in the range [-,]. But actually the phase is a smooth surface that exceeds t his dynamic range. Therefore, it is necessary to use a phase unwrapping method t o recover the desired smooth phase surface. Here we show a performance between o ur Recursive Phase Unwrapping (RPU) system, the well known Goldstein branch-cut unwrapping method and the Regularized Phase Tracker (RPT). The RPU is a Infinite Impulse Response system that simultaneously unwraps and low-pass filters the wr apped phase. Unlike branch-cut methods, our RPU system does not need mark phase inconstancies for successfully unwrap the phase. We will see that the RPU is a n ovel practical, fast, and robust solution for the phase unwrapping problem in tw o-dimensions (2D). 2012 Elsevier Ltd. All rights reserved. KW - Fringe analysis KW - Image processing KW - Optical metrology KW - Phase unwrapping KW - Branch-cut method KW - Dynamic range KW - Fringe analysis KW - Infinite impulse response systems KW - Optical Metrology KW - Phase demodulation KW - Phase surface KW - Phase unwrapping KW - Phase unwrapping methods KW - Phase unwrapping problem KW - Robust solutions KW - Smooth surface KW - Image processing KW - Impulse response KW - Signal noise measurement N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optlaseng.2012.01.008 N1 - Correspondence Address: Estrada, J.C.; Centro de Investigaciones en Optica A.C., Loma del Bosque 115, Col. Lomas del Campestre, 37150 Leon Guanajuato, Mex ico; email: julio@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84860662038&partnerID=4 0&md5=b02884bdef8c9730f537e189f3298e11 ER TY T1 rison JF SP INPR Analysis of Thermal-Conductivity Measurement Data from International Compa of National Laboratories International Journal of Thermophysics 1

EP - 26 PY - 2012/// AU - Hay, B. AU - Zarr, R. AU - Stacey, C. AU - Lira-Cortes, L. AU - Hammerschmidt, U. AU - Sokolov, N. AU - Zhang, J. AU - Filtz, J.-R. AU - Fleurence, N. AD - Scientific and Industrial Metrology Centre, Laboratoire National de Mtrolog ie et d'Essais, 1 Rue Gaston Boissier, Paris, 75015, France AD - Engineering Laboratory, National Institute of Standards and Technology, 10 0 Bureau Drive, Gaithersburg, 20899-8632, United States AD - Thermal Performance Group, Materials Division, National Physical Laborator y, Teddington, Middlesex, TW11 0LW, United Kingdom AD - Centro Nacional de Metrologa, rea Elctrica, Division de Termometra, Km 4,5 Car retera a los Cues, El Marques, Quertaro, C.P. 76241, Mexico AD - Physikalisch-Technische Bundesanstalt, AG 1.74, Bundesallee 100, Braunschw eig, 38116, Germany AD - D.I. Mendeleyev Institute for Metrology, Moskovsky Prospect 19, St. Peters burg, 190005, Russian Federation AD - Heat Division, National Institute of Metrology, Bei San Huan Dong Lu 18, B eijing, 100013, China AB - For the first time under the auspices of the Bureau International des Poid s et Mesures (BIPM), seven national metrology institutes (NMIs) participated in an international interlaboratory comparison on thermal-conductivity measurements by the guarded hot-plate method. Measurements were conducted successively by al l participants on the same set of specimens of insulating materials (mineral woo l and expanded polystyrene) at temperatures ranging from 10C to 40C, according to th e International Standard ISO 8302. This protocol aims to minimize issues of mate rial variability by circulating the same pairs of specimens among the laboratori es following the strict format of a round-robin test program. This comparison is a pilot study which is intended as a first stage for future key comparisons bet ween NMIs. The descriptive analysis of obtained results shows good agreement bet ween laboratories for the mineral wool (MW) specimens and the thicker specimens of expanded polystyrene (EPS), with relative deviations within the uncertainties of measurement. A positive drift of thermal-conductivity values, which has appe ared progressively during the comparison process, seems to be correlated with th e size of the metering area of the guarded hot plates used. A statistical analys is was applied to repeated thermal-conductivity measurements at 23C, to identify a nomalous and outlying data, to assess the within- and between-laboratory variabi lity, and to evaluate the participant laboratories' performance. 2012 Springer S cience+Business Media, LLC. KW - Guarded hot plate KW - Insulating materials KW - Interlaboratory comparison KW - Thermal conductivity N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Article in Press N1 - :doi 10.1007/s10765-012-1225-x N1 - Correspondence Address: Hay, B.; Scientific and Industrial Metrology Centr e, Laboratoire National de Mtrologie et d'Essais, 1 Rue Gaston Boissier, Paris, 7 5015, France; email: bruno.hay@lne.fr UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84862226459&partnerID=4 0&md5=9521421ad6bea223b3c63a878bcac6be ER -

TY - JOUR T1 - Allan deviation analysis of financial return series JF - Physica A: Statistical Mechanics and its Applications VL - 391 IS - 9 SP - 2883 EP - 2888 PY - 2012/// AU - Hernndez-Prez, R. AD - SATMEX, CONTEL Edif, Av. de las Telecomunicaciones S/N, SGA-II, Mxico, D.F. 09310, Mexico AB - We perform a scaling analysis for the return series of different financial assets applying the Allan deviation (ADEV), which is used in the time and frequ ency metrology to characterize quantitatively the stability of frequency standar ds since it has demonstrated to be a robust quantity to analyze fluctuations of non-stationary time series for different observation intervals. The data used ar e opening price daily series for assets from different markets during a time spa n of around ten years. We found that the ADEV results for the return series at s hort scales resemble those expected for an uncorrelated series, consistent with the efficient market hypothesis. On the other hand, the ADEV results for absolut e return series for short scales (first one or two decades) decrease following a pproximately a scaling relation up to a point that is different for almost each asset, after which the ADEV deviates from scaling, which suggests that the prese nce of clustering, long-range dependence and non-stationarity signatures in the series drive the results for large observation intervals. 2012 Elsevier B.V. All rights reserved. KW - Allan deviation KW - Econophysics KW - Scaling in financial time series KW - Allan deviation KW - Econophysicss KW - Efficient market hypothesis KW - Financial assets KW - Financial returns KW - Frequency metrology KW - Long range dependence KW - Non-stationarities KW - Non-stationary time series KW - Observation interval KW - Scaling analysis KW - Scaling in financial time series KW - Scaling relations KW - Time span KW - Financial data processing KW - Frequency standards KW - Time series analysis N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.physa.2012.01.005 N1 - Correspondence Address: Hernndez-Prez, R.; SATMEX, CONTEL Edif, Av. de las T elecomunicaciones S/N, SGA-II, Mxico, D.F. 09310, Mexico; email: ricardohdzpz@gma il.com UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84857189712&partnerID=4 0&md5=ec0ed99a0845855727e0ec8de13d0bb5 ER TY - CONF T1 - Influence of losses induced by macrobends in the supercontinuum generation using standard fiber JF - Proceedings of SPIE - The International Society for Optical Engineering

VL - 8240 PY - 2012/// AU - Rojas-Laguna, R. AU - Estudillo-Ayala, J.M. AU - Mata-Chvez, R.I. AU - Vargas-Rodrguez, E. AU - Sierra-Hernndez, M. AU - Andrade-Lucio, J.A. AU - Rodrguez-Ramrez, C.O. AD - Universidad de Guanajuato, Campus Irapuato-Salamanca, Comunidad de Palo Bl anco, Carretera Salamanca-Valle de Santiago km 3.5 + 1.8, Salamanca, Gto., C.P. 36885, Mexico AD - Universidad Politcnica de San Luis Potosi, Av. Urbano Villaln 500, S.L.P., C .P. 78363, Mexico AB - Supercontinuum generation is being widely studied due to its applications in communications, medicine and metrology. Usually, special fibers, such as phot onic crystal fibers and dispersion-shifted fiber, have been utilized. However, t here is few information about the potential use of standard fiber with this purp ose, which shows some advantages: low cost and availability. In this work, the i nfluence of losses due to induced macrobends on the supercontinuum generation us ing standard fiber was studied. The losses were introduced by wrapping 30 m in l ength of standard fiber on cylinders with different diameter, a nanosecond micro chip laser and 1064 nm of wavelength were employed. The continuum was recorded a t the fiber output by using an optical spectrum analyzer and its dynamics was an alyzed by tuning the launched power. In a first stage, the fiber was used withou t bends generating strong firs-order Raman Stokes and a supercontinuum spectrum of 636 nm. When the fiber was wrapped in a cylinder of 0.9 cm of diameter to ind uce macrobends, the Raman Stokes of high order were attenuated and the output sp ectrum was reduced to 240 nm. Also, a peak pulse was observed, around 1030 nm, t hat means new frequencies were generated in the near infrared region. Thus, indu ced macrobends affect the supercontinuum broadening. 2012 SPIE. KW - Bending loss KW - Nonlinear optics KW - Single-mode fiber KW - Supercontinuum KW - 1064 nm KW - Bending loss KW - Dispersion shifted fibers KW - High order KW - Launched power KW - Low costs KW - Microchip lasers KW - Near infrared region KW - Optical spectrum analyzer KW - Output spectrum KW - Peak pulse KW - Raman Stokes KW - Special fibers KW - Standard fibers KW - Supercontinuum KW - Supercontinuum spectra KW - Cylinders (shapes) KW - Dispersions KW - Nonlinear optics KW - Photonic crystal fibers KW - Single mode fibers KW - Spectrum analyzers KW - Supercontinuum generation KW - Fibers N1 - Export Date: 26 April 2013

N1 - Source: Scopus N1 - Art. No.: 82401M N1 - :doi 10.1117/12.908907 N1 - Correspondence Address: Rojas-Laguna, R.; Universidad de Guanajuato, Campu s Irapuato-Salamanca, Comunidad de Palo Blanco, Carretera Salamanca-Valle de San tiago km 3.5 + 1.8, Salamanca, Gto., C.P. 36885, Mexico; email: rlaguna@ugto.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84859707012&partnerID=4 0&md5=aa67da0a04e7fbd607b9705c9cac8432 ER TY - JOUR T1 - Clinical efficacy of etanercept versus sulfasalazine in ankylosing spondyl itis subjects with peripheral joint involvement JF - Journal of Rheumatology VL - 39 IS - 4 SP - 836 EP - 840 PY - 2012/// AU - Braun, J. AU - Pavelka, K. AU - Ramos-Remus, C. AU - Dimic, A. AU - Vlahos, B. AU - Freundlich, B. AU - Koenig, A.S. AD - Ruhr University Bochum, Charit Medical University, Bochum, Germany AD - Institute of Rheumatology, Prague, Czech Republic AD - Unidad de Investigacion en Enfermedades Cronico Degenerativas, Guadalajara , Mexico AD - Rheumatology Institut, Niska Banja, Serbia AD - Inflammation and Immunology, Pfizer Inc., Collegeville, PA, United States AD - Wyeth, United States AB - Objective. Etanercept, a fully human tumor necrosis factor soluble recepto r, is effective in treatment of ankylosing spondylitis (AS). Current guidelines suggest sulfasalazine (SSZ) treatment as initial therapy for the management of p atients with AS with peripheral arthritis versus therapy with biologics. We comp ared the efficacy of etanercept with SSZ in patients with AS with peripheral joi nt involvement. Methods. The efficacy of etanercept 50 mg once weekly was compar ed with that of SSZ up to 3 g daily in subjects with 1 swollen peripheral joint at baseline, using data from a 16-week randomized double-blind study in subjects with AS. Efficacy was assessed by the Assessment in AS criteria and the Bath AS Disease Activity, Functional, and Metrology indices. The last observation carri ed forward method was used for imputation of missing values. Results. Of 566 sub jects included in original study, 181 (etanercept 121; SSZ 60) had 1 swollen per ipheral joint and 364 (etanercept 250; SSZ 124) had none at baseline. AS patient s treated with etanercept showed significantly greater improvement than those tr eated with SSZ in all joint assessments regardless of swollen joint involvement. Conclusion. In this analysis, etanercept was significantly more effective than SSZ for management of patients with AS and peripheral joint involvement. The Jou rnal of Rheumatology Copyright 2012. All rights reserved. KW - Ankylosing spondylitis KW - Disease management KW - Disease-modifying antirheumatic drugs KW - Etanercept KW - Sulfasalazine KW - Tumor necrosis factor- KW - etanercept KW - salazosulfapyridine KW - adult

KW - ankylosing spondylitis KW - article KW - controlled study KW - disease association KW - double blind procedure KW - drug efficacy KW - drug response KW - female KW - human KW - intention to treat analysis KW - intermethod comparison KW - joint swelling KW - major clinical study KW - male KW - outcome assessment KW - priority journal KW - randomized controlled trial KW - remission KW - syndrome delineation KW - Adult KW - Antirheumatic Agents KW - Arthritis KW - Double-Blind Method KW - Female KW - Humans KW - Immunoglobulin G KW - Male KW - Receptors, Tumor Necrosis Factor KW - Spondylitis, Ankylosing KW - Sulfasalazine N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.3899/jrheum.110885 N1 - Correspondence Address: Koenig, A.S.; Inflammation Disease Area, Specialty Care Business Unit, Pfizer Inc., 500 Arcola Road, Collegeville, PA 19422, Unite d States; email: Andrew.Koenig@pfizer.com UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84859466376&partnerID=4 0&md5=6193111c9bb14ac3eedec3555e066828 ER TY - CONF T1 - A novel ionization chamber for high doses at industrial gamma irradiation facilities JF - IEEE Nuclear Science Symposium Conference Record SP - 1811 EP - 1813 PY - 2012/// AU - Ramrez-Jimnez, F.J. AU - Alcntara Prez, Y.B. AD - Instituto Nacional de Investigaciones Nucleares, Departamento de Sistemas Electrnicos, Carretera Mxico-Toluca S/N, Ocoyoacac, 52750, Estado de Mxico, Mexico AD - Instituto Politcnico Nacional, Mxico, D. F., Mexico AB - This work presents the design of an ionization chamber with cylindrical ge ometry for measuring high doses of gamma radiation at industrial irradiation fac ilities. A novel geometry for the collector electrode to optimize the ion collec tion is suggested. This chamber is used to provide an alternative mean for dosim etry studies in the gamma irradiation plant, because with the proposed measuring system, we can know the dose rate at all the points and the dose during all the irradiation process. A prototype was tested and calibrated with 137Cs and 60Co radioactive sources in the Ionizing Radiation Metrology Laboratory of ININ and f

inally tested in the gamma irradiation plant at ININ. 2011 IEEE. KW - Cylindrical geometry KW - Dose rate KW - Gamma irradiation KW - Gamma irradiation facility KW - High dose KW - Industrial irradiation KW - Ion collection KW - Irradiation process KW - Measuring systems KW - Radioactive sources KW - Cesium KW - Cylinders (shapes) KW - Ionization chambers KW - Ionizing radiation KW - Irradiation KW - Medical imaging KW - Nuclear physics KW - Gamma rays N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 6154689 N1 - :doi 10.1109/NSSMIC.2011.6154689 N1 - Correspondence Address: Ramrez-Jimnez, F.J.; Instituto Nacional de Investiga ciones Nucleares, Departamento de Sistemas Electrnicos, Carretera Mxico-Toluca S/N , Ocoyoacac, 52750, Estado de Mxico, Mexico; email: francisco.ramirez@inin.gob.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858634030&partnerID=4 0&md5=cf8ab45fc8add29a6a82905a7f487ec8 ER TY - JOUR T1 - Automated Clock Comparisons and Time Scale Generation in the SIM Region JF - Mapan - Journal of Metrology Society of India VL - 27 IS - 1 SP - 49 EP - 53 PY - 2012/// AU - Lpez-Romero, J.M. AU - Lombardi, M.A. AU - Daz-Muoz, N. AD - Time and Frequency Division, Centro Nacional de Metrologa, CENAM, Quertaro, Mexico AD - Time and Frequency Division, National Institute of Standards and Technolog y, NIST, Boulder, CO, United States AB - The second, the base unit of time interval in the International System, is defined in terms of the two hyperfine states of the Cesium atom ground-state en ergy level. This definition has so far served the metrology community well, and the uncertainty of the best realization of the second has improved by a rate of about one order of magnitude per decade over the past 50 years, reaching a curre nt level of a few parts in 10 16 [1]. This continual reduction in uncertainty ha s increased the level of performance expected from both time and frequency trans fer systems and from the time standards maintained by national metrology institu tes (NMIs). During recent years, an automated time comparison network has been d eveloped within the Sistema Interamericano de Metrologia (SIM), a regional metro logy organization. The SIM Time Network (SIMTN) allows NMIs to compare their tim e scales via the Global Positioning System common-view and all-in-view time tran sfer techniques, and makes results available through the Internet in near real t ime [2]. The SIMTN has proven to be robust and reliable, and the uncertainty of its comparisons is similar to the uncertainty of the key comparisons published b

y the Bureau International des Poids et Mesures in its monthly Circular T docume nt. The large number of geographically dispersed clocks measured by the SIMTN ma de it attractive to develop a SIM time scale (SIMT), which is computed in near r eal time and immediately made available to the general public via the Internet. This rapid computation allows contributing laboratories to easily monitor their time scales, and to quickly detect short term fluctuations in stability and accu racy. This paper discusses both the SIMTN and the SIMT, focusing primarily on th e SIMT algorithm and the results of its performance. 2012 Metrology Society of I ndia. KW - International comparisons KW - Time KW - Time scales KW - Time transfer N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s12647-012-0002-4 N1 - Correspondence Address: Lpez-Romero, J. M.; Time and Frequency Division, Ce ntro Nacional de Metrologa, CENAM, Quertaro, Mexico; email: jlopez@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84861459624&partnerID=4 0&md5=4cbe81539d9b88ecf70fd30ff5b13c36 ER TY - CONF T1 - Automatic re-calibration by laser metrology and computer algorithms JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8287 PY - 2011/// AU - Rodrguez, J.A.M. AU - Pedroza, E.F.V. AD - Centro de Investigaciones en Optica, A. C., Leon, Gto, 37150, Mexico AD - Universidad de Guadalajara, Centro Universitario de Los Lagos, Mexico AB - An automatic re-calibration for mobile vision is presented. In this techni que, the vision parameters are determined by means of a Bezier network. This pro cedure is carried out by image processing of a laser line. From the network stru cture, the initial calibration and the online re-calibration are performed. The proposed technique avoids calibrated references and physical measurements, which are used in traditional calibration. Thus, the proposed re-calibration improves the accuracy and performance of the mobile vision. This procedure represents a contribution in the re-calibration. To elucidate this contribution, an evaluatio n is performed based on the re-calibration methods. Also, the time processing is described. 2011 SPIE. KW - Bezier networks KW - Mobile vision KW - Re-calibration KW - Laser lines KW - Laser metrology KW - Mobile vision KW - Network structures KW - Physical measurement KW - Re-calibration KW - Recalibrations KW - Time processing KW - Traditional calibration KW - Algorithms KW - Image processing KW - Optical data processing KW - Calibration N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 828710

N1 - :doi 10.1117/12.913339 N1 - Correspondence Address: Rodrguez, J.A.M.; Centro de Investigaciones en Opti ca, A. C., Leon, Gto, 37150, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-82955225220&partnerID=4 0&md5=82629086726dab8592a46c851f93cf0a ER TY - CONF T1 - C-band optical fibers chromatic dispersion measurement at CENAM JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8287 PY - 2011/// AU - Ruz, Z.E. AU - Ayala, B.E. AU - Rosas, E. AU - Torres-Gmez, I. AU - Garca, C.H.M. AU - Huerta-Ruelas, J.A. AU - Arzate, N. AD - Divisin de ptica y Radiometra, Centro Nacional de Metrologa, km 4.5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico AD - Centro de Investigaciones en ptica, A. C., Loma del Bosque 115, Lomas del C ampestre, 37150, Len, Guanajuato, Mexico AD - CICATA Unidad Quertaro, Instituto Politcnico Nacional, Cerro Blanco 141, 760 90, Santiago de Quertaro, Quertaro, Mexico AB - Here we report on the first CENAM realization of the phase-shift method fo r chromatic dispersion measurements in mono-mode dispersion-shifted optical fibe rs used for the telecommunications C-band (1 530 nm to 1 565 nm). This chromatic dispersion measurement and calibration capability development at CENAM will pro vide the Mexican telecommunications industry with a formally established SI unit 's traceability source, thus enhancing this rapidly growing and high impact econ omic sector competitiveness in Mexico. We also identified a 40 MHz modulation fr equency, a 2.5 nm wavelength step and the 1 535 nm to 1 570 nm wavelength scanni ng range, as the optimum experimental parameters that have to be set in order to obtain experimental data which numerical Sellmeier polynomials fittings produce representative determinations for the group delay and the chromatic dispersion. We also obtained 1 549.388 nm 0.098 nm, for coverage factor k=1, for the zero d ispersion wavelength, and 0.719 7 psnm -2 0.005 5 ps nm -2, (k=1), for the zero d ispersion slope of the tested optical fiber. 2011 SPIE. KW - C-band telecommunications window KW - Chromatic dispersion KW - Fiber optics calibration services KW - Group velocity delay KW - Mono-mode fiber optics metrology KW - Primary Metrology KW - Zero dispersion wavelength KW - Calibration capabilities KW - Chromatic dispersion measurement KW - Coverage factors KW - Economic sectors KW - Experimental data KW - Experimental parameters KW - Fiber optics calibration services KW - Group velocity delay KW - High impact KW - Me-xico KW - Modulation frequencies KW - Mono-mode fiber optics metrology KW - Phase-shift method KW - Telecommunications industry

KW - Wavelength scanning KW - Zero dispersion KW - Zero-dispersion wavelength KW - Calibration KW - Chromatic dispersion KW - Competition KW - Dispersions KW - Fibers KW - Group delay KW - Metric system KW - Optical fibers KW - Optics KW - Telecommunication KW - Telecommunication industry KW - Dispersion (waves) N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 828707 N1 - :doi 10.1117/12.910299 N1 - Correspondence Address: Rosas, E.; Divisin de ptica y Radiometra, Centro Naci onal de Metrologa, km 4.5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico; e mail: erosas@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-82955225231&partnerID=4 0&md5=0bc0e11287b40fcbe5dc3dad87c3715c ER TY - CONF T1 - Radial slope measurements of transparent samples using phase shifting inte rferometry by polarization JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8287 PY - 2011/// AU - Serrano-Garca, D.-I. AU - Toto-Arellano, N.-I. AU - Martnez-Garca, A. AU - Rodrguez-Zurita, G. AD - Centro de Investigaciones en ptica A.C., Loma del Bosque #115, Len, Gto., Me xico AD - Laboratorio de Interferometra y Holografa, Benemrita Universidad Autnoma de Pu ebla, Fac. Ciencias Fsico-Matemticas, Av. Sn. Claudio y 18 Sur, C.P. 72570, Puebla , Mexico AB - We present experimental results obtained by using phase-shifting interfero metry by polarization to measure the radial slope of transparent samples, by imp lementing a Radial-Shear interferometer and using a grating to replicate the int erference patterns modulated by polarization; the interferometer is capable to p rocess the optical phase data by obtaining four interferograms in one-shot. The experimental results for transparent samples are presented in this research. 201 1 SPIE. KW - Interferometry KW - Metrology KW - Microscopy KW - Polarization KW - Radial slope, phase shift KW - Spatial filtering KW - Interference patterns KW - Interferograms KW - Optical phase KW - Phase shifting Interferometry KW - Slope measurement KW - Spatial filterings

KW - Interferometers KW - Measurements KW - Microscopic examination KW - Phase shift KW - Polarization KW - Interferometry N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 828714 N1 - :doi 10.1117/12.913547 N1 - Correspondence Address: Serrano-Garca, D.-I.; Centro de Investigaciones en p tica A.C., Loma del Bosque #115, Len, Gto., Mexico; email: david@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-82955201906&partnerID=4 0&md5=6987bb04568e33600e1168266af454ea ER TY - CONF T1 - Effective detection plane location uncertainty component in luxmeters cali bration JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8287 PY - 2011/// AU - Lpez-Ramrez, R. AU - Gonzlez-Galvn, L.P. AU - Estrada-Hernndez, A. AU - Rosas, E. AD - Divisin de ptica y Radiometra, Centro Nacional de Metrologa, km 4.5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico AB - Here we report on the estimation of the effective plane location uncertain ty component in commercially available luxmeters calibration as performed at the Laboratorio de Fotometra of the Centro Nacional de Metrologa of Mexico. The study was carried out by using a twelve luxmeters sample, comprising three of the mos t common detection heads shapes, and as a result we found 0.17 % as the highest uncertainty component value, which once combined to the typical luxmeters calibr ations uncertainty budget, fully agree with the 1 %, coverage factor k=2, illumi nance Calibration and Measurement Capability declared by Mexico to the Bureau In ternational des Poids et Mesures. 2011 SPIE. KW - Illuminance calibration services KW - Illuminance meter correction factor KW - Illuminance uncertainty budget KW - Luxmeter effective plane detection KW - Luxmeters calibration KW - Primary metrology KW - Primary photometry KW - Uncertainty estimation KW - Illuminance calibration services KW - Illuminance meter correction factor KW - Illuminance uncertainty budget KW - Plane detection KW - Uncertainty estimation KW - Budget control KW - Calibration KW - Lighting KW - Uncertainty analysis N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 828708 N1 - :doi 10.1117/12.910306 N1 - Correspondence Address: Rosas, E.; Divisin de ptica y Radiometra, Centro Naci onal de Metrologa, km 4.5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico; e

mail: erosas@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-82955243702&partnerID=4 0&md5=b7cdf617a9e8804e0f3ece7a4e4be1a4 ER TY - CONF T1 - Rigorous diffraction of Hermite-Gaussian beams by a double slit: TM polari zation case JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8287 PY - 2011/// AU - Enriquez-Leon, G. AU - Martinez-Flores, M.G. AU - Torres-Morales, G. AU - Sumaya-Martinez, J. AU - Lopez-Lopez, S. AD - Grupo de Optica, Facultad de Ciencias, Universidad Autonoma del Estado de Mexico, Instituto Literario 100, 50000, Toluca, Estado de Mexico, Mexico AD - Division de Tiempo y Frecuencia, Centro Nacional de Metrologia, km 4.5 Car retera a Los Cues, El Marques Queretaro. C.P. 76246, Mexico AB - A rigorous numerical analysis of the diffraction of finite-size Hermite-Ga ussian beams by two slits is presented. The case of TM (Transversal Magnetic) po larization and oblique incidence is considered. We assume the double slit is rul ed onto a metallic screen of non-zero thickness h, width and separation . Far-fie ld spectra and transmission coefficients are analyzed as a function of several o pto-geometrical parameters, i.e. the wavelength , slit width and separation . Part icular emphasis is put on the description of the energy diffracted along the inc ident direction E i because of its applications on optical-metrology. Finally, t he validity of a well known scalar property Ei = 2/ is studied within the vectoria l regime. 2011 SPIE. KW - Diffraction gratings KW - Diffraction theory KW - Double slit KW - Electromagnetic beams KW - Electromagnetic theory KW - Far-field spectra KW - Finitesize electromagnetic beams KW - HermiteGussian beams KW - Diffraction theory KW - Double slit KW - Electromagnetic beams KW - Electromagnetic theories KW - Far field spectra KW - HermiteGussian beams KW - Diffraction KW - Diffraction gratings KW - Electric fields KW - Electromagnetism KW - Numerical analysis KW - Polarization KW - Separation KW - Gaussian beams N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 82870R N1 - :doi 10.1117/12.912506 N1 - Correspondence Address: Sumaya-Martinez, J.; Grupo de Optica, Facultad de Ciencias, Universidad Autonoma del Estado de Mexico, Instituto Literario 100, 50 000, Toluca, Estado de Mexico, Mexico; email: jsm@uaemex.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-82955225250&partnerID=4

0&md5=44e86f45478b2c91532426c6bfa30841 ER TY - JOUR T1 - Experimental unconditional preparation and detection of a continuous bound entangled state of light JF - Physical Review Letters VL - 107 IS - 24 PY - 2011/// AU - Diguglielmo, J. AU - Samblowski, A. AU - Hage, B. AU - Pineda, C. AU - Eisert, J. AU - Schnabel, R. AD - Institut fr Gravitationsphysik, Leibniz Universitt Hannover, 30167 Hannover, Germany AD - Max-Planck Institut fr Gravitationsphysik, 30167 Hannover, Germany AD - Instituto de Fsica, Universidad Nacional Autnoma de Mxico, Mexico AD - Dahlem Center for Complex Quantum Systems, Freie Universitt Berlin, 14195 B erlin, Germany AD - Institute of Physics and Astronomy, University of Potsdam, 14476 Potsdam, Germany AB - Among the possibly most intriguing aspects of quantum entanglement is that it comes in free and bound instances. The existence of bound entangled states c ertifies an intrinsic irreversibility of entanglement in nature and suggests a c onnection with thermodynamics. In this Letter, we present a first unconditional, continuous-variable preparation and detection of a bound entangled state of lig ht. We use convex optimization to identify regimes rendering its bound character well certifiable, and continuously produce a distributed bound entangled state with an extraordinary and unprecedented significance of more than 10 standard de viations away from both separability and distillability. Our results show that t he approach chosen allows for the efficient and precise preparation of multimode entangled states of light with various applications in quantum information, qua ntum state engineering, and high precision metrology. 2011 American Physical Soc iety. KW - Bound entangled state KW - Continuous variables KW - Distillability KW - Entangled state KW - High precision KW - Multimodes KW - Quantum Information KW - Quantum-state engineering KW - Standard deviation KW - Convex optimization KW - Precision engineering KW - Quantum optics KW - Thermodynamics KW - Quantum entanglement N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 240503 N1 - :doi 10.1103/PhysRevLett.107.240503 N1 - Correspondence Address: Diguglielmo, J.; Institut fr Gravitationsphysik, Le ibniz Universitt Hannover, 30167 Hannover, Germany UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-83655165318&partnerID=4 0&md5=0facdd7bc7d3f06018be3b66ee1a4527

ER TY - CONF T1 - Tomato classification based on laser metrology and computer algorithms JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8011 PY - 2011/// AU - Igno Rosario, O. AU - Muoz Rodrguez, J.A. AU - Martnez Hernndez, H.P. AD - Centro de Investigaciones en ptica, A. C., Len, Guanajuato, 37150, Mexico AD - Instituto Tecnolgico de Apizaco, Departamento de Ingeniera Elctrica Y Electrni ca, Apizaco, Tlaxcala, 90341, Mexico AB - An automatic technique for tomato classification is presented based on siz e and color. The size is determined based on surface contouring by laser line sc anning. Here, a Bezier network computes the tomato height based on the line posi tion. The tomato color is determined by CIELCH color space and the components re d and green. Thus, the tomato size is classified in large, medium and small. Als o, the tomato is classified into six colors associated with its maturity. The pe rformance and accuracy of the classification system is evaluated based on method s reported in the recent years. The technique is tested and experimental results are presented. 2011 Copyright Society of Photo-Optical Instrumentation Engineer s (SPIE). KW - Bezier network KW - CIELCH space color KW - Laser line projection KW - Automatic technique KW - Classification system KW - Color space KW - Laser line projection KW - Laser lines KW - Laser metrology KW - Line positions KW - Surface contouring KW - Algorithms KW - Color KW - Light KW - Fruits N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 80117K N1 - :doi 10.1117/12.903052 N1 - Correspondence Address: Igno Rosario, O.; Centro de Investigaciones en ptic a, A. C., Len, Guanajuato, 37150, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858377686&partnerID=4 0&md5=d02559ed53f7e9854b5cfc58c5226803 ER TY - JOUR T1 - Online self-camera orientation based on laser metrology and computer algor ithms JF - Optics Communications VL - 284 IS - 24 SP - 5601 EP - 5612 PY - 2011/// AU - Rodrguez, J.A.M. AD - Centro de Investigaciones en Optica A.C., Apartado Postal 1-948, Len, GTO, 37150, Mexico

AB - An online self-camera orientation for mobile vision is presented. In this technique, the camera orientation is determined during the vision task. This pro cedure is carried out by Bezier networks of a laser line. Here, the camera orien tation is calibrated when the camera is turned during the vision task. Also, the networks perform the three-dimensional vision. The network structure is built b ased on the behavior of the line shifting, which is provided by the surface dept h. From this structure, the initial calibration and the online self-camera orien tation are deduced. The proposed technique avoids calibrated references and phys ical measurements, which are used in the traditional calibration of camera orien tation. Thus, calibration limitations caused by camera orientation modifications are overcome to perform the three-dimensional vision. Therefore, the proposed s elf-camera orientation improves the accuracy and performance of the mobile visio n. It is because online data of calibrated references are not passed to the visi on system. This procedure represents a contribution in the field of the calibrat ion of camera orientation. To elucidate this contribution, an evaluation is perf ormed based on the reported methods of self-calibration of camera orientation. A lso, the time processing is described. 2011 Elsevier B.V. All rights reserved. 2 011 Elsevier B.V. All rights reserved. KW - Computer algorithms KW - Mobile vision KW - Online self-camera orientation KW - Camera orientation KW - Laser lines KW - Laser metrology KW - Line-shifting KW - Mobile vision KW - Network structures KW - Online data KW - Physical measurement KW - Self calibration KW - Time processing KW - Traditional calibration KW - Vision systems KW - Algorithms KW - Calibration KW - Three dimensional KW - Cameras N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optcom.2011.08.045 N1 - Correspondence Address: Rodrguez, J.A.M.; Centro de Investigaciones en Opti ca A.C., Apartado Postal 1-948, Len, GTO, 37150, Mexico; email: munoza@foton.cio. mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-80053911268&partnerID=4 0&md5=887d98565bbbaf78c1e2fdac0490fcf3 ER TY - CONF T1 - Illuminance-spatial-distribution-based total luminous flux determination f or white LEDs JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8011 PY - 2011/// AU - Vidal, N. AU - Rosas, E. AU - Hurtado-Ramos, J.B. AD - Divisin de ptica Y Radiometra, Centro Nacional de Metrologa, km 4.5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico AD - CICATA Unidad Quertaro, Instituto Politcnico Nacional, Cerro Blanco 141, Col inas del Cimatario, 76090, Quertaro, Mexico

AB - Here we report on the application of the well known photo-goniometric meth od, based on illuminance spatial distribution direct measurements, to determine the total luminous flux for high-intensity white LED sources; thus testing the C ENAM primary metrology capabilities recently developed to face the increasing ne eds claimed by the rapidly moving solid-state lighting industrial sector in Mexi co. These first results obtained at CENAM after the gonio-photometric method imp lementation, allowed us to determine in good accuracy the total luminous flux fo r a high intensity white LED source, with an estimated uncertainty of 2.86 % (k= 1); still lower than the claimed by the tested LED manufacturer. We clearly iden tified the spectral mismatch correction factor determination and the LED junctio n temperature measurement and control as the dominant uncertainly sources, and w ill be addressed in order to improve the accuracy of the measurement system for future experiments. 2011 Copyright Society of Photo-Optical Instrumentation Engi neers (SPIE). KW - High-Intensity LEDs KW - Illuminance Spatial Distribution KW - LEDs Photometry KW - Primary Metrology KW - Solid-State Lighting KW - Total Luminous Flux KW - Uncertainty Estimation KW - Direct measurement KW - High intensity KW - High-Intensity LEDs KW - Industrial sector KW - Luminous flux KW - Me-xico KW - Measurement system KW - Solid state lighting KW - Spectral mismatch KW - Uncertainty estimation KW - White LED KW - Light KW - Lighting KW - Luminance KW - Photometry KW - Spatial distribution KW - Temperature measurement KW - Uncertainty analysis KW - Units of measurement KW - Light emitting diodes N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 80111Z N1 - :doi 10.1117/12.903375 N1 - Correspondence Address: Rosas, E.; Divisin de ptica Y Radiometra, Centro Naci onal de Metrologa, km 4.5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico; e mail: erosas@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858397332&partnerID=4 0&md5=08d0fe1a2e52f181779585526429c88a ER TY T1 JF VL PY AU AU AU CONF Noise tolerant N-order phase unwrapping system Proceedings of SPIE - The International Society for Optical Engineering 8011 2011/// Navarro, M.A. Estrada, J.C. Servin, M.

AD - Centro de Investigaciones en Optica A.C., Loma del Bosque 115, Col. Lomas del Campestre, 37150, Leon Guanajuato, Mexico AB - The present work shows preliminary results of a phase unwrapping technique used in interferometry. Wrapped phase maps are the result of the modulus 2 ambig uities caused for the phase recovery function arctan. Here we present a recursiv e n-order phase unwrapping system that removes the ambiguities, it's robust to n oise and fast. The system is able to recover the unwrapping phase in presence of high noise, according to stability of the system that can be controlled. This h igh noise causes line sequential integrations of phase differences to fail. The system is not numerically-heavy in comparison with other methods that tolerate t he noise. The application areas of the system can be: optical metrology, magneti c resonance, and those imaging systems where information is obtained as a demodu lated wrapped phase map. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE). KW - filter for phase unwrapping KW - interferometry KW - Phase unwrapping KW - Application area KW - High noise KW - Noise-Tolerant KW - Optical Metrology KW - Phase difference KW - Phase recovery KW - Phase unwrapping KW - Wrapped phase map KW - Interferometry KW - Light KW - Magnetic resonance KW - Signal noise measurement N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 80112X N1 - :doi 10.1117/12.903442 N1 - Correspondence Address: Navarro, M.A.; Centro de Investigaciones en Optica A.C., Loma del Bosque 115, Col. Lomas del Campestre, 37150, Leon Guanajuato, Me xico; email: naromi@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858401164&partnerID=4 0&md5=ceac81ac5aa6873b2868ebf3b00a4a66 ER TY - JOUR T1 - NMI - Metrology user relations JF - PTB - Mitteilungen Forschen und Prufen VL - 121 IS - 4 SP - 441 EP - 442 PY - 2011/// AU - Echeverra-Villagmez, S. AU - De Souza, T.L. AU - Sanetra, C. AD - Centro Nacional de Metrologa (CENAM), Mexico AD - National Institute of Metrology, Standardization and Industrial Quality (I NMETRO), Brazil AD - Technical Cooperation, PTB, Germany N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Echeverra-Villagmez, S.; Centro Nacional de Metrologa (CENAM)Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84855648487&partnerID=4

0&md5=e0f453657c520acb3ea6fc930ea9de44 ER TY - CONF T1 - Geometrical properties of microstructures by Mirau interferometric objecti ve microscope JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8011 PY - 2011/// AU - Jurez, M. AU - Rodrguez-Vera, R. AU - Rayas, J. AD - Divisin de Ciencias e Ingenieras, Campus Len, Universidad de Guanajuato, Loma del Bosque 103, Lomas del Campestre 37150, Len Guanajuato, Mexico AD - Centro de Investigaciones en ptica, A. C., Loma del Bosque 115, Lomas del C ampestre 37154, Len Guanajuato, Mexico AB - This paper describes a micro-topography measurement system using a Mirau i nterferometric microscope objective. Such system is a non-invasive, full-field, economical, and compact. The interferometer device consists of a beam splitter t hat permits send a portion of the light to the sample surface and other part to a reference surface. Reflected light from these surfaces are combined to form in terference fringes which are captured by a CCD camera. For each local point on t he surface target, there is a distance from the Mirau microscope objective lens. Then, each fringe provides the locus of points of equal phase in the interferog ram image. Contour lines corresponding to the surface target topography are extr acted from the interferograms using digital image processing. Phase-stepping tec hnique have been used in order to have a phase map which is unwrapped and mapped to a full-field microscopic data topography of the surface target. Object targe t is mounted on computer controlled stage with capability of linear movements of the order of nanometers. With this, the phase-stepping technique was done. For calibrating, a step-in-shape made of thin film on a glass substrate is built up. The obtained depth resolution is of 15 4 nm, employing the interferometric syst em. Experimental results were compared with an Atomic Force Microscope, (AFM) gi ving an overall error of 17 nm on a 33m 45m field of view. An application for inte grated optics on-chip quality control is suggested. 2011 Copyright Society of Ph oto-Optical Instrumentation Engineers (SPIE). KW - interferometry KW - micro-structures KW - micro-topography KW - Mirau microscope KW - Optical metrology KW - AFM KW - Atomic force microscope (AFM) KW - Contour line KW - Depth resolution KW - Field of views KW - Full-field KW - Geometrical property KW - Glass substrates KW - Interference fringe KW - Interferograms KW - Interferometric microscope KW - Interferometric system KW - Measurement system KW - Micro topography KW - Microscope objective KW - On chips KW - Optical Metrology KW - Phase maps KW - Phase-stepping technique

KW - Reflected light KW - Sample surface KW - Surface target KW - Atomic force microscopy KW - Image processing KW - Light KW - Microscopes KW - Optical data processing KW - Substrates KW - Surface topography KW - Interferometry N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 80117N N1 - :doi 10.1117/12.903255 N1 - Correspondence Address: Jurez, M.; Divisin de Ciencias e Ingenieras, Campus L en, Universidad de Guanajuato, Loma del Bosque 103, Lomas del Campestre 37150, Len Guanajuato, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858387165&partnerID=4 0&md5=ebb0936eb3c8a72b27f62b5f82205aa4 ER TY - CONF T1 - Michelson microscope interference objective for micro-structure topography measuring JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8011 PY - 2011/// AU - Hernndez, K. AU - Rodrguez-Vera, R. AU - Rayas, J. AD - Divisin de Ciencias e Ingenieras, Campus Len, Universidad de Guanajuato, Loma del Bosque 103, Lomas del Campestre 37150, Len Guanajuato, Mexico AD - Centro de Investigaciones en ptica, A. C., Loma del Bosque 115, Lomas del C ampestre 37154, Len Guanajuato, Mexico AB - Nowadays, the trends of miniaturization of sensors and inspection devices have been of major importance in science and technology. The characterization of microchips, integrated circuits, MEMS, and micro-sensors is important to determ ine their proper operation. Due to their element small size may have structural fails for improper handling of them. This paper proposes the use of a Michelson interferometric objective for the determination of topographical features in mat erials at micro and nanoscale level. The main advantage of this method is its no n-invasive nature that allows testing in soft materials without damage. The Mich elson interferometric microscope objective with a magnification of 5X illuminate d with a 632nm He-Ne laser is used. Fringes that allow the study of the topograp hy of these structures are properly analyzed. The acquisition of the interferogr ams was performed by a CCD, which are handled by the method of phase-stepping. A n integrated circuit of a CCD as target is used. A reconstruction of the microsc opic topography of the sample produced results with a statistical error in the t opography of 12nm. Application of this method is to conduct quality control test s in manufacture of electronic components such as micro-chips and integrated cir cuits. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE). KW - interferometry KW - Michelson microscope objective KW - micro-structures KW - micro-topography KW - Optical metrology KW - Electronic component KW - He-Ne lasers KW - Inspection devices

KW - Interferograms KW - Interferometric microscope KW - Michelson KW - Micro topography KW - Micro-chips KW - Microscope interference KW - Nanoscale levels KW - Optical Metrology KW - Quality control tests KW - Science and Technology KW - Small size KW - Soft material KW - Statistical errors KW - Topographical features KW - Integrated circuits KW - Interferometry KW - Microscopes KW - Neon KW - Topography KW - Light N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 80117U N1 - :doi 10.1117/12.903319 N1 - Correspondence Address: Hernndez, K.; Divisin de Ciencias e Ingenieras, Campu s Len, Universidad de Guanajuato, Loma del Bosque 103, Lomas del Campestre 37150, Len Guanajuato, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858437099&partnerID=4 0&md5=7767dd751c2abd2aed51b08a72ebfaa2 ER TY - CONF T1 - High topographical accuracy by optical noise reduction in digital holograp hic microscopy JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8011 PY - 2011/// AU - Len-Rodrguez, M. AU - Rodrguez-Vera, R. AU - Rayas, J.A. AU - Calixto, S. AD - Centro de Investigaciones en ptica, A.C., Loma del bosque 115, C.P. 37150, Len, Guanajuato, Mexico AB - In this work we present a different method to reduce shot noise in phase i maging from digital holograms. An averaging process of phase images reconstructe d with different reconstruction algorithms of the complex amplitude of a phase o bject in digital holographic microscopy. We obtain an improved phase image reach ing a 29% of shot noise reduction. We use a single object complex amplitude that is needed to perform our proposal. Also show the corresponding simulations and experimental results. As phase sample test we used a micro-thin film step surfac e made at home of 100 nm high of TiO 2 on a glass substrate of 4.7 mm thickness, our system was calibrated and traceable to an Atomic Force Microscope results. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE). KW - digital holography KW - in-line transmission configuration KW - microscopy KW - Optical metrology KW - shot noise reduction KW - Atomic force microscope (AFM) KW - Complex amplitude

KW - Digital holograms KW - Digital holographic microscopy KW - Digital holography KW - Glass substrates KW - In-line KW - In-phase KW - Optical Metrology KW - Optical noise reduction KW - Phase image KW - Phase object KW - Phase samples KW - Reconstruction algorithms KW - Single object KW - Step surface KW - TiO KW - Acoustic noise measurement KW - Amplitude modulation KW - Atomic force microscopy KW - Computer generated holography KW - Film thickness KW - Microscopic examination KW - Phase measurement KW - Shot noise KW - Substrates KW - Titanium dioxide KW - Light N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 801116 N1 - :doi 10.1117/12.902595 N1 - Correspondence Address: Len-Rodrguez, M.; Centro de Investigaciones en ptica, A.C., Loma del bosque 115, C.P. 37150, Len, Guanajuato, Mexico; email: migue@cio .mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858429091&partnerID=4 0&md5=7bdeba4e40ebd36133f4c73b83ced3d2 ER TY - CONF T1 - Tangential and sagittal curvature from the normals computed by the null sc reen method in corneal topography JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8011 PY - 2011/// AU - Estrada-Molina, A. AU - Daz-Uribe, R. AD - Universidad Nacional Autnoma de Mxico, Centro de Ciencias Aplicadas Y Desarr ollo Tecnolgico, Apto. Postal 70-186, C.P 04510, Mxico, D.F., Mexico AB - A new method for computing the tangential and sagittal curvatures from the normals to a cornea is proposed. The normals are obtained through a Null Screen method from the coordinates of the drops shaped spots at the null screen, the c oordinates on a reference approximating surface and the centroids on the image p lane. This method assumes that the cornea has rotational symmetry and our deriva tions will be carried out in the meridional plane that contains the symmetry axi s. Experimental results are shown for a calibration spherical surface, using cyl indrical null screens with radial point arrays. 2011 Copyright Society of PhotoOptical Instrumentation Engineers (SPIE). KW - Corneal Topography KW - null screen KW - tangential and sagittal curvatures and optical metrology KW - Corneal topography

KW - Image plane KW - Meridional planes KW - Null screen KW - Optical Metrology KW - Rotational symmetries KW - Spherical surface KW - Symmetry axis KW - Engineering KW - Molecular physics KW - Light N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 80119J N1 - :doi 10.1117/12.903417 N1 - Correspondence Address: Estrada-Molina, A.; Universidad Nacional Autnoma de Mxico, Centro de Ciencias Aplicadas Y Desarrollo Tecnolgico, Apto. Postal 70-186, C.P 04510, Mxico, D.F., Mexico; email: amilcar.estrada@ccadet.unam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858414957&partnerID=4 0&md5=a52916182533c307e55361f3ac3b0aa1 ER TY - CONF T1 - Parallel phase shifting interferometry using a double cyclic shear interfe rometer JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8011 PY - 2011/// AU - Toto-Arellano, N.-I. AU - Serrano-Garca, D.-I. AU - Martnez-Garca, A. AU - Rayas-lvarez, J.A. AU - Rodrguez-Zurita, G. AU - Montes-Prez, A. AD - Centro de Investigaciones en ptica A.C., Loma del Bosque #115, Col. L. del Campestre, A.P. 1-948, C.P. 37150, Len, Gto., Mexico AD - Laboratorio de Interferometra Y Holografa, Benemrita Universidad Autnoma de Pu ebla, Fac. Ciencias Fsico-Matemticas, Av. Sn. Claudio y 18 Sur, C.U. Sn. Manuel, C .P. 72570, Puebla, Pue., Mexico AB - In this work we present a parallel polarizing phase shifting interferomete r based in a Double Cyclic Interferometer (DCSI) to analyze transparent samples. This system has the advantage of generating four beams that can interfere prope rly; this can reduce the number of captures needed in phase shifting interferome try. The interferometric system generates two -shifed interferograms, which are recorded by the CCD camera in a single-shot. For the processing of the optical p hase data map, a parallel phase shift can be generated by placing a linear polar izer covering two patterns. We analyze the cases of four patterns with arbitrary shifts captured in two shots. The unwrapped phase is processed by Kreis methods . Experimental results obtained by the proposed interferometer are presented. 20 11 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE). KW - Interferometry KW - Metrology KW - Phase shift KW - Polarization KW - Spatial Filtering KW - Cyclic shear KW - In-phase KW - Interferograms KW - Interferometric system KW - Linear polarizer

KW - Optical phase KW - Phase shifting Interferometry KW - Phase-shifting interferometers KW - Single-shot KW - Spatial filterings KW - Interferometers KW - Interferometry KW - Light KW - Measurements KW - Phase shifters KW - Polarization KW - Phase shift N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 80110N N1 - :doi 10.1117/12.901957 N1 - Correspondence Address: Toto-Arellano, N.-I.; Centro de Investigaciones en ptica A.C., Loma del Bosque #115, Col. L. del Campestre, A.P. 1-948, C.P. 37150, Len, Gto., Mexico; email: ivantotoarellano@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858391009&partnerID=4 0&md5=93237eba322eec89eaeced8a0cc18f48 ER TY - JOUR T1 - Differences in the stability of the heart interbeat rate during wake and s leep periods JF - Fluctuation and Noise Letters VL - 10 IS - 4 SP - 405 EP - 416 PY - 2011/// AU - Hernndez-Prez, R. AU - Guzmn-Vargas, L. AU - Reyes-Ramrez, I. AU - Angulo-Brown, F. AD - SATMEX, CONTEL Edif. SGA-II, Av. de las Telecomunicaciones S/N, Mxico, D.F. 09310, Mexico AD - Unidad Profesional Interdisciplinaria en Ingeniera y Tecnologas Avanzadas, I nstituto Politcnico Nacional, Av. IPN No. 2580, Col. Ticomn, Mxico D.F. 07340, Mexi co AD - Departamento de Fsica, Escuela Superior de Fsica y Matemticas, Edif. No. 9, U .P. Zacatenco, Mxico D. F. 07738, Mexico AB - The Allan (ADEV) and Hadamard (HDEV) deviations are mathematical tools dev eloped in the field of time and frequency metrology to define quantitatively the frequency instabilities of an oscillator; which consist of any unwanted departu re from its nominal frequency value over a specified time interval. We use both deviations to analyze the stability of the heart interbeat rate for healthy subj ects and patients with congestive heart failure (CHF) during wake and sleep peri ods. We find that the ADEV and HDEV profiles for the subjects in the CHF group e xhibit remarkably different trends between wake and sleep periods, namely, large r dispersion between the results for each member of the group while the results for the healthy subjects show some uniformity across the members of the group. M oreover, we observe that the stability for both groups degrades for low scales d uring the sleep phase, being more significant for the CHF group. Both ADEV and H DEV statistics reveal that healthy data can be described by more uniform deviati on values along several scales, particularly for the wake period, whereas CHF da ta shows important variations. 2011 World Scientific Publishing Company. KW - Allan variance KW - Cardiac dynamics

KW - heart rate stability N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1142/S0219477511000661 N1 - Correspondence Address: Hernndez-Prez, R.; SATMEX, CONTEL Edif. SGA-II, Av. de las Telecomunicaciones S/N, Mxico, D.F. 09310, Mexico; email: ricardohdzpz@gma il.com UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84856504322&partnerID=4 0&md5=582893718bad9b716607695b88fcfe54 ER TY - JOUR T1 - A new method for extracting Imazapyr from soil samples without using organ ic solvents T2 - Nuevo mtodo para extraer imazapyr del suelo sin el uso de solventes orgnicos JF - Revista Internacional de Contaminacion Ambiental VL - 27 IS - 4 SP - 323 EP - 332 PY - 2011/// AU - Soto-Barajas, M. AU - Prado, B. AU - Raymundo, E. AU - Hidalgo, C. AU - Etchevers, J. AD - Instituto de Geologa, Universidad Nacional Autnoma de Mxico, Delegacin Coyoacn, 04510, Mexico AB - A new method was developed for extracting Imazapyr from soil samples. Inst ead of using organic solvents as the extracting medium, the new method employs d eionized water. Validation and extraction tests were carried out on five agricul tural soils where the extracted solution was analyzed by high performance liquid chromatography to identify and quantify the herbicide. Validation of the extrac ting procedure was conducted by computing four performance indexes: selectivity, recovery, reproducibility and robustness, according to the definitions of these parameters given by the Centro Nacional de Meteorologa (Metrology National Cente r of Mexico). Since the proposed method has a recovery rate of herbicide above 8 5 %, it can be used as a routine procedure when studying fate and transport of I mazapyr in soil. KW - HPLC KW - Imazapyr KW - Methods for extracting KW - Quantification KW - Validation of methods KW - agricultural soil KW - efficiency measurement KW - environmental fate KW - extraction method KW - herbicide KW - liquid chromatography KW - performance assessment KW - solvent KW - water N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Prado, B.; Instituto de Geologa, Universidad Nacion al Autnoma de Mxico, Delegacin Coyoacn, 04510, Mexico; email: bprado@geologia.unam.m x UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84857498097&partnerID=4 0&md5=6e652e59f81f6cfe1f11279749292b94

ER TY - CONF T1 - Study of a figure-eight laser generating noise-like pulses with adjustable characteristics JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8011 PY - 2011/// AU - Pottiez, O. AU - Ibarra-Escamilla, B. AU - Kuzin, E.A. AU - Hernandez-Garcia, J.C. AD - Centro de Investigaciones en ptica, 115 Loma del Bosque, Len, Gto., 37150, M exico AD - Instituto Nacional de Astrofsica, ptica Y Electrnica, 1 L.E. Erro, Puebla, Pu e., 72000, Mexico AB - In this work we study experimentally and numerically a passively mode-lock ed figure-eight fiber laser that includes a polarization-imbalanced Nonlinear Op tical Loop Mirror (NOLM), whose switching power can be adjusted through a wave r etarder plate. The laser emits broadband noise-like pulses with a bandwidth that can exceed 50 nm. The pulses are actually sub-nanosecond wave packets with an i nner fine structure of sub-ps pulses with random amplitude and duration. The dur ation of the pulses as well as their spectral width can be adjusted through the variation of the NOLM switching power. Numerical simulations are in good agreeme nt with experimental results, confirming in particular the strong dependence of the pulse properties on the value of the NOLM switching power, although NOLM swi tching alone does not explain the appearance of the noise-like pulsing mode. The properties of this kind of pulses, like their wide bandwidth and energy, make t hem attractive for applications like supercontinuum generation and metrology. 20 11 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE). KW - Erbium fiber lasers KW - Mode-locked fiber lasers KW - Nonlinear Optical Loop Mirror KW - Erbium fiber lasers KW - Fine structures KW - Mode-locked KW - Nonlinear optical loop mirror KW - Passively mode-locked KW - Spectral widths KW - Switching power KW - Wide bandwidth KW - Bandwidth KW - Fiber lasers KW - Light KW - Optical switches KW - Passive mode locking KW - Supercontinuum generation KW - Switching KW - Pulse generators N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 801138 N1 - :doi 10.1117/12.901953 N1 - Correspondence Address: Pottiez, O.; Centro de Investigaciones en ptica, 11 5 Loma del Bosque, Len, Gto., 37150, Mexico; email: pottiez@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84858388658&partnerID=4 0&md5=c16b0db4586f89a316135babbf78b461 ER TY - CONF

T1 - Manufacturing, testing, and metrology of axi-symmetric circular phase mask s for stellar coronagraphy JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8169 PY - 2011/// AU - N'Diaye, M. AU - Dohlen, K. AU - Tisserand, S. AU - Gautier, S. AU - El Hadi, K. AU - Moreaux, G. AU - Soummer, R. AU - Cuevas, S. AU - Snchez-Prez, C. AD - Laboratoire d'Astrophysique de Marseille, UMR6110, CNRS/Universit de Proven ce, 38 rue Frdric Joliot Curie, 13388 Marseille Cedex 13, France AD - SILIOS Technologies, ZI Peynier Rousset, Rue Gaston Imbert prolonge, 13790 Peynier, France AD - Space Telescope Science Institute, 3700 San Martin Drive, Baltimore, MD 21 218, United States AD - Instituto de Astronoma, Universidad Nacional Autnoma de Mxico (UNAM), Ciudad Universitaria, Apartado Postal 70-264, 04510 Mxico D.F., Mexico AD - Centro de Ciencias Aplicadas Y Desarrollo Tecnolgico, UNAM, Ciudad Universi taria, Apartado Postal 70-186, 04510 Mxico D.F., Mexico AB - Stellar coronagraphs using circular phase masks are promising concepts ded icated to the image suppression of an observed bright star in order to enhance t he substellar mass companions present in its vicinity, typically 2 /D angular sep aration. These concepts include a focal plane phase mask which introduces a phas e delay on a part of the stellar image. With an adequate choice of the mask para meters (thickness, diameter), the light going through the mask and the light goi ng outside the mask will interfere destructively inside the geometric pupil in t he following pupil plane. The light rejected outside this re-imaged pupil will b e blocked by a Lyot stop. Typically, the mask physical size is about F, where F d enotes the f-number of the optical system, and the mask thickness depends on the required phase shifting. The contrast provided by these concepts is highly rela ted to the quality of thickness profile of the phase mask and therefore, severe manufacturing tolerances are necessary to reach the theoretical performance of t he corresponding coronagraphic system. In 2007, we designed a Roddier & Roddier phase mask with a 65 m diameter and ordered it to GEPI of Paris Observatory which manufactured it using ion etching process. A roughness of 0.8 nm rms and a tran sition width of 1% of the mask diameter were measured with a profilometer for th is mask showing the good quality of the mask (N'Diaye et al. 2010). We pursue ou r efforts to design and manufacture high quality masks in collaboration with the firm SILIOS. Several tests of manufacturing procedures are currently realized t o reach the best trade-off between mask roughness and mask transition width. The se values, measured in our laboratory with a profilometer, allow us to determine the best configuration for fabrication. In addition, by knowing the mask profil e, we can estimate theoretically the performance that can be reached. 2011 Copyr ight Society of Photo-Optical Instrumentation Engineers (SPIE). KW - coronagraphy KW - high angular resolution KW - Angular separation KW - Axisymmetric KW - Coronagraphy KW - Focal Plane KW - High angular resolutions KW - High quality KW - Image suppression KW - Ion etching KW - Manufacturing procedure

KW - Manufacturing tolerances KW - Mask thickness KW - Mask-roughness KW - Phase delay KW - Phase masks KW - Phase-shifting KW - Profilometers KW - Pupil planes KW - Stellar images KW - Theoretical performance KW - Thickness profiles KW - Transition widths KW - Fabrication KW - Optical systems KW - Profilometry KW - Units of measurement KW - Stars N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 81690G N1 - :doi 10.1117/12.897010 N1 - Correspondence Address: N'Diaye, M.; Laboratoire d'Astrophysique de Marsei lle, UMR6110, CNRS/Universit de Provence, 38 rue Frdric Joliot Curie, 13388 Marseil le Cedex 13, France; email: mamadou.ndiaye@oamp.fr UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-80355146237&partnerID=4 0&md5=8d50ed176c39dd08b48614b2d7708df3 ER TY - CONF T1 - Measuring hairiness in carpets by using surface metrology JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 8133 PY - 2011/// AU - Quinones, R. AU - Ortiz-Jaramillo, B. AU - Vargas, S.A.O. AU - De Meulemeester, S. AU - Van Langenhove, L. AU - Philips, W. AD - Faculty of Electronic and Biomedical Engineering, Antonio Narino Universit y, Cra. 58A No. 37 - 94, Bogota, Colombia AD - Department of Telecommunications and Information Processing (TELIN-IPI-IBB T), Ghent University, St-Pietersnieuwstraat 41, Gent, Belgium AD - Department of Textiles, Ghent University, Technologiepark 907, 9052 Gent, Belgium AB - Recently, an automatic system for grading appearance retention in carpets using our own scanner and image analysis techniques was proposed. A system for c arpets with low pile construction and without color patterns has been developed. Appearance changes in carpets with high pile construction were still not well d etected. We present an approach based on surface metrology that extract informat ion given by the hairs on the carpet surface. These features are complementary t o the texture features previously explored. By combining both features, we expan d the use of the automatic grading system including some carpets types with high pile construction. 2011 SPIE. KW - Carpet wear assessment KW - Hairiness analysis KW - Image analysis KW - Appearance retentions KW - Automatic grading KW - Automatic systems

KW - Carpet wear assessment KW - Color pattern KW - Hairiness analysis KW - Image analysis techniques KW - Pile construction KW - Surface metrology KW - Texture features KW - Image analysis KW - Piles KW - Units of measurement KW - Measurements N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 81330W N1 - :doi 10.1117/12.893769 N1 - Correspondence Address: Quinones, R.; Faculty of Electronic and Biomedical Engineering, Antonio Narino University, Cra. 58A No. 37 - 94, Bogota, Colombia; email: rquinone@telin.ugent.be UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-80055018107&partnerID=4 0&md5=2f844cf98480c6c1c452439d6fe9cc99 ER TY - JOUR T1 - 4D profile of phase objects through the use of a simultaneous phase shifti ng quasi-common path interferometer JF - Journal of Optics VL - 13 IS - 11 PY - 2011/// AU - Toto-Arellano, N.-I. AU - Serrano-Garca, D.I. AU - Garca, A.M. AU - Zurita, G.R. AU - Montes-Prez, A. AD - Laboratorio de ptica Fsica, Facultad de Ciencias Fsico-Matemticas de la Benemri ta, Universidad Autnoma de Puebla, Pue, Mexico AD - Centro de Investigaciones en ptica AC, Loma del Bosque #115, Col. Lomas del Campestre, CP 37150, Len, Gto, Mexico AB - Modulation of polarization is commonly employed in optical interferometry through the use of polarizers and quarter-wave retarders. Phase shifts between i nterfering beams can be easily controlled with such techniques. This communicati on describes some details of modulation of polarization which are useful in phas e shifting interferometry applied to the study of phase objects. As an applicati on, the case of a two-beam phase grating interferometer is discussed on the grou nds of polarization analysis as an example. The configuration presented does not require micro-polarizer arrays or additional software to eliminate noise caused by vibration. This system does not use a double window, and generates two beams , the separation of which can be varied according to the characteristics of the grid used. Experimental results are also given. 2011 IOP Publishing Ltd. KW - dynamic interferometry KW - fringe analysis KW - gratings KW - image processing KW - instrumentation KW - measurement and metrology KW - phase-shifting KW - polarization KW - Dynamic interferometry KW - Fringe analysis KW - instrumentation

KW - measurement and metrology KW - Phase-shifting KW - Image processing KW - Interferometers KW - Interferometry KW - Optical data processing KW - Polarization KW - Phase shift N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 115502 N1 - :doi 10.1088/2040-8978/13/11/115502 N1 - Correspondence Address: Toto-Arellano, N.-I.; Laboratorio de ptica Fsica, Fa cultad de Ciencias Fsico-Matemticas de la Benemrita, Universidad Autnoma de Puebla, Pue, Mexico; email: ivantotoarellano@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-80755169920&partnerID=4 0&md5=ab53d600535db9b45d3df295a47cb298 ER TY - JOUR T1 - Interlaboratory comparison for the determination of pesticide residues in Chinese cabbage JF - Accreditation and Quality Assurance VL - 16 IS - 10 SP - 499 EP - 505 PY - 2011/// AU - Kim, B. AU - Ahn, S. AU - Mitani, Y. AD - Division of Metrology for Quality of Life, Korea Research Institute of Sta ndards and Science, Yuseong, Daejeon 305-340, South Korea AD - Centro Nacional de Metrologia, Municipio deEl Marques, 76246 Queretrao, Me xico AB - The results of and findings from an interlaboratory comparison among labor atories carrying out food testing of pesticide residues in the APEC (Asia-Pacifi c Economic Cooperation) region are presented and discussed to show critical role s of chemical metrology infrastructure in establishing traceability of measureme nts and in supporting existing measurement capability in safety and quality of f ood trade. The study material, which was prepared and certified by Korea Researc h Institute of Standards and Science (KRISS), was freeze-dried Chinese cabbage p owder fortified with two organophosphorous pesticides (diazinon and chlorpyrifos ). Among 14 participants, 12 laboratories were accredited based on ISO/IEC17025 and one laboratory was under assessment for the accreditation at the time of thi s study. Though all participants demonstrated very good intra-day repeatability and inter-day intermediate precision, many of them showed a large bias from the certified values. It is suggested that in addition to the accreditation system, economies are encouraged to develop appropriate chemical metrology infrastructur e, which could effectively support laboratories to assure measurement traceabili ty to SI, for which NMIs could play significant roles through their metrological services recognized in Mutual Recognition Arrangement (MRA) of the Internationa l Committee for Weights and Measures (Comit International des Poids et Mesures, C IPM). 2011 Springer-Verlag. KW - Chemical metrology KW - Chinese cabbage KW - Interlaboratory comparison KW - Pesticide residue KW - Traceability

N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s00769-011-0795-9 N1 - Correspondence Address: Kim, B.; Division of Metrology for Quality of Life , Korea Research Institute of Standards and Science, Yuseong, Daejeon 305-340, S outh Korea; email: byungjoo@kriss.re.kr UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-80053159964&partnerID=4 0&md5=78d62f6b6f21a0a449701cfb169f5961 ER TY - JOUR T1 - FPGA-based smart sensor for online displacement measurements using a heter odyne interferometer JF - Sensors VL - 11 IS - 8 SP - 7710 EP - 7723 PY - 2011/// AU - Vera-Salas, L.A. AU - Moreno-Tapia, S.V. AU - Garcia-Perez, A. AU - Romero-Troncoso, R.J. AU - Osornio-Rios, R.A. AU - Serroukh, I. AU - Cabal-Yepez, E. AD - HSPdigital, CA Procesamiento Digital de Seales, CA Telematica, DICIS, Unive rsidad de Guanajuato, Carr. Salamanca-Valle km 3.51.8, Palo Blanco, 36885 Salama nca, Gto, Mexico AD - HSPdigital, CA Mecatronica, Facultad de Ingenieria, Campus San Juan del Ri o, Universidad Autonoma de Queretaro, Rio Moctezuma 249, 76807 San Juan del Rio, Qro, Mexico AB - The measurement of small displacements on the nanometric scale demands met rological systems of high accuracy and precision. In this context, interferomete r-based displacement measurements have become the main tools used for traceable dimensional metrology. The different industrial applications in which small disp lacement measurements are employed requires the use of online measurements, high speed processes, open architecture control systems, as well as good adaptabilit y to specific process conditions. The main contribution of this work is the deve lopment of a smart sensor for large displacement measurement based on phase meas urement which achieves high accuracy and resolution, designed to be used with a commercial heterodyne interferometer. The system is based on a low-cost Field Pr ogrammable Gate Array (FPGA) allowing the integration of several functions in a single portable device. This system is optimal for high speed applications where online measurement is needed and the reconfigurability feature allows the addit ion of different modules for error compensation, as might be required by a speci fic application. 2011 by the authors; licensee MDPI, Basel, Switzerland. KW - FPGA KW - Heterodyne interferometer KW - Phase measurement KW - Smart sensor KW - algorithm KW - article KW - computer KW - computer program KW - genetic procedures KW - image processing KW - interferometry KW - Internet KW - methodology

KW - motion KW - optics KW - reproducibility KW - statistical model KW - Algorithms KW - Biosensing Techniques KW - Computers KW - Image Processing, Computer-Assisted KW - Interferometry KW - Internet KW - Models, Statistical KW - Motion KW - Optics and Photonics KW - Reproducibility of Results KW - Software N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.3390/s110807710 N1 - Correspondence Address: Garcia-perez, A.; HSPdigital, CA Procesamiento Dig ital de Seales, CA Telematica, DICIS, Universidad de Guanajuato, Carr. SalamancaValle km 3.51.8, Palo Blanco, 36885 Salamanca, Gto, Mexico; email: agarcia@hspdi gital.org UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-80052174188&partnerID=4 0&md5=bde66efbd3074dbc56b44bc90ab45200 ER TY - JOUR T1 - Micro- and macro deformation measurement by extension of correlation techn ique JF - Optik VL - 122 IS - 18 SP - 1642 EP - 1645 PY - 2011/// AU - Anguiano-Morales, M. AU - Martnez, A. AU - Garnica, G. AU - Rayas, J.A. AU - Santoyo, F.M. AD - Instituto Tecnolgico de Chihuahua, Divisin de Estudios de Posgrado e Investi gacin, Av. Tecnolgico No 2909, Chihuahua, Chih. 31310, Mexico AD - Centro de Investigaciones en ptica, A. C. Lomas Del Bosque, No 115 Col Loma s del Campestre Len, Gto. 37150, Mexico AB - In this work, we present the implementation of Electronic Speckle Pattern Interferometry (ESPI), Digital Speckle Photography (DSP) and Digital Image Corre lation (DIC) as complementary techniques to measure in-plane micro and macro dis placement. The main advantage of ESPI is its great sensitivity to small displace ments (smaller than the size of the speckle). However, the contrast of fringes i n this technique is severely affected by de-correlation effects when the in-plan e displacement exceeds the size of the speckle. To eliminate the de-correlation effects, we use the DSP technique. It is possible to generate artificial speckle s, usually bigger than those generated by means of illumination of the sample wi th laser light. By combining DSP and DIC the displacement field can be obtained when the ESPI method cannot be applied due to image de-correlation. The experime ntal results show that the combination of these techniques is useful to analyze deformations over a wider range. 2010 Elsevier GmbH. All rights reserved. KW - Digital Image Correlation KW - Digital Speckle Photography KW - Optical Metrology

KW - Speckle decorrelation KW - Correlation techniques KW - Deformation measurements KW - Digital image correlations KW - Digital speckle photography KW - Displacement field KW - Electronic speckle pattern interferometry KW - In-plane KW - In-plane displacement KW - Laser lights KW - Micro and macro KW - Optical Metrology KW - Small displacement KW - Speckle decorrelation KW - Correlation detectors KW - Deformation KW - Image analysis KW - Photography KW - Speckle KW - Strain measurement KW - Optical correlation N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.ijleo.2010.10.017 N1 - Correspondence Address: Anguiano-Morales, M.; Instituto Tecnolgico de Chihu ahua, Divisin de Estudios de Posgrado e Investigacin, Av. Tecnolgico No 2909, Chihu ahua, Chih. 31310, Mexico; email: manguiano@itchihuahua.edu.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79961027269&partnerID=4 0&md5=5e06c8585e38e2d8a98062edec4bf4b8 ER TY - JOUR T1 - Generation of long broadband pulses with a figure-eight fiber laser JF - Laser Physics VL - 21 IS - 8 SP - 1518 EP - 1524 PY - 2011/// AU - Hernandez-Garcia, J.C. AU - Pottiez, O. AU - Grajales-Coutio, R. AU - Ibarra-Escamilla, B. AU - Kuzin, E.A. AU - Estudillo-Ayala, J.M. AU - Gutierrez-Gutierrez, J. AD - Centro de Investigaciones en Optica (CIO), Loma del Bosque 115, Col. Lomas del Campestre, Leon, Gto. 37150, Mexico AD - Escuela de Ciencias, Universidad Autonoma Benito Juarez de Oaxaca, Av. Uni versidad s/n, Oaxaca, Oax. 68120, Mexico AD - Optica y Electronica (INAOE), Departamento de Optica, Instituto Nacional d e Astrqfisica, L. E. Erro 1, Puebla, Pue. 72000, Mexico AD - Division de Ingenierias Campus Irapuato-Salamanca, Universidad de Guanajua to, Carretera Salamanca-Valle de Santiago Km 3.5+1.8 Km, Comunidad de Palo Blanc o, Salamanca, Gto. 36885, Mexico AB - In this paper we performed the experimental and numerical study of a passi vely mode-locked fiber laser that generates packets of sub-picosecond pulses ins tead of individual pulses. The proposed configuration is a figure-eight fiber la ser scheme, which includes a Nonlinear Optical Loop Mirror with polarization asy

mmetry inserted into a ring cavity. No experimental evidence of self-starting mo de locking operation of the laser was observed; however, for proper adjustments of the wave retarders included in the setup, a mechanical stimulation triggers t he onset of mode locking. The autocorrelation of the generated pulses shows a na rrow sub-picosecond peak riding a large sub-nanosecond pedestal whose intensity is half that of the peak, and the optical spectrum is smooth and wide. We show t hat contrary to conventional ultrashort pulses, these pulses do not vanish rapid ly after propagation through a long dispersive fiber, which makes then attractiv e for super-continuum generation as well as for applications in metrology. Final ly, we study the pulse formation in the laser and present arguments based on exp erimental data and numerical simulations that the observed pulses are actually s ets of a large number of solitons. 2011 Pleiades Publishing, Ltd. KW - Broadband pulse KW - Dispersive fiber KW - Experimental data KW - Experimental evidence KW - Mechanical stimulation KW - Nonlinear optical loop mirror KW - Numerical studies KW - Optical spectra KW - Polarization asymmetry KW - Pulse formation KW - Ring cavities KW - Self-starting KW - Supercontinuum generations KW - Fiber lasers KW - Fibers KW - Laser mode locking KW - Mirrors KW - Nonlinear optics KW - Pulse generators KW - Solitons KW - Ultrashort pulses KW - Mode-locked fiber lasers N1 - Cited By (since 1996):6 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1134/S1054660X11150114 N1 - Correspondence Address: Hernandez-Garcia, J.C.; Centro de Investigaciones en Optica (CIO), Loma del Bosque 115, Col. Lomas del Campestre, Leon, Gto. 37150 , Mexico; email: juancarlos@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-80051585128&partnerID=4 0&md5=315a6c26837bfc56d3f9e8323be62273 ER TY - JOUR T1 - Ultrasound Metrology in Mexico: A round robin test for medical diagnostics JF - Journal of Physics: Conference Series VL - 279 IS - 1 PY - 2011/// AU - Luna, R.A. AU - Snchez, A.L.L. AU - Jurez, A.A.E. AD - Centro Nacional de Metrologa(CENAM Mxico), Carretera a Los Cus km.4.5, El Mar qus, QC 76246, Mexico AB - This paper presents preliminary statistical results from an on-going imagi ng medical ultrasound study, of particular relevance for gynecology and obstetri cs areas. Its scope is twofold, firstly to compile the medical ultrasound infras tructure available in cities of Queretaro-Mexico, and second to promote the use

of traceable measurement standards as a key aspect to assure quality of ultrasou nd examinations performed by medical specialists. The experimental methodology i s based on a round robin test using an ultrasound phantom for medical imaging. T he physician, using its own ultrasound machine, couplant and facilities, measure s the size and depth of a set of pre-defined reflecting and absorbing targets of the reference phantom, which simulate human illnesses. Measurements performed g ive the medical specialist an objective feedback regarding some performance char acteristics of their ultrasound examination systems, such as measurement system accuracy, dead zone, axial resolution, depth of penetration and anechoic targets detection. By the end of March 2010, 66 entities with medical ultrasound facili ties, from both public and private institutions, have performed measurements. A network of medical ultrasound calibration laboratories in Mexico, with traceabil ity to The International System of Units via national measurement standards, may indeed contribute to reduce measurement deviations and thus attain better diagn ostics. Published under licence by IOP Publishing Ltd. KW - Axial resolutions KW - Couplants KW - Dead zones KW - Experimental methodology KW - Me-xico KW - Measurement deviations KW - Measurement standards KW - Measurement system accuracy KW - Medical diagnostics KW - Medical ultrasound KW - National measurements KW - Objective feedback KW - Performance characteristics KW - Private institutions KW - Round Robin test KW - Targets detection KW - Ultrasound examination KW - Ultrasound machines KW - Ultrasound metrology KW - Ultrasound phantom KW - Medical imaging KW - Metric system KW - Ultrasonics KW - Ultrasonic applications N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 012030 N1 - :doi 10.1088/1742-6596/279/1/012030 N1 - Correspondence Address: Luna, R. A.; Centro Nacional de Metrologa(CENAM Mxic o), Carretera a Los Cus km.4.5, El Marqus, QC 76246, Mexico; email: ramezola@cenam .mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79959488074&partnerID=4 0&md5=cae1412cf5ec46b610dba9b7ef157316 ER TY T1 nd JF VL IS SP EP PY AU - JOUR - Research in optics and photonics at CIO, Mexico: Some advances in optics a photonics: Legacy of CIO to the world in its XXX anniversary - Optics and Lasers in Engineering - 49 - 6 - 659 - 662 - 2011/// - Rodrguez-Vera, R.

AD - Centro de Investigaciones en ptica A.C., Loma del Bosque No. 115, Col. Loma s del Campestre, 37150 Len, Guanajuato, Mexico AB - Research in optics and photonics at CIO, Mexico is discussed. In September , 1980, during the first meeting of the Government body of CIO Malacara was appo inted as General Director, a position that he held until 1989. He was in charge of consolidating one of the first and most successful projects to create scienti fic institutions outside Mexico City, whereup to then most of the technological development of the country had taken place. He implemented institutional managem ent and direction systems based on quality models, and launched quality certific ation systems for the tasks and goals of the different areas of CIO, such as in the laboratories and workshops of the area of technological applications, as wel l as, in the laboratories of dimensional metrology and of colorimetry, and in ar eas of specialized services, such as the Central Library. KW - Dimensional Metrology KW - Me-xico KW - Mexico City KW - Quality certification KW - Quality models KW - Scientific institutions KW - Technological applications KW - Technological development KW - Photonics N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optlaseng.2011.02.008 N1 - Correspondence Address: Rodrguez-Vera, R.; Centro de Investigaciones en ptic a A.C., Loma del Bosque No. 115, Col. Lomas del Campestre, 37150 Len, Guanajuato, Mexico; email: rarove@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79953768510&partnerID=4 0&md5=542913aefa8f5a0307623f9e43ebed3d ER TY - JOUR T1 - Optical measurements of self-induced oscillations JF - Optics and Lasers in Engineering VL - 49 IS - 6 SP - 709 EP - 713 PY - 2011/// AU - Gutierrez Hernandez, D.A. AU - Perez Lopez, C. AU - Mendoza Santoyo, F. AU - Hernandez Montes, M.S. AU - Trillo Yanez, C. AD - Centro de Investigaciones en ptica A.C., Lomas del Bosque 115, Col Lomas de l Campestre, 37150 Len, Guanajuato, Mexico AD - Departamento de Fsica Aplicada, Universidade de Vigo, Campus Universitario, E36310 Vigo, Spain AB - High speed digital holographic interferometry is used to measure the selfinduced mechanical oscillations produced by frequency signals near the first nat ural resonance mode of a rectangular polyester membrane. The external excitation produces very low mechanical amplitude levels in the membrane. This non-invasiv e optical technique has high temporal and spatial resolution allowing large data acquisition and hence allowing the processing of thousands of recorded images a cquired in a CMOS camera set at 5000 frames per second (fps). 2010 Elsevier Ltd. All rights reserved. KW - High speed digital holographic interferometry KW - Optical metrology KW - Self-induced oscillations

KW - CMOS camera KW - Digital holographic interferometry KW - External excitation KW - Frames per seconds KW - Frequency signals KW - Mechanical oscillations KW - Natural resonance KW - Non-invasive optical techniques KW - Optical measurement KW - Optical metrology KW - Self-induced oscillations KW - Spatial resolution KW - Image enhancement KW - Optical data processing KW - Units of measurement KW - Holographic interferometry N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optlaseng.2010.12.017 N1 - Correspondence Address: Gutierrez Hernandez, D. A.; Centro de Investigacio nes en ptica A.C., Lomas del Bosque 115, Col Lomas del Campestre, 37150 Len, Guana juato, Mexico; email: davidgh@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79953767941&partnerID=4 0&md5=c83e14da3f25e7be0b1da9cca11b96af ER TY - JOUR T1 - Digital approximation to extended depth of field in no telecentric imaging systems JF - Journal of Physics: Conference Series VL - 274 IS - 1 PY - 2011/// AU - Meneses, J.E. AU - Contreras, C.R. AD - Grupo de ptica Y Tratamiento de Seales, Escuela de Fsica, Universidad Industr ial de Santander, A.A. 678 Bucaramanga, Colombia AB - A method used to digitally extend the depth of field of an imaging system consists to move the object of study along the optical axis of the system and di fferent images will contain different areas that are sharp; those images are sto red and processed digitally to obtain a fused image, in that image will be sharp all regions of the object. The implementation of this method, although widely u sed, imposes certain experimental conditions that should be evaluated for to stu dy the degree of validity of the image final obtained. An experimental condition is related with the conservation of the geometric magnification factor when the re is a relative movement between the object and the observation system; this im plies that the system must be telecentric, which leads to a reduction of the obs ervation field and the use of expensive systems if the application includes micr oscopic observation. This paper presents a technique that makes possible to exte nd depth of filed of an imaging system non telecentric; this system is used to r ealize applications in Optical Metrology with systems that have great observatio n field. KW - Degree of validity KW - Depth of field KW - Experimental conditions KW - Extended depth of field KW - Fused images KW - Magnification factors KW - Microscopic observations

KW - Observation systems KW - Optical axis KW - Optical Metrology KW - Relative movement KW - Imaging systems N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 012040 N1 - :doi 10.1088/1742-6596/274/1/012040 N1 - Correspondence Address: Meneses, J. E.; Grupo de ptica Y Tratamiento de Seal es, Escuela de Fsica, Universidad Industrial de Santander, A.A. 678 Bucaramanga, Colombia; email: jaimen@uis.edu.co UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79953743577&partnerID=4 0&md5=319ed7e2737c1700d8780e5b6006ef9a ER TY - JOUR T1 - Noise robust linear dynamic system for phase unwrapping and smoothing JF - Optics Express VL - 19 IS - 6 SP - 5126 EP - 5133 PY - 2011/// AU - Estrada, J.C. AU - Servin, M. AU - Quiroga, J.A. AD - Centro de Investigaciones en Ptica A. C., Loma del Bosque 115, Col. Lomas del Campestre, 37150, Len Guanajuato, Mexico AD - Optics Departament, Universidad Complutence de Madrid, Facultad CC Fsicas, Ciudad Universitaria s/n, Madrid 28040, Spain AB - Phase unwrapping techniques remove the modulus 2pambiguities of wrapped ph ase maps. The present work shows a first-order feedback system for phase unwrapp ing and smoothing. This system is a fast phase unwrapping system which also allo ws filtering some noise since in deed it is an Infinite Impulse Response (IIR) l ow-pass filter. In other words, our system is capable of low-pass filtering the wrapped phase as the unwrapping process proceeds. We demonstrate the temporal st ability of this unwrapping feedback system, as well as its low-pass filtering ca pabilities. Our system even outperforms the most common and used unwrapping meth ods that we tested, such as the Flynn's method, the Goldstain's method, and the Ghiglia least-squares method (weighted or unweighted). The comparisons with thes e methods show that our system filters-out some noise while preserving the dynam ic range of the phase-data. Its application areas may cover: optical metrology, synthetic aperture radar systems, magnetic resonance, and those imaging systems where information is obtained as a demodulated wrapped phase map. 2011 Optical S ociety of America. KW - Application area KW - Dynamic range KW - Feedback systems KW - First-order KW - Infinite impulse response KW - Least squares methods KW - Linear dynamic system KW - Low-pass filtering KW - Optical Metrology KW - Phase unwrapping KW - Temporal stability KW - Unwrapping process KW - Wrapped phase map KW - IIR filters

KW - Imaging systems KW - Impulse response KW - Linear control systems KW - Low pass filters KW - Magnetic resonance KW - Radar imaging KW - Radar systems KW - Signal filtering and prediction KW - Signal noise measurement KW - Synthetic aperture radar KW - Least squares approximations N1 - Cited By (since 1996):11 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1364/OE.19.005126 N1 - Correspondence Address: Estrada, J. C.; Centro de Investigaciones en Ptica A. C., Loma del Bosque 115, Col. Lomas del Campestre, 37150, Len Guanajuato, Me xico; email: julio@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79952597405&partnerID=4 0&md5=7eee9adba98ead585c322c49c5fef722 ER TY - JOUR T1 - The SIM time network JF - Journal of Research of the National Institute of Standards and Technology VL - 116 IS - 2 SP - 557 EP - 572 PY - 2011/// AU - Lombardi, M.A. AU - Novick, A.N. AU - Lopez R, J.M. AU - Jimenez, F. AU - De Carlos Lopez, E. AU - Boulanger, J.-S. AU - Pelletier, R. AU - De Carvalho, R.J. AU - Solis, R. AU - Sanchez, H. AU - Quevedo, C.A. AU - Pascoe, G. AU - Perez, D. AU - Bances, E. AU - Trigo, L. AU - Masi, V. AU - Postigo, H. AU - Questelles, A. AU - Gittens, A. AD - National Institute of Standards and Technology (NIST), Boulder, CO 80305, United States AD - Centro Nacional de Metrologia (CENAM), Quertaro, Mexico AD - National Research Council (NRC), Ottawa, Canada AD - National Observatory (ONRJ), Rio de Janeiro, Brazil AD - Centro Nacional de Metrologia de Panama (CENAMEP), Panama City, Panama AD - Instituto Costarricense de Electricidad (ICE), San Jose, Costa Rica AD - Superintendencia de Industria y Comercio (SIC), Bogota, Colombia AD - Bureau of Standards Jamaica (BSJ), Kingston, Jamaica AD - Instituto Nacional de Tecnologia Industrial (INTI), Buenos Aires, Argentin a

AD - Laboratorio Nacional de Metrologia (LNM), Guatemala City, Guatemala AD - Administracion Nacional de Usinas y Trasmisiones Electricas (UTE), Montevi deo, Uruguay AD - Instituto Nacional de Tecnologia Normalizacion y Metrologia (INTN), Asunci on, Paraguay AD - Servicio Nacional de Metrologia (SNM), INDECOPI, Lima, Peru AD - Trinidad and Tobago Bureau of Standards (TTBS), Trinidad and Tobago AD - Saint Lucia Bureau of Standards (SLBS), Castries, Saint Lucia AB - The Sistema Interamericano de Metrologia (SIM) is a regional metrology org anization (RMO) whose members are the national metrology institutes (NMIs) locat ed in the 34 nations of the Organization of American States (OAS). The SIM/OAS r egion extends throughout North, Central, and South America and the Caribbean Isl ands. About half of the SIM NMIs maintain national standards of time and frequen cy and must participate in international comparisons in order to establish metro logical traceability to the International System (SI) of units. The SIM time net work (SIMTN) was developed as a practical, cost effective, and technically sound way to automate these comparisons. The SIMTN continuously compares the time sta ndards of SIM NMIs and produces measurement results in near real-time by utilizi ng the Internet and the Global Positioning System (GPS). Fifteen SIM NMIs have j oined the network as of December 2010. This paper provides a brief overview of S IM and a technical description of the SIMTN. It presents international compariso n results and examines the measurement uncertainties. It also discusses the metr ological benefits that the network provides to its participants. KW - Frequency KW - Internet KW - Regional metrology organization KW - Time KW - Traceability KW - Cost effective KW - Frequency KW - International comparison KW - International system KW - Measurement results KW - Measurement uncertainty KW - National metrology institutes KW - National standard KW - Organization of american state KW - Regional metrology organization KW - South America KW - Time KW - Time standard KW - Traceability KW - Global positioning system KW - Internet KW - Units of measurement KW - Uncertainty analysis N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Lombardi, M. A.; National Institute of Standards a nd Technology (NIST), Boulder, CO 80305, United States; email: michael.lombardi@ nist.gov UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79955509481&partnerID=4 0&md5=1a32ad7ba1608097870d6492ccb6d436 ER TY T1 JF VL JOUR Fractal Metrology for biogeosystems analysis Biogeosciences 7

IS - 11 SP - 3799 EP - 3815 PY - 2010/// AU - Torres-Argelles, V. AU - Oleschko, K. AU - Tarquis, A.M. AU - Korvin, G. AU - Gaona, C. AU - Parrot, J.-F. AU - Ventura-Ramos, E. AD - Universidad Autnoma de Quertaro, Quertaro, Mexico AD - Centro de Geociencias, Universidad Nacional Autnoma de Mxico (UNAM), Blvd. J uriquilla 3001, 76220, Quertaro, Mexico AD - Dept. of Applied Mathematics to Agricultural Engineering (E.T.S.I.A.) C.E. I.G.R.A.M., Technical University of Madrid (U.P.M.), Ciudad Universitaria, 28040 , Madrid, Spain AD - King Fahd University of Petroleum and Minerals, Dhahran 31261, Saudi Arabi a AD - Instituto de Geografa, UNAM, Ciudad Universitaria, Mxico, Distrito Federal, Mexico AB - The solid-pore distribution pattern plays an important role in soil functi oning being related with the main physical, chemical and biological multiscale a nd multitemporal processes of this complex system. In the present research, we s tudied the aggregation process as self-organizing and operating near a critical point. The structural pattern is extracted from the digital images of three soil s (Chernozem, Solonetz and "Chocolate" Clay) and compared in terms of roughness of the gray-intensity distribution quantified by several measurement techniques. Special attention was paid to the uncertainty of each of them measured in terms of standard deviation. Some of the applied methods are known as classical in th e fractal context (box-counting, rescaling-range and wavelets analyses, etc.) wh ile the others have been recently developed by our Group. The combination of the se techniques, coming from Fractal Geometry, Metrology, Informatics, Probability Theory and Statistics is termed in this paper Fractal Metrology (FM). We show t he usefulness of FM for complex systems analysis through a case study of the soi l's physical and chemical degradation applying the selected toolbox to describe and compare the structural attributes of three porous media with contrasting str ucture but similar clay mineralogy dominated by montmorillonites. Author(s) 2010 . KW - biological analysis KW - clay mineral KW - digital image KW - fractal analysis KW - geometry KW - measurement method KW - physicochemical property KW - research work KW - self organization KW - soil degradation KW - uncertainty analysis KW - wavelet KW - Theobroma cacao N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.5194/bg-7-3799-2010 N1 - Correspondence Address: Oleschko, K.; Centro de Geociencias, Universidad N acional Autnoma de Mxico (UNAM), Blvd. Juriquilla 3001, 76220, Quertaro, Mexico; em ail: olechko@servidor.unam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78649484488&partnerID=4

0&md5=f11b0b369874c74f11d23588d54d3532 ER TY - CONF T1 - Electron-beam induced photoresist shrinkage influence on 2D profiles JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7638 PY - 2010/// AU - Bunday, B. AU - Cordes, A. AU - Allgair, J. AU - Aguilar, D.B. AU - Tileli, V. AU - Thiel, B. AU - Avitan, Y. AU - Peltinov, R. AU - Bar-Zvi, M. AU - Adan, O. AU - Chirko, K. AD - International SEMATECH Manufacturing Initiative (ISMI), Austin, TX, 78741, United States AD - Universidad de Las Americas Puebla, Sta. Catarina Martir, Cholula, Puebla, CP 72820, Mexico AD - College of Nanoscale Science and Engineering, University at Albany-SUNY, A lbany, NY 12203, United States AD - PDC Business Group, Applied Materials, 9 Oppenheimer, Rehovot 76705, Israe l AB - For many years, lithographic resolution has been the main obstacle in keep ing the pace of transistor densification to meet Moore's Law. For the 32 nm node and beyond, new lithography techniques will be used, including immersion ArF (i ArF) lithography and extreme ultraviolet lithography (EUVL). As in the past, the se techniques will use new types of photoresists with the capability to print sm aller feature widths and pitches. Also, such smaller feature sizes will require thinner layers of photoresists, such as under 100 nm. In previous papers, we foc used on ArF and iArF photoresist shrinkage. We evaluated the magnitude of shrink age for both R&D and mature resists as a function of chemical formulation, litho graphic sensitivity, scanning electron microscope (SEM) beam condition, and feat ure size. Shrinkage results were determined by the well accepted methodology des cribed in ISMI's CD-SEM Unified Specification. A model for resist shrinkage, whi le derived elsewhere, was presented, that can be used to curve-fit to the shrink age data resulting from multiple repeated measurements of resist features. Param eters in the curve-fit allow for metrics quantifying total shrinkage, shrinkage rate, and initial critical dimension (CD) before e-beam exposure. With these par ameters and exhaustive measurements, a fundamental understanding of the phenomen ology of the shrinkage trends was achieved, including how the shrinkage behaves differently for different sized features. This work was extended in yet another paper in which we presented a 1-D model for resist shrinkage that can be used to curve-fit to shrinkage curves. Calibration of parameters to describe the photor esist material and the electron beam were all that were required to fit the mode l to real shrinkage data, as long as the photoresist was thick enough that the b eam could not penetrate the entire layer of resist. In this paper, we extend thi s work yet again to a 2-D model of a trapezoidal photoresist profile. This model thus allows CD shrinkage in thin photoresist to be solved, which is now of grea t interest for upcoming realistic lithographic processing. It also allows us to predict the change in resist profile with electron dose and the influence of ini tial resist profile on shrinkage characteristics. In this work, the results from the previous paper will be shown to be consistent with numerically simulated re sults, thus lending credibility to these papers' postulations. Also, results fro m this 2-D profile model can also give clues as to how we might, in the future, model the shrinkage of contour edges of 3-D shapes. With these findings, we can

conclude with observations about the readiness of SEM metrology for the challeng es of future photoresist measurement, as well as estimate the errors involved in calculating the original CD from the shrinkage trend. 2010 Copyright SPIE - The International Society for Optical Engineering. KW - 193nm KW - ArF KW - CD-SEM KW - contour KW - EUV KW - iArF KW - immersion KW - metrology KW - photoresist KW - shrinkage KW - slimming KW - VeritySEM4i KW - 193nm KW - ArF KW - CD-SEM KW - contour KW - EUV KW - iArF KW - immersion KW - slimming KW - VeritySEM4i KW - Curve fitting KW - Electron beams KW - Electrons KW - Extreme ultraviolet lithography KW - Lithography KW - Measurement errors KW - Measurements KW - Photoresists KW - Process control KW - Scanning electron microscopy KW - Three dimensional KW - Units of measurement KW - Shrinkage N1 - Cited By (since 1996):6 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 76381L N1 - :doi 10.1117/12.846991 N1 - Correspondence Address: Bunday, B.; International SEMATECH Manufacturing I nitiative (ISMI), Austin, TX, 78741, United States UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79956128673&partnerID=4 0&md5=d4df87786d5998dce8eb56ed32840fe4 ER TY - CONF T1 - International comparison on thermal conductivity measurements of insulatin g materials by guarded hot plate-preliminary results JF - Proceedings of the 30th International Thermal Conductivity Conference and the 18th International Thermal Expansion Symposium, Thermal Conductivity 30/Ther mal Expansion 18 SP - 378 EP - 385 PY - 2010/// AU - Hay, B. AU - Cortes, L.

AU - Doucey, B. AU - Filtz, J.-R. AU - Hammerschmidt, U. AU - Sokolov, N. AU - Stacey, C. AU - Zarr, R. AU - Zhang, J. AD - Laboratoire National de Mtrologie et d'Essais, Scientific and Industrial Me trology Centre, 1 rue Gaston Boissier, 75015 Paris, France AD - Centro Nacional de Metrologa, rea Elctrica, Division de Termometra, Km 4,5 car retera a los Cues, El Marques cp 76241 , Queretaro, Mexico AD - AG 1.74, Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Bra unschweig, Germany AD - D.I. Mendeleyev Institute for Metrology, Moskovsky prospect 19, 190005 St. Petersburg, Russian Federation AD - National Physical Laboratory, Materials Team, Industry and Innovation Divi sion, Teddington, Middlesex, TW11 0LW, United Kingdom AD - Building and Fire Research Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899-8632, United States AD - National Institute of Metrology, Heat Division, Bei San Huan Dong Lu 18, B eijing 100013, China AB - An inter-laboratory comparison on thermal conductivity measurements of ins ulating materials is currently organized under the auspices of the Bureau Intern ational des Poids et Mesures (BIPM). Measurements are carried out by seven Natio nal Metrology Institutes (NMIs) using Guarded Hot Plate apparatus according to t he International Standard ISO 8302. The participants determine the thermal condu ctivity of expanded polystyrene and resin-bonded glass fiber boards at 10C, 23C an d 40C. The comparison is organized as a round-robin test; a set of specimens circ ulates between the NMIs and is, thus, successively measured by them. This pilot study is intended as a first stage for future Key Comparisons between NMIs. Prel iminary results for all above mentioned temperatures show good agreement between laboratories for the mineral wool specimens and the thicker specimens of expand ed polystyrene, with relative deviations within the uncertainties of measurement . KW - Bureau international des poids et mesures KW - Expanded polystyrene KW - Hot plates KW - Interlaboratory comparison KW - International comparison KW - International standards KW - Key comparison KW - National metrology institutes KW - Pilot studies KW - Relative deviations KW - Round Robin test KW - Thermal conductivity measurements KW - Wool specimens KW - Electric conductivity measurement KW - Glass fibers KW - Measurement theory KW - Mineral wool KW - Polystyrenes KW - Resins KW - Thermal conductivity KW - Thermal expansion KW - Uncertainty analysis KW - Thermal insulating materials N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus

N1 - Correspondence Address: Hay, B.; Laboratoire National de Mtrologie et d'Ess ais, Scientific and Industrial Metrology Centre, 1 rue Gaston Boissier, 75015 Pa ris, France UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79551539941&partnerID=4 0&md5=3731b26daa2c893c32b5aca7c61d6999 ER TY - JOUR T1 - Optical fiber metrology to small displacements detection T2 - Metrologa por fibra ptica para la deteccin de pequeos desplazamientos JF - Revista Facultad de Ingenieria IS - 56 SP - 151 EP - 159 PY - 2010/// AU - Duarte, J.E. AU - Morales, F.H.F. AU - Sereno, M.M. AU - Almerich, J.M. AU - Andrs, M.V. AD - Universidad Pedaggica, Tecnolgica de Colombia, Carrera 18, calle 22, Duitama , Boyac, Colombia AD - Universidad de Barcelona, c/Marti i Franqus 1, 08028, Barcelona, Spain AD - Universidad de Valencia, Edificio de Investigacin, C/Dr. Moliner, 5046100 B urjasoot, Valencia, Spain AB - This work presents a methodology to measure defections in the range of mic rons in thermo-pneumatic silicon micomembranes. This method is based on the fibe r optic interferometry, which was used to study the static behavior of a silicon membrane of 10 mm in thickness, 5 mm in side length and 300 mm in bulk, which w as glued to a glass slide. Static behavior is defines as the membrane defection measurement taking into account only its response to the infrared radiation ener gy that drives them. KW - Interferometry KW - Optical fiber KW - Silicon micromenbrane N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Duarte, J.E.; Universidad Pedaggica, Tecnolgica de C olombia, Carrera 18, calle 22, Duitama, Boyac, Spain; email: julioenriqued1@gmail .com UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78650320573&partnerID=4 0&md5=7182266b0466ac4c2218a3d9c293efcd ER TY - SER T1 - Fringe-pattern demodulation using a parametric method based on differentia l evolution JF - Lecture Notes in Computer Science (including subseries Lecture Notes in Ar tificial Intelligence and Lecture Notes in Bioinformatics) VL - 6256 LNCS SP - 61 EP - 70 PY - 2010/// AU - Jimenez, J.F. AU - Cuevas, F.J. AU - Sossa, J.H. AU - Gomez, L.E. AD - Centro de Investigacin en Computacin-IPN, Unidad Profesional Adolfo-Lpez Mate os, Av. Juan de Dios Batiz s/n and M. Othon de Mendizabal, Zacatenco, Mxico, DF. 07738, Mexico

AD - Centro de Investigaciones en ptica A.C., Loma del Bosque 115, Col. Lomas de l Campestre C.P. 37150, Len Gto., Mexico AB - A parametric method to carry out fringe pattern demodulation by means of D ifferential Evolution is presented. The phase is approximated by the parametric estimation of an nth-grade polynomial so that no further unwrapping is required. On the other hand, a different parametric function can be chosen according to t he prior knowledge of the phase behavior. A differential evolution is codified w ith the parameters of the function that estimates the phase. The differential ev olution evolves until a fitness average threshold is obtained. The method can de modulate noisy fringe patterns and even a one-image closed-fringe pattern succes sfully. 2010 Springer-Verlag Berlin Heidelberg. KW - Differential Evolution KW - Fringe analysis KW - Optical metrology KW - Phase retrieval KW - Differential Evolution KW - Fitness average KW - Fringe analysis KW - Fringe pattern KW - Fringe-pattern demodulation KW - Optical Metrology KW - Parametric estimation KW - Parametric functions KW - Parametric method KW - Phase retrieval KW - Prior knowledge KW - Demodulation KW - Optical variables measurement KW - Pattern recognition KW - Evolutionary algorithms N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/978-3-642-15992-3_7 N1 - Correspondence Address: Jimenez, J. F.; Centro de Investigacin en Computacin -IPN, Unidad Profesional Adolfo-Lpez Mateos, Av. Juan de Dios Batiz s/n and M. Ot hon de Mendizabal, Zacatenco, Mxico, DF. 07738, Mexico; email: jfvielma@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78751550735&partnerID=4 0&md5=5f4a0ac9d5c2201af2d96ee60e18e03d ER TY - CONF T1 - Neonatal videokeratometer: Basic design of a portable device and evaluatio n method JF - AIP Conference Proceedings VL - 1310 SP - 56 EP - 59 PY - 2010/// AU - Molina, A.E. AU - Uribe, R.D. AU - Ortiz, M.R. AD - Universidad Nacional Autnoma de Mxico, Centro de Ciencias Aplicadas y de Des arrollo Tecnolgico, Apto. Postal 70-186, C.P. 04350, Mxico D.F., Mexico AD - Hospital Infantil de Mxico Federico Gmez, Servicio de Oftalmologa, C.P. 06720 , Mxico D.F., Mexico AB - Initial laboratory tests to adjust the device parameters and dimension for the first prototype of the videokeratometer, are presented. These tests were ma de for a calibration sphere r = 6.34 mm, a very close value to the reported vert ex radius of curvature of an infant cornea. Also, the quantitative method for as sessing the shape of the corneal surface using programming algorithms is present

ed. The shape of the corneal surface can be obtained from the normal at each poi nt on the surface; the normal is related to the coordinates of the center of eac h spot (centroids) in the image plane and these centroids are related to the coo rdinates of the drops shaped spots in the null screen. 2010 American Institute o f Physics. KW - Centroids KW - Dioptric power KW - Keratometry KW - Null screens KW - Optical metrology N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1063/1.3531607 N1 - Correspondence Address: Molina, A. E.; Universidad Nacional Autnoma de Mxico , Centro de Ciencias Aplicadas y de Desarrollo Tecnolgico, Apto. Postal 70-186, C .P. 04350, Mxico D.F., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78650865705&partnerID=4 0&md5=d6d740f8a88c1feec51dce6413f3d267 ER TY - JOUR T1 - Current controversies in spondyloarthritis: SPARTAN JF - Journal of Rheumatology VL - 37 IS - 12 SP - 2617 EP - 2623 PY - 2010/// AU - Weisman, M. AU - Learch, T.J. AU - Baraliakos, X. AU - Chandran, V. AU - Gladman, D.D. AU - Raychaudhuri, S.P. AU - Xu, H. AU - Collantes-Estvez, E. AU - Vzquez-Mellado, J. AU - Mease, P.J. AU - Sieper, J. AU - Deodhar, A.A. AU - Colbert, R.A. AU - Clegg, D.O. AD - Medical Center, Los Angeles, CA, United States AD - Rheumazentrum Ruhrgebiet Herne, Ruhr-University Bochum, Germany AD - University of Toronto, Toronto, ON, Canada AD - University of California, Davis, CA, United States AD - Shanghai Changzheng Hospital, Second Military Medical University, Shanghai , China AD - University Hospital of Cordoba, Cordoba, Spain AD - Hospital General de Mexico, Mexico City, Mexico AD - Swedish Medical Center, University of Washington, Seattle, WA, United Stat es AD - Rheumatology, Charit, Campus Benjamin Franklin, Berlin, Germany AD - Oregon Health and Science University, Portland, OR, United States AD - National Institutes of Health, Bethesda, MD, United States AD - University of Utah School of Medicine, 50 North Medical Drive, Salt Lake C ity, UT 84132, United States AB - The Spondyloarthritis Research and Therapy Network (SPARTAN), founded in 2 003 to promote research, education, and treatment of ankylosing spondylitis (AS)

and related forms of spondyloarthritis (SpA), held its 7th Annual Research and Education Meeting in July 2009 in Houston, Texas. Current controversies in SpA d iscussed during the meeting included an update on the epidemiology of AS, axial SpA, and inflammatory back pain; the adequacy of the mSASS to assess radiographi c involvement; the helpfulness of magnetic resonance imaging in assessing diseas e progression; the reliability of metrology in assessing damage; and whether bio logic agents alter the course of AS. Presentations also were made on psoriasis i n the SCID mouse model; the challenges and opportunities of SpA in China; a disc ussion of the special needs in managing SpA in Ibero-America, and the SPARK Surv ey in Europe and North America. The Journal of Rheumatology Copyright 2010. All rights reserved. KW - Ankylosing spondylitis KW - Epidemiology KW - Spondyloarthritis KW - Spondyloarthropathies KW - abatacept KW - adalimumab KW - cyclosporin KW - disease modifying antirheumatic drug KW - etanercept KW - HLA B27 antigen KW - infliximab KW - interleukin 17 KW - interleukin 23 receptor KW - nonsteroid antiinflammatory agent KW - tumor necrosis factor alpha inhibitor KW - ankylosing spondylitis KW - backache KW - bone radiography KW - China KW - chromosome 2 KW - chromosome 21 KW - clinical assessment KW - clinical feature KW - competitive inhibition KW - computer assisted tomography KW - conference paper KW - disease course KW - Europe KW - genetic association KW - genotype KW - human KW - inflammatory back pain KW - medical research KW - medical society KW - nonhuman KW - North America KW - nuclear magnetic resonance imaging KW - prevalence KW - priority journal KW - psoriasis KW - psoriatic arthritis KW - quality of life KW - rheumatoid arthritis KW - SCID mouse KW - T lymphocyte activation KW - Th17 cell KW - United States KW - Animals KW - Central America

KW - Congresses as Topic KW - Disease Models, Animal KW - Disease Progression KW - Europe KW - Humans KW - Magnetic Resonance Imaging KW - Mexico KW - Mice KW - Mice, SCID KW - North America KW - Psoriasis KW - Spondylarthritis KW - Spondylitis, Ankylosing KW - Texas N1 - Cited By (since 1996):5 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.3899/jrheum.100890 N1 - Correspondence Address: Clegg, D. O.; University of Utah School of Medicin e, 50 North Medical Drive, Salt Lake City, UT 84132, United States; email: Danie l.Clegg@hsc.utah.edu UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78649743776&partnerID=4 0&md5=3507465fe98d45599dc5ca6e33dc4265 ER TY - CONF T1 - Problem of Talbot self-images localization: Adaptive photo-EMF-based detec tor vs. CCD-based methods JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7750 PY - 2010/// AU - Guzar-Iturbide, I. AU - De La Fraga, L.G. AU - Rodrguez-Montero, P. AU - Mansurova, S. AD - INAOE, Apartado Postal 51 y 216, Puebla 72000, Mexico AD - Cinvestav, Departamento de Computacin, Av. IPN 2508, Mexico D.F., Mexico AB - Talbot self-images localization is important in many optical applications such as interferometry, metrology and nanolithography. Usually, the problem of s elf-images localization is reduced to the finding the planes of maximal light pa ttern visibility. There are several conventional techniques that determine the c ontrast of an intensity distribution generated by a periodical object, such as r oot mean square (RMS) method, and variogram-based method. In all these cases, a CCD camera is used to record the light patterns that are processed and analyzed in order to find the self-image position. Recently, it has been proposed the use an adaptive photo-detector based on the non-steadystate photo-electromotive for ce (photo-EMF) effect, which uses periodically oscillating light pattern to indu ce alternating current through the short-circuited photoconductive sample. Here we perform the theoretical analysis of the technique based on the photo-EMF effe ct against the conventional methods for the localization of the Talbot patterns. 2010 Copyright SPIE - The International Society for Optical Engineering. KW - non-steady-state photo-EMF effect KW - Ronchi grating KW - Talbot effect KW - Alternating current KW - Conventional methods KW - Conventional techniques KW - Image position KW - Intensity distribution KW - Light patterns

KW - Optical applications KW - Photo-electromotive force KW - Photo-emf KW - Ronchi grating KW - Root mean square methods KW - Talbot effects KW - Talbot self-images KW - Variograms KW - Cameras KW - Electromotive force KW - Optical properties KW - Plasmons KW - CCD cameras N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 77500Y N1 - :doi 10.1117/12.873399 N1 - Correspondence Address: Guzar-Iturbide, I.; INAOE, Apartado Postal 51 y 216 , Puebla 72000, Mexico; email: giturbide@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78049485137&partnerID=4 0&md5=c442d24320813115f32ef14b547dc266 ER TY - CONF T1 - Scattering from moderately rough interfaces between two arbitrary media JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7794 PY - 2010/// AU - Harvey, J.E. AU - Choi, N. AU - Krywonos, A. AU - Schrder, S. AU - Penalver, D.H. AD - CREOL: the College of Optics and Photonics, University of Central Florida, P. O. Box 162700, Orlando, FL 32826, United States AD - Fraunhofer IOF, Jena, Germany AD - National Institute of Astrophysics Optics and Electronics (INAOE), Mexico, Mexico AB - The generalized Harvey-Shack (GHS) surface scatter theory has been shown t o accurately predict the BRDF produced by moderately rough mirror surfaces from surface metrology data. The predicted BRDF also holds for both large incident an d scattering angles. Furthermore, it provides good agreement with the classical Rayleigh-Rice theory for those surfaces that satisfy the smooth-surface criterio n. The two-dimensional band-limited portion of the surface PSD contributing to s cattered radiation is discussed and illustrated for arbitrary incident angles, a nd the corresponding relevant roughness necessary to calculate the total integra ted scatter (TIS) is determined. It is shown that BRDF data measured with a larg e incident angle can be used to expand the range of surface roughness for which the inverse scattering problem can be solved; i.e., for which the surface PSD ca n be calculated from measured BRDF data. This PSD and the GHS surface scatter th eory can then be used to calculate the BRDF of that surface for arbitrary incide nt angles and wavelengths that do not satisfy the smooth-surface criterion. Fina lly, the surface transfer function characterizing both the BTDF and the BRDF of a moderately rough interface separating two media of arbitrary refractive index is derived in preparation for modeling the scattering of structured thin film so lar cells. 2010 SPIE. KW - BRDF KW - BTDF KW - Surface PSD KW - Surface roughness

KW - Surface scatter KW - Arbitrary refractive index KW - BRDF KW - BTDF KW - Incident angles KW - Inverse scattering problems KW - Mirror surfaces KW - Rayleigh-Rice theories KW - Rough interfaces KW - Scattered radiations KW - Scattering angles KW - Surface metrology KW - Surface scatter KW - Surface transfer KW - Thin film solar cells KW - Total integrated scatters KW - Film preparation KW - Geometrical optics KW - Metal analysis KW - Optical systems KW - Refractive index KW - Scattering KW - Surface measurement KW - Surface properties KW - Two dimensional KW - Surface roughness N1 - Cited By (since 1996):5 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 77940V N1 - :doi 10.1117/12.863995 N1 - Correspondence Address: Harvey, J. E.; CREOL: the College of Optics and Ph otonics, University of Central Florida, P. O. Box 162700, Orlando, FL 32826, Uni ted States UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77958194537&partnerID=4 0&md5=4b1b8aa1a8556b65939fc5123a682992 ER TY - CONF T1 - Topography measurement of specular and diffuse surfaces JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7792 PY - 2010/// AU - Garca, D.I.S. AU - Garca, A.M. AU - Rayas-Alvarez, J.A. AD - Centro de Investigaciones en ptica, Loma del Bosque 115, Col. Lomas del Cam pestre, C.P. 7150. Len GTO, Mexico AB - We measured the topography of lens by using a technique of diffuse reflect ion (fringe projection technique) and by a method based on specular reflection t echnique (similar to Placido disk system). The obtained results with both techni ques are compared with those obtained with a spherometer. The retrieval of the t hree-dimensional shape of the lens is an issue of great interest for wide medica l application, particularly in ophthalmology. 2010 SPIE. KW - Fringe projection KW - Optical metrology KW - Placido rings KW - Topography of lens KW - Diffuse reflection KW - Diffuse surfaces

KW - Fringe projection KW - Fringe projection techniques KW - Optical Metrology KW - Placido disks KW - Placido rings KW - Specular reflections KW - Three-dimensional shape KW - Topography measurement KW - Diffraction KW - Lenses KW - Medical applications KW - Optical instruments KW - Optical systems KW - Three dimensional KW - Topography N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 77921A N1 - :doi 10.1117/12.871112 N1 - Correspondence Address: Garca, D. I. S.; Centro de Investigaciones en ptica, Loma del Bosque 115, Col. Lomas del Campestre, C.P. 7150. Len GTO, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77958039362&partnerID=4 0&md5=51971b0d5a8131ff02965d24599a3314 ER TY - JOUR T1 - Fundamental aspects for accrediting medical equipment calibration laborato ries in Colombia T2 - Aspectos fundamentales para la acreditacin de laboratorios de calibracin de equipos mdicos en Colombia JF - Revista de Salud Publica VL - 12 IS - 1 SP - 126 EP - 134 PY - 2010/// AU - Llamosa-Rincn, L.E. AU - Lpez-Isaza, G.A. AU - Villarreal-Castro, M.F. AD - Facultad de Ciencias Bsicas, Departamento de Fsica, Universidad Tecnolgica de Pereira, Colombia AD - Facultad de Tecnologas, Escuela de Tecnologa Industrial, Universidad Tecnolgi ca de Pereira, Colombia AD - Laboratorio de Metrologa Electromdica, Universidad Tecnolgica de Pereira, Col ombia AB - Objective Analysing the fundamental methodological aspects which should be considered when drawing up calibration procedure for electro-medical equipment, thereby permitting international standard-based accreditation of electro-medica l metrology laboratories in Colombia. Methods NTC-ISO-IEC 17025:2005 and GTC-51based procedures for calibrating electro-medical equipment were implemented and then used as patterns. Results The mathematical model for determining the estima ted uncertainty value when calibrating electro-medical equipment for accreditati on by the Electrical Variable Metrology Laboratory's Electro-medical Equipment C alibration Area accredited in compliance with Superintendence of Industry and Co mmerce Resolution 25771 May 26th 2009 consists of two equations depending on the case; they are: Conclusion The mathematical modelling implemented for measuring uncertainty in the Universidad Tecnolgica de Pereira's Electrical Variable Metro logy Laboratory (Electro-medical Equipment Calibration Area) will become a good guide for calibration initiated in other laboratories in Colombia and Latin-Amer ica.

KW - Accreditation KW - Calibration KW - Equipment safety KW - Uncertainty KW - accreditation KW - article KW - calibration KW - Colombia KW - electrical equipment KW - laboratory KW - mathematics KW - reproducibility KW - standard KW - Accreditation KW - Calibration KW - Colombia KW - Electrical Equipment and Supplies KW - Laboratories KW - Mathematics KW - Reproducibility of Results N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Llamosa-Rincn, L. E.; Facultad de Ciencias Bsicas, D epartamento de Fsica, Universidad Tecnolgica de PereiraColombia; email: lellamo@ut p.edu.co UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77958067510&partnerID=4 0&md5=490b8ca647ed9acf5a7cc06ce773af97 ER TY - JOUR T1 - What to teach about Metrology to the chemist? A contents proposal T2 - qu ensear de metrologa al qumico? una propuesta de contenidos JF - Educacion Quimica VL - 21 IS - 4 SP - 324 EP - 331 PY - 2010/// AU - De Los Olvera-Trevino, M.A. AD - Facultad de Qumica, Universidad Nacional Autnoma de Mxico, Av. Ciudad Univers itaria 3000, Ciudad Universitaria, 04510 Mxico, D.F, Mexico AB - Metrology is the science of measurement and its applications; one of his c oncerns is to obtain reliable measurements through an international framework. C urrently, metrology demands the formation of qualified professionals to accompli sh the international scheme. This scheme contemplates the ability to develop new measurement methods, to demonstrate the technical competence of assay laborator ies, to calibrate instruments, to evaluate personnel performance, to evaluate as say methods, to organize aptitude essays and specially to design, preparation an d certification of reference materials using primary methods. This work proposes activity areas related with metrology that the chemist could cope as well as th e associated competences with every activity. In this manner, it is proposed a s et of knowledge, skills and attitudes related among them that could facilitate t he accomplishment of mentioned activity. Universidad Nacional Autnoma de Mxico. KW - Competences of chemist KW - Metrology KW - Metrology international scheme KW - Science of measurement N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Olvera-Trevino, M. A.; Facultad de Qumica, Universid

ad Nacional Autnoma de Mxico, Av. Ciudad Universitaria 3000, Ciudad Universitaria, 04510 Mxico, D.F, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79951729052&partnerID=4 0&md5=b8e2d0d37647ec3fcb0c8bee60b9868b ER TY - JOUR T1 - Error-free demodulation of pixelated carrier frequency interferograms JF - Optics Express VL - 18 IS - 17 SP - 18492 EP - 18497 PY - 2010/// AU - Servin, M. AU - Estrada, J.C. AD - Centro de Investigaciones en Optica A.C., Loma del Bosque 115, 37150 Leon Guanajuato, Mexico AB - Recently, pixelated spatial carrier interferograms have been used in optic al metrology and are an industry standard nowadays. The main feature of these in terferometers is that each pixel over the video camera may be phase-modulated by any (however fixed) desired angle within [0,2] radians. The phase at each pixel is shifted without cross-talking from their immediate neighborhoods. This has op ened new possibilities for experimental spatial wavefront modulation not dreamed before, because we are no longer constrained to introduce a spatial-carrier usi ng a tilted plane. Any useful mathematical model to phase-modulate the testing w avefront in a pixel-wise basis can be used. However we are nowadays faced with t he problem that these pixelated interferograms have not been correctly demodulat ed to obtain an error-free (exact) wavefront estimation. The purpose of this pap er is to offer the general theory that allows one to demodulate, in an exact way , pixelated spatial-carrier interferograms modulated by any thinkable two-dimens ional phase carrier. 2010 Optical Society of America. KW - Carrier frequency KW - General theory KW - Industry standards KW - Interferograms KW - Optical Metrology KW - Tilted planes KW - Wavefront estimation KW - Mathematical models KW - Pixels KW - Video cameras KW - Wavefronts KW - Interferometry N1 - Cited By (since 1996):5 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1364/OE.18.018492 N1 - Correspondence Address: Servin, M.; Centro de Investigaciones en Optica A. C., Loma del Bosque 115, 37150 Leon Guanajuato, Mexico; email: mservin@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77956370757&partnerID=4 0&md5=9a9edb0dc499cccb2bedd9a2c04bc80c ER TY T1 JF VL IS SP JOUR Mobile calibration based on laser metrology and approximation networks Sensors 10 8 7681

EP - 7704 PY - 2010/// AU - Apolinar Muoz-Rodriguez, J. AD - Centro de Investigaciones en Optica, Loma del Bosque 115, Col. Lomas del c ampestre, C.P. 37150, Leon, Guanajuato, Mexico AB - A mobile calibration technique for three-dimensional vision is presented. In this method, vision parameters are computed automatically by approximation ne tworks built based on the position of a camera and image processing of a laser l ine. The networks also perform three-dimensional visualization. In the proposed system, the setup geometry can be modified online, whereby an online re-calibrat ion is performed based on data provided by the network and the required modifica tions of extrinsic and intrinsic parameters are thus determined, overcoming any calibration limitations caused by the modification procedure. The mobile calibra tion also avoids procedures involving references, which are used in traditional online re-calibration methods. The proposed mobile calibration thus improves the accuracy and performance of the three-dimensional vision because online data of calibrated references are not passed on to the vision system. This work represe nts a contribution to the field of online re-calibration, as verified by a compa rison with the results based on lighting methods, which are calibrated and re-ca librated via perspective projection. Processing time is also studied. 2010 by th e authors. KW - Bezier networks KW - Laser line projection KW - Mobile calibration KW - Three-dimensional vision KW - algorithm KW - article KW - calibration KW - image processing KW - laser KW - methodology KW - theoretical model KW - three dimensional imaging KW - Algorithms KW - Calibration KW - Image Processing, Computer-Assisted KW - Imaging, Three-Dimensional KW - Lasers KW - Models, Theoretical N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.3390/s100807681 N1 - Correspondence Address: Apolinar Muoz-rodriguez, J.; Centro de Investigacio nes en Optica, Loma del Bosque 115, Col. Lomas del campestre, C.P. 37150, Leon, Guanajuato, Mexico; email: munoza@foton.cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77957224837&partnerID=4 0&md5=312f64edd7ff3d14bdadae60d000a6e3 ER TY - SER T1 - A parametric method applied to phase recovery from a fringe pattern based on a particle swarm optimization JF - Lecture Notes in Computer Science (including subseries Lecture Notes in Ar tificial Intelligence and Lecture Notes in Bioinformatics) VL - 6076 LNAI IS - PART 1 SP - 40 EP - 47 PY - 2010///

AU - Jimenez, J.F. AU - Cuevas, F.J. AU - Sossa, J.H. AU - Gomez, L.E. AD - Centro de Investigacin en Computacin, IPN, Unidad Profesional Adolfo-Lpez Mat eos, Av. Juan de Dios Batiz s/n and M. Othon de Mendizabal, Zacatenco, Mxico, DF. 07738, Mexico AD - Centro de Investigaciones en ptica, A.C. Loma del Bosque #115, Col. Lomas d el Campestre, C.P. 37150, Len Gto., Mexico AB - A parametric method to carry out fringe pattern demodulation by means of a particle swarm optimization is presented. The phase is approximated by the para metric estimation of an nth-grade polynomial so that no further unwrapping is re quired. On the other hand, a different parametric function can be chosen accordi ng to the prior knowledge of the phase behavior. A particle swarm is codified wi th the parameters of the function that estimates the phase. A fitness function i s established to evaluate the particles, which considers: (a) the closeness betw een the observed fringes and the recovered fringes, (b) the phase smoothness, (c ) the prior knowledge of the object as its shape and size. The swarm of particle s evolves until a fitness average threshold is obtained. The method was able to successfully demodulate noisy fringe patterns and even a one-image closed-fringe pattern. 2010 Springer-Verlag. KW - Fringe analysis KW - Optical metrology KW - Particle Swarm Optimization KW - Phase retrieval KW - Fitness average KW - Fitness functions KW - Fringe analysis KW - Fringe pattern KW - Fringe-pattern demodulation KW - Optical Metrology KW - Parametric estimation KW - Parametric functions KW - Parametric method KW - Particle swarm KW - Phase recovery KW - Phase retrieval KW - Prior knowledge KW - Shape and size KW - Artificial intelligence KW - Function evaluation KW - Particle swarm optimization (PSO) N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/978-3-642-13769-3_5 N1 - Correspondence Address: Jimenez, J. F.; Centro de Investigacin en Computacin , IPN, Unidad Profesional Adolfo-Lpez Mateos, Av. Juan de Dios Batiz s/n and M. O thon de Mendizabal, Zacatenco, Mxico, DF. 07738, Mexico; email: jfvielma@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77954580037&partnerID=4 0&md5=6c23a70c35eb78c2a25cfbfd54a3a574 ER TY T1 JF VL SP EP PY AU CONF Advances on talbot projection profilometry AIP Conference Proceedings 1236 409 418 2010/// Rodriguez-Vera, R.

AU - Rayas, J.A. AU - Mendoza-Santoyo, F. AU - Aranda, A. AD - Centro de Investigaciones en Optica, A.C. Loma del Bosque No. 115, Col. Lom as del campestre, Leon, Gto., Mexico AB - When a periodic screen is illuminated with a monochromatic plane wavefront , it is formed exact replicas of the screen in defined planes along the illumina tion direction. This phenomenon is known as the Talbot effect or self-imaging. I f a Talbot image of a linear grating is formed on a surface structure under stud y, the grating lines are deformed according to the topography of the structure s urface. The deformed fringe image is captured with a CCD camera and processed fo r obtaining a wrapped phase map by means of the Fourier transform method. From t he unwrapped phase map, the profile of the structure surface is obtained. In thi s work some advances of the Talbot projection profilometry (TPP) are presented, in particular, its use in macro and microscopic experimental mechanics. To macro scopic level, an inverse problem is described. This problem consists on using th e TPP technique as a force sensor: Knowing the Young's modulus of a material sub jected to a mechanical deformation, determine the field of forces that produce t he deformation. From this last procedure, experimental results are shown using a latex membrane as the structure subjected to a uniform load taken place by an a pplied pressure. Additionally, the detected force limits with the proposed exper imental setup are shown. 2010 American institute of Physics. KW - Optical metrology KW - Pressure measuring KW - Profilometry KW - Structured light illumination KW - Talbot projection fringe N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Rodriguez-Vera, R.; Centro de Investigaciones en Op tica, A.C. Loma del Bosque No. 115, Col. Lomas del campestre, Leon, Gto., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77954613974&partnerID=4 0&md5=9abc096878583ad2f76ac5f4b99b632f ER TY - JOUR T1 - Medicon de la evolucin temporal de los campos dinmicos de desplazamiento medi ante interferometra de moteado para una probeta de latn JF - Revista Mexicana de Fisica VL - 56 IS - 3 SP - 262 EP - 267 PY - 2010/// AU - Martnez, A. AU - Rayas, J.A. AU - Madrid Garay, J.C. AD - Centro de Investigaciones en ptica, A.C. Loma del Bosque 115, Col. Lomas de l Campestre, Len, Gto, Mexico AD - Universidad de La Salle Bajo, Av. Universidad 602, Col. Lomas del Campestre , Lon, Gto, Mexico AB - In this work, we have used the speckle interferometry technique and 3-step s-phase shifting to evaluate the displacement fields induced on a sample by mech anical load. The specimen was a brass sheet metal, 3 mm thick and an area of 210 mm3 mm. The sample was tested on an Instron machine working in tension at a cons tant speed. The mechanical load was controlled by using of a computer. Additiona l to the displacement fields, stress fields and Young's modulus were obtained. 2 010 Sociedad Mexicana de Fsica. KW - Mechanical stress fields KW - Optical metrology

KW - Speckle interferometry KW - Young's modulus N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Martnez, A.; Centro de Investigaciones en ptica, A.C . Loma del Bosque 115, Col. Lomas del Campestre, Len, Gto, Mexico; email: amalia@ cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77957310709&partnerID=4 0&md5=88a6747bf1240bb3dbff8abddd2f7a65 ER TY - JOUR T1 - A traceability scheme for materials metrology JF - Metrologia VL - 47 IS - 2 SP - S18 EP - S22 PY - 2010/// AU - Salas-Tellez, J.A. AU - Guardado-Perez, J.A. AU - Rosas-Gutierrez, F. AU - Mitani, Y. AD - Centro Nacional de Metrologia, Carretera A Los Cues, El Marques, QRO, CP 7 6246, Mexico AB - A schematic traceability chain is proposed similar to the traceability sch eme in chemical measurements, in which calibration hierarchy is established by c onsecutive sets of three components, namely measurement standard, measurement sy stem and measurement procedure. The calibration hierarchy is established among s ets of measurement levels, which are characterized by the associated uncertainty that is assigned or achieved to the value assignment process or calibration pro vided. By taking particle size measurements as an example, a scheme of the imple mentation of traceability is explained in which proper establishment of three re spective elements are illustrated: method or procedure, measurement system and s tandard or reference material. 2010 BIPM & IOP Publishing Ltd. KW - Chemical measurements KW - Measurement procedures KW - Measurement standards KW - Measurement system KW - Particle size measurement KW - Reference material KW - Three component KW - Value assignment KW - Calibration KW - Particle size KW - Uncertainty analysis KW - Measurements N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1088/0026-1394/47/2/S02 N1 - Correspondence Address: Salas-Tellez, J. A.; Centro Nacional de Metrologia , Carretera A Los Cues, El Marques, QRO, CP 76246, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77949380492&partnerID=4 0&md5=9fa7939decfcb02ee477bde342e20d51 ER TY T1 iance JF JOUR Measurement of the nonlinearity of Ge-and InGaAs-photodiodes at high irrad levels Mapan - Journal of Metrology Society of India

VL - 25 IS - 1 SP - 47 EP - 52 PY - 2010/// AU - Lpez, M. AU - Molina, J.C. AU - Hofer, H. AU - Sperling, A. AU - Kck, S. AD - Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany AD - Centro Nacional de Metrologa, Quertaro, Mexico AB - We present the measurements and the analysis of nonlinearity of Ge- and In GaAs-photodiodes responsivity measured at high irradiance levels (up to 90 mW / mm 2) in the near infrared. The nonlinearity was measured using a fiber-optics-b ased setup which employs the Differential Spectral Responsivity (DSR) technique. The measurements of the nonlinearity were carried out at different laser beam d iameters with fiber optic attachment as well as open-beam. All photodiodes inves tigated present a nonlinarity of the saturation type, which depends on the beam diameter of the radiation source. 2010 Metrology Society of India. N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s12647-010-0008-8 N1 - Correspondence Address: Lpez, M.; Physikalisch-Technische Bundesanstalt (PT B), Braunschweig, Germany; email: marco.lopez@ptb.de UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77952415660&partnerID=4 0&md5=b1218b7425c76197e0674ba062f05a02 ER TY - JOUR T1 - Determining the time-frequency parameters of low-power bright picosecond o ptical pulses by using the interferometric technique JF - Optik VL - 121 IS - 5 SP - 426 EP - 434 PY - 2010/// AU - Shcherbakov, A.S. AU - Muoz Zurita, A.L. AU - Kosarsky, A.Yu. AU - Campos Acosta, J. AD - Department of Optics, National Institute for Astrophysics, Optics, A.P. 51 and 216, Puebla, Pue. 72000, Mexico AD - LLC Petro, Peterhoff Chausse 71, Saint-Petersburg, 198206, Russian Federat ion AD - Department of Metrology, Institute for Applied Physics (IFA-CSIC), Serrano 144, Madrid, 28006, Spain AB - We present an approach to the characterization of low-power bright picosec ond optical pulses with an internal frequency modulation simultaneously in both time and frequency domains in practically much used case of the Gaussian shape. This approach exploits the Wigner time-frequency distribution, which can be foun d for these bright pulses by using a novel interferometric technique under our p roposal. Then, the simplest two-beam scanning Michelson interferometer is select ed for shaping the field-strength auto-correlation function of low-power picosec ond pulse trains. We are proposing and considering in principle the key features of a new experimental technique for accurate and reliable measurements of the t rain-average width as well as the value and sign of the frequency chirp of pulse s in high-repetition-rate trains. This technique is founded on an ingenious algo

rithm for the advanced metrology, assumes using a specially designed supplementa ry semiconductor cell, and suggests carrying out a pair of additional measures w ith exploiting this semiconductor cell. Such a procedure makes possible construc ting the Wigner distribution and describing the above-listed time-frequency para meters of low-power bright picosecond optical pulses. In the appendix, we follow one of possible avenues for deriving the joint Wigner time-frequency distributi on via choosing the Weil's correspondence between classical functions and operat ors. 2008 Elsevier GmbH. All rights reserved. KW - Bright picosecond optical pulse KW - Interferometric technique KW - Wigner time-frequency distribution KW - Autocorrelation functions KW - Average width KW - Beam scanning KW - Bright pulse KW - Experimental techniques KW - Frequency chirp KW - Frequency domains KW - Gaussian shape KW - High repetition rate KW - Interferometric techniques KW - Internal frequency KW - Key feature KW - Low Power KW - Optical pulse KW - Pico-second pulse KW - Picoseconds KW - Reliable measurement KW - Time-frequency distributions KW - Time-frequency parameter KW - Wigner Distribution KW - Design KW - Distribution functions KW - Frequency modulation KW - Interferometry KW - Light pulse generators KW - Locomotives KW - Mathematical operators KW - Michelson interferometers KW - Quantum optics KW - Railroad cars KW - Pulse repetition rate N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.ijleo.2008.07.033 N1 - Correspondence Address: Shcherbakov, A.S.; Department of Optics, National Institute for Astrophysics, Optics, A.P. 51 and 216, Puebla, Pue. 72000, Mexico; email: alex@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77249108987&partnerID=4 0&md5=984f643e7be3cfd30750ddaefc9028db ER TY - JOUR T1 - Computer vision of the foot sole based on laser metrology and algorithms o f artificial intelligence JF - Optical Engineering VL - 48 IS - 12 PY - 2009///

AU - Muoz-Rodrguez, J.A. AD - Centro de Investigaciones en Optica A.C., Apartado Postal 1-948, Len, GTO 3 7150, Mexico AB - An automatic technique for the 3-D vision of the foot sole is presented. T his technique is performed by means of laser metrology and approximation network s. To retrieve the topography, the foot sole is scanned by a laser line through a glass window. The contouring of the foot sole is based on the behavior of the laser line. This 3-D modeling is performed by an approximation network. The stru cture of this network is built based on the line shift that is generated due to surface variation and the camera position. Also, the intrinsic and extrinsic par ameters of the vision system are computed based on the network. In this manner, online setup modifications can be performed. Thus, the external measurements are not passed to the vision system. In this manner, the accuracy and the performan ce are improved because physical measurements are avoided. The approach of this vision system is to fit the shoe sole mold to the foot sole via contour curves. The results are evaluated by means of a root mean square of error using referenc es from a contact method. Thus, a contribution in computer vision is achieved fo r profitable shoe design. The processing time is also described. 2009 Society of Photo-Optical Instrumentation Engineers. KW - approximation networks KW - computer vision KW - foot sole KW - laser line metrology KW - 3-d modeling KW - 3-D vision KW - Approximation networks KW - Automatic technique KW - Camera positions KW - Contact methods KW - foot sole KW - Glass windows KW - Intrinsic and extrinsic parameters KW - laser line metrology KW - Laser lines KW - Laser metrology KW - Line shifts KW - Physical measurement KW - Processing Time KW - Root Mean Square KW - Shoe soles KW - Surface variations KW - Vision systems KW - Artificial intelligence KW - Computer networks KW - Glass lasers KW - Profitability KW - Three dimensional KW - Units of measurement KW - Computer vision N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 123604 N1 - :doi 10.1117/1.3275455 N1 - Correspondence Address: Muoz-Rodrguez, J. A.; Centro de Investigaciones en Optica A.C., Apartado Postal 1-948, Len, GTO 37150, Mexico; email: munoza@foton.c io.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-79952337941&partnerID=4 0&md5=18fd02b9c1bc90b10437cb2264e4b2b6 ER -

TY - CONF T1 - Gear inspection and reconstruction based on laser metrology and computer a lgorithms JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7499 PY - 2009/// AU - Contreras, I.T. AU - Apolinar Muoz Rodrguez, J. AU - Campos, G.G. AD - Centro de Ingeniera y Desarrollo Industrial, Quertaro, 76130, Mexico AD - Centro de Investigaciones en Optica, A. C. Leon, Gto, 37150, Mexico AB - An automatic technique for gear reconstruction is presented. In this techn ique, the gear modeling is performed by means of an approximation network. To ca rry it out, a vision system is implemented based on laser metrology. The approxi mation network is performed based on the gear pattern. To perform the contouring , the gear is scanned by a laser line. This process involves image processing of a laser line pattern. The network performs the gear modeling without measuremen ts on the optical setup. In this manner, errors of the measurement are not added to the computational model. Thus, the setup performance and accuracy are improv ed. To describe the accuracy a mean square of error is calculated using data pro vided by the network and data given by a contact method. This technique is teste d with real gears and its experimental results are presented. 2009 SPIE. KW - Bezier networks KW - Gear modeling KW - Laser line scanning KW - Approximation networks KW - Automatic technique KW - Computational model KW - Computer algorithm KW - Contact methods KW - Laser lines KW - Laser metrology KW - Mean square KW - Optical set-up KW - Vision systems KW - Algorithms KW - Image processing KW - Measurement errors KW - Optical data processing N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 74990G N1 - :doi 10.1117/12.851781 N1 - Correspondence Address: Contreras, I. T.; Centro de Ingeniera y Desarrollo Industrial, Quertaro, 76130, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-73849115003&partnerID=4 0&md5=701e2dffa19b706797adea95d15f20df ER TY T1 rface JF VL PY AU AU AU AU CONF Determination of Hurst exponent by optical signal processing applied on su roughness measurements Proceedings of SPIE - The International Society for Optical Engineering 7499 2009/// Salgado, J.A.M. Martnez, O.S. Cruz, D.M. Chavarn, J.U.

AD - Research Center in Engineering and Applied Sciences, Autonomous University of Morelos State, Av. Universidad 1001, Col. Chamilpa. Cuernavaca, Morelos. C. P. 62209, Mexico AB - In this work a surface roughness measurement performed by Hurst exponent d etermination, calculated at the same time from data processing of an optical ref lected signal is presented. An industrial plate roller rod covered with a polyme ric coating is illuminated using a laser source. A lens is used for casting the scattered light reflected from several sectors of the plate roller, and also to focus it into a power meter connected to a computer where corresponding data ser ies are stored. Information related to specific points of the considered object is contained into the optical reflected signal and post-processing of related da ta signal series allows calculation of the Hurst exponent, also known as roughne ss exponent. A wear analysis on considered surface sectors of the roller is perf ormed and as a result a relation between Hurst exponent and the coating thicknes s for each surface sector is clearly established. The simplicity of the opto-mec hanical setup among other evident advantages may suggest the application of this non-destructive technique on surface metrology. 2009 SPIE. KW - Metrology KW - Optical data processing KW - Roughness KW - Surface measurements KW - Coating thickness KW - Data series KW - Data signals KW - Hurst exponents KW - Laser sources KW - Non-destructive technique KW - Optomechanical KW - Polymeric coatings KW - Post processing KW - Power meters KW - Reflected signal KW - Roughness exponent KW - Roughness surfaces KW - Scattered light KW - Surface metrology KW - Wear analysis KW - Bionics KW - Coatings KW - Integrated optics KW - Light KW - Modulation KW - Optical data processing KW - Optical signal processing KW - Roughness measurement KW - Signal processing KW - Surface properties KW - Surface roughness KW - Thickness measurement KW - Rollers (machine components) N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 749909 N1 - :doi 10.1117/12.845799 N1 - Correspondence Address: Salgado, J. A. M.; Research Center in Engineering and Applied Sciences, Autonomous University of Morelos State, Av. Universidad 10 01, Col. Chamilpa. Cuernavaca, Morelos. C. P. 62209, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-73849142504&partnerID=4 0&md5=8ceb098cad76d0a5c4a1dfb39d6c5922 ER -

TY - CONF T1 - Real-time turning surface inspection using laser light scattering JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7499 PY - 2009/// AU - Moreno-Bez, A. AU - Len, G.M.-D. AU - Tenorio-Prez, F. AU - Ruiz-Torres, M. AU - Huerta-Ruelas, J.A. AD - Centro de Investigacion en Ciencia Aplicada y Tecnologia Avanzadaijnidad Q ueretaro IPN, Cerro Blanco 141, Santiago de Queretaro, Queretaro, Mexico AD - Universidad Autnoma de Zacatecas, Fac. de Ingeniera Elctrica, Lpez Velarde 801 , Zacatecas, Zacatecas, Mexico AB - An optical system for real-time measurements on a turning surface was desi gned and implemented in the optical metrology laboratory at CICATA-IPN. Differen t profiles of machined parts can be determined using a single detector or a phot o-diode array. The basis of the measurement is the scattering of a laser beam wh ich is reflected by the turning surface. Two different configurations were teste d, the first one uses a single photodetector and a commercial lock-in amplifier, and the second uses a photodetector array and a proprietary platform. The sampl es under test were mounted on two different lathes for each configuration. The s amples were rotating while the measurements were taken by the electronic system. Under these conditions it was possible to detect the intensity changes of the s cattered light in the single detector case, and changes of the spread in the int ensity distribution in the multidetector case. With the acquired data, qualitati ve profiles of the samples were obtained, with promising results. Potential appl ications in industry are straightforward when surface inspection is necessary to asses product's quality. 2009 SPIE. KW - Laser light scattering KW - Lathe KW - Photodetector array KW - Electronic systems KW - Intensity change KW - Intensity distribution KW - Laser light scattering KW - Lock-in amplifier KW - Multi-detectors KW - Optical Metrology KW - Photo detector array KW - Potential applications KW - Real time measurements KW - Scattered light KW - Single photodetector KW - Surface inspection KW - Lathes KW - Light KW - Optical systems KW - Optoelectronic devices KW - Photodetectors KW - Refraction KW - Scattering KW - Time measurement KW - Turning KW - Light scattering N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 74990T N1 - :doi 10.1117/12.848671

N1 - Correspondence Address: Huerta-Ruelas, J. A.; Centro de Investigacion en C iencia Aplicada y Tecnologia Avanzadaijnidad Queretaro IPN, Cerro Blanco 141, Sa ntiago de Queretaro, Queretaro, Mexico; email: jhuertar@ipn.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-73849122483&partnerID=4 0&md5=d8054ed48c08df85ef37b14993e1d2c1 ER TY - CONF T1 - Comparison among methods employed in the calibration of high accuracy mass standards and uncertainty validation by numerical simulation JF - 19th IMEKO World Congress 2009 VL - 2 SP - 1060 EP - 1066 PY - 2009/// AU - Ramirez, L. AU - Becerra, L.O. AU - Pea, L.M. AD - Universidad de Costa Rica (UCR), San Jos, Costa Rica AD - Centro Nacional de Metrologa (CENAM), Queretaro, Mexico AB - The present work exposes the comparison among numerical methods used in th e calibration of a set of high accuracy weights by subdivision method. This pape r covers the comparison of the mean values, the uncertainties and correlations o btained with the Orthogonal, the Gauss Markov, the Ordinary Least Squares and th e Weighted Least Squares (Lagrange Multiplier) methods. These methods are the mo st commonly used in the realization of the mass scale in the National Metrology Institutes (NMI). Also, the uncertainty evaluated by these methods was compared against the evaluation by a numerical simulation method (Monte Carlo's method). KW - Mass calibration KW - Monte Carlo KW - Numerical multivariate simulation KW - Subdivision KW - Gauss-Markov KW - Mass calibrations KW - Mass scale KW - Mass standard KW - Mean values KW - MONTE CARLO KW - National metrology institutes KW - Numerical multivariate simulation KW - Numerical simulation method KW - Ordinary least squares KW - Subdivision KW - Subdivision methods KW - Weighted least squares KW - Calibration KW - Computer simulation KW - Lagrange multipliers KW - Least squares approximations KW - Monte Carlo methods N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Ramirez, L.; Universidad de Costa Rica (UCR), San Jos, Costa Rica; email: lautaro.ramirezvaras@ucr.ac.cr UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871541724&partnerID=4 0&md5=7e6c61d1916e5c1a7843f06f7a598665 ER TY - CONF T1 - New paradigms in LED photometry and colorimetry

JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7499 PY - 2009/// AU - Estrada-Hernndez, A. AU - Gonzlez-Galvn, L.P. AU - Rosas, E. AD - Divisin de ptica y Radiometra, Centro Nacional de Metrologa, km 4,5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico AB - Motivated by the growing number of applications the light emitting diodes, LEDs, are having in solid-state lighting systems, we summarize the new internat ionally standardized measurement methods for photometric and colorimetric quanti ties in LEDs; since they are commonly used to quantify some of the key performan ce parameters of several products used in automotive industry, traffic signaling , etc. Finally, special emphasis is given to the mismatch corrections factors ca lculation, and its use when measuring LEDs photometric and colorimetric quantiti es. 2009 SPIE. KW - Leds KW - Leds emitted color KW - Metrology KW - Solid-state lighting KW - Color metrology KW - Key performance parameters KW - Mismatch correction KW - Solid state lighting KW - Standardized measurement KW - Traffic signaling KW - Automotive industry KW - Color KW - Colorimetry KW - Light KW - Lighting KW - Photometry KW - Water analysis KW - Light emitting diodes N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 74990L N1 - :doi 10.1117/12.848783 N1 - Correspondence Address: Estrada-Hernndez, A.; Divisin de ptica y Radiometra, C entro Nacional de Metrologa, km 4,5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico; email: aestrada@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-73849134977&partnerID=4 0&md5=f59648441b2976963a5ddd0cdd7bef8d ER TY - CONF T1 - Development and implementation of photometric bench based on neutral optic al density filters JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7499 PY - 2009/// AU - Gonzlez-Galvn, L.P. AU - Chvez-Velazquez, R.A. AU - Lpez-Ramrez, R. AU - Vidal-Medina, N. AU - Zarate-Hernndez, H. AU - Rosas, E. AD - Divisin de ptica y Radiometra, Centro Nacional de Metrologa, km 4,5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico AB - We present the development of a semi-automated photometric bench implement

ed at the Laboratorio de Fotometra of the Centro Nacional de Metrologia of Mexico , in order to reduce the illuminance meters calibration time. This photometric b ench reproduces the minimum values established in the Mexican regulation NOM-025 -STPS-2008 and allows the fast calibration of the luxmeters required for illumin ance levels checks. The photometric bench design uses neutral optical density fi lters in order to realize different illuminances at the same distance. Here we a lso present the uncertainty estimated for the reference illuminance values reali zed by the implemented photometric bench. 2009 SPIE. KW - Lighting measurements KW - Metrology KW - Mexican regulations KW - Me-xico KW - Metrology KW - Minimum value KW - Optical densities KW - Semi-automated KW - Calibration KW - Density (optical) KW - Density measurement (optical) KW - Laws and legislation KW - Lighting KW - Uncertainty analysis KW - Photometry N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 74990A N1 - :doi 10.1117/12.844973 N1 - Correspondence Address: Gonzlez-Galvn, L. P.; Divisin de ptica y Radiometra, Ce ntro Nacional de Metrologa, km 4,5 Carretera a los Cus, 76246, El Marqus, Quertaro, Mexico; email: lgonzale@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-73849142093&partnerID=4 0&md5=d055c81c28f9846ff18153264f7d0cb5 ER TY - CONF T1 - Young's modulus determination of a circular plate by ESPI JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7499 PY - 2009/// AU - Faras, M. AU - Rodrguez-Vera, R. AU - Rayas, J.A. AD - Divisin de Ciencias e Ingenieras, Universidad de Guanajuato, Loma del Bosque 103 Col, Lomas del Campestre, Len, Mexico AD - Centro de Investigaciones en ptica, Loma del Bosque 115 Col, Lomas del Camp estre, Len, Mexico AB - Nowadays, the implementation of an accurate non-destructive technique for the measurement of mechanical properties in small samples has become a main subj ect of interest due to the recent development of MEMS and intelligent materials, which need a safe procedure for their characterization. In this work we study a nondestructive method for determining the Young's modulus of an aluminium circu lar plate. Our technique is based on Electronic Speckle Pattern Interferometry ( ESPI), a mechanical loading setup, and digital processing, which allows to obtai n accurate values of Young's modulus for the sample agreeing those values from t he literature. 2009 SPIE. KW - Circular plate KW - ESPI KW - Mechanical properties KW - Optical metrology

KW - Young's modulus KW - Circular plate KW - Circular plates KW - Digital processing KW - Electronic speckle pattern interferometry KW - Mechanical loading KW - Non-destructive technique KW - Nondestructive methods KW - Optical Metrology KW - Small samples KW - Young's Modulus KW - Elastic moduli KW - Elasticity KW - Intelligent materials KW - Optical properties KW - Mechanical properties N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 749912 N1 - :doi 10.1117/12.849076 N1 - Correspondence Address: Faras, M.; Divisin de Ciencias e Ingenieras, Universi dad de Guanajuato, Loma del Bosque 103 Col, Lomas del Campestre, Len, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-73849105047&partnerID=4 0&md5=0a287398b5dd55df8ad08c48c16eaab2 ER TY - CONF T1 - Design and construction of a mechatronic robot with five degrees of freedo m that located internal porosity in centrifugal pumps JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7499 PY - 2009/// AU - Bautista-Elivar, N. AU - Uribe-Fernndez, U. AU - Ruiz-Contreras, F. AU - Santillan-Gutierrez, D. AU - Snchez-Hernndez, C. AU - Robledo-Snchez, C. AD - Polytechnical University of Pachuca, Biomedical Optics Laboratory, Highway Pachuca-Cd. Sahagn Km.20, Hidalgo State, 43830, Mexico AD - Autonomous University of Puebla, Faculty of Sciences Physics-Mathematics, Optics Workshop, Ave. San Claudio S/N, Col. San Manuel, Puebla, Puebla 22000, Me xico AB - In this paper is presented construction and implementation of a mechatroni c robot to obtain porosity in parts mechanics of centrifugal pumps using ultraso nic wave. Considerations about the methods applied and their use in the field of metrology for the metal mechanic industry are taken into consideration, This pr oject is inserted in ITT Goulds Pumps industries, with a headquarter in Tizayuca Hidalgo State, Mexico. A mechatronic robot with 5 free grades (XYZUV) of 170 10 4 120 cm controlled by a PC is built. The robot let us scan metal mechanic piece s of 120 90 170 cm. It is incoiporated a sensor ultrasonic in miniature in the Z axis. Such arrangement allows applying the techniques of ultrasonic wave to obt ain maps of porosity in pails mechanics in manufacturing pumps to test mechanic deformation. The scan is done by the Z axis when traveling around the piece unde r test with the objective of finding fragility zones when applying cutting effor ts to the pieces. 2009 SPIE. KW - Mechatronic KW - Testing without contact KW - Ultrasonic waves

KW - Degrees of freedom KW - Design and construction KW - Internal porosity KW - Itt goulds pumps KW - Me-xico KW - Centrifugal pumps KW - Hydraulic machinery KW - Machine design KW - Mechatronics KW - Porosity KW - Pumping plants KW - Pumps KW - Robots KW - Ultrasonic testing KW - Ultrasonic waves KW - Ultrasonics KW - Mechanics N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 749908 N1 - :doi 10.1117/12.852232 N1 - Correspondence Address: Bautista-Elivar, N.; Polytechnical University of P achuca, Biomedical Optics Laboratory, Highway Pachuca-Cd. Sahagn Km.20, Hidalgo S tate, 43830, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-73849100438&partnerID=4 0&md5=8fd13cbeb60e041ee63c6ced33dbe5a0 ER TY - CONF T1 - A stitching method to test the segments of a large primary JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7453 PY - 2009/// AU - Gutierrez-Herrera, E. AU - Strojnik, M. AU - Paez, G. AU - Shore, P. AU - Morantz, P. AD - Centro De Investigaciones En Optica, Apdo. Postal 1-948, C.P. 37000, Leon, Guanajuato, Mexico AD - Cranfield University, Cranfield, Bedfordshire, MK43 0AL England, United Ki ngdom AB - The European Extremely Large Telescope will be a large optical/infrared te lescope with a segmented primary mirror of 42-m diameter, and 84-m radius of cur vature. Each segment, about 1.2-meters across, implies great manufacturing and m easuring challenges. To determine the most adequate metrology technique for test ing these segments, we report a brief comparative analysis of the four most impo rtant testing techniques used for large surfaces. The study shows that the stitc hing method is the most appropriate technique. We implement a proof of concept t o demonstrate the viability of this technique for studying surfaces with a small curvature and estimate the challenges to overcome. The analysis confirms that t he success of the stitching technique, in curved elements, ensues because the ro ughness does not contribute significantly to the surface tendency. Therefore, we propose the use of tendency information to solve Procrustes' problem and to imp rove the resultant shape of the unified map for surfaces with small curvature, a s in the case of the segments of a large primary mirror. 2009 SPIE. KW - Abbe errors KW - Large surfaces KW - Procrustes' problem KW - Segmented mirror

KW - Stitching method KW - Surface tendency KW - Abbe errors KW - Large surfaces KW - Procrustes' problem KW - Segmented mirror KW - Stitching method KW - Errors KW - Instruments KW - Optical telescopes KW - Remote sensing KW - Testing KW - Mirrors N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 74530U N1 - :doi 10.1117/12.826765 N1 - Correspondence Address: Gutierrez-Herrera, E.; Centro De Investigaciones E n Optica, Apdo. Postal 1-948, C.P. 37000, Leon, Guanajuato, Mexico; email: enoch @cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-70449465988&partnerID=4 0&md5=d16fbad1b7283dcdbdec53e6b00c5c19 ER TY - CONF T1 - Application of the Talbot effect for three-dimensional and step-height mea surement using an LCD JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7442 PY - 2009/// AU - Vela-Esparza, E. AU - Ramrez-Zavaleta, G. AU - Rosales-Medina, M.A. AU - Rodrguez-Montero, P. AU - Tepichn-Rodrguez, E. AD - Universidad de Las Amricas, Puebla (UDLAP), Ex-hacienda Santa Catarina Mrtir s/n, San Andrs Cholula, Pue, Mexico AD - Instituto Nacional de Astrofsica, ptica y Electrnica (INAOE), Apdo. Postal # 51, Puebla, Pue., 72000, Mexico AB - The self-imaging phenomenon under coherent illumination or Talbot effect h as been widely used in different fields including optical metrology. According t o the Talbot effect, when a periodic grating is illuminated with spatially and t emporary collimated coherent light, the grating is self-imaged at a certain dist ance, Z T, which depends on the inverse of the wavelength of the incident light and the square of the period, d, of the grating. This means that they can be see n at different positions Z T by changing either d or . Using the wavelength depen dence of the self-images, and a fixed period, d, an application of the Talbot ef fect for three-dimensional and step-height measurement using a two-wavelength la ser, appeared recently in the literature. We propose in this work to use an LCD to display a tunable grating. In our setup, we used a fixed wavelength and a dyn amic 1-D grating to adjust the step-height measurement capabilities. We also ana lyze the possibility of measuring continuously varying surfaces with this techni que. We include the preliminary results of our proposal. 2009 SPIE. KW - Dynamic grating. KW - LCD KW - Talbot effect KW - Tunable grating KW - Coherent illumination KW - Dynamic grating.

KW - Fixed period KW - Fixed wavelength KW - Incident light KW - LCD KW - Optical Metrology KW - Periodic gratings KW - Self imaging KW - Step height measurement KW - Talbot effect KW - Talbot effects KW - Tunable grating KW - Two-wavelength lasers KW - Wavelength dependence KW - Data processing KW - Light KW - Liquid crystal displays KW - Three dimensional N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 74420F N1 - :doi 10.1117/12.826396 N1 - Correspondence Address: Vela-Esparza, E.; Universidad de Las Amricas, Puebl a (UDLAP), Ex-hacienda Santa Catarina Mrtir s/n, San Andrs Cholula, Pue, Mexico; e mail: elizabeth.velae@udlap.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-70449404998&partnerID=4 0&md5=ffda8b21b68c01e0bbc5893f18535b8f ER TY - JOUR T1 - Characterizations of silver alloys used in modern Mexican coins JF - Materials Characterization VL - 60 IS - 9 SP - 1041 EP - 1048 PY - 2009/// AU - Mendoza-Lpez, M.L. AU - Prez-Bueno, J.J. AU - Rodrguez-Garca, M.E. AD - Instituto Tecnolgico de Quertaro, Avenida Tecnolgico S/N, Quertaro, Qro C.P. 7 6000, Mexico AD - Centro de Fsica Aplicada y Tecnologa Avanzada, Departamento de Nanotecnologi a, Universidad Nacional Autnoma de Mxico, Campus Juriquilla, Apdo. Postal 1-1010, Quertaro, Qro. C.P. 76230, Mexico AD - Centro de Investigacin y Desarrollo Tecnolgico en Electroqumica, Parque Tecno logico Queretaro-Sanfandila, Pedro Escobedo, Qro., C.P. 760703, Mexico AD - Departamento de Posgrado e Investigacin, Facultad de Ingeniera, Centro Unive rsitario S/N, Quertaro, Qro, Mexico AB - This paper presents a complete methodology for the characterization of sil ver alloys used in modern coin production. Mexican coins with a nominal silver c oncentration from 10% to 99.99% were used in this study. Calibrated Glow Dischar ge Optical Emission Spectrometers were used to determine the chemical compositio n of the alloys as a function of the depth, while inductively coupled plasma was used to determine the total element composition in bulk. Scanning Electron Micr oscope was used to study the phase distributions in the different silver coins. According to Glow Discharge Optical Emission Spectrometers and inductively coupl ed plasma, the silver content found in the studied samples was consistently grea ter than that of the nominal silver content reported by the Mexican mint. This m ay lead to a review of the new methods of analysis used nowadays in contemporary coin minting. This result is very important because silver is increasing in val

ue as metal and, considering the volume of production of silver coins, this may increase further as a consequence of a growing popular confidence in silver curr ency. In the case of silver studies, an advantage of the absence of silver detec tor in the Glow Discharge Optical Emission Spectrometers system is that it allow s for the recalibration to have a better range of detection of other metals pres ent in the alloys. A calibration curve using the copper content obtained by indu ctively coupled plasma (bulk) and Glow Discharge Optical Emission Spectrometers (depth profile) was performed. The relevance of control in modern silver coin mi nting was clarified, especially in minimizing the discrepancy between the nomina l and the core fineness. The physical and chemical properties of the alloys stud ied are defined, revealing important variations in silver and copper contents. A new methodology and metrology for the control of coinage are suggested. 2009 El sevier Inc. All rights reserved. KW - Coins KW - Glow Discharge Optical Emission Spectrometry KW - Inductively coupled plasma KW - Quantitative depth profiles KW - Silver KW - Calibration curves KW - Chemical compositions KW - Coins KW - Copper content KW - Depth profile KW - Element compositions KW - Glow discharge optical emission spectrometer KW - Glow Discharge Optical Emission Spectrometry KW - Methods of analysis KW - Phase distribution KW - Physical and chemical properties KW - Quantitative depth profiles KW - Recalibration KW - Scanning Electron Microscope KW - Silver coins KW - Silver concentration KW - Silver content KW - Alloys KW - Characterization KW - Chemical elements KW - Chemical properties KW - Glow discharges KW - Inductively coupled plasma KW - Light emission KW - Mints KW - Optical emission spectroscopy KW - Photoresists KW - Scanning electron microscopy KW - Silver KW - Spectrometers KW - Spectrometry KW - Silver alloys N1 - Cited By (since 1996):3 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.matchar.2009.04.010 N1 - Correspondence Address: Rodrguez-Garca, M.E.; Departamento de Posgrado e Inv estigacin, Facultad de Ingeniera, Centro Universitario S/N, Quertaro, Qro, Mexico; email: marioga@fata.unam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-67650233174&partnerID=4 0&md5=347ecfd7aea5c112213b712994b5c38f ER -

TY - JOUR T1 - Vibration analysis at microscale by Talbot fringe projection method JF - Strain VL - 45 IS - 3 SP - 249 EP - 258 PY - 2009/// AU - Rodriguez-Vera, R. AU - Genovese, K. AU - Rayas, J.A. AU - Mendoza-Santoyo, F. AD - Centro de Investigaciones en Optica, Loma del Bosque 115, Col. Lomas del C ampestre, Len, Mexico AD - Dipartimento di Ingegneria e Fisica dell'Ambiente (DIFA), Universit degli S tudi della Basilicata, Viale dell'Ateneo Lucano 10, 85100 Potenza, Italy AB - This work focuses on the implementation of a structured light projection t echnique for the analysis of the 3D vibration modes of microsamples. The Talbot image of a Ronchi grating is projected onto the sample surface passing through o ne of the objective tube of a stereomicroscope thus realising a fringe projectio n system at a micrometric scale. An aluminium cantilever beam PZT-driven into ha rmonic vibration served as test sample for investigating the possibility to get the full-field vibration modes of micro-objects. An automated Fourier transform analysis of the fringe patterns was performed to obtain the full-field time-reso lved profile information of the sample at each frame delivered by a high-speed c amera with a micrometric resolution. A straightforward procedure for retrieving resonance frequency for different modes and vibration amplitudes along the whole sample surface was implemented. The great sensitivity and the full-field capaci ties of the proposed experimental procedure allow to put in evidence differences between real and theoretical behaviours hence could be extremely useful for des igning and testing structural dynamic response of microstructures and micro-elec tro-mechanical Systems. 2009 Blackwell Publishing Ltd. KW - Contouring KW - Optical metrology KW - Profilometry KW - Talbot fringe projection KW - Vibration analysis KW - Contouring KW - Different modes KW - Experimental procedure KW - Fourier transform analysis KW - Fringe pattern KW - Fringe projection method KW - Fringe projection system KW - Full-field KW - Harmonic vibration KW - Micro electro mechanical system KW - Micro-objects KW - Micro-scale KW - Microsamples KW - Optical metrology KW - PZT KW - Resonance frequencies KW - Ronchi grating KW - Sample surface KW - Structured light projection KW - Talbot fringe projection KW - Test samples KW - Time-resolved profiles

KW - Vibration amplitude KW - Vibration modes KW - Work Focus KW - Dynamic response KW - Microelectromechanical devices KW - Piezoelectric transducers KW - Profilometry KW - Projection systems KW - Resonance KW - Structural dynamics KW - Three dimensional KW - Vibrating conveyors KW - Vibration analysis KW - Vibrators N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1111/j.1475-1305.2008.00611.x N1 - Correspondence Address: Rodriguez-Vera, R.; Centro de Investigaciones en O ptica, Loma del Bosque 115, Col. Lomas del Campestre, Len, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-65649115404&partnerID=4 0&md5=3ff59dc94e664f42dfb84f472aeec6ba ER TY - JOUR T1 - Proficiency tests to evaluate commercially available IVD kits for glucose and cholesterol measurements JF - Accreditation and Quality Assurance VL - 14 IS - 5 SP - 269 EP - 271 PY - 2009/// AU - Urquiza, M.P. AU - Mitani, Y. AU - Jaimes, H.O.N. AD - CENAM, Quertaro, Mexico AB - The first proficiency testing round 630-IL-1002, was carried out with a Re ference Material DMR-180a with reference values obtained by using gas chromatogr aphy isotope dilution mass spectrometry methods, in which glucose, cholesterol a nd creatinine were measured. The serum pool was obtained from blood donors and a ll the analytes were at the normal concentration in Mexican population. The labo ratories participants used different field methods to measure the analytes. The Mexican compulsory standard NOM-064-SSA1-1993 "specifications for equipments in vitro diagnostic (IVD)" requests 5% precision and 5% maximum bias of the IVD equ ipments in the measurements of analytes like glucose and cholesterol. The result s obtained by field laboratories in the proficiency testing round are compared t o the reference value and uncertainty provided by the National Metrology Institu te (CENAM). The quality of measurements is dependent not only on the laboratory competence but also on the methods used by those commercially available IVD kits . It is concluded that quality assessment of measurements in clinical laboratori es should be critically evaluated by using stable and certified reference materi als. 2009 Springer-Verlag. KW - Certified reference materials KW - Cholesterol KW - Glucose KW - Proficiency test KW - Serum N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013

N1 - Source: Scopus N1 - :doi 10.1007/s00769-009-0493-z N1 - Correspondence Address: Urquiza, M. P.; CENAM, Quertaro, Mexico; email: mep erez@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-67349267700&partnerID=4 0&md5=bba991a055063685dedd14e781b4de3c ER TY - JOUR T1 - Uncertainty analysis of whole-field phase-differences retrieved from ESPI fringe patterns by using the Fourier transform method (FTM) JF - Optics Communications VL - 282 IS - 5 SP - 686 EP - 691 PY - 2009/// AU - Anguiano Morales, M. AU - Martnez, A. AU - Rayas, J.A. AU - Cordero, R.R. AU - Labbe, F. AD - Centro de Investigaciones en ptica, AC, Department of Metrologia, Loma Bosq ue # 115, Apdo. Postal 1-948, 37000 Len Guanajuato, Mexico AD - Universidad Tcnica Federico Santa Maria, Av. Espaa 1680, Valparaso, Chile AD - Universidad de Santiago de Chile, Casilla 307, Correo 2 Santiago, Chile AB - We have evaluated the uncertainty associated with the whole-field phase-di fferences retrieved by using the Fourier transform method (FTM), from a fringe p attern generated by electronic speckle pattern interferometry (ESPI). The phasedifferences were induced by applying load to an elastic sample. The FTM involved the Fourier transform application to the fringe pattern, the isolation of the t erm carrying the phase information by applying a band-pass filter in the spatial frequency domain, and then the inverse Fourier transform application. Since the fringes in the analyzed pattern were adequately open, the FTM outcomes were pre sumed to be mainly affected by errors in the determination of both the width and the location of the applied filter mask. The influence of these error sources w as assessed by using a Monte Carlo-based computer simulation. It implied evaluat ing the phase-differences a large number of times under the influence of the inv olved error sources. We found that the phase uncertainty depends strongly on the width of the applied filter mask; the influence of the other error sources cons idered into the uncertainty propagation was significantly smaller. 2008 Elsevier B.V. All rights reserved. KW - Electronic speckle pattern interferometry (ESPI) KW - Optical metrology KW - Sensitivity vector KW - Fourier transforms KW - Interferometers KW - Interferometry KW - Moire fringes KW - Speckle KW - Vectors KW - Band-pass filters KW - Electronic speckle pattern interferometry (ESPI) KW - Error sources KW - Fringe patterns KW - Monte carlo KW - Optical metrology KW - Phase informations KW - Sensitivity vector KW - Spatial frequencies

KW - Uncertainty propagations KW - Uncertainty analysis N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optcom.2008.10.072 N1 - Correspondence Address: Anguiano Morales, M.; Centro de Investigaciones en ptica, AC, Department of Metrologia, Loma Bosque # 115, Apdo. Postal 1-948, 3700 0 Len Guanajuato, Mexico; email: anguiano@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-58249130493&partnerID=4 0&md5=e3d2fee4c9457a6496213f6a5f77b3cc ER TY - JOUR T1 - International comparison of the determination of the mass fraction of cadm ium, chromium, mercury and lead in polypropylene: The Comit Consultatif pour la Q uantit de Matire pilot study CCQM-P106 JF - Accreditation and Quality Assurance VL - 15 IS - 1 SP - 39 EP - 44 PY - 2009/// AU - Ma, L. AU - Feng, L. AU - Hioki, A. AU - Cho, K.H. AU - Vogl, J. AU - Berger, A. AU - Turk, G. AU - Macleod, S. AU - Labarraque, G. AU - Tong, W.F. AU - Schiel, D. AU - Yafa, C. AU - Valiente, L. AU - Konopelko, L.A. AU - Quetel, C. AU - Vermaercke, P. AU - Manzano, J.V.L. AU - Linsky, M. AU - Corts, E. AU - Tangpitayakul, S. AU - Plangsangmas, L. AU - Bergamaschi, L. AU - Hearn, R. AD - National Institute of Metrology, Beijing, China AD - National Metrology Institute of Japan, Tsukuba, Japan AD - Korean Research Institute of Standards and Science, Taejon, South Korea AD - Federal Institute for Materials Research and Testing, Berlin, Germany AD - National Institute for Standards and Technology, Gaithersberg, MD, United States AD - Underwriter Laboratories, Millville, NY, United States AD - Laboratoire National de Mtrologie et d'Essais, Paris, France AD - Government Laboratory, Homantin, Hong Kong AD - Physikalisch-Technische Bundesanstalt, Braunschweig, Germany AD - National Institute of Metrology, Pathumthani, Thailand AD - Instituto Nacional de Tecnologia Industrial, Buenos Aires, Argentina AD - All-Russia D.I. Mendeleyev Scientific and Research Institute for Metrology , St. Petersburg, Russian Federation

AD - Institute for Reference Materials and Measurements, Studiecentrum voor Ker nenergie-Centre d'Etudes de l'Energie Nuclaire, Geel, Belgium AD - Centro Nacional de Metrologia, Queretaro, Mexico AD - National Metrology Institute of South Africa, Pretoria, South Africa AD - Chilean Nuclear Energy Commission, Santiago, Chile AD - Department of Science Service, Bangkok, Thailand AD - Thailand Institute of Scientific and Technological Research, Bangkok, Thai land AD - National Institute of Metrological Research Unit of Radiochemistry and Spe ctroscopy, Pavia, Italy AD - Laboratory of the Government Chemist, Teddington, United Kingdom AB - The CCQM-P106 pilot study was organized by the inorganic working group of the Comit Consultatif pour la Quantit de Matire (CCQM) as a feasibility comparison to study the applicability of different analysis methods to the polypropylene sa mple and test the abilities of the participants for measuring the Cd, Cr, Hg and Pb in polypropylene. National Institute of Metrology P. R. China (NIM) acted as the coordinating laboratory of this pilot study. There were 21 laboratories tha t submitted the final results. The median values of the mass fraction of Cd, Cr, Hg and Pb were 36.12 mg kg -1 (the median absolute deviation about the median ( MADe) = 0.46 mg kg -1), 252.5 mg kg -1 (MADe = 3.4 mg kg -1), 387.0 mg kg -1 (MA De = 10.1 mg kg -1) and 466.2 mg kg -1 (MADe = 8.9 mg kg -1), respectively. Isot ope dilution mass spectrometry (IDMS), inductively coupled plasma-mass spectrome try (ICP-MS), inductively coupled plasma-optical emission spectrometry (ICP-OES) , atomic absorption spectrometry (AAS), instrumental neutron activation analysis (INAA) and X-ray fluorescence (XRF) measurement methods were used, and microwav e digestion was used by the most of the participants. In general, very good agre ement of the results was observed. Moreover, compared to the results of other me thods, the results of IDMS still showed less spread amongst laboratories and had a smaller uncertainty. In addition, the results of some analytes used by XRF an d INAA also got satisfactory agreement with the median value. Springer-Verlag 20 09. KW - Cadmium KW - CCQM KW - Chromium KW - Lead KW - Mercury KW - Polypropylene N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s00769-009-0574-z N1 - Correspondence Address: Feng, L.; National Institute of Metrology, Beijing , China; email: fenglx@nim.ac.cn UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-73949098955&partnerID=4 0&md5=66a9295ba012f3c97e884f83714699df ER TY T1 JF VL PY AU AU AU AU AU AD del AD - CONF - Static and dynamic 3D contouring by using structured light - Proceedings of SPIE - The International Society for Optical Engineering - 7155 - 2008/// - Rodriguez-Vera, R. - Vasquez, D. - Genovese, K. - Rayas, J.A. - Mendoza-Santoyo, F. - Centra de Investigaciones en Optica, A.C., Col. Lomas del Campestre, Loma Bosque 115, 37150 Leon, Gto, Mexico - Dipartimento di Ingegneria e Fisica dell'Ambiente (DIFA), Universit degli S

tudi della Basilicata, Viale dell'Ateneo Lucano 10, 85100 Potenza, Italy AB - Non-destructive optical techniques for 3D shape measuring are fundamental in science, engineering, medicine, and industry. Such 3D data offer advantages o ver 2D data: shape data are invariant against alteration of the illumination and object motion. One of the major and easy methods to obtain 3D shape is from its contours. There exist several optical techniques for contouring, but the easies t to put into operation is by using linear structured light projection. The pres ent work focuses on the implementation of linear structured light projection tec hniques for static and dynamic 3D contouring at macro- and micro-levels. Linear structured light as a fringe pattern is projected on the surface to be contoured . White light and laser-illuminating Talbot image are used in order to project t he fringe pattern. Projected fringe pattern is captured by a conventional or hig h-speed CCD camera for image digitalizing and further analysis. Fourier transfor m method is employed as a tool to obtain a contour-wrap optical phase map. The s imple experimental arrangement is adapted for static or dynamic conditions of th e surface to contour. Samples that are under harmonic vibration conditions, for example, their vibrating frequency is tuned with that of the capture CCD camera to obtain the mode shape. In the static case one can obtain the topographical co mparison before and after the surface subject to a static load or simply its top ography. Examples, at micro and macro levels, of static and dynamics surface con ditions are shown. KW - Contouring KW - Fringe projection KW - Macro- And micro-level KW - Optical metrology KW - Profilometry KW - Vibration analysis KW - Cameras KW - CCD cameras KW - Charge coupled devices KW - Digital cameras KW - Electric load shedding KW - Fourier transforms KW - Lasers KW - Measurements KW - Moire fringes KW - Profilometry KW - Surface topography KW - Two dimensional KW - Vibration analysis KW - 3-D shapes KW - 3d datum KW - Before and after KW - Contouring KW - Dynamic conditions KW - Experimental arrangements KW - Fourier transform methods KW - Fringe patterns KW - Fringe projection KW - Harmonic vibrations KW - High-speed ccds KW - Micro and macros KW - Mode shapes KW - Non-destructive KW - Object motions KW - Optical metrology KW - Optical phase KW - Optical techniques KW - Projected fringes KW - Shape datum

KW - Static and dynamics KW - Static loads KW - Structured light projections KW - Structured lights KW - Surface conditions KW - White lights KW - Work focus KW - Three dimensional N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 71552A N1 - :doi 10.1117/12.814584 N1 - Correspondence Address: Rodriguez-Vera, R.; Centra de Investigaciones en O ptica, A.C., Col. Lomas del Campestre, Loma del Bosque 115, 37150 Leon, Gto, Mex ico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-57549101383&partnerID=4 0&md5=4e11279407be34acbf0a07a0c38d5c90 ER TY - CONF T1 - Optical metrology by fringe processing on independent windows using a gene tic algorithm JF - Proceedings of the Society for Experimental Mechanics, Inc. VL - 65 SP - 559 EP - 569 PY - 2008/// AU - Toledo, L.E. AU - Cuevas, F.J. AD - Department of Optical Metrology, Centra de Investigaciones en Optica, A.C, Loma del bosque 115, Col. Lomas del Campestre, Len 37150 Guanajuato, Mexico AB - We present a method to retrieve the phase of a fringe pattern based on the window fringe pattern demodulation technique (WFPD). The overlapped phase simil arity criterion is avoided in the proposed method, and it is substituted by a se cond order smoothness criterion. The fringe processing on independent windows (F PIW) method can measure physical quantities from closed and near subsampled frin ge patterns by a simplified cost or fitness function. The fringe image is divide d into a set of partially overlapping windows. In these sub-images the estimated phase is modelled as a parametric analytic-function, and its parameters are opt imized using a genetic algorithm (GA). This analytic-function is used to estimat e the phase in the area framed by the window. Phases from all windows are sequen tially spliced to retrieve the whole phase field. A media filter is applied over the entire phase field to smooth the irregularities that appear in the juncture s between windows. Society for Experimental Mechanics 2007. KW - Computer vision KW - Digital image processing KW - Fringe analysis KW - Genetic algorithms KW - Optical metrology KW - Phase retrieval N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Cuevas, F. J.; Department of Optical Metrology, Ce ntra de Investigaciones en Optica, A.C, Loma del bosque 115, Col. Lomas del Camp estre, Len 37150 Guanajuato, Mexico; email: fjcuevas@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78149350555&partnerID=4 0&md5=e5bd7c8bfd0b26b5de185fb55ca04591 ER TY - JOUR

T1 - Measuring the profile of a simulated machined aspherical surface using a n onconventional optimization algorithm JF - Optical Engineering VL - 47 IS - 8 PY - 2008/// AU - Snchez Escobar, J.J. AU - Barbosa Santilln, L.I. AU - Ubera, J.V. AU - Salinas-Luna, J. AU - Guillen-Bonilla, H. AD - Centro de Enseanza Tcnica Industrial (CETI), Nueva Escocia 1885, Fraccionami ento Providencia, Guadalajara, Jalisco 44620, Mexico AD - Universidad de Guadalajara, Campus Universitario de Los Valles, Carreterra Guadalajara meca km 45.5, meca, Jalisco, Mexico AD - Universidad Politcnica de Madrid, Facultad de Informtica, Boadilla Del Monte , 28660 Madrid, Spain AD - Universidad Autnoma de la Ciudad de Mxico, Campus Cuautepec, Avenida la Coro na No. 320, Col. Loma la palma, Delegacion Gustavo A Madero, 54060 Mexico, D.F., Mexico AD - Universidad de Guadalajara, Departamento de Fsica CUCEI Blvd, Marcelino Gar ca Barragn 1421, Guadalajara, Jalisco, Mexico AB - We show an optimization method based on an evolutive algorithm to obtain t he profile of a simulated machined aspherical surface starting from a set of noi sy discrete Cartesian coordinates (x,y,z), where the experimental coordinates x and y are used to simulate the sagitta z of the analyzed surface. By minimizing an objective function, the proposed method fits the sagitta function to the set of noisy discrete coordinates; thus the geometrical parameters of the simulated surface under test, such as the paraxial radius of curvature, the conic constant , and the aspheric deformation constants, can be obtained. Numerical results sho w that our method can be successfully applied to retrieve the simulated machined surface profile. 2008 Society of Photo-Optical Instrumentation Engineers. KW - inverse problems KW - metrology KW - optical testing KW - Aspherical surface KW - Cartesian coordinate KW - Discrete coordinates KW - Evolutive algorithms KW - Geometrical parameters KW - Machined surface KW - metrology KW - Numerical results KW - Objective functions KW - Optimization algorithms KW - Optimization method KW - Paraxial radius KW - Sagitta KW - Surface under tests KW - Curve fitting KW - Differential equations KW - Optical testing KW - Optimization KW - Inverse problems N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 083601 N1 - :doi 10.1117/1.2968270 N1 - Correspondence Address: Snchez Escobar, J. J.; Centro de Enseanza Tcnica Indu strial (CETI), Nueva Escocia 1885, Fraccionamiento Providencia, Guadalajara, Jal

isco 44620, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77957223103&partnerID=4 0&md5=206b82e8f498fe8fd9113fb3f26bd0b6 ER TY - JOUR T1 - Mtodo de mltiples reflexiones para determinar el movimiento en un riel de ai re JF - Revista Mexicana de Fisica E VL - 54 IS - 2 SP - 208 EP - 211 PY - 2008/// AU - Padilla-Sosa, P. AU - Cerecedo-Nez, H.H. AU - Narvez-Ramrez, J. AU - Del Rosario, F.H.S. AU - Garca-Guzmn, J. AD - Facultad de Fsica e Inteligencia Artificial, Universidad Veracruzana, Apart ado Postal 270, Xalapa, Ver., Mexico AD - Facultad de Ingeniera Mecnica-Elctrica, Universidad Veracruzana, Apartado Pos tal 270, Xalapa, Ver., Mexico AB - This work proposes an experimental set-up to explain the rectilinear and t he accelerated uniform movements in the experimental laboratory. The system uses a combination of movement sensors and optics instrumentation. The proposed abou t this experimental work is to obtain measurements in practical laboratory using an alternative method and introducing to the students, to use different concept s of physic, in the experimental measurement. KW - Acceleration KW - And laboratory procedures KW - And rotation KW - Electrical KW - Etc.) KW - Gas KW - Laboratory experiments and apparatus KW - Measurements KW - Metrology KW - Movement KW - Optical KW - Remote sensing KW - Sensors (chemical KW - Techniques of testing KW - Testing and inspecting procedures KW - Velocity N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Padilla-Sosa, P.; Facultad de Fsica e Inteligencia Artificial, Universidad Veracruzana, Apartado Postal 270, Xalapa, Ver., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-60949083483&partnerID=4 0&md5=13433b0c99cee4b71f756235c0e14d29 ER TY T1 orary JF VL IS PY JOUR Optomechanical design, manufacturing, assembly, and integration of contemp camera barrels for astronomical instrumentation Optical Engineering 47 7 2008///

AU - Farah, A. AD - Universidad Nacional Autnoma de Mxico, Instituto de Astronoma, D.F. 04510, Mxi co, Mexico AB - Optical systems for scientific instrumentation frequently include lenses w ith critical mechanical requirements. Position and rotation issues of these comp onents are inextricably bound to the efficiency of the instrument. This work des cribes the optomechanical design, manufacturing, assembly, and integration of th e camera barrel located in the OSIRIS imager/spectrograph for the Gran Telescopi o Canarias. The barrel was developed by the Instituto de Astronoma at the Univers idad Nacional Autnoma de Mxico (IA-UNAM), in collaboration with the Instituto de A strofsica de Canarias (IAC), Spain. The camera barrel (CB) includes a set of eigh t lenses with their respective supports and cells, as well as two compensators: the focusing unit and the passive displacement unit, which uses the third double t as a thermal compensator to maintain the camera's focal length and image quali ty with changing ambient temperature. A brief description of OSIRIS, the design criteria, optomechanical requirements, and specifications for misalignment error s and stresses are included. The camera components, analytical calculations, FEA simulations, and error budgets are also described. The iterative process of the optomechanical stages for the development of the camera are also verified and s ummarized. Finally, notes about fabrication, metrology, assembly, and integratio n are proposed as guidelines for future developments in optomechanics. 2008 Soci ety of Photo-Optical Instrumentation Engineers. KW - astronomy KW - birefringence stress KW - FEA KW - manufacturing tolerances KW - materials KW - Analytical calculation KW - Astronomical instrumentation KW - Design criterion KW - Error budgets KW - FEA simulation KW - Focal lengths KW - Gran telescopio canarias KW - Iterative process KW - manufacturing tolerances KW - Mechanical requirements KW - Misalignment errors KW - Opto-mechanical design KW - Opto-mechanics KW - Optomechanical KW - Thermal compensator KW - Astronomy KW - Design KW - Finite element method KW - Image quality KW - Integration KW - Lenses KW - Manufacture KW - Materials KW - Cameras N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 073401 N1 - :doi 10.1117/1.2957960 N1 - Correspondence Address: Farah, A.; Universidad Nacional Autnoma de Mxico, In stituto de Astronoma, D.F. 04510, Mxico, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-81355151234&partnerID=4 0&md5=7e7240d8093ce0a727d7c4439e4e5606 ER -

TY - JOUR T1 - A regional comparison of calibration results for type K thermocouple wire from (100 to 1,100) c JF - International Journal of Thermophysics VL - 29 IS - 5 SP - 1828 EP - 1837 PY - 2008/// AU - Garrity, K.M. AU - Ripple, D.C. AU - Araya, M. AU - Cabrera, C.R. AU - Cordova Murillo, L. AU - De Vanegas, M.E. AU - Gee, D.J. AU - Guilln, E. AU - Martinez-Martinez, S. AU - Mendez-Lango, E. AU - Mussio, L. AU - Petkovic, S.G. AU - Quelhas, K.N. AU - Rangugni, G. AU - Robatto, O. AU - Von Borries Rocha, E. AD - Pilot Laboratory, National Institute of Standards and Technology, Gaithers burg, MD, United States AD - Laboratorio Custodio de Los Patrones Nacionales de Temperatura, Red Nacion al de Metrologa, Santiago, Chile AD - Servicio Autnomo Nacional de Normalizacin, Calidad, Metrologa y Reglamentos Tc nicos, Caracas, Venezuela AD - Instituto Boliviano de Metrologa, La Paz, Bolivia AD - Consejo Nacional de Ciencia y Tecnologa, San Salvador, El Salvador AD - National Research Council of Canada, Ottawa, Canada AD - Instituto Nacional de Defensa de la Competencia y de la Proteccion de la P ropiedad Intelectual, Servicio Nacional de Metrologa, Lima, Peru AD - Centro Nacional de Metrologa, Queretaro, Mexico AD - Laboratorio Tecnolgico Del Uruguay, Montevideo, Uruguay AD - Instituto Nacional de Metrologa, Normalizao e Qualidade Industrial, Rio de Ja neiro, Brazil AD - Instituto Nacional de Tecnologa Industrial, Buenos Aires, Argentina AB - Under the auspices of the Inter-American Metrology System (SIM), the Natio nal Institute of Standards and Technology (NIST) initiated a regional comparison for type K thermocouples from (100 to 1,100) C with 11 participating countries. The use of type K material above approximately 200 C is considered destructive. T herefore, each participating laboratory was sent new, unused wire from a lot of material characterized by NIST. The uniformity of the lot was remarkable, especi ally at temperatures above 500 C; the standard deviation of the thermocouple emf values of multiple cuts tested at NIST was 2.7 V or less over the full temperatur e range. The high uniformity eliminated any need to correct for variations of th e transfer standard among the laboratories, greatly simplifying the analysis. Th e level of agreement among the laboratories' results was quite good. Even though test procedures and equipment varied significantly among the participants, the standard deviation of all emf values at each test temperature was less than the equivalent of 0.20 C at 200 C and below, and less than 0.60 C from (400 to 1,100) C. Of the 380 total bilateral combinations of the data at the eight test temperatu res, only 13 (i.e., 3.4% of all combinations) are outside the k = 2 limits, and of these 13, only 3 are outside k = 3 limits. All the outliers occur at temperat ures of 800 C and below, which suggests that drift of the type K wire due to high

-temperature oxidation did not cause changes in the thermocouple emf comparable to or larger than the claimed uncertainties. 2008 Springer-Verlag. KW - Comparison KW - ITS-90 KW - Temperature KW - Thermocouple KW - Type K KW - Comparison KW - Emf values KW - High-temperature oxidation KW - ITS-90 KW - Metrology systems KW - National institute of standards and technology KW - Standard deviation KW - Temperature KW - Temperature ranges KW - Test procedures KW - Test temperatures KW - Thermocouple KW - Transfer standards KW - Type K KW - Variations of KW - Standards KW - Statistics KW - Testing KW - Thermal effects KW - Thermocouples KW - Wire KW - Thermometers N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s10765-007-0354-0 N1 - Correspondence Address: Garrity, K. M.; Pilot Laboratory, National Institu te of Standards and Technology, Gaithersburg, MD, United States; email: karen.ga rrity@nist.gov UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-52349104236&partnerID=4 0&md5=ab7cb6405178100b1f8cd789c024403f ER TY - JOUR T1 - Optics in Mexico JF - Optics and Photonics News VL - 19 IS - 10 SP - 20 EP - 21 PY - 2008/// AU - Servin, M. AU - Malacara, Z. AD - Centro de Investigaciones en Optica (CIO), Leon Gto., Mexico AB - The development and trends for past few years in the field of optical rese arch in Mexico, are presented. Mexico has started many research programs in metr ology, fiber optics, optical materials, and interferometry. Daniel Malacara, a s cientists, in 1965 started applying standard techniques for laser building, desi gning, and constructing thin films for optical manufacturing. The Mexican govern ment established the National Council for Science and Technology (CONACyT) to en courage the research in optical technology. The National University of Mexico es tablished the Center for Research in Optics (CIO) in 1980 to promote the optical research. The National Observatory started an optical fabrication and testing p

rogram for astronomical purposes. Some of the significant field of optical resea rch includes quantum optics, optical materials and holography, lasers, optical m etrology, and image-interferometric data processing. N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Servin, M.; Centro de Investigaciones en Optica (C IO), Leon Gto., Mexico; email: mservin@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-57849110203&partnerID=4 0&md5=469bde65eb8dfc1c80faebd506f6240e ER TY - CONF T1 - Temporal phase detection of interferograms without frequency carrier JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7063 PY - 2008/// AU - Estrada, J.C. AU - Servin, M. AU - Arroyo, D. AD - Centro de Investigaciones en ptica, A. P. 1-948, 31160 Len Gto, Mexico AB - In our Optical Metrology laboratories, we deal with the problem of demodul ating temporal sequences of interferograms. These sequences of interferograms ar e obtained by means of optical testing of transient events using an Electronic S peckle Pattern Interferometry system (ESPI). It is well known that using Phase S tepping Interferometry techniques (PSI), one can obtain the modulated interferog ram phase with at least three equally temporal phase shifted interferograms. To obtain these three (or more than three) phase shifted interferograms with a conv entional ESPI array, it is necessary to have a static object under test. On the other hand, if the object under test is not static, we can make the analysis usi ng dual-pulse subtraction ESPI, introducing a spatial frequency carrier. However , in our case, we will use a conventional ESPI technique, with a continuous lase r and without a frequency carrier. Thus, as we pretend to analyze transient defo rmations or events without frequency carrier, we can not use the demodulation me thods used in dual-pulse subtraction ESPI, nor PSI techniques because it results almost impossible to take the least amount of interferograms with the required linear phase shift (or temporal carrier) among them. To accomplish this, it will be necessary look for alternatives to demodulate temporal sequences of interfer ograms without a frequency carrier and without linear phase-shifting. Here, we p resent the groundwork aimed at demodulating sequences of interferograms without a frequency carrier, where traditional PSI techniques are unable to detect the p hase correctly. KW - Beam plasma interactions KW - Civil aviation KW - Demodulation KW - Geodetic satellites KW - Interferometers KW - Optical testing KW - Phase shift KW - Signal filtering and prediction KW - Static analysis KW - Testing KW - Transient analysis KW - Electronic speckle pattern interferometry KW - Interferogram KW - Interferograms KW - Linear phase KW - Optical Metrology KW - OpticalKW - Phase shifting

KW - Phase-stepping interferometry KW - Spatial frequencies KW - Temporal phase KW - Temporal sequencing KW - Transient events KW - Interferometry N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 70631B N1 - :doi 10.1117/12.793785 N1 - Correspondence Address: Estrada, J. C.; Centro de Investigaciones en ptica, A. P. 1-948, 31160 Len Gto, Mexico; email: julio@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-52249101151&partnerID=4 0&md5=0a56ad4c678a9168929a9f64effef007 ER TY - CONF T1 - Calibration of laser vibrometers at frequencies up to 100 kHz and higher JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 7098 PY - 2008/// AU - Silva Pineda, G. AU - Von Martens, H.-J. AU - Rojas, S. AU - Ruiz, A. AU - Muiz, L. AD - Centro Nacional de Metrologa, Mexico AD - Physikalisch-Technische Bundesanstalt, Abbestrasse 2 - 12, 12587 Berlin, G ermany AB - Manufacturers and users of laser vibrometers exploit the wide frequency an d intensity ranges of laser techniques, ranging over many decades (e.g., from 0. 1 Hz to 100 MHz). Traceability to primary measurement standards is demanded over the specified measurement ranges of any measurement instrumentation. As the pri mary documentary standard ISO 16063-11 for the calibration of vibration transduc ers is restricted to 10 kHz, a new international standard for the calibration of laser vibrometers, ISO 16063-41, is under development. The current stage of the 2nd Committee Draft (CD) of the ISO standard specifies calibration methods for frequencies from 0.4 Hz to 50 kHz which does not meet the demand for providing t raceability at higher frequencies. New investigations will be presented which de monstrate the applicability of the laser interferometer methods specified in ISO 16063-11 and in the 2nd CD also at higher frequencies of 100 kHz and beyond. Th e three standard methods were simultaneously used for vibration displacement and acceleration measurements up to 100 kHz, and a fourth high-accuracy method has been developed and used. Their results in displacement and acceleration measurem ents deviated by less than 1 % from each other at vibration displacement amplitu des in the order of 100 nm. In addition to the three interferometer methods spec ified in ISO 16063-11 and 16063-15, and in the 2nd Committee Draft of 16063-41 a s well, measurement results will be presented. Examples of laser vibrometer cali brations will bedemonstrated. Further investigations are aimed at developing app ropriate vibration exciters to achieve accurately measurable displacements at fr equencies higher than 100 kHz. KW - Accelerometer KW - Calibration KW - Documentary standards KW - Laser interferometer KW - Laser vibrometer KW - Measurement standards KW - Measuring instrument KW - Metrology KW - Transducer

KW - Uncertainty KW - Vibration measurement KW - Acceleration measurement KW - Accelerometers KW - Calibration KW - Composite beams and girders KW - Interferometers KW - Interferometry KW - Lasers KW - Lattice vibrations KW - Optical instruments KW - Standardization KW - Standards KW - Transducers KW - Tropical engineering KW - Vibration measurement KW - Vibrations (mechanical) KW - Accelerometer KW - Calibration methods KW - Documentary standards KW - High-accuracy KW - Higher frequencies KW - Intensity ranges KW - International conferences KW - International standard KW - ISO standards KW - Laser interferometer KW - Laser interferometers KW - Laser techniques KW - Laser vibrometer KW - Laser vibrometers KW - Measurement instrumentation KW - Measurement results KW - Measurement standards KW - Measuring instrument KW - Metrology KW - Primary measurement standards KW - Standard methods KW - Transducer KW - Uncertainty KW - Vibration displacements KW - Vibration exciters KW - Measurements N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 70981K N1 - :doi 10.1117/12.803338 N1 - Correspondence Address: Silva Pineda, G.; Centro Nacional de MetrologaMexic o UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-50249133697&partnerID=4 0&md5=a234cc6f080f44072a8b35d2060d758f ER TY T1 phy JF VL IS - JOUR - Microstrain detection using simultaneous endoscopic pulsed digital hologra - Optical Engineering - 47 - 7

PY - 2008/// AU - Anaya, T.S. AU - De La Torre, M. AU - Santoyo, F.M. AD - Universidad Autnoma de Zacatecas, Calzada Solidaridad Esquina Con Paseo la Bufa S/N, Zacatecas 98060, Mexico AD - SPIE AD - Centro de Investigaciones en ptica A.C, Loma del Bosque 115 Lomas del Campe stre Len, Guanajuato 37150, Mexico AB - A simultaneous 2-D pulsed digital holographic setup that incorporates a ri gid endoscope is used to Inspect hidden object areas in order to measure microst rains. The system was tested on the internal surface of a harmonically vibrating rectangular metal box with a fracture on its surface. The simultaneous setup al lows the acquisition of displacement data from two different object illumination positions at the same time, so that the system Is capable of studying nonrepeat able dynamic events. Further analysis using displacement data generates a gradie nt strain map where the fracture is successfully detected with the correspondina strain magnitude and direction quantified. 2008 Society of Photo-Optical Instru mentation Engineers. KW - Holography KW - Instrumentation KW - Interferometry KW - Measurement KW - Metrology KW - Computer generated holography KW - Data recording KW - Digital arithmetic KW - Fracture fixation KW - Holographic interferometry KW - Laser recording KW - Metals KW - Photonics KW - Dynamic events KW - Internal surfaces KW - Micro strain KW - Microstrains KW - Optical Instrumentation KW - Pulsed digital holography KW - Strain magnitude KW - Data acquisition N1 - Cited By (since 1996):5 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 073601 N1 - :doi 10.1117/1.2955510 N1 - Correspondence Address: Anaya, T. S.; Universidad Autnoma de Zacatecas, Cal zada Solidaridad Esquina Con Paseo la Bufa S/N, Zacatecas 98060, Mexico; email: tsaucedo@planck.reduaz.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-47249159511&partnerID=4 0&md5=7720068a474865a7dcb0a4ae56f13352 ER TY T1 JF VL IS SP EP PY JOUR Shape connection by pattern recognition and laser metrology Applied Optics 47 20 3590 3608 2008///

AU - Muoz-Rodrguez, J.A. AD - Centro de Investigaciones en Optica, A.C., Leon, Gto 37150, Mexico AB - Shape connection based on the pattern recognition of three-dimensional sha pes is presented. In this technique, the object shape is reconstructed by laser scanning and image processing. The object is reconstructed from multiple views w hen an object occlusion appears. From this process, multiple parts of the object are reconstructed. Then, these parts are assembled to obtain the complete objec t shape. To perform the assembling, a matching procedure is applied to a transve rse section of the multiple views by Hu moments. The depth of the transverse sec tion is computed by an approximation network based on the behavior of the laser line and the camera position. Also, vision parameters are deduced by the network and image processing. In this manner, the shape connection is achieved automati cally by computational algorithms. Therefore, errors of physical measurement are not passed to the reconstruction system. Thus, the performance and the accuracy of the reconstruction system are improved. This is elucidated by the comparison between the obtained results by the proposed technique and the obtained results by a contact method. Thus, a contribution in laser metrology for shape connecti on is achieved. 2008 Optical Society of America. KW - Camera positions KW - Computational algorithms KW - Hu moments KW - Laser lines KW - Laser metrology KW - Laser scanning KW - Multiple parts KW - Multiple views KW - Network based KW - Object occlusion KW - Object shape KW - Physical measurements KW - Three-dimensional shapes KW - Transverse sections KW - Digital image storage KW - Feature extraction KW - Image processing KW - Imaging systems KW - Imaging techniques KW - Measurement errors KW - Optical data processing KW - Pattern recognition KW - Repair KW - Restoration KW - Three dimensional KW - Lasers N1 - Cited By (since 1996):6 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1364/AO.47.003590 N1 - Correspondence Address: Muoz-Rodrguez, J. A.; Centro de Investigaciones en O ptica, A.C., Leon, Gto 37150, Mexico; email: munoza@foton.cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-51949094542&partnerID=4 0&md5=27f47bba6a6cd39483d1ed3d05a3b395 ER TY T1 esign JF VL SP SER Individual evolution as an adaptive strategy for photogrammetric network d Studies in Computational Intelligence 136 157

EP - 176 PY - 2008/// AU - Olague, G. AU - Dunn, E. AU - Lutton, E. AD - CICESE, Km. 107 Carretera Tij-Eda, 22860 Ensenada, Mexico AD - INRIA Rocquencourt, Le Chesnay Cedex, France AB - This chapter introduces individual evolution as a strategy for problem sol ving. This strategy proposes to partition the original problem into a set of hom ogeneous elements, whose individual contribution to the problem solution can be evaluated separately. A population comprised of these homogeneous elements is ev olved with the goal of creating a single solution by a process of aggregation. T he goal of individual evolution is to locally build better individuals that join tly form better global solutions. The implementation of the proposed approach re quires addressing aspects such as problem decomposition and representation, loca l and global fitness integration, as well as diversity preservation mechanisms. The benefit of applying the individual evolution approach for problem solving is a substantial reduction in computational effort expended in the evolutionary op timization process. This chapter shows an example from vision metrology where ex perimental results coincide with previous state of the art photogrammetric netwo rk design methodologies, while incurring in only a fraction of the computational cost. 2008 Springer-Verlag Berlin Heidelberg. KW - Coevolution KW - Individual evolution KW - Photogrammetric network design A2 - Cotta C.C. A2 - Sevaux M.S. A2 - Sorensen K.S. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/978-3-540-79438-7_8 N1 - Correspondence Address: Olague, G.; CICESE, Km. 107 Carretera Tij-Eda, 228 60 Ensenada, Mexico; email: olague@cicese.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-45949092454&partnerID=4 0&md5=dd5cea02e655f5d50c01e34867a51b3c ER TY - CONF T1 - Nanometrology of deformations by temperature in metallic materials JF - AIP Conference Proceedings VL - 992 SP - 919 EP - 923 PY - 2008/// AU - Mendoza, E.F. AU - Perucho, C.J. AU - Arturo Plata, G. AD - Universidad Industrial de Santander, Barrio la Universidad, cll. 9 cra. 27 , Bucaramanga, Santander, Colombia AB - The cross-sectional and longitudinal deformations are determined that unde rgoes the ferrous materials like Nick-elferrous, nonFerrous like the steel 316 a nd alloys like Nitinol when they are exposed to changes of temperature in the ra nk of 20 to 32 centigrade. The micro structural transitions that they undergo the metallic materials like the Nitinol and others elements when changing their mart ensita austenite solid state are quantified measuring the changes in its volume with hires (10 nanos). Observing the fluctuations of the temperature it obtains the curve of the deformations versus the temperature in metallic materials that present display form memory. These cross-sectional and longitudinal variations d emonstrate martesiticas transformations of phase that occur in the materials and the volumetric variations of these, which are quantified by means of an optical

system (microscope with an objective Mirau type) using interferometric methods, since these methods combined with a source of white illumination it allows us t o make a reconstruction not only of the topography and texture, but of variation s in the different directions from deformations that they before have the materi als and after being exposed to the changes of temperature, this method also allo wed us to quantify displacements of such material. 2008 American Institute of Ph ysics. KW - Deformations KW - Interferometry KW - Optical metrology N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1063/1.2926996 N1 - Correspondence Address: Mendoza, E. F.; Universidad Industrial de Santande r, Barrio la Universidad, cll. 9 cra. 27, Bucaramanga, Santander, Colombia UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-43649092923&partnerID=4 0&md5=2e29809fd268855d6053daed4515e8ad ER TY - CONF T1 - Optimization algorithm for designing diffractive optical elements JF - AIP Conference Proceedings VL - 992 SP - 174 EP - 179 PY - 2008/// AU - Agudelo, V.A. AU - Orozco, R.A. AD - Universidad Nacional de Colombia, Ciudad Universitaria, Calle 45 Carrera 3 0, Bogot, Colombia AD - Combustin Ingenieros Ltda., Calle 25B No. 85B - 76, Bogot, Colombia AB - Diffractive Optical Elements (DOEs) are commonly used in many applications such as laser beam shaping, recording of micro reliefs, wave front analysis, me trology and many others where they can replace single or multiple conventional o ptical elements (diffractive or refractive). One of the most versatile way to pr oduce them, is to use computer assisted techniques for their design and optimiza tion, as well as optical or electron beam microlithography techniques for the fi nal fabrication. The fundamental figures of merit involved in the optimization o f such devices are both the diffraction efficiency and the signal to noise ratio evaluated in the reconstructed wave front at the image plane. A design and opti mization algorithm based on the error - reduction method (Gerchberg and Saxton) is proposed to obtain binary discrete phase-only Fresnel DOEs that will be used to produce specific intensity patterns. Some experimental results were obtained using a spatial light modulator acting as a binary programmable diffractive phas e element. Although the DOEs optimized here are discrete in phase, they present an acceptable signal noise relation and diffraction efficiency. 2008 American In stitute of Physics. KW - Diffraction efficiency KW - Diffractive optical elements KW - Iterative algorithms KW - Optimization KW - Signal to noise rate N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1063/1.2926852 N1 - Correspondence Address: Agudelo, V. A.; Universidad Nacional de Colombia, Ciudad Universitaria, Calle 45 Carrera 30, Bogot, Colombia UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-43649106406&partnerID=4 0&md5=a427a3248a6076576abab0dc11201d80 ER -

TY - CONF T1 - Correlation of spatially filtered dynamic speckles in distance measurement application JF - AIP Conference Proceedings VL - 992 SP - 577 EP - 582 PY - 2008/// AU - Semenov, D.V. AU - Nippolainen, E. AU - Miridonov, S.V. AU - Kamshilin, A.A. AD - Department of Physics, University of Kuopio, P.O.B. 1627, FI-70211 Kuopio, Finland AD - Optics Department, CICESE, Carr. Tijuana-Ensenadakm 107, C.P. 22860, Ensen ada, B.C., Mexico AB - In this paper statistical properties of spatially filtered dynamic speckle s are considered. This phenomenon was not sufficiently studied yet while spatial filtering is an important instrument for speckles velocity measurements. In cas e of spatial filtering speckle velocity information is derived from the modulati on frequency of filtered light power which is measured by photodetector. Typical photodetector output is represented by a narrow-band random noise signal which includes non-informative intervals. Therefore more or less precious frequency me asurement requires averaging. In its turn averaging implies uncorrelated samples . However, conducting research we found that correlation is typical property not only of dynamic speckle patterns but also of spatially filtered speckles. Using spatial filtering the correlation is observed as a response of measurements pro vided to the same part of the object surface or in case of simultaneously using several adjacent photodetectors. Found correlations can not be explained using j ust properties of unfiltered dynamic speckles. As we demonstrate the subject of this paper is important not only from pure theoretical point but also from the p oint of applied speckle metrology. E.g. using single spatial filter and an array of photodetector can greatly improve accuracy of speckle velocity measurements. 2008 American Institute of Physics. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1063/1.2926930 N1 - Correspondence Address: Semenov, D. V.; Department of Physics, University of Kuopio, P.O.B. 1627, FI-70211 Kuopio, Finland UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-43649098501&partnerID=4 0&md5=d11f17b09ea409d368b85b98abc9c4b6 ER TY - CONF T1 - A new technique of measuring low-power picosecond optical pulse trains JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6796 PY - 2008/// AU - Shcherbakov, A.S. AU - Munoz Zurita, A.L. AU - Campos Acosta, J. AD - Department of Optics, National Institute for Astrophysics, Optics and Elec tronics (INAOE), A.P. 51 y 216, Puebla, 72000, Mexico AD - CSIC, Institute for Applied Physics, C.P. 28006, Madrid, Spain AB - We present a theoretic approach to the characterization of low-power brigh t ultrashort optical pulses with an internal frequency modulation simultaneously in both time and frequency domains. This approach exploits the Wigner time-freq uency distribution, which can be determined and developed for these bright optic al pulses by using a novel interferometric technique under our proposal. At firs

t, the analysis and computer simulations are applied to studying the capability of Wigner distribution to characterize solitary pulses in practically important case of the sech-pulses. Then, the simplest two-beam scanning Michelson interfer ometer is selected for shaping the field-strength auto-correlation function of l ow-power picosecond pulse trains. We are proposing the key features of a new int erferometric experimental technique for accurate and reliable measurements of th e train-average width as well as the value and sign of the frequency chirp of pu lses in high-repetition-rate trains. This technique is founded on an ingenious a lgorithm for the advanced metrology, assumes using a specially designed suppleme ntary semiconductor cell, and suggests carrying out a pair of additional measure s with exploiting this semiconductor cell. The procedure makes it possible to co nstruct the Wigner distribution and to describe the time-frequency parameters of low-power bright picosecond optical pulses. KW - Bright picosecond optical pulse KW - Interferometric technique KW - Wigner time-frequency distribution KW - Characterization KW - Frequency domain analysis KW - Frequency modulation KW - Interferometry KW - Michelson interferometers KW - Reliability theory KW - Bright picosecond optical pulses KW - Interferometric technique KW - Wigner time-frequency distribution KW - Laser pulses N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 67962S N1 - :doi 10.1117/12.778918 N1 - Correspondence Address: Shcherbakov, A. S.; Department of Optics, National Institute for Astrophysics, Optics and Electronics (INAOE), A.P. 51 y 216, Pueb la, 72000, Mexico; email: alex@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-43149095382&partnerID=4 0&md5=a821fc0ac2d31a495050e4b194fd58b7 ER TY - JOUR T1 - Aztec arithmetic revisited: Land-area algorithms and acolhua congruence ar ithmetic JF - Science VL - 320 IS - 5872 SP - 72 EP - 77 PY - 2008/// AU - Williams, B.J. AU - Jorge Y Jorge, M.D.C. AD - Department of Geography and Geology, University of Wisconsin-Rock County, Janesville, WI 53546, United States AD - Instituto de Investigaciones en Matemticas Aplicadas Y en Sistemas, FENOMEC , Ciudad Universitaria, 04510 Mxico D.F., Mexico AB - Acolhua-Aztec land records depicting areas and side dimensions of agricult ural fields provide insight into Aztec arithmetic. Hypothesizing that recorded a reas resulted from indigenous calculation, in a study of sample quadrilateral fi elds we found that 60% of the area values could be reproduced exactly by computa tion. In remaining cases, discrepancies between computed and recorded areas were consistently small, suggesting use of an unknown indigenous arithmetic. In revi siting the research, we discovered evidence for the use of congruence principles , based on proportions between the standard linear Acolhua measure and their uni

ts of shorter length. This procedure substitutes for computation with fractions and is labeled "Acolhua congruence arithmetic." The findings also clarify varian ce between Acolhua and Tenochca linear units, long an issue in understanding Azt ec metrology. KW - agricultural land KW - algorithm KW - mathematics KW - algorithm KW - arithmetic KW - article KW - calculation KW - decomposition KW - Eastern Hemisphere KW - historical period KW - land use KW - priority journal KW - reference database KW - Agriculture KW - Algorithms KW - History, 16th Century KW - Humans KW - Indians, North American KW - Mathematics KW - Acolhua N1 - Cited By (since 1996):3 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1126/science.1153976 N1 - Correspondence Address: Jorge Y Jorge, M. D. C.; Instituto de Investigacio nes en Matemticas Aplicadas Y en Sistemas, FENOMEC, Ciudad Universitaria, 04510 Mx ico D.F., Mexico; email: mcj@mym.iimas.unam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-41749100838&partnerID=4 0&md5=7de67fc8ad31dab6161a682b76c2da05 ER TY - JOUR T1 - Optical metrology by fringe processing on independent windows using a gene tic algorithm JF - Experimental Mechanics VL - 48 IS - 4 SP - 559 EP - 569 PY - 2008/// AU - Toledo, L.E. AU - Cuevas, F.J. AD - Department of Optical Metrology, Centro de Investigaciones en ptica, A.C., Loma del bosque 115, Col. Lomas del Campestre, Len 37150 Guanajuato, Mexico AB - We present a method to retrieve the phase of a fringe pattern based on the window fringe pattern demodulation technique (WFPD). The overlapped phase simil arity criterion is avoided in the proposed method, and it is substituted by a se cond order smoothness criterion. The fringe processing on independent windows (F PIW) method can measure physical quantities from closed and near sub-sampled fri nge patterns by a simplified cost or fitness function. The fringe image is divid ed into a set of partially overlapping windows. In these sub-images the estimate d phase is modelled as a parametric analytic-function, and its parameters are op timized using a genetic algorithm (GA). This analytic-function is used to estima te the phase in the area framed by the window. Phases from all windows are seque ntially spliced to retrieve the whole phase field. A media filter is applied ove r the entire phase field to smooth the irregularities that appear in the junctur

es between windows. Society for Experimental Mechanics 2007. KW - Computer vision KW - Digital image processing KW - Fringe analysis KW - Genetic algorithms KW - Optical metrology KW - Phase retrieval KW - Computer vision KW - Digital image processing KW - Experimental mechanics KW - Fitness functions KW - Fringe analysis KW - Fringe patterns KW - Fringe processing KW - Fringe-pattern demodulation KW - Genetic Algorithm (GA) KW - Optical metrology KW - Phase fields KW - Phase retrieval KW - Physical quantities KW - Second orders KW - Similarity criterion KW - Sub-images KW - Algorithms KW - Bioelectric phenomena KW - Demodulation KW - Differential equations KW - Estimation KW - Function evaluation KW - Genetic algorithms KW - Inverse problems KW - Moire fringes KW - Parameter estimation KW - Speed KW - Windows N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s11340-007-9106-0 N1 - Correspondence Address: Cuevas, F.J.; Department of Optical Metrology, Cen tro de Investigaciones en ptica, A.C., Loma del bosque 115, Col. Lomas del Campes tre, Len 37150 Guanajuato, Mexico; email: fjcuevas@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-49949091719&partnerID=4 0&md5=b1d3d37c14549427e3e0be25f496b293 ER TY - CONF T1 - Activities designed to establish relationships between concepts as a didac tic strategy in the metrology teaching process JF - 20th IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2007 SP - 513 EP - 518 PY - 2007/// AU - Santamara M., P.I. AU - Tejeda C., R. AD - Departamento de Fsica y Qumica Terica, Facultad de Qumica, Ciudad Universitari a, Mxico D.F., Mexico AB - The teaching of metrology in undergraduate courses includes concepts such as traceability, calibration and uncertainty. This paper proposes a certain acti

vity that students will have to realize in the Metrology Laboratory. The purpose of this activity is that students understand the contribution that the traceabi lity chain has in the estimation of the uncertainty of a measurement. The activi ty should be realized in three stages. The first one consists of the constructio n of a mass measuring device. In the second stage, the pupil realizes the calibr ation of the device with two different patron mass kits. In the third stage, the student weighs different problem masses and informs the value of the measurand with an uncertainty statement, calculated with the information of his previous c alibrations. Once the student has obtained different uncertainties of the same m easurand, estimated with the same instrument, the instruments' traceability rele vance will be set. KW - Calibration KW - Metrology teaching KW - Traceability KW - Uncertainty KW - Measurand KW - Measuring device KW - Teaching process KW - Traceability KW - Uncertainty KW - Undergraduate Courses KW - Calibration KW - Measurements KW - Students KW - Units of measurement KW - Uncertainty analysis N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Santamara M., P.I.; Departamento de Fsica y Qumica Ter ica, Facultad de Qumica, Ciudad Universitaria, Mxico D.F., Mexico; email: iqprax@g mail.com UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871400791&partnerID=4 0&md5=5a09c4995ca53478851f59099eb8d87a ER TY - CONF T1 - Metrology impact in technological universities Mexico JF - 20th IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2007 SP - 430 EP - 434 PY - 2007/// AU - Martnez-Sanchez, S. AU - Laguna-Aguilar, F.M.C. AU - Torres-Guzman, J.C. AD - Cuerpo Academico Optimizacion de Procesos Productivos de la Universidad Te cnologica, Tula Tepeji, Mexico AD - Centro Nacional de Metrologa, Quertaro, Mexico AB - The Universidades Tecnolgicas (Technological Universities) in Mexico have a s a mission to offer a high quality education model which has been in operation for more than 50 years in countries where it has proven to be a success. In 1998 , the Centro Nacional de Metrologa (CENAM) collaborated with the Technological Un iversities by means of an indepth technical training in Metrology. The objective was to disseminate the metrological knowledge among the academic members and st imulate them to establish secondary calibration laboratories in their institutio ns. KW - Metrology KW - Technological universities KW - Calibration laboratories KW - High quality

KW - Me-xico KW - Technical training KW - Technological universities KW - Measurements KW - Societies and institutions KW - Technical presentations KW - Units of measurement KW - Education N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Martnez-Sanchez, S.; Cuerpo Academico Optimizacion de Procesos Productivos de la Universidad Tecnologica, Tula Tepeji, Mexico; emai l: smartinez@uttt.edu.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871453252&partnerID=4 0&md5=e0d9bed0e74b375ab3446ea73e4add4a ER TY - CONF T1 - Metrology in developing economies - Jamaican experience in publishing mass CMCs in appendix C of MRA of CIPM JF - 20th IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2007 SP - 209 EP - 217 PY - 2007/// AU - Sanz, M. AU - Becerra, L.O. AD - Formerly Bureau of Standards Jamaica (BSJ), Richmond Hill, Jamaica AD - CENAM, Quertaro, Mexico AB - This paper presents the strategy followed to restore Jamaica's Mass labora tory's development aiming towards the expansion of its Calibration and Measureme nt Capabilities (CMCs). The work will present a set of key steps taken to improv e the current status of the Bureau of Standards Jamaica (BSJ) Mass laboratory in order to bring the laboratory closer to a level of a recognized National Metrol ogy Institution (NMI). The factors considered for the improvement strategy of th e laboratory were: i) the laboratory's quality system, ii) expertise and exposur e of the staff, iii) work with peers NMIs, iv) publication of the laboratory CMC s. KW - CMCs recognition KW - Mass Metrology KW - CMCs recognition KW - Current status KW - Developing economies KW - Quality systems KW - Molar mass KW - Units of measurement KW - Laboratories N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Sanz, M.; Formerly Bureau of Standards Jamaica (BS J), Richmond Hill, Jamaica; email: msanz@vecollective.com UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871452440&partnerID=4 0&md5=021cf57d63830a34b75a3689e181ecd0 ER TY T1 JF VL PY CONF Object modelling based on laser metrology and neural networks Proceedings of SPIE - The International Society for Optical Engineering 6422 2007///

AU - Cisea, M.R. AU - Apolinar Muoz Rodrguez, J. AU - Rodrguez, M.O. AD - Centro de Ingeniera y Desarrollo Industrial, Queretaro, 76130, Mexico AD - Centro de Investigaciones en Optica, A. C. Leon, Gto, 37150, Mexico AD - Instituto Tecnolgico de Len, Len, Gto. 37290, Mexico AB - An automatic technique for shape modelling is presented. The approach of t his technique is the object representation by means of a mathematical model. To carry it out, a neural network is implemented to perform the object modelling. T he model provided by the neural network is performed based on the surface data. To detect the surface data, the object is scanned by a light line. Thus, the las er metrology provides the surface data to construct the model by means of the ne twork. This process involves image processing of a laser line pattern. The appro ach of the neural networks is to perform the object modelling without measuremen ts on the optical setup. Thus, the setup performance and accuracy are improved. It is because the errors of the measurement are not added to the computational m odel. To describe the accuracy a root mean square of error is calculated using d ata provided by the network and data given by a contact method. This technique i s tested with real objects and its experimental results are presented. KW - Bezier functions KW - Laser line KW - Neural networks KW - Surface detection KW - Mathematical models KW - Mean square error KW - Neural networks KW - Object recognition KW - Bezier functions KW - Laser line patterns KW - Surface detection KW - Laser optics N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 64220V N1 - :doi 10.1117/12.742640 N1 - Correspondence Address: Cisea, M.R.; Centro de Ingeniera y Desarrollo Indust rial, Queretaro, 76130, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-37649015664&partnerID=4 0&md5=d3f3e8f168b6417563c9087a0a3264f9 ER TY - CONF T1 - SIM vacuum comparison from 133.3 Pa to 13.33 kPa JF - 3rd IMEKO TC16 International Conference on Pressure Measurement 2007 SP - 200 EP - 205 PY - 2007/// AU - Torres-Guzmn, J.C. AU - Paraguass, L.H. AU - Couto, P.R.G. AU - Bezerra, I.L. AD - Centro Nacional de Metrologa, CENAM, Mexico AD - Instituto Nacional de Metrologia, Normalizao e Qualidade Industrial (INMETRO ), Brazil AB - This comparison constitutes the second part of the first vacuum comparison among National Metrology Institutes (NMI) within the Interamerican Metrology Sy stem (SIM). Each laboratory used its national standards for the compared range. The Centro Nacional de Metrologa (CENAM, Mexico) used a reference standard (compa rison system type) and the Instituto Nacional de Metrologia, Normalizao e Qualidad e Industrial (INMETRO, Brazil) used a similar reference standard (comparison sys

tem type). The comparison started in December 2004 and finished in March 2005. T he objective of the comparison was to estimate the level of agreement for the re alization of the quantity and the uncertainty associated to its measurement. One transducer (Capacitive Diaphragm Gauge) was used as transfer standard; the comp arison range was selected from 133.3 Pa up to 13.33 kPa. The relevant aspects of the measurement protocol are summarized in the paper but were widely developed in the comparison reference documents. The gas used for the comparison was nitro gen. The measurements started at the lowest pressure and the pressure was increa sed up to the maximum range. The analysis of measurements comparability between the laboratories is included here. This bilateral comparison has been entered wi thin the SIM data base as a pilot comparison SIM.7.26 P. KW - Capacitive diaphragm gauge KW - Comparison KW - SIM KW - Vacuum KW - Analysis of measurements KW - Comparison KW - Me-xico KW - Measurement protocol KW - Metrology systems KW - National metrology institutes KW - National standard KW - Reference standard KW - SIM KW - Transfer standard KW - Diaphragms KW - Force measurement KW - Gages KW - Nitrogen KW - Pressure measurement KW - Vacuum KW - Uncertainty analysis N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Torres-Guzmn, J.C.; Centro Nacional de Metrologa, CE NAMMexico; email: jtorres@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871439061&partnerID=4 0&md5=6077f234a0dc7dcf55b65e3314e97442 ER TY - CONF T1 - A bilateral acceleration comparison between CENAM and INMETRO JF - 1st IMEKO TC22 International Conference on Vibration Measurement 2007 SP - 28 EP - 40 PY - 2007/// AU - Ripper, G.P. AU - Silva-Pineda, G. AD - INMETRO - National Institute of Metrology, Standardization and Industrial Quality, Rio de Janeiro, Brazil AD - CENAM - Centro Nacional de Metrologa, Mexico AB - A bilateral key comparison was conducted in the area of vibration between the National Institute of Metrology, Standardization and Industrial Quality (INM ETRO), Brazil and the Centro Nacional de Metrologa (CENAM), in Mexico; with INMET RO acting as pilot laboratory. This comparison was registered in the BIPM key co mparison database (Mutual Recognition Arrangement - Appendix B) as SIM.AUV.V-K1. 1 and the measurements were carried out by the participating laboratories from O ctober 2004 to March 2006. The aim of this exercise was to compare primary inter ferometric measurements of complex charge sensitivity of standard accelerometers under sinusoidal linear accelerations in the frequency range from 10 Hz to 10 k

Hz. In addition, it was intended to provide a link between INMETRO and the key c omparison reference values (KCRVs) established in the CIPM key comparison CCAUV. V-K1. This link of the regional metrology organization (RMO) key-comparison SIM. AUV.V-K1.1 to the International Committee for Weights and Measures (CIPM) key-co mparison CCAUV.VK1 can be established because CENAM participated in both compari sons. Both participants used automated calibration systems based on homodyne qua drature laser interferometers to measure the sensitivity magnitude and the phase shift of two backto- back standard accelerometers in compliance with the intern ational standard ISO 16063-11:1999. The results reported by the participating la boratories at 30 specified frequencies and the respective calculated degrees of equivalence are presented. These results show an agreement better than 0,3 % fro m 10 Hz to 5 kHz and than 1% from 6 kHz to 10 kHz in sensitivity magnitude and b etter than 0,6D in phase shift in the entire frequency range. KW - Accelerometer KW - Calibration KW - Interlaboratory comparison KW - Metrology KW - Vibration KW - Automated calibration KW - Charge sensitivity KW - Degrees of equivalence KW - Frequency ranges KW - Homodynes KW - Industrial quality KW - Interferometric measurement KW - Interlaboratory comparison KW - International Committee for Weights and Measures KW - International standards KW - Key comparison KW - Key comparison database KW - Key Comparison Reference Value KW - Laser interferometer KW - Linear accelerations KW - Me-xico KW - Mutual recognition arrangements KW - Vibration KW - Calibration KW - Laser interferometry KW - Measurements KW - Phase shift KW - Phase shifters KW - Regulatory compliance KW - Units of measurement KW - Vibration measurement KW - Accelerometers N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Ripper, G.P.; INMETRO - National Institute of Metr ology, Standardization and Industrial Quality, Rio de Janeiro, Brazil; email: la vib@inmetro.gov.br UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871517381&partnerID=4 0&md5=c01ae2bcf94b0b7329cf2c2aa57a5470 ER TY - CONF T1 - Torque proficiency test among accredited laboratories in Mexico JF - 20th IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2007 SP - 442 EP - 447

PY - 2007/// AU - Galvan-Mancilla, J. AU - Torres-Guzman, J.C. AU - Ramirez-Ahedo, D. AD - Centro Nacional de Metrologia, CENAM, Mexico AB - A torque proficiency test among accredited laboratories in Mexico was perf ormed starting in January 2007. The main objectives of this exercise were to est imate the level of agreement for the dissemination of the quantity among laborat ories and to evaluate the compatibility, including the uncertainty associated to its measurements, of the laboratories results with the set references values. T he Centro Nacional de Metrologia, CENAM (Mexico) was the pilot laboratory and re sponsible for the coordination of this program. The maximum torque measurement f or this proficiency test was 800 Nm. The torque standard TS used for the proficie ncy test was a torque wrench with a range up to 800 Nm. In this torque proficienc y test 5 Mexican torque accredited laboratories participated. The results of the test showed good agreement among the laboratories and also with the reference v alues set by the national metrology institute (CENAM). KW - Accredited laboratories KW - Proficiency test KW - Torque KW - Accredited laboratories KW - Me-xico KW - National metrology institutes KW - Proficiency tests KW - Reference values KW - Torque wrenches KW - Laboratories KW - Testing KW - Torque measurement KW - Uncertainty analysis KW - Torque N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Galvan-Mancilla, J.; Centro Nacional de Metrologia , CENAMMexico; email: jgalvan@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871463470&partnerID=4 0&md5=a2ce3f0c95d2b9b18a2e083416a3256c ER TY - CONF T1 - Linking SIM mass comparisons to the KCRV on 1 kg JF - 20th IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2007 SP - 378 EP - 389 PY - 2007/// AU - Becerra, L.O. AD - CENAM Quertaro, Qro., Mexico AB - Within the frame of SIM (Sistema Interamericano de Metrologa) some inter la boratory mass comparisons have been performed in different nominal values. The m ain objective of those comparisons was to evaluate the degree of equivalence of SIM National Metrology Institutes (NMIs) between themselves and between SIM's NM Is with NMIs from other metrological regions. This paper presents the degree of equivalence in 1 kg between SIM's NMIs and between SIM's NMIs with the Key Compa rison Reference Value (KCRV) of CCM.M-K1. KW - Mass KW - Mass comparisons KW - Degree of equivalence KW - Key comparison reference values KW - Mass

KW - Mass comparisons KW - National metrology institutes KW - Measurements N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Becerra, L.O.; CENAM Quertaro, Qro.Mexico; email: l becerra@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871400464&partnerID=4 0&md5=90fd835760c4b483332955ca0e7135b6 ER TY - CONF T1 - Solids volume by hydrostatic weighing comparison between CENAM-Mexico and INMETRO-Brazil. SIM.7.34-B JF - 20th IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2007 SP - 341 EP - 347 PY - 2007/// AU - Becerra, L.O. AU - Malta, D. AU - Centeno, Luz.Ma. AU - Pinheiro, J.J. AD - CENAM, Quertaro, Qro., Mexico AD - INMETRO, Xerm, Duque de Caxias, Rj, Brazil AB - This paper presents the results obtained for a SIM comparison between CENA MMexico and INMETRO-Brazil in volume of solids by hydrostatic weighing measureme nts. In this work are presented a scheme of measurements, and the systems used b y the National Metrology Institutes. The travelling standards were two spheres m ade of different materials (stainless steel and glass) with approximated diamete r of 15 mm each. KW - Hydrostatic weighing measurements KW - Solid density KW - Volume of solids KW - Hydrostatic weighing KW - National metrology institutes KW - Solid density KW - Solids volume KW - Travelling standard KW - Hydraulics KW - Weighing KW - Hydrodynamics N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Becerra, L.O.; CENAM, Quertaro, Qro.Mexico; email: lbecerra@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871442350&partnerID=4 0&md5=824f6bcf9c3c4aecd7bb54314118b7df ER TY T1 a for JF SP EP PY AU AU AU CONF Hydraulic gauge pressure proficiency test in the range from 7 MPa to 70 MP Mexican accredited laboratories 3rd IMEKO TC16 International Conference on Pressure Measurement 2007 177 184 2007/// Olvera-Arana, P. Torres-Guzman, J.C. Navarro-Nateras, A.

AU - Aranzolo-Surez, J. AD - Centro Nacional de Metrologa (CENAM, Mexico), Mexico AB - At the end of 2006, the Pressure Group of the Centro Nacional de Metrologa CENAM, Mexican National Metrology Institute, organized and piloted a proficiency test in hydraulic gauge pressure in the range from 7 MPa to 70 MPa for accredit ed laboratories by the Entidad Mexicana de Acreditacin (ema), Mexican Accreditati on Body. For the proficiency test, the pilot laboratory (CENAM) carried out thre e calibrations of the transfer standard; the first one at the beginning of the p roficiency test, the second at the middle and the last one at the end of the pro gram. With the measurements made by CENAM the reference values were established, including error and uncertainty. The deviations for each laboratory were compar ed against the reference values and the compatibility of results was calculated, for each participating laboratory, by means of the normalized error equation me thod. The measurements were carried out by each participant laboratory with thei r own resources (personnel, calibration systems, environmental conditions and in their installations). Laboratories located all around the country participated and most of the laboratories with this range of measurement participated. The pr oficiency test started in November 2006 and finished in March 2007. KW - Hydraulic gauge pressure KW - Pressure KW - Proficiency tests KW - Accredited laboratories KW - Calibration system KW - Environmental conditions KW - Error equation KW - Gauge pressure KW - National metrology institutes KW - Proficiency tests KW - Reference values KW - Transfer standard KW - Accreditation KW - Calibration KW - Gages KW - Laboratories KW - Pressure KW - Pressure measurement KW - Testing KW - Uncertainty analysis KW - Software testing N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Olvera-Arana, P.; Centro Nacional de Metrologa (CEN AM, Mexico)Mexico; email: polvera@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871422690&partnerID=4 0&md5=644623f032699dcf5f0573e71e9a95ef ER TY T1 a for JF SP EP PY AU AU AU AU AD AB CONF Pneumatic gauge pressure proficiency test in the range from-70 kPa to 0 kP Mexican accredited laboratories 3rd IMEKO TC16 International Conference on Pressure Measurement 2007 185 192 2007/// Zuiga-Gonzalez, S. Olvera-Arana, P. Torres-Guzman, J.C. Flores-Martinez, F.J. Centro Nacional de Metrologa (CENAM, Mexico), Mexico With the purpose to establish deviations and concordance levels for negati

ve pressure measurements in Mexico, and by a request from the Mexican Accreditat ion Body (ema), the pressure and vacuum group in CENAM (the Mexican National Met rology Institute) organized a proficiency test among laboratories from the Natio nal System of Calibrations (SNC). In this proficiency test most of the Mexican s econdary laboratories with the capabilities to perform calibrations in this meas urement range participated. This document presents the results and the concordan ce level obtained among the laboratories which participated in the proficiency t est. The measurements performed by the pilot laboratory (CENAM) are also present ed. CENAM established the reference values (error and uncertainty) and determine d the drift of the transfer standard during the period of the proficiency test. The concordance of the results obtained by the laboratories was evaluated by mea ns of the normalized error equation method. KW - Pneumatic gauge pressure KW - Pressure KW - Proficiency tests KW - Accredited laboratories KW - Error equation KW - Gauge pressure KW - Me-xico KW - Measurement range KW - National metrology institutes KW - Proficiency tests KW - Reference values KW - Transfer standard KW - Accreditation KW - Calibration KW - Laboratories KW - Pneumatic gages KW - Pressure KW - Pressure measurement KW - Testing N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Zuiga-Gonzalez, S.; Centro Nacional de Metrologa (CE NAM, Mexico)Mexico; email: szuniga@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871403074&partnerID=4 0&md5=0da42ab6f9cbe7cf1f61c18f560e10d9 ER TY - CONF T1 - Construction of an optical tiltmeter JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6422 PY - 2007/// AU - Jaramillo-Nez, A. AU - Lucero-Alvarez, M. AD - Instituto Nacional de Astrofisica Optica y Electronica, Apdo. Postal 51 y 216, Puebla, 72000, Mexico AB - In this work an optical instrument for measuring tilt is described. The de vice is compact, requires no special handling and can measure variations in tilt of the order of 0.5 arcsec, although this value can be suitably modified by cha nging the setup parameters. The instrument was developed as a tiltmeter using a liquid surface as reference surface. The inclination is obtained by measuring th e longitudinal displacement of a laser beam after being reflected from the surfa ce of the liquid. The application of the instrument for measuring the tilt of th e spindle of a polishing machine of large dimensions is presented. KW - Beam displacement KW - Geometrical optics KW - Metrology KW - Tiltmeter

KW - Angle measurement KW - Geometrical optics KW - Laser beams KW - Parameter estimation KW - Beam displacement KW - Optical tiltmeters KW - Optical instruments N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 64220D N1 - :doi 10.1117/12.742347 N1 - Correspondence Address: Jaramillo-Nez, A.; Instituto Nacional de Astrofisica Optica y Electronica, Apdo. Postal 51 y 216, Puebla, 72000, Mexico; email: ajar amil@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-37649009671&partnerID=4 0&md5=fbd7e1eac53f88c96d19c9bdbd1b70dc ER TY - CONF T1 - Luminous flux and correlated color temperature determination for LEDs sour ces JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6422 PY - 2007/// AU - Estrada-Hernndez, A. AU - Gonzlez-Galvn, L.P. AU - Zrate-Hernndez, H. AU - Cardoso, R. AU - Rosas, E. AD - Divisin de ptica y Radiometra, Centro Nacional de Metrologa, km 4.5 Carretera a los Cues, E1 Marqus, Quertaro, Mexico AB - Recently, Light Emitting Diodes (LEDs) have found several applications fro m lighting to automotive displays, screens, traffic signaling and many other. Th ese emerging applications require some of their visual quality characteristics t o be measured as accurately as possible in an objective physical manner. Therefo re the Photometry Laboratory and the Sources Spectroradiometry Laboratory of the Centro Nacional de Metrologa (CENAM) of Mexico have started with the development of photometry and radiometry measurement capabilities for LEDs in order to prov ide the industry with the necessary metrological infrastructure. In this paper w e present the first results obtained at CENAM for the measurement of the luminou s flux and the determination of the correlated color temperature of a couple of commercial white LEDs sources used for lighting. The values obtained for those q uantities are presented here together with their corresponding estimated uncerta inties and provided with traceability to the SI units through the national stand ards maintained at CENAM. KW - Correlated color temperature KW - LEDs KW - Metrology KW - Photometry KW - Radiometry KW - Total luminous flux KW - Uncertainty KW - Luminous materials KW - Photometry KW - Radiometry KW - Standards KW - Uncertainty analysis KW - Correlated color temperature KW - Total luminous flux KW - Visual quality

KW - Light emitting diodes N1 - Cited By (since 1996):3 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 64220O N1 - :doi 10.1117/12.742589 N1 - Correspondence Address: Rosas, E.; Divisin de ptica y Radiometra, Centro Naci onal de Metrologa, km 4.5 Carretera a los Cues, E1 Marqus, Quertaro, Mexico; email: erosas@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-37649014675&partnerID=4 0&md5=cb56ab1fdc1f1449d2bf34344f25d091 ER TY - CONF T1 - Frequency response of the three Gaussian beam interferometric profilometer JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6671 PY - 2007/// AU - Lorenzo Jurez, P. AU - Flores, J.M. AU - Cywiak, M. AU - Servn, M. AD - Centro de Investigaciones en ptica, A.C., Lomas del Campestre, Loma del Bos que 115, Len, Guanajuato, Mxico, 37150, Mexico AB - A novel technique based on the use of a three Gaussian beam interferometer to obtain roughness information about smooth optical surfaces is described. The technique is based on the heterodinization of three coherent optical beams. One of the beams is used as a probe beam after being focused and reflected from the surface under test. A second beam is generated to be reflected by a reference s urface. The last beam is obtained from the first diffraction order of a Bragg ce ll and thus, it is shifted in its temporal frequency. The three beams are cohere ntly added at the sensitive plane of a photodetector that integrates the overall intensity of the beams. It will be demonstrated analytically that the electrica l signal at the output of the photodetector is a time varying signal whose ampli tude is proportional to the surface's local vertical height. The frequency respo nse of the proposed system is characterized experimentally by measuring the prof ile of three different blazed-gratings. Once the system is calibrated, we presen t measurements of the roughness of an optical flat. KW - Diffraction gratings KW - Frequency response KW - Gaussian beams KW - Heterodyne KW - Interferometric profilometer KW - Interferometry KW - Metrology KW - Optical flat KW - Surfaces KW - Three beams interferometry KW - Heterodyne KW - Interferometric profilometers KW - Optical flat KW - Three beams interferometry KW - Diffraction gratings KW - Frequency response KW - Gaussian beams KW - Interferometry KW - Optical variables measurement KW - Profilometry N1 - Export Date: 26 April 2013 N1 - Source: Scopus

N1 - Art. No.: 66710E N1 - :doi 10.1117/12.734142 N1 - Correspondence Address: Cywiak, M.; Centro de Investigaciones en ptica, A.C ., Lomas del Campestre, Loma del Bosque 115, Len, Guanajuato, Mxico, 37150, Mexico ; email: moi@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-42149093930&partnerID=4 0&md5=6951614a72474b1d35ecd5573009df05 ER TY - CONF T1 - Instrumentation improvements in the MMS-150 kN force standard machine, CEN AM Mexico JF - 20th IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2007 SP - 404 EP - 409 PY - 2007/// AU - Morales-Aguillon, C. AU - Torres-Guzman, J.C. AU - D. A. Ramrez-Ahedo AD - Centro Nacional de Metrologa (CENAM Mexico), Mexico AB - The Mexican National Metrology Center (CENAM) has installed a Dead Weights Force Standard Machine as national standard with a measuring range up to 153.6 kN (MMS-150 kN), which allows to carry out calibrations of force transducers in traction or compression mode. This machine has an automatic system which permits , by a series of comparisons with well known masses, to perform a calibration pr ocedure in three different modes (high accuracy, low accuracy and special proced ures). This force standard facility gives traceability to measurements (and cali brations) made by the net of secondary calibration laboratories in Mexico by mea ns of their secondary force standards calibration. The instruments that can be c alibrated in the MMS-150kN are high accuracy load cells, force transducers and p roving rings. This paper describes the improvements in the data acquisition, sig nal processing and automatic control implementation to obtain the readings of th e calibration process. KW - Calibration KW - Control KW - Force standard KW - Traceability KW - Automatic systems KW - Calibration laboratories KW - Calibration procedure KW - Calibration process KW - Compression mode KW - Control implementation KW - Force standard KW - Force standard machines KW - Force transducers KW - Load cells KW - Me-xico KW - National standard KW - Proving ring KW - Secondary forces KW - Traceability KW - Automation KW - Control KW - Signal processing KW - Transducers KW - Calibration N1 - Export Date: 26 April 2013 N1 - Source: Scopus

N1 - Correspondence Address: Morales-Aguillon, C.; Centro Nacional de Metrologa (CENAM Mexico)Mexico; email: cmorales@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871424984&partnerID=4 0&md5=7b56b92272fc8d1a5f738b0f408f4dfb ER TY - CONF T1 - Continuous improvement of a Mexican pressure calibration secondary laborat ory JF - 3rd IMEKO TC16 International Conference on Pressure Measurement 2007 SP - 92 EP - 98 PY - 2007/// AU - Cedillo, F.J. AU - Villeda, R.L. AD - Calibraciones Profesionales e Ingenier S.A. de C.V., Mexico AB - The present article has as main objective showing the evolution of a Mexic an pressure calibration secondary laboratory based on comparisons. This could be thought to be a reflection of the maturity and metrological culture disseminati on from the Centro Nacional de Metrolog (Mexican National Centre of Metrology, CE NAM). The participation in a total of 10 comparisons through one decade as a sec ondary laboratory is analyzed in 4 subintervals. Due to the big measurement rang e covered, from -70 kPa up to 70 000 kPa, to analyzed in only one graph would be a little illustrative. KW - Comparison KW - Normalized error KW - Pressure KW - Secondary laboratory KW - Uncertainty KW - Comparison KW - Continuous improvements KW - Measurement range KW - Pressure calibration KW - Subintervals KW - Uncertainty KW - Calibration KW - Pressure KW - Pressure measurement KW - Laboratories N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Cedillo, F.J.; Calibraciones Profesionales e Ingen ier S.A. de C.V.Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84871427359&partnerID=4 0&md5=dd30c054a29f5fbd44d6075957928da8 ER TY T1 JF VL IS SP EP PY AU AU AU AU AD JOUR Accurate absolute measurement of trapped Cs atoms in a MOT Revista Mexicana de Fisica 53 5 358 365 2007/// Talavera O., M. Lpez R., M. De Carlos L., E. Jimnez S., S. Divisin de Tiempo Y Frecuencia, Centro Nacional de Metrologa, CENAM, km 4.5

Carretera a los Cus, El Marques, Quertaro, 76241, Mexico AD - Centro de Investigacin Y Estudios Avanzados del IPN, Unidad Quertaro, Libram iento Norponiente No. 2000, Fracc. Real de Juriquilla, Qro, 76230, Mexico AB - A Cs-133 Magneto-Optical Trap (MOT) has been developed at the Time and Fre quency Division of the Centro Nacional de Metrologa, CENAM, in Mexico. This MOT i s part of a primary frequency standard based on ultra-cold Cs atoms, called CsF1 clock, under development at CENAM. In this Cs MOT, we use the standard configu ration ( + - -) 4-horizontal 2-vertical laser beams 1.9 cm in diameter, with 5 mW each. We use a 852 nm, 5 mW, DBR laser as a master laser which is stabilized by saturation spectroscopy. Emission linewidth of the master laser is 1 MHz. In or der to amplify the light of the master laser, a 50 mW, 852 nm AlGaAs laser is us ed as slave laser. This slave laser is stabilized by light injection technique. A 12 MHz red shift of the light is performed by two double passes through two Ac usto-Optic Modulators (AOMs). The optical part of the CENAMs MOT is very robust against mechanical vibration, acoustic noise and temperature changes in our labo ratory, because none of our diode lasers use an extended cavity to reduce the li newidth. In this paper, we report results of our MOT characterization as a funct ion of several operation parameters such as the intensity of laser beams, the la ser beam diameter, the red shift of light, and the gradient of the magnetic fiel d. We also report accurate absolute measurement of the number of Cs atoms trappe d in our Cs MOT. We found up to 6 10 7 Cs atoms trapped in our MOT measured with an uncertainty no greater than 6.4%. KW - Cold Cs atoms KW - Diode lasers KW - Laser stabilization KW - MOT KW - Time and Frequency Metrology N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Talavera O., M.; Divisin de Tiempo Y Frecuencia, Ce ntro Nacional de Metrologa, CENAM, km 4.5 Carretera a los Cus, El Marques, Quertaro , 76241, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-40449142187&partnerID=4 0&md5=0d106b290519eab44aa77f87baf9250f ER TY - JOUR T1 - SIM force standards comparison up to 10 kN JF - Measurement: Journal of the International Measurement Confederation VL - 40 IS - 7-8 SP - 786 EP - 793 PY - 2007/// AU - Torres-Guzmn, J.C. AU - Ramrez-Ahedo, D.A. AU - Giobergia, L. AU - Cruz, J.P. AU - Dajer, A.C. AD - Force and Pressure Metrology Division, Centro Nacional de Metrologia, km 4 ,5 carretera a Los Cus, El Marqus, Queretaro, Mexico AD - Centro de Fsica, Instituto Nacional de Tecnologa Industrial, INTI-CEFIS, Arg entina AD - Instituto Nacional de Metrologia, Normalizao e Qualidade Industrial, INMETRO , Brazil AD - Centro de Control de Calidad y Metrologa, SIC, Colombia AB - A comparison in the quantity of force was carried out among the Interameri can Metrology System (SIM) national laboratories in order to estimate the level of agreement for the realization of the quantity and the uncertainty associated to its measurement. This comparison was carried out up to 10 kN. The equipment u

sed consisted on two force transducers (load cells); both with the same measurin g range (10 kN). With the purpose of obtaining maximum accuracy on the transduce rs, the comparison range was selected from 4 kN up to 10 kN. This comparison (SI M comparison number SIM 7.7) has an overlap with the force steps used in the CIP M key comparison CCM.F-K1.a and CCM.F-K1.b. The results obtained, as well as the reference values selected for the comparison are included in this document. Two different methods were used to analyze the level of agreement and to state the conformity declaration. 2006 Elsevier Ltd. All rights reserved. KW - 10 kN KW - Comparison KW - Force KW - SIM KW - Measurement theory KW - Parameter estimation KW - Real time control KW - Standardization KW - Uncertainty analysis KW - Comparison range KW - Interamerican Metrology System KW - Two different methods KW - Force measurement N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.measurement.2006.07.014 N1 - Correspondence Address: Torres-Guzmn, J.C.; Force and Pressure Metrology Di vision, Centro Nacional de Metrologia, km 4,5 carretera a Los Cus, El Marqus, Quer etaro, Mexico; email: jorge.torres@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-34548161163&partnerID=4 0&md5=520a2295ff89410b210a90b4ec28942b ER TY - JOUR T1 - Evaluation of error in the measurement of displacement vector components b y using electronic speckle pattern interferometry JF - Optics Communications VL - 271 IS - 2 SP - 445 EP - 450 PY - 2007/// AU - Martnez, A. AU - Rayas, J.A. AD - Centro de Investigaciones en ptica, A. C. Apdo. Postal 1-948, C. P. Leon, 3 7000 Guanajuato, Mexico AB - We report on the errors obtained by comparing in- and out-of-plane displac ements calculated from the sensitivity matrix with all its components, and when only the component from the largest contributing of each one of the three interf erometers is considered. Divergent illumination is considered in the evaluation of sensitivity vector to measure displacement vector components. This analysis i s performed for a flat elastic target which is loaded in the x-direction and aft er in the z-direction. The technique applied is electronic speckle pattern inter ferometry. 2006 Elsevier B.V. All rights reserved. KW - ESPI KW - In-plane and out-of-plane displacements KW - Optical metrology KW - Sensitivity matrix KW - Electronic properties KW - Interferometry KW - Optical properties KW - Sensitivity analysis

KW - Speckle KW - Vectors KW - Electronic speckle pattern interferometry (ESPI) KW - In-plane and out-of-plane displacements KW - Optical metrology KW - Sensitivity matrix KW - Error analysis N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optcom.2006.10.046 N1 - Correspondence Address: Martnez, A.; Centro de Investigaciones en ptica, A. C. Apdo. Postal 1-948, C. P. Leon, 37000 Guanajuato, Mexico; email: amalia@cio.m x UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33846302787&partnerID=4 0&md5=acf69c76103cd5d60c315ab4356fba0a ER TY - JOUR T1 - Development of a practical photogrammetric network design using evolutiona ry computing JF - Photogrammetric Record VL - 22 IS - 117 SP - 22 EP - 38 PY - 2007/// AU - Olague, G. AU - Dunn, E. AD - CICESE Research Center, Km. 107 Carretera Tijuana-Ensenada, 22860 Ensenada , Baja California, Mexico AD - Centre for Scientific Research and Higher Education of Ensenada, Baja Cali fornia, Mexico AB - Photogrammetric network design is the process of optimising a network conf iguration in terms of the accuracy of object points. This accuracy is improved b y selecting the best set of intersection rays in a bundle adjustment. This paper explains the approach followed to achieve the development of a practical networ k design using a real robotic system. The aim is to integrate a simulation-based network design into a practical vision metrology system. The simulation is carr ied out with a population search metaheuristic inspired by the evolutionary comp uting paradigm. The proposed approach uses an analytical criterion to search for a suitable first-order design in a fraction of the computational time required by the evolutionary approach using a rigorous bundle adjustment. The combination of an evolutionary algorithm simulation with the very well-established bundle a djustment provides a straightforward approach to network design. An example of a photogrammetric network design is provided to illustrate the result of a comple te network design. 2007 The Authors. Journal Compilation 2007 The Remote Sensing and Photogrammetry Society and Blackwell Publishing Ltd. KW - Camera placement KW - Evolutionaryalgorithms KW - Networkdesign KW - Sensorplanning KW - Visionmetrology KW - Computer simulation KW - Evolutionary algorithms KW - Heuristic methods KW - Robotics KW - Object points KW - Photogrammetric network design KW - Population search metaheuristic

KW - Vision metrology KW - Photogrammetry KW - accuracy assessment KW - algorithm KW - digital photogrammetry KW - evolutionary theory KW - heuristics KW - network design KW - robotics N1 - Cited By (since 1996):6 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1111/j.1477-9730.2007.00403.x N1 - Correspondence Address: Olague, G.; CICESE Research Center, Km. 107 Carret era Tijuana-Ensenada, 22860 Ensenada, Baja California, Mexico; email: olague@cic ese.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-34247143654&partnerID=4 0&md5=7bbd74b0c854c38933680bbd70aa4b15 ER TY - CONF T1 - Optical discontinuous fringe metrology by using a genetic algorithm JF - Proceedings of the 2nd IASTED International Conference on Computational In telligence, CI 2006 SP - 293 EP - 296 PY - 2006/// AU - Cuevas, F.J. AU - Alcal, N. AU - Toledo, L.E. AU - Sossa-Azuela, J.H. AD - Centro de Investigaciones en ptica, A.C., Loma del Bosque 115 Len, Guanajuat o, Mexico AD - Centro de Investigacin en Computacin-IPN, Unidad Profesional Adolfo Lpez Mate os, Av. Juan de Dios Batiz s/n y M. Othon de Mendizabal, Zacatenco, Mxico, D.F., 07738, Mexico AB - We present the use of a Genetic Algorithm (GA) for optical fringe metrolog y application. In this case, the physical property being measured is coded in a fringe image or interferogram. In some applications, discontinuous fringe images are detected due to experimental conditions. Then, conventional metrology metho ds such as Fourier or phase tracker can not be applied when fringe data are lost . A GA is applied to fit a low degree polynomial to the physical measurement fie ld coded in the fringe image. Results from a computer simulated fringe image and a real interferogram coming from a grazing incidence interferometer are present ed. These images contain discontinuous fringe patterns and are successfully deco ded. KW - Fringe analysis KW - Genetic algorithms KW - Interferometry KW - Oblique incidence interferometer KW - Optical testing KW - Experimental conditions KW - Fourier KW - Fringe analysis KW - Fringe patterns KW - Grazing incidences KW - Interferogram KW - Low degrees KW - Metrology methods KW - Oblique incidence interferometer

KW - Optical fringes KW - OpticalKW - Physical measurements KW - Some applications KW - Algorithms KW - Artificial intelligence KW - Diesel engines KW - Genetic algorithms KW - Image enhancement KW - Intelligent control KW - Interferometers KW - Optical instruments KW - Optical testing KW - Interferometry N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Cuevas, F. J.; Centro de Investigaciones en ptica, A.C., Loma del Bosque 115 Len, Guanajuato, Mexico; email: fjcuevas@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-56349143024&partnerID=4 0&md5=124401caa612e1eae3323fe623a621ee ER TY - CONF T1 - Flow behavior in an experimental facility for airspeed metrology applicati on JF - Proceedings of ASME Fluids Engineering Division Summer Meeting 2006, FEDSM 2006 VL - 2 FORUMS SP - 963 EP - 967 PY - 2006/// AU - Tolentino Eslava, R. AU - Snchez Silva, F. AU - Tolentino Eslava, G. AU - Toledo Velzquez, M. AD - Control and Automatization Engineering Department, ICA-ESIME-IPN, Mexico AD - Thermal Engineering and Applied Hidraulics Laboratory (LABINTHAP), SEPI-ES IME-IPN, Mexico AB - An experimental characterization of flow behavior in an experimental facil ity for type S Pitot tube calibration by means of velocity profiles and turbulen ce is present. The measurements were carried out with a Pitot static tube and a hot wire anemometer at 4, 8 and 12 diameters from fan outlet for maximum velocit ies from 5.8 m/s to 35 m/s. The velocity and turbulence profiles were measuremen t at the discharge of the duct, in order to evaluate the possibility to use this installation for anemometer calibration too. Results showed that plane located at 12 D from fan outlet is adequate for establish the test section for type S Pi tot tube calibration. Measurement in the exit of dueted outlet showed a good flo w quality for anemometers calibration. Copyright 2006 by ASME. KW - Anemometers KW - Calibration KW - Discharge (fluid mechanics) KW - Ducts KW - Tubes (components) KW - Turbulence KW - Velocity measurement KW - Wind KW - Airspeed metrology KW - Flow quality KW - Flow patterns N1 - Export Date: 26 April 2013

N1 - Source: Scopus N1 - Correspondence Address: Tolentino Eslava, R.; Control and Automatization E ngineering Department, ICA-ESIME-IPNMexico; email: rtolentino@ipn.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33847006274&partnerID=4 0&md5=a2fa7760d7352af5efe83ec3eeee2162 ER TY - CONF T1 - Flow behavior in an experimental facility for airspeed metrology applicati on JF - 2006 ASME Joint U.S.-European Fluids Engineering Summer Meeting, FEDSM 200 6 VL - 2006 PY - 2006/// AU - Tolentino Eslava, R. AU - Snchez Silva, F. AU - Tolentino Eslava, G. AU - Toledo Velzquez, M. AD - Control and Automatization Engineering Department, ICA-ESIME-IPN, Mexico AD - Thermal Engineering and Applied Hidraulics Laboratory (LABINTHAP), SEPI-ES IME-IPN, Mexico AB - An experimental characterization of flow behavior in an experimental facil ity for type S Pitot tube calibration by means of velocity profiles and turbulen ce is present. The measurements were carried out with a Pitot static tube and a hot wire anemometer at 4, 8 and 12 diameters from fan outlet for maximum velocit ies from 5.8 m/s to 35 m/s. The velocity and turbulence profiles were measuremen t at the discharge of the duct, in order to evaluate the possibility to use this installation for anemometer calibration too. Results showed that plane located at 12 D from fan outlet is adequate for establish the test section for type S Pi tot tube calibration. Measurement in the exit of ducted outlet showed a good flo w quality for anemometers calibration. Copyright 2006 by ASME. KW - Aerodynamics KW - Anemometers KW - Calibration KW - Turbulent flow KW - Velocity measurement KW - Flow behavior KW - Flow quality KW - Flow visualization N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Tolentino Eslava, R.; Control and Automatization E ngineering Department, ICA-ESIME-IPNMexico; email: rtolentino@ipn.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33845744943&partnerID=4 0&md5=26d28f8d12886318f01eb13191aa24e9 ER TY - CONF T1 - Real-time displacements measurement using FPGA and interferometry JF - Multiconference on Electronics and Photonics, MEP 2006 SP - 266 EP - 269 PY - 2006/// AU - Velsquez-Aguilar, J.G. AU - Mayorga-Cruz, D. AU - Zamudio-Lara, A. AU - Arias-Estrada, M.O. AD - Centro de Investigacin en Ingeniera Y Ciencias Aplicadas, Universidad Autnoma del Estado de Morelos, Av. Universidad 1001, Col. Chamilpa, Cuernavaca, Morelos , 62209, Mexico

AD - Instituto Nacional de Astrofsica, ptica Y Electrnica, Departamento de Ciencia s Computacionales, Luis Enrique Erro No. 1, Apdo. Postal 51 y 216, Tonanzintla, Puebla, Pue. 72000, Mexico AB - In this work, implementation of a system-on-chip in a Field Programmable G ate Array (FPGA) is described. This system analyzes temporal phase-shift in a pa ttern of interference fringes, in order to measure displacements in real-time. T he interferograms images are introduced to the FPGA through a Charge Coupled Dev ice (CCD). A pipeline architecture is used to the stages of phase analysis and d isplay of the results. The system consumes just 2030 slices of an XC2V3000 and i t runs at 65 MHz clock frequency. 2006 IEEE. KW - FPGA KW - Interferometry KW - Optics metrology KW - Real-time processing KW - Application specific integrated circuits KW - Charge coupled devices KW - Digital cameras KW - Geodetic satellites KW - Integrated circuits KW - Interferometry KW - Internet KW - Internet service providers KW - Optics KW - Photonics KW - Pipelines KW - Signal processing KW - Clock frequencies KW - Field programmable gate array (FPGA) KW - Interference fringes KW - Interferograms KW - Phase analysis KW - Pipeline architectures KW - System on chip (SoCs) KW - Temporal phase KW - Time displacements KW - Field programmable gate arrays (FPGA) N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 4135762 N1 - :doi 10.1109/MEP.2006.335678 N1 - Correspondence Address: Velsquez-Aguilar, J. G.; Centro de Investigacin en I ngeniera Y Ciencias Aplicadas, Universidad Autnoma del Estado de Morelos, Av. Univ ersidad 1001, Col. Chamilpa, Cuernavaca, Morelos, 62209, Mexico; email: jgpeva@u aem.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-48649098293&partnerID=4 0&md5=68c52021c8ffcb6c00e6a9019a275d6a ER TY - CONF T1 - Ultraviolet radiation dose national standard of Mxico JF - AIP Conference Proceedings VL - 854 SP - 96 EP - 98 PY - 2006/// AU - Cardoso, R. AU - Rosas, E. AD - Centro Nacional de Metrologa, km 4, 5 Carretera a los Cus, El Marques, C. P. 76241, Queretaro, Mexico AB - We present the Ultraviolet (UV) Radiation Dose National Standard for Mxico.

The establishment of this measurement reference at Centro Nacional de Metrologa (CENAM) eliminates the need of contacting foreign suppliers in the search for tr aceability towards the SI units when calibrating instruments at 365 nm. Further more, the UV Radiation Dose National Standard constitutes a highly accurate and reliable source for the UV radiation dose measurements performed in medical and cosmetic treatments as in the the food and pharmaceutics disinfection processes, among other. 2006 American Institute of Physics. KW - National standard KW - UV medical applications KW - UV metrology KW - UV radiation dose N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1063/1.2356414 N1 - Correspondence Address: Cardoso, R.; Centro Nacional de Metrologa, km 4, 5 Carretera a los Cus, El Marques, C. P. 76241, Queretaro, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33846545500&partnerID=4 0&md5=f55b4a4be402df6310cb114f7e20836c ER TY - CONF T1 - GPC control design for a temperature and humidity prototype using ICD anal ysis JF - Proceedings of the IEEE International Conference on Control Applications SP - 978 EP - 983 PY - 2006/// AU - Castro, J.L. AU - Espaa, C.R. AU - Castro, E.L. AD - Departament of Mecatronics, Instituto Tecnolgico, Monterrey-Campus Estado, Mxico, Mexico AD - SEPI-ESIME, Ticoman Intituto Politecnico Nacional, Mexico AB - In this paper the design of a multivariable control system for an air cond itioning process is presented. The controller design is based on the classical G eneralized Predictive Control (GPC)scheme, while the resulting stability, robust ness and performance properties are analysed in the context of Individual Channe l Design (ICD). The design specifications in this work are those established by the Mexican Government Metrology Office (Centro Nacional e Metrologia, Mxico); it indicates that the temperature and humidity values must be kept within certain ranges. The designed control system has been tested using the Gunt Hamburg ET605 Recirculating Air Conditioning Trainer. Real time results are included in order to show the excellent performance of the control design. 2006 IEEE. KW - Conditioning process KW - Control design KW - Controller designs KW - Design specification KW - Excellent performance KW - Generalized predictive control KW - Individual channel designs KW - Performance properties KW - Real time KW - Air conditioning KW - Control KW - Design KW - Humidity control KW - Moisture KW - Multivariable control systems KW - Predictive control systems KW - Controllers

N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 4776777 N1 - :doi 10.1109/CACSD-CCA-ISIC.2006.4776777 N1 - Correspondence Address: Castro, J. L.; Departament of Mecatronics, Institu to Tecnolgico, Monterrey-Campus Estado, Mxico, Mexico; email: jliceaga@itesm.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77952891308&partnerID=4 0&md5=850db396c89606242c9437d973a4793e ER TY - JOUR T1 - High accuracy measurement of the absolute spectral responsivity of Ge and InGaAs trap detectors by direct calibration against an electrically calibrated c ryogenic radiometer in the near-infrared JF - Metrologia VL - 43 IS - 6 SP - 508 EP - 514 PY - 2006/// AU - Lpez, M. AU - Hofer, H. AU - Kck, S. AD - Physikalisch-Technische Bundesanstalt, 38116 Braunschweig, Germany AD - Centro Nacional de Metrologa, 76241 Quertaro, Mexico AB - This paper presents measurements of the absolute spectral responsivity of Ge and InGaAs trap detectors carried out by direct comparison with an electrical ly calibrated cryogenic radiometer (ECCR) in the near-infrared spectral range. T wo tunable laser diodes were used as radiation sources operating between 1260 nm and 1360 nm and between 1460 nm and 1620 nm. The measurements of the cavity abs orption and the Brewster-angled window transmission of the ECCR in these wavelen gth ranges are presented. A detailed analysis of the total measurement uncertain ty is performed. The relative standard uncertainty of the responsivity measureme nt achieved is less than 5 10-4 for all wavelengths investigated. The measuremen ts are also discussed in terms of external spectral quantum efficiency, which is up to 90% for the Ge trap and up to 93% for the InGaAs trap. The determined spe ctral responsivities are compared with the existing scale for spectral responsiv ity at the Physikalisch-Technische Bundesanstalt (the German National Metrology Institute) based on a thermopile detector. The deviation between the scales is a t most 0.15% for the InGaAs trap detector and at most 0.30% for the Ge trap dete ctor. The agreement is therefore within the combined standard uncertainties. 200 6 BIPM and IOP Publishing Ltd. KW - Calibration KW - Quantum efficiency KW - Radiometers KW - Semiconducting germanium KW - Semiconducting indium gallium arsenide KW - Semiconductor lasers KW - Spectrum analysis KW - Thermopiles KW - Brewster angled window transmission KW - Cavity absorption KW - Electrically calibrated cryogenic radiometer (ECCR) KW - Wavelength KW - Detectors N1 - Cited By (since 1996):6 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 005 N1 - :doi 10.1088/0026-1394/43/6/005

N1 - Correspondence Address: Lpez, M.; Physikalisch-Technische Bundesanstalt, 38 116 Braunschweig, Germany; email: marco.lopez@ptb.de UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33846876770&partnerID=4 0&md5=75eab66e77c5062c6530e2a37bb50252 ER TY - JOUR T1 - Development and validation of a simple tape-based measurement tool for rec ording cervical rotation in patients with ankylosing spondylitis: Comparison wit h a goniometer-based approach JF - Journal of Rheumatology VL - 33 IS - 11 SP - 2242 EP - 2248 PY - 2006/// AU - Maksymowych, W.P. AU - Mallon, C. AU - Richardson, R. AU - Conner-Spady, B. AU - Jauregui, E. AU - Chung, C. AU - Zappala, L. AU - Pile, K. AU - Russell, A.S. AD - Department of Medicine, University of Alberta, Edmonton, Alta., Canada AD - CAYRE Hospital for Arthritis and Rehabilitation, Bogota, Colombia AD - Department of Medicine, James Cook University, Townsville, QLD, Australia AD - 562 Heritage Medical Research Building, University of Alberta, Edmonton, A lta. T6G 2S2, Canada AB - Objective. To compare a tape-based tool for measuring cervical mobility in patients with ankylosing spondylitis (AS) with the widely practiced goniometerbased approach. Methods. We developed a novel tape-based approach to measurement of lateral cervical rotation of the neck that is minimally affected by flexion/ extension movements of the neck. This requires measurement of the difference bet ween a mark at the suprasteral notch and the tragus of the ear. Rotation score i s measured in centimeters and constitutes the difference in length between the 2 extremes of cervical rotation (http://www.arthritisdoctors. org/researcher.html ). We assessed the tape-based and goniometer-based methods in a total of 263 pat ients from 3 countries. Canada (n = 205). Australia (n = 29), and Colombia (n = 29), that included patients from community and tertiary-based practice. Intra- a nd interobserver reliability was assessed in a subset of 44 patients by ANOVA an d a 2-way mixed effects model. The Bath AS Disease Activity (BASDAI) and Functio n (BASFI) Indices, and the modified Stoke AS Spinal Score (mSASSS), were also re corded to assess construct validity by correlation coefficient and regression an alysis. Responsiveness was assessed in a subset of 33 patients that were either randomized to anti-tumor necrosis factor- therapy:placebo (n = 22) or received op en label infliximab (n = 4) or pamidronate (n = 7) over a period of 24 weeks. Re sults. Scores obtained with the tape-based method were normally distributed, whi le those obtained using the goniometer were skewed towards normal values. Reliab ility for the goniometer-based approach was excellent [intraclass correlation co efficient (ICC) > 0.90] and very good for the tape-based approach (ICC > 0.80). Significant correlations were noted between age. disease duration, function and structural damage scores, and scores obtained with both methods. Responsiveness was high using raw scores obtained with the goniometer (standardized response me an > 0.80) but was not evident when the grading scheme proposed for the Bath AS Metrology Index (BASMI) was employed. Conclusion. The tape-based approach we des cribe provides a simple, feasible, and reliable index of cervical rotation that is comparable to the information obtained from the use of a goniometer. If the g oniometer-based approach is used, raw scores should be used in the calculation o

f responsiveness rather than the grading scheme suggested in the BASMI. KW - Ankylosing spondylitis KW - Cervical rotation KW - Goniometer KW - Measurement KW - Tape measure KW - Validation KW - infliximab KW - pamidronic acid KW - placebo KW - tumor necrosis factor alpha antibody KW - adult KW - age KW - analysis of variance KW - ankylosing spondylitis KW - article KW - Australia KW - bath ankylosing spondylitis disease activity index KW - bath ankylosing spondylitis function index KW - Bath Ankylosing Spondylitis metrology index KW - Canada KW - cervical spine KW - clinical trial KW - Colombia KW - community hospital KW - construct validity KW - controlled clinical trial KW - controlled study KW - correlation coefficient KW - disease activity KW - disease duration KW - double blind procedure KW - feasibility study KW - female KW - functional assessment KW - goniometry KW - human KW - instrument KW - intermethod comparison KW - Internet KW - intervertebral articulation KW - joint mobility KW - major clinical study KW - male KW - measurement KW - multicenter study KW - neck KW - open study KW - priority journal KW - randomized controlled trial KW - regression analysis KW - reliability KW - reproducibility KW - scoring system KW - stoke ankylosing spondylitis spinal score KW - tape measure KW - tertiary health care KW - treatment duration KW - validation study KW - Anthropometry

KW - Arthrometry, Articular KW - Humans KW - Neck KW - Observer Variation KW - Range of Motion, Articular KW - Reproducibility of Results KW - Sensitivity and Specificity KW - Spondylitis, Ankylosing N1 - Cited By (since 1996):6 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Maksymowych, W.P.; 562 Heritage Medical Research B uilding, University of Alberta, Edmonton, Alta. T6G 2S2, Canada; email: walter.m aksymowych@ualberta.ca UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33750983937&partnerID=4 0&md5=35589a6401c83df998135873c07b0f95 ER TY - JOUR T1 - Role of national metrology institutes for comparable measurements JF - Communications in Soil Science and Plant Analysis VL - 37 IS - 15-20 SP - 2095 EP - 2106 PY - 2006/// AU - Mitani, Y. AD - National Center of Metrology, El Marques, Queretaro, Mexico AD - Direccin de Metrologa de Materiales, CENAM, 5 Carretera a Los Cues, El Marqu es, Queretaro, 7624, Mexico AB - The global economy and fair trade commitment has forced the need to demons trate equivalence between national measurement standards. That includes a need t o meet ever-increasing demands for accuracy, range, and diversity of measurement s. Recent activities of national metrology institutes (NMIs) are among the topic s discussed in this article. These include mutual recognition of calibration and measurement certificates of NMIs under mutual recognition arrangements (MRAs), operated among NMIs under an international framework of five regional metrology organizations (RMOs). Particular attention is given to the efforts of Mexico's N MI, Centro Nacional de Metrologia (CENAM), to establish a national traceable mea surement system for sectoral testing laboratories for agriculture. Other initiat ives include proficiency testing in collaboration with the Colegio de Posgraduad os, the intention being to promote development and certification of reference ma terials and to establish sectoral reference laboratories in the country. Copyrig ht Taylor & Francis Group, LLC. KW - Comparability KW - Measurement capability KW - Metrology KW - Proficiency test KW - Quadratic mean error (QME) KW - Traceability KW - accuracy assessment KW - calibration KW - comparative study KW - global economy KW - trade agreement KW - Mexico [Mexico (NTN)] KW - Mexico [North America] KW - North America N1 - Export Date: 26 April 2013 N1 - Source: Scopus

N1 - :doi 10.1080/00103620600812607 N1 - Correspondence Address: Mitani, Y.; Direccin de Metrologa de Materiales, CEN AM, 5 Carretera a Los Cues, El Marques, Queretaro, 7624, Mexico; email: ymitani@ cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33750343169&partnerID=4 0&md5=83cea098e7b2706064109c37616822e5 ER TY - JOUR T1 - Proficiency tests conducted by soil and plant analysis laboratories in Mex ico JF - Communications in Soil Science and Plant Analysis VL - 37 IS - 15-20 SP - 2495 EP - 2503 PY - 2006/// AU - Lpez, R.M.R. AU - Segoviano, F. AU - Arvizu, R. AU - Lara, V. AU - Mitani, Y. AU - Etchevers, J.D.B. AD - Laboratorio de Fertilidad de Suelos, Colegio de Postgraduados, Campus Mont ecillo, Texcoco, Mexico AD - Centro Nacional de Metrologa, Divisin Materiales Metlicos, Municipio del Mrque z, Quertaro, Mexico AD - Laboratorio de Fertilidad de Suelos, Colegio de Postgraduados, Campus Mont ecillo, Km 35.5, Texcoco, Mexico AB - Measurement is the comparison of a quantity against a certain standard. Me asurements conducted in chemistry are usually compared against certified referen ce material (CRM). When a laboratory makes proper measurements, the results obta ined have a low level of uncertainty; they are reliable, traceable in accordance with the International System of Units, and comparable to those made in any lab oratory in the world. The purpose of this article was to determine the performan ce of the analytical measurements carried out by Mexico's soil and plant analysi s laboratories through a proficiency testing program. The materials used for thi s program came from three sample batches of corn leaves, which were certified by Centro Nacional de Metrologa of Mexico (CENAM). The critical mean quadratic erro r (MQEc) was used as the evaluation criterion. Although the percentage of accept able results reported by laboratories has risen only slightly as a consequence o f the proficiency testing program, it is worth mentioning that laboratory manage rs in Mexico are becoming more aware of the importance of quality control and th e use of CRM. Copyright Taylor & Francis Group, LLC. KW - Certified reference materials KW - Metrology KW - Uncertainty KW - comparative study KW - laboratory method KW - maize KW - measurement method KW - plant KW - soil analysis KW - Mexico [North America] KW - North America KW - Zea mays N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1080/00103620600820220 N1 - Correspondence Address: Lpez, R.M.R.; Laboratorio de Fertilidad de Suelos,

Colegio de Postgraduados, Campus Montecillo, Km 35.5, Texcoco, Mexico; email: ro sal@colpos.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33750323470&partnerID=4 0&md5=70d0288fc5a876ed9f5765ecf858a11b ER TY - CONF T1 - Very high speed digital holography JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6341 PY - 2006/// AU - Lpez, C.P. AU - Santoyo, F.M. AU - Vera, R.R. AU - Moreno, D. AU - Barrientos, B. AD - Centro de Investigaciones en ptica, A.C., Loma del Bosque 115, Len, Guanajua to, 37150, Mexico AB - It is reported for the first time the use of a high speed camera in digita l holography with an out of plane sensitivity. The camera takes the image plane holograms of a cw laser illuminated rectangular framed polyester material at a r ate of 5000 per second, that is a spacing of 200 microseconds between holograms, and 512 by 500 pixels at 10 bit resolution. The freely standing object has a ra ndom movement due to non controlled environmental air currents. As is usual with this technique each digital hologram is Fourier processed in order to obtain up on comparison with a consecutive digital hologram the phase map of the displacem ent. High quality results showing the amplitude and direction of the random move ment are presented. KW - Digital holography KW - High-speed KW - Optical metrology KW - Digital holography KW - High-speed KW - Optical metrology KW - Cameras KW - Optical resolving power KW - Polyesters KW - Holography N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 63412Y N1 - :doi 10.1117/12.695997 N1 - Correspondence Address: Lpez, C.P.; Centro de Investigaciones en ptica, A.C. , Loma del Bosque 115, Len, Guanajuato, 37150, Mexico; email: cperezl@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33749824887&partnerID=4 0&md5=9db62e1a30dcd8b913263c67369b6896 ER TY - CONF T1 - Evaluation of the error in 3D deformation measurement from the combination of in plane and out-of-plane ESPI interferometers JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6341 PY - 2006/// AU - Martnez, A. AU - Rayas, J.A. AD - Centro de Investigaciones en ptica, A. C., Apartado Postal 1-948, C. P. 370 00, Len, Gto, Mexico AB - We report on the errors obtained by comparing the in- and out-of-plane dis placements calculated from the sensitivity matrix with all its components and wh

en it is considered only the component of the largest contributing of each one o f the three interferometers. Divergent illumination is considered in the sensiti vity vectors evaluation to measure displacement vector components. This analysis is made for a flat elastic target by using of Electronic Speckle Pattern Interf erometry (ESPI). KW - 3-D deformation in-plane and out-of-plane KW - ESPI KW - Optical metrology KW - Sensitivity matrix KW - 3-D deformation in-plane and out-of-plane KW - ESPI KW - Optical metrology KW - Sensitivity matrix KW - Elastic moduli KW - Error analysis KW - Interferometers KW - Sensitivity analysis KW - Vectors KW - Speckle N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 63412C N1 - :doi 10.1117/12.695498 N1 - Correspondence Address: Martnez, A.; Centro de Investigaciones en ptica, A. C., Apartado Postal 1-948, C. P. 37000, Len, Gto, Mexico; email: amalia@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33749861751&partnerID=4 0&md5=cad8173579d0dd3b365c984995926ae0 ER TY - CONF T1 - Phase recovery from a single interferogram using multiple Fourier transfor ms JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6292 PY - 2006/// AU - Muoz-Maciel, J. AU - Gerardo Lecona-Pea, F. AU - Castillo-Quevedo, C. AU - Casillas-Rodrguez, F.J. AU - Duran-Martnez, V. AU - Mora-Gonzlez, M. AD - Universidad de Guadalajara, Centro Universitario de Los Lagos, Lagos de Mo reno, Jalisco, Mexico AB - An algorithm for phase determination from a single interferogram with clos ed fringes using Fourier transforms is proposed. Traditionally, the Fourier tran sform method has been used for interferograms containing only open fringes. This is done performing a pass-band filtering of one half of the frequency spectrum and taking the arctangent function of the real and imaginary parts of the filter ed spectrum. The proposed method performs multiple pass-band filtering resulting in several wrapped phases with wrong sign changes corresponding to the orientat ion of the filters. Among the different wrapped phases, regions are expected to have the same sign enabling the correct reconstruction of the phase. The correct ions of the sing changes are made by comparing the derivatives of the wrapped ph ases by means of a modified process of phase unwrapping taking into account smal l areas of the interferogram field. This is done under the assumption of that ad jacent areas won't have abrupt changes in their phase derivatives as correspondi ng to smooth continuous surfaces. The procedure is robust against noise since lo w-pass filtering can be easily performed in the calculation of the wrapped maps and during the modified process of phase unwrapping. KW - Fringe analysis

KW - Interferometry KW - Metrology KW - Phase retrieval KW - Fringe analysis KW - Low-pass filtering KW - Phase retrieval KW - Algorithms KW - Fourier transforms KW - Interferometry KW - Measurement theory KW - Spurious signal noise KW - Fourier optics N1 - Cited By (since 1996):3 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 62920D N1 - :doi 10.1117/12.681445 N1 - Correspondence Address: Muoz-Maciel, J.; Universidad de Guadalajara, Centro Universitario de Los Lagos, Lagos de Moreno, Jalisco, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33749679407&partnerID=4 0&md5=f32f13b96adf72426d29c536355a54f7 ER TY - CONF T1 - Describing and measuring the time-frequency parameters of low-power bright picosecond optical pulses using the interferometric technique JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6292 PY - 2006/// AU - Shcherbakov, A.S. AU - Zurita, A.L.M. AU - Kosarsky, A.Yu. AD - National Institute for Astrophysics, Optics, and Electronics (INAOE), A.P. 51 y 216, Puebla, Pue., 72000, Mexico AD - LLC Petro, Peterhoff Chausse 71, Saint-Petersburg 198206, Russian Federati on AB - We present a theoretic approach to the characterization of low-power brigh t picosecond optical pulses with an internal frequency modulation simultaneously in both time and frequency domains. This approach exploits the joint Wigner tim e-frequency distribution, which can be determined and developed for these bright optical pulses by using a novel interferometric technique under our proposal. E ither power or spectral densities inherent in such pulses can be obtained throug h integrating the Wigner distribution with respect to the corresponding conjugat e variable. At first, the analysis and computer simulations are applied to study ing the capability of Wigner distribution to characterize solitary pulses or tra in-average values for pulse string in practically much used case of the Gaussian shape, when the Wigner distribution is positive. In the context of this analysi s, the relation between the spectrum density and the auto-correlation function i s followed. Then, the simplest two-beam scanning Michelson interferometer is sel ected for shaping the field-strength auto-correlation function of low-power pico second pulse trains. We are proposing and considering in principle the key featu res of a new interferometric experimental technique for accurate and reliable me asurements of the train-average width as well as the value and sign of the frequ ency chirp of pulses in high-repetition-rate trains. This technique is founded o n an ingenious algorithm for the advanced metrology, assumes using a specially d esigned supplementary semiconductor cell, and suggests carrying out a pair of ad ditional measures with exploiting this semiconductor cell. Such a procedure make s it possible to construct the Wigner distribution and to describe the above-lis ted time-frequency parameters of low-power bright picosecond optical pulses. In the appendix, we follow the avenue of deriving the joint Wigner time-frequency d

istribution via choosing the Weil's correspondence between classical functions a nd operators. KW - Bright picosecond optical pulse KW - Interferometric technique KW - Wigner time-frequency distribution KW - Bright picosecond optical pulse KW - Interferometric technique KW - Wigner time frequency distribution KW - Computer simulation KW - Frequency domain analysis KW - Interferometry KW - Statistical methods KW - Time domain analysis KW - Optical variables measurement N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 62921H N1 - :doi 10.1117/12.681030 N1 - Correspondence Address: Shcherbakov, A.S.; National Institute for Astrophy sics, Optics, and Electronics (INAOE), A.P. 51 y 216, Puebla, Pue., 72000, Mexic o; email: alex@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33749674141&partnerID=4 0&md5=e44c0610c98ba4280aa8470e43e78329 ER TY - JOUR T1 - Magnetic properties comparison of mass standards among seventeen national metrology institutes JF - Metrologia VL - 43 IS - 5 SP - 426 EP - 434 PY - 2006/// AU - Becerra, L.O. AU - Berry, J. AU - Chang, C.S. AU - Chapman, G.D. AU - Chung, J.W. AU - Davis, R.S. AU - Field, I. AU - Fuchs, P. AU - Jacobsson, U. AU - Lee, S.M. AU - Loayza, V.M. AU - Madec, T. AU - Matilla, C. AU - Ooiwa, A. AU - Scholz, F. AU - Sutton, C. AU - Van Andel, I. AD - Centro Nacional de Metrologia (CENAM), CP 76900, Quertaro, Qro, Mexico AD - National Physical Laboratory (NPL), Teddington, Middlesex, TW11 0LW, Unite d Kingdom AD - Center for Measurement Standards, Industrial Technology Research Institute (CMS/ITRI), Hsinchu, 300, Taiwan AD - Institute for National Measurement Standards, National Research Council (I NMS/NRC), Ottawa, Ont. K1A 0R6, Canada AD - Korea Research Institute of Standards and Science (KRISS), Box 102, Yousun g, Taejon, 305-600, South Korea

AD - Bureau International des Poids et Mesures (BIPM), Pavillon de Breteuil, F92310, Svres Cedex, France AD - National Metrology Laboratory (CSIR-NML), PO Box 395, Pretoria 0001, South Africa AD - Metrologie und Akkreditierung Schweiz (METAS), Lindenweg 50, CH-3003 BernWabern, Switzerland AD - Swedish National Testing and Research Institute (SP), PO Box 857, SE-501 1 5 Bors, Sweden AD - Standards, Productivity and Innovation Board (SPRING Singapore), 1 Science Park Drive, Singapore 118221, Singapore AD - Instituto Nacional de Metrologia (INMETRO), Av. N.S. das Gracas, 50-Xerem, Duque de Caxias-RJ, 25250-020, Brazil AD - Laboratoire National de Mtrologie et d'Essais (LNE), 1, Rue Gaston Boissier , 75015 Paris, France AD - Centro Espol de Metrologia (CEM), C/ Del Alfar, 2 - Apartado 37, 28760 Tres Cantos (Madrid), Spain AD - National Metrology Institute of Japan, National Institute of Advanced Indu strial Science and Technology (NMIJ/AIST), Central 3, 1-1, Umezono 1-chome, Tsuk uba, 305-8563, Japan AD - Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Brauns chweig, Germany AD - Measurement Standards Laboratory of New Zealand, Industrial Research Limit ed (MSL), PO Box 31310, Lower Hutt, New Zealand AD - Nederlands Meetinstituut, Van Swinden Laboratorium (NMi-VSL), Box 654, Thi jsseweg 11, 2600 AR Delft, Netherlands AD - European Commission, Joint Research Centre, Institute for Reference Materi als and Measurements (IRMM), Retieseweg 111, B-2440 Geel, Belgium AB - The ubiquitous technology of magnetic force compensation of gravitational forces acting on artifacts on the pans of modern balances and comparators has br ought with it the problem of magnetic leakage from the compensation coils. Leaki ng magnetic fields, as well as those due to the surroundings of the balance, can interact with the artifact whose mass is to be determined, causing erroneous va lues to be observed. For this reason, and to comply with normative standards, it has become important for mass metrologists to evaluate the magnetic susceptibil ity and any remanent magnetization that mass standards may possess. This paper d escribes a comparison of measurements of these parameters among seventeen nation al metrology institutes. The measurements are made on three transfer standards w hose magnetic parameters span the range that might be encountered in stainless s teel mass standards. 2006 BIPM and IOP Publishing Ltd. KW - Gravitational effects KW - Magnetic properties KW - Magnetic susceptibility KW - Magnetism KW - Stainless steel KW - Units of measurement KW - Artifacts KW - Compensation coils KW - Magnetic force KW - Mass standards KW - Magnetic leakage N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 014 N1 - :doi 10.1088/0026-1394/43/5/014 N1 - Correspondence Address: Becerra, L.O.; Centro Nacional de Metrologia (CENA M), CP 76900, Quertaro, Qro, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33749445619&partnerID=4 0&md5=5275676f590d9a24f9b440e4b767e7af ER -

TY - JOUR T1 - Optical laser level JF - Optical Engineering VL - 45 IS - 9 PY - 2006/// AU - Jaramillo-Nez, A. AU - Lucero-Alvarez, M. AD - Instituto Nacional de Astrofsica, Optica y Electronica, Apdo. Postal 51 Y 2 16, Puebla 72000, Mexico AB - An instrument for measuring the level of a liquid surface is described. Th e device is compact, requires no special handling, is non-contact, and can measu re variations in level of the order of a micrometer, although this value can be suitably modified by changing the setup parameters. The instrument was developed as a machine flatness profilometer using the liquid level as a reference surfac e. Two applications of the instrument as a machine profilometer are presented, t he first in order to measure the straightness of the displacement of the spindle of a polishing machine and the second in order to find the flatness error of a coordinate-measuring machine of large dimensions. 2006 Society of Photo-Optical Instrumentation Engineers. KW - Beam displacement KW - Geometric optics KW - Metrology KW - Geometrical optics KW - Micrometers KW - Optical instruments KW - Optical variables measurement KW - Profilometry KW - Beam displacement KW - Liquid surface level KW - Machine profilometer KW - Laser optics N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 093601 N1 - :doi 10.1117/1.2349538 N1 - Correspondence Address: Jaramillo-Nez, A.; Instituto Nacional de Astrofsica, Optica y Electronica, Apdo. Postal 51 Y 216, Puebla 72000, Mexico; email: ajaram il@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33751015425&partnerID=4 0&md5=a50aa85fa124f1c48b676e078fd02fd1 ER TY - JOUR T1 - Development and validation of the Edmonton Ankylosing Spondylitis Metrolog y Index JF - Arthritis Care and Research VL - 55 IS - 4 SP - 575 EP - 582 PY - 2006/// AU - Maksymowych, W.P. AU - Mallon, C. AU - Richardson, R. AU - Conner-Spady, B. AU - Jauregui, E. AU - Chung, C.

AU - Zappala, L. AU - Pile, K. AU - Russell, A.S. AD - University of Alberta, Edmonton, Alta., Canada AD - CAYRE Arthritis and Rehabilitation Clinic, Bogota, Colombia AD - James Cook University, QLD, Australia AD - 562 Heritage Medical Research Building, University of Alberta, Edmonton, A lta. T6G 2S2, Canada AB - Objective. Assessment of spinal and hip mobility has been recommended by t he Assessments in Ankylosing Spondylitis (AS) Working Group for clinical trials and record keeping, although suggested measures primarily reflect structural dam age. Our objective was to validate a simple, 4-item composite measure of spinal and hip mobility, the Edmonton AS Metrology Index (EDASMI). Methods. We assessed the EDASMI and the Bath AS Metrology Index (BASMI) using a total of 263 patient s from 3 countries: Canada (n = 205), Australia (n = 29), and Colombia (n = 29). Intra- and interobserver reliability were assessed in a subset of 44 patients. Construct validity with respect to disease activity (Bath AS Disease Activity In dex [BASDAI]), function (Bath AS Functional Index [BASFI]), and structural damag e (modified Stoke AS Spinal Score [mSASSS]) was analyzed using correlation and h ierarchical regression. Responsiveness was assessed in a subset of 33 patients w ho received either anti-tumor necrosis factor therapy (n = 26) or pamidronate (n = 7) over 24 weeks. Results. In contrast to the EDASMI, BASMI scores covered a limited range, with 70% of patients demonstrating a score 3 (range 0-10) and 4 of 5 individual measures demonstrating substantial floor effects. Both measures we re highly reliable (intraclass correlation coefficient >0.90) and demonstrated s imilar construct validity (EDASMI correlated with disease duration [0.52], BASDA I [0.24], BASFI [0.61], Bath Ankylosing Spondylitis Radiology Index [0.79], mSAS SS [0.75]; P < 0.001 for all). The change in EDASMI score was significant after 24 weeks of therapy (standardized response mean 0.40; P = 0.03), but change in t he BASMI was not significant. Conclusion. The EDASMI is a simple, rapid, and rel iable tool for the assessment of spinal mobility in AS that is responsive to the rapeutic intervention. 2006, American College of Rheumatology. KW - Ankylosing spondylitis KW - Index KW - Spinal and hip mobility KW - Validation KW - pamidronic acid KW - tumor necrosis factor alpha antibody KW - adult KW - aged KW - ankylosing spondylitis KW - article KW - Australia KW - bath ankylosing spondylitis disease activity index KW - Bath Ankylosing Spondylitis functional index KW - Canada KW - Colombia KW - construct validity KW - correlation analysis KW - disease activity KW - edmonton ankylosing spondylitis metrology index KW - female KW - hip KW - human KW - joint mobility KW - major clinical study KW - male KW - observer variation KW - reliability KW - scoring system

KW - spine KW - validation process KW - Adult KW - Diphosphonates KW - Female KW - Hip Joint KW - Humans KW - Male KW - Observer Variation KW - Range of Motion, Articular KW - Receptors, Tumor Necrosis Factor KW - Reproducibility of Results KW - Spondylitis, Ankylosing KW - Treatment Outcome N1 - Cited By (since 1996):23 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1002/art.22103 N1 - Correspondence Address: Maksymowych, W.P.; 562 Heritage Medical Research B uilding, University of Alberta, Edmonton, Alta. T6G 2S2, Canada; email: walter.m aksymowych@ualberta.ca UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33747888630&partnerID=4 0&md5=8b2d4ee911323f78e0bdd394a6e5da48 ER TY - JOUR T1 - Parisian camera placement for vision metrology JF - Pattern Recognition Letters VL - 27 IS - 11 SP - 1209 EP - 1219 PY - 2006/// AU - Dunn, E. AU - Olague, G. AU - Lutton, E. AD - Centro de Investigacin Cientfica y de Educacin Superior de Ensenada, Depto. d e Ciencias de la Computacin, Divisin de Fsica Aplicada, Km. 107 carretera Tijuana-E nsenada, 22860 Ensenada, BC, Mexico AD - INRIA-COMPLEX Team, Domaine de Voluceau, BP 105, 78153 Le Chesnay Cedex, F rance AB - This paper presents a novel camera network design methodology based on the Parisian evolutionary computation approach. This methodology proposes to partit ion the original problem into a set of homogeneous elements, whose individual co ntribution to the problem solution can be evaluated separately. A population com prised of these homogeneous elements is evolved with the goal of creating a sing le solution by a process of aggregation. The goal of the Parisian evolutionary p rocess is to locally build better individuals that jointly form better global so lutions. The implementation of the proposed approach requires addressing aspects such as problem decomposition and representation, local and global fitness inte gration, as well as diversity preservation mechanisms. The benefit of applying t he Parisian approach to our camera placement problem is a substantial reduction in computational effort expended in the evolutionary optimization process. Moreo ver, experimental results coincide with previous state of the art photogrammetri c network design methodologies, while incurring in only a fraction of the comput ational cost. 2005 Elsevier B.V. All rights reserved. KW - Accurate 3D reconstruction KW - Camera placement KW - Evolutionary computation KW - Parisian approach

KW - Photogrammetric network design KW - Cameras KW - Computational complexity KW - Evolutionary algorithms KW - Problem solving KW - Accurate 3D reconstruction KW - Camera placement KW - Parisian approach KW - Photogrammetric network design KW - Computer vision N1 - Cited By (since 1996):18 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.patrec.2005.07.019 N1 - Correspondence Address: Olague, G.; Centro de Investigacin Cientfica y de Ed ucacin Superior de Ensenada, Depto. de Ciencias de la Computacin, Divisin de Fsica A plicada, Km. 107 carretera Tijuana-Ensenada, 22860 Ensenada, BC, Mexico; email: olague@cicese.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33646675103&partnerID=4 0&md5=4c973969e2707f9f09dbcdb8b4b994e4 ER TY - JOUR T1 - Absolute frequency measurement of the R(12) 26-0 and R (106) 28-0 transiti ons in 127I2 at = 543 nm JF - IEEE Transactions on Instrumentation and Measurement VL - 55 IS - 3 SP - 876 EP - 880 PY - 2006/// AU - Ma, L.S. AU - Picard, S. AU - Zucco, M. AU - Chartier, J.-M. AU - Robertsson, L. AU - Balling, P. AU - Krn, P. AU - Qian, J. AU - Liu, Z. AU - Shi, C. AU - Alonso, M.V. AU - Xu, G. AU - Tan, S.L. AU - Nyholm, K. AU - Henningsen, J. AU - Hald, J. AU - Rowley, W.R.C. AU - Barwood, G.P. AU - Windeler, R. AD - Bureau International des Poids et Mesures, Svres Cedex F-92312, France AD - Department of Physics, School of Science and Engineering, East China Norma l University, Shanghai 200062, China AD - Istituto Nazionale di Ricerca Metrologica (INRIM), Torino 10135, Italy AD - Czech Metrology Institute, Prague 15072, Czech Republic AD - National Institute of Metrology, Beijing 100013, China AD - Centro Nacional de Metrologa, El Marques 76241, Queretaro, Mexico AD - Standards, Productivity, and Innovation Board, Singapore 118221, Singapore AD - Centre for Metrology and Accreditation, Helsinki FI-00181, Finland AD - Danish Institute of Fundamental Metrology, Kongens Lyngby DK-2800, Denmark

AD - National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingd om AD - OFS Laboratories, Murray Hill, NJ 07974, United States AB - A direct phase coherent determination of the absolute frequency of the a15 component in the R(12) 26-0 and b10 component in the R(106) 28-0 transitions in 127I2 at 543 nm has been made at the International Bureau of Weights and Measur es. Lasers from the Czech Metrology Institute (Czech Republic), the National Ins titute of Metrology (China), the Centro Nacional de Metrologia (Mexico), the Sta ndards, Productivity and Innovation Board (Singapore), the Centre for Metrology and Accreditation (Finland), the Danish Institute of Fundamental Metrology (Denm ark), the National Physical Laboratory (U.K.), and the International Bureau of W eights and Measures took part. The mean frequency values found are f(a15) = 551 579 856 480.4 kHz, uc = 4.8 kHz and f(b10) = 551 580 162 397.1 kHz, uc = 4.6 kHz for the current group of lasers, where uc is the combined standard uncertainty. This constitutes a 30-fold improvement in accuracy for this radiation, which is recommended for the realization of the definition of the meter. If only lasers equipped with an iodine cell temperature control are considered, the group of la sers shows a dispersion of 7 kHz. This value is indicative of the level of repro ducibility that can be expected at present for this type of standard. 2006 IEEE. KW - 543 nm KW - Absolute frequency measurement KW - He Ne laser KW - Optical comb KW - Recommended radiation KW - Wavelength standard KW - Dispersion (waves) KW - Helium neon lasers KW - Laser optics KW - Optical frequency conversion KW - Optical phase conjugation KW - Absolute frequency measurement KW - Optical comb KW - Recommended radiation KW - Wavelength standard KW - Optical variables measurement N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1109/TIM.2005.858122 N1 - Correspondence Address: Ma, L.S.; Bureau International des Poids et Mesure s, Svres Cedex F-92312, France UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33744525699&partnerID=4 0&md5=6bf7269694b540898d28a52b7fb52a02 ER TY - JOUR T1 - Window fringe pattern demodulation by multi-functional fitting using a gen etic algorithm JF - Optics Communications VL - 261 IS - 2 SP - 231 EP - 239 PY - 2006/// AU - Cuevas, F.J. AU - Mendoza, F. AU - Servin, M. AU - Sossa-Azuela, J.H. AD - Centro de Investigaciones en ptica, A.C., Department of Optical Metrology, Loma Bosque 115 Col. Lomas Campestre, Len 37150 Guanajuato, Mexico

AD - Centro de Investifgacin en Computacin-IPN, Unidad Profesional Adolfo Lpez Mat eos, Av. J Dios Batiz, M Othon Mendizabal, Zacatenco, DF 07738, Mexico AB - We present a new way to demodulate complicated fringe patterns containing closed fringes using a genetic algorithm (GA). The entire fringe pattern is divi ded into a set of partially overlapping smaller sub-image windows. Each of these has a lower dimensionality and as a consequence is faster and can be demodulate d more reliably. The demodulation process proceeds row-by-row way passing from o ne sub-image in a neighborhood until the whole interferogram is processed. The m odulating phase of each sub-image is modeled as a parametric analytic function w hose parameters are optimized using a GA. The technique is demonstrated demodula ting some normalized fringe patterns that have two main difficulties: closed fri nges within the interferogram and regions of under-sampled fringes. These fringe images cannot be demodulated by techniques such as the regularized phase tracke r (RPT). 2005 Elsevier B.V. All rights reserved. KW - Fringe analysis KW - Genetic algorithms KW - Optical metrology KW - Phase retrieval KW - Functions KW - Genetic algorithms KW - Image processing KW - Mathematical models KW - Optimization KW - Phase modulation KW - Fringe analysis KW - Optical metrology KW - Phase retrieval KW - Demodulation N1 - Cited By (since 1996):6 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.optcom.2005.12.028 N1 - Correspondence Address: Cuevas, F.J.; Centro de Investigaciones en ptica, A .C., Department of Optical Metrology, Loma Bosque 115 Col. Lomas Campestre, Len 3 7150 Guanajuato, Mexico; email: fjcuevas@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33748262269&partnerID=4 0&md5=22cf2572dc14ee9a5da48a6f03fc5aaa ER TY - JOUR T1 - Simpler approach to virtual multiaxis machines: Fundamentals JF - Measurement: Journal of the International Measurement Confederation VL - 39 IS - 4 SP - 352 EP - 370 PY - 2006/// AU - Snchez, J. AU - Santilln, S. AD - Laboratory of Metrology, Applied Sciences and Technical Research Centre (C CADET), National University of Mxico, AP 70-186, 04510 Mexico D.F., Mexico AD - Mechanical Design Centre, Faculty of Engineering, National University of Mx ico, AP 70-186, 04510 Mexico D.F., Mexico AB - This paper presents models, computational primitives and procedures, descr ibing the behaviour of machines, distortions of parts, assembles and movements; where the state of such machines may be launched to CAD browsers through interfa ces, constituting a whole system named by us virtual multiaxis machine (VMM). Al though similar concepts appeared more than 13 years ago for aiding calibrations, their modelling was so difficult to understand for most people in the field of metrology, design and manufacturing. The focus of this research is to look for e

asier alternatives than conventional ones, for calibrating coordinate measuring machines (CMMs) or similar instruments, and for mapping their errors. The VMM sy stem allows verifying measures on scales, intermediate states of assembles among bodies, or final states in probes, without ambiguity. Linked to CAD, the system help us to use the VMM as an equivalent laboratory, where scales, guide-ways, a nd assembles, may be changed and verified. The VMM may also be used for teaching , for doing geometrical meaning to parameters of calibration, and for judging ca ses of controversy in calibrations. 2005 Elsevier Ltd. All rights reserved. KW - CMMs calibration KW - CMMs modelling KW - Errors modelling KW - Virtual machines KW - Calibration KW - Computer aided design KW - Mechanical properties KW - Parameter estimation KW - CMMs calibration KW - CMMs modeling KW - Errors modeling KW - Virtual machines KW - Measurement theory N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/j.measurement.2005.07.016 N1 - Correspondence Address: Snchez, J.; Laboratory of Metrology, Applied Scienc es and Technical Research Centre (CCADET), National University of Mxico, AP 70-18 6, 04510 Mexico D.F., Mexico; email: sanchezj@aleph.cinstrum.unam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33644681764&partnerID=4 0&md5=95cc8185eb55c1bb318e6881331bc611 ER TY - CONF T1 - Phase unwrapping by means of finite differences JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6064 PY - 2006/// AU - Olivos-Prez, L.I. AU - De La Rosa Miranda, E. AU - Valdos, L.R.B. AU - Lpez, R.R. AD - Instituto Nacional de Astrofsica, ptica y Electrnica (INAOE), Luis Enrique Er ro no. 1, CP 72840 Tonantzintla, Puebla, Mexico AB - Many problems in metrology and optical tomography have to recover informat ion from the wrapping phase. In most of the cases, phase, that is associate to a physical magnitude, is continuous and generally, varies smoothly. Therefore, we can say that the problem in these cases is reduced to find a continuous phase. Considering this, many solutions to this kind of problems have been proposed, fr om the use of local planes to the implementation of most robust algorithms. Howe ver, these methods are also very slow. That is why the unwrapping problem is an open subject research in optics. We propose a phase unwrapping method based on f inite differences that is fast and robust. In addition, it is easy to program. 2 006 SPIE-IS&T. KW - Interferograms KW - Phase unwrapping KW - Algorithms KW - Computerized tomography KW - Finite difference method KW - Optics KW - Interferograms

KW - Phase unwrapping KW - Problem solving N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 60640E N1 - :doi 10.1117/12.650913 N1 - Correspondence Address: Olivos-Prez, L.I.; Instituto Nacional de Astrofsica, ptica y Electrnica (INAOE), Luis Enrique Erro no. 1, CP 72840 Tonantzintla, Puebl a, Mexico; email: lolivos@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645657634&partnerID=4 0&md5=ce27e3dbeb780e6e591e5b89548c432f ER TY - JOUR T1 - Uncertainty and traceability in an assay method (ascorbic acid in juices) JF - Accreditation and Quality Assurance VL - 11 IS - 1-2 SP - 63 EP - 68 PY - 2006/// AU - Ocaa, A.B. AU - De Los ngeles Patricia Olvera Trevio, M. AD - Laboratorio de Metrologa, Facultad de Qumica, Universidad Nacional Autnoma de Mxico (UNAM), Mxico D.F. 04510, Mexico AB - We discus two of the most important aspects for ensuring the quality of th e measurements in an assay method. These parameters are: measurement uncertainty and traceability of the measuring method. To be able to exemplify these paramet ers, we took as an example the measuring of ascorbic acid in commercial juices t o clearly understand all the implicit metrological requirements in an assay meth od. To do this, it was necessary to meticulously analyze every step of the ascor bic acid measuring process via implementation of the practical application of th e AOAC 967.21 Official Method for determining ascorbic acid, which is a titrimet ric method based on the ISO 10012 norm. The uncertainty and traceability were st udied and applied to control the process variability on the assay method. All th is allows us to show the importance of implementing a measurement control system on an assay method, thus guaranteeing repeatable and traceable measurements, an d ensuring that the measurements have been done accurately. Springer-Verlag 2005 . KW - Measurement uncertainty KW - Method KW - Metrology KW - Quality assurance KW - Traceability N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s00769-005-0048-x N1 - Correspondence Address: Ocaa, A.B.; Laboratorio de Metrologa, Facultad de Qum ica, Universidad Nacional Autnoma de Mxico (UNAM), Mxico D.F. 04510, Mexico; email: alejbarragan@litio.fquim.unam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645773480&partnerID=4 0&md5=2bd52b00bb4788769375c91169dc8e4b ER TY - CONF T1 - Some interpretations and analysis concerning the accuracy of the thin wire diameter measurement JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6046 PY - 2006///

AU - Serroukh, I. AU - Bernabeu, E. AD - Centro Nacional de Metrologa, km 4,5 Carretera a los Cus, Quertaro, Mexico AD - Physics Department of Optics, Universidad Complutense de Madrid, Spain AB - The principle purpose of this work is to providing some general analysis a nd interpretation in both theory and techniques concerning high accuracy of the thin metallic wire diameter measurement. The closest estimation of the magnitude requires understanding and analyzing the interaction between light and matter ( wire). The wires diameter we re concern is between 30 to 500m. The work is focus on both science and metrology. To reach this goal the simplicity and accuracy is required especially for an industrial automatic implementation control. The art icle is organized as follow: the section one consist of analyzing and understand ing of theoretical interpretation for laser diffraction by thin metallic wire. T he second section contains analysis of the experimental set-ups used for calibra tion and measurement. The followed section is data analysis to estimate the angu lar location of the minima. With some conclusions we close to achieve the work. KW - Calibration KW - Diameter KW - Diffraction KW - Measurement KW - Metrology KW - Wires KW - Automation KW - Calibration KW - Diffraction KW - Light KW - Measurement theory KW - Metals KW - Automatic implementation control KW - Diameter measurements KW - Thin metallic wire KW - Wire A2 - Rosas E. A2 - Cardoso R. A2 - Bermudez J.C. A2 - Barbosa-Garcia O. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 60461P N1 - :doi 10.1117/12.674594 N1 - Correspondence Address: Serroukh, I.; Centro Nacional de Metrologa, km 4,5 Carretera a los Cus, Quertaro, Mexico; email: iserrouk@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645214913&partnerID=4 0&md5=c90360f36d6fde7d5d30449ddc426569 ER TY - CONF T1 - High speed speckle interferometry JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6046 PY - 2006/// AU - Davila, A. AU - Pinto, V. AU - Garnica, G. AD - Centro de Investigaciones en Optica, Loma del Bosque 115, Leon Guanajuato, Mexico AB - The basic optical set-ups used for speckle interferometry have a limited c apability to study transient events due to the synchronization with the acquisit ion devices. This capability is explored in this work and compared with recent d eveloped techniques such as the temporal phase unwrapping.

KW - Optical Metrology KW - Speckle Interferometry KW - Interferometry KW - Optical properties KW - Synchronization KW - Optical Metrology KW - Speckle Interferometry KW - Speckle A2 - Rosas E. A2 - Cardoso R. A2 - Bermudez J.C. A2 - Barbosa-Garcia O. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 60462G N1 - :doi 10.1117/12.674663 N1 - Correspondence Address: Davila, A.; Centro de Investigaciones en Optica, L oma del Bosque 115, Leon Guanajuato, Mexico; email: adavila@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645238934&partnerID=4 0&md5=e3f8b9fe64221287af9de6fe5efe99d8 ER TY - CONF T1 - Half-quadratic regularization for interferograms analysis JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6046 PY - 2006/// AU - Rivera, M. AD - Centro de Investigacin en Matemticas A.C., Departamento de Ciencias de la Co mputacin, Apdo. Postal 402, 36000, Guanajuato, Gto, Mexico AB - We present recent applications of robust half-quadratic regularization for solving common problems in interferogram analysis. Specifically, we review half -quadratic cost functions for: phase unwrapping noisy and discontinuous wrapped phase maps, phase refinement process for computed coarse phases, as those obtain ed from partial-field patterns with a full-field method for open fringes analysi s, for phase retrieval from closed-fringe interferograms and phase denoising. Th e cases of convex and the non-convex cost functions are analyzed: The convex for mulation produces unique and noise-free solutions, but such solution are deterio rated by real discontinuities in phase maps; therefore, we also present a non-co nvex formulation which, with an extra computational cost, shows a superior perfo rmance. KW - Edge-preserving regularization KW - Fringe pattern analysis KW - Interferometry KW - Inverse problems KW - Optical metrology KW - Phase retrieval KW - Phase unwrapping KW - Robust regularization KW - Computational methods KW - Interferometry KW - Inverse problems KW - Optical systems KW - Problem solving KW - Edge-preserving regularization KW - Fringe pattern analysis KW - Optical metrology KW - Phase retrieval KW - Phase unwrapping KW - Robust regularization

KW - Quadratic programming A2 - Rosas E. A2 - Cardoso R. A2 - Bermudez J.C. A2 - Barbosa-Garcia O. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 60461O N1 - :doi 10.1117/12.674592 N1 - Correspondence Address: Rivera, M.; Centro de Investigacin en Matemticas A.C ., Departamento de Ciencias de la Computacin, Apdo. Postal 402, 36000, Guanajuato , Gto, Mexico; email: mrivera@cimat.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645221819&partnerID=4 0&md5=3f9c8abe47b903b8f9842c961d3ddca3 ER TY - CONF T1 - Correlated color temperature determination in FEL type incandescent lamps JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6046 PY - 2006/// AU - Estrada-Hernndez, A. AU - Oidor, I. AU - Rosas, E. AD - Divisin de ptica y Radiometra, Centro Nacional de Metrologa, km 4.5 Carretera a los Cus, C. P. 76241, El Marques, Queretaro, Mexico AB - We present the application of the method recommended by the Commission Int ernationale de L'clairage (CIE), in the determination of the correlated color tem perature for the FEL type incandescent lamps, used in the Laboratorio de Espectr orradiometra de Lmparas of the Centro Nacional de Metrologa of Mexico (CENAM) as re ference standards in the measurement and calibration services for this quantity. The knowledge of the correlated color temperature of a lamp allows it to be use d as a particular CIE illuminant; and therefore permits its application in the v isual evaluation of colors in several industrial processes. Also, we present the uncertainty estimation for the determination of the correlated color temperatur e of the evaluated FEL type incandescent lamps. KW - Correlated color temperature KW - FEL lamps KW - Metrology KW - Uncertainty KW - Calibration KW - Color KW - Incandescent lamps KW - Lighting KW - Temperature measurement KW - Correlated color temperature KW - FEL lamps KW - Uncertainty KW - Optical correlation A2 - Rosas E. A2 - Cardoso R. A2 - Bermudez J.C. A2 - Barbosa-Garcia O. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 60461Q N1 - :doi 10.1117/12.674595 N1 - Correspondence Address: Estrada-Hernndez, A.; Divisin de ptica y Radiometra, C entro Nacional de Metrologa, km 4.5 Carretera a los Cus, C. P. 76241, El Marques, Queretaro, Mexico; email: aestrada@cenam.mx

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645233640&partnerID=4 0&md5=8597db9df9ffdcfead6a364c4599fecd ER TY - CONF T1 - Laser cooling and trapping of Cs-133 neutral atoms at CENAM JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6046 PY - 2006/// AU - Talavera Ortega, M. AU - Lpez Romero, J.M. AU - De Carlos Lpez, E. AD - Divisin de Masa y Densidad, Centro Nacional de Metrologa, km 4.5 Carretera a los Cus, El Marqus, Qro, Mexico AD - Divisin de Tiempo y Frecuencia, Centro Nacional de Metrologa, km 4.5 Carrete ra a los Cus, El Marqus, Qro, Mexico AB - At the moment the National Center of Metrology (CENAM) develops to the nec essary technology for the creation of a frequency standard of high accuracy deno minated CsF1 atomic fountain. The first stage of development of this clock consi sts of laser cooling and trapping neutral Cs-133 atoms. The mechanism of laser c ooling and trapping of atoms requires of the accomplishment of a magneto-optical trap (MOT) in where is indispensable to maintain a strict control in its parame ters of operation. In this experiment, the MOT operates with three set of red de tuning |6 2s I/2,F = 4 |6 2 3/2,F = 5 cyclical transition of Cs-133, mutually ortho gonal, counterpropagating laser beams, with opposite circular polarization, inte rsecting at the center of a magnetic field which is generated by a pair of coil in antiHelmholtz configuration. Additionally, a beam of light that comes from a repumping laser, tuned to the frequency of the |6 2s I/2,F = 3 |6 2 3/2,F = 4 trans ition of Cs-133, is injected to the MOT to maintain an atoms population in the | 6 2s I/2,F = 4 state. To cool and trap atoms to so low temperatures, of the order of the microkelvins on the zero absolute, by several seconds, minutes or even b y several hours, provided the fundamentals tools to us to study the temporal and spatial behavior of the fluorescence of the atomic cloud and to make exact meas urements in the count of such, in order to deduce the parameters of operation of the MOT that allows us to trap 10 10 atoms or more. In this work the theoretica l concepts as well as the experimental details of the parameters of operation of the MOT for the formation of the cold atom cloud are approached. KW - Atomic cloud KW - Doppler shift KW - Laser cooling KW - Molasse KW - MOT KW - Radiation pressure KW - Trapping KW - Atoms KW - Cesium compounds KW - Cooling KW - Doppler effect KW - Fluorescence KW - Parameter estimation KW - Standards KW - Atomic cloud KW - Laser cooling KW - Molasse KW - MOT KW - Radiation pressure KW - Trapping KW - Laser applications A2 - Rosas E. A2 - Cardoso R.

A2 - Bermudez J.C. A2 - Barbosa-Garcia O. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 604623 N1 - :doi 10.1117/12.674615 N1 - Correspondence Address: Talavera Ortega, M.; Divisin de Masa y Densidad, Ce ntro Nacional de Metrologa, km 4.5 Carretera a los Cus, El Marqus, Qro, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645238935&partnerID=4 0&md5=d58e3259c07ca30f3280aa41017c928d ER TY - CONF T1 - Relative spectral responsivity determination of photometric detectors JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 6046 PY - 2006/// AU - Molina, J.C. AU - Bermudez, J.C. AU - Hernndez-Lpez, J.E. AD - Centro Nacional de Metrologa, km 4,5 carretera a los Cus, El Marqus, Qro., Me xico AB - The experimental evaluation of the relative spectral response of a standar d photometer is presented; the measurements were carried out by the substitution method by means a double monochromator in the range of 405 nm to 730 nm with 5 nm resolution wavelength. The experimental uncertainty and its mismatching facto r f1' are evaluated as part of the routine procedure to realize the candela unit with trazability to an absolute cryogenic radiometer which is the national stan dard of radiant flux at CENAM (National Center of Metrology of Mxico). KW - Mismatching factor KW - Photometer KW - Photopic vision KW - Spectral responsivity KW - Monochromators KW - Radiometers KW - Standards KW - Stereo vision KW - Mismatching factor KW - Photopic vision KW - Spectral responsivity KW - Photometers A2 - Rosas E. A2 - Cardoso R. A2 - Bermudez J.C. A2 - Barbosa-Garcia O. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 604620 N1 - :doi 10.1117/12.674612 N1 - Correspondence Address: Molina, J.C.; Centro Nacional de Metrologa, km 4,5 carretera a los Cus, El Marqus, Qro., Mexico; email: jmolina@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645219138&partnerID=4 0&md5=eb5cb0ee0f404c484ef5e9f8ee0adc4d ER TY T1 JF VL PY CONF How to obtain traceability on optical radiation measurements? Proceedings of SPIE - The International Society for Optical Engineering 6046 2006///

AU - Garca, C.H.M. AD - Centro Nacional de Metrologa, Municipio El Marqus, km 4,5 carretera a Los Cus , C. P. 76241, Quertaro, Mexico AB - Traceability to national standards provides confidence in measurements res ults, granting a guaranty when carrying out governmental rules and when demonstr ating conformity with quality requirements such as ISO 9000 or ISO/IEC 17025 (an d the Mexican equivalent standards). The appropriate traceability contributes wi th confidence of the quality of products or services. This paper presents differ ent ways to obtain traceability in Mexico for the optical radiation measurements , mentioning some applications, and highlighting the necessity of having traceab ility to the appropriate units of the SI. Additionally it present the national s tandards maintained by Centro Nacional de Metrologia (CENAM), the national metro logy institute in Mxico, that give the technical support to Mexican measurements in this field and the international recognition that the personal of the Optics and Radiometry Division had gained in 10 years of development. KW - National standards KW - Optical properties KW - Photometry KW - Radiometry KW - Standard reference materials KW - Traceability KW - Optical properties KW - Optics KW - Photometry KW - Standards KW - National standards KW - Standard reference materials KW - Traceability KW - Radiometry A2 - Rosas E. A2 - Cardoso R. A2 - Bermudez J.C. A2 - Barbosa-Garcia O. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 60461U N1 - :doi 10.1117/12.674600 N1 - Correspondence Address: Garca, C.H.M.; Centro Nacional de Metrologa, Municip io El Marqus, km 4,5 carretera a Los Cus, C. P. 76241, Quertaro, Mexico; email: cma tamor@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33645223861&partnerID=4 0&md5=e1a2765acd9cbb47edac71fa84509d59 ER TY - CONF T1 - The Inter-American metrology system (SIM) common-view GPS comparison netwo rk JF - Proceedings of the IEEE International Frequency Control Symposium and Expo sition VL - 2005 SP - 691 EP - 698 PY - 2005/// AU - Lombardi, M.A. AU - Novick, A.N. AU - Lpez, J.M. AU - Boulanger, J.-S. AU - Pelletier, R. AD - National Institute of Standards and Technology (NIST), Boulder, CO, United States

AD - Centro Nacional de Metrologa (CENAM), Quertaro, Mexico AD - National Research Council (NRC), Ottawa, Canada AB - The Inter-American Metrology System (SIM) consists of national metrology i nstitutes in 34 member nations located throughout North, Central, and South Amer ica, and the Caribbean region. Currently, at least ten SIM laboratories pursue t ime and frequency metrology, and are responsible for maintaining the national ti me and frequency standards for their respective countries. To benefit these labo ratories and advance metrology in the SIM region, we have developed a measuremen t network to continuously intercompare these standards and to make the data read ily accessible to all SIM members. This network utilizes the multi-channel commo n-view GPS technique and the near real-time exchange of data via the Internet. T his paper discusses the challenges of implementing the SIM comparison network, a nd provides a technical description of the measurement system supplied to partic ipating laboratories. It describes the method used to calibrate the SIM measurem ent systems, and describes how the measurement results are processed and reporte d to the laboratories. It presents data collected from comparisons between the n ational frequency and time standards located in Canada, Mexico, and the United S tates. It validates these data by comparing them to data collected from previous ly established time links. It concludes with a discussion of the measurement unc ertainties. 2005 IEEE. KW - Communication channels (information theory) KW - Data acquisition KW - Frequency standards KW - Internet KW - Measurement theory KW - Real time systems KW - Standards KW - GPS comparison network KW - SIM measurement systems KW - Time and frequency metrology KW - Global positioning system N1 - Cited By (since 1996):3 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 1574019 N1 - :doi 10.1109/FREQ.2005.1574019 N1 - Correspondence Address: Lombardi, M.A.; National Institute of Standards an d Technology (NIST), Boulder, CO, United States; email: lombardi@nist.gov UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33846621590&partnerID=4 0&md5=68bcb78e6d16ab062ee60e72ddfd6617 ER TY - CONF T1 - Evaluation of AlGaAs/GaAs two dimensional electron gas heterostructures to obtain a resistance standard JF - 2nd International Conference on Electrical and Electronics Engineering, IC EEE and XI Conference on Electrical Engineering, CIE 2005 VL - 2005 SP - 424 EP - 427 PY - 2005/// AU - Hernandez-Marquez, F. AU - Rivera-Alvarez, Z. AU - Guillen-Cervantes, A. AU - Huerta-Ruelas, J. AU - Hernndez, I.C. AU - Zamora-Peredo, L. AU - Lastras-Martinez, A. AU - Mndez-Garca, V.H. AU - Lopez-Lopez, M.

AD - Centro Nacional de Metrologia, km 4.5 carretera a Los Cues, C.P. 76241 El Marques, Queretaro, Mexico AD - Departmento de Fsica, Centro de Investigaciones y de Estudos Avanzados - IPN , Mxico D.F, Mexico AD - Centro de Investigacin en Ciencia Aplicada y Tecnologa Avanzada, IPN - Unida d Queretaro, Quertaro, Mexico AD - Lasertel Inc., 7775 N. Casa Grande Hwy, Tucson, AZ 85743, United States AD - Institute de Investigacin en Comunicacin ptica, Universidad Autnoma de San Lui s Potos, San Luis Potos, Mexico AD - CICATA-IPN, Mexico AB - The Quantum Hall Effect allows to the national metrology Institutes to rep roduce the unit of resistance (ohm) in terms of physical constants. We have made efforts in order to develop AlGaAs/GaAs heterostructures with enough quality to be used in metrology as a resistance standard. The ohmic contacts in the sample s is one of the most important aspects for metrology applications, therefore goo d contacts are essential in the analysis of the longitudinal resistance under di ssipationless condition. Measurements at 1.3 K temperature, in magnetic fields u p to 12 T were made, as required to obtain Quantum Hall Effect phenomenon. Our r esults show that the developed samples have low longitudinal resistance, compara ble with those used at the mexican national metrology institute as reference sta ndard of dc resistance. 2005 IEEE. KW - Algaas/gaas heterostructures KW - Longitudinal resistance KW - Quantum hall effect KW - AlGaAs/GaAs heterostructures KW - Longitudinal resistance KW - Physical constants KW - Quantum Hall Effect KW - Electric resistance KW - Electron gas KW - Hall effect KW - Magnetic field effects KW - Ohmic contacts KW - Quantum theory KW - Semiconducting aluminum compounds KW - Semiconducting gallium arsenide KW - Heterojunctions N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 1529660 N1 - :doi 10.1109/ICEEE.2005.1529660 N1 - Correspondence Address: Hernandez-Marquez, F.; Centro Nacional de Metrolog ia, km 4.5 carretera a Los Cues, C.P. 76241 El Marques, Queretaro, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33748902767&partnerID=4 0&md5=cbe9df25839dd96ddd6ccd8534cc5ce5 ER TY T1 JF VL IS SP EP PY AU AU AU AU AU JOUR Reconstruccin 3D de la sagita de una superficie en rotacin Revista Mexicana de Fisica 51 6 636 640 2005/// Oliva, V.I.M. Snchez, C.I.R. Dvila, A.C. Hernndez, P.N. Nez, A.J.

AD - Facultad de Ciencias Fsico Matemticas, Benemrita Universidad Autnoma de Puebla , Apartado Postal 1152, Puebla, Pue, Mexico AD - Instituto Nacional de Astrofsica ptica y Electrnica, Apartado Postal 51 y 216 , Puebla, Pue., Mxico, 72000, Mexico AB - An instrument of optical contact is described to obtain the values of zagi ta in 3D of concave and convex nonreflecting surfaces. The system measure the za gita imaging a thin variable slit over the surface test. To obtain 3D informatio n the instrument is translated in X direction and the surface test is rotated a constant angular velocity. With this system is reached a resolution of 2.5m in Z and 1m in X. KW - Metrology KW - Profilometry N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Oliva, V.I.M.; Facultad de Ciencias Fsico Matemticas , Benemrita Universidad Autnoma de Puebla, Apartado Postal 1152, Puebla, Pue, Mexi co; email: vmoreno@fcfm.buap.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-36048953362&partnerID=4 0&md5=ace4d8971b775f5b3a34ddcc6f6283ac ER TY - CONF T1 - Surface metrology using "laser trackers" JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5776 SP - 568 EP - 575 PY - 2005/// AU - Enrquez, R. AU - Sampieri, C.E. AD - Instituto Nacional de Astrofsica, Optica y Electrnica, Departamento de Elect rnica, Sta. Ma. Tonantzintla, Puebla, Mexico AB - During the process of manufacture or measuring large components, position and orientation are needed thus; a method based in surveying the surface can be used to describe them. This method requires an ensemble of measurements of fixed points whose coordinates are unknown. Afterwards resulting observations are man ipulated to determinate objects position in order to apply surface metrology. In this work, a methodology to reduce uncertainties in surface measuring is presen ted. When measuring large surfaces, numerical methods can reduce uncertainties i n the measures, and this can be done with instruments as such as the Laser Track er -LT-. Calculations use range and angles measures, in order to determinate the coordinates of tridimensional unknown positions from differents surveying point s. The purpose of this work, is to solve problems of surface metrology with give n tolerances; with advantages in resources and results, instead of making time s acrifices. Here, a hybrid methodology is developed, combining Laser Tracker with GPS theories and analysis. Such a measuring position system can be used in appl ications where the use of others systems are unpractical, mainly because this ki nd of measuring instruments are portables and capable to track and report result s in real-time, it can be used in virtually anyplace. Simulations to measure pan els for the Large Millimetric Telescope - LMT/GTM- in Mxico were done. A first be nefit from using this method is that instrument is not isolated from its measuri ng environment. Instead, the system is thought as a whole with operator, measuri ng environment and targets. This solution provides an effective way, and a more precise measurement, because it does optimize the use of the instrument and uses additional information to strength the solution. KW - Coordinate metrology KW - Laser Tracker KW - Surface metrology KW - Computer simulation KW - Global positioning system

KW - Laser applications KW - Optical telescopes KW - Real time systems KW - Coordinate metrology KW - Coordinates KW - Laser trackers KW - Surface metrology KW - Surface measurement A2 - Rodriguez-Vera R. A2 - Mendoza-Santoyo F. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 61 N1 - :doi 10.1117/12.611571 N1 - Correspondence Address: Enrquez, R.; Instituto Nacional de Astrofsica, Optic a y Electrnica, Departamento de Electrnica, Sta. Ma. Tonantzintla, Puebla, Mexico; email: rogerio@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-26444468471&partnerID=4 0&md5=87a922785d35178799f80209d45147a7 ER TY - CONF T1 - Structured laser light and coordinate measuring systems integration for 3d metrology JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5776 SP - 618 EP - 629 PY - 2005/// AU - Orozco, B.V. AU - Garduno, V.G. AD - Centro de Ciencias Aplicadas y Desarrollo Tecnolgico, UNAM, Ciudad Universi taria, Mxico 04510, Mexico AD - Facultad de Ingeniera, UNAM, Ciudad Universitaria, Mxico 04510, Mexico AB - This paper presents an instrument for 3D metrology of smooth free form wor k pieces. In our scheme, the integration of structured laser light and coordinat e measuring systems provides high levels of accuracy, sample rate and automation of the measurement process. In order to get 3D information, a computer vision s ystem uses the 2D projection of a non-coherent structured laser light diode on t he scene. The object under inspection is placed over an indexed rotary table in order to perform multiple acquisitions in the whole measurement volume. The meas urement vision system and the rotary table are calibrated by means of integratin g a coordinate measuring machine into the measurement system. Experimental resul ts are developed in order to estimate the accuracy in the 3D reconstruction. KW - 3D machine vision KW - 3D metrology KW - Coordinate measurement machine KW - Structured laser light KW - 3D machine vision KW - 3D metrology KW - Laser light diodes KW - Structured laser light KW - Automation KW - Computer vision KW - Coordinate measuring machines KW - Diodes KW - Laser theory KW - Lasers KW - Measurement theory KW - Three dimensional

KW - Laser optics A2 - Rodriguez-Vera R. A2 - Mendoza-Santoyo F. N1 - Cited By (since 1996):3 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 67 N1 - :doi 10.1117/12.611839 N1 - Correspondence Address: Orozco, B.V.; Centro de Ciencias Aplicadas y Desar rollo Tecnolgico, UNAM, Ciudad Universitaria, Mxico 04510, Mexico; email: valerab@ aleph.cinstrum.unam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-26444469466&partnerID=4 0&md5=14670464671a358bde72f606687013f2 ER TY - CONF T1 - Laser metrology in food related systems JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5776 SP - 347 EP - 354 PY - 2005/// AU - Mendoza-Snchez, P. AU - Lpez, D. AU - Kongraksawech, T. AU - Vazquez, P. AU - Torres, J.A. AU - Ramirez, J.A. AU - Huerta-Ruelas, J. AD - CICATA-IPN, Jose Siurob 10, Col. Alameda, Queretaro, 76040, Mexico AD - Oregon State University, 100 Wiegand Hall, Corvallis, OR 97331-6602, Unite d States AD - UAM Reynosa Aztln, UAT, Calle 16 y Lago de Chapala, Reynosa, Tamaulipas, 88 740, Mexico AB - An optical system was developed using a low-cost semiconductor laser and c ommercial optical and electronic components, to monitor food processes by measur ing changes in optical rotation (OR) of chiral compounds. The OR signal as a fun ction of processing time and sample temperature were collected and recorded usin g a computer data acquisition system. System has been tested during two differen t processes: sugar-protein interaction and, beer fermentation process. To study sugar-protein interaction, the following sugars were used: sorbitol, trehalose a nd sucrose, and in the place of Protein, Serum Albumin Bovine (BSA, A-7906 Sigma -Aldrich). In some food processes, different sugars are added to protect damage of proteins during their processing, storage and/or distribution. Different suga r/protein solutions were prepared and heated above critical temperature of prote in denaturation. OR measurements were performed during heating process and effec t of different sugars in protein denaturation was measured. Higher sensitivity o f these measurements was found compared with Differential Scanning Calorimetry, which needs higher protein concentration to study these interactions. The brewin g fermentation process was monitored in-situ using this OR system and validated by correlation with specific density measurements and gas chromatography. This i nstrument can be implemented to monitor fermentation on-line, thereby determinin g end of process and optimizing process conditions in an industrial setting. The high sensitivity of developed OR system has no mobile parts and is more flexibl e than commercial polarimeters providing the capability of implementation in har sh environments, signifying the potential of this method as an in-line technique for quality control in food processing and for experimentation with optically a ctive solutions. KW - Fermentation process KW - In-line control

KW - Optical rotation KW - Product quality KW - Protein denaturation KW - Semiconductor laser KW - Sugar inversion KW - Sugar-protein interaction KW - Fermentation process KW - In-line control KW - Product quality KW - Protein denaturation KW - Sugar inversion KW - Sugar-protein interaction KW - Data acquisition KW - Differential scanning calorimetry KW - Fermentation KW - Food processing KW - Food products KW - Gas chromatography KW - Heating KW - Laser optics KW - Optical rotation KW - Optical systems KW - Optical testing KW - Polarimeters KW - Proteins KW - Semiconductor lasers KW - Sugar (sucrose) KW - Optical variables measurement A2 - Rodriguez-Vera R. A2 - Mendoza-Santoyo F. N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 38 N1 - :doi 10.1117/12.611643 N1 - Correspondence Address: Huerta-Ruelas, J.; CICATA-IPN, Jose Siurob 10, Col . Alameda, Queretaro, 76040, Mexico; email: jhuertar@ipn.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-26444491592&partnerID=4 0&md5=afe3829fbbd1ab7ff36192dd5d5b9f71 ER TY - CONF T1 - Uncertainty evaluation of displacements measured by ESPI with divergent wa vefronts JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5776 SP - 812 EP - 822 PY - 2005/// AU - Martiez, A. AU - Cordero, R. AU - Rayas, J.A. AU - Puga, H.J. AU - Rodrguez-Vera, R. AD - Centro de Investigaciones en ptica, A. C., Apartado Postal 1-948, C. P. 370 00, Len, Gto., Mexico AD - Department of Mechanical and Metallurgical Engineering, Pontificia Univers idad Catlica de Chile, Vicua Mackenna 4860, Santiago, Chile AD - Faculty of Mechanical and Production Sciences Engineering, Escuela Superio r Politcnica del Litoral, Km. 30.5 Va Perimetral, Guayaquil, Ecuador

AD - Instituto Tecnolgico de Len, Depto. Ciencias Bsicas, Av. Tecnolgico s/n Fracc, Julian de Obregon, Leon, Gto., Mexico AB - Displacement measurements by optical interferometry are affected by errors in the determination of the phase-difference and in interferometer sensitivity. In this paper, we perform an uncertainty analysis of displacements measured by inplane ESPI with spherical wavefronts. The displacements were induced by applyi ng uniaxial tensile load on a nominally flat elastic sample. Our attention was f ocused on the quantification of the effect of eventual errors in the sensitivity vector determination. We found that the displacement uncertainty depends on the geometry of the optical arrangement, and on the dimensions of the illuminated f ield. Moreover, the displacement uncertainty increases with the deformation. KW - In-plane-ESPI KW - Optical metrology KW - Sensitivity vector KW - Strain fields KW - Uncertainty analysis KW - Elasticity KW - Geometrical optics KW - Interferometry KW - Loads (forces) KW - Measurement theory KW - Speckle KW - Strain KW - Vectors KW - Wavefronts KW - In-plane-ESPI KW - Optical metrology KW - Sensitivity vectors KW - Strain fields KW - Uncertainty analysis KW - Distance measurement A2 - Rodriguez-Vera R. A2 - Mendoza-Santoyo F. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 87 N1 - :doi 10.1117/12.611903 N1 - Correspondence Address: Martiez, A.; Centro de Investigaciones en ptica, A. C., Apartado Postal 1-948, C. P. 37000, Len, Gto., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-26444439969&partnerID=4 0&md5=57e1e4d90302ec8d54c5aec215e98caa ER TY - CONF T1 - Fringe normalization by using of an interpolation algorithm JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5776 SP - 684 EP - 691 PY - 2005/// AU - Cuevas, F.J. AU - Azuela, J.H.S. AU - Garnica, G. AU - Rayas, J. AU - Carpio, M. AU - Gonzalez, O. AD - Centro de Investigaciones en ptica, A.C., Loma del Bosque 115, CP. 37150, L eon, Guanajuato, Mexico AD - Centro de Investigacin en Computacin, Av. Othn de Mendizabal s/n, Zacatenco, Mxico, D.F., Mexico

AD - Instituto Tecnolgico de Len, Fracc. Ind. Julian de Obregn, Av. Tecnolgico S/N, C.P. 37290, Len, Gto., Mexico AB - A fringe normalization procedure is presented in this paper. The main idea of the computer algorithm is to normalize the fringe pattern using spline inter polation functions. To achieve this, two splines are fitted using the maximum an d minimum irradiance peaks detected over each fringe image line. Then, each pixe l in the fringe image is interpolated and normalized by using of the values of t he max and min splines. The fringe contrast is enhanced with an error around 1%. Preliminary results are presented. KW - Fringe analysis KW - Fringe detection KW - Fringe normalization KW - Optical metrology KW - Spline interpolation KW - Fringe analysis KW - Fringe detection KW - Fringe normalization KW - Optical metrology KW - Spline interpolation KW - Algorithms KW - Errors KW - Geometrical optics KW - Image analysis KW - Interpolation KW - Optical engineering A2 - Rodriguez-Vera R. A2 - Mendoza-Santoyo F. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 74 N1 - :doi 10.1117/12.611686 N1 - Correspondence Address: Cuevas, F.J.; Centro de Investigaciones en ptica, A .C., Loma del Bosque 115, CP. 37150, Leon, Guanajuato, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-26444597977&partnerID=4 0&md5=85b99cef1388264ce6edc291ee237049 ER TY - CONF T1 - Micro displacement measurements with holographic gratings JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5776 SP - 773 EP - 778 PY - 2005/// AU - Ortiz-Gutirrez, M. AU - Prez-Corts, M. AU - Gmez-Coln, M.R. AU - Olivares-Prez, A. AU - Ibarra-Torres, J.C. AD - Escuela de Ciencias Fsico Matemticas, UMSNH, Morelia, Mich., Mexico AD - Facultad de Ingeniera, Universidad Autnoma de Yuctan, Mrida Yuctan, Mexico AD - Instituto Nacional de Astrofsica ptica y Electrnica, Puebla, Mexico AD - Centro de Enseanza Tcnica Industrial, Nueva Escocia No. 1885, Guadalajara, J al., Mexico AB - In this work we propose a new technique to measure micro displacements usi ng high frequency holographic gratings. In this technique the grating is placed on an object with micro displacement and these displacements are measured counti ng the displaced fringes of an amplified grating image as the object is moving. KW - Gratings KW - Holography

KW - Metrology KW - Diffraction gratings KW - Holography KW - Image analysis KW - Measurements KW - Optical engineering KW - Fringes KW - Gratings KW - Holographic gratings KW - Micro displacement measurements KW - Distance measurement A2 - Rodriguez-Vera R. A2 - Mendoza-Santoyo F. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 83 N1 - :doi 10.1117/12.611749 N1 - Correspondence Address: Ortiz-Gutirrez, M.; Escuela de Ciencias Fsico Matemti cas, UMSNH, Morelia, Mich., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-26444524923&partnerID=4 0&md5=d73d8f663dffd99d4d7ecf298073666e ER TY - JOUR T1 - Tcnicas pticas para el contorneo de superficies tridimensionales JF - Revista Mexicana de Fisica VL - 51 IS - 4 SP - 431 EP - 436 PY - 2005/// AU - Martnez, A. AU - Rayas, J.A. AU - Flores M., J.M. AU - Rodrguez-Vera, R. AU - Donato Aguayo, D. AD - Centro de Investigaciones en ptica, A.C., Apartado Postal 1-948, 37000, Len, Gto., Mexico AB - We will present some non-contact systems for obtaining three-dimensional o bjects topography. The described systems are incoherent fringe projection techni que, Talbot and speckle interferometry. In fringe projection technique, the digi tulization is realized when black and white lines are projected over the object and this image is captured by the CCD. In Talbot interferometry, the object is c ollocated on one of the grating auto-image planes. The deformed grating image is captured by the CCD and superposed with a synthetic grating generated in the co mputer for obtaining a moir pattern which gives information about the object topo graphy. In the speckle interferometry technique, dual collimated illumination is used for contouring. The collimated beams illuminate symmetrically the object a t an angle with the optical axis, and an image is recorded in the usual way. Now if the object is tilted by a small , a system of equispaced interference planes i ntersects the object. A second recorded is taking in this object position. Both images are processed to get the object topography. The shape of the car part, a gasket, shoe mold and other examples of digitalized objects are shown. Advantage s and disadvantages of the techniques are discussed. KW - Fringes projection KW - Optical metrology KW - Speckle interferometry KW - Talbot interferometry N1 - Cited By (since 1996):5 N1 - Export Date: 26 April 2013

N1 - Source: Scopus N1 - Correspondence Address: Martnez, A.; Centro de Investigaciones en ptica, A.C ., Apartado Postal 1-948, 37000, Len, Gto., Mexico; email: amalia@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-34248595019&partnerID=4 0&md5=2d35b799fa434cbc3e7b28e7faee9113 ER TY - JOUR T1 - Spatial phase stepping wavelength meter JF - Measurement Science and Technology VL - 16 IS - 3 SP - 821 EP - 827 PY - 2005/// AU - Surrel, Y. AU - Garca-Mrquez, J. AU - Fodor, J. AU - Juncar, P. AD - Conservatoire National des Arts et Mtiers, 292 rue Saint-Martin, 75141, Par is, France AD - Centro de Investigaciones en ptica, Loma del Bosque 115, 37150, Leon, Mexic o AD - Institut National de Mtrologie, CNAM, 292 rue Saint Martin, 75141, Paris, F rance AB - A new way of evaluating the ratio between a reference wavelength radiation and an unknown wavelength radiation in a two-beam interferometer is proposed he re. The advantage of two-beam interferometry is the sinusoidal fringe signal for which precise phase detection algorithms exist. Modern algorithms can cope with different sources of errors, and correct them. We recall the principle of the M ichelson-type lambdameter using temporal interference and we introduce the Young -type lambdameter using spatial interference. The Young-type lambdameter is base d on the acquisition of the interference pattern from two point sources (e.g. tw o ends of monomode fibres projected onto a CCD camera). The measurement of an un known wavelength can be achieved by comparing with a reference wavelength. Accur ate interference phase maps can be calculated using spatial phase shifting. In t his way, each small group of contiguous pixels acts as a single interferometer, and the whole set of pixels corresponds to many hundreds or thousands of interfe rometric measurement system units. The analysis of uncertainties shows that reso lutions better than 10-7 can be achieved. An advantage of the fibre wavelength m etre described here is the measurement velocity that takes only a few seconds. 2 005 IOP Publishing Ltd. KW - Fibre couplers KW - Lasers KW - Length metrology KW - Phase shifting interferometry KW - Uncertainty evaluation KW - Wavemeters KW - Algorithms KW - Cameras KW - Charge coupled devices KW - Interferometers KW - Lasers KW - Phase shift KW - Signal interference KW - Fiber couplers KW - Length metrology KW - Phase shifting interferometry KW - Uncertainty evaluation KW - Wavemeters

KW - interferometry N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1088/0957-0233/16/3/025 N1 - Correspondence Address: Surrel, Y.; Conservatoire National des Arts et Mtie rs, 292 rue Saint-Martin, 75141, Paris, France; email: surrel@cnam.fr UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-24144438588&partnerID=4 0&md5=06f2a5004a9fb888fd7751c8bc8657ce ER TY - JOUR T1 - Recognition of a light line pattern by Hu moments for 3-D reconstruction o f a rotated object JF - Optics and Laser Technology VL - 37 IS - 2 SP - 131 EP - 138 PY - 2005/// AU - Muoz-Rodrguez, J.A. AU - Asundi, A. AU - Rodriguez-Vera, R. AD - Centro de Investigaciones en Optica, A.C. Gto, Leon 37150, Mexico AD - Nanyang Technological University, Sch. of Mechan./Prod. Engineering, Nanya ng Avenue, Singapore, 639798, Singapore AB - A simple technique of a light line projection for 3-D shape detection of r otated objects is presented. In this technique, an object is rotated around its symmetrical axis four times at an angle by using an electromechanical device and scanned by a light line. Four views of the object surface are extracted from ea ch one of these rotations by processing a set of light line images. These views are connected using rotation angle and origin coordinates to obtain the complete 3-D shape. Angle and origin are calculated by recognition of a light line patte rn. Light line pattern is recognized by Hu moments. In this manner, measurement errors on setup are avoided. It is an advantage over common methods, where these two parameters are measured directly on the setup to obtain the 3-D shape. Loca l profilometric method is based on the perturbation that the light line suffers when it is projected on the object surface. This perturbation is observed on an image plane due to the different direction between light line projector and view er. These perturbations are measured by using Gaussian functions. In this techni que the light line images are processed in very fast form. The technique and pro cessing time are presented in detail. This technique is tested with objects, whi ch have little information and its experimental results are also presented. 2004 Elsevier Ltd. All rights reserved. KW - 3-D reconstruction KW - Hu moments KW - Light line projection KW - Pattern recognition KW - Algorithms KW - Charge coupled devices KW - Computer vision KW - Electromechanical devices KW - Robotics KW - Video cameras KW - Optical metrology KW - Robotic vision KW - Rotation angles KW - Object recognition N1 - Cited By (since 1996):8 N1 - Export Date: 26 April 2013

N1 - Source: Scopus N1 - :doi 10.1016/j.optlastec.2004.02.019 N1 - Correspondence Address: Muoz-Rodrguez, J.A.; Centro de Investigaciones en Op tica, A.C. Gto, Leon 37150, Mexico; email: munoza@foton.cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-5444269327&partnerID=40 &md5=672fc6e8a3acd89dc351be62b4c5ac51 ER TY - JOUR T1 - Results of the key comparison SIM-Euromet.M.P-BK3 (bilateral comparison) i n the pressure range from 3 10-4 Pa to 0.9 Pa JF - Metrologia VL - 42 IS - SUPPL. SP - 07002 PY - 2005/// AU - Jousten, K. AU - Romero, L.A.S. AU - Guzman, J.C.T. AD - Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany AD - Centro Nacional de Metrologa (CENAM), Municipio del Marqus, CP 76241 Quertaro , Mexico AB - A medium and high vacuum primary standard has newly been set up at the CEN AM, Mexico. This vacuum standard is based on the static expansion method and cov ers a measuring range from 1 10-5 Pa to 1 10 3 Pa of absolute pressure. To valid ate its function and uncertainty budget, in 2002 a comparison was performed with a primary standard of the vacuum metrology section at PTB which had taken part in the key comparison CCM.P-K4. In this manner, the degree of equivalence of the pressure measurements performed with this standard with those of other national primary standards of the CCM.P-K4 could be found. In addition, a link could be achieved with the national standards of the Euromet comparison Euromet.M.P-K1.b, since the latter comparison was carried out with the same protocol and the same tranfer standards, having also PTB as common participant. Two spinning rotor ga uges served as transfer standards and showed an excellent transport stability. T he effective accommodation coefficients of the rotors had to be determined at ei ght target points, at and between 3 10-4 Pa and 0.9 Pa. The pressures generated by the PTB and the CENAM primary standards showed good agreement within their co mbined uncertainties. So, there is also equivalence of the CENAM medium and high vacuum primary standard with the other national primary standards of the CCM.PK4. The CENAM primary standard is also equivalent with the reference value of th e Euromet.M.P-K1.b. Main text. To reach the main text of this paper, click on Fi nal Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/. The final report has been peer-reviewed and approved for publication by the CCM, according to the provisions of the Mutu al Recognition Arrangement (MRA). KW - Database systems KW - Pressure distribution KW - Rotors KW - Uncertain systems KW - Vacuum applications KW - Mutual Recognition Arrangement (MRA) KW - Vacuum metrology KW - Research laboratories N1 - Cited By (since 1996):5 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 07002 N1 - :doi 10.1088/0026-1394/42/1A/07002 N1 - Correspondence Address: Jousten, K.; Physikalisch-Technische Bundesanstalt

(PTB), Abbestr. 2-12, 10587 Berlin, Germany UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-28844499917&partnerID=4 0&md5=595e86e89f5b2561f925985052e7303a ER TY - JOUR T1 - Final report on key comparison CCM.P-K7 in the range 10 MPa to 100 MPa of hydraulic gauge pressure JF - Metrologia VL - 42 IS - SUPPL. SP - 07005 PY - 2005/// AU - Sabuga, W. AU - Bergoglio, M. AU - Rabault, T. AU - Waller, B. AU - Torres, C. AU - Olson, A. AU - Agarwal, A. AU - Kobata, T. AU - Bandyopadhyay, K. AD - Physikalisch-Technische Bundesanstalt, Germany AD - Istituto di Metrologia 'G Colonnetti', Consiglio Nazionale delle Ricerche, Italy AD - Bureau National de Mtrologie, Laboratoire National d'Essais, France AD - National Physical Laboratory, United Kingdom AD - Centro Nacional de Metrologa, Mexico AD - National Institute of Standards and Technology, United States AD - Institute for National Measurement Standards, National Research Council, C anada AD - National Metrology Institute of Japan (NMIJ/AIST), Japan AD - National Physical Laboratory, India AB - This report describes a CCM key comparison of hydraulic pressure standards of nine national metrology institutes that was carried out in the period from N ovember 2002 to June 2004 in order to determine their degrees of equivalence in the range 10 MPa to 100 MPa of the gauge pressure. The pilot laboratory was PTB. The primary pressure standards were pressure balances of different design equip ped with piston-cylinder assemblies operated in free-deformation, controlled-cle arance or re-entrant operation mode. The transfer standard was a pressure balanc e equipped with a piston-cylinder assembly and a mass set. The pressure-dependen t effective areas of the transfer standard at specified pressures were reported by the participants and led to the reference values calculated as medians. All p articipants' results agree with the reference values and with each other within the expanded uncertainties calculated with a coverage factor 2, most of them eve n within their standard uncertainties. In addition, the results were analysed in terms of the zero-pressure effective area and the pressure distortion coefficie nt. Also for them agreement within expanded uncertainties (k 2) is observed. The results of the comparison demonstrate equivalence of the laboratory standards a nd support their measurement capability statements. Main text. To reach the main text of this paper, click on Final Report. Note that this text is that which ap pears in Appendix B of the BIPM key comparison database kcdb.bipm.org/. The fina l report has been peer-reviewed and approved for publication by the CCM, accordi ng to the provisions of the Mutual Recognition Arrangement (MRA). KW - Measurement capability statements KW - Mutual Recognition Arrangement (MRA) KW - Pressure distortion coefficient KW - Database systems KW - Pressure effects KW - Standards

KW - Hydraulic models N1 - Cited By (since 1996):9 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 07005 N1 - :doi 10.1088/0026-1394/42/1A/07005 N1 - Correspondence Address: Sabuga, W.; Physikalisch-Technische BundesanstaltG ermany UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-28844480945&partnerID=4 0&md5=7fed63c17bfa0a09200abc27a1b8b8a3 ER TY - CONF T1 - Some studies to prevent the production of some types of moir effects in fab rics JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5457 SP - 727 EP - 737 PY - 2004/// AU - Serrano, A. AU - Ponce, R. AU - Serroukh, I. AD - ITESM, Centro ptica, Tec of Monterrey, Av. Garza Soda 2501, C.P. 64849, Mon terrey, N.L., Mexico AB - The symmetry concerning the fabric pattern is not always suitable for the quality that we expected from fabric textile. The moir effects produced by a peri odic structure may be caused by various and diverse factors as folds, lines, etc . The defect that we are concern is bright and dark fringes appearing in the Nyl on Fabric are viewed with necked eye, from a particular angle using white light. To prevent these annoying effects, one should be focusing the research basicall y on geometrical fabric structure, physical, optical and dyeing. We start this w ork by an exhaustive study made to obtain enough information in order to identif y and analyze the problem in order to identify, explain and prevent it appearanc e. To realize that we may define the factors that causes the phenomena. Concerni ng the experimental results, we begin with a conventional experiment called "Fla t table examination" using Fluorescent white light bulb as types of illumination . We have used as well a microscope examination. It is useful to inspect the fib er and yams which may have different characteristics of size and form. The light interaction with the fiber will produce especially kind of reflection and absor ption. We finish the work by designing and developing an optical system able not only for detecting those kinds of fringes. As well to allow some defects inspec tion. We believe that some measurements are necessary during some process of fab rication (dyeing, spinning and knitting), at least to reduce this types of defec ts. KW - Metrology KW - Moir KW - Nylon fabrics KW - Textile KW - Absorption KW - Fibers KW - Light reflection KW - Lighting KW - Parameter estimation KW - Polymers KW - Velocity measurement KW - Final fabric KW - Nylon fabrics KW - Quality inspection KW - Trilobal fibers

KW - Fabrics KW - Absorption KW - Fibers KW - Forming Fabrics KW - Illumination KW - Parameters KW - Polymers KW - Velocity Measurement A2 - Osten W. A2 - Takeda M. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.545796 N1 - Correspondence Address: Serrano, A.; ITESM, Centro ptica, Tec of Monterrey, Av. Garza Soda 2501, C.P. 64849, Monterrey, N.L., Mexico; email: serrano@itesm. mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-10044269689&partnerID=4 0&md5=55d819fd8c4caaa3ae1d3f092222f5e1 ER TY - CONF T1 - Measurement of the very thin metallic wires diameter for the industrial au tomatic control JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5457 SP - 660 EP - 668 PY - 2004/// AU - Serroukh, I. AU - Martinez, J.C. AU - Serrano, A. AU - Bernabeu, E. AD - ITESM, Centro ptica, Tec. of Monterrey, Av. Garza Sada 2501, C.P. 64849, Mo nterrey, N.L., Mexico AD - Univ. Complutense de Madrid, Physics Faculty, Department of Optics, Spain AB - The accuracy and precision of the thin wires still requiring special atten tion. Both theoretical and experimental studies together may give closest approx imation to the "real" value. Concerning the optical technique of measurement, pe rhaps one may analyze more in detail the interaction between light and matter (w ire) which can lead to a simple mathematical approach. Besides this, a calibrati ng system and robust technique of measurement is required both in the industrial sector and laboratories. Measuring the wires depends especially on how much acc uracy and precision we want to achieve, we have static or dynamic measurement, w hich kind of wire we need to measure ...etc. This report shows some work about t he diffraction models and some measurement of the thin wire (30-500 m ). Statisti cal technique of measurement is provided as well. KW - Calibration KW - Diameter KW - Diffraction KW - Measurement KW - Metrology KW - Wire KW - Calibration KW - Control systems KW - Diffraction KW - Error analysis KW - Interferometers KW - Mathematical models KW - Measurement theory KW - Problem solving

KW - Cylindrical wires KW - Thin metallic wires KW - Wave diffraction KW - Wire diameters KW - Wire A2 - Osten W. A2 - Takeda M. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.545875 N1 - Correspondence Address: Serroukh, I.; ITESM, Centro ptica, Tec. of Monterre y, Av. Garza Sada 2501, C.P. 64849, Monterrey, N.L., Mexico; email: ibrahim@fis. ucm.es UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-10044260908&partnerID=4 0&md5=44192978bd835f72817d617547560787 ER TY - SER T1 - Modifiable high distorted CMM to validate models for correction, procedure s of calibration and diagnoses JF - VDI Berichte IS - 1860 SP - 81 EP - 86+795 PY - 2004/// AU - Snchez, J. AU - Santilln, S. AD - National University of Mexico, Laboratory of Metrology, P.O. Box 70-185, 0 4510 Mexico D.F, Mexico AB - Modifiable high-distorted machine is part of a major project named: Virtua l Multiaxis Machine (VMM) [1], this last developed as a whole computational reso urce to assay methods of calibration, models and algorithms. Although VMM is lin ked to CAD, simulating movements and assembles of distorted bodies, there are ot her ones errors produced by friction, dust, elasticity, control, vibrations and ways of touching; all of them so difficult to represent in actual standard CADs. A way of validating facilities of such virtual instrument for industrial applic ations, where dynamic variables are present, is by testing all static and dynami c phenomena in a physical CMM, where all variables are amplified. Main propertie s of the distorted CMM we developed are: a) it is linked to the virtual through soft and hard interfaces; b) the twenty one degrees of freedom of the standard m odel are present in amplified way, and modifiable; c) effects caused by dust, fr iction and inclination are easy to appreciate through results; speed, accelerati on, vibrations and protocols of touching may be modelled in interfaces of contro l. Additional profits of this project are: a) it is possible to weight geometric al and dynamic uncertainties in the budget of final for particular applications as alternative to ISO-GUM, or instead it; and b) the quick skill acquired by pos tgraduate students in designing, manufacturing, controlling and testing mechatro nics for metrology. KW - Algorithms KW - Calibration KW - Computer aided design KW - Dust KW - Elasticity KW - Error correction KW - Friction KW - Mathematical models KW - Mechanical testing KW - Mechatronics KW - Vibrations (mechanical) KW - Air bearings

KW - Box gears KW - Optical encoders KW - Virtual multiaxis machines (VMM) KW - Coordinate measuring machines N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Snchez, J.; National University of Mexico, Laborato ry of Metrology, P.O. Box 70-185, 04510 Mexico D.F, Mexico; email: sanchezj@alep h.cinstrum.unam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-19744382517&partnerID=4 0&md5=25920b88000adc8c8c9544228383f6ac ER TY - CONF T1 - Analysis of the phase conjugation reflectivity for volume speckle patterns in a BSO crystal JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5622 IS - PART 1 SP - 470 EP - 474 PY - 2004/// AU - Salazar, A. AU - Tebaldi, M. AU - Bolognini, N. AD - Grupo de Optica y Espectroscopia, Centro de Ciencia Bsica, Universidad Pont ificia, Bolivariana, Medelln, Colombia AD - Ctro. de Invest. pticas, CIOp (CONICET, CIC), UID OPTIMO, P. O. Box 124, La Plata 1900, Argentina AD - Facultad de Ciencias Exactas, UNLP, Argentina AB - When a diffusing surface is illuminated by a coherent light beam, speckles are formed in the space in front of the surface. These speckles have a three-di mensional structure. However, in spite of this three-dimensional nature, two-dim ensional recording media are usually used for applications in optical metrology. Since 80's, the photorefractive crystals were widely employed for optical proce ssing and metrology in particular concerning speckle applications. Furthermore, we have taken advantage of the three-dimensional photorefractive medium to store three-dimensional speckle distributions. In our case, the phase conjugation the ory, within the transmission grating approximation, is applied to study the phas e conjugation reflectivity when speckle patterns are stored in a BSO photorefrac tive crystal. It is numerically shown that the beam coupling theory is adequate to explain the reflectivity behavior in terms of the average modulation of the r egistered speckles and the average speckle length. The knowledge of the reflecti vity behavior when speckle patterns are considered, allows to optimize interfero metric system based on real-time speckle pattern correlation and to improve spec kle applications in optical signal processing. KW - Phase conjugation reflectivity KW - Photorefractive BSO crystal KW - Speckle KW - Coherent light KW - Crystals KW - Diffusion KW - Light modulation KW - Measurements KW - Pattern recognition KW - Photoreactivity KW - Optical metrology KW - Phase conjugation reflectivity KW - Photorefractive BSO crystals KW - Speckles

KW - Optical phase conjugation A2 - Marcano O. A. A2 - Paz J.L. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 89 N1 - :doi 10.1117/12.590629 N1 - Correspondence Address: Salazar, A.; Grupo de Optica y Espectroscopia, Cen tro de Ciencia Bsica, Universidad Pontificia, Bolivariana, Medelln, Colombia; emai l: ansama@geo.net.co UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-17644370600&partnerID=4 0&md5=4237637bb30488de120c77281145acee ER TY - CONF T1 - Automated calibration of graduated scales JF - 2004 1st International Conference on Electrical and Electronics Engineerin g, ICEEE SP - 385 EP - 390 PY - 2004/// AU - Chvez, G. AU - Valera, B. AU - Padilla, S. AD - Laboratorio de Metrologa, Centro de Ciencias Aplicadas y Desarrollo Tecnolgi co, Ciudad Universitaria, P. O. Box 70-186, 04510, Mxico, Mexico AB - In the geometrical metrology field, calibration of graduated scales is per formed by comparison of the scale under inspection against a length standard at specific intervals. The procedure can take a long time due to the human interven tion as a part of an observation process at each measurement interval. For examp le, the calibration of a scale of 1m can be divided in intervals of 1cm, which r esults in a process with around 100 measurements. This paper describes a fully a utomated measurement instrument used in the calibration of graduated scales. The instrument avoids the human intervention by means of computer vision hardware a nd software and automated control. The measurement acquisition is done in known length intervals by the accurate positioning of an observation device and then a pplying computer vision techniques in order to recognize the magnitude in the sc ale. The measurements are compared against those reported by the length standard to complete a calibration chart. The system described here improves the overall performance in relation to the manual method. 2004 IEEE. KW - Computer software KW - Electrical engineering KW - Electronics engineering KW - Hardware KW - Measurements KW - Standards KW - Automated control KW - Gemetrical metrology fields KW - Calibration N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Chvez, G.; Laboratorio de Metrologa, Centro de Cienc ias Aplicadas y Desarrollo Tecnolgico, Ciudad Universitaria, P. O. Box 70-186, 04 510, Mxico, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-24644481812&partnerID=4 0&md5=5570c4ecfb7d03be0f22a6978af0ee99 ER TY - CONF T1 - Interinstrumental agreement between spectrocolorimeters

JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5622 IS - PART 3 SP - 1237 EP - 1242 PY - 2004/// AU - Carranza, J.G. AU - Medina, J.M. AD - Natl. Inst. Astrofis., Opt./E., Luis Enrique Erro #1 Sta. Ma., Tonantzintl a, Puebla, Mexico AB - The aim of this work is to generate a scheme for the intercomparation of s pectrocolorimeters which have the same optic configuration of illumination/viewi ng, in chromatics coordinates L a b in base to the ASTM recommendation E1164 - 0 21. In order to quantify the agreement interinstrumental of these equipments, we were utilized five Materials Reference Standard (MRC), in five points of the CI EL a b color space. The scheme proposed in this work can be applied in colorimet ry to discriminate the existent of variations in chromatics coordinates CIEL a b generated for samples that can not taken as standards. KW - Color metrology KW - Interinstrumental agreement KW - Calibration KW - Ceramic materials KW - Chromate coatings KW - Color matching KW - Light reflection KW - Matrix algebra KW - Ultraviolet radiation KW - Color metrology KW - Interinstrumental agreement KW - Spectral reflectance factor KW - Statistic variances KW - Spectrophotometers A2 - Marcano O. A. A2 - Paz J.L. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 235 N1 - :doi 10.1117/12.590866 N1 - Correspondence Address: Carranza, J.G.; Natl. Inst. Astrofis., Opt./E., Lu is Enrique Erro #1 Sta. Ma., Tonantzintla, Puebla, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-17644394886&partnerID=4 0&md5=8e38dbe725b6dbaca3c0db276e5d69e9 ER TY - CONF T1 - Three illumination sources position optimization for interferometry JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5622 IS - PART 2 SP - 651 EP - 656 PY - 2004/// AU - Martinez, A. AU - Rayas, J.A. AU - Rodrguez-Vera, R. AU - Puga, H.J. AD - Ctro. de Invest. en ptica, A. C, Apartado Postal 1-948, C. P. 37000, Len, Gt o., Mexico AD - Inst. Tecn. de Len, Depto. Ciencias Bsicas, Av. Tecnolgico s/n Fracc, Julian de Obregon, Leon, Gto., Mexico

AB - When it is carried out to perform a three dimensional evaluation of displa cements, it has been proposed ESPI systems which uses three illumination beams o r the use of three sensors. The same technique has been used by digital holograp hy and shearography. The different sensitivity vectors associated to each illumi nation beam let us permit to calculate the displacement in each direction by sen sitivity matrix. In the present work, it is showed the sensitivity components fo r each source in the case of optical set-up with three divergent illuminating be ams, where the sources position makes possible measure the u, v and w components with a weight factor approximately equal respecting to set-up sensitivity. KW - 3-d deformation KW - Optical metrology KW - Sensitivity matrix KW - Deformation KW - Illuminating engineering KW - Matrix algebra KW - Optimization KW - Sensitivity analysis KW - Three dimensional KW - Vectors KW - 3-D deformation KW - Illumination beams KW - Optical metrology KW - Sensitivity matrix KW - Interferometry A2 - Marcano O. A. A2 - Paz J.L. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 125 N1 - :doi 10.1117/12.591955 N1 - Correspondence Address: Martinez, A.; Ctro. de Invest. en ptica, A. C, Apar tado Postal 1-948, C. P. 37000, Len, Gto., Mexico; email: amalia@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-17644416717&partnerID=4 0&md5=d2ca0d9f6c8b076f121287899924c589 ER TY - CONF T1 - Closed fringe demodulation by multi-polynomial fitting JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5531 SP - 405 EP - 412 PY - 2004/// AU - Cuevas, F.J. AU - Servin, M. AD - Ctro. de Invest. en Optica, A.C., Loma del Bosque 115, Len Gto., Mexico AB - In this paper, a set of polynomials are calculated to approximate the phas e from a single closed fringe pattern image or interferogram. A scanning window is used to carry out the demodulation process. A polynomial function is fitted o ver the sub-image obtained from each scanning window. Then, the scanning window is moved on an overlapped neighbourhood of the previous one and the process is r epeated. The coefficient polynomial optimization is achieved by multiple applica tion of a genetic algorithm (GA). The GA optimizes a cost function which conside rs the irradiance similitude between original interferogram and fringes generate d by the polynomial obtained from chromosome decodification, the smoothness of t he phase being demodulated, and the phase similitude between the overlapped area of actual and previous scanning window. Closed fringe patterns with broad bandw idth can be demodulated. Preliminary results are presented. KW - Fringe analysis KW - Genetic algorithms

KW - Optical Metrology KW - Amplitude modulation KW - Genetic algorithms KW - Interferometers KW - Interferometry KW - Mathematical models KW - Optical variables measurement KW - Optimization KW - Phase locked loops KW - Polynomials KW - Variable frequency oscillators KW - Carrier frequency KW - Fringe analysis KW - Interferograms KW - Optical metrology KW - Demodulation A2 - Creath K. A2 - Schmit J. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 50 N1 - :doi 10.1117/12.560979 N1 - Correspondence Address: Cuevas, F.J.; Ctro. de Invest. en Optica, A.C., Lo ma del Bosque 115, Len Gto., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-15744392676&partnerID=4 0&md5=fc836bdb2a9b5ee6f52bcde0b9cb3925 ER TY - CONF T1 - Flow visualization using nonlinear phase contrast JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5622 IS - PART 1 SP - 204 EP - 207 PY - 2004/// AU - Trevio-Palacios, C.G. AU - Iturbe-Castillo, M.D. AU - Sanchez-De-La-Llave, D. AU - Olivos-Perez, L.I. AD - INAOE, Apdo Postal 51 y 216, Puebla Pue 72000, Mexico AB - In this work, we show a simple single lens system using laser light illumi nation to observe flow dynamics. It is based on a phase contrast technique in wh ich the filter is made of a nonlinear optical material, therefore it is self-ali gned and depends mainly on the illuminating intensity. Due to these characterist ics, the resulting setup is extremely robust and builds up within a few millisec onds. KW - Metrology KW - Nonlinear optical materials KW - Phase contrast KW - Fourier transforms KW - Illuminating engineering KW - Laser beam effects KW - Lenses KW - Nonlinear optics KW - Nonlinear systems KW - Robustness (control systems) KW - Spectrum analysis KW - Laser light illumination KW - Nonlinear optical materials

KW - Phase contrast KW - Zero frequency components KW - Flow visualization A2 - Marcano O. A. A2 - Paz J.L. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 37 N1 - :doi 10.1117/12.590703 N1 - Correspondence Address: Trevio-Palacios, C.G.; INAOE, Apdo Postal 51 y 216, Puebla Pue 72000, Mexico; email: carlost@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-17644396308&partnerID=4 0&md5=0e1e42df43e5535e5a4e9e21288d456e ER TY - CONF T1 - Massively parallel interferometry: Towards the all-integrated lambdameter JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5531 SP - 181 EP - 192 PY - 2004/// AU - Fodor, J. AU - Garca-Mrquez, J. AU - Surrel, Y. AD - BNM-INM, 292 rue Saint-Martin, 75141 Paris cedex 03, France AD - Ctro. de Invest. en ptica, Loma del Bosque 115, 37150, Leon, Mexico AD - Conserv. Natl. des Arts et Metiers, 292 rue Saint-Martin, 75141 Paris cede x 03, France AB - In this paper we present recent work about the application of digital phas e detection for accurate wavelength measurement using two beam interferometry (l ambdametry). The advantage of two beam interferometry is the sinusoidal fringe s ignal for which precise phase detection algorithms exist. Modern algorithms can cope with different sources of errors, and correct them. We recall the principle of the Michelson-type lambdameter using temporal interference and we introduce the Young-type lambdameter using spatial interference. The Young-type lambdamete r is based on the acquisition of the interference pattern from two point sources (e.g. two ends of monomode optical fibers) projected onto a CCD camera. The mea surement of an unknown wavelength can be achieved by comparison with a reference wavelength. Accurate interference phase maps can be calculated using spatial ph ase-shifting. In this way, each small group of contiguous pixels acts as a singl e interferometer, and the whole set of pixels corresponds to a massively paralle l interferometric measurement system (up to many hundreds of thousands units). T he major advantage of our method is its structural simplicity and the possibilit y of full optical integration. The final goal is to achieve a relative uncertain ty of the order of some 10-8 with a measurement duration of the order of some mi nutes. Preliminary results are presented. KW - Digital phase detection KW - Interferometry KW - Metrology KW - Spatial phase stepping KW - Wavelength measurement KW - Algorithms KW - Cameras KW - Charge coupled devices KW - Electromagnetic waves KW - Light propagation KW - Measurement theory KW - Phase shift KW - Vacuum

KW - Digital phase detection KW - Lambdameters KW - Spatial phase stepping KW - Wavelengh measurement KW - Interferometry A2 - Creath K. A2 - Schmit J. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 21 N1 - :doi 10.1117/12.556325 N1 - Correspondence Address: Fodor, J.; BNM-INM, 292 rue Saint-Martin, 75141 Pa ris cedex 03, France; email: jozsua.fodor@cnam.fr UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-15744370436&partnerID=4 0&md5=c3ba6a8c594a60cdf956fcf49a02a92b ER TY - CONF T1 - Interferometrical measurement of radii of local curvature in a conical sur face JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5622 IS - PART 2 SP - 663 EP - 668 PY - 2004/// AU - Solano, J.D.S. AU - Agustn, F.G. AU - Rodrguez, A.C. AD - Natl. Inst. Astrophys., Opt./E., A. P. 51 216, CP 72000, Puebla, Mexico AB - Xiang developed a method for the measurement of radii of curvature of opti cal surfaces greater than one meter, this method is used for spherical concaves and convexes surfaces, at the vertex; the error is of 0.1%[1]. In this work are carried out some innovations to the method of Xiang, for measurements of local r adius of curvature of conical concaves and convexes surfaces. Some results obtai ned are for a parabolic surface. KW - Interferometry KW - Metrology KW - Optical Testing KW - Angle measurement KW - Error analysis KW - Lenses KW - Light interference KW - Optical properties KW - Surface properties KW - Conical concaves KW - Optical surface KW - Paraxial radius KW - Spherical concaves KW - Interferometry A2 - Marcano O. A. A2 - Paz J.L. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 127 N1 - :doi 10.1117/12.591962 N1 - Correspondence Address: Solano, J.D.S.; Natl. Inst. Astrophys., Opt./E., A . P. 51 216, CP 72000, Puebla, Mexico; email: dsolano@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-17644372685&partnerID=4 0&md5=24c4958f9453ca2c18722a8929346947

ER TY - CONF T1 - Silicon quadrant detector in CMOS technology JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 5622 IS - PART 2 SP - 922 EP - 925 PY - 2004/// AU - Marquina, A.V. AU - Jcome, A.T. AD - Depto. de Invest. en Fsica, Universidad de Sonora, Apdo. Postal: 5-88, Hill o., Son., 83000, Mexico AD - Inst. Nac. Astrofis. Opt./Electron., Apdo. Postal 51, 216, Pue., 72000, Me xico AB - An optoelectronic device that detect visible light is designed in silicon technology, peaking in 650 nm wavelength. The quadrant detector (QD) derive phot ocurrents by projecting a light spot on four photodiodes placed close to each ot her on a silicon common substrate. The photodetector is square shaped with 2.25 mm per active area by each quadrant and the size of the device is 9mm 2. This wo rk describes a technology to develop position sensitive detectors of four quadra nt optimizing geometry to increase sensitivity. We propose to integrate sensor i nto complementary metal-oxide-semiconductor (CMOS) technology in order to improv e photodetector out signal, reducing noise generated when photodetector is so fa r from data acquisition system. KW - CMOS technology KW - Optoelectronic device KW - PSD KW - Data acquisition KW - Information analysis KW - Optical systems KW - Optoelectronic devices KW - Photodetectors KW - Photodiodes KW - Refractive index KW - Silicon KW - CMOS technology KW - Metrology systems KW - Quadrant detector (QD) KW - Silicon technology KW - CMOS integrated circuits A2 - Marcano O. A. A2 - Paz J.L. N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Art. No.: 175 N1 - :doi 10.1117/12.591669 N1 - Correspondence Address: Marquina, A.V.; Depto. de Invest. en Fsica, Univers idad de Sonora, Apdo. Postal: 5-88, Hillo., Son., 83000, Mexico; email: avera@gu aymas.uson.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-17644394155&partnerID=4 0&md5=7f961bef98306385bc1495bb8b57340a ER TY T1 gy JF - CONF - From pulsed laser vibrometer to optical doppler velocimeter: Laser metrolo using photo-EMF sensors - AIAA Paper

SP - 5320 EP - 5325 PY - 2004/// AU - Wang, C.-C. AU - Trivedi, S. AU - Jin, F. AU - Elliott, G. AU - Tse, S. AU - Rodriguez, P. AU - Stepanov, S. AU - Meyers, J.F. AU - Lee, J. AD - Brimrose Corp. of America, 7720 Belair Road, Baltimore, MD 21236, United S tates AD - Dept. Aeronautical Engineering, Univ. Illinois at Urbana-Champaign, Urbana , IL 61801, United States AD - Dept. Mechanical Engineering, Rutgers University, Piscataway, NJ 08854, Un ited States AD - Inst. Nac. Astrofis., Opt./Electron., Puebla, Mexico AD - MS 493, NASA Langley Research Center, Hampton, VA 23681, United States AB - Recent progresses in using photo-electromotive-force (photo-EMF) sensors f or a variety of laser metrological applications are discussed. We'll present an overview on the device physics for photo-EMF sensors and discuss recent experime ntal results on several fronts, including highly sensitive pulsed laser vibromet ers for surface vibration monitoring and laser ultrasonic diagnostics, interfero meter-less coherent optical distance range finder with sub-laser wavelength prec ision, as well as laser Doppler velocimetry studies on hard surfaces. KW - Optical doppler velocimeter KW - Photo-electromotive-force sensors KW - Pulsed laser vibrometers KW - Thermal evaporation KW - Doppler effect KW - Electric potential KW - Electrodes KW - Fast Fourier transforms KW - Image sensors KW - Interferometers KW - Laser beam effects KW - Optical frequency conversion KW - Photocurrents KW - Photodetectors KW - Photodiodes KW - Q switched lasers KW - Semiconductor devices KW - Stoichiometry KW - Pulsed laser applications N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Wang, C.-C.; Brimrose Corp. of America, 7720 Belai r Road, Baltimore, MD 21236, United States UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-2942716767&partnerID=40 &md5=69f0ef4a684e2414cc357cf8ede1e66d ER TY - JOUR T1 - Calculo del ngulo de desviacin en un pentaprisma, en funcin de los errores en los ngulos de 90 y 112.5 grados y el error piramidal JF - Revista Mexicana de Fisica VL - 50 IS - 2

SP - 99 EP - 106 PY - 2004/// AU - Jaramillo Nez, A. AU - Vera Marquina, A. AD - Inst. Natl. de Astrofis. Opt./E., Apartado Postal 51 y 216, Pue., Mxico, 72 000, Mexico AD - Departamento de Investigacon, Universidad de Sonora, Apartado Postal 5-88, Hillo., Son., Mxico, 83000, Mexico AB - An expression is derived showing the relationship between the errors in th e 90 and 112.5 degree angles of a pentaprism and the angle formed between entran ce and exit beams (angle of deviation). A relationship between the pyramidal err ors of each prism surface and the deviation of the exit beam from the plane defi ned by the entrance and ideal exit beams is also deduced. Finally, a method for constructing a pentaprism with a particular error making use of these derivation s is discussed. The fabricated pentaprism is used to characterize a coordinate m easuring machine of large dimensions. KW - Metrology KW - Optical geometric KW - Prismas N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Jaramillo Nez, A.; Inst. Natl. de Astrofis. Opt./E., Apartado Postal 51 y 216, Pue., Mxico, 72000, Mexico; email: ajaramil@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-2442555707&partnerID=40 &md5=9b0d5548fa4150a1a3c801eddc5719d3 ER TY - CONF T1 - Sensivity study in moir interferometry under spherical illumination JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 4829 I SP - 294 EP - 295 PY - 2003/// AU - Rodriguez-Vera, R. AU - Rayas, J.A. AU - Martnez, A. AD - Centro de Investigaciones en Optica, A.C. Apartado Postal 1-948, 37000 Leo n, Gto., Mexico AB - In the present work, a simple moir interferometer, which commoly is sensiti ve to in-plane displacement, is studied. In contrast to traditional in-plane moi r interferometric technique, we use two spherical wavefronts. This kind of illumi nation produces a sensitivity vector varying with the position. Therefore, it is capable of detecting in-plane and (a whitish) out-of-plane deformations due to the use of divergent beams. Uncertainty to each component of the displacement ve ctor is calculated and discussed. It is shown each component of the sensitivity vector, which should be examined in the stage of planning an interferometric mea surement experiment, have to minimize the required component uncertainty. This a nalysis is made for a flat and spherical object surface. Experimental results fo r the displacements of a rigid object are presented, which show the measured dis placement components with the highest sensitivity. KW - Interferometry KW - Moir KW - Optical metrology KW - Sensitivity vector KW - Spherical wave front illumination KW - Uncertainty measurement KW - Diffraction gratings KW - Light transmission

KW - Moire fringes KW - Optical variables measurement KW - Vectors KW - Wavefronts KW - Moir interferometry KW - Optical metrology KW - Sensitivity vectors KW - Spherical wave front illumination KW - Uncertainty measurement KW - Interferometry A2 - Righini G.C. A2 - Consortini A. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.524845 N1 - Correspondence Address: Rodriguez-Vera, R.; Centro de Investigaciones en O ptica, A.C. Apartado Postal 1-948, 37000 Leon, Gto., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-2342632516&partnerID=40 &md5=92908cafd754d6654bcd6e6474b6716c ER TY - JOUR T1 - Medicin del modulo de Young en el hule ltex usando ESPI JF - Revista Mexicana de Fisica VL - 49 IS - 6 SP - 555 EP - 564 PY - 2003/// AU - Rayas, J.A. AU - Rodrguez-Vera, R. AU - Martnez, A. AD - Ctr. de Invest. en ptica, Apartado Postal 1-948, 37150 Lon, Gto, Mexico AB - It is well know that the module of elasticity or Young's module relates th e stress to the strain that suffers a object, which is yielded to external loads . In this work we show the implementation of the Electronic Speckle Pattern Inte rferometry (ESPI) as a technique to measure deformations on a piece of latex whe n it is subjected to external loads. Along with the measurement of tension loads (by means of a digital dynamometer), we determine the Young's module of the obj ect under test. The value determined by using the ESPI technique is compared wit h that obtained in a device designed and constructed in our laboratory (which is equivalent to a commercial testing machine). It is demonstrated the veracity of the ESPI technique applied as an interferometric extensometer. KW - Elastic constants KW - Optical metrology KW - Speckle interferometry N1 - Cited By (since 1996):13 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Rayas, J.A.; Ctr. de Invest. en ptica, Apartado Pos tal 1-948, 37150 Lon, Gto, Mexico; email: jrayas@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0742271529&partnerID=40 &md5=e4ad6dfd0055a78371c7918b7799a61e ER TY T1 JF VL SP CONF Linearization schemes for Pockels cell light intensity modulators Proceedings of SPIE - The International Society for Optical Engineering 4829 II 928

EP - 929 PY - 2003/// AU - Garcia-Weidner, A. AU - Torres, C.T. AU - Khomenko, A.V. AU - Garcia-Zarate, M.A. AD - Ctro. Invest. Cie. Estud. S.E., Carretera Tijuana-Ensenada Km. 107, Ensena da Baja California, C.P. 22860, Mexico AB - We present two optoelectronic schemes that enhance the linearity of light intensity modulators based on the Pockels effect. The first scheme consists in a Sagnac interferometer which has an electro-optic modulator in the loop of the i nterferometer. The linearity is improved by feedback which uses part of the outp ut light intensity to generate an electrical signal that is directed to the Pock els cell. The second scheme consists of two Pockels cells placed between two pol arizers. The linearity is improved by properly choosing the orientation of the c rystal axes as well as the two DC bias-voltages applied to the cells. The theore tical and experimental analysis of the proposed schemes are presented. KW - Optical Communications KW - Optical Modulators KW - Optoelectronics and Photonics KW - Sensors and Metrology KW - Crystal orientation KW - Electricity KW - Electrooptical devices KW - Electrooptical effects KW - Feedback KW - Interferometers KW - Light amplifiers KW - Linearization KW - Measurements KW - Optical communication KW - Optoelectronic devices KW - Sensors KW - DC bias-voltage KW - Linearity KW - Pockels effect KW - Light modulators A2 - Righini G.C. A2 - Consortini A. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.530024 N1 - Correspondence Address: Garcia-Weidner, A.; Ctro. Invest. Cie. Estud. S.E. , Carretera Tijuana-Ensenada Km. 107, Ensenada Baja California, C.P. 22860, Mexi co; email: agarcia@cicese.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-2342507117&partnerID=40 &md5=b0d4e21075f2aad681e98466e9f7c8c6 ER TY T1 AM JF VL IS SP EP PY AU AU - JOUR - Case study of by-products of the Technical Cooperation between PTB and CEN PTB - Mitteilungen Forschen und Prufen 113 3 244 246 2003/// Nava-Jaimes, H. Echeverra-Villagmez, S.

AD - National Centre of Metrology, CENAM, Mxico, Mexico AD - CENAM, Mexico, Mexico AB - A case study of by-products of the Technical Cooperation between PTB and C ENAM is presented. The technical cooperation that CENAM received from other Nati onal Metrology Institutes, chiefly PTB, NIST and later NPL, is a key factor in t he establishment of the physical infrastructure and the training of scientific s taff. The torque standard developed by CENAM and PTB is used to provide traceabl e calibrations to industry. KW - Health KW - Personnel KW - Societies and institutions KW - Technical assistance KW - Environmental protection N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Nava-Jaimes, H.; National Centre of Metrology, CEN AM, Mxico, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0142216299&partnerID=40 &md5=97a22ff4f4c570418138078d4e2ed1cb ER TY - SER T1 - Traceable measurements in materials characterization JF - Key Engineering Materials VL - 243-244 SP - 165 EP - 170 PY - 2003/// AU - Mitani, Y. AD - Centro Nacional de Metrologia, Km 4,5, Carretera a los Cues, El Marques, Q ueretaro, Mexico AB - International standardization of the measurements has gained enormous impo rtance in the recent globalization of the market, due to the necessity of reduci ng the technical barriers to trade (TBT), in which conformity assessment by comp arable measurements among countries is one of the main issues in the free trade agreement. Some activities in establishing internationally acceptable traceabili ty measurements and comparability within the framework of BIPM-CIPM are describe d and mention is made on the Mutual Recognition Arrangement (MRA) among National Metrology Institutes. A national metrology infrastructure which supports commer ce and trade depends on the policy of each nation, but has been affected by the establishment of regional free trade blocks. The comparability of measurements a nd calibration among them can be obtained by the sound scientific and technologi cal principles which cover instrumentation, methodology and measurement standard s, including reference materials. KW - Materials Behavior KW - Measurement Standards KW - Test Methods KW - Traceability of Measurement KW - Globalization KW - Calibration KW - International trade KW - Materials testing KW - Systematic errors KW - Measurement theory A2 - Geni M. A2 - Kikuchi M. N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Mitani, Y.; Centro Nacional de Metrologia, Km 4,5,

Carretera a los Cues, El Marques, Queretaro, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0038578263&partnerID=40 &md5=415198eee03d01b8c2decd18a5bb87a3 ER TY - JOUR T1 - An international evaluation of holmium oxide solution reference materials for wavelength calibration, in molecular absorption spectrophotometry JF - Analytical Chemistry VL - 74 IS - 14 SP - 3408 EP - 3415 PY - 2002/// AU - Travis, J.C. AU - Zwinkels, J.C. AU - Mercader, F. AU - Ruz, A. AU - Early, E.A. AU - Smith, M.V. AU - Nol, M. AU - Maley, M. AU - Kramer, G.W. AU - Eckerle, K.L. AU - Duewer, D.L. AD - Chemical Science and Technology Laboratory, National Institute of Standard s and Technology, Gaithersburg, MD 20899-8394, United States AD - Institute of National Measurement Standards, National Research Council Can ada, Ottawa, ON K1A 0R6, Canada AD - Metals Division, Centro Nacional de Metrologa, 76900 Quertaro, Mexico AD - Optical and Radiometric Division, Centro Nacional de Metrologa, 76900 Querta ro, Mexico AD - Physics Laboratory, National Institute of Standards and Technology, Gaithe rsburg, MD 20899-8441, United States AB - Commercial spectrophotometers typically use absorption-based wavelength ca libration reference materials to provide wavelength accuracy for their applicati ons. Low-mass fractions of holmium oxide (Ho 2O 3) in dilute acidic aqueous solu tion and in glass matrixes have been favored for use as wavelength calibration m aterials on the basis of spectral coverage and absorption band shape. Both aqueo us and glass Ho 2O 3 reference materials are available commercially and through various National Metrology Institutes (NMIs). Three NMIs of the North American C ooperation in Metrology (NORAMET) have evaluated the performance of Ho 3+(aq)-ba sed Certified Reference Materials (CRMs) under "routine" operating conditions us ing commercial instrumentation. The study was not intended to intercompare natio nal wavelength scales but to demonstrate comparability of wavelength measurement s among the participants and between two versions of the CRMs. It was also desig ned to acquire data from a variety of spectrophotometers for use in a NIST study of wavelength assignment algorithms and to provide a basis for a possible reass essment of NIST-certified Ho 3+(aq) band locations. The resulting data show a su bstantial level of agreement among laboratories, instruments, CRM preparations, and peak-location algorithms. At the same time, it is demonstrated that the wave length comparability of the five participating instruments can actually be impro ved by calibrating all of the instruments to the consensus Ho 3+(aq) band locati ons. This finding supports the value of absorption-based wavelength standards fo r calibrating absorption spectrophotometers. Coupled with the demonstrated robus tness of the band position values with respect to preparation and measurement co nditions, it also supports the concept of extending the present approach to addi tional NMIs in order to certify properly prepared dilute acidic Ho 2O 3 solution as an intrinsic wavelength standard. KW - Wavelengths

KW - Algorithms KW - Solutions KW - Spectrophotometers KW - Holmium compounds KW - glass KW - holmium KW - oxide KW - acidity KW - algorithm KW - aqueous solution KW - article KW - calibration KW - instrumentation KW - laboratory KW - molecular absorption spectrophotometry KW - performance KW - spectrophotometer KW - spectrophotometry KW - spectrum KW - standard N1 - Cited By (since 1996):8 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1021/ac0255680 N1 - Correspondence Address: Duewer, D.L.; Chemical Science/Technol. Laboratory , Natl. Inst. of Standards/Technology, Gaithersburg, MD 20899-8394, United State s; email: David.Duewer@nist.gov UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0037099402&partnerID=40 &md5=135adf98d7886ef9939aa06b12f37350 ER TY - JOUR T1 - A parametric method applied to phase recovery from a fringe pattern based on a genetic algorithm JF - Optics Communications VL - 203 IS - 3-6 SP - 213 EP - 223 PY - 2002/// AU - Cuevas, F.J. AU - Sossa-Azuela, J.H. AU - Servin, M. AD - Centro De Investigaciones En ptica, A.C., Apdo. Postal 1-948, Len Gto., Mexi co AD - Centro De Investigacin En Computacin-IPN, Unidad Profesional Adolfo-Lpez Mate os, Av. J. de D. B. s/n and M. O. de Me., Zacatenco, Mxico, DF. 07738, Mexico AD - Centro De Investigaciones En ptica, A.C., Apdo. Postal 1-948, Len Gto., Mexi co AB - A paraetric method to carry out fringe pattern demodulation by means of a genetic algorithm is presented. The phase is approximated by the parametric esti mation of an nth-grade polynomial so that no further unwrapping is required. On the other hand, a different parametric function can be chosen according to the p rior knowledge of the phase behavior. A population of chromosomes is codified wi th the parameters of the function that estimates the phase. A fitness function i s established to evaluate the chromosomes, which considers: (a) the closeness be tween the observed fringes and the recovered fringes, (b) the phase smoothness, (c) the prior knowledge of the object as its shape and size. The population of c hromosomes evolves until a fitness average threshold is obtained. The method can demodulate noisy fringe patterns and even a one-image closed-fringe pattern suc

cessfully. 2002 Published by Elsevier Science B.V. KW - Fringe analysis KW - Genetic algorithms KW - Optical metrology KW - Phase retrieval KW - Chromosomes KW - Demodulation KW - Genetic algorithms KW - Image analysis KW - Parameter estimation KW - Fringe pattern demodulation KW - Light measurement N1 - Cited By (since 1996):29 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1016/S0030-4018(02)01132-X N1 - Correspondence Address: Cuevas, F.J.; Centro de Investigaciones en Optica, Apdo. Postal 1-948, Len Gto., Mexico; email: fjcuevas@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0037086635&partnerID=40 &md5=fc45d3aa2c852ac736a98e14a0af1b12 ER TY - CONF T1 - Coherence modulation with radial conical holograms JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 4659 SP - 189 EP - 196 PY - 2002/// AU - Olivares-Prez, A. AU - Gmez-Colin, M.R. AU - Pinto-Iguanero, B. AU - Snchez-Martnez, J.A. AU - Zamora-Lima, C. AD - Instituto Nacional de AOE, A.P. 51 y 216 C.P., 72840 Puebla, Pue., Mexico AB - We shown a technique to modulate source's spatial coherence, using conical beams, made with rings amplitude computer hologram. With these devices can be a pplied to modulate the spatial structure of the light from arbitrary source. In the present work, we design a computer amplitude hologram to produce as to first order a light distribution as ring with a spot in the center of the conical dis tribution, incrementing the spatial coherence. Because a ring light has more sma ll the airy disc than conventional pupil with similar diameter, Young interferom eter, we modeling by numerical process to obtain the visibility of the interfere nce pattern. This device open the possibility to make good collimator of white l ight. KW - Coherence KW - Gratings KW - Holography KW - Metrology KW - Computer generated holography KW - Diffraction gratings KW - Interferometers KW - Optical collimators KW - Radial conical holograms KW - Holograms A2 - Benton S.A. A2 - Stevenson S.H. A2 - Trout T.J. N1 - Export Date: 26 April 2013 N1 - Source: Scopus

N1 - :doi 10.1117/12.469266 N1 - Correspondence Address: Olivares-Prez, A.; Instituto Nacional de AOE, A.P. 51 y 216 C.P., 72840 Puebla, Pue., Mexico; email: olivares@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0036057090&partnerID=40 &md5=91fa75d02bfee722ff537b0d735804d1 ER TY - CONF T1 - Conical beams made with radial amplitude computer holograms JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 4659 SP - 148 EP - 155 PY - 2002/// AU - Gmez-Coln, M.R. AU - Olivares-Prez, A. AU - Pinto-Iguanero, B. AU - Ortiz-Gutirrez, M. AU - Prez-Cortez, M. AU - Jurez-Prez, J.L. AD - Instituto Nacional de AOE, A.P. 51 y 216 C.P., 72840 Puebla, Pue., Mexico AB - We propose a technique to produce conical beams, this effect is produced w hen a conventional beam laser through the radial amplitude computer hologram. Th e computer hologram can be design to produce as to first order a ring of light d istribution with a spot in the center our the screen, elliptical distribution or another conical distribution are designed and showed. With these computer holog rams can be applied to modulate the spatial structure of the light source. With the radial amplitude hologram is possible to produce different conical distribut ion, only with incorporate a phase term in the hologram function. KW - Coherence KW - Gratings KW - Holography KW - Metrology KW - Diffraction gratings KW - Interferometers KW - Laser beams KW - Light sources KW - Conical beams KW - Computer generated holography A2 - Benton S.A. A2 - Stevenson S.H. A2 - Trout T.J. N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.469261 N1 - Correspondence Address: Gmez-Coln, M.R.; Instituto Nacional de AOE, A.P. 51 y 216 C.P., 72840 Puebla, Pue., Mexico; email: rgomez@susu.inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0036055271&partnerID=40 &md5=d57220a33f4a54cf0315cca8a5202860 ER TY T1 r JF VL IS SP EP - CONF - Evaluation of object's roughness and spherical illumination in grating moi and speckle interferometry - Proceedings of SPIE - The International Society for Optical Engineering - 4900 - 2 - 730 - 738

PY - 2002/// AU - Rodriguez-Vera, R. AU - Martinez, A. AU - Puga, H.J. AU - Rayas, J.A. AD - Centro de Investigaciones en Optica,, Departamento de Metrologia Optica, A partado Postal 1-948, Len, Guanajuato, Mexico AB - The importance of shape and out-of-plane displacements as factors that int roduce error in the interpretation of a phase map obtained from a grating moire and in-plane ESPI interferometers, are evaluated. The analysis is done utilizing the uncertainty of the sensitivity vector varying as a position function on the surface under study. It is shown that the possible errors in the measurement fr om the ESPI and grating moire interferometers using non-collimated object illumi nation can be estimated before doing the measurement. KW - Moir interferometry KW - Non-destructive testing KW - Optical metrology KW - Sensitivity KW - Speckle interferometry KW - Diffraction gratings KW - Laser beams KW - Light interference KW - Measurement errors KW - Moire fringes KW - Nondestructive examination KW - Roughness measurement KW - Sensitivity analysis KW - Speckle KW - Vectors KW - Interference fringes KW - Moire grating technique KW - Sensitivity vector KW - Spekle interferometry KW - Interferometry A2 - Chugui Y.V. A2 - Bagayev S.N. A2 - Weckenmann A. A2 - Osanna P.H. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.484456 N1 - Correspondence Address: Rodriguez-Vera, R.; Centro de Investigaciones en O ptica,, Departamento de Metrologia Optica, Apartado Postal 1-948, Len, Guanajuato , Mexico; email: rarove@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0036452155&partnerID=40 &md5=344c514e0817cf0f4213cc92568fb5bb ER TY T1 JF VL SP EP PY AU AU AU AU AU CONF Real discontinuity preservation algorithm for ESPI fracture measuring Proceedings of SPIE - The International Society for Optical Engineering 4537 269 272 2001/// Rodriguez-Vera, R. Rayas, J.A. Marroquin, J.L. Rivera, M. Quiroga, J.A.

AD - Centro de Investigaciones en Optica, Apartado Postal 1-948, 37000 Leon, Gt o., Mexico AB - A well-founded and computationally fast method is presented for filtering and interpolating noisy and discontinuous wrapped phase fields that preserves bo th the 2 discontinuities that come from the wrapping effect and the true disconti nuities that may be present. It also permits the incorporation of an associated quality map, if it is available, in a natural way. Examples of its application t o the computation recovery of discontinuous phase fields from speckle interferom etry fracture measuring are presented. KW - Fracture measurement KW - Fringe analysis KW - Optical metrology KW - Regularization methods KW - Speckle interferometry KW - Algorithms KW - Computational methods KW - Fracture KW - Interpolation KW - Optical variables measurement KW - Piecewise linear techniques KW - Fringe analysis KW - Optical metrology KW - Speckle interferometry KW - Wrapping effect KW - Interferometry N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.468840 N1 - Correspondence Address: Rodriguez-Vera, R.; Centro de Investigaciones en O ptica, Apartado Postal 1-948, 37000 Leon, Gto., Mexico; email: rarove@cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035553995&partnerID=40 &md5=61d555dd1e03d7c03beb7820358a4aa8 ER TY - CONF T1 - Double exposure specklegrams obtained by using scaled aperture pupils JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 4419 SP - 186 EP - 189 PY - 2001/// AU - Angel, L. AU - Tebaldi, M. AU - Trivi, M. AU - Bolognini, N. AD - Departamento de Ciencias Basicas, Universidad EAFIT, Medelln, Colombia AB - In speckle photography the pupil aperture is usually not modified between exposures. In our work, the change of the pupil aperture scale between exposures is analysed on the basis of double-exposed image speckle, before and after a di ffuser inplane displacement is done. The apertures have the same shape but its s cale is modified between exposures. Note that the relative position of the apert ure is maintained. In particular, we analyse a simple case that uses a circular aperture whose diameter is modified for recording each image. The intensities in the image plane and the fringe visibility are evaluated, in terms of the geomet ric characteristics of the pupils. KW - Interferometry KW - Metrology KW - Speckle KW - Coherent light KW - Computer simulation

KW - Image analysis KW - Image recording KW - Interferometry KW - Laser beams KW - Photography KW - Speckle photography KW - Speckle A2 - Kaufmann G.H. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.437233 N1 - Correspondence Address: Angel, L.; Departamento de Ciencias Basicas, Unive rsidad EAFIT, Medelln, Colombia UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035759984&partnerID=40 &md5=637d0ca239704ce46b7a049ab4c1bdb2 ER TY - CONF T1 - Shearing interferometry to analyse two-dimensional fractal gratings JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 4419 SP - 273 EP - 276 PY - 2001/// AU - Ramrez Zabaleta, G. AU - Tepichn Rodrguez, E. AU - Lehman, M. AU - Garavaglia, M. AD - INAOE, L.E. Erro 1, Tonantzintla, Puebla, Mexico AB - In this work, the changes in the self-similar function for a grating under possible structural changes are investigated using the shearing interferometry method. Such changes can be: deformations, introduction of random perturbations or changes in the fractal dimension. The results obtained have applications to r elate such changes with the corresponding fractal parameters, which can be exten ded for the case of rough surfaces. KW - Fractal gratings KW - Interferometry KW - Metrology KW - Shearing KW - Amplification KW - Deformation KW - Diffraction gratings KW - Fractals KW - Light interference KW - Optical systems KW - Perturbation techniques KW - Surface roughness KW - Fractal gratings KW - Interferometry A2 - Kaufmann G.H. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.437122 N1 - Correspondence Address: Lehman, M.; INAOE, L.E. Erro 1, Tonantzintla, Pueb la, Mexico; email: mlehman@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035759252&partnerID=40 &md5=7020607ad6a79b6865e6d5ef1ea9552a ER TY - JOUR

T1 - Matched spatial-phase-shifting for the temporal-phase-unwrapping in electr onic speckle pattern interferometry JF - Optik (Jena) VL - 112 IS - 11 SP - 515 EP - 520 PY - 2001/// AU - Martnez-Celorio, R.A. AU - Dvila, A. AU - Barrientos, B. AU - Puga, J.H. AU - Lpez, L.M. AD - Centro De Investigaciones En Optica, AC, Apdo 1-948, C.P. 37 000 Len, Gto, Mexico AB - A synchronous combination spatial-carrier phase-shifting and temporal-phas e-unwrapping techniques is proposed to reduce the frame acquisition time of the standard temporal phase unwrapping used in electronic speckle pattern interferom etry. The proposed technique is robust against problems associated with the temp oral phase shifting method, such as nonlinear phase shift and noise. The method allows us to extend the displacement measurement range and to reduce the process ing time of the temporal phase un-wrapper by a factor of 4. KW - Optical metrology KW - Spatial-carrier phase-shift KW - Speckle interferometry KW - Temporal phase unwrapping KW - Correlation methods KW - Deformation KW - Phase measurement KW - Phase shift KW - Plates (structural components) KW - Speckle KW - Electronic speckle pattern interferometry (ESPI) KW - Interferometry N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Martnez-Celorio, R.A.; Centro de Investigaciones en Optica, AC, Apdo 1-948, C.P. 37000 Len, Gto, Mexico; email: rcelorio@foton.cio.m x UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035680317&partnerID=40 &md5=61466f5ae411434d2008af6e5c87ba2b ER TY - CONF T1 - Spatial phase-stepping using a computer-generated diffractive optical elem ent JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 4420 SP - 162 EP - 173 PY - 2001/// AU - Rodriguez-Vera, R. AU - Barrientos, B. AU - Moore, A.J. AD - Centro de Invest. en Optica, A.C., Apartado Postal 1-948, 37000 Len, Gto., Mexico AB - A computer-generated diffractive optical element (DOE) is used in electron ic speckle pattern interferometry (ESPI). This DOE is applied to calculate the i nterference phase corresponding to object deformation from a single TV frame. Th

e system is utilized for static and transient deformation measurement with CW an d pulse Nd:YAG lasers, respectively. The DOE is a modified phase computer genera ted hologram or cross grating. For transient deformation measurements the DEO do es not need to be translated in order to introduce the phase change between diff racted fields. Thus, spatial phase-stepping becomes, feasible and high-speed fra me acquisitions do not limit real-time phase measurements. Experimental results for spatial phase-stepping with and without moving the DOE are given. KW - ESPI KW - Fringe analysis KW - Pulse lasers KW - Spatial phase-stepping KW - Speckle metrology KW - Transient deformation KW - Computer generated holography KW - Continuous wave lasers KW - Laser pulses KW - Light interference KW - Neodymium lasers KW - Phase measurement KW - Speckle KW - Video cameras KW - Electronic speckle pattern interferometry (ESPI) KW - Interferometry A2 - Albertazzi, Jr. A. N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.439207 N1 - Correspondence Address: Rodriguez-Vera, R.; Centro de Invest. en Optica, A .C., Apartado Postal 1-948, 37000 Len, Gto., Mexico; email: rarove@foton.cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035760110&partnerID=40 &md5=ad98de428eafbb45b518b66a358ac0d1 ER TY - JOUR T1 - Biological and environmental reference materials in CENAM JF - Analytical and Bioanalytical Chemistry VL - 370 IS - 2-3 SP - 156 EP - 159 PY - 2001/// AU - Arvizu-Torres, R. AU - Perez-Castorena, A. AU - Salas-Tellez, J.A. AU - Mitani-Nakanishi, Y. AD - Centro Nacional de Metrologa, km 4,5 Carretera a los Cues, El Marquez, Quert aro, Mexico AB - Since 1994, when the NIST/NOAA Quality Assurance Program in Chemical Measu rements was discussed in Queretaro, CENAM, the National Measurement Institute (N MI) of Mexico, has become involved in the development of reference materials. In the field of biological and environmental reference materials, in particular, t he NORAMET collaboration program with NIST and NRC, and the North-American Envir onmental Cooperation signed among three free-trade treaty organizations, have gr eatly helped the development of the materials metrology program in the newly est ablished CENAM. This paper describes some particularly significant efforts of CE NAM in the development of biological and environmental reference materials, on t he basis of intercomparison studies organized with local and governmental enviro nmental agencies of Mexico. In the field of water pollution CENAM has developed a practical proficiency testing (PT) scheme for field laboratories, as a part of

registration by local government in the metropolitan area, according to the Mex ican Ecological Regulation. The results from these eight PTs in the last 5 years have demonstrated that this scheme has helped ensure the reliability of analyti cal capability of more than 50 field laboratories in three states, Mexico, D.F., and the States of Mexico and Queretaro. Similar experience has been obtained fo r more than 70 service units of stack emission measurements in the three states in 1998 and 1999, as a result of the design of a PT scheme for reference gas mix tures. This PT scheme has been accomplished successfully by 30 analytical labora tories who provide monitoring services and perform research on toxic substances (Hg, methylmercury, PCB, etc.) in Mexico. To support these activities, reference samples have been produced through the NIST SRMs, and efforts have been made to increase CENAM's capability in the preparation of primary reference materials i n spectrometric solutions and gas mixtures. Collaboration among NMIs has also su ccessfully overcome the inability of CENAM to prepare biological tissue for merc ury assessment and marine sediments for analysis of trace metals. The importance of international collaboration is stressed not only in the NORAMET region but a lso in the SIM, to provide help for each other and achieve mutual recognition am ong member countries of the region. Springer-Verlag 2001. KW - chemistry KW - conference paper KW - environmental monitoring KW - international cooperation KW - methodology KW - Mexico KW - pollutant KW - standard KW - Chemistry, Analytical KW - Environmental Monitoring KW - Environmental Pollutants KW - International Cooperation KW - Mexico KW - Reference Standards N1 - Cited By (since 1996):5 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Arvizu-Torres, R.; Centro Nacional de Metrologa, km 4,5 Carretera a los Cues, El Marquez, Quertaro, Mexico; email: ymitani@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0034932151&partnerID=40 &md5=ab99bcb2f690960b4b31065ca9303d05 ER TY - JOUR T1 - Mapping correlation algorithm as interface between experimental optical te chnique and computer modeling for the study of mechanical structures JF - Optical Engineering VL - 40 IS - 8 SP - 1598 EP - 1607 PY - 2001/// AU - Puga, H.J. AU - Rodriguez-Vera, R. AU - Botello, S. AD - Centro de Investigaciones en Optica, Departmento de Metrologia Optica, Apa rtado Postal 1-948, 37000 Len, Gto, Mexico AB - To create a hybrid system applied to mechanical structure analysis link to experimental optical techniques (EOTs) and computer modeling (CM), the correlat ion problem between CM and EOT methods must be solved. A mapping correlation alg orithm (MCA) is proposed as the interface between both techniques. Out-of-plane electronic speckle pattern interferometry (ESPI) as the experimental optical tec

hnique and a commercial finite element method (FEM) package are employed. The MC A proposed is based on a set of mapping functions, which are found by least-squa res algorithms and enable the compensation of image distortions produced by the experimental optical setup. The algorithm was tested initially on a simple 2-D s tructure and two 3-D complex mechanical structures. Results are reported. Furthe r, the MCA algorithm linking ESPI-FEM methods is applied to out-of-plane displac ements over a rectangular plate under stress. Numerical and experimental results along with their error analysis are also presented. 2001 Society of Photo-Optic al Instumentation Engineers. KW - Electronic speckle pattern interferometry KW - Finite element method KW - Interface KW - Linear function KW - Numerical modeling KW - Optical metrology KW - Algorithms KW - Error analysis KW - Finite element method KW - Interferometry KW - Least squares approximations KW - Mapping KW - Speckle KW - Mapping correlation algorithms (MCA) KW - Optical systems N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/1.1387993 N1 - Correspondence Address: Puga, H.J.; Centro de Investigaciones en Optica, D epartmento de Metrologia Optica, Apartado Postal 1-948, 37000 Len, Gto, Mexico; e mail: pugajose@foton.cio.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035414778&partnerID=40 &md5=b4645cdb278c3afb48445e023e531ca7 ER TY T1 JF VL IS SP EP PY AU AU AU AU AU AU AU AU AU AU AU AU AU AU AU AU AU JOUR An international comparison of 50/60 Hz power (1996-1999) IEEE Transactions on Instrumentation and Measurement 50 2 356 360 2001/// Oldham, N. Nelson, T. Bergeest, R. Ramm, G. Carranza, R. Corney, A.C. Gibbes, M. Kyriazis, G. Laiz, H.M. Liu, L.X. Lu, Z. Pogliano, U. Rydler, K.-E. Shapiro, E. So, E. Temba, M. Wright, P.

AD - IEEE AD - Electricity Division, Electronics and Electrical Engineering Laboratory, N ational Institute of Standards and Technology, Gaithersburg, MD 20899, United St ates AD - Physikalisch-Technische Bundesanstalt, 3816 Braunschweig, Germany AD - Centro Nacional de Metrologia (CENAM), Queretaro 76900, Mexico AD - Measurement Standards Laboratory of New Zealand, Industrial Research Limit ed, Lower Hutt, New Zealand AD - National Measurement Laboratory, CSIRO, Lindfield, NSW 2070, Australia AD - INMETRO, National Institute of Metrology, Rio de Janeiro 25250-020, Brazil AD - Instituto Nacional de Tecnologa Industrial (INTI), San Martin 1650, Argenti na AD - National Measurement Centre, Singapore Productivity and Standards Board, S ingapore AD - Measurement Standards Laboratory of New Zealand, Industrial Research, Lowe r Hutt, New Zealand AD - National Institute of Metrology (NIM), Beijing 100 013, China AD - Istituto Elettrotecnico Nazionale Galileo Ferraris (IEN), 10135 Torino, It aly AD - SP Swedish National Testing and Research Institute, SE-501 15 Bors, Sweden AD - D. I. Mendeleyev Institute for Metrology, St. Petersburg, 198 005, Russian Federation AD - Institute for National Measurement Standards, National Research Council (N RC) Canada, Ottawa, Ont. K1A 0R6, Canada AD - National Metrology Laboratory, CSIR, Pretoria 0001, South Africa AD - National Physical Laboratory (NPL), Teddington, Middlesex TW11 0LW, United Kingdom AB - An international comparison of 50/60 Hz power is described. The traveling standard was an electronic power transducer that was tested at 120 V, 5 A, 53 Hz , at five power factors (1.0, 0.5, and 0.0). Fifteen National Metrology Institut es (NMIs) from six metrology regions participated in the comparison. KW - Electronic equipment testing KW - Standards KW - Transducers KW - Electronic power transducer KW - Traveling standard KW - Electric power measurement N1 - Cited By (since 1996):10 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1109/19.918141 N1 - Correspondence Address: Oldham, N.; Electricity Division, Electronics and Elec. Eng. Lab., Nat. Inst. of Std. and Technol., Gaithersburg, MD 20899, United States UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035306835&partnerID=40 &md5=c3d6cf3be2f79cb0078e07ffd6d9df5a ER TY - JOUR T1 - MESURA 2000: A strategy to integrate a true communication network of metro logy experts with process technology experts JF - Accreditation and Quality Assurance VL - 6 IS - 2 SP - 80 EP - 84 PY - 2001/// AU - Echeverra-Villagmez, S. AU - Mitani-Nakanishi, Y. AU - Nava-Jaimes, H.

AD - Centro Nacional de Metrologa, Col. Centro, Mxico Apdo. Postal 1-100, Quertaro , Qro., 76000, Mexico AB - The Centro Nacional de Metrologa (CENAM) has developed the MESURA Interinst itutional Network in collaboration with other research and development institute s in Mexico. This network has the aim of providing integral metrological service s to industry throughout the country, with uniform standards of quality and cons istency. The fulfillment of this aim has been possible because of a number of fa ctors that have made the MESURA Program an attractor for the integration of metr ological services. Among these factors are: an unswerving focus on the customer needs, an integral and logical problem solving approach to consultancy, adequate modular classification of the consultants functions, clear-cut definition of th e functions of each member of interdisciplinary groups, and a uniform code of co mmunication among the members of the network. The next stage of the strategy is to strengthen the link between metrology and its industrial applications forming a new type of consultant with the technical experts from R&D Centers. These wil l be consultants with general knowledge and experience in metrology, specialized in certain type of industrial processes and products. The strategy will be init iated in the year 2000 and with it the MESURA Network is expected to make a stro ng contribution to fostering the optimum use of metrology in industry and to act as a channel for the integration of other technologies in which the participati ng Centers have expertise. KW - Consultancy KW - Integral metrological services KW - Metrology KW - Quality assurance KW - Technology administration N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1007/s007690000229 N1 - Correspondence Address: Echeverra-Villagmez, S.; Centro Nacional de Metrologa , Col. Centro, Mxico Apdo. Postal 1-100, Quertaro, Qro., 76000, Mexico; email: sal eche@cenam.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035242096&partnerID=40 &md5=2454649aa39964f91b9d39a5157e63fd ER TY - CONF T1 - Micro-displacement measurements with holographic gratings JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 4296 SP - 108 EP - 115 PY - 2001/// AU - Gmez-Coln, M.R. AU - Olivares-Prez, A. AU - Snchez-Villicaa, V. AD - Inst. Nacional de Astrofisica Optica, A.P. 51 y 216 C.P., 72840 Puebla, Pu e., Mexico AB - Nowadays micro-displacement systems are quite common. In this work we prop ose a new technique to measure micro displacements using high frequency holograp hic gratings. In this technique the grating is place on the object carrying out the micro displacement. The small displacements are measured by counting the num ber of displace fringes of an amplified grating image as the micro-displacement takes place. The main advantage of the system we have designed is the accuracy o f its measurements, which can easily be adjusted by changes in the grating frequ ency. KW - Gratings KW - Holography KW - Metrology KW - Amplification

KW - Diffraction gratings KW - Light interference KW - Optical sensors KW - Optoelectronic devices KW - Photodetectors KW - Photodiodes KW - Refractive index KW - Spatial variables measurement KW - Holographic gratings KW - Micro-displacement measurements KW - Optical encoder KW - Holography A2 - Benton S.A. A2 - Stevenson S.H. A2 - Trout T.J. N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.429448 N1 - Correspondence Address: Gmez-Coln, M.R.; Inst. Nacional de Astrofisica Optic a, A.P. 51 y 216 C.P., 72840 Puebla, Pue., Mexico; email: rgomez@susu.inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0034868589&partnerID=40 &md5=4aa6dea2a405c7fdbffce7362623360a ER TY - CONF T1 - Reinforcing a telephone synchrony network in Mexico using the GPS common-v iew technique JF - CPEM Digest (Conference on Precision Electromagnetic Measurements) SP - 80 EP - 81 PY - 2000/// AU - Molina, Victoria AU - Lopez, J.Mauricio AU - Jardon, Hildeberto AD - Centro Nacional de Metrologia, Queretaro, Mexico AB - In this paper we show how the Common View (CV) Technique, a simple but pow erful tool, was the better solution for TELMEX, the largest telephone company in Mexico, to improve its synchrony network in order to give a better and reliable telephonic public services. The CV links, between the main telephone centrals a nd the National Metrology Center in Mexico, CENAM supports and strengthens this synchrony network. Experimental results of the electromagnetic environment studi es and those obtained from the receiver's calibration, at TELMEX stations are re ported. KW - Calibration KW - Electromagnetic field effects KW - Frequency stability KW - Global positioning system KW - Networks (circuits) KW - Reinforcement KW - Signal receivers KW - Time measurement KW - Telephone synchrony networks KW - Telephone systems PB - IEEE CP - Piscataway, NJ, United States N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Molina, Victoria; Centro Nacional de Metrologia, Q ueretaro, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0033696792&partnerID=40

&md5=f2244b0fe17c8374658cf141dad2766d ER TY - JOUR T1 - Optical processing by fringed speckles registered in a BSO crystal JF - Optical Engineering VL - 39 IS - 12 SP - 3232 EP - 3238 PY - 2000/// AU - Tebaldi, M. AU - Toro, L.A. AU - Trivi, M. AU - Bolognini, N. AD - Ctro. de Invest. pticas CIOp, OPTIMO Dpto. de Fisicomatematica, Facultad de Ingeniera, UNLP Casilla de Correo 124, 1900, La Plata, Argentina AD - Universidad EAFIT, Medelln, Colombia AB - An alternative image multiplexing technique, employing a multiple-aperture pupil for each exposure, is presented. The aperture arrangement of the pupil is modified between exposures. A thick photo-refractive BSO crystal is used as rec ording material. The technique allows concentrating the spectral components of a pair of images selectively into isolated spots in the Fourier plane. Two applic ations are proposed, in image processing and optical metrology. KW - Crystals KW - Photorefractive materials KW - Speckle KW - Fringe speckle KW - Holography N1 - Cited By (since 1996):13 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/1.1327496 N1 - Correspondence Address: Tebaldi, Myrian; UNLP Casilla de Correo, La Plata, Argentina UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0034427694&partnerID=40 &md5=8ebe5b510901485fc6b9094b621762c4 ER TY - JOUR T1 - Cryogenic radiometer facility of the CENAM and first international compari son JF - Metrologia VL - 37 IS - 4 SP - 269 EP - 271 PY - 2000/// AU - Stock, K.D. AU - Hofer, H. AU - Surez Romero, J.G. AU - Gonzlez Galvn, L.P. AU - Schmid, W. AD - Phys.-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany AD - Ctro. Natl. de Metrologia (CENAM), Km 4.5 Carretera a Los Cus, Marques, CP 76900, Queretaro, Mexico AB - A new modern cryogenic radiometer facility has recently been installed at the Centro National de Metrologia (CENAM), Queretaro, Mexico. The radiometer hea d is a CryoRad II (CRI Inc., Boston, USA). In a specially designed laboratory wi

th clean-room atmosphere, the facility is now ready for calibrations of detector s with power-stabilized laser radiation. This cryogenic radiometer facility will be the basis for most of the radiometric and photometric calibrations of the CE NAM. A first radiometric comparison between the CENAM and the Physikalisch-Techn ische Bundesanstalt (PTB), Germany, was carried out with trap detectors at the H e-Ne laser wavelength of 632.8 nm. Two reflection trap detectors, each with thre e photodiodes, were used: one with 10 mm10 mm and the other with 18 mm18 mm Si pho todiodes. The results were very encouraging. At power levels of about 100 W the c alibrations showed a relative difference of 710-5 or even less. The PTB calibrati ons are based on a modified LaseRad II (CRI) radiometer that has been compared w ith cryogenic radiometers of other types and from other national metrology insti tutes. KW - Calibration KW - Clean rooms KW - Cryogenic equipment KW - Helium neon lasers KW - Laser beam effects KW - Photodiodes KW - Silicon sensors KW - Cryogenic radiometers KW - Radiometers PB - Bur Int des Poids et Mes CP - Singapore, Singapore N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1088/0026-1394/37/4/1 N1 - Correspondence Address: Stock, K.D.; Physikalisch-Technische, Bundesanstal t, Braunschweig, Germany UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0034505843&partnerID=40 &md5=6e81777d0990e907062ea0b1bc9287a6 ER TY - JOUR T1 - Tcnica de moteado para medicin de fracturas en estructuras metlicas JF - Revista Mexicana de Fisica VL - 46 IS - 5 SP - 468 EP - 477 PY - 2000/// AU - Alcal Ochoa, N. AU - Rodriguez-Vera, R. AU - Barrientos, B. AD - Centro de Investigaciones en ptica, A.C., Apartado postal 1-948, 37000 Len, Gto., Mexico AB - When a rough object is illuminated by coherent light, the scattered light produces a random speckle effect or luminous twinkling. This effect can be used as an optical non-destructive test for detecting and measuring surface deformati ons. This technique is based on holographic interferometry, where CCD cameras ar e used as recording mean. For this reason the technique becomes an opto-electron ic one. Thus, a fringe pattern that appears by overlapping two wavefronts coming from the object under study, before and after its deformation, is digitally rec orded. This image is computer processed to interpret the deformations suffered b y the object. As a result one can study, in full field, an object under differen t load conditions, with no necessity of being in contact. The present work shows the potential of the speckle techniques, extending its application towards the detection and measurement of fractures in different metallic objects. Speckle te chniques are theoretically described and experimental results of a fracture meas urements in a metallic plate under mechanical load are shown.

KW - Fracture mechanics KW - Optical metrology KW - Speckle interferometer N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Alcal Ochoa, N.; Centro de Investigaciones en ptica, A.C., Apartado postal 1-948, 37000 Len, Gto., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-20644459930&partnerID=4 0&md5=859a4e467e19302e4f4d5403fed1bedb ER TY - JOUR T1 - Direct object shape detection based on skeleton extraction of a light line JF - Optical Engineering VL - 39 IS - 9 SP - 2463 EP - 2471 PY - 2000/// AU - Apolinar Muoz-Rodriguez, J. AU - Rodriguez-Vera, R. AU - Servin, M. AD - Ctro. de Invest. en Optica A.C., Depto. de Metrologa Optica, Apartado Posta l 1-948, Lon, GTO, 37000, Mexico AB - A simple, fast and accurate light line technique for direct detection of 3 -D shape is presented. This technique is proved by simulation and experimentally verified. To obtain the surface shape, the object is moved along an axis with a n electromechanical device and scanned by a projected light line. Based on the m easurement of displacement that suffers the projected line on the surface, objec t high data is obtained. Light line displacement is acquired by determining the precise position of its maximum on the object's surface and is compared with tha t projected on a reference plane. The described method has the advantages over c onventional fringe pattern contouring that it is not necessary to design softwar e to obtain the fringe phase and a phase-unwrapping step does not have to be app lied. Another advantage is processing time, because the maximum is extracted usi ng an efficient algorithm to fit a concave function with the light line intensit y profile. The technique is quite skilled, robust, and highly accurate, and it c an obtain the form of an object with complicated surfaces even with difficult de tails such as occlusions and discontinuities. Line light displacement can be obt ained with resolution of fraction of a pixel, and a surface height accuracy up t o 0.001 mm can be obtained. KW - Algorithms KW - Cameras KW - Charge coupled devices KW - Computer simulation KW - Electromechanical devices KW - Optical resolving power KW - Polynomials KW - Semiconductor lasers KW - Spatial variables measurement KW - Three dimensional KW - Light line displacement KW - Optical metrology KW - Peak detection methods KW - Skeleton extraction KW - Triangulation method KW - Imaging techniques PB - Society of Photo-Optical Instrumentation Engineers CP - Bellingham, WA, United States

N1 - Cited By (since 1996):15 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/1.1287931 N1 - Correspondence Address: Munoz-Rodriguez, J.Apolinar; Centro de Investigaci ones en Optica, A.C., Leon, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0342955652&partnerID=40 &md5=b4b3bc20ce24a57669fc9d72157ef74b ER TY - JOUR T1 - Spatial phase-stepped interferometry using a holographic optical element JF - Optical Engineering VL - 38 IS - 12 SP - 2069 EP - 2074 PY - 1999/// AU - Barrientos Garca, B. AU - Moore, A.J. AU - Prez-Lpez, C. AU - Wang, L. AU - Tschudi, T. AD - Centro de Investigaciones en Optica, Apdo. Postal 1-948, Leon, Gto., Mexic o AD - Heriot-Watt University, Department of Physics, Edinburgh, EH14 4AS, United Kingdom AD - Institute of Applied Physics, Hochschulstrasse 6, Darmstadt, D-64289, Germ any AB - We describe two new techniques for spatial phase stepping using a computer -generated holographic optical element (HOE). The techniques are implemented wit h electronic speckle pattern interferometry, although they could be applied to o ther optical metrology methods. The first technique uses an HOE that introduces a known phase step between the 1 diffracted orders, without being translated. The interference phase corresponding to object deformation can be calculated from a single TV frame, and the technique is therefore suitable for the measurement of transient deformations. We apply the technique to measure the phase changes cau sed by refractive index variations in an evolving thermal plume. The second tech nique requires the HOE to be used in conjunction with a phase grating. In this t echnique, the HOE and the phase grating are used sequentially for the two exposu res required in speckle interferometry (made before and after object deformation ) and is therefore suitable for making dynamic deformation measurements with a d ouble-pulsed interferometer. A root mean square (rms) precision of 2/20 rad for t he phase measurements is obtained. KW - Computer generated holography KW - Diffraction gratings KW - Optical materials KW - Refractive index KW - Speckle KW - Spatial phase-stepped interferometry KW - Transient deformation measurement KW - Holographic interferometry PB - SPIE CP - Bellingham, WA, United States N1 - Cited By (since 1996):21 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/1.602313 N1 - Correspondence Address: Garcia, Bernardino Barrientos; Centro de Investiga ciones en Optica, Leon, Mexico

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0342526644&partnerID=40 &md5=426915c5163ec2e956b02a01efba8e72 ER TY - JOUR T1 - NORAMET comparison of gauge block measurement by optical interferometry JF - Metrologia VL - 36 IS - 5 SP - 421 EP - 432 PY - 1999/// AU - Decker, J.E. AU - Lapointe, A. AU - Stoup, J. AU - Viliesid Alonso, M. AU - Pekelsky, J.R. AD - Natl. Res. Council of Canada (NRC), 207 M-36 Montreal Road Campus, Ottawa, Ont. K1A 0R6, Canada AD - Natl. Inst. of Std. and Technology, Gaithersburg, MD, United States AD - Ctro. Nacional de Metrologia (CENAM), Quertaro, Mexico AB - A varied assortment of forty-seven new and used steel, ceramic, chromium c arbide and tungsten carbide gauge blocks from nine manufacturers, ranging in len gth from 0.5 mm to 101.6 mm, were calibrated by four laboratories from the NORAM ET countries using the method of optical interferometry. Measurements of central length of the gauge blocks are compared. The data are utilized as a test bed to illustrate the outcome of two different techniques with potential for applicati on in comparisons of the calibration services of national metrology institutes ( NMIs). KW - Central length KW - Chromium carbide KW - Gauge block measurement KW - Ceramic materials KW - Chromium compounds KW - Interferometry KW - Laboratories KW - Spatial variables measurement KW - Steel KW - Tungsten carbide KW - Calibration N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1088/0026-1394/36/5/4 N1 - Correspondence Address: Decker, J.E.; Natl Research Council of Canada, (NR C), Ottawa, Canada UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0033327416&partnerID=40 &md5=971f0da1640629f381355035a4efb3ef ER TY - JOUR T1 - Medicin de la longitud focal de una lente con el patrn de difraccin de una ab ertura y una cmara CCD JF - Revista Mexicana de Fisica VL - 45 IS - 4 SP - 351 EP - 354 PY - 1999/// AU - Pino Mota, E.

AU - Robledo Snchez, C.I. AD - Facultad de Ciencias Fsico Matemticas, Universidad Autnoma de Puebla, Apartad o postal 1152, 72000 Puebla, Pue., Mexico AB - When the analytical solution for the Fraunhofer diffraction of an aperture is known, it is possible to use that expression to solve some metrological prob lems. In this work, we obtain theorically and experimentally the effective focal lenght of a binconvex lens; errors and accuracy in this method are discussed. KW - Effective focal lenght KW - Fraunhofer diffraction KW - Metrology N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Pino Mota, E.; Facultad de Ciencias Fsico Matemticas , Universidad Autnoma de Puebla, Apartado postal 1152, 72000 Puebla, Pue., Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0033454950&partnerID=40 &md5=ed5aee72fa3892935895c3c024dd8923 ER TY - JOUR T1 - Optics at Universidad Industrial de Santander JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 3572 SP - 584 EP - 587 PY - 1999/// AU - Gualdron, Oscar AU - Lasprilla, Maria del C. AU - Meneses, Jaime E. AU - Plata, Arturo AU - Salazar, L.Rene AU - Salcedo, Jaime S. AU - Torres, Yezid AD - Universidad Industrial de Santander, Bucaramanga, Colombia AB - This communication introduces the Optics and Signal Processing Group from Universidad Industrial de Santander at Bucaramanga, Colombia. First, a brief des cription of how the group was formed, its strategic importance and also some of its more important achievements are presented. Then, the main scientific domains where the group carries out its research are described and finally, some guidel ines about future research work in the group are given. KW - Photorefractive materials KW - Signal processing KW - Optics metrology KW - Optics PB - Society of Photo-Optical Instrumentation Engineers CP - Bellingham, WA, United States N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Gualdron, Oscar; Universidad Industrial de Santand er, Bucaramanga, Colombia UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0032674073&partnerID=40 &md5=4eb666d04990a69b93bffdbb11e85b52 ER TY - CONF T1 - Double-pulsed-carrier speckle-shearing pattern interferometry for transien t deformation analysis JF - Proceedings of SPIE - The International Society for Optical Engineering VL - 3478 SP - 352 EP - 358

PY - 1998/// AU - Fernndez, A. AU - Doval, A.F. AU - Dvila, A. AU - Blanco-Garca, J. AU - Prez-Lpez, C. AU - Fernndez, J.L. AD - Universidade de Vigo, Departamento de Fsica Aplicada, ETSEIM, Lagoas-Marcos ende, 9, E-36200 Vigo, Spain AD - Centro de Investigaciones en ptica, A. C., Apartado Postal 1-948, 37150 LenGto, Mexico AB - We report on a novel technique for the evaluation of transient phase in do uble-pulsed electronic speckle-shearing pattern interferometry. Our technique re quires the acquisition of just two speckle-shear interferograms (one before and one after object's deformation) which are correlated by subtraction to obtain a fringe pattern. A spatial carrier is generated by means of an original optical s etup based on the separation and later recombination of the two beams produced b y a Nd:YAG twin pulsed laser. One introduces an optical path difference in the c urvature radii of the illumination beams by mismatching the distances from two d iverging lenses to a beam combiner. This procedure gives rise to a linear phase term in the second speckle- shear interferogram that plays the role of a spatial carrier and allows the use of spatial phase measurement methods to analyze the fringe pattern. We present the theoretical aspects of the technique as well as i ts experimental implementation. KW - Electronic speckle-shearing pattern interferometry KW - Shearography KW - Spatial carrier KW - Speckle metrology KW - Transient deformation measurement KW - Civil aviation KW - Deformation KW - Holography KW - Interferometers KW - Interferometry KW - Lasers KW - Moire fringes KW - Phase measurement KW - Pulsed laser applications KW - Shearing KW - Electronic speckle-shearing pattern interferometry KW - Shearography KW - Spatial carrier KW - Speckle metrology KW - Transient deformation measurement KW - Speckle N1 - Cited By (since 1996):7 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - :doi 10.1117/12.312955 N1 - Correspondence Address: Fernndez, A.; Universidade de Vigo, Departamento de Fsica Aplicada, ETSEIM, Lagoas-Marcosende, 9, E-36200 Vigo, Spain; email: antfde z@uvigo.es UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0005268414&partnerID=40 &md5=2813337a93ebae1f361f8dc70f136410 ER TY - JOUR T1 - Phase-stepping technique with an electro-optic crystal in digital speckle pattern interferometry JF - Optics Communications

VL - 149 IS - 4-6 SP - 235 EP - 238 PY - 1998/// AU - Angel, L. AU - Tebaldi, M. AU - Henao, R. AU - Tagliaferri, A. AU - Trivi, M. AU - Bolognini, N. AU - Torroba, R. AD - Ctro. de Invest. pticas, P.O. Box 124, (1900) La Plata, Argentina AD - Universidad EAFIT, Medelln, Colombia AD - Instituto de Fisica, Universidade Federal Fluminense, Niteroi, Rio Janeiro , Brazil AB - The use of an electro-optic crystal as phase-stepping device in a digital speckle interferometer is discussed. Phase stepping is introduced by varying the external voltage applied to the crystal. The crystal calibration procedure is o utlined and errors are discussed. Experimental results compared to those obtaine d with a piezo-electrically driven mirror are presented. 1998 Elsevier Science B .V. KW - BSO crystal KW - Digital speckle pattern interferometry KW - Metrology KW - Phase stepping KW - Calibration KW - Crystals KW - Electrooptical effects KW - Light KW - Measurements KW - Optics KW - Speckle KW - Phase stepping KW - Interferometry N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Angel, L.; Ctro. de Invest. pticas, P.O. Box 124, ( 1900) La Plata, Argentina UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0032048899&partnerID=40 &md5=e776bf59f92eb7e2430cb54338214049 ER TY T1 JF VL IS SP EP PY AU AU AU AU AD o AD o JOUR Fast algorithm for integrating inconsistent gradient fields Applied Optics 36 32 8381 8390 1997/// Rivera, M. Marroquin, J.L. Servin, M. Rodriguez-Vera, R. Centro de Investigaciones en Optica, Apdo. Postal 1-948, 37000 Leon, Mexic

- Ctro. de Invest. en Matematicas, Apdo. Postal 402, 36000 Guanajuato, Mexic

AB - A discrete Fourier transform (DFT) based algorithm for solving a quadratic cost functional is proposed; this regularized functional allows one to obtain a consistent gradient field from an inconsistent one. The calculated consistent g radient may then be integrated by use of simple methods. The technique is presen ted in the context of the phase-unwrapping problem; however, it may be applied t o other problems, such as shapes from shading (a robot-vision technique) when in consistent gradient fields with irregular domains are obtained. The regularized functional introduced here has advantages over existing techniques; in particula r, it is able to manage complex irregular domains and to interpolate over region s with invalid data without any smoothness assumptions over the rest of the latt ice, so that the estimation error is reduced. Furthermore, there are no free par ameters to adjust. The DFT is used to compute a preconditioner because there is highly efficient hardware to perform the calculations and also because it may be computed by optical means. 1997 Optical Society of America. KW - Interferometry KW - Inverse problems KW - Metrology KW - Phase unwrapping N1 - Cited By (since 1996):12 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Rivera, M.; Centro de Investigaciones en Optica, A pdo. Postal 1-948, 37000 Leon, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0009601813&partnerID=40 &md5=5d33c1c0e3d2a3e58c34e631100334a6 ER TY - CONF T1 - First year results of the international comparison of UTC(CENAM) JF - Proceedings of the Annual IEEE International Frequency Control Symposium SP - 404 EP - 407 PY - 1997/// AU - Lopez-Romero, J.M. AU - Molina-Lopez, V. AU - Figueroa-Estrada, J.M. AD - CENAM, Mexico AB - The Centro Nacional de Metrologia (National Center of Metrology), CENAM, i n Mexico, has been contributing to UTC since March 1996 with six HP5071A high pe rformance frequency standards. The UTC(CENAM) (or UTC(CNM) as it is labeled in B IPM Circular T) is presently generated from a single HP5071A clock which is oper ated under controlled temperature and humidity conditions. In this report we pre sent results of the first year (from March 96 to March 97) of international comp arison of UTC(CENAM). We use the common-view time transfer technique and follow the BIPM schedule for North-West America to make that comparison through the BIP M. Analyzing the BIPM Circular T CENAM's data, we find the fractional frequency instability of our Master Clock to be about 210-15 for an integration time () of 8 1 days, and an intrinsic frequency offset of about 1,510-13. In the future we pla n to add the other five HP5071A clocks to an algorithm to generate the UTC(CENAM ). KW - Algorithms KW - Frequency stability KW - Frequency standards KW - Master clock KW - Time transfer technique KW - Clocks A2 - Anon PB - IEEE CP - Piscataway, NJ, United States N1 - Export Date: 26 April 2013

N1 - Source: Scopus N1 - Correspondence Address: Lopez-Romero, J.M.; CENAMMexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0031360356&partnerID=40 &md5=9484f6175f1b966cd1e963441f02b266 ER TY - JOUR T1 - Measuring the angles and pyramidal error of high-precision prisms JF - Optical Engineering VL - 36 IS - 10 SP - 2868 EP - 2871 PY - 1997/// AU - Jaramillo-Nez, A. AU - Robledo-Snchez, C. AD - Inst. Nac. Astrofis., Optica E., Apartado Postal 51 Y 216, Puebla, 72000, Mexico AD - Inst. Nac. Astrofis., Optica E., Mexico AB - The use of a Twyman-Green interferometer to measure the wedge angles and p yramidal error of high-precision optical prisms is described. The method allows these parameters to be determined independently or in combination. Prism angles are measured with the aid of a reference flat attached to a goniometer mounting. The pyramidal error is obtained by measuring the period of interferogram fringe pattern. Prism angles up to 25 deg have been measured with a standard deviation of 3 arcsec. 1997 Society of Photo-Optical Instrumentation Engineers. KW - Angle metrology KW - Interferometry KW - Optical tolerancing KW - Prisms N1 - Cited By (since 1996):2 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Jaramillo-Nez, A.; Inst. Nac. Astrofis., Optica E., Apartado Postal 51 Y 216, Puebla, 72000, Mexico; email: ajaramil@inaoep.mx UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-2442602571&partnerID=40 &md5=e414af881354d5951db032368f9f0cb0 ER TY - JOUR T1 - Coherent-optical localization and assessment of importance of damage and d efects of cultural heritage JF - NDT and E International VL - 30 IS - 2 SP - 61 EP - 67 PY - 1997/// AU - Boone, P.M. AU - Markov, V.B. AU - Burykin, N.M. AU - Ovsyannikov, V.V. AD - University of Gent, Department of Applied Mechanics, Laboratory Soete, Sin t-Pietersnieuwstraat 41, B-9000, Gent, Belgium AD - Institute of Applied Optics, Jt. Initiative Natl. Acad. of Sci., Kudryavsk aya 10-G, 254053, Kiev, Ukraine AD - Centro Internacional de Fisica, Apartado Aereo 49490, Bogota, Colombia AB - Some experimental results are presented, related to practical applications of a holographic nondestructive technique for inspection of museum item conditi ons, especially in the detection of deformation, stress concentration and defect

localization. These results are obtained using the basic principles of traditio nal double-exposure holographic interferometry, as well as its electronic varian t with computer image processing. In the latter case the accuracy in displacemen t measurements was studied on a test object. Two museum items have been selected for their condition inspection: a XVIIIth century icon on wooden panel and a pr ecolumbian terracotta anthropomorphic. The technique described can give quite ac curate metrological information, and is also rather promising for rapid qualitat ive analysis of the object condition before and after restoration, as well as du ring its storage. 1997 Elsevier Science Ltd. KW - Art work diagnostic KW - Holographic interferometry KW - Metrology KW - Nondestructive testing KW - Computer applications KW - Defects KW - Deformation KW - Holographic interferometry KW - Image processing KW - Museums KW - Stress concentration KW - Art work diagnostics KW - Nondestructive examination N1 - Cited By (since 1996):3 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Boone, P.M.; University of Gent, Department of App lied Mechanics, Laboratory Soete, Sint-Pietersnieuwstraat 41, B-9000, Gent, Belg ium UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0031121204&partnerID=40 &md5=f0b49273d5fd2e0f093bf430d6f66190 ER TY - CONF T1 - Experimental study for the use of elbows as flowmeters JF - American Society of Mechanical Engineers, Fluids Engineering Division (Pub lication) FED VL - 6 PY - 1997/// AU - Sanchez Silva, F. AU - Toledo Velazquez, M. AU - Ruiz Hernandez, J. AD - ESIME-IPN-COFAA, Mexico, Mexico AB - A study of fluid flow in elbows for application in flow metrology was unde rtaken. Most of the current flow measurement methods represent a great investmen t for many industries, however, when the accuracy requirements are not too high, elbows could be used as primary elements for flow rate measurements because the y represent a very low cost instrument, easy to install and operate as well. The studies already made for the application of this device, indicate that more inv estigation is necessary for its full characterization. In the experimental work reported in this paper, three commercial 90 elbows, installed horizontally, were tested. All of them were short curvature radius with 0.75, 1 and 1.5 inches of i nternal diameter; water was employed for the experiments and maintained at 24 C. Pressure taps on the elbows were located at 45 along the curvature radius, one on the internal wall and the other on the external. The performance of the elbow w as compared against a calibrated orifice plate. A mathematical model based on th e centrifugal force in the elbow, was developed to describe the effects of the c urvature on the radial pressure gradient. Experimental results show that there i s a greater sensibility of the elements when the curvature radius diminishes, th at is, a larger pressure gradient is obtained. If this radial pressure gradient is used in the typical equation for the orifice plate, a good concordance betwee

n the measurements of both elements is observed and it only requires a correctio n factor to use the elbow as a flowmeter. We concluded that the radial pressure gradient is adequate for the flow rate determination and that it is possible to use elbows as flowmeters. KW - Flow measurement KW - Mathematical models KW - Pressure drop KW - Pressure measurement KW - Elbows KW - Radial pressure gradient KW - Flowmeters A2 - Anon PB - ASME CP - New York, NY, United States N1 - Cited By (since 1996):1 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Sanchez Silva, F.; ESIME-IPN-COFAA, Mexico, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0030650615&partnerID=40 &md5=ce11529215ae503292597ed6742c04a4 ER TY - JOUR T1 - Scale-space filter for smoothing electronic speckle pattern interferometry fringes JF - Optical Engineering VL - 35 IS - 12 SP - 3549 EP - 3554 PY - 1996/// AU - Dvila, A. AU - Kaufmann, G.H. AU - Kerr, D. AD - Centro de Investigaciones en Optica, Lon, Gto. 37000, Mexico AD - Instituto de Fsica Rosario, 2000 Rosario, Argentina AD - Loughborough University, Department of Mechanical Engineering, Loughboroug h LE11 3TU, United Kingdom AB - Processing of correlation fringes obtained from electronic speckle pattern interferometry (ESPI) requires the use of a digital filter to reduce the speckl e noise. Even though smoothing algorithms based on the Fourier transform signifi cantly suppress speckle noise, they do not preserve the image characteristics. T he application of a scale-space filter to reduce speckle noise in ESPI fringes i s reported. Results obtained using both computer-simulated and experimental frin ge patterns are used to test the scale-space filter and they are also compared w ith those obtained by Fourier, convolution, and median filtering. 1996 Society o f Photo-Optical Instrumentation Engineers. KW - Digital image processing KW - Fringe analysis KW - Speckle metrology KW - Speckle noise reduction N1 - Cited By (since 1996):23 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Centro de Investigaciones en Optica, Lon, Gto. 3700 0, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0000409981&partnerID=40 &md5=cbd5cdf74f3bf6de8d10ffa115787909 ER -

TY - JOUR T1 - Linnik microscope imaging of integrated circuit structures JF - Applied Optics VL - 35 IS - 1 SP - 131 EP - 148 PY - 1996/// AU - Gale, D.M. AU - Pether, M.I. AU - Dainty, J.C. AD - Optics Section, Department of Physics, Imp. Coll. Sci., Technol. and Med., London SW7 2BZ, United Kingdom AD - Inst. Nac. Astrofis., Optica E., Apartado Postal 51 y 216, Puebla 72000, P uebla, Mexico AB - Experimental one-dimensional intensity and phase images of thick (>200 nm) oxide lines on silicon are presented together with profiles predicted from the waveguide model. Experimental results were obtained with a purpose-built Linnik interference microscope that makes use of phase-shifting interferometry for inte rferogram analysis. Profiles have been obtained for both TE and TM polarizations for a wide range of focal positions and in both bright-field [type 1(a)] scanni ng and confocal modes of microscope operation. The results show extremely good a greement despite several simplifying assumptions incorporated into the theoretic al model to reduce computing times. 1996 Optical Society of America. KW - Integrated circuit metrology KW - Interference microscopy KW - Profilometry KW - Waveguide imaging theory N1 - Cited By (since 1996):32 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Gale, D.M.; Inst. Nac. Astrofis., Optica E., Apart ado Postal 51 y 216, Puebla 72000, Puebla, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0001606237&partnerID=40 &md5=d56be1940f6b9579380b8b7a8e1e855f ER TY - JOUR T1 - Digital display of the temporal evolution of speckle patterns JF - Optical Engineering VL - 35 IS - 1 SP - 63 EP - 69 PY - 1996/// AU - Henao, R. AU - Rabal, H.J. AU - Tagliaferri, A. AU - Torroba, R.D. AD - Centro de Investigaciones Opticas, Casilla de Correo 124, La Plata 1900, A rgentina AD - Universidad Nacional de La Plata, Facultad de Ingenieria, La Plata 1900, A rgentina AD - SPIE AD - ANIRT, Apartado Aereo 2073, Medelln, Colombia AD - Universidade Federal Fluminense, Instituto de Fisica, Niteroi, R.J., Brazi l AD - University of La Plata, Argentina AD - ICTP, Trieste, Italy AD - CONICET, Argentina

AD - CNPq, Brazil AD - Department of Optics, Universidade Federal Fluminence, Niteroi, Brazil AB - An interesting way to display the temporal evolution of a speckle pattern produced by a slowly changing perturbation is presented. It is based on digital speckle pattern interferometry (DSPI) concepts applied to 1-D slices of each fra me of the time-evolving perturbation. The time history of a column of an image i s depicted as a function of time. Correlation fringes are obtained by subtractin g an unperturbed state from consecutive or alternate columns. Applications are s uggested. KW - Optical metrology KW - Speckle correlation KW - TV holography N1 - Cited By (since 1996):6 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Henao, R.; Centro de Investigaciones Opticas, Casi lla de Correo 124, La Plata 1900, Argentina; email: postmaster@ciop.edu.ar UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0040815693&partnerID=40 &md5=a3c183ae59c9eca58d326b665a5789cc ER TY - JOUR T1 - Multimode optical fiber core measurement by speckle correlation JF - Optical Engineering VL - 35 IS - 1 SP - 26 EP - 30 PY - 1996/// AU - Henao, R. AU - Pomarico, J.A. AU - Russo, N. AU - Torroba, R.D. AU - Trivi, M. AD - SPIE AD - Universidad de Antioquia, Medelln, Colombia AD - Universidad Nacional de La Plata AD - Optical Research Center (ClOp) AD - University of San Luis, Argentina AD - Faculty of Engineering, University of La Plata AD - Optical Research Center (ClOp), La Plata, Argentina AD - German Academic Exchange Service, Stuttgart University, Germany AD - Intl. Center for Theoretical Physics, Italy AD - University of La Plata, Argentina AD - Optics Group, Optical Research Center (ClOp), La Plata, Argentina AD - Argentinian Research Council AD - Intl. Ctr. Sci. and High Technol., Trieste, Italy AD - Alexander von Humboldt Stiftung, Germany AD - German Academic Exchange Service AD - Organization of American States AD - Valencian Community, Spain AD - Buenos Aires Research Council, Argentina AD - Faculty of Engineering, National University of La Plata AD - Istituto Nazionale di Ottica, Florence, Italy AD - Intl. Centre for Theoretical Physics, Trieste, Italy AD - University of Antioquia, Medellin, Colombia AB - The modal distribution at the output of a multimode optical fiber behaves as a speckle pattern. Further, a speckle pattern carries information on the pupi l diameter of the optical system exit aperture. Pupil measurements by speckle si ze determination may not be an easy task, because of the statistical nature of t

he speckle phenomena. The measurement of a multimode fiber core is proposed usin g a speckle autocorrelation algorithm to obtain the minimum speckle diameter pre sent in the pattern generated by the fiber. Both computer simulations and actual pupils are used to test its performance. Core diameter measurements are carried out showing good agreement with the specifications supplied by the fiber manufa cturer. KW - Fiber optics KW - Speckle correlation KW - Speckle metrology N1 - Cited By (since 1996):4 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Henao, R.; Universidad de Antioquia, Medelln, Colom bia; email: postmaster@ciop.edu.ar UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0141605211&partnerID=40 &md5=4b1b9ca5f392d9d727cac4e29caead44 ER TY - CONF T1 - Mexican realization of a cryogenic current comparator JF - CPEM Digest (Conference on Precision Electromagnetic Measurements) SP - 347 EP - 348 PY - 1996/// AU - Sanchez, Carlos AD - CENAM, Qro, Mexico AB - A Cryogenic Current Comparator (CCC) Bridge for the measurement of the Qua ntum Hall resistance and standard resistors from 1 to 10 k was built for its use a t the National Center of Metrology (CENAM) in Mexico. Construction details and o perating principles of the system are described. KW - Cryogenic equipment KW - Differential amplifiers KW - Electric currents KW - Electric measuring bridges KW - Electric resistance KW - Electric resistance measurement KW - Hall effect KW - Quantum theory KW - Resistors KW - Signal generators KW - SQUIDs KW - Cryogenic Current Comparator KW - Grohmann type KW - High input impedance differential amplifier KW - Quantum Hall resistance standard KW - Sullivan type KW - Comparator circuits PB - IEEE CP - Piscataway, NJ, United States N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Sanchez, Carlos; CENAM, Qro, Mexico UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0029766428&partnerID=40 &md5=5c5c6b2e364a872ee912241e0aa45f36 ER TY T1 JF VL JOUR Moir with zone plates pseudo-randomly encoded Optics Communications 97

IS - 3-4 SP - 157 EP - 161 PY - 1993/// AU - Ojeda-Castaeda, J. AU - Carranza, J. AD - Departamento de Optica, Universidad de Valencia, Burjassot 46 100, Spain AD - Instituto Nacional de Astrofisica, Optica y Electrnica, Apdo. Postal 216, P uebla, 72000 Pue., Mexico AB - Moir patterns are a convenient method for optically sensing lateral displac ements, or in-plane rotations. Sharp moir fringes are here created by using two z one plates, pseudo-randomly encoded. Our results may be useful in metrology, opt ical testing, and robotics. Experimental results are reported. 1993. KW - Error analysis KW - Error detection KW - Mathematical models KW - Measurements KW - Optical correlation KW - Optical testing KW - Optics KW - Random processes KW - Robotics KW - Pseudo-randomly encoded KW - Schuster fringes KW - Zone plates KW - Moire fringes N1 - Cited By (since 1996):3 N1 - Export Date: 26 April 2013 N1 - Source: Scopus N1 - Correspondence Address: Ojeda-Castaeda, J. UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0027558614&partnerID=40 &md5=73faca7766ed18e2ab5842c40af9eef7 ER -