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H11AA814 SERIES
PACKAGE
H11A617 SERIES
H11A817 SERIES
H11AA814 SCHEMATIC
4 COLLECTOR
4
2 3 EMITTER
DESCRIPTION
The H11AA814 Series consists of two gallium arsenide infrared emitting diodes, connected in inverse parallel, driving a single silicon phototransistor in a 4-pin dual in-line package. The H11A617 and H11A817 Series consists of a gallium arsenide infrared emitting diode driving a silicon phototransistor in a 4-pin dual in-line package.
ANODE 1
4 COLLECTOR
FEATURES
Compact 4-pin package Current transfer ratio in selected groups: H11AA814: 20-300% H11A817: H11AA814A: 50-150% H11A817A: H11A617A: 40%-80% H11A817B: H11A617B: 63%-125% H11A817C: H11A617C: 100%-200% H11A817D: H11A617D: 160%-320% Minimum BVCEO of 70V guaranteed 50-600% 80-160% 130-260% 200-400% 300-600%
CATHODE 2
3 EMITTER
APPLICATIONS
H11AA814 Series AC line monitor Unknown polarity DC sensor Telephone line interface H11A617 and H11A817 Series Power supply regulators Digital logic inputs Microprocessor inputs
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H11A617 SERIES
Symbol Device
H11A817 SERIES
Value Units
ELECTRICAL CHARACTERISTICS (TA = 25C Unless otherwise specied.) INDIVIDUAL COMPONENT CHARACTERISTICS
Parameter EMITTER Input Forward Voltage Reverse Leakage Current DETECTOR Collector-Emitter Breakdown Voltage Emitter-Collector Breakdown Voltage Test Conditions Symbol (IF = 60 mA) (IF = 20 mA) (IF = 20 mA) (VR = 6.0 V) (VR = 5.0 V) (IC = 1.0 mA, IF = 0) (IE = 100 A, IF = 0) IR VF Device H11A617A/B/C/D H11A817/A/B/C/D H11AA814/A H11A617A/B/C/D H11A817/A/B/C/D Min Typ* 1.35 1.2 1.2 .001 Max 1.65 1.5 1.5 10 A V Unit
BVCEO BVECO
70 6 7 6
100
10
ICEO CCE
1 8
100 50
nA pF
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ISOLATION CHARACTERISTICS
Characteristic Input-Output Isolation Voltage (note 3) Isolation Resistance Isolation Capacitance *Typical values at TA = 25C. NOTES 1. Current Transfer Ratio (CTR) = IC/IF x 100%. 2. For test circuit setup and waveforms, refer to Figure 8. 3. For this test, Pins 1 and 2 are common, and Pins 3 and 4 are common. Test Conditions f = 60Hz, t = 1 min (VI-O = 500 VDC) (VI-O = 0, f = 1 MHz) Symbol VISO RISO CISO Min 5300 1011 0.5 Typ* Max Units Vac(rms) pf
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H11A617 SERIES
NORMALIZED CTR CTR NORMALIZED @ IF = 5 mA, VCE = 5 V, TA = 25C
H11A817 SERIES
Fig. 2 Normalized CTR vs. Ambient Temperature
1.2
IF = 10 mA
1.2
NORMALIZED CTR
0.8
IF = 5 mA
0.8
0.6
0.4
0.6
0.2
0.4 -50 -25 0 +25 +50 +75 +100 TA - AMBIENT TEMPERATURE (C)
1.7
.12
1.5
.1
1.3
T = -55C
.08
1.1
T = 25C
.06
.04
0.9
T = 100C
.02
0.7
0 -50
0.5 -25 0 25 50 75 100 125 0.1 0.2 0.5 1.0 2.0 5 10 20 50 100 TA - AMBIENT TEMPERATURE (C) IF - FORWARD CURRENT (mA)
IF = 20 mA
20
15
IF = 10 mA
10
IF = 5 mA
IF = 1 mA
0 0 1 2 3 4 5 6 7 8 9 10
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H11A617 SERIES
H11A817 SERIES
Fig. 7 Rise and Fall Time vs. Load Resistor
10
VCE = 10 V
1000
IF = 5 mA VCC = 5 V TA = 25C
toff tf
10-1
100
10-2
10
10-3
10-4
1
tr
ton
10-5
TEST CIRCUIT
VCC = 10V
WAVE FORMS
INPUT PULSE
IF INPUT
IC
RL = 100
10% 90% OUTPUT PULSE
OUTPUT
tr Adjust IF to produce IC = 2 mA
tf
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SEATING PLANE
SEATING PLANE
0.020 (0.51) MIN 0.016 (0.40) 0.008 (0.20) 0.300 (7.62) typ
0.100 (2.54) TYP
0.070 (1.78)
0.270 (6.86) 0.250 (6.35)
0.060 (1.52)
SEATING PLANE
0.004 (0.10) MIN 0.400 (10.16) TYP 0 to 15 0.016 (0.40) 0.008 (0.20)
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H11A617 SERIES
H11A817 SERIES
MARKING INFORMATION
V X YY T
3
814
1
Denitions
1 2 3 4 5 6 Fairchild logo Device number VDE mark (Note: Only appears on parts ordered with VDE option See order entry table) One digit year code Two digit work week ranging from 01 to 53 Assembly package code
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H11A617 SERIES
H11A817 SERIES
0.1 MAX
10.30 0.20
1.6 0.1
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DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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