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Ceramic Component Technologies, Inc.

J.GaylordGasque
CeramicComponentTechnologies,Inc.(CCT)
1487PoinsettiaAvenue,Suite127
Vista,CA92081,USA
Phone:(760)2953180
gaylordgasque@ccti.biz
MichaelS.Randall
AlmegacyLLC
313RiverWalkDrive
Simpsonville,SC29681USA
Phone:(864)6081047
Michael@Almegacy.com
WilliamR.Harrell,GithinAlapatt
ClemsonUniversity
HolcombeDept.ofElectrical&ComputerEngineering
205RiggsHall,Box340915
Clemson,SC296340915
Phone:(864)6565918
rod.harrell@ces.clemson.edu
galapat@g.clemson.edu

CARTSInternational2012,March2629,LasVegasNevada

Abstract:Paper3.3
Accurateandconsistentimpedancebasedmeasurementsaredifficulttoachieveinthe
caseofveryloworveryhighimpedancesituations(e.g.,near1nF capacitorsat1MHz).
Forthesesituations,itisimportanttouseshielded,Kelvintypecontacts,andthe
fixturingusedshouldbeoptimizedtocontactthedeviceundertest(DUT)inamanner
thatconsistentlyminimizescontactresistancewithoutdamagingtheterminalsofthe
DUT.NotallKelvintypefixturesarecreatedequally,however.Inthisstudythebenefit
oftheapplicationofproprietaryfixturingtechnologytohighprecisiontestand
measurementapplicationsisdiscussed.Severalexamplesareusedtoillustratethe
benefitofsaidproprietarydesignsovercommerciallyavailablealternatives.Thedata
indicatethatuseofthistechnologyresultsinmeasurementsthataremoreaccurate,
consistent,andstable.Theseproprietarycontacttechnologiesenableseveralsignificant
benefitstotheuser,includingmoreconsistentcontactwithreducedcontactresistance,
moreaccurateandstablemeasurementsthatenablereducedguardbandingand
superiorcontactlongevitythatenablesreducedpreventivemaintenanceaswellas
reduceddowntime.Thestudyindicatesthatthesenewandproprietarycontact
technologiesenablecheaper,betterandfastermeasurementofkeyimpedancebased
deviceparameters.
Ceramic Component Technologies, Inc.

CARTSInternational2012,March2629,LasVegasNevada

DesignDiscussion:TweezersTypeFixturing
U.S.Patent7,456,642
DesignedforPurpose

CurrentStateoftheArt

Ceramic Component Technologies, Inc.

CARTSInternational2012,March2629,LasVegasNevada

DesignDiscussion:AutomatedTestFixturing
U.S.Patents6,756,798,7,005,869
DesignedforPurpose

CurrentStateoftheArt

Ceramic Component Technologies, Inc.

CARTSInternational2012,March2629,LasVegasNevada

DesignDiscussion:Other
(Pogopinforflyingprobeofbedofnails,etc.)U.S.6,957,005
DesignedforPurpose

Ceramic Component Technologies, Inc.

CARTSInternational2012,March2629,LasVegasNevada

Experimental
TweezersTypeFixturesEvaluated

Fixture Supplier
ModelNumber
Type
A
Agilent 16034B(StandardDesign)
B
SMD
SMDClip4BNC(StandardDesign)
MulticontactTestTweezer (Designed
C
CCT
forPurpose,PatentedDesign)
CCTPatentedTechnology
Ceramic Component Technologies, Inc.

CARTSInternational2012,March2629,LasVegasNevada

Sample#

ResultsandDiscussion:
DataSummary,TweezersTypeFixturing
TweezersType
B

A
Capacitance
St.Dev.P
Average

Sample

1 0.1pF0603C0G+/0.1pFMLCC(pF)

0.194 0.00131

2 1.0pF1206C0G+/0.25pFMLCC(pF)

1.017 0.00056

3 10pF1206C0G+/5%MLCC(pF)

10.109 0.00082

4 100pF1206C0G+/5%MLCC(pF)

101.07 0.00114

5 1000pF1206C0G+/5%MLCC(pF)
7 100F1206X5R+/20%MLCC(F)

1,003.0
10.01
83.51

8 1000F29175mESR+/20%Ta(F)

989.1

6 10F1206X7R+/10%MLCC(F)

0.01966

DF(%)
St.Dev.P
Average

Capacitance
St.Dev.P
Average

0.012% 0.0026% 1.744

0.017% 0.0009% 2.635
0.036% 0.0003% 12.485
0.055%
0.0019% 110.90
0.0066%
0.198%
1,084.5

3.783%
0.5999%
0.00656
6.184%
0.0501%
0.02671
0.10112 11.940% 7.8607%

0.03951
0.06036
0.13680
0.06898
0.25169

9.85 0.12427
81.230 2.54010
997.4 2.08947

DF(%)
St.Dev.P
Average

11.993%
3.290%
1.093%

7.3566%
8.4016%
3.0565%
0.068% 0.1186%
0.023% 0.0172%
12.377% 4.4646%
15.893% 8.8410%
9.408% 18.3893%

C
Capacitance
St.Dev.P
Average

0.129
1.005
10.085
100.88
994.3

0.00042
0.00049
0.00037
0.00066
0.01296

9.958 0.02586
83.365 0.06636

990.2

0.47232

DF(%)
St.Dev.P
Average
0.029%

0.0209%

0.006%
0.015%
0.021%
0.068%
3.167%
5.789%
2.661%

0.0025%

0.0003%
0.0003%
0.0010%
0.0736%
0.0148%
0.6511%

Overallbestperformancewithpatentedtweezersdesign(C)
TypeBresultedinoutofspecmeasurementsforallsamplesevaluated
TypeAresultsinoutofspecmeasurementsfor2of8samplesevaluated
Ceramic Component Technologies, Inc.

CARTSInternational2012,March2629,LasVegasNevada

ResultsandDiscussion:Timeseries,Samples1and2
NormalizedCapacitanceTimeSeries

Sample1(0.1pF)

NormalizedDFTimeSeries

140%

101.0%

NormalizedCapacitance(%)

NormalizedCapacitance(%)

130%

100.5%

100.0%

99.5%

Cexhibitshigheststabilityinallcases

110%
100%
90%
80%
70%
60%

99.0%
0

20

40
ProbeA

60
ProbeB

80

100

20

40
ProbeA

ProbeC

Sample2(1pF)

NormalizedCapacitanceTimeSeries
100.8%

150%

100.6%

140%

NormalizedCapacitance(%)

NormalizedCapacitance(%)

120%

100.4%
100.2%
100.0%
99.8%
99.6%
99.4%

60
ProbeB

80

100

ProbeC

NormalizedDFTimeSeries

130%
120%
110%
100%
90%
80%
70%
60%

99.2%
0

20

40
ProbeA

60
ProbeB

80

100

20

40
ProbeA

ProbeC

60
ProbeB

80

100
ProbeC

Ceramic Component Technologies, Inc.

CARTSInternational2012,March2629,LasVegasNevada

ResultsandDiscussion:
DataSummary,AutomatedFixturing
Sample#

AutomatedFixturingType

9
10
11
12

Sample
1.0pF1206C0G+/0.25pFMLCC(pF)
10pF1206C0G+/5%MLCC(pF)
1000pF1206C0G+/5%MLCC(pF)
10F1206X7R+/10%MLCC(F)

WellShielded
PoorlyShielded
Capacitance
DF(%)
Capacitance
DF(%)
Average St.Dev.P Average St.Dev.P Average St.Dev.P Average St.Dev.P

0.989
9.955
1,014.72
9.89

0.00066
0.0019
0.0020
0.0086

0.018% 0.005% 0.970

0.005% 0.001% 9.909
0.003% 0.001% 1,014.88
3.13% 0.010% 9.86

0.00803

0.036%

0.009%

0.0276

0.056%

0.021%

0.0326

0.016%

0.003%

0.0104

3.06%

0.016%

Wellshieldedoutperformspoorlyshieldedinallbutonecomparison

Ceramic Component Technologies, Inc.

CARTSInternational2012,March2629,LasVegasNevada

Conclusion:TweezersTypeFixturing
Category
Kelvin4PointConvergenceNeartheDUTTerminal
MeasurementAccuracy
MeasurementPrecision
MultipleContactsperDUTTerminal(lower,moreconsistentESR)
OrthogonalDUTterminalcontact(MechanicallyRobust,Consistency)
LongLastingContactConfiguration/Finish
SmallCaseSizeComponentCapable(<0603EIA(1608Metric))

TweezersType
B

Designedforpurpose,tweezerstypefixturesoffernumerousperformance
advantagesovercurrentstateofthearttweezerstypefixturedesigns
Ceramic Component Technologies, Inc.

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CARTSInternational2012,March2629,LasVegasNevada

Conclusion:AutomatedChipTestFixturing
AutomtatedFixtureType

Category
Kelvin4PointConvergenceNeartheDUTTerminal
MeasurementAccuracy
MeasurementPrecision
MultipleContactperTerminal(lower,moreconsistentESR)
LongLastingContactConfiguration/Finish

WellShielded

Poorly
Shielded/
Rolling
Contact

Designedforpurpose,wellshieldedautomatedtestfixturingoffers
numerousperformanceadvantagesoverpoorlyshieldedandrolling
contacttypestateoftheartfixturedesignsforautomatedchiptesting
Ceramic Component Technologies, Inc.

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CARTSInternational2012,March2629,LasVegasNevada