Excellence in Surface Chemistry

Quartz Crystal Microbalance

KSV Dissipative QCM-Z500

Resistance (Dissipation) change

measure
Frequency change

calculate

adsorbed mass adsorbed thickness density surface elastic modulus surface and bulk viscosity

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Real-time single- or multi-channel bench-top monitoring of adsorption, binding or fouling at solid surfaces in liquids or gases!

Adsorption Sensors
Dissipative QCM-Z500
Do you need a simple method to observe the following? Biology/Medicine Affinity interactions, e.g. antibody-antigen Binding of proteins at surfaces (specific or non-specific) Cell attachment / detachment Cell-membrane specific proteins Deposited lipid bilayers Vesicle attachment Chemistry Gas/liquid phase measurement Surfactant adsorption Polymer adsorption Nanoparticle adsorption Corrosion Self-assembly Polymeric surface coatings Surface gels Industry Fouling/cleaning In-line sensing Non-ideal surfaces, e.g. polymers

Vesicle spreading

Alternating polyelectrolyte / protein / nanoparticle adsorption

Gas sensors Antigen-antibody binding Reactive modification of interfaces

Surface grafting

LB-films, SAM

The Instrument The KSV QCM-Z500 is an acoustic sensor that exploits the highly mass-sensitive resonance vibration of singlecrystal quartz to measure the mass of thin surface layers. However, it is much more than a simple adsorption sensor. By measuring the amount of energy lost (dissipation or damping) at several overtones, the QCM-Z500 can provide the viscoelasticity, thickness and density profile of the attached layer. The Measurement The QCM substrate, is precoated on one side with the relevant metal, inorganic or polymeric material.

Obtain adsorbed amount, layer thickness, density profiles and viscoelastic properties of surface layers!

The substrate is mounted in the holder, and the instrument assembled. The liquid of interest is introduced via the tubing system or using a pump. The QCM can also be fitted with a fully automated 4-8 liquid syringe dispenser, greatly simplifying repetitive liquid handling tasks.

The measurement is started, and is displayed in real-time. In Real Time Plot Resonance frequency (F or F) Mass change (m) Mass change / unit area (m/A) Dissipation (D or D) Resistance (R or R) Quality factor (Q or Q) Inductance (L or L) Capacitance (C or C).

With Modelling Software Calculate Stiffness Elastic modulus Viscous modulus Bulk viscosity Layer thickness Layer density

Graphs can be directly copied for reports, or data can be exported for publication quality presentation.

Simultaneous monitoring via -Microscopy -Ellipsometry -Electrochemical cell Modular cell design and liquid handling
Advantages of QCM as an adsorption sensor QCM is an acoustic technique, so there is no requirement for optical clarity of the liquid phase, or reflectivity of the solid as is the case for optical methods such as ellipsometry. Simple to set up and use The simultaneous measurement of resistance (dissipation) provides crucial information on the mechanical properties of the material attached to the surface, e.g. viscoelasticity, thickness and density profile. Advantages of KSV Instruments as your supplier KSV provides the widest available variety of professionally coated QCM crystals More than 20 years experience of building instruments for surface chemistry applications, guarantees you innovative and user-friendly research tools, and rapid, friendly service KSV can efficiently modify instruments to fit special needs, including process and quality control applications. Advantages of the KSV QCM-Z500 General The QCM-Z500 can measure on crystals with a wide range of resonance frequencies User-friendly and intuitive software and instrumentation will have you up and running quickly Superior measurement speeds, up to hundreds of datapoints/second, allow observation of high speed processes The excellent temperature stability provides reliable data within minutes, allowing time dependent studies ranging from seconds to weeks Impedance analysis By using the widely accepted and proven method of impedance analysis, the QCM-Z500 provides not only adsorbed mass, but changes in the dissipation of energy at several overtones.The improved amount and quality of raw data allows for optimal model fitting, required to extract mechanical properties of attached layers such as viscous and elastic modulus, density and thickness Recording of changes in resistance (R), impedance (L), capacitance (C), quality factor (Q) and dissipation (D) allow full freedom to further develop the impedance analysis models Modular measurement cell and liquid handling options A quick change of some optional components allows the basic measurement module to readily swap between ellipsometric, microscopic and electrochemical modes The parts in contact with the surface and solution can easily be separated and removed for cleaning and sterilization A free volume cell can be placed at the interface of a Langmuir trough to study interactions between a deposited monolayer and subphase solutes Flow measurements are optimally performed using the well-defined stagnant point flow chamber in combination with a peristaltic pump Multichannel measurements can be made in up to four separate chambers simultaneously by hooking together the desired number of instruments, and allows you to place the instruments in different locations when your multichannel measurement is finished The automatic 4-8 syringe multidispenser frees your hands by programmable introduction of repetitive samples, such as polyelectrolyte multilayers For cases when your liquid sample is scarce, a novel Peltier heating and cooling element has been developed for open surface measurements on minimal liquid volumes placed using an autosampler.
Electrochemical attachment

Flow cell

Window cell (for microscopy)

Ellipsometry attachment

Open volume cell

L dispensing onto open volume cell

4-liquid multidispenser

Peristaltic pump

Active in-cell temperature control provides temperature stability, quick set-up, modularity, flexibility and open design Specifications Frequency range 0.1 55 MHz Frequency resolution 0.01 Hz Maximum sensitivity in liquid vs. data averaging (5 MHz crystal) Example for 1 datapoint / 6 seconds: Mass resolution, 5 MHz crystal (Sauerbrey) 0.177 ng/cm2 Resistance (R) resolution (Dissipation, D) 0.01 Ohm (1x10-9)* Measurement method True Impedance analysis Crystals Standard 5 MHz, AT-cut On request 10 MHz, AT-cut Working Temperature Active sensor area Maximum mass load Maximum film thickness Computer Interface Voltage Sample Volume Flow cell Other cells Multiliquid autodispenser Acquisition speed Weight & Dimensions Flow cell Window cell Electronics unit Shipping Weight Maximum sensitivity in liquid (5 MHz crystal): 1 datapoint / 6 seconds (25 oC) 1 datapoint / second (25 oC) 8 datapoints / second (25 oC) 0.05 Hz, corresponds to 0.9 ng/cm2 0.2 Hz, corresponds to 3.5 ng/cm2 0.5 Hz, corresponds to ~ 9 ng/cm2 4.75 kg, H 165 mm, W 120 mm, D 210 mm 1 kg, H 80 mm, W 100 mm, D 150 mm 4.5 kg, H 255 mm, W 157 mm, D 250 mm 20 kg Liquid flow 10 60 oC (active in-cell temperature control) ~ 20 mm2 ~ 0.1 mg/cm2 ~ 10 m (depends on the softness of the material) Ethernet 100 250 VAC (45-65 Hz) from 300 L (window cell) to 2 mL (Flow cell) (smaller volumes available on request**) stagnant point, batch or continuous (with peristaltic pump) laminar flow, batch or continuous 4 or 8 liquids hundreds of points/second for special applications

* The Resistance (R) resolution corresponds to a Dissipation resolution of about 1x10-9.This resolution is several orders of magnitude better than is actually needed, as the change in dissipation normally observed in a liquid environment lies in the range of a few 10-6. ** Considerably smaller volumes can be used by dispensing onto open volume cell with autosampler. Further information available online! http://www.ksvltd.com If you need further information, please visit our website, where you can find background information, example measurements, the full range of accessories and contact details for our distributors. If you dont find what you are looking for, please contact us (info@ksvltd.fi). Online Literature Detailed background information Frequently asked questions Example measurements on - affinity based systems - surfactant adsorption - LB film deposition - bulk viscosity measurement - electrochemistry

The Company
KSV Instruments Ltd is a leading global provider of routine, research and characterization instruments for surface chemistry and Langmuir-Blodgett film applications. Our headquarters are in Helsinki, Finland and we have offices in North America and Sweden and trained representatives throughout the world.

Interfacial Characterization
With Sigma tensiometers and CAM Drop Shape Analysis contact angle meters and their various modifications KSV covers most of the known interfacial measurement techniques. All instruments utilize the latest technological advances in measurement of surface/ interfacial tension of liquids as well as contact angles and surface free energies.

Langmuir Film Preparation and Characterization

Ranging from manual, educational instruments to fully equipped high performance R&D grade multi/alternating layer LB-troughs KSV offers the widest range of Langmuir systems in the world. KSVs BAM (Brewster Angle Microscope) and ISR (Interfacial Shear Rheometer) are used for characterization of Langmuir and LB films in a wide variety of nanotechnology, biology and molecular engineering applications.

Dip Coating
A wide variety of dip-coaters for exacting applications, from single manual dippers to automatic multiple dipping devices.

Process Control
KSV makes a range of at-line (AL) and on-line (OL) process control tools for monitoring surface tension, temperature, pH, viscosity and conductivity. An option also exists for automatic dosing of surfactants.

KSV Instruments Ltd. Hylmtie 7, 00380 Helsinki, FINLAND Tel. +358-9-5497-3300, Fax +358-9-5497-3333 e-mail: info@ksvltd.fi, www.ksvltd.com KSV Instruments, Inc. P.O.Box 192, Monroe, CT 06468, U.S.A. Toll Free 1-800-280 6216 (U.S.A. only) Tel. +1-203-268 1745, Fax. +1-203-459 0437 e-mail: info@ksvinc.com

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21.4.2006