Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
Rev. 110214-1
+ LAYER WALLS
D-MATERIAL:PLASTICS
Background measurements, solution requirements within the meaning of - Influence of coating on the material properties: Optical / electrical / mechanical / chemical / thermal / porosity
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-2 APPLICATION TSLSYSTEMSERIES MATERIAL THICKNESS MT/QS/US/QW/EL/DF/AU/FI/US/FH1/FH 7 FILM THICKNESS PCI / delta / GA / RA / QS / DF COEX / DUPLEX THICKNESS MT / FI / EL / AU + DF THIN PCI / delta / GA / RA SURFACE .- roughness / TOPOGRAPHY / PORE PCI / SU / PCT / TH / TY / FI / PO Color, luster, cleanliness / PURITY delta / PG / CC / PCI
SPECIAL APPLICATIONS RADII, INTERNAL PIPE, SMALL AREAS MT / EL / DF / AU / FI / PCI / FH STAINLESS STEEL + AUSTENIT MT / EL / DF / AU / QS / FH LayerMaterials PAINT / PAINT + CERAMIC other organic THICK QA / MT / DF / EL / AU / FI / RA / delta / PCI / CCS Order process MT / QA / QW / EL / DF / AU / FI / PCI / delta
OrdereProcess,specifically Plating STAINLESS STEEL, MT/ DF / QS / FH / MT / DF / EL / AU / POWDER SOLGEL, THERM.SPRITZEN, PVD, CVD QA / RA / EL / alpha / delta / PCI / CCS BASE-COAT + el.TAUCH PROCESS alpha / delta ONLINE MEASUREMENT It should be noted that most solutions as online versions, and more extensively for the 8-hour operation to date as budget systems are available.
Please choose in the google video mode, the corresponding measurement applications
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NAVIGATION within the TSL kathegorisierten materials / methods described in the direction of measurement system distribution in each case above TSL-operated working area. Other operations are u.U. very different. Some commercial areas require individual user information, so we ask you for your request-> aA
Ratings are the first orientation, of course, subject to individual review and if profitability analysis. Points 7, 9, 10 and 11, we respond to the knowledge of concrete Questions individually -> a.A.
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GLOSSARY SDM-> coating being measured WDM-> Walls/material being measured TSL-system-name in thickness Measuremnet technologies inductive Wiedycurrent ULTRAsonics Hall-sensor Optic Interferometer electricstat Coulommetric Tactile R xray Thermic 03 Area Measurementarea in m -> useful / border 04 prakt. Tolerance Tol in the above industries, operating range: under 100 micron in microns, / / About 100 micron-> in% of reading 05 USP- Efficiency and solution height such as: power Measure possible / Physics fits better than conventionally used procedures / simple / safer to use / less need for training .... other benefits 0 -> there is no 10 -> relevance in competition 06 measurement electronic data pratised 1 -> low 10 -> high 07 known Risk per Operator error 1 -> low 10 -> high 08 Knowledge needed: Responsible / Operator 1 -> Instruction 5 -> Training 10 -> education 09 known payback in months with device cuts, frequency / solvent storage 10 TestPart-Costs, under section 10 in the particular environment including staff / training / Test Preparation in EUR 1 -> low 10 -> high 11 possible Potential of Prevention, Returns /ComplianceCosts 0P USE 01 TYPE 02 Physics Abbreviations used as following
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TSL-SYSTEMS
Largely current EU standard. Built in or external probes. External probes often in the system 2 to about 20 000m Data transfer and / or internal statistics, Internal memory for data series (batches) and / or memory for spec. Adjustment settings (applications). Equipment portable / stationary, by radio, infrared, or via interface multiplexing / Mux. Accessory sets, tripod / handling, roll-additives, Mux, data, radio ... BUTTON > Systems> Hand Measuring-> Options BUTTON > Systems> hand-held> Options + programs Measuring and transfer programs for every need,
TSL-TYPE USE
FAILURE RISK
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OP 01 02 03
MT Series
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TSL-TYPE USE
FAILURE RISK
KNOWLEDGE Amort.
COSTS
PREV
OP 01 02 03
MT 700 Series
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TSL-TYPE USE
FAILURE RISK
KNOWLEDGE Amort.
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Sensors
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FH 1 Series
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SDM / WDM FH1 BONDING force 5-20 000 3 / / 3-10 5 / 10 - aA 6 / 1 a.a a.a a.A.
A representative type-section of our extensive product range, - According to fitness, we offer you the system or even more suitable for your needs.
TSL-TYPE USE
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FH 7 Series
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TSL-TYPE USE
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GA Series
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QW Series
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PCT Series
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PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA
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MI Series
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TSL-TYPE USE
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STR Series
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CC Series
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TSL-TYPE USE
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TSL-QS SERIES
- Layer thickness measurements on organic substrates and multilayers. System cost: systems from EUR 3500 Training needs: 5 Measuring time: 10 sec Preparation / set-up time: 5 min.
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TSL-QW-SERIES
- Layer thickness measurements on organic substrates and multilayers. System cost: systems from EUR 3500 Training needs: 5 Measuring time: 10 sec Preparation / set-up time: 5 min.
Serial measurement of very thin layers with the possibility TSL-alpha-SERIES very thin substrates - the capacitive SDM process
Application Capacitive SDM method for thin films on conductive reference film, the carrier material thickness from about 1 micron hardly relevant. Training needs: 3
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-13 Measuring time: 10 sec Preparation / set-up time: 1 min. Suitable for reference measurements with films - such as: offset printing. The method can be used on very thin FE-reference materials, in which case the usual measurement errors, such as by magnetization fluctuations in an otherwise very thin FE reference not come into play - perhaps a unique selling feature.
Non-contact measurement of very thin layers with the possibility transparency measurement, - the SDM interferometric method
System Cost: sensors from about EUR 7000 Training Requirements: 6 / 2 Measuring time: 0.1 seconds Preparation / set-up time: 5/0.5 min. Measuring rate up 200/sek.
TSL-delta-SERIES
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Micro Topgrafien, roughness and thickness measurements for non-contact and fast measurements
TSLPCISERIES
Photothermal method for heavily pigmented layers, powder and wet measurements, non contact. as a thermal measurement method and to visualize Faults and coupling faults.
System cost: EUR 25 000 from sensors Training Needs: 4 Measuring time: from 2 sec
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TSL-MI-SERIES
System Cost: sensors from about EUR 60 000 Training needs: 5 Measuring time: 0.1 seconds Preparation / setup time: minimum 10 min.
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TSL-MT-SERIES
For the most widely used measurement application procedures are established, both of which are from the use of on the effects of a sensor over a metallic base material (GW) as a carrier of measuring Layer define. Each resulting signal response between a sending and a receiving sensor to a Metal as a carrier of the layer is influenced by the distance to be measured (= layer thickness). The thicker the layer, the smaller the sensor effect can be evaluated. Distance measurement between sensors and the respective base material as a reference. This base material (or substrate, or backing material) therefore first determined that, in some cases to use measurement processes. To be measured Wall /Layer defines the distance to the substrate, where it in alloys Changeinteractions with the substrate may.
As a sensor of a measuring unit, these technologies are encapsulated in the different measuring probes almost all manufacturers and measurement principles of portable devices. Many Questions a measuring system resulting from the correct Ratio is a primary fed- for secondary measurable / measured energyResponse. The focus will thus binding the elektrsized/ Magnetic / acoustic / optical Transmission properties der respective Workmaterials. Here you can find almost any potential for conflict and solution strategies again.
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TSL-
Device Type: Optical almost identical to the inductive method is the only high-frequency coil of the probe usually horizontally, which the measurement area determines effect.
WDM / SDM from electrically non-conductive media in relation to highly conductive References / substrates. WDM non-conductive materials to Referenz-Leitern/Kugeln - there significant advantages over ultrasound systems at very high accuracy. Suitable for thick layers and materials (fiberglass, carbon fiber, etc.).
Requirements: Electrical adjustment on the uncoated object using standards. also suitable building sites, System Cost: 400 Training Needs: 4
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-18 Measuring time: 10 sec Preparation / set-up time: 1 min. Requirements: Electrical adjustment on the uncoated object using standards. Substrate thickness: approx 40m minimal. For non-magnetic metal substrates with non-conductive coatings. The coating must be tough enough to resist the pressure of each patch Measurement probe tip is not to yield.
TSL-MT
WDM non-magnetic materials to reference-FE. - Also suitable building sites, measuring time: usually faster than 5 seconds. Each suitability for conductive walls / thick films (galvanizing) to consider! System cost-EUR: 400 Training needs: 5 Measuring time: 5 sec better Preparation / set-up time: 5 min Prerequisites: Electric-magnetic alignment at the (same) uncoated object using standards.
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-19 Perform eddy current fields in the conductor to be measured at constant methodically measuring deviations characteristics, a correction program (see TSLconvert) be einsettzbar. For magnetizable metal substrates with non-magnetizable coating / wall. Substrate thickness: 0.5-1mm minimal, depending on the sensor. The material must be tough enough to be the pressure of each patch test probe tip to yield.
TSL-FH 7 SERIES
SDM / WDM non-magnetic walls / FE layers to substrates. WDM non-magnetic materials to reference FE (as a ball), - a Ball serves as Referenzpol, - Often safety-profit and advantages over, for example. Ultrasound systems for multiple precision and very good radius capability to 1mm!. Requirements: Electric-magnetic alignment on the uncoated object using standards. For units of the FH-Series is the adjustment to the FE reference sphere already internally automated ..
Suitable building sites, especially near stream areas .- often for thin substrates - rolling Measuring time: 5 seconds System Cost: 700 Training Needs: 4
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-20 Measuring time: 1-10 sec Preparation / set-up time: 1 min. For magnetizable metal substrates with non-magnetizable coatings. The coating must be tough enough to be the pressure of each patch test probe tip to yield.
Technology Hall does not require acoustic impedance-dependent adjustments of the wall-material
Properties compared with ultrasonic techniques (US-WDM) with changing metrics and Geometries. It also eliminates the coupling fluid. The wall thickness may be only a few micrometers (microns) are up a millimeter.
Magnetic Strength-Procedure
Application
TSL-FH 1
WDM of non-magnetic layers (layers) compared with FE-substrates. WDM non-magnetic materials to FE. Also for soft Schhicht / wall materials.
-21 Training required: 2 Measuring time: 10 sec Preparation / set-up time: 30 sec Requirements: No adjustment, therefore, close application limits. Substrate thickness note (about 1 mm minimum)! For magnetizable metal substrates with non-magnetizable walls / coatings. The coating must not hard enough so as not to pressure the relevant patch test probe tip to give, since Measurement of release of the pressure goes to zero. Wiche materials such as rubber, are so often measured.
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SURFACE LAYER COLOR WALL THICKNESS, - Examples of equipment series If there is more than one TSL system indicated, the challenge of the application may ask about possibilities:
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AUTOMOTIVE
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VW Product Reflector, Non-metal Application 10-20m below base-coating aluminum TSL-delta system 2.3
Product
Product: Rolls-Royce - wooden dashboards Application: <2 mm transparent coating on wood TSL System: PCI (for scanning), or US-200 ultrasonic
Product: Bayer Makrolon, polycarbonate Application: <2 mm wall, - and 2-20m coating
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-27 TSL System: delta 3.2 + PCI (scanning), Wall: delta 3.4 and FH
Product: BMW door shilding, rubber Application: <20m coating measurement TSL System: PCI
Product:
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Product:
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Product: Space, glass-fiber Application: 8-20 mm wall thickness TSL System: FH featuring convert
Product:
Application: 5-120 micron multi-layer coating thicknesses TSL System: U.S.: Filler + cover plus: transparent, delta 2.3
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Product:
Application: 5-120 micron multi-layer coating thicknesses TSL System: U.S.: Filler + cover plus: transparent, delta 2.3
Product: Item of automatic-control, Non metal Application: 2-20 micron multi-layer coating thicknesses TSL System: delta 3.2: transparent - plus U.S. filler / base
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Product:
Product: flexible plastic films Application: <20m transparent thin film measurement TSL System: PCI / delta
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Product:
Glass-fiber Container
Product:
Plastic curtain
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Product: SI-Wafer Application: 1-20 micron multi-layer coating thicknesses TSL System: delta 2.3
Product:
Wood,- Furnishing
Application: 20-200 micron multi-layer coating thicknesses TSL System: PCI non contact / contact U.S.
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Product:
Product:
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ELECTRICAL / ELECTRONICS
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Product:
Printed board
Application: 5-100 microns different coating thicknesses TSL System: PCI / delta
Product:
Printed board
Application: 5-10 microns Photo-resist coating thickness TSL System: PCI / delta
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Product:
Application: minimum 100 micron coating thickness above coil TSL System: PCI
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Product: Relay/Magnetic-Coil , - Covering thickness Application: 100 micron min covering above coil
Product:
Injector, polacarbonate
Application: 0.1-2 micron coating thicknesses and online through wall TSL System: delta 3.9
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Product:
Blister packaging
Product:
offset printing
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Product: Liquid-sprayerContainer Application: 2-50 microns and wall thicknesses valve-coating TSL System: PCI / delta - and FH
Product:
GlassContainers
Application: 2-5 mm wall thickness TSL System: PCI / delta online and offline FH
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Some methods of measurement, especially in layer structures, possibly via the suitability micrograph of Check and correct. With suitable methodological differences and stable processes, the Using an automatic curve-correction program, such as TSLconvert. To it, for example, is for highway pavement thickness settlement of this process, a regulatory basis of calculation and shall be trained accordingly.
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The conditions in industrial production environments demand meters, which are fast and reliable work and use local are network independent, weather-resistant and temperature-independent. In addition, the required margin of measurement uncertainty, as it is to read from the device manufacturer should be taken into account. Noteworthy are the representations and conditions under which the Lieferanten/Hersteller-Details of Measuring Properties are accessible - even ours. A transparency of the different modes of representation, particularly in relation to the requested application solution out to us essential, as we design solutions with the matching, so different systems.
With a plurality of measuring devices affect conductivity / Magnetic properties of the measured wall / coating such as nickel rata Selected measuring method for the user imperceptibly or clear. This can provide independent advice from seasoned Apllikationen recognized phenomena in advance and give effect to clarify.
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Tag
In the SD measurement GEpreliminary Terms that in communication can confuse: Calibration a measuring instrument: Repatriation on a national / international deposited Standard mass and timed De Documentations Target-state durch a Calibration with certificate and seal. Adjustment/ Setting the meter: Electrical preparation and adjustment of the instrument for the current Messaufgabe.durch the user by means of zero and any film standard.
The Adjustment is often Manuals in more than >Calibration, 'Or' calibration < and on keyboards with> KAL <button called!
, or micron-> microns?
At this point the opportunity to emphasize that according to DIN EN ISO throughout the issue is not the Greek term (micron), but binding of the metrological term microns,Micrometer, Is utilized. 1 m 1 x 10-6 M 1: 1000 000 meters 0, 000 001Meter 0,001 mm 1mm 1 x 10-3 M 1 Meter: 1000 1000 microns
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DIN 50976
Hot dip galvanizing of components (hot dip galvanizing); requirements and testing,
DIN EN ISO 2064 / DIN 50 928 for replacement-1 Metallic and other organic layers, definitions and Provisions relating to the measurement of film thickness: 1987-08) DIN EN ISO 2178 / Replacement for DIN 50 981: 1979-05) Non-magnetic coatings on magnetic substrates; Measurement of coating thickness, Magnetverfah, Ren DIN EN ISO 2360 / Replacement for DIN 50 984: 1978-08 Non-conductive coatings on non-magnetic substrates; Measurement of coating thickness, eddy currentprocess
-48 Quality System-Directive FORD Q-101 or the manuals of the German Society for Quality (DGQ) as a further indication for the calculation of control limits.
DIN 1319-3
includes: DIN 50 981, DIN 50 984, ISO 2178, 2360, 2808, BS 5411 (3,11) 3900 (c, 5) and ASTM B499, DI 400th
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-49 NAVIGATION NOTE Dear reader of our Representations, in order to effectively and accurately find your desired Task Stellungn by TSL Solving strategies and systems please use the following 5 Choice of topic buttons, if you are :
>starting from Your material to be measured at Material >or Your Application starting >or the already knownn Procedure >or if you apply for a Commercial unit Interest >content / editorial Backgrounds- And on our problem-solving opportunities, Engineering and want to inform R & D.
-> MATERIAL -> APPLICATION -> SYSTEMS -> SHOP -> SUPPORT
We give up the search word input, the experience shows very often user Expectations not responded. They are therefore our opportunities for your measuring task by image-navigation after the 3-th level. By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where you to your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level
TV Conference> -1197
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