BaBar Note 492

TNDC-99-97 April 28, 1999

dE/dx Systematics in the BaBar Drift Chamber 1

Mikhail Dubrovin 2 , David Coupal 3

Based on statistics of cosmic runs accumulated since November 1998 to January 1999 with BaBar Drift Chamber, several systematics directly related to the dE=dx resolution are considered.

Abstract

1 2

This research was partly supported by Ministry of Science of Russian Federation and SLAC. Temporary in SLAC, from Budker INP, Novosibirsk, 630090, Russia. 3 SLAC.

Contents
1 Waveform
1.1 Test of waveform and charge quality . . . . . . . . . . . . . . . . . . . . . 1.1.1 Calibration le and coe cients . . . . . . . . . . . . . . . . . . . . 1.1.2 Charge calculation from waveform . . . . . . . . . . . . . . . . . . 1.1.3 Comparison of pedestal . . . . . . . . . . . . . . . . . . . . . . . . 1.1.4 Comparison of charge . . . . . . . . . . . . . . . . . . . . . . . . . 1.1.5 Check of address correctness . . . . . . . . . . . . . . . . . . . . . 1.1.6 Waveform quality control . . . . . . . . . . . . . . . . . . . . . . . 1.1.7 Summary for this section . . . . . . . . . . . . . . . . . . . . . . . 1.2 Correlations of waveform parameters and reconstruction of clipped charge 1.2.1 De nition of waveform parameters . . . . . . . . . . . . . . . . . . 1.2.2 Correlations of A32 with charge Q and Noverflow . . . . . . . . . . 1.2.3 Correlations of charge Q with Qclip and Noverflow . . . . . . . . . . 1.2.4 Clipped charge reconstruction . . . . . . . . . . . . . . . . . . . . . 1.2.5 Summary for this section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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2 Spectra of parameters used in analysis of cosmic runs

2.1 Parameters for track selection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.2 Spectra of momentum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.3 Angular distributions of cosmic statistics . . . . . . . . . . . . . . . . . . . . . . . . .

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3 Standard systematic corrections

3.1 Wire-to-wire gain correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 3.2 Dip angular correction for mean amplitude . . . . . . . . . . . . . . . . . . . . . . . 9 3.3 Distance of closest approach correction for the mean amplitude . . . . . . . . . . . . 10 4.1 4.2 4.3 4.4 4.5 4.6 Evaluation of dE/dx & Truncated mean algorithm . . . . . . . . . . . . . . . . Optimization of the truncated mean algorithm . . . . . . . . . . . . . . . . . . Parameterization of ionization strength vs ................... Dependence of dE=dx resolution on applied corrections and cut of parameters . Dependence of dE=dx resolution on sample length . . . . . . . . . . . . . . . . Dependence of dE=dx resolution on number of amplitude samples . . . . . . . . . . . . . . . . . . . . . . . . . .

4 dE/dx analysis

10
10 11 11 12 12 12

5 Additional systematic corrections

5.1 Reconstruction of clipped charge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5.2 Amplitude dependence on entrance angle . . . . . . . . . . . . . . . . . . . . . . . . 13 5.3 Correction of the truncated mean biasing e ect . . . . . . . . . . . . . . . . . . . . . 14 2

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5.4 Mean amplitude versus time correction . . . . . . . . . . . . 5.5 Dip-angular amplitude correction for spectrum . . . . . . . 5.5.1 Procedure . . . . . . . . . . . . . . . . . . . . . . . . 5.5.2 Comparison of new and old dip-angular corrections . 5.5.3 Summary for this section . . . . . . . . . . . . . . .

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6 Single cell spectrum

6.1 Single cell spectrum simulation . . . . . . . . . . . . 6.1.1 Simulation algorithm . . . . . . . . . . . . . . 6.1.2 Contribution of the gas gain uctuations . . 6.1.3 Fit of simulated spectra . . . . . . . . . . . . 6.1.4 Dependence of spectral parameters on < m > 6.2 Experimental dependence of single cell spectrum on 6.2.1 Procedure of spectra accumulation . . . . . . 6.2.2 Fit of experimental spectra . . . . . . . . . . 6.2.3 Dependence of t parameters on ..... 6.3 Comparison of experimental and simulated spectra . 6.4 Summary for this section . . . . . . . . . . . . . . .

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7 Summary 8 Acknowledgments

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Introduction
From October 1998 to January 1999 cosmic runs with BaBar Drift Chamber separately and integrated with other detector's systems have been conducted before the beginning of running at PEP-II on May 7, 1999. By November '98, the Drift Chamber reached stable operation and later statistics are used for this analysis. At the beginning of this work in the middle of February 1999, the working version of standard BaBar code for dE/dx was almost complete. Some of the usual amplitude corrections were tested and implemented in on-line dE/dx calibration. Expected dE=dx resolution 6:5 7% were obtained at > 10 20, but for the most useful range for BaBar (2 < < 10) there was an unexpected deterioration of resolution of up to 8 9%. The question arose of possibly improving the resolution in this range. A few problems directly related to dE=dx resolution are considered in this note. All e orts were concentrated in two directions: to improve as much as possible the dE=dx resolution and to try understand to what extent results di er from expected on the basis of ionization statistics. The contents of this note are divided into the following almost independent parts: waveform analysis; amplitude systematic corrections; dE=dx resolution evaluation and optimization of the truncated mean algorithm; check on some of the classic statistical hypothesis in uencing single cell spectra and leading to the dependence of dE=dx on sample length and number of samples.

1 Waveform
1.1 Test of waveform and charge quality
The main idea of this test is to check that the ROM \feature extraction" algorithm does not contain rough errors in calculation of charge from the waveform and that electronics calibration coe cients are used in the proper way. Probabilities of \bad" waveforms have been estimated for di erent values of high voltage. This test is done using n-tuples with waveforms for runs 2246, 2248, 2250, 2252 (HV = 2080, 2020, 1960, 1900 V) with corresponding calibration le 160.

1.1.1 Calibration le and coe cients

The document http://www.slac.stanford.edu/ masahiro/ir2calib.html contains a description of the 27 parameters associated with each wire in the electronics calibration le: $BFROOT/detector/dch/DchIR2/calibration/cal160/calibration.out Distributions of wire-channels for some of these parameters are presented in Fig. 1.

1.1.2 Charge calculation from waveform

Waveform (see Fig. 6) reconstruction and charge calculation is done on the ntuple waveform routine as close as possible to the standard code algorithm by following operations: 1. Linear transformation of bi-linear scale FADC for each amplitude sample of waveform: ( Alin = A0 A 63 A0 31 (1) 3 0 A0 32 4

where A0 is ADC count for current sample, Alin is a resulting linear amplitude. 2. Linear interpolation of missed amplitude samples due to the time codes in the waveform. 3. Integration of the charge: starting from leading edge (with threshold 1 ADC count above pedestal level) to the 32-nd sample. 4. Correction of the charge Q according to the calibration coe cients:

Q=2 (

nint

Alin nint pedestal)=analgain;

where nint is a number of integrated samples, leads to the units of roughly fC=2.

1.1.3 Comparison of pedestal

Pedestals can be obtained in several ways. First, using the pedestal determined in the electronics calibration (corresponding le was considered above). A second way is a pedestal de ned as a mean value of the few rst samples of the waveform. The rst sample has been used to estimate a pedestal level. Fig. 2a shows the distribution of pedestal di erence for all hits of 100 events. p R.M.S. value of this distribution (0:45 ADC count) is larger than the expected 1 ADC count= 12 = 0:28 ADC count. This e ect could be explained by the fact, that sometimes a leading edge or waveform distortion is beginning already in the rst sample (see examples in Fig. 3).

1.1.4 Comparison of charge

The rest of the histograms in Fig. 2 show: spectrum obtained for charge calculated directly from waveform (b); spectrum of charge from n-tuple (variable hitCharge(i)) (d); and spectrum of charge di erence (c). All these histograms are obtained with additional cut o hitCharge(i) 20, in order to suppress peak in spectra at low amplitude. Gaussian width of the peak in charge di erence spectrum 6 fC=2, that corresponds to 1:5 ADC count in integrated charge. This could be explained by float ! integer ! float conversion at charge transformation and di erence with the ROM feature extraction algorithm. To understand the nature of small fraction of long tails in this distribution, a few waveforms with Q 50 fC=2 are plotted in Fig. 3. Obviously, that standard code has an algorithm of suppression of bad waveforms, that is di erent from the simple waveform analysis implemented here in PAW.

1.1.5 Check of address correctness

In order to check a correctness of addresses of the calibration coe cients and corresponding waveforms, the premeditated error have been inserted in addresses of calibration coe cients: 1) layer number ! layer number + 1 at layer number 39; 2) wire number ! wire number + 1 at wire number 252. In both cases the r.m.s. width of Pedestal spectrum increased from 0:45 to 0:57 ADC count as well as width ( ) of Q spectrum from 6:0 to 23 fC=2. This simple test con rms that: 1. the addresses are correct; 2. pedestal spread from channel to channel is very small. 5

1.1.6 Waveform quality control

Histograms in Fig. 4 show the statistical waveform quality: distribution of waveforms on number of integrated in charge samples; number of over owed samples; number of samples in bi-linear mode; number of TDC hits; and 32-nd sample amplitude spectrum (without pedestal subtraction). Conclusions for HV=2020 V are the following: 3% of waveforms are over owed, 57% waveforms have samples in bi-linear mode, 70% waveforms have more than one time sample, 8:3% waveforms have a tail exceeded 5 ADC count in the last (32-nd) sample above the pedestal. Dependences of these probabilities on high voltages are shown in Fig. 5. Clearly, probabilities of \bad" waveforms are increasing with growing high voltage.

1.1.7 Summary for this section

1. Good agreement between online and o ine charge calculation has been achieved. 2. Better agreement in charge calculation would require a more exact implementation of o ine algorithm. 3. There is no implemented corrections for over owed or long tail waveforms. A survey of publications from detectors that achieved 3 4% dE=dx resolution (see, for example, 1, 2]) suggests some improved resolution could be obtained by cutting out poorly measured waveforms. The following parameters could be used: number of over owed samples (with amplitude 128 ADC counts); level of 32-nd sample above pedestal; number of time samples in the waveform. At a minimum, the ag bits could be used to tag above conditions.

1.2 Correlations of waveform parameters and reconstruction of clipped charge

In cosmic runs at HV=1960 V about 2% of all hits have at least one sample of FADC pulse in over ow, equal to 63 ADC counts (see Fig. 4, 5). For low momentum p, K , ,... this probability could increase, leading to deterioration of particle identi cation via dE=dx. It is well known, that the shape of the waveform depends on track location with respect to anode wire, electric eld con guration in the drift cell, cross-talk from neighboring wires and channels. The clipped top of the waveform could be predicted by an analytical function tted to the rest of the waveform, but precision of this method is not likely to be better than the proposed statistical approach, based on correlation of total charge with clipped waveform parameters. This work was started with Prototype-II data 3], and continued by A.Yushkov 4 , but very promising results have not been applied to waveform reconstruction. So, it's interesting to look at what could be done in the present situation. This analysis is done using n-tuple with waveforms for run 2248 (HV = 2020 V) with corresponding calibration le 160. All waveforms were considered regardless their relation to the tracks.
4

Private communication.

1.2.1 De nition of waveform parameters

A few parameters describing a waveform (see Fig. 6) are de ned below: total integrated charge Q is a sum of amplitude samples from the leading edge to the end of the waveform with pedestal subtracted; if at least one sample over oved (63 ADC count), one gets clipped charge Qclip instead of the true charge; number of over oved samples Noverflow ; a signal of modest amplitude should to slope down to pedestal level at the end of the waveform, hence, the amplitude of the last sample A32 could be used as well.

1.2.2 Correlations of A32 with charge Q and Noverflow

Scatter plots of A32 versus charge Q and Noverflow are shown in Figs 7. In case of proper waveforms, one could expect a quasi-linear correlations of these parameters. The long tail of high amplitude A32 even at small charge and zero number of an over owed samples is probably due to late ionizationin edge cells of superlayer. This result con rms, that not all waveforms have a perfect shape, and A32 parameter could be used as an estimator of waveform quality.

1.2.3 Correlations of charge Q with Qclip and Noverflow

In order to study the dependence of charge Q on Qclip and Noverflow we have to measure all these values simultaneously, but that is impossible in standard case. Instead we move an e ective clipping threshold from 63 ADC counts to 31 ADC counts. With taking in to account bi-linear mode, this corresponds to 1/4 of ADC scale. In Fig. 8a,c the correlations of measured charge Q versus Qclip and Noverflow31 are shown (for waveforms without real over ow of 63 ADC count level). Points with error bars show an average charge value for each bin with their errors. Smooth curves show optimal polynomial t of points. A 6-th order polynomial has been applied in Fig. 8a with coe cients: 3.939993, 0.8469808, 0.1136615E-02, -.3009004E-05, 0.3307198E-08, -.1422910E11, 0.2120827E-15; as well as 2-nd order in Fig. 8c with coe cients: 911.0364, 13.84160, 22.98801. Fig. 8b,d show relative (r.m.s.) width of charge distribution as a function of parameters Qclip and Noverflow respectively. These plots can be interpreted as resolution of the reconstructed charge, using one of parameters Qclip or Noverflow31 . It is clear from Fig. 8a, that over ow of the level 31 is beginning for charges greater than 800 fC/2, hence the real resolution of charge in Fig. 8d is above this value (below 800 fC/2 it shows ratio of histogram bin size ). The conclusion is that <Q> for clipped waveforms the resolution of reconstructed charge 20% can be easily acheived at extension of the ADC scale for 3 4 times. This resolution should be compared with 70|80% (FWHM=most probable) uctuations of Landau distribution for single drift cell.

1.2.4 Clipped charge reconstruction

Polynomial functions shown in Fig. 8a,c could be used for charge reconstruction: Qcorr:1 = f1 (Noverflow31 ) or Qcorr:2 = f2 (Qclip:31) in case of owerfrlow level of 31 ADC count. In real over ow of level 63 ADC count one could use the same functions, with corresponding scaling factors: Qcorr:1 = 4 f1 (Noverflow63 ) and Qcorr:2 = f2 (Qclip:63 =4). One sees in Fig. 8b, that Qclip provides better precision ( 10%) at low values of charge, while (in Fig. 8d) parameter Noverflow31 gives better resolution 7

( 15%) at larger total charge. Hence, combining these two parameters, charge resolution could be improved in all range. The simplest linear combination of charges Qcorr = (Qcorr:1 + Qcorr:2 )=2 has been tested, without optimization of relative weights. Results of this procedure are shown in Fig. 9a, as a correlation between Qcorr and total charge Q. Resolution of corrected charge on charge is shown in Fig. 9b. Fig. 10 contains the same resolution plot with two others, corresponding to the charge reconstruction using Qcorr:1 and Qcorr:2 separately. Signi cant improvement in case of linear combination is clearly observed.

1.2.5 Summary for this section

Strong correlations between few waveform parameters have been observed. These correlations could be used for clipped charge reconstruction with precision of 10 20% and a 3 4 fold extension of ADC scale.

2 Spectra of parameters used in analysis of cosmic runs

2.1 Parameters for track selection
To provide a minimal quality of reconstructed tracks, events were selected with cuts on the following parameters: Ntrk | number of founded tracks in event; 2 (chisqDof) | parameters of 1-st and 2-nd track reconstruction quality; 1;2 Ndigi | number of hits per event; Nhits | number of hits (samples) per track; Pt (1) Pt (2) | di erence in transverse momentum between 1-st and 2-nd track. Distributions of these and some other standard N-tuple parameters are shown in Fig.11. The typical set of selection conditions are: Ntrk = 2; 2;2 < 3; 35 < Nhits < 45. These cuts discard 15% of events. In the 1 case, when all hits of cosmic event are treated as a single track, the cut o Nhits is replaced for appropriate cut o Ndigi , and jPt (1) Pt (2)j < 0:25 is applied as well.

2.2 Spectra of momentum

Most of nal results of dE=dx analysis based on particle momentum dependence. Spectra of transverse momentum PT , momentum P and = P=M (M is a particle mass) in logarithmic scale and their normalized integrals are shown in Fig. 12. The range of available momentum is limited by > 2 due to nominal magnetic eld and applied trigger in cosmic runs.

2.3 Angular distributions of cosmic statistics

Distributions of two-track events on sine of dip angle jsin j and scatter plot of jsin j versus are plotted in Figs 13, 15. They show a broad distribution between 0 < jsin j < 0:9 with jsin jmean ' 0:3 roughly independent on . It provides a good opportunity for investigation of di erent amplitude e ects. Distributions of two-track events on entrance angle and scatter plot of versus are shown in Figs 14, 16. These gures show that cosmics are sharply peaked at 0o and 180o . More than 8

95% of hits have an entrance angle inside the ranges 20o w.r.t. indicated directions. As shown in Fig. 16, the \desert" area outside of peaked ranges is populated mainly by hits of tracks with low . Non-uniform distribution of cosmic statistics could strongly a ect investigations of amplitude dependence on . An amplitude dependence on entrance angle should exist (at least due to the drift cell geometry). Hence, real experimental events should be used for this calibration. In the present analysis the dependence on entrance angle should not have signi cant in uence due to the narrow range.

3 Standard systematic corrections

Electronics calibration provides an absolute value of the input charge, but it does not take in to account the processes of charge collection and gas ampli cation. The complicated drift cell geometry of BaBar drift chamber and magnetic eld lead to the strong dependence of amplitude of the signal on track location with respect to the sense wire. Therefore, some of systematic corrections of amplitude should be done before dE=dx calculation. Most of these corrections have been evaluated according with technique developed for Prototype II in 3, 4] and already implemented in standard on-line dE=dx calibration algorithm 5]. So, the results for \standard" corrections are brie y listed in this section. New corrections are also discussed as well in Section 5. The following deviations from standard on-line dE=dx calibration approach have been used during all of this work:

to-layer gain calibration. Individual layer calibration for doca and dip angle amplitude dependences is applied instead of calibration for the layer groups. Polynomial ts are used everywhere instead of Chebyshev polynomials.

Q cos is used instead of dq=dx for each of drift cells. Wire to wire gain calibration based on 5 104 events of one run is used instead of layer-

3.1 Wire-to-wire gain correction

Statistics of a single run of 5 104 events are su cient to get a mean amplitude of each wire with an accuracy of 3 5%. Corresponding individual occupancy and single cell spectra of Q cos before and after application of all corrections, are shown in Figs 17, 18, 19, 20, 21 respectively. Distributions of mean amplitude < Q cos > versus wire and layer number before and after application of all corrections, are presented in Figs 22, 23. Array of mean amplitudes are stored after calibration and used at the processing stage. Mean amplitude over all drift chamber is used for general normalization. The plot of occupancy, shown in Fig. 17 or its slices could be used for monitoring of channels with problems (low e ciency or noisy).

3.2 Dip angular correction for mean amplitude

The most simple approximation of the mean amplitude of Q cos dependence on dip angle could be done if the angle expressed in terms of function jsin j, instead of tan , which was used before 9

for historical reasons. Dependence of mean amplitude < Q cos > versus jsin j for separate layers and all layers with low and high gas gain are shown in Figs 24, 25, 26, 27 before and after corrections as well. A third order polynomial is used for parameterization of the dependence for each layer. Polynomial coe cients are stored after calibration and used in following to restore the function for correction purposes. As a curiosity should be mentioned that the dependence of mean amplitude on jsin j1=2 (see Fig. 32) can be parameterized by an almost straight line. A higher degree could be used to re ne the t.

3.3 Distance of closest approach correction for the mean amplitude

Dependence of mean amplitude < Q cos > on normalized Distance Of Closest Approach (doca) are shown in Figs 28, 29, 30, 31 for separate layers and all layers with low and high gas gain before and after corrections. Normalization of doca is done on the semi-dimension dl of the drift cell along the circle with radius of each layer (measured for the anode wires on the ange). The sign of doca is also taken in to account. Sixth order polynomial approximation looks su cient for parameterization in this case. Higher degree polynomials do not improve 2 =Ndof signi cantly. Polynomial coe cients are also stored and used as in the dip angle correction. The 40-th layer dependence is di erent from either the high or low gain layers.

4 dE/dx analysis
4.1 Evaluation of dE/dx & Truncated mean algorithm
After application of amplitude correction procedures the value Q cos can be considered as a dE=dx for each sample, expressed in relative units. Mean value of all amplitude samples along the track are considered in the simplest case as a dE=dx estimator. Truncated mean method (see the survey in 6]) is usually applied to get more stable estimation of the dE=dx value for each track. In this case a certain fraction of high amplitude samples fhigh are discarded to escape a long amplitude tail of Landau distribution. Sometimes, a fraction of low amplitude samples flow is also discarded to suppress a contribution of noise uctuations. The values flow : fhigh expressed in percents will be used in the following to specify the truncated mean algorithm parameters. Ionization strength strongly depends on momentum of the particle or . Typical scatter plot of dE=dx versus is shown in Fig.33. Systematic corrections wire-to-wire gain, spectrum dip angular (see Section 5.5), doca as well as 10%:25% truncated mean were applied. Two approaches were exploited to get the mean ionization strength and its spread as functions of . All the statistics were shared for equidistant in logarithmic scale of histogram bins. In rst case mean dE=dx and RMS for each bin are evaluated. The Gaussian t and its parameters (most probable value Im:p: and width of distribution ) were exploited in the second case for each bin, as shown in Fig.34. Comparison of this two approaches in terms of normalized mean ionization strength and dE=dx resolution versus are presented in Figs 35, Fig. 36 respectively. For Fig 35 the normalization was done for the same value Imin in both cases. There are no signi cant di erence in the mean ionization strength. Fig. 36 shows, that Gaussian approximation provides more stable de nition of the value, than simple RMS. 10

4.2 Optimization of the truncated mean algorithm

In former BaBar Notes 7, 8, 9] truncated mean optimization was done with very rough step of 10% and in 7, 9] the fraction of low amplitudes was not considered at all. Following on one of the rst works devoted to investigation of helium-based gas mixtures 10] 5 authors of 7, 9] used as a dE=dx estimator the mean value of lowest amplitudes. It should be mentioned, that in Annecy test chamber high threshold 5 noise was used and the in uence of noise uctuations was not very important. In present work the truncated mean optimization procedure is the same, as done with PrototypeII 3]. Events with Nhit = 40 and 2 < P < 4 GeV for the rst track were selected, wire to wire gain, dip angle and doca amplitude corrections were applied to Q cos . Then the set of 40 amplitudes was ordered and for all possible combinations of discarded hit fractions of high and low amplitudes, the mean and RMS value of dE=dx distribution were evaluated. Results for mean < dE=dx > and resolution are shown in Fig. 37a{c in matrix form and optimal slices for resolution are presented in Fig. 37d. According to the algorithm, each event contributes to each bin of twodimensional histograms. The ratio of discarded fractions 10%:25% looks optimal and admit small variations around due to the shallow minimum. To check, that the same aspect ratio is working for another number of samples, 80 hits of event was treated as a single track. The same histograms for this case are shown in Fig. 38, and con rm the validity of optimal aspect ratio. In addition, other intervals for momentum have been tested: 0:3 < P < 0:6 GeV , 6 < P < 10 GeV . The location of the optimum does not show signi cant dependence on momentum.

4.3 Parameterization of ionization strength vs

To provide particle species separation, the mean energy loss on momentum should be approximated with much better precision, than the value of resolution. Two types of functions have been tested to t experimental data: classical Bethe-Bloch formulae 11]

I = p1 3 (p2 + 2ln( ) 2p

2p3

(2)

with xed additional parameter p3 = 1, and modi ed Bethe-Bloch formulae 12] providing phenomenological account for ionization density e ect in the region of Fermi plateau:

I = p1 5 (p2 2p

2p5

ln(p3 + ( )p4 ));

(3)

with xed parameter p5 = 1. Both approximations are shown in Fig. 39. Absence of cosmic statistics in the region < 2 does not allow one to x de nitively a shape of the function in the 1= 2 range. Obviously, that the function (3) with additional parameters provides a better description of experimental data over the full range.
This work contains very serious error | it does not take in to account dependence of mean ionization strength. To shadow their problems and get better dE/dx resolution, authors used very speci c trick: several cosmic events were combined together and truncated mean procedure was applied to all of their amplitude samples. Hence, the nal resolution results are very doubtful.
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4.4 Dependence of dE=dx resolution on applied corrections and cut of parameters

Several extensive tests of dE=dx resolution have been performed with the same selection conditions described in Section 2.1 with only one variation, non-optimal 0:25% truncated mean were applied in these cases. Mean and RMS values were used for estimations. Fig. 40a shows that resolution strongly depends on number of amplitude samples corresponding to the 1-st track (open circles) and two tracks together ( lled circles). Detailed investigation of this e ect see in Section 4.6. Traditional test of dE=dx resolution dependence on sequentially applied corrections have been done and results are shown in Fig.40b. Each of basic corrections provides signi cant improvement. Fig. 41a shows dependence of resolution versus on applied cuts of doca < 0:9 and Nhit = 40 with respect to case without these limitations. Observed di erence is not very signi cant. All hits of the event were treated as one track in Fig. 41b. The samples of inner layers (Nlayer 20) and outer layers (Nlayer 21) provide the same resolution. Fig. 42 shows the resolution di erence for inner and edge layers of super-layers with respect to single track resolution. The 1-st and 40-th layer have been assigned to inner layers, due to their gas gain. The small observed di erence could be explained by di erent number of samples used in dE=dx estimation. Fig. 43 shows again, that the number of samples and truncated mean algorithm strongly in uences resolution.

4.5 Dependence of dE=dx resolution on sample length

Based on primary ionization statistics, the dE=dx resolution should depend on l length of the sample 13, 14] according to the function l 0:32 . This dependence could be checked experimentally using wide spread of dip-angular distribution for cosmic statistics (see Figs 13, 15). To get this dependence, 1-st track of each event have been considered at 2 < P < 4 GeV and 38 Nhit 42, all standard set of calibrations have been applied. Results for dE=dx scatter plot and resolution on jsin j are shown in Fig. 44. Solid curve in Fig.p shows l 0:32 t of experimental data, while 44b the dashed curve | is a statistical limit 1= l. Obtained dependence does not contradict the expected behavior, while the region of strong variation of the function is not well de ned statistically and additional systematic edge e ects could contribute at jsin j 1 as well.

4.6 Dependence of dE=dx resolution on number of amplitude samples

Semi-empirical dependence of resolution on number of samples was predicted to vary as Nhit0:428 14] based on measured single cell spectra. Degree of Nhit0:5 could be considered as a statistical limit for purely Gaussian spectra of amplitude. Other experiments obtained slight variations in the exponential the range of 0:42 0:47, which strongly depends on measurement technique. Hence, BaBar drift chamber should have its own degree slightly depending on track selection algorithm. Our interest is to de ne this dependence at Nhit 40 in order to predict resolution variation for another number of amplitude samples. To nd this dependence, 2-track events with Nhit 40(80) were selected at 2 < P < 4 GeV (jP1 P2 j < 0:2 GeV ). Then hits with random addresses were excluded step by step from consideration. The remaining hits were used for dE=dx estimation using truncated mean algorithm. Mean and RMS were used in this case. Fig. 45a shows mean value of < dE=dx > obtained at 0:25% nonoptimal truncated mean for initial Nhit = 40. Integer number biasing e ect, arising at application 12

of the truncated mean, is clearly seen as a step-wise dependence. Fig 45b shows the dependence of p2 resolution on number of hits. Resulting degree p2 = 0:55 of tted function p1 =Nhit is even larger than 0.5 due to the strong in uence of the truncated mean at small number of amplitude samples. The same results for Nhit 80 without and with optimal truncated mean 10%:25% are shown in Fig. 46. In this case biasing of the dE=dx mean value has not so regular behavior because of changed truncated mean algorithm. Approximation of resolution without truncated mean algorithm leads to p2 = 0:47 (see t parameter in Fig. 46b) at 2 =Ndof = 394=86. The truncated mean algorithm provides about two-fold improvement of resolution. The dependence of resolution on number of samples in this can not be interpolated successfully form Nhit = 1 to 80. Results of three variants of interpolation are shown in Table 1. Full range from Nhit = 1 to 80 provides poor 2 =N dof = 1711=80. The degree of the function at the beginning of the scale (2 < Nhit < 10) is equal to 0.57, while the rest part (10 < Nhit < 80) shows degree of 0.45 with very good 2 =Ndof . The last t could be used for resolution approximation in the wide range of Nhit > 10. Table 1: Results of the t of dE=dx resolution on number of amplitude samples by the function p2 p1 =Nhit . Di erent ranges of Nhit are presented to show the di erence in resulting parameter p2 .
2 =N Fitted range of Nhit p1 p2 dof 1 80 0.4660 0.0057 0.499 0.004 1711/80 2 10 0.5264 0.0075 0.575 0.008 23.0/9 10 80 0.3931 0.0034 0.453 0.002 42.7/71

5 Additional systematic corrections

Some amplitude corrections were omitted during this work for following reasons: speci c of accumulated cosmic statistics and too short time (three months) allowed to perform this work. The in uence of omitted e ects could be signi cant for the real experimental statistics. These e ects are listed in this Section with some comments. Several new corrections were suggested, tested and discussed in this Section as well.

5.1 Reconstruction of clipped charge

The waveform over ow (see Section 1.2) could not be studied completely with present cosmic statistics (because of limitation > 2, see Fig. 12). But it should be signi cant for low range for real events.

5.2 Amplitude dependence on entrance angle

As mentioned in Section 2.3, peaked distribution of entrance angle (see also Fig. 14) does not permit to study quite robust corresponding dependences. About 30 50% e ect of amplitude dependence on entrance angle is observed now, but does not in uence signi cantly results with cosmic statistics 15]. This correction was not applied in this study. 13

5.3 Correction of the truncated mean biasing e ect

Figs 45a, 46a show, that mean dE=dx depends on initial number of amplitude samples on track. This dependence arises due to integer operations with number of samples at truncated mean. Just the step-wise functions plotted in the gures could be used for correction of mean amplitude. This operation has been tested at Nhit 40. Expected 2% e ect does not in uence dE=dx resolution in this case. If the tracks with Nhit < 20 are considered in real events, this e ect will contributes 10% to the systematic spread of the mean dE=dx, about equal to the intrinsic resolution.

5.4 Mean amplitude versus time correction

Mean amplitude depends on many environmental parameters such as pressure, temperature, concentration of gas components and their purity, HV and electronics stability etc. Complete, account of all these e ects is a very complicated problem. On the other hand, small deviation of mean amplitude with time could be easily accounted with low statistics. Behavior of spectrum mean value and relative r.m.s. width over 10 hours are shown in Fig 47. Wire to wire gain, doca and dip angular corrections were de ned for run 268 and applied for all the next runs. Each point in Fig 47 corresponds to 1000 events. Shown statistics errors is much smaller than systematic spread from measurement to measurement. It could be explained by the fact, that only part of drift cells are involved at 1000 event statistics. But even in this case, some of global systematic e ects are seen during this period. This correction is not applied in present work, because typically used the number of events does not exceed 2 105 since run 268 and this range does not show variation of the mean amplitude more than 3%.

5.5 Dip-angular amplitude correction for spectrum

The strong dependence of mean amplitude on jsin j at 0 is explained by the gas gain saturation. The dependence of the correction value on mean gas gain factor has been observed in many drift chambers and published for example in 1, 2, 16]. The saturation e ect was not observed with Annecy prototype 7], but according to 17], their gas gain was less than 5000. It con rms, that the e ect does not contribute at low gain. From physical point of view, the high amplitude signal is equivalent to high gain factor. Hence, the dip angular correction should strongly depends on charge of the signal. Currently, we apply the dip angular correction based on dependence of the mean value of the spectra with respect to dip angle (see for example Fig. 24). We do not consider a di erence between high and low amplitudes. The problem is how to de ne correctly the amplitude dependence on dip angle? The general idea is to transform a spectra of Qcos (or dq=dx) accumulated at di erent directions of dip angle to one selected direction. Doing this, we assume that the set of particles used for calibration should provide the same spectra at di erent directions of the dip angle. It is not completely true, because the relative width of spectra depends on the total sample length ( l 0:32 ). On the other hand, this dependence is signi cant at sin > 0:8 while the correction is most signi cant at small dip angle sin < 0:2. Nevertheless, providing the correct transformation of the spectra, the dependence on the sample length (due to the dip angle) will be neglected. 14

5.5.1 Procedure
An adequate transformation of the spectra can be done using normalized integrated spectral distributions. To get these statistics of few runs ( 2 105 events) are treated separately for layers with low and high gain. Very ne granulated (500 bins) spectra of Q cos have been accumulated for 50 equidistant slices in the range of 0 < jsin j < 1, integrated and normalized. Results are shown in Fig. 48. The last bin of each histogram contains the over ow for this histogram (> 2500 fC=2). This method allows one to compare the location of equivalent parts (at least on the point of view probability) of di erent spectra and to perform the transformation. Indeed, another projection of this distribution in units of Q cos versus jsin j, for constant levels of probability with step of 0.05 is shown in Figs 50, 51, and provides the desired histograms for amplitude transformation versus dip angle. A third degree polynomial is su cient to t each of these histograms. To show the relative size of the correction, the same tted functions are plotted in Figs 52, 53 with normalization at = 30o . A wide spread of correction functions is observed for di erent values of Q cos . Dependence of polynomial coe cients on probability level index are shown in Fig. 54, and, in principle, allows their parameterization in order to go from discrete to continuum correction functions. For this study a simpli ed method has been applied for the correction purpose. The nearest function from the set presented in Fig. 50 and Fig. 51 is used for each amplitude hit with coordinates: (jsin j, Q cos ). The transformation brings all the amplitudes to the same angle (for example = 30o or 0o ), where all the functions are well de ned. The result of application of this procedure to the normalized integrated probability distributions is shown in Fig. 49. For all angular slices the normalized integrated probabilities and hence the spectra are coincide with good precision.

5.5.2 Comparison of new and old dip-angular corrections

We wish to compare new and old dip-angular corrections with completely similar conditions. Statistics of 2 105 events from runs 268 272 have been processed with the same, very \soft" event selection criteria: event contains two-track and the 1-st track considered; 36 Nhit 1 45; 2;2 3. 1 These criteria discard 15.7% of all events (about half of them due to two-track requirement, another half due to Nhit limitation). Then wire to wire gain, dip angle and doca corrections have been applied sequentially to each Q cos , before calculation of < dE=dx > with application of optimal (10%:25%) truncated mean. Three di erent cases of dip angle correction have been treated separately: 1. old dip angle correction for mean amplitude versus jsin j; 2. new dip angle correction for transformation of spectra to jsin j = 0:5; 3. new dip angle correction for transformation of spectra to jsin j = 0. Resulting relative ionization loss strength and dE=dx resolution are shown in Figs 55 and 56 respectively for three indicated cases. For understandable reasons, signi cant improvement 0:6 1% of dE=dx resolution is reached at case of spectra transformation to jsin j = 0. The same case provides of 30% relative di erence between minimum and Fermi plateau of ionization curve (see Figs 55). It is about 5% less than in two other cases. Real K = separation power could 15

be estimated, if we plot the same ionization curves as a function of K and momentum (see Figs 57) and compare their di erence in units of resolution for , shown in Fig. 58, 59. New correction algorithm shows advantage for all range of momentum.

5.5.3 Summary for this section

New algorithm of amplitude on dip angle correction have been suggested. It takes in to account an amplitude dependence of saturation e ect. Signi cant improvement of dE=dx resolution have been achieved: 1% at 1 and 0:6% at 100. Improvement of K = separation is also expected in case of new dip angle correction.

6 Single cell spectrum

In order to check how far our result for dE=dx resolution deviates from the statistical limit, a comparison of experimental and simulated single cell spectra is done. This approach escapes some of the systematic corrections that complicate the dE=dx calculation. A lower limit on mean number of primary electrons at minimum ionization can be estimated. An experimental dependence of single cell spectra on is accumulated and considered at several bands of ; a simulation of single cell spectra is carried out as a function of the mean number of primary electrons per track in the drift cell; comparison of experimental and simulated data is performed. Results con rm an expected statistical nature of dE/dx resolution and explain its dependence on .

6.1 Single cell spectrum simulation

6.1.1 Simulation algorithm
Simulation of spectra is based on approach applied in 6, 18]. The number of primary electronion pairs per unit of length m produced by high energy charged particles is de ned from Poisson distribution P<m> (m) (see Fig. 60a for < m >= 20). For each electron the random choice of ki from tabulated cluster size distribution 6 19] (see Fig. 60b) provides de nition of the total number of electrons as a sum:

n=

m X i=1

ki :

Obtained spectra of normalized number of electrons n= < m > are shown in Fig. 60d as a dashed histogram and in Fig. 61 for few values of < m >. E ects of ionization drift, electron attachment, di usion etc. are ignored. Drift cell geometry e ects are partly corrected in experimental spectra and also omitted at simulation. At the next stage, gas gain uctuations were accounted for using a form of Yule-Furry (exponential) distribution (Fig. 60c), instead of Polya distribution, which has parameters not well de ned for our gas mixture and strongly depend on gas gain factor. Individual gas gain factor Gi randomly chosen from exponential distribution with mean value < Gain >= 5 104 (see Fig. 60c) was applied to each of n electrons and a nal charge Q is de ned as a sum:
The cluster size distribution is taken from experimental measurements for He, but it has roughly similar dependence for iso C4 H10 .
6

16

Q=

n X i=1

Gi :

Spectra of normalized charge Q= < m > = < Gain > are shown in Fig. 60d as a hatched histogram and in Fig. 62 for few values of < m >.

6.1.2 Contribution of the gas gain uctuations

Comparison of spectra in Fig. 61 and Fig. 62 shows that a gas gain uctuations do not contribute signi cantly at least in our case at < m > 10. The di erences in r.m.s. and mean values of the spectra do not exceed few percent. Nevertheless, the gain uctuations are accounted for in the following consideration.

6.1.3 Fit of simulated spectra

There is a well-known problem, that r.m.s. and mean value for unlimited single sample spectrum are the strong uctuating parameters, in spite of perfect shape of the peak. That is why, by eye estimation of most probable charge and FWHM of the spectra are usually used. To perform automatic procedure, analytical function is required. To nd a most probable charge Qm:p: and width of the spectrum , the modi ed Gaussian function 7 is used for parameterization:

f (Q) = p1 exp
where is a linear function of charge:

1 log2 (Q) + p2 ; 4 2 p2 4

(4)

and parameters p1 , p2 , p3 associated with Gaussian normalization factor, Qm:p: and respectively. Additional parameter p4 accounts for left-right tail asymmetry. To get the commonly used resolution parameter for single cell spectra, FWHM=Qm:p:, one uses 2:36 =Qm:p: .

p2 (Q) = 1 + sinh(p4 ln4) Q p p2 ; ln4 3

6.1.4 Dependence of spectral parameters on < m >

Dependence of tted parameters on < m > is plotted in Fig. 63a. It shows that the normalized most probable charge, Qm:p: = < m > = < Gain >, is slowly growing with < m >, while the normalized width = < m > = < Gain > decreases. Relative spectral width =Qm:p: has a well de ned descending dependence on < m > as shown in Fig. 63b.
This kind of function does not relate to the physical nature of the spectrum. Nevertheless, it is used sometimes in spectrometry for parameterization.
7

17

6.2 Experimental dependence of single cell spectrum on

6.2.1 Procedure of spectra accumulation
To plot the dependence of single cell spectrum on , 2 105 events of Integrated Cosmic Runs 268 271 are used. Two tracks per event were required at 2;2 < 3 and the rst track considered 1 only with 36 Nhit 45. Statistics, which could be considered for real single cell (about few thousand events) is not su cient to study dependence of spectra. So, statistics for all drift cells for each layer are combined as well as statistics of all layers combined for better accuracy. Systematic corrections of wire to wire gain, dip angle and Doca dependences of amplitude were applied before accumulation of spectra. The range of from 1 to 104 was shared for 40 equidistant bands in logarithmic scale. Fig. 64 shows obtained two-dimensional distributions of spectra on band index for all drift cells (a, b) and drift cells of one layer (c, d). The evolution of spectrum versus is roughly observed. Each layer demonstrates the same behavior.

6.2.2 Fit of experimental spectra

Spectra accumulated for each band are treated separately. The function of Eq. 4 is used for parameterization. Obtained spectra for several bands are shown in Fig. 65 as well as optimal t. Applied parameterization does not show good statistical agreement with experimental data, but the most probable value of corrected charge Qm:p: and spectrum width are de ned quite well. Slow evolution of spectra is seen with .

6.2.3 Dependence of t parameters on

Dependence of main spectral parameters on is presented in Fig. 66. The most probable charge Qm:p: (see Fig. 66a) repeats modi ed Bethe-Bloch dependence, which one observed for < dE=dx >, but R = 40% in stead of 30%! (R - is an enhancement of Fermi plateau with respect to m.i.p. level). Dependence of spectral width , does not contradict to statistical expectation. Similar dependence with increased statistical errors were also observed for spectra summarized for each layer. Relative width of single cell spectra in Fig. 66b reproduces the behavior of dE=dx resolution. Some indication for resolution improvement in 1= 2 region is observed for < 1:5 at low statistics, but it could be also explained by systematic errors at threshold of .

6.3 Comparison of experimental and simulated spectra

The relative width of spectral distribution is most convenient parameter for comparison of spectra accumulated in di erent scale. Fig. 66b shows, that experimental range for relative widths is from 0.36 to 0.47. According to dependence obtained via simulation (see Fig. 63b), it corresponds to the range of primary electrons per drift cell from 30 to 15. Taking into account, that simulated spectra does not take in to account many of systematic e ects, the obtained value could be considered as a lower limit for real number of primary electrons in the drift cell. In spite of this the value is in good agreement with expected mean number of primary electrons 25 30 for our drift cell dimensions and gas mixture.

18

6.4 Summary for this section

The following consequences can be outlined based on this analysis: Experimentally observed relative width of single cell spectra are in a good agreement with statistical interpretation. The low limit on number of primary electrons necessary to describe the shape of spectra is in the range from 15 to 30 for the range of from 1 to 104 . The most probable value of single cell spectra repeats modi ed Bethe-Bloch dependence on , but R = 40% instead of 30% measured for dE=dx (for example, in Fig. 35). Hence, R depends on event selection cut-o parameters, truncated mean algorithm etc. The dependence of the spectral width on follows Qm:p: and does not contradict to primary ionization statistics. Relative width of single cell spectra depends on like dE=dx resolution. It is obvious, that they are connected through the number of amplitude samples and truncated mean procedure, modifying the spectrum. Hence, the di erence in dE=dx resolution for two ranges at 2 < < 10 and 30 < < 300 does not relate to systematic corrections (at least part of corrections and truncated mean algorithm are excluded) and explained by primary ionization statistics. Some indication at low statistics for resolution improvement in 1= 2 region is observed at < 1:5

7 Summary
Several systematics related to dE=dx resolution of the BaBar drift chamber are considered using cosmic data. The correctness of charge calculation from the waveform in the ROM code is checked as well as the correct application of calibration coe cients. Correlations of waveform parameters are considered. New parameters for ag of \bad waveform" are proposed. New approach to the reconstruction of clipped waveform charge is suggested and was shown that it provides 10 20% accuracy at three-fold extension of the charge scale. Standard systematic amplitude corrections are repeated for dE/dx evaluation. Dependences of dE=dx resolution versus on di erent parameters and applied methods are considered. Optimal parameters of the truncated mean method are found correspond to 10%:25% of discarded hits with low and high amplitude respectively. Dependence of dE=dx resolution on number of hits per track is considered and obtained interpo0 lation Nhits:45 could be used in wide range of 10 < Nhits < 80. There is no obvious interpolation to Nhits = 1 was found, while, the function with additional parameters could be used for this aim. Several new amplitude corrections are suggested. Spectra-dip-angular correction is most promising of them. It provides signi cant improvement (from 1% to 0.6%) in dE=dx resolution as well as some improvement in K= separation, comparing with standard dip-angular correction for mean amplitude. Statistical nature of the observed single cell spectra is tested. Good coincidence of experimental and simulated spectra have been achieved at number of primary electrons from 15 to 30. 19

8 Acknowledgments
We wish to thank Dr. William Dunwoodie for helpful discussions and many of our colleagues discussing related problems at numerous O ine Calibration Friday Meetings.

References
1] M.Hauschild et al., Nucl.Instr. and Meth. A314 (1992) 74{85. 2] A.Boyarski et al., Nucl.Instr. and Meth. A283 (1989) 617{621. 3] M.Dubrovin, D.Coupal, Amplitude Analysis of Cosmic Runs with BaBar Drift Chamber Prototype-II & dE/dx, BaBar Note 426, April 20, 1998. 4] V.Blinov, TNDC-97-397, October 28, 1997. 5] Report of Fergus Wilson presented on February'99 BaBar Collaboration Meeting. 6] W.Blum, L.Rolandi, Particle Detection with Drift Chambers, Springer Verlag Berlin Heidelberg 1993. 7] M.Berthet et al., BaBar Note 479, January 20, 1999. 8] V.Blinov, BaBar Note 480, January, 1999. 9] M.Milek, P.M.Patel, BaBar Note 485, March 19, 1999. 10] K.K.Gan et al., Nucl.Instr. and Meth. A374 (1996) 27{33. 11] Bethe, Bloch, 1930. 12] M.Hauschild, CERN PPE/91-130. 13] W.W.M.Allison, Ann. Rev. Nucl. Sc. 30, 253 (1980). 14] A.H.Walenta, Nucl.Instr. and Meth. 161 (1979) 45{58. 15] Results of Federico Colecchia presented on February'99 BaBar Collaboration Meeting. 16] J.Vavra et al., Nucl.Instr. and Meth. A203 (1982) 109{118. 17] D.Boutigny, private communication. 18] D.Coupal, TNDC 95-16, 1996. 19] H.Fischle et al., Nucl. Instr. Meth. A301 (1991) 202.

20

Calibration 160
C(7,:)
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7424 0.3103E-01 0.5254E-03

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7424 1.429 0.1570

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Entries Mean RMS 7424 1.365 0.2357

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0.045

C(11,:)
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300 200 100 0 0.75 1 1.25 1.5 1.75
Entries Mean RMS

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Entries Mean RMS 7424 0.4957 0.6858E-01

Test bench an.gain ext.cal.

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0.2

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Figure 1: Distributions of calibration coe cients.

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Run 2248
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Figure 2: a{spectra of pedestal di erence, b; d{two type of charges, and c{charge di erence.

22

Run 2248
Ev 11 L24 W 46 dQ 872.3
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Entries Mean RMS 32 19.92 7.869

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Entries Mean RMS 32 21.32 8.206

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Ev 14 L32 W 38 dQ 54.4
100 50 0 0 10 20 30
Entries Mean RMS 32 12.22 7.170

Ev 15 L33 W 26 dQ 52.4
20 10 0 0 10 20 30
Entries Mean RMS 32 14.58 7.911

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Entries Mean RMS 32 13.62 7.417

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Entries Mean RMS 32 19.10 7.316

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Figure 3: Waveforms for the case of large di erence in charge ( Q 50 fC=2). 23

Run 2248
Waveforms
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91057 26.09 4.423

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Entries Mean RMS 91057 0.1879 1.446

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Entries Mean RMS 91057 7.633 3.707

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Last sample spectrum

Waveforms
30000 20000 10000 0 0 10 20 30 40 50

Alast sample, ADC count

Figure 4: Waveform quality control histograms.

24

Waveform quality test

Pbi-linear , in %
1900 1950 2000 2050 2100

Povrefow , in %

12 10 8 6 4 2 0

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High Voltage, V

1900

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Figure 5: Dependences of \bad" waveform probabilities on high voltage.

25

ADC counts

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Noverflow 31 Level 31

20
Pmeasured

TDC-samples A32

Reference pedestal

10 15 20 25 30

Sample No.
Figure 6: Defenitions some of the waveform parameters.

Run 2248
A32 , ADC count

25 20 15 10 5 0 0 2000

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ENTRIES 0. 1.00 0.

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ENTRIES 0. 0. 0.

620. 0.894E+05 0.

90165 133. 0. 0.

4000

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Figure 7: Scatter plots of A32 versus charge Q (a) and Noverflow 63 (b). 26

Run 2248
Q, fC/2

5000 4000 3000 2000 1000 0 0 1000

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Q / <Q>

Q / <Q>

0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 0 1000 2000

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0.25 0.2 0.15 0.1 0.05 0

(d)

Clipped Q, fC/2

3000

10

Noverflow 31

Figure 8: a { correlations between charge Q and clipped charge Qclip. Points with errors are the mean pro le of this distribution. Fitted curve is a six-order polynom. b { relative width of charge distribution versus clipped charge. c { correlations of charge Q and number of over owed samples Noverflow 31 . Points with errors are the mean pro le of this distribution. Fitted curve is a second-order polynom. d { relative width of charge distribution versus Noverflow 31 . 27

Run 2248
(a)
Q corr. / <Qcorr.> Qcorr. , fC/2
6000 5000 4000 3000 2000 1000 0 0 2000 4000 6000 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 0 2000 4000 6000

(b)

Q, fC/2

Q, fC/2

Figure 9: a { corrected charge Qcorr: as a function of total charge Q. Points with errors are the mean pro le of this distribution tted by the straight line. b { relative width of the corrected charge distribution versus total charge.
Q corr. / <Qcorr.>
0.25 0.2 0.15 0.1 0.05 0
- (Q1+Q2)/2 - Q1(Nover.31) - Q2(Qclip.31)

500 1000 1500 2000 2500 3000

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Figure 10: Relative width of the corrected charge distribution versus total charge for three cases of charge reconstruction. 28

Run 268
Events

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Figure 11: Spectra of several ntuple parameters for track selection.

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10

Figure 12: Spectra of transverse momentum PT , momentum P and and their normalized integrals (b; d; f ) respectively.

(a; c; e) in logarithmic scale

30

Events

Hits

1500

Entries Mean RMS

42801 0.3262 0.2143

Entries Mean RMS

664781 -10.81 122.4

30000 20000 500 10000 0 -180

1000

0.2

0.4

0.6

0.8

|sin|

-90

, degree

90

180

Figure 13: Distribution of two-track events versus jsin j.

Figure 14: Distribution of two-track events versus entrance angle .

|sin|

0.8 0.6 0.4 0.2 0 1 10 10

2 3

, degree

180 90 0 -90

-180 1 10 10

10

10

Figure 15: Scatter plot of jsin j versus for 20 K events.

Figure 16: Scatter plot of entrance angle versus for 1000 events. Each event is presented by vertical strike of dots, corresponding to the track hits. 31

Run 268
Wire
250

200

150

100

50

10

15

20

25

30

35

Layer

40

Events per wire

Figure 17: Occupancy (statistics per each wire).

32

Runs 268-272
Spectrum for L 1 W 25
400 200 0 0 500
Entries Mean RMS Constant Mean Sigma 5751 644.5 560.8 22.77 / 15 377.5 487.6 312.0

Spectrum for L 2 W 25
400 200 0 0 500
Entries Mean RMS 32.32 Constant Mean Sigma 5666 570.7 505.7 / 15 436.0 443.4 271.7

1000 1500 2000 2500

1000 1500 2000 2500

Spectrum for L 3 W 25
400 200 0 0 500
Entries Mean RMS Constant Mean Sigma 5801 622.3 478.0 37.66 / 15 405.7 495.2 285.3

Spectrum for L 4 W 25
Entries Mean RMS

200 0

17.81 Constant Mean Sigma

5547 860.0 662.0 / 15 297.4 699.9 321.0

1000 1500 2000 2500

500

1000 1500 2000 2500

Spectrum for L 5 W 25
Entries Mean RMS

Spectrum for L 6 W 25
400 200 0 0 500
Entries Mean RMS 53.07 Constant Mean Sigma 4810 563.6 523.3 / 15 360.7 397.8 293.1

200

Constant Mean Sigma

5091 879.7 671.4 29.30 / 15 262.7 703.9 325.5

500

1000 1500 2000 2500

1000 1500 2000 2500

Spectrum for L 7 W 25
400 200 0 0 500
Entries Mean RMS Constant Mean Sigma 4936 614.5 513.6 54.70 / 15 350.0 472.6 283.8

Spectrum for L 8 W 25
Entries Mean RMS

200

10.56 Constant Mean Sigma

4943 790.0 585.7 / 15 276.5 632.5 326.0

1000 1500 2000 2500

500

1000 1500 2000 2500

Spectrum for L 9 W 25
200 100 0 0 500
Entries Mean RMS Constant Mean Sigma 4442 848.8 659.7 17.18 / 15 246.1 660.6 311.0

Spectrum for L 10 W 25
Entries Mean RMS 33.91

200 0

Constant Mean Sigma

4393 566.5 496.3 / 15 325.0 361.9 326.2

1000 1500 2000 2500

500

1000 1500 2000 2500

Figure 18: Spectra of raw Q cos for several wires. Corrections were not applied.

33

Runs 268 - 281

Spectrum for L 1 W 25
1000 500 0 0 500
Entries Mean RMS Constant Mean Sigma 11106 720.2 576.1 41.02 / 10 982.7 553.4 189.5

Spectrum for L 2 W 25
1000 500 0 0 500
Entries Mean RMS Constant Mean Sigma 11001 676.9 522.2 48.13 / 10 1060. 540.4 182.3

1000 1500 2000 2500

1000 1500 2000 2500

Spectrum for L 3 W 25
1000 500 0 0 500
Entries Mean RMS Constant Mean Sigma 11185 673.6 527.1 103.6 / 10 1076. 536.9 179.0

Spectrum for L 4 W 25
1000 500 0 0 500
Entries Mean RMS Constant Mean Sigma 10708 662.1 517.9 161.8 / 10 1081. 527.4 172.0

1000 1500 2000 2500

1000 1500 2000 2500

1000 500 0

Spectrum for L 5 W 25
Entries Mean RMS Constant Mean Sigma 9889 661.7 474.8 68.20 / 10 927.1 529.1 186.3

Spectrum for L 6 W 25
Entries Mean RMS 52.16

500 0

Constant Mean Sigma

9325 675.5 544.6 / 10 895.1 530.3 180.9

500

1000 1500 2000 2500

500

1000 1500 2000 2500

Spectrum for L 7 W 25
1000 500 0
Entries Mean RMS Constant Mean Sigma 9549 651.6 521.3 128.5 / 10 947.1 512.0 175.0

Spectrum for L 8 W 25
1000 500 0
Entries Mean RMS 94.60 Constant Mean Sigma 9472 660.5 493.1 / 10 912.7 520.1 181.3

500

1000 1500 2000 2500

500

1000 1500 2000 2500

Spectrum for L 9 W 25
Entries Mean RMS

Spectrum for L 10 W 25
Entries Mean RMS

500 0

Constant Mean Sigma

8254 660.2 499.1 60.50 / 10 770.6 519.6 187.7

500 0

66.04 Constant Mean Sigma

8247 661.3 518.9 / 10 741.7 514.1 196.8

500

1000 1500 2000 2500

500

1000 1500 2000 2500

Figure 19: Spectra of Q cos for several wires. Wire-to-wire gain, doca and dip angle corrections were applied.

34

Runs 268-272
Sum of single wire spectra Hits
8000 6000 4000
Entries Mean RMS P1 P2 P3 P4 14113946 705.7 608.5 0.3632E+06/ 196 419.2 188.3 0.1480E+07 2.839

Hits

x 10

2 10 Sum

Run 268
of single wire spectra
Entries Mean RMS P1 P2 P3 P4 2993198 632.9 491.7 0.8770E+05/ 196 511.8 108.4 0.4395E+06 1.975

3000

2000

1000 2000 0 0 1000 2000 3000 4000 0 0 1000 2000 3000 4000

Figure 20: Spectrum of raw Q cos summarized for all wires. Corrections were not applied. Fitted curve is Moyal analytical form for Landau distribution approximation.
Run 268
Mean charge
600 400 200 0 0 20 40 60 80 100 120

Q cos

Figure 21: Spectrum of Q cos summarized for all wires. Wire to wire gain, doca and dip angular corrections were applied. Fitted curve is Moyal analytical form for Landau distribution approximation.
Run 268
<Q cos>
800 700 600 500

Q cos

Layer 10

Layer 10
71.67 A0 / 127 643.8

20

40

60

80
A0

100
962.8

120

Events per layer Mean charge

1000 750 500 250 0 5 10 15 20 25 30 35

Wire <Q cos>

700 680 660 640 620

Events per layer

Wire
/ 39 635.1

40

600

10

15

20

25

30

35

40

Figure 22: Intermediate results of wire-towire gain calibration: top gure | < Q cos > vs wire number for one of the layers, bottom gure | < Q cos > vs layer number. Statistical errors are shown.

Layer

Figure 23: The same, that in Fig. 22, but wire-to-wire gain, doca and dip angle corrections were applied. 35

Layer

Layer 3 Q cos
900 800 700 0 0.2
P1 P2 P3 P4 P1 P2 P3 P4 330.3 / 42 676.1 698.3 -1034. 583.2

Run 268
Q cos
1200 1000 800 600
P1 P2 P3 P4 95.73 / 43 661.6 -57.89 126.7 -91.71

Layer 3

0.4

0.6

0.8

Layer 4 Q cos
900 800 700 0 0.2 0.4 0.6 0.8
295.7 / 42 668.2 774.6 -1114. 605.4

|sin|

400

0
P1 P2 P3 P4

0.2
80.66

0.4
/ 43 675.6 -66.07 108.5 -58.22

0.6

0.8

Q cos

1200 1000 800 600

Layer 5

|sin|

|sin|

400

0.2

0.4

0.6

0.8

|sin|

Figure 24: Dependence of Q cos on jsin j for two layers. Wire-to-wire gain correction was applied.
Layers with lower gain Q cos
900 800 700 0 0.2 0.4 0.6 0.8

Figure 25: Dependence of Q cos on jsin j for two layers. Wire-to-wire gain, doca and dip angle corrections were applied.
1200 1000 800 600 1 400 0 0.2 0.4 0.6 0.8 1

Layers with lower gain

Run 268

Layers with higher gain Q cos

900 800 700 0 0.2 0.4 0.6 0.8

|sin|

Q cos

Q cos

1200 1000 800 600

Layers with higher gain

|sin|

|sin|

400

0.2

0.4

0.6

0.8

|sin|

Figure 26: Dependence of Q cos on jsin j. for all layers. Wire-to-wire gain correction was applied. 36

Figure 27: Dependence of Q cos on jsin j for all layers. Wire-to-wire gain, doca and dip angle corrections were applied.

Layer 3 Q cos
1773. A0 A1 A2 A3 A4 A5 A6 A7

Run 268
/ 14 1007. -13.84 -1380. 247.7 1405. -528.7 -757.3 290.2

Layer 3
137.9 A0 A1 A2 A3 A4 A5 A6 A7 / 14 645.1 4.391 -169.7 -56.42 606.1 146.9 -505.8 -99.52

1000 750 500 250 0 -1 0

Q cos

1000 750 500 250 0 -1 0

Layer 5 Q cos
1000 750 500 250 0 -1 0
A0 A1 A2 A3 A4 A5 A6 A7

Doca / dl
4680. / 14 959.0 267.3 -879.6 -819.2 473.1 891.4 -317.7 -324.5

Layer 5 Q cos
1000 750 500 250 0 -1 0
A0 A1 A2 A3 A4 A5 A6 A7

Doca / dl
747.6 / 14 645.0 -10.92 -207.1 98.86 702.1 -222.3 -567.9 138.4

Doca / dl

Doca / dl

Figure 28: Dependence of Q cos on normalized doca for two layers. Wire-to-wire gain correction was applied.
Layers with lower gain Q cos
1000 750 500 250 0 -1 0 1

Figure 29: .Dependence of Q cos on normalized doca for two layers. Wire-to-wire gain, doca and dip angle corrections were applied.
Layers with lower gain Q cos
1000 750 500 250 0 -1 0 1

Run 268

Layers with higher gain Doca / dl Q cos

1000 750 500 250 0 -1 0 1

Layers with higher gain Doca / dl Q cos

1000 750 500 250 0 -1 0 1

Doca / dl

Doca / dl

Figure 30: Dependence of Q cos on normalized doca for all layers. A t for the 40-th layer is plotted in both gures and it is di erent from all other curves. Wire-to-wire gain correction was applied.

Figure 31: Dependence of Q cos on normalized doca for all layers. Wire-to-wire gain, doca and dip angle corrections were applied. 37

Run 268
Q cos
1200 1000 800 600 400
P1 P2 P3 P4 83.25 / 42 632.6 374.5 -135.9 20.30

Layer 3

dE/dx
0.6 0.8

600 500

0
P1 P2 P3 P4

0.2

0.4

Q cos

1200 1000 800 600 400 0

Layer 4
118.3 / 42 637.1 212.7 420.9 -397.6

|sin|

1/2

400 300 10 10

10

0.2

0.4

0.6

0.8

|sin|

1/2

Figure 32: Dependence of Q cos on jsin j1=2 for two layers. Wire-to-wire gain correction was applied. Straight line could be used for approximation.

Figure 33: Scatter plot of dE=dx versus for 10 K events of run 268. Systematic corrections: wire-to-wire gain; dip angle; doca as well as 10%:25% truncated mean were applied to dE=dx.

38

Band 4: 1.99526<<2.51189
40.30

1.4

100 0 500 0 1000 0 1000 0 1000

P1 P2 P3

I / Imin

/ 25 137.2 406.8 33.78

- I defined as mean - m.p. from Gaussian

1.3 1.2 1.1

Band 8: 5.01187<<6.30957
114.7 P1 P2 P3 / 20 690.6 392.1 29.77

Band 12: 12.5893<<15.8489

87.48 P1 P2 P3 / 23 1223. 422.6 -29.90

1 10 10
2

Band 16: 31.6228<<39.8107

106.3 P1 P2 P3 / 25 1389. 465.8 30.74

Band 20: 79.4328<<100

60.82 P1 P2 P3 / 21 949.0 497.3 32.25

Figure 35: Relative dE=dx versus . For open circles I and were de ned as Mean and RMS values; black dots | dE=dx distribution for each bin was tted by Gaussian and its parameters were used for I and .

10

Band 24: 199.526<<251.189

P1 P2 P3

0.1

250 0 100

/I

35.70

/ 22 402.5 513.5 33.18

- / m.p. from Gaussian

0.09
- RMS / Mean

Band 28: 501.187<<630.957

17.33 P1 P2 P3 / 20 102.1 521.7 34.41

0.08 0.07

Events

Band 32: 1258.93<<1584.89

11.16 P1 P2 P3 / 18 28.38 526.7 33.24

25 0 0 200 400 600

0.06 0.05 10 10
2

800

1000

dE/dx

Figure 34: dE=dx spectra for several bins of . Gaussian t is used for de nition of the most probable and width ( ) of distribution. 39

Figure 36: dE=dx resolution for the cases presented in Fig. 35.

10

a) <dE/dx>
0.6 0.4 0.2 0

b) dE/dx / <dE/dx>

2000 1500 1000 500 0

N 20 lo
w dis c.

20 0 0

N high disc

arded

N 20 lo
w dis c.

20 0 0

N high disca

rded

c) Detailed map
dE/dx / <dE/dx> Nlow discarded
10 8 6 4 0.08 2 0 10 0.06 0.14 0.12 0.1

d) Bands through the min.

- high ampl. discarded

- low ampl. discarded

Nhigh discarded

15

10

20

Ndiscarded

30

Figure 37: Truncated mean optimization at 2 < P < 4 GeV and Nsamples = 40. The location of the optimum does not show signi cant dependence on momentum. 40

a) <dE/dx>
800 700 600 500 400

Run 268

b) dE/dx / <dE/dx>

0.12 0.1 0.08 0.06

N 20 lo
w dis c.

20 0 0

Nh

scard igh di

ed

N 20 lo
w dis c.

20 0 0

N high disca

rded

c) Detailed map
dE/dx / <dE/dx> Nlow discarded
20 15 10 5 0.05 0 15 20 25 0.04 0.1 0.09 0.08 0.07 0.06

d) Bands through the min.

- high ampl. discarded - low ampl. discarded

Nhigh discarded

10

20

Ndiscarded

30

Figure 38: Truncated mean optimization at 2 < P < 4 GeV and Nsamples = 80. The location of the optimum con rms, that the aspect ratio for truncated mean could be used as 10% : 25% of discarded hits with lowest and highest amplitudes respectively. 41

I / I min

1.4 1.3 1.2 1.1 1 10

(a)

P1 P2 P3
2

77.03 / 11 0.5921E-01 14.04 1.000

3

10

10

I / I min

1.4 1.3 1.2 1.1 1 10

(b)

P1 P2 P3 P4 P5 10
2

194.7 / 22 0.6421E-01 12.94 0.1308E-03 -1.894 1.000

2p3

10

a)

p1

2 p3 (

p2 + 2ln(
2p5

b)

p1

2 p5 (

p2

ln(p3 + (

)p4 ))

Figure 39: Fit of the normalized ionization strength: a | approximation of Bethe-Bloch formulae 11] with additional parameter p3 ; b | modi ed approximation 12] taking into account \density e ect". 42

Run 268
RMS / <dE/dx>
0.1

(a)
0.08 0.06 0.04 10 10
2 3
- All hits of 2 tracks - 1 - st track

RMS / <dE/dx>

0.14 0.12 0.1 0.08 0.06 0.04

- No corrections - W-to-W - W-to-W and dip angle - W-to-W and doca - all corrections

10

(b)

10
Figure 40: Comparison of dE=dx resolution versus were applied in each case.

10

10

for di erent cases. 75% truncated mean

43

Run 268
RMS / <dE/dx>
0.1 0.09 0.08 0.07 0.06 0.05 10 10
- 1 - st track - |Doca/dl| < 0.9 - Nhit(1)=40 2

(a)

RMS / <dE/dx>

0.1

10

(b)
0.08 0.06 0.04 10

- All hits at layer<20 - All hits at layer>20 - All hits

10

Figure 41: Comparison of dE=dx resolution versus were applied in each case.

for di erent cases. 75% truncated mean

44

/<dE/dx>

0.09 0.08 0.07 0.06 0.05

- 35<Nhit<46, hits of 1-st track - 71<Nhit<91, edge 18 layers - 71<Nhit<91, inner 22 layers

/<dE/dx>

0.1

0.1 0.09 0.08 0.07 0.06

- 35<Nhit<46, t.m. 4 : 10 hits - 35<Nhit<46, t.m.10% : 25% - Nhit=40, t.m.10% : 25%

10

10

0.05

Figure 42: Comparison of dE=dx resolution versus for di erent cases. 10%:25% truncated mean were applied in each case.

10

10

Figure 43: Comparison of dE=dx resolution versus for di erent cases. Event selection and algorithm of truncated mean procedure are strongly in uenced for dE=dx resolution.

Run 268
dE/dx /<dE/dx>
1000 800 600 400 200 0 0 0.5 1

(a)

0.1

(b)

0.08 0.06 0.04

P1 18.08 / 17 3719.

0.02 0 0 0.5 1

|sin| |sin| Figure 44: a | scatter plot of dE=dx versus jsin j obtained at 2 < P < 4 GeV and 38 Nhit 42; b | dE=dx resolution versus jsin j, solid curve | tted expected dependence on l (amplitude p sample length) l 0:32 13]; dashed curve | statistical limit 1= l.
45

Run 268
/ <dE/dx> <dE/dx>
600
27.66 P1 P2 / 29 0.5216 0.5518

550

(a)

0.15

(b)

0.1 500 0.05 10 20 30

450

Nhits

40

10

20

30

Nhits

40

Figure 45: Dependences of a | < dE=dx > and b | dE=dx resolution on number of samples per track. Truncated mean algorithm: 3 hits with low amplitude and 25% with high amplitude are discarded. 1-st track selection conditions 2 < P < 4 GeV and initial Nhits = 40 have been applied. Each track contributes one time per each point with randomly selected set of descending in number amplitude samples. Integer number in uence at 25% truncated mean level is clearly appeared as a p2 step-wise dependence in a. Standard parameterization p1 =Nhit was used to t points in b. Rather 0:5 fast slope than Nhit is observed at small Nhit .

46

<dE/dx>

700

600

(a)
- without truncated mean - 10:25% truncated mean

500

400

10

20

30

40

50

60

70

80

Nhits

90

/ <dE/dx>

0.8 P1 P2 0.6 0.4 0.2 0

394.4 / 86 0.8042 0.4729

0.1805E-02 0.6379E-03

(b)
- without truncated mean - 10:25% truncated mean

10

20

30

40

50

60

70

80

Nhits

90

Figure 46: The same that in Fig. 45, but all hits of the event are treated as for one track without limitations on initial value Nhits 80. Track cut-o parameters: 2 < P1 < 4 GeV , jP1 P2 j < 0:2 GeV . Open circles and table of the t parameters correspond to evaluation of dE=dx without excluding of amplitude samples. Filled circles | for optimal truncated mean algorithm (10% : 25%). Detailed results of the t for truncated mean are listed in Table 1.

47

Runs 268 - 281

<Q>, fC/2
750
A0 0.4217E+05/ 512 661.2

(a)

700

650

600

100

200

300

Point/1000 events

400

500

Q / <Q>

1.4
A0 0.2770E+06/ 512 0.9638

(b)

1.2

0.8

100

200

300

Point/1000 events

400

500

Figure 47: Long term behavior of summarized spectrum mean value | a and relative r.m.s. width of spectrum | b for runs 268 281 (13:38 | 23:30 January 9, 1999). Wire to wire gain, doca and dip angular corrections were de ned for run 268 and applied for all next runs.

48

Runs 268 - 272

1 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0

Probability

250

500

750

1000

1250

1500

1750

2000

2250

Q cos

2500

Probability

a) Layers with low gain

1 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0

a) Layers with low gain

250

500

750

1000

1250

1500

1750

2000

2250

Q cos

2500

1 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0

Probability

250

500

750

1000

1250

1500

1750

2000

2250

Q cos

2500

Probability

b) Layers with high gain

1 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0

b) Layers with high gain

250

500

750

1000

1250

1500

1750

2000

2250

Q cos

2500

Q cos for 48 (of 50) slices on jsin j. Top curves correspond to jsin j 0, bottom | jsin j 1. All statistics shared between low (a) and high (b) gain layers.

Figure 48: Normalized integrated spectra of

Figure 49: The same, that in Fig. 48, but after application of considered correction.

49

Q cos

1500 1000 500 0

Q cos

2000

Layers with low gain

2000 1500 1000 500 0

Layers with high gain

0.2

0.4

0.6

0.8

|sin|

0.2

0.4

0.6

0.8

|sin|

Figure 50: Correction functions for low gain layers, which should be applied to di erent Q cos on jsin j.

Figure 51: The same that in Fig. 50 for layers with high gain.

Low gain layers

o

High gain layers Q cos / Q cos30

o

Q cos / Q cos30

1.2

1.2

0.8 0 0.2 0.4 0.6 0.8

0.8

|sin|

1
50

0.2

0.4

0.6

0.8

|sin|

Figure 52: Relative corrections to be applied for di erent Qcos on jsin j. Statistics processed for low gain layers only.

Figure 53: The same that in Fig. 52, but statistics processed for high gain layers.

P1

1200 1000 800 600 400 200 0 5 10

Entries Mean RMS

19 12.93 5.146

P2

2000 1750 1500 1250 1000 750 500 250

Entries Mean RMS

19 14.45 4.488

Index of prob. level

Entries Mean RMS 19 14.22 4.535

15

20

Index of prob. level

Entries Mean RMS 19 13.44 4.744

10

15

20

P3

P4

-500 -1000 -1500 -2000 -2500 -3000 5

1400 1200 1000 800 600 400 200

Index of prob. level

10

15

20

Index of prob. level

10

15

20

Figure 54: Fit parameters versus probability level number. Solid line histogram | for low gain layers, dashed | for high gain layers.

51

I / I min

1.3 1.2 1.1

- Old corr. o - New corr. =30 - New corr. =0o

/I

1.4

0.09
- Old corr.

0.08 0.07 0.06

- New corr.=30o - New corr.=0

o

1 10 10
2

10

0.05 10 10

10

Figure 55: Normalized distributions of ionization lose strength versus for three types of dip angle corrections.

Figure 56: dE=dx resolution versus three types of dip angle corrections.

for

I / I min , IK / I min

- -K

1.4

1.2

1 10
-1

10

P , GeV

10

Figure 57: Expected mean ionization strength versus momentum of and K . 52

|IK - I| /

15 10 5 0 1 10
- Old corr. - New corr. =30o o - New corr. =0

|IK - I| /

20

1.5 1 0.5 0 1
- Old corr. - New corr. =30 - New corr. =0
o o

P , GeV

10

P , GeV

10

Figure 58: Expected K = separation as a function of momentum for three types of dip angle corrections.

Figure 59: The same that in Fig. 58, zoomed at P > 1 GeV .

53

Simulation
Events
Entries Mean RMS 100000 20.00 4.466

Events

10000

10 6 10 5

Entries Mean RMS

1999624 1.945 10.29

7500

(a)
5000

10 4 10 3

(b)

2500

10 2 10 10 20 30 40

50

20

40

60

80

100

Events

10

Entries Mean RMS

3888745 0.4990E+05 0.4948E+05

Events

8000 6000

Entries Mean RMS

100000 1.747 1.028

10 4 10 3 10 2 0 1000

(c)
4000 2000 0 0

(d)

2000

3000

4000 Gas gain10 2 x

Q / <m> / <Gain>

Figure 60: Intermediate distributions at simulation of single cell spectra: a | simulated Poisson distribution P<m> (m) for mean number of primary electrons per track < m >= 20; b | simulated cluster size distribution 19] for case of He; c | simulated Yule-Furry (exponential) distribution of gas gain uctuations with mean value 5 104 ; d | simulated spectrum of number of electrons per cluster: dashed histogram shows the spectra without gas gain uctuations (Gain = 1), hatched histogram | all indicated statistical contributions are taken in to account.

54

0.5

Mean RMS

1.736 1.699

0.05

Mean RMS

2.127 2.001

<m> = 1
0 0.2
Mean RMS 1.490 1.415

<m> = 1
0 0.05
Mean RMS 1.722 1.640

<m> = 2
0 0.1
Mean RMS 1.517 1.176

<m> = 2
0 0.05
Mean RMS 1.611 1.286

<m> = 5
0 0.05
Mean RMS 1.623 1.051

<m> = 5
0 0.05
Mean RMS 1.672 1.124

<m> = 10
0 0.05 0 0.1
Mean RMS 1.727 1.003

<m> = 10
0 0.05 0 0.1
Mean RMS 1.752 1.038

<m> = 20
Mean RMS 1.839 0.9531

<m> = 20
Mean RMS 1.846 0.9612

<m> = 50
0 0.1
Mean RMS 1.935 0.9869

<m> = 50
0 0.1
Mean RMS 1.942 0.9851

<m> = 100
Probability
Mean RMS 1.898 0.3214

<m> = 100
Probability
0 0.1 0
Mean RMS 1.904 0.3295

0 0.2

<m> = 1000
0 0 1 2 3 4 5 6 7 8

<m> = 1000
0 1 2 3 4 5 6

n / <m>

10

Q / <m> / <Gain>

10

Figure 61: Evolution of simulated spectra for several values of < m >. Gas gain uctuations are not accounted.

Figure 62: The same that in Fig. 61, but gas gain uctuations are taken in to account at < Gain >= 5 104 .

55

 and Qm.p. in Q/<m>/<Gain>

1.5

(a) - Qm.p. -

0.5

0 10 1 0.8 0.6 0.4 0.2 0 10 10 10

<m>

10

/ Qm.p.

(b)

<m>

10

Figure 63: a | dependence of the most probable charge and the width of spectral distribution on < m >; b | relative width of the spectra as a function of < m >.

56

(a)
90000 80000 70000 60000 50000 40000 30000 20000 10000 0 1000 20 30 2250 2000 1750 1500 1250 1000 750 500 250 0 1000

(c)

Q
co r.

10 0

Index
Qcor.
1500

Q
co r.

10 0

20

30

Index

Qcor.

1500

(b)

(d)

1000

1000

500

500

10

15

20

25

10

15

20

25

Index

Index

Figure 64: Single cell spectra of corrected charge versus index of band (proportional to ln ). a; b | sum of spectra of all drift cells; c; d | sum of spectra of 1-st layer drift cells.

57

Band 4: 1.99526<<2.51189
0.1
452.4 P1 P2 P3 P4 / 15 0.1010 410.2 190.4 0.2944

0 0.1

Band 8: 5.01187<<6.30957
1550. P1 P2 P3 P4 / 15 0.1112 393.9 175.1 0.3201

0 0.1

Band 12: 12.5893<<15.8489

2830. P1 P2 P3 P4 / 15 0.1094 429.2 176.7 0.2900

0 0.1

Band 16: 31.6228<<39.8107

3371. P1 P2 P3 P4 / 15 0.1038 481.6 184.0 0.2438

0 0.1

Band 20: 79.4328<<100

P1 P2 P3 P4 2572. / 15 0.9937E-01 520.0 190.2 0.2108

0 0.1

Band 24: 199.526<<251.189

P1 P2 P3 P4 1023. / 15 0.9633E-01 537.9 195.3 0.1999

0 0.1

Band 28: 501.187<<630.957

P1 P2 P3 P4 303.6 / 15 0.9363E-01 549.2 200.1 0.1854

Probability

Band 32: 1258.93<<1584.89

P1 P2 P3 P4 62.92 / 15 0.9347E-01 556.4 199.5 0.1722

Parameterization function: ! 1 log2 + p2 ; f (Q) = p1 exp 2 p2 4 4 where

0.1

500

1000

1500

2000

2500

Qcor.

p2 = 1 + sinh(p4 ln4) Q p p2 : ln4 3

Figure 65: Fit of single cell spectra obtained for di erent bands of .

58

Ratios

1.6

1.4

(a)

1.2

- Qm.p. / Qm.p., min - / min

1 10 10
2

0.8

10

10

/ Qm.p.

0.5

0.45

(b)

0.4

0.35

0.3 1 10 10

10

10

Figure 66: Dependence of spectral t parameters on for: a | most probable corrected charge and width of spectral distribution, both normalized on its minimal values; b | relative width of spectral distribution. Spectra of all drift cells were summarized together, but similar dependence with increased statistical errors were also observed for spectra summarized for each layer.

59