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DRV8305
SLVSCX2A AUGUST 2015 REVISED SEPTEMBER 2015

DRV8305 Three Phase Gate Driver With Current Shunt Amplifiers and Voltage Regulator
1 Features

3 Description

The DRV8305 is a gate driver IC for three phase


motor drive applications. It provides three highaccuracy trimmed and temperature compensated half
bridge drivers, each capable of driving a high-side
and low-side N-type MOSFET.

4.4-V to 45-V Operating Voltage


1.25-A/1-A Peak Gate Driver Currents
Programmable, Independent HS/LS Slew
Rate/Slope Control
Charge Pump Gate Driver for 100% Duty Cycle
Three Integrated Current Shunt Amplifiers
Integrated 50-mA LDO (3.3-V/5-V Option)
Control of 3-PWM or 6-PWM Inputs up to 200 kHz
Built-In Commutation Tables for Using 1 PWM
Programmable Dead Time
MOSFET Shoot Through Prevention
Programmable VDS Protection of MOSFETs
Reverse Battery Protection Support
Supports Both 3.3-V/5-V Digital Interface
SPI Interface
Thermally Enhanced 48-Pin QFP (7 7 mm)
Protection Features
VM Undervoltage Lockout (UVLO2)
Logic Undervoltage (UVLO1)
Charge Pump Undervoltage (CPUVL)
Temperature Warnings and Shutdown
Watchdog Timer

A charge pump driver supports 100% duty cycle and


low voltage operation. The gate driver can also
handle load dumps up to 45 V.
The gate driver uses automatic handshaking when
switching to prevent current shoot through. Accurate
VDS of both the high-side and low-side MOSFETs
conditions are sensed to protect external MOSFETs
during over current.
The DRV8305 includes three current shunt amplifiers
for accurate current measurements that support bidirectional current sensing with adjustable gain.
The DRV8305 has an integrated voltage regulator
and controller to support a MCU or additional system
power needs.
The SPI provides detailed fault reporting and flexible
parameter settings such as gain options for the
current shunt amplifier, slew rate control of the gate
drivers, various protection features.
Device Information
PART NUMBER

PACKAGE

BODY SIZE (NOM)

2 Applications

DRV8305

(1) For all available packages, see the orderable addendum at


the end of the data sheet.

3 Phase BLDC and PMSM Motors


CPAP and Pumps
Robotics and RC Toys
Power Tools
Industrial Automation

HTQFP (48)

(1)

7.00 mm 7.00 mm

Simplified Schematic

4.4 to 45 V

MCU

PWM
SPI

Shunt Amps
nFAULT

DRV8305
3-Phase
Brushless
Pre-Driver

Gate Drive

LDO

Sense

N-Channel
MOSFETs

EN_GATE

Shunt Amps
Protection

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.

DRV8305
SLVSCX2A AUGUST 2015 REVISED SEPTEMBER 2015

www.ti.com

Table of Contents
1
2
3
4
5
6

Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
6.1
6.2
6.3
6.4
6.5
6.6
6.7

1
1
1
2
3
5

Absolute Maximum Ratings ...................................... 5


ESD Ratings.............................................................. 5
Recommended Operating Conditions....................... 6
Thermal Information .................................................. 6
Electrical Characteristics........................................... 7
SPI Timing Requirements (Slave Mode Only) ........ 13
Typical Characteristics ............................................ 14

Detailed Description ............................................ 15


7.1 Overview ................................................................. 15
7.2 Functional Block Diagram ....................................... 16
7.3 Feature Description................................................. 17

7.4 Device Functional Modes........................................ 28


7.5 Programming........................................................... 30
7.6 Register Maps ......................................................... 31

Application and Implementation ........................ 39


8.1 Application Information............................................ 39
8.2 Typical Application ................................................. 40

Power Supply Recommendations...................... 44


9.1 Bulk Capacitance ................................................... 44

10 Layout................................................................... 45
10.1 Layout Guidelines ................................................. 45
10.2 Layout Example .................................................... 45

11 Device and Documentation Support ................. 46


11.1
11.2
11.3
11.4

Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................

46
46
46
46

12 Mechanical, Packaging, and Orderable


Information ........................................................... 46

4 Revision History
Changes from Original (August 2015) to Revision A

Page

Change the Electrical Characteristics Condition From: TJ = 40C to 150C To: TA = 25C ............................................... 7

Changed Table 18 - Bit 10 , 9, and 8 DEFAULT From: = 0x1 To: 0x0 ............................................................................... 37

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SLVSCX2A AUGUST 2015 REVISED SEPTEMBER 2015

5 Pin Configuration and Functions

37

38

39

40

41

42

43

44

45

46

36

35

34

33

32

1
2 PAD
POWER
3
(GND)

6
7

31
30

29

24

23

22

21

GHA
SHA
SLA
GLA
GLB
SLB
SHB
GHB
GHC
SHC
SLC
GLC

PWRGD
GND
AVDD
SO1
SO2
SO3
SN3
SP3
SN2
SP2
SN1
SP1

20

25
19

12
18

26
16

11
15

27

14

28

13

9
10

17

EN_GATE
INHA
INLA
INHB
INLB
INHC
INLC
nFAULT
nSCS
SDI
SDO
SCLK

47

48

VREG
WAKE
DVDD
GND
VDRAIN
CP1H
CP1L
PVDD
CP2L
CP2H
VCPH
VCP_LSD

PHP Package
48-Pin HTQFP
Top View

Pin Functions
PIN
NO.

NAME

I/O

DESCRIPTION

EN_GATE

Enable gate

Enables the gate driver and current shunt amplifiers; internal


pulldown

INHA

Bridge PWM input

PWM input signal for bridge A high-side

INLA

Bridge PWM input

PWM input signal for bridge A low-side

INHB

Bridge PWM input

PWM input signal for bridge B high-side

INLB

Bridge PWM input

PWM input signal for bridge B low-side

INHC

Bridge PWM input

PWM input signal for bridge C high-side

INLC

Bridge PWM input

PWM input signal for bridge C low-side

nFAULT

OD

Fault indicator

When low indicates a fault has occurred; open drain; external


pullup to MCU power supply needed (1 k to 10 k)

nSCS

SPI chip select

Select/enable for SPI; active low

10

SDI

SPI input

SPI input signal

11

SDO

SPI output

SPI output signal; referred to VREG

12

SCLK

SPI clock

SPI clock signal

13

PWRGD

Power Good

VREG and MCU watchdog fault indication; open drain; external


pullup to MCU power supply needed (1 k to 10 k)

OD

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SLVSCX2A AUGUST 2015 REVISED SEPTEMBER 2015

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Pin Functions (continued)


PIN
NO.

NAME

I/O

DESCRIPTION

14
45

GND

Device ground

Must be connected to ground

15

AVDD

Analog regulator

5.0 V analog internal supply regulator; bypass to GND with a 6.3V, 1-F ceramic capacitor

16

SO1

Current amplifier output

Output of current sense amplifier 1

17

SO2

Current amplifier output

Output of current sense amplifier 2

18

SO3

Current amplifier output

Output of current sense amplifier 3

19

SN3

Current amplifier negative input

Negative input of current sense amplifier 3

20

SP3

Current amplifier positive input

Positive input of current sense amplifier 3

21

SN2

Current amplifier negative input

Negative input of current sense amplifier 2

22

SP2

Current amplifier positive input

Positive input of current sense amplifier 2

23

SN1

Current amplifier negative input

Negative input of current sense amplifier 1

24

SP1

Current amplifier positive input

Positive input of current sense amplifier 1

25

GLC

Low-side gate driver

Low-side gate driver output for half-bridge C

26

SLC

Low-side source connection

Low-side source connection for half-bridge C

27

SHC

High-side source connection

High-side source connection for half-bridge C

28

GHC

High-side gate driver

High-side gate driver output for half-bridge C

29

GHB

High-side gate driver

High-side gate driver output for half-bridge B

30

SHB

High-side source connection

High-side source connection for half-bridge B

31

SLB

Low-side source connection

Low-side source connection for half-bridge B

32

GLB

Low-side gate driver

Low-side gate driver output for half-bridge B

33

GLA

Low-side gate driver

Low-side gate driver output for half-bridge A

34

SLA

Low-side source connection

Low-side source connection for half-bridge A

35

SHA

High-side source connection

High-side source connection for half-bridge A

36

GHA

High-side gate driver

High-side gate driver output for half-bridge A

37

VCP_LSD

Low-side gate driver regulator

Internal voltage regulator for low-side gate driver; connect 1-F


capacitor to GND

38

VCPH

High-side gate driver regulator

Internal voltage regulator for high-side gate driver; connect 2.2-F


capacitor to PVDD

39

CP2H

40

CP2L

Charge pump flying capacitor

Flying capacitor for charge pump; connect 0.047-F capacitor


between CP2H and CP2L

PPAD

External Components
COMPONENT

PIN 1

PIN 2

RECOMMENDED

CPVDD

PVDD

GND

4.7-F ceramic capacitor rated for 50 V

CAVDD

AVDD

GND

1.0-F ceramic capacitor rated for 6.3 V

CDVDD

DVDD

GND

1.0-F ceramic capacitor rated for 6.3 V

CVCPH

VCPH

PVDD

2.2-F ceramic capacitor rated for 16 V

CVCP_LSD

VCP_LSD

GND

1.0-F ceramic capacitor rated for 16 V

CCP1

CP1H

CP1L

0.047-F ceramic capacitor rated for 16 V

CCP2

CP2H

CP2L

0.047-F ceramic capacitor rated for 16 V

CVREG

VREG

GND

1.0-F ceramic capacitor rated for 6.3 V

RVDRAIN

VDRAIN

PVDD

100- series resistor

RnFAULT
(1)

nFAULT

VCC

(1)

1 to 10 k pulled up the MCU power supply

VCC is not a pin on the DRV8305, but a VCC supply voltage pullup is required for open-drain output nFAULT

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SLVSCX2A AUGUST 2015 REVISED SEPTEMBER 2015

6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range referenced with respect to GND (unless otherwise noted)
Power supply voltage (PVDD)

(1)

MIN

MAX

UNIT

0.3

45

Power supply voltage ramp rate (VM)

V/s

0.3

PVDD + 12

High side gate driver voltage (GHA, GHB, GHC)

57

Low-side gate driver voltage (GHA, GHB, GHC)

12

High side gate driver source pin voltage (SHA, SHB, SHC)

45

Low-side gate driver source pin voltage (SLA, SLB, SLC)

Internal phase clamp pin voltage difference {(GHA-SHA), (GHB-SHB), (GHC-SHC),


(GLA-SLA), (GLB-SLB), (GLC-SLC)}

0.3

15

Drain pin voltage drain (VDRAIN)

0.3

45

Max source current (VDRAIN) limit current with external series resistor

20

Charge pump voltage (CP1H,CP1L, CP2L,CP2H, VCPH, VCP_LSD)

V
mA

Max sink current (VDRAIN)

mA

Voltage difference between supply and VDRAIN (PVDD-VDRAIN)

10

10

Control pin voltage range (INHA, INLA, INHB, INLB, INHC, INLC, EN_GATE, SCLK,
SDI, SCS, SDO, nFAULT, PWRGD)

0.3

5.5

mA

0.3

45

mA

0.3

5.5

100

Open drain pins skink current (nFAULT, PWRGD)


Wake pin voltage (WAKE)
Wake pin sink current (WAKE) limit with external series resistor
Sense amp voltage (SPA, SNA, SPB, SNB, SPC, SNC)
Externally applied reference voltage (VREG) when vreg_vref = 1
Externally applied reference sink current (VREG) when vreg_vref = 1
Operating ambient temperature, TA

40

125

Operating junction temperature, TJ

40

150

Storage temperature, Tstg

55

150

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

6.2 ESD Ratings


VALUE
V(ESD)
(1)
(2)

Electrostatic
discharge

Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001

(1)

UNIT

2000

Charged-device model (CDM), per JEDEC specification JESD22-C101

(2)

500

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

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SLVSCX2A AUGUST 2015 REVISED SEPTEMBER 2015

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6.3 Recommended Operating Conditions


over operating free-air temperature range (unless otherwise noted)
MIN

MAX

UNIT
V

VPVDD

Power supply voltage range

4.4

45

(1)

VPVDD

Power supply voltage range for voltage regulator operation

4.3

45

(2)

VPVDDRAMP

Power supply voltage ramp rate (PVDD = 0 to 20 V rising <3-mA pin sink
current)

V/s

VPVDD-SH_X

Total voltage drop from PVDD to SH_X pins

4.5

ISRC_VCPH

External load on VCPH pin (current limit resistor in series to load)

10

mA

CO_OPA

Maximum external capacitive load on shunt amplifier (no external resistor on


output, excluding internal pin capacitance)

60

pF

InFAULT

nFAULT sink current (VnFAULT = 0.3 V)

Fgate

Operating switching frequency of gate driver

IGATE

Total average gate driver current (HS + LS) charge pump limited

TA

Operating ambient temperature

(1)
(2)

-40

mA

200

kHz

30

mA

125

IC is fully functional and tested in the range 4.4 to 45 V.


Subject to thermal dissipation limits.

6.4 Thermal Information


DRV8305
THERMAL METRIC

(1)

PHP (HTQFP)

UNIT

48 PINS
RJA

Junction-to-ambient thermal resistance

26.6

C/W

RJC(top)

Junction-to-case (top) thermal resistance

12.9

C/W

RJB

Junction-to-board thermal resistance

7.6

C/W

JT

Junction-to-top characterization parameter

0.3

C/W

JB

Junction-to-board characterization parameter

7.5

C/W

RJC(bot)

Junction-to-case (bottom) thermal resistance

0.6

C/W

(1)

For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.

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6.5 Electrical Characteristics


PVDD = 4.4 to 45 V, TA = 25C, unless specified under test condition
PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

POWER SUPPLIES (PVDD, DVDD, AVDD)


4.4

45

4.3

45

VPVDD

PVDD operating voltage

IPVDD_Operating

PVDD operating supply


current

EN_GATE = enabled; LDO reg =


enabled at no load; outputs HiZ

15

IPVDD_Standby

PVDD standby supply


current

EN_GATE = disabled; LDO reg =


enabled at no load

mA

IPVDD_Sleep

PVDD sleep supply current

EN_GATE = disabled; LDO reg =


disabled; ready for WAKE

60

175

5.15

VAVDD

Internal regulator voltage

VDVDD

Internal regulator voltage

VREG (voltage regulator) operational

PVDD = 5.3 to 45 V

4.85

PVDD = 4.4 to 5.3 V

PVDD
0.22

PVDD

V
mA

3.3

VOLTAGE REGULATOR (VREG)


PVDD = 5.3 to 45 V

VVREG

VREG DC output voltage

PVDD = 4.3 to 5.3 V; 5-V regulator


PVDD = 4.3 to 5.3 V; 3.3-V regulator

VLineReg

Line regulation VOUT/VIN

5.3 V VIN 12 V; IO = 1 mA

VLoadReg

Load regulation
VOUT/IOUT

100 A IOUT 50 mA

Vdo

Dropout voltage

VSET
(0.03
VSET)

VSET

PVDD 0.4
V
VSET
(0.03
VSET)

VSET +
(0.03
VSET)
PVDD

VSET

VSET +
(0.03
VSET)

10

30

mV

30

mV

IOUT = 100 A; 3.3 V

0.05

0.1

IOUT = 50 mA; 3.3 V

0.2

0.4

LOGIC-LEVEL INPUTS (INHA, INLA, INHB, INLB, INHC, INLC, EN_GATE, SCLK, nSCS)
VIL

Input logic low voltage

VIH

Input logic high voltage

RPD

Internal pull down resistor

0.8

2
To GND

5
100

V
V
k

CONTROL OUTPUTS (nFAULT, SDO, PWRGD)


VOL

Output logic low voltage

VOH

Output logic high voltage

IOH

Output logic high leakage

IO = 5 mA

0.5

2.4
VO = 3.3 V

HIGH VOLTAGE TOLERANT LOGIC INPUT (WAKE)


VIL_WAKE

Output logic low voltage

1.1

1.41

VIH_WAKE

Output logic high voltage

1.42

1.75

GATE DRIVE OUTPUT (GHA, GHB, GHC, GLA, GLB, GLC)

VGHS

High side gate driver Vgs


voltage

VPVDD = 8 to 45 V; IGATE < 30 mA, CVCPH


= 2.2 F, CCP1/CP2 = 0.047 F, CVCP_LSD
= 1 F

VPVDD = 5.5 to 8 V; IGATE < 6 mA, CVCPH


= 2.2 F, CCP1/CP2 = 0.047 F, CVCP_LSD
= 1 F

7.2

7.2

VPVDD = 4.4 to 5.5 V; IGATE < 6 mA,


CVCPH = 2.2 F, CCP1/CP2 = 0.047 F,
CVCP_LSD = 1 F

10

10.5

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Electrical Characteristics (continued)


PVDD = 4.4 to 45 V, TA = 25C, unless specified under test condition
PARAMETER

Low-side gate driver Vgs


voltage

VGLS

TEST CONDITIONS

MIN

TYP

MAX

VPVDD = 8 to 45 V; IGATE < 30 mA, CVCPH


= 2.2 F, CCP1/CP2 = 0.047 F, CVCP_LSD
= 1 F

10

10.5

VPVDD = 5.5 to 8 V; IGATE < 6 mA, CVCPH


= 2.2 F, CCP1/CP2 = 0.047 F, CVCP_LSD
= 1 F

10.5

VPVDD = 4.4 to 5.5 V; IGATE < 6 mA,


CVCPH = 2.2 F, CCP1/CP2 = 0.047 F,
CVCP_LSD = 1 F

UNIT

PEAK CURRENT DRIVE TIMES

Peak sink or source current


drive time

tDRIVE

TDRIVEP = 00; TDRIVEN = 00

220

TDRIVEP = 01; TDRIVEN = 01

440

TDRIVEP = 10; TDRIVEN = 10

880

TDRIVEP = 11; TDRIVEN = 11

1660

ns

HIGH SIDE (GHA, GHB, GHC) PEAK CURRENT GATE DRIVE

IDRIVEP_HS

High side peak source


current

IDRIVEP_HS = 0000

0.01

IDRIVEP_HS = 0001

0.02

IDRIVEP_HS = 0010

0.03

IDRIVEP_HS = 0011

0.04

IDRIVEP_HS = 0100

0.05

IDRIVEP_HS = 0101

0.06

IDRIVEP_HS = 0110

0.07

IDRIVEP_HS = 0111

0.125

IDRIVEP_HS = 1000

0.25

IDRIVEP_HS = 1001

0.5

IDRIVEP_HS = 1010

0.75

IDRIVEP_HS = 1011

IDRIVEN_HS

High side peak sink current

IDRIVEP_HS = 1100, 1101, 1110, 1111

0.05

IDRIVEN_HS = 0000

0.02

IDRIVEN_HS = 0001

0.03

IDRIVEN_HS = 0010

0.04

IDRIVEN_HS = 0011

0.05

IDRIVEN_HS = 0100

0.06

IDRIVEN_HS = 0101

0.07

IDRIVEN_HS = 0110

0.08

IDRIVEN_HS = 0111

0.25

IDRIVEN_HS = 1000

0.5

IDRIVEN_HS = 1001

0.75

IDRIVEN_HS = 1010

IDRIVEN_HS = 1011

1.25

IDRIVEN_HS = 1100, 1101, 1110, 1111

0.06

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Electrical Characteristics (continued)


PVDD = 4.4 to 45 V, TA = 25C, unless specified under test condition
PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

LOW SIDE (GLA, GLB, GLC) PEAK CURRENT GATE DRIVE

IDRIVEP_LS

Low-side peak source


current

IDRIVEP_HS = 0000

0.01

IDRIVEP_HS = 0001

0.02

IDRIVEP_HS = 0010

0.03

IDRIVEP_HS = 0011

0.04

IDRIVEP_HS = 0100

0.05

IDRIVEP_HS = 0101

0.06

IDRIVEP_HS = 0110

0.07

IDRIVEP_HS = 0111

0.125

IDRIVEP_HS = 1000

0.25

IDRIVEP_HS = 1001

0.5

IDRIVEP_HS = 1010

0.75

IDRIVEP_HS = 1011

IDRIVEP_HS = 1100, 1101, 1110, 1111

0.05

LOW SIDE (GLA, GLB, GLC) PEAK CURRENT GATE DRIVE

IDRIVEN_LS

Low-side peak sink current

IDRIVEN_HS = 0000

0.02

IDRIVEN_HS = 0001

0.03

IDRIVEN_HS = 0010

0.04

IDRIVEN_HS = 0011

0.05

IDRIVEN_HS = 0100

0.06

IDRIVEN_HS = 0101

0.07

IDRIVEN_HS = 0110

0.08

IDRIVEN_HS = 0111

0.25

IDRIVEN_HS = 1000

0.5

IDRIVEN_HS = 1001

0.75

IDRIVEN_HS = 1010

IDRIVEN_HS = 1011

1.25

IDRIVEN_HS = 1100, 1101, 1110, 1111

0.06

GATE PULL DOWN, MOTOR OFF STATE (BRIDGE IN HI-Z)


RSLEEP_PD

Gate pull down resistance,


SLEEP, under voltage and
sleep mode

2 V < PVDD < PVDD_UVLO2


GHX to GND; GLX to GND

RSTANDBY_PD

Gate pull down resistance,


STANDBY, standby mode
(Parallel with ISTANDBY_PD)

IOPERATING_PD

Gate pull down current,


OPERATING, operating
mode

2000

PVDD > PVDD_UVLO2; EN_GATE =


low;
GHX to GND; GLX to GND

750

PVDD > PVDD_UVLO2; EN_GATE =


high;
GHX to SHX; GLX to SLX

50

mA

mA

GATE PULL DOWN, MOTOR ON STATE (IDRIVE/tdrive)


IHOLD

Gate pull down current,


holding

PVDD > PVDD_UVLO2; EN_GATE =


high;
GHX to SHX; GLX to SLX

50

IPULLDOWN

Gate pull down current,


strong

PVDD > PVDD_UVLO2; EN_GATE =


high;
GHX to SHX; GLX to SLX

1.25

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Electrical Characteristics (continued)


PVDD = 4.4 to 45 V, TA = 25C, unless specified under test condition
PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

GATE TIMING
tpd_lf-O

Positive input falling to


GHS_x falling

PVDD = 12 V; CL = 1 nF; 50% to 50%

200

ns

tpd_lr-O

Positive input rising to


GHS_x rising

PVDD = 12 V; CL = 1 nF; 50% to 50%

200

ns

td_min

Minimum dead time after


hand shaking

280

ns

Dead time in addition to


td_min

tdtp

DEAD_TIME = 000

35

DEAD_TIME = 001

52

DEAD_TIME = 010

88

DEAD_TIME = 011

440

DEAD_TIME = 100

880

DEAD_TIME = 101

1760

DEAD_TIME = 110

3520

DEAD_TIME = 111

5280

ns

tPD_MATCH

Propagation delay matching


between high-side and lowside

50

ns

tDT_MATCH

Dead time matching

50

ns

CURRENT SHUNT AMPLIFIER

GCSA

Current sense amplifier gain

Current sense amplifier gain


error

GERR

tSETTLING

Current sense amplifier


settling time

GAIN_CSx = 00

10

GAIN_CSx = 01

20

GAIN_CSx = 10

40

GAIN_CSx = 11

80

Input differential > 0.025 V

3%

V/V

3%

Settling time to 1%; no blanking; TJ = 40 150C, GCSA = 10; Vstep = 0.46 V

300

Settling time to 1%; no blanking; TJ = 40 150C, GCSA = 20; Vstep = 0.46 V

600

Settling time to 1%; no blanking; TJ = 40 150C, GCSA = 40; Vstep = 0.46 V

1.2

Settling time to 1%; no blanking; TJ = 40 150C, GCSA = 80; Vstep = 0.46 V

2.4

ns

VIOS

DC input offset

GCSA = 10; input shorted; RTI

VVREF_ERR

Reference buffer error (DC)

Internal or external VREF

VDRIFTOS

Input offset error drift

GCSA = 10; input shorted; RTI

IBIAS

Input bias current

VIN_COM = 0; SOx open

IOFFSET

Input bias current offset

IBIAS (SNx-SPx); VIN_COM = 0; SOx


open

VIN_COM

Common input mode range

0.15

0.15

VIN_DIFF

Differential input range

-0.48

0.48

CMRR

Common mode rejection


ration

2%

V/C
100

External input resistance matched; DC;


GCSA = 10

60

80

External input resistance matched; 20


kHz; GCSA = 10

60

80

A
A

dB

DC (<120 Hz); GCSA = 10

150

Power supply rejection ratio

VSWING

Output voltage swing

PVDD > 5.3 V

0.3

VSLEW

Output slew rate

GCSA = 10; RL = 0 ; CL = 60 pF

5.2

20 kHz; GCSA = 10

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mV

2%
10

PSRR

10

dB

90
4.7
10

V
V/s

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Electrical Characteristics (continued)


PVDD = 4.4 to 45 V, TA = 25C, unless specified under test condition
PARAMETER

TEST CONDITIONS

IVO

Output short circuit current

SOx shorted to ground

UGB

Unity gain bandwidth


product

GCSA = 10

MIN

TYP

MAX

UNIT

20

mA

MHz

VOLTAGE PROTECTION
VAVDD_UVLO

AVDD undervoltage Fault

Relative to GND

3.3

3.5

VREG_UV_LEVEL = 00

VSET-10%

VREG_UV_LEVEL = 01

VSET-20%

VREG_UV_LEVEL = 10

VSET-30%

VREG_UV_LEVEL = 11

VSET-30%

VVREG_UV

VREG undervoltage Fault

VVREG_UV_DGL

VREG undervoltage monitor


deglitch time

VPVDD_UVFL

Undervoltage protection
Warning, PVDD

VPVDD_UVLO1

Undervoltage protection
lockout, PVDD

PVDD falling

4.1

PVDD rising

4.3

VPVDD_UVLO2

Undervoltage protection
Fault, PVDD

PVDD falling

4.2

4.4

PVDD rising

4.4

4.6

VPVDD_OVFL

Overvoltage protection
Warning, PVDD

PVDD falling

33.5

36

PVDD rising

32.5

35

VVCPH_UVFL

Charge pump under voltage


protection Warning, VCPH

VVCPH_UVLO

Charge pump under voltage


protection Fault, VCPH

VVCP_LSD_UVLO

1.5

PVDD falling

7.7

8.1

PVDD rising

7.9

8.3

Relative to PVDD

s
V
V
V
V
V

Relative to PVDD, SET_VCPH_UV = 0

4.5

4.9

Relative to PVDD, SET_VCPH_UV = 1

4.2

4.6

Low-side charge pump


under voltage Fault,
VCP_LSD

Relative to PVDD

6.4

7.5

VVCPH_OVLO

Charge pump over voltage


protection FAULT, VCPH

Relative to PVDD

14

18

VVCPH_OVLO_ABS

Charge pump over voltage


protection FAULT, VCPH

Relative to GND

60

TEMPERATURE PROTECTION
OTW_CLR

Junction temperature for


resetting over temperature
(OT) warning (1)

140

OTW_SET/
OTSD_CLR

Junction temperature for


over temperature warning
and resetting over
temperature shutdown (1)

155

OTSD_SET

Junction temperature for


over temperature
shutdown (1)

175

TEMPFLAG1

Junction temperature flag


setting 1 (no warning) (1)

105

TEMPFLAG2

Junction temperature flag


setting 2 (no warning) (1)

125

TEMPFLAG3

Junction temperature flag


setting 3 (no warning) (1)

135

TEMPFLAG4

Junction temperature flag


setting 4 (no warning) (1)

175

(1)

Specified by design and characterization data

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Electrical Characteristics (continued)


PVDD = 4.4 to 45 V, TA = 25C, unless specified under test condition
PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

PROTECTION CONTROL
tpd,E-L

Delay, error event to all


gates low

tpd,E-SD

Delay, error event to


nFAULTx low

24

FET CURRENT PROTECTION (VDS SENSING)

VDS_TRIP

tVDS

tBLANK

12

Drain-source voltage
protection limit

VDS sense deglitch time

VDS sense blanking time

VDS_LEVEL = 00000

0.06

VDS_LEVEL = 00001

0.068

VDS_LEVEL = 00010

0.076

VDS_LEVEL = 00011

0.086

VDS_LEVEL = 00100

0.097

VDS_LEVEL = 00101

0.109

VDS_LEVEL = 00110

0.123

VDS_LEVEL = 00111

0.138

VDS_LEVEL = 01000

0.155

VDS_LEVEL = 01001

0.175

VDS_LEVEL = 01010

0.197

VDS_LEVEL = 01011

0.222

VDS_LEVEL = 01100

0.25

VDS_LEVEL = 01101

0.282

VDS_LEVEL = 01110

0.317

VDS_LEVEL = 01111

0.358

VDS_LEVEL = 10000

0.403

VDS_LEVEL = 10001

0.454

VDS_LEVEL = 10010

0.511

VDS_LEVEL = 10011

0.576

VDS_LEVEL = 10100

0.648

VDS_LEVEL = 10101

0.73

VDS_LEVEL = 10110

0.822

VDS_LEVEL = 10111

0.926

VDS_LEVEL = 11000

1.043

VDS_LEVEL = 11001

1.175

VDS_LEVEL = 11010

1.324

VDS_LEVEL = 11011

1.491

VDS_LEVEL = 11100

1.679

VDS_LEVEL = 11101

1.892

VDS_LEVEL = 11110

2.131

VDS_LEVEL = 11111

2.131

TVDS = 00

TVDS = 01

1.75

TVDS = 10

3.5

TVDS = 11

TBLANK = 00

TBLANK = 01

1.75

TBLANK = 10

3.5

TBLANK = 11

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Electrical Characteristics (continued)


PVDD = 4.4 to 45 V, TA = 25C, unless specified under test condition
PARAMETER
tVDS_PULSE

TEST CONDITIONS

MIN

TYP

nFAULT pin reporting pulse


stretch length for VDS event

MAX

UNIT

56

PHASE SHORT PROTECTION


VSNSOCP_TRIP

Phase short protection limit

Fixed voltage

6.6 SPI Timing Requirements (Slave Mode Only)


MIN
tSPI_READY

SPI read after power on

tCLK

Minimum SPI clock period

tCLKH

PVDD > VPVDD_UVLO1

NOM

MAX

10

UNIT
ms

100

ns

Clock high time

40

ns

tCLKL

Clock low time

40

ns

tSU_SDI

SDI input data setup time

20

ns

tHD_SDI

SDI input data hold time

30

tD_SDO

SDO output data delay time, CLK high to SDO valid

tHD_SDO

SDO output hold time

40

ns

tSU_SCS

SCS setup time

50

ns

tHD_SCS

SCS hold time

50

ns

tHI_SCS

SCS minimum high time before SCS active low

tACC

SCS access time, SCS low to SDO out of high impedance

10

ns

tDIS

SCS disable time, SCS high to SDO high impedance

10

ns

ns

CL = 20 pF

20

400

ns

ns

Figure 1. SPI Slave Mode Timing Definition

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Figure 2. SPI Slave Mode Timing Diagram

6.7 Typical Characteristics


6

30

5.9
25

T A = 40C

S u p p ly C u r r e n t ( m A )

S u p p ly C u r r e n t ( m A )

5.8

T A = 25C

5.7

T A = 125C

5.6
5.5
5.4

20

15

10

5.3
T A = 40C

T A = 25C

5.2

T A = 125C

5.1

10

20

30

40

50

PVDD (V)

10

20

30

40

PVDD (V)

D001

Figure 3. Standby Current

50
D002

Figure 4. Operating Current

200

12

180
10

140

120

V C P H (V )

S u p p ly C u r r e n t ( m A )

160

100
80

60
40

T A = 40C

T A = 40C

T A = 25C

20

T A = 25C

T A = 125C

T A = 125C

10

20

30
PVDD (V)

40

50

D003

Figure 5. Sleep Current


14

10

20

30
PVDD (V)

40

50
D004

Figure 6. VCPH Voltage

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7 Detailed Description
7.1 Overview
The DRV8305 is a 4.4-V to 45-V gate driver IC for three-phase motor driver applications. This device reduces
external component count by integrating three half-bridge drivers, three current shunt amplifiers, and a LDO. The
DRV8305 provides overcurrent, overtemperature, and undervoltage protection. Fault conditions are indicated by
the nFAULT pin and specific fault indication can be read back from the SPI registers.
Adjustable dead time control and peak gate drive current allows for finely tuning the switching of the external
MOSFETs. Internal hand-shaking is used to prevent FET shoot through.
VDS sensing of the external MOSFETs allows for the DRV8305 to detect overcurrent conditions and respond
appropriately. Individual MOSFET overcurrent conditions are reported through the SPI status registers.
There are three versions of DRV8305 with separate part numbers:
DRV8305N VREG pin is used as input that supplies the reference for the CSA and SPI.
DRV83053 VREG is a 3.3-V LDO output pin.
DRV83055 VREG is a 5.0-V LDO output pin.

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DVDD

AVDD

CP1L

CP1H

CP2L

CP2H

VCP_LSD

AVDD

DVDD

7.2 Functional Block Diagram

VCP_LSD

VCPH

DVDD
LDO

AVDD
LDO

Low Side
Gate Drive
LDO

VCPH

High Side Gate Drive


2-Stage Charge Pump

PVDD
VREG

WAKE

PVDD

VREG
VDRAIN

VREG
LDO

VDRAIN

PWRGD
VDRAIN

VCPH

GHA
+

HS

VDS
-

SHA
EN_GATE

VCP_LSD

GLA
+

INHA

LS

VDS
-

SLA
INLA

Phase A Pre-Driver

INHB

INLB

VDRAIN

Digital
Inputs
and
Outputs

PVDD

VCPH

GHB
+

HS

VDS
-

SHB
Core Logic

INHC

VCP_LSD

GLB
+

INLC

LS

VDS

Control

SLB
nFAULT
Configuration

Phase B Pre-Driver
VDRAIN

PVDD

VCPH

GHC

Timing

HS

VDS

SCLK

SHC
Protection

VCP_LSD

nSCS

GLC

SPI

LS

VDS

SDI

SDO

SLC
Thermal
Sensor

Voltage
Monitoring

SO1

Phase C Pre-Driver
VREG

Current
Sense
Amplifier 1

Ref/k
VREG

VREG

Ref/k

GND

16

Current
Sense
Amplifier 2

Ref/k

GND

SP1
SN2

AVDD

SO2

SO3

SN1

AVDD

SP2
SN3

AVDD

Current
Sense
Amplifier 3

SP3

PowerPAD

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7.3 Feature Description


7.3.1 Three-Phase Gate Driver
The DRV8305 provides three half-bridge drivers, each driver is capable of driving two N-type MOSFETs, one for
the high side and one for the low side.
Both the high side (GHX to SHX) and the low side (GLX to SLX) are implemented as floating gate drivers.
The gate driver uses a charge pump architecture which enables an extended voltage operating range to support
a variety of application requirements.
7.3.2 Operating Modes
The DRV8305 can be operated in three modes, to support various commutation schemes.
Table 1 shows six independent PWM inputs with the truth table.
Table 1. 6-PWM Truth Table

INHX

INLX

GHX

GLX

1
1

Three independent high-side PWM inputs (low-side complimentary PWMs generated internally).
In this mode all activity on INLA, INLB and INLC is ignored.
Table 2. 3-PWM Truth Table

INHX

INLX

GHX

GLX
L

One single PWM that uses internally stored 6-step block commutation tables. In this mode of operation,
DRV8305 can be operated using a single PWM sourced from a low cost microcontroller. The PWM is applied
on pin PWM_IN (INHA) from the microcontroller along with three GPIO pins PHC_0 (INLA), PHC_1 (INHB),
PHC_2 (INLB) that serve to set the bits of a three bit register. The PWM may be operated from 0-100% duty
cycle. The three bit register is used to select the state of each of the phases for a total of eight states
including an align and stop state. The 1-PWM mode tables will use all the applicable settings from the control
registers as set up by the user.
An additional and optional GPIO (INHC) can be used to facilitate the insertion of dwell states or phase current
overlap states between the six commutation steps. This may be used to reduce acoustic noise and improve
motion through the reduction of abrupt current direction changes when switching between states. INHC must
be high when the states are changed and the dwell state will exist until INHC is taken low. If the dwell states
are not being used, the INHC pin can be simply tied low.
In this mode all activity on INLC is always ignored.
The commutation tables ( Table 3 and Table 4) may be selected through the appropriate SPI register.

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Table 3. 1-PWM Active Freewheeling


INLA : INHB : INLB : INHC

AH

AL

BH

BL

CH

CL

AB

0110

PWM

!PWM

LOW

HIGH

LOW

LOW

AB_CB

0101

PWM

!PWM

LOW

HIGH

PWM

!PWM

CB

0100

LOW

LOW

LOW

HIGH

PWM

!PWM

CB_CA

1101

LOW

HIGH

LOW

HIGH

PWM

!PWM

CA

1100

LOW

HIGH

LOW

LOW

PWM

!PWM

CA_BA

1001

LOW

HIGH

PWM

!PWM

PWM

!PWM

BA

1000

LOW

HIGH

PWM

!PWM

LOW

LOW

BA_BC

1011

LOW

HIGH

PWM

!PWM

LOW

HIGH

BC

1010

LOW

LOW

PWM

!PWM

LOW

HIGH

BC_AC

0011

PWM

!PWM

PWM

!PWM

LOW

HIGH

AC

0010

PWM

!PWM

LOW

LOW

LOW

HIGH

AC_AB

0111

PWM

!PWM

LOW

HIGH

LOW

HIGH

Align

1110

PWM

!PWM

LOW

HIGH

LOW

HIGH

Stop

0000

LOW

LOW

LOW

LOW

LOW

LOW

CH

CL

Table 4. 1-PWM Diode Freewheeling


INLA : INHB : INLB : INHC

AH

AL

BH

BL

AB

0110

PWM

LOW

LOW

HIGH

LOW

LOW

AB_CB

0101

PWM

LOW

LOW

HIGH

PWM

LOW

CB

0100

LOW

LOW

LOW

HIGH

PWM

LOW

CB_CA

1101

LOW

HIGH

LOW

HIGH

PWM

LOW

CA

1100

LOW

HIGH

LOW

LOW

PWM

LOW

CA_BA

1001

LOW

HIGH

PWM

LOW

PWM

LOW

BA

1000

LOW

HIGH

PWM

LOW

LOW

LOW

BA_BC

1011

LOW

HIGH

PWM

LOW

LOW

HIGH

BC

1010

LOW

LOW

PWM

LOW

LOW

HIGH

BC_AC

0011

PWM

LOW

PWM

LOW

LOW

HIGH

AC

0010

PWM

LOW

LOW

LOW

LOW

HIGH

AC_AB

0111

PWM

LOW

LOW

HIGH

LOW

HIGH

Align

1110

PWM

LOW

LOW

HIGH

LOW

HIGH

Stop

0000

LOW

LOW

LOW

LOW

LOW

LOW

7.3.3 Charge Pump


A regulated triple charge pump scheme is used to create sufficient VGS to drive standard FETs under low voltage
operation.
The high-side FETs are directly driven by the tripler charge pump output while the low-side FETs are driven by a
voltage that is internally regulated but derived from the tripler charge pump. This allows both the high side and
low side to maintain sufficient VGS through low voltage transients. This topology also supports 100% duty cycle
operation.
Between 4.4 to 18 V the charge pump regulates the voltage in tripler mode; beyond 4.4 to 18 V, it switches over
to doubler mode until the operating max voltage. The charge pump is monitored for undervoltage and
overvoltage conditions to prevent underdriven or overdriven FET conditions.
7.3.4 Gate Driver Architecture
The DRV8305 gate driver is a complimentary push-pull topology for both the high-side and the low-side drivers.
The peak currents for the drivers are adjustable; their benefits are described in detail in the Slew Rate/Slope
Control section.

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The gate driver is implemented as constant current sources for up to 80 mA (sink)/70 mA (source) currents in
order to maintain the accuracy required for precise slew rate control. Beyond that, resistors are switched to
create the desired settings up to 1.25 A (sink)/1 A (source).
7.3.5 IDRIVE/TDRIVE
The DRV8305 gate driver has an integrated state machine (TDRIVE/IDRIVE scheme) to protect against high
current events on the outputs (shorts or inadvertent clamp activation) and also dV/dt turn on due to switching on
the phase nodes.
When changing the state of the gate driver, the peak current (source or sink, IDRIVE) is applied for a fixed period
of time (TDRIVE) until the gate capacitances are charged or discharged completely. After this time has expired, a
fixed current source of IHOLD is used to hold the gate at the desired state (pulled up or pulled down).

INHX

GHX (V)

tDRIVEP

tDRIVEN
IDRIVEP
IHOLD

GHX (mA)

-IHOLD
-IPULLDOWN

-IPULLDOWN

IDRIVEN

tDEAD
`
IDRIVEP

GLX (mA)

IHOLD

IHOLD
- IHOLD
-IPULLDOWN
IDRIVEN

tDRIVEN

tDRIVEP

GLX

INLX
Figure 7. TDRIVE/IDRIVE Waveforms
This fixed TDRIVE time ensures that under abnormal circumstances like a short on the FET gate, or the
inadvertent turning on of a FET VGS clamp, the high peak current through the DRV8305 gate drivers is limited to
the energy of the peak current during TDRIVE. Limiting this energy helps to prevent the gate driver from
damage.

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Select a TDRIVE time that is longer than the time needed to charge or discharge the gate capacitances. IDRIVE
and TDRIVE are selected based on the size of external FETs used and the desired rise and fall times. These
registers must be configured so that the FET gates are charged completely during TDRIVE. If IDRIVE and
TDRIVE are too low for a given FET, then the FET may not turn on completely. TI suggests to adjust these
values in-system with the required external FETs to determine the best possible setting for any application.
Note that TDRIVE will not increase the PWM time and will simply terminate if a PWM command is received while
it is active. A good starting point is to select a TDRIVE that is about 2 longer than the external FET switching
rise (turn ON) and fall (turn OFF) times.
The IDRIVE/TDRIVE state machine protects against dV/dt turn on of a FET due to switching of the phase nodes.
A strong pulldown current source of value IPULLDOWN is switched on between (GHX to SHX) or (GLX to SLX),
every time an opposing FET is commanded to turn on.
7.3.6 Slew Rate/Slope Control
Control of the FET VDS rise and fall times during the Miller region of the FET is one of the most important
parameters for optimizing emitted radiations and power. The rise and fall times also influence the energy and
duration of the diode recovery inductive spikes and also dV/dt turn on of the LS FET.
The ability of a driver to control the rise and fall times across the entire range of gate drive temperature, voltage,
and process variation is essential to design robust systems. The key control knob is the ability to turn on and turn
off the external FET with the least amount of variation.
The DRV8305 uses temperature compensated constant current sources up to 80-mA (sink) and 70-mA (source)
current. The current source architecture helps eliminate the temperature, process, and load-dependent variation
associated with internal and external series limiting resistors.
For higher currents, internal series resistors are used to minimize the power losses associated with mirroring
such large currents.
The 12 settings that are available on the DRV8305 allow the user to optimize the system using only SPI
commands. This flexibility allows the system designer to tune the performance of the driver for different operating
conditions through software alone.
The slew rate settings may be set separately for source and sink values and can also be set separately for the
high-side FETs (the high sides of all three phases share the same setting) and the low-side FETs (the low sides
of all three phases share the same settings)
7.3.7 Current Shunt Amplifiers
The DRV8305 includes three high performance low-side current shunt amplifiers for accurate current
measurement. The current amplifiers provide output bias up to 2.5 V to support bidirectional current sensing.
Current shunt amplifier has following features:
Each of the three current sense amplifiers can be programmed and calibrated independently.
The independent current shunt amplifiers may be used either for sensing current through individual phase
shunt resistors or the total current delivered to the motor through a single shunt resistor.
Programmable gain: four gain settings through SPI command
Internally or externally provided reference voltage to set output bias for amplifiers. Reference voltage is
internally sourced from DRV8305 voltage regulator VREG, if also used to power microcontroller. It can
alternatively be applied externally on the VREG pin.
Programmable output bias scaling. The scaling factor k can be programmed through SPI to be equal to, half
or a fourth of the reference voltage.
Programmable blanking time (delay) of the amplifier outputs. The blanking time is implemented from any
rising or falling edge (any of the outputs) of the internal gate driver gate signals. The blanking time is applied
to all three current sense amplifiers equally. In case the current sense amplifiers are already being blanked
when another gate driver rising or falling edge is seen, the blanking interval will be restarted at the edge.
Note that the blanking time options do not include delay from internal amplifier loading or delays from the
trace or component loads on the amplifier output. The programmable blanking time may be overridden to
have no delay (default value).
Minimize DC offset and drift through temperature with DC calibrating through SPI command. When DC
calibration is enabled, device will short input of current shunt amplifier and disconnect the load. DC calibrating
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can be done at anytime, even when the FET is switching because the load is disconnected. For best result,
perform the DC calibrating during switching off period when no load is present to reduce the potential noise
impact to the amplifier.
The output of current shunt amplifier can be calculated as:
VVREF
VO
 G u SNX  SPX
k
where

VREF is the reference voltage.


G is the gain of the amplifier.
k = 2, or 4
SNx and SPx are the inputs of channel x. SPx should connect to resistor ground for the best common mode
rejection.
(1)

Figure 8 shows current amplifier simplified block diagram.


S4

400

DC _ CAL(SPI)
SN

200 kO

S3

100 kO

S2

50 kO

S1

5 kO
AVDD

100 O

S5

SO

5 kO

+
SP
50 kO

S1

100 kO

S2

200 kO

S3

400 kO

S4

DC _ CAL(SPI)

VREF/k
VREF

AVDD

k = 2, 4

+
Figure 8. Current Shunt Amplifier Simplified Block Diagram
7.3.8 Internal Regulators (DVDD and AVDD)
The DRV8305 has two internal regulators, DVDD and AVDD, that power internal circuits. These regulators
cannot be used to drive external loads and may not be supplied externally.
DVDD is the voltage regulator for the internal logic circuits and is maintained at a value of about 3.3 V through
the entire operating range of the device. DVDD is derived from the PVDD supply.

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AVDD is the voltage regulator that provides the voltage rail for the internal analog circuit blocks including the
current sense amplifiers. AVDD is derived from the PVDD voltage supply.
Because the allowed operating range of the device permits operation below the nominal value of AVDD, this
regulator operates in two regimes: namely a linear regulating regime and a dropout region. In the dropout region,
the AVDD will simply track the PVDD voltage minus a voltage drop.
If the device is expected to operate within the dropout region, take care while selecting current sense amplifier
components and settings to accommodate this reduced voltage rail.
7.3.9 Voltage Regulator Output for Driving External Loads (VREG)
The DRV8305 integrates an LDO voltage regulator (VREG) that is dedicated for driving external loads like an
MCU directly. The two versions of the device provide different voltages: DRV83053 provides 3.3 V, DRV83055
provides 5.0 V. Because the user can supply microcontroller and other system power from the DRV8305, the
user does not need to add an external regulator IC for system power.
The DRV8305 voltage regulator is standalone, uncommitted, and is not used internally.
The DRV8305 voltage regulator also features a PWRGD pin to protect against brownouts on externally driven
devices. The PWRGD pin is often tied to a reset pin on a microcontroller to ensure that the microcontroller is
always reset when the voltage is outside of its recommended operation area.
When the voltage output of the LDO drops or exceeds the set threshold (programmable).
The PWRGD pin will go low for a period of 64 s.
After the 64-s period has expired, the LDO voltage will be checked and PWRGD will be held low until the
LDO voltage has recovered.
The voltage regulator also has undervoltage protection implemented for both the input voltage (PVDD) and
output voltage (VREG).
7.3.10 Protection Features
Fault / Warning Classes and Recovery summarizes the protection features, fault responses, and recovery
sequences.
7.3.10.1 Fault and Protection Handling
The DRV8305 handles fault (latched fault) and warnings (unlatched faults) separately. Both latched and
unlatched faults are reported in status registers and can be read through SPI.
A latched nFAULT pin indicates an error event has occurred that has caused part of the gate driver to shut
down and force outputs to a safe state (external FETs in high impedance).
A latched fault is indicated by the nFAULT pin going low (and staying low) and reporting the details of the
fault in the status registers (0x02 and 0x03). The appropriate recovery sequence must be performed in
order to reset the latched fault. In addition, the register (0x01) contains a single status bit if any latched
faults are detected.
The nFAULT pin will stay low until the appropriate recovery sequence is performed.
TI recommends to inspect the system and board when a latched nFAULT faults occurs.
An unlatched warning on nFAULT pin indicates that an event that requires a warning to be communicated has
occurred.
An unlatched fault is indicated by the nFAULT pin going low for a period of 64 s, reporting the warning
and then recovering back high for a period of 64 s before reporting any subsequent errors.
When a warning has been read by SPI through the warning register (0x01), that same warning will not be
reported through nFAULT again unless that warning or condition passes and then reoccurs.
However, the SPI registers will continue to report the latest status of the condition even after it has been
cleared by the read, that is, if the condition has cleared, then the warning will clear in the SPI registers.
Note that if the microprocessor does not read the warning, then the nFAULT pin will continue to toggle.
In case another warning or warnings are received during the 64-s period but after the warning register
has been read, then after the expiration of 64 s, the nFAULT pin will go high for another 64 s and then
report those warning or warnings by going low for another 64 s.
If a latched fault occurs during a period where nFAULT is low, then the nFAULT pin will stay low.
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Note that nFAULT is an open-drain signal and must be pulled up through an external resistor.
7.3.10.2 Shoothrough Protection
DRV8305 integrates analog and digital monitors to prevent shoot-through in the external FETs.
An Internal handshake through analog comparators is performed between high-side and low-side FETs
during switching transition.
A minimum dead time (digital) of 40 ns is always inserted after a successful handshake. This digital dead-time
is programmable and is in addition to the time taken for the handshake.
7.3.10.3 VDS Sensing External FET Protection and Reporting (OC Event)
To protect the external FETs from damage due to high currents, VDS sensing circuitry is implemented in the
DRV8305.
The VDS sensing is implemented for both the high-side and low-side MOSFET through these pins:
High-side MOSFET: VDS measured between VDRAIN and SHX pins
Low-side MOSFET: VDS measured between SHX and SLX pins
Based on RDS(on) of the power MOSFETs and the maximum allowed IDS, a voltage threshold can be calculated,
which when exceeded, triggers the VDS protection feature.
This voltage threshold level is programmable through SPI command and may be programmed during operation if
needed.
The VDS protection logic also has an adjustable blanking time and deglitch time to prevent false trips.
VDS blanking time (tBLANK): This time is inserted digitally and is programmable. The tBLANK time is a delay inserted
at each output after that particular output has been commanded to turn ON. During tBLANK time, the VDS
comparators are not being monitored in order to prevent false trips when the FETs first turn ON.
VDS deglitch time (tVDS): This time is inserted digitally and is programmable. The tVDS time is a delay inserted after
the VDS sensing comparators have tripped to when the protection logic is informed that a VDS event has
occurred.
Note that the dead time and blanking time are overlapping counters as shown in Figure 9

INx_x
Gx_x
1
2
3

tDead

Input Signal
Output Slew
Expiration of Blanking

tBLANK
1

tdeglitch

2
3

Figure 9. VDS Protection Timing


Three overcurrent responses are possible depending on the configuration option selected through SPI.
VDS event latch shutdown mode
When a VDS event occurs, device will pull all outputs low in order to take all six external FETs into highimpedance mode. The Fault will be reported on nFAULT and details of the FET that reported the fault can be
read back through SPI.
VDS event Reporting only mode
In this mode, VDS event will be reported on the nFAULT pin and the SPI register. Gate drivers will continue
to operate.
VDS event disable mode
Device ignores all the VDS event detections and does not report them.

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7.3.10.4 Low-Side Source Monitoring (SNS_OCP)


The DRV8305 monitors the voltage on the SLX pins for high-current events like phase shorts that may cause the
voltage on those pins to exceed 2 V. The device will put the FETs into a high-impedance state to avoid damage.
7.3.11 Undervoltage Reporting and Undervoltage Lockout (UVLO) Protection
The DRV8305 implements appropriate undervoltage responses in order to protect the system. Fault / Warning
Classes and Recovery lists the details of the monitors and their response and recovery sequences.
Under-voltage is monitored on PVDD, AVDD, VCPH, and VCP_LSD.
The UVLO protection fault may be completely disabled for the PVDD undervoltage condition using a SPI register
command. In this case, the fault is still reported in the register.
The UVLO protection may never be completely disabled for the VCPH or VCP_LSD in OPERATING mode
because this may indicate a short condition that could damage the DRV8305.
7.3.11.1 Battery Overvoltage Protection (PVDD_OV)
The DRV8305 implements appropriate overvoltage responses in order to protect the system.
PVDD is monitored for overvoltage conditions. If the overvoltage threshold is tripped, a warning is issued and the
event is reported in the status registers. The device takes no action.
7.3.11.2 Charge Pump Overvoltage Protection (VCPH_OV/VCP_LSD_OV)
If VCPH or VCP_LSD exceed the overvoltage threshold due to potential issue related to the charge pumps (for
example, short of external charge pump capacitor or charge pump, an overvoltage fault is triggered).
7.3.11.3 Overtemperature (OT) Warning and Protection
A multi-level temperature detection circuit is implemented:
Flag Level 1: Level 1 overtemperature flag. No warning is reported on nFAULT. A real-time register bit is set
to indicate flag and can be read through SPI.
Flag Level 2: Level 2 overtemperature flag. No warning is reported on nFAULT. A real-time register bit is set
to indicate flag and can be read through SPI.
Flag Level 3: Level 3 overtemperature flag. No warning is reported on nFAULT. A real-time register bit is set
to indicate flag and can be read through SPI.
Flag Level 4: Level 4 overtemperature flag. No warning is reported on nFAULT. A real-time register bit is set
to indicate flag and can be read through SPI.
Warning Level: Overtemperature warning only. Warning is reported on nFAULT for 64 s and can be read
through SPI.
Fault Level: Overtemperature fault and latched shut down of gate driver and charge pump Fault will be
reported to nFAULT pin.
SPI operation is still available and register settings will be retained in the device during OTSD operation as long
as PVDD is still within defined operation range.
The details of the fault will be reported into a register that can be read back through SPI.
7.3.11.4 dV/dt Protection
The DRV8305 gate driver implements a strong pulldown scheme for preventing dV/dt turn on of external FETs.
After a FET has been turned off using the selected sink slew rate setting, the internal state machine will turn on a
stronger pulldown if it senses that the opposite FET on that phase has been commanded to turn on. This allows
the systems designer to decouple the optimum slew rate setting selection for EMI and power from the pull down
required to prevent dV/dt turn on.
7.3.11.5 VGS Protection
The DRV8305 gate driver uses a multilevel level protection scheme to protect the external FET from VGS
voltages that may damage the gate of the external FET.

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The device integrates VGS clamps inside the gate driver that will turn on when the GHX voltage exceeds SHX
voltage by a value that could be damaging to the FETs. If the voltage continues to rise, in spite of the clamps
turning on, the TDRIVE architecture ensures that the energy through the clamps is limited. If the high VGS
voltage is due to an abnormal condition on the charge pump, the charge pump overvoltage fault will trip in order
to protect the FETs from damage.
7.3.11.6 Gate Driver Faults
The DRV8305 protects against abnormal short to battery or short to ground conditions on the gate driver outputs
that could result in an incorrect state of the gate driver outputs. The gate driver integrates VGS comparators that
check the status of the gate driver output against the commanded PWM signal to ensure that they match. This
comparison occurs shortly after the expiration of the TDRIVE time. If the comparison indicates a mismatch, a
gate driver fault is indicated.
7.3.11.7 Reverse Battery Protection
The VCPH pin on the DRV8305 is designed to be able to supply an external load of up to 10 mA. This feature
allows implementation of an external reverse battery protection scheme using a MOS and a BJT. The MOS gate
can be driven through VCP through a current limiting resistor to limit the current drawn from VCP. The current
limit resistor must be sized not to exceed the maximum external load on VCPH.
The VDRAIN pin (sense) may also be protected against negative transients on it by use of a current limiting
resistor. The current limit resistor must be sized not to exceed the maximum current load on the VDRAIN pin.
BATTERY

CP2H CP2L CP1H CP1L


VCPH
PVDD

PVDD

VDRAIN

Figure 10. Typical Scheme for Reverse Battery Protection Using VCPH

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7.3.11.8 MCU Watchdog


An MCU watchdog function may be enabled to ensure that the external controller that is instructing the DRV8305
is active and not in an unknown state.
SPI Watchdog must be enabled by writing a 1 to the WD_EN bit through SPI (default is disabled = 0).
When the SPI watchdog is enabled, an internal timer starts to countdown to an interval set by WD_dly bit.
To reset the watchdog, the address 0x01 (Status register) must be read by the microcontroller within the interval
set by the register WD_dly.
If the timer is allowed to expire without the address 0x01 being read, the WD fault will get enabled.
Response to this fault is as follows:
A Latched + PWRGD fault occurs on the DRV8305 and gate drivers are put into a safe state. The appropriate
recovery sequence must be performed.
PWRGD pin is taken low for 64 s and then back high in order to reset the microcontroller.
nFAULT is asserted
WD_EN bit is cleared
Report that the watchdog had expired through SPI bit WD_FAULT
TI recommends that if the watchdog function is being used, the MCU software routine reads the status
registers as part of its recovery or power-up routine in order to know whether a WD_FAULT had previously
occurred.
Note that the fault results in clearing of the WD_EN bit and it will have to be set again to resume watchdog
functionality.
7.3.12 Pin Control Functions
7.3.12.1 EN_GATE
EN_GATE low is used to put the gate driver into standby mode. Note that EN_GATE has no effect on the LDO
voltage regulator. When EN_GATE is low, the device will always put the MOSFET output stage to high
impedance as long as PVDD is still present. EN_GATE is also used to reset the IC.
It is not possible to enter SLEEP mode without taking EN_GATE low and entering STANDBY mode first.
TI recommends to take EN_GATE for at least greater than 25 s when it is asserted low to go into standby
mode.
7.3.12.2 SPI Pins
SDO pin has to be tri-state, so a data bus line can be connected to multiple SPI slave devices. SCS pin is active
low. When SCS is high, SDO is at high-impendence mode.
Ensure that SDO pin is always configured in the system as an output from DRV8305.
SDO pin must never be driven to ensure correct operation of DRV8305. SDO is referrenced to the VREG
voltage.

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Table 5. Fault / Warning Device Status


CLASS

OUTPUTS
PD PULL
DOWN
O OPERATING

PVDD undervoltage (VPVDD_UVLO1)


falling

None

PD

SD

SD

SD

PVDD undervoltage (VPVDD_UVLO2)


falling

Latched

PD

SD

PVDD undervoltage (VPVDD_UVFL)


falling

Warning

PVDD overvoltage (VPVDD_OVFL) rising

Warning

Charge pump undervoltage


(VVCPH_UVFL) falling

Warning

Charge pump undervoltage


(VVCPH_UVLO / VVCP_LSD_UVLO)

Latched

PD

SD

Charge pump overvoltage


(VVCPH_OVLO, VVCPH_OVLO_ABS)

Latched

PD

SD

AVDD undervoltage

Latched

PD

SD

SD

TEMP FLAG 1/2/3/4

Real time

OT warning (OTW)

Warning

OT shutdown (OTS)

Latched

PD

SD

VDS event latch mode (FETxx_VDS)

CONDITION

CHARGE PUMP
AVDD / DVDD
O OPERATING O OPERATING
SD SHUTDOWN SD SHUTDOWN

VOLTAGE
REGULATOR
O OPERATING
SD SHUTDOWN

Latched

PD

VDS event report mode


(FETxx_VDS)

Report only

VDS event disable mode


(FETxx_VDS)

Not reported

SNS OCP

Latched

PD

Gate driver fault VGS event

Latched

PD

SD

MCU watchdog

Latched +
PWRGD

PD

VREG_UV

Latched +
PWRGD

PD

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7.3.13 Fault / Warning Classes and Recovery


7.3.13.1 Reg 09h CLR_FLTS
When CLR_FLTS bit is set to 1, all expired faults (latch/warn) will be cleared from the SPI status register. Also,
the nFAULT pin will be released on the event of an expired Latched fault. CLR_FLTS provides a software reset
option to DRV8305. The effect on nFAULT pin and SPI status registers is the same as pulling EN_GATE pin low
and taking it HIGH.
CLR_FLTS bit self clears to 0 after SPI status register is reset and nFAULT pin is released.
Table 6. Fault / Warning Reporting and Handling
CLASS

nFAULT

PWRGD

SPI REPORT

DEVICE RECOVERY SEQUENCE

SPI REPORT
RECOVERY

Latched

Low

No action

Yes

Toggle EN_GATE (Faults clear on


rising edge of EN_GATE)
OR
Write Reg 09h CLR_FLTS bit set 1

Bit clears only on


successful fault
recovery

Warning

Toggles with 64s period

No action

Yes

Read SPI status register 0x01 to


acknowledge warning (otherwise
nFAULT will continue to toggle)

Bit clears on register


read only if condition
has passed

Report only (VDS


mode)

Toggles with 64s period

No action

Yes

Read SPI status register 0x01 to


acknowledge warning (otherwise
nFAULT will continue to toggle)

Bit clears on register


read only if condition
has passed

Real time

No action

No action

Yes

Read SPI register to capture real


time status

Bit clears after


condition has passed

Not reported

No action

No action

No

None

None

Latched +
PWRGD

Low

Low for minimum


of 64 s

Yes

Toggle EN_GATE (Faults clear on


rising edge of EN_GATE)
OR
Write Reg 09h CLR_FLTS bit set 1

Bit clears only on


successful fault
recovery

7.4 Device Functional Modes


7.4.1 Power-Up and Operating States Hardware Configuration for VREG/VREF
Hardware configuration is not required. Voltage regulator voltage (3.3 or 5 V or disabled) is based on orderable
part number.
7.4.1.1 POWER Up
During power-up, all internal circuits are enabled. The VREG will also be enabled based on the hardware
configuration (see Voltage Regulator Control (address = 0xB) section). All gate drive outputs are held low and
the nFAULT pin is taken low by the IC while power up is being executed.
7.4.1.2 STANDBY State
After the startup sequence is completed and the PVDD voltage is above VPVDD_UVLO2, the DRV8305 will indicate
successful and fault-free power up of all circuits by releasing the nFAULT pin.
The device will also enter STANDBY state any time that EN_GATE is taken low or a latched fault occurs.
Gate driver always has control of the power FETs even in STANDBY state.
TI recommends to set up the device control registers through SPI in the STANDBY state.
7.4.1.3 OPERATING State
Normal operation of the gate driver and current shunt amplifiers can be initiated by taking EN_GATE from a low
state to a high state. In this state the charge pump is powered up and the driver is ready for operation.

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Device Functional Modes (continued)


7.4.1.4

SLEEP State

The SLEEP state is invoked by issuing a SLEEP command through SPI. After the SLEEP command is received,
the VREG and the gate driver safely power down internally after a programmable delay.
The DRV8305 can then only be enabled through the WAKE pin which is a high-voltage-tolerant input pin.
For the DRV8305 to be brought out of SLEEP, the WAKE pin must be at a voltage greater than 3 V. This allows
the WAKE to be driven, for example, directly by the battery through a switch, through the inhibit pin (INH) on
standard LIN interface or through standard digital logic. The WAKE pin will only react to a wake-up command if
PVDD > VPVDD_UVLO2.
After the DRV8305 is out of SLEEP mode, all activity on the WAKE pin is ignored.
SLEEP state erases the values in the SPI control registers. TI does not recommend to write through SPI in
SLEEP state.

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7.5 Programming
7.5.1 SPI Communication
7.5.1.1 SPI
SPI is used to set device configuration, operating parameters, and read out diagnostic information. The
DRV8305 SPI operates in slave mode.
The SPI input data (SDI) word consists of a 16-bit word with 11-bit data and 5-bit (MSB) command. The SPI
output data (SDO) word consists of 11-bit register data. (The first 5 bits (MSB) are to be ignored.)
A

valid frame must meet following conditions:


Clock must be low when nSCS goes low.
It should have 16 full clock cycles.
Clock must be low when nSCS goes high.

Data is always shifted out on the rising edge of the clock in the same frame following the 5-bit MSB.
Data is always sampled on the falling edge of the clock in the same frame following the 5-bit MSB.
When SCS is asserted high, any signals at the SCLK and SDI pins are ignored, and SDO is forced into a highimpedance state. When SCS transitions from HIGH to LOW, SDO is enabled and the SPI response word loads
into the shift register based on 5-bit command.
The SCLK pin must be low when SCS transitions low. While SCS is low, at each rising edge of the clock, the
response bit is serially shifted out on the SDO pin with MSB shifted out first.
While SCS is low, at each falling edge of the clock, the new control bit is sampled on the SDI pin. The SPI
command bits are decoded to determine the register address and access type (read or write). The MSB will be
shifted in first. If the word sent to SDI is less than 16 bits or more than 16 bits, it is considered a frame error and
the data will not be written into the destination address. If it is a write command, the data will be ignored.
For a write command, the existing data in the register being written to is shifted out on SDO following the 5-bit
MSB.
SCS should be taken high for at least 500 ns between frames.
7.5.1.2 SPI Format
SPI input data control word is 16-bit long, consisting of:
1 read or write bit W [15]
4 address bits A [14:11]
11 data bits D [10:0]
SPI output data response word is 11-bit long (first 5 bits are ignored) and its content is the content of the register
being accessed
For a Write transaction: The response word is the data currently in the register being written to.
For a Read Command: The response word is the data currently in the register being read.
Table 7. SPI Input Data Control Word Format
R/W

ADDRESS

DATA

Word Bit

B15

B14

B13

B12

B11

B10

B9

B8

B7

B6

B5

B4

B3

B2

B1

B0

Command

W0

A3

A2

A1

A0

D10

D9

D8

D7

D6

D5

D4

D3

D2

D1

D0

Table 8. SPI Output Data Response Word Format


DATA
Word Bit

B15

B14

B13

B12

B11

B10

B9

B8

B7

B6

B5

B4

B3

B2

B1

B0

Command

D10

D9

D8

D7

D6

D5

D4

D3

D2

D1

D0

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7.6 Register Maps


Table 9. Register Map
ADDRESS

NAME

D10

D9

D8

D7

D6

D5

D4

D3

D2

D1

D0

0x1

Warning & Watch


Dog

FAULT

Reserved

TEMP_FLAG4

PVDD_UVFL

PVDD_OVFL

VDS_STATUS

VCPH_UVFL

TEMP_FLAG1

TEMP_FLAG2

TEMP_FLAG3

OTW

0x2

OV/VDS Faults

FETHA_VDS

FETLA_VDS

FETHB_VDS

FETLB_VDS

FETHC_VDS

FETLC_VDS

Reserved

Reserved

SNS_C_OCP

SNS_B_OCP

SNS_A_OCP

0x3

IC Faults

PVDD_UVLO2

WD_FAULT

OTS

Reserved

VREG_UV

AVDD_UVLO

VCP_LSD_UVLO

Reserved

VCPH_UVLO

VCPH_OVLO

VCPH_OVLO_A
BS

0x4

Gate drvier VGS


Faults

FETHA_VGS

FETLA_VGS

FETHB_VGS

FETLB_VGS

FETHC_VGS

FETLC_VGS

Reserved

Reserved

Reserved

Reserved

Reserved

0x5

HS Gate Driver
Control

Reserved

TDRIVEN[1]

TDRIVEN[0]

IDRIVEN_HS[3]

IDRIVEN_HS[2]

IDRIVEN_HS[1]

IDRIVEN_HS[0]

IDRIVEP_HS[3]

IDRIVEP_HS[2]

IDRIVEP_HS[1]

IDRIVEP_HS[0]

0x6

LS Gate Driver
Control

Reserved

TDRIVEP[1]

TDRIVE[0]

IDRIVEN_LS[3]

IDRIVEN_LS[2]

IDRIVEN_LS[1]

IDRIVEN_LS[0]

IDRIVEP_LS[3]

IDRIVEP_LS[2]

IDRIVEP_LS[1]

IDRIVEP_LS[0]

0x7

Gate Drive
Control

Reserved

COMM_OPTION

PWM_MODE[1]

PWM_MODE[0]

DEAD_TIME[2]

DEAD_TIME[1]

DEAD_TIME[0]

TBLANK[1]

TBLANK[0]

TVDS[1]

TVDS[0]

0x8

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

DIS_GDRV
FAULT

EN_SNS_CLAM
P

WD_DLY[1]

WD_DLY[0]

DIS_SNS_OCP

WD_EN

SLEEP

CLR_FLTS

SET_VCPH_UV

0x9

IC Operation

FLIP_OTS

DISABLE
VPVDD_UVLO2

0xA

Shunt Amplifier
Control

DC_CAL_CH3

DC_CAL_CH2

DC_CAL_CH1

CS_BLANK[1]

CS_BLANK[0]

GAIN_CS3[1]

GAIN_CS3[0]

GAIN_CS2[1]

GAIN_CS2[0]

GAIN_CS1[1]

GAIN_CS1[0]

0xB

Voltage
Regulator Control

Reserved

VREF_SCALE[1]

VREF_SCALE[0]

Reserved

Reserved

Reserved

SLEEP_DLY[1]

SLEEP_DLY[0]

DIS_VREG_PW
RGD

VREG_UV_LEVE
L[1]

VREG_UV_LEVE
L[0]

0xC

VDS Sense
Control

Reserved

Reserved

Reserved

VDS_LEVEL[4]

VDS_LEVEL[3]

VDS_LEVEL[2]

VDS_LEVEL[1]

VDS_LEVEL[0]

VDS_MODE[2]

VDS_MODE[1]

VDS_MODE[0]

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7.6.1 Read / Write Bit


The MSB bit of SDI word (W0) is read/write bit. When W0 = 0, input data is a write command; when W0 = 1,
input data is a read command, and the register value will send out on the same word cycle from SDO from D10
to D0.
7.6.2 Status Registers
Status registers are used to report warning, fault conditions and provide a means to prevent timing out of the
watchdog timer. Status registers are read only registers.
7.6.3 0x1 Warning and Watchdog Reset
Table 10. Warning and Watchdog Reset Register Description
BIT

R/W

NAME

DEFAULT

DESCRIPTION

10

FAULT

0x0

0 - Warning,
1 - Latched fault

Reserved

0x0

TEMP_Flag4

0x0

Temperature flag setting for about 175C

PVDD_UVFL

0x0

PVDD undervoltage flag warning

PVDD_OVFL

0x0

PVDD overvoltage flag warning

VDS_STATUS

0x0

Real time or of all VDS sensors (0x2[D10:5])

VCHP_UVFL

0x0

Charge pump undervoltage flag warning

TEMP_Flag1

0x0

Temperature flag setting for about 105C

TEMP_Flag2

0x0

Temperature flag setting for about 125C

TEMP_Flag3

0x0

Temperature flag setting for about 135C

OTW

0x0

Overtemperature warning

7.6.4 0x2 OV/VDS Faults


Table 11. OV/VDS Faults Register Description
BIT

R/W

NAME

DEFAULT

DESCRIPTION

10

FETHA_VDS

0x0

VDS monitor fault for high-side FET A

FETLA_VDS

0x0

VDS monitor fault for low-side FET A

FETHB_VDS

0x0

VDS monitor fault for high-side FET B

FETLB_VDS

0x0

VDS monitor fault for low-side FET B

FETHC_VDS

0x0

VDS monitor fault for high-side FET C

FETLC_VDS

0x0

VDS monitor fault for low-side FET C

4:3

Reserved

0x0

SNS_C_OCP

0x0

Sense C overcurrent protection flag

SNS_B_OCP

0x0

Sense B overcurrent protection flag

SNS_A_OCP

0x0

Sense A overcurrent protection flag

32

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7.6.5 0x3 IC Faults


Table 12. IC Faults Register Description
BIT

R/W

NAME

DEFAULT

DESCRIPTION

10

PVDD_UVLO2

0x0

PVDD undervoltage 2 fault

WD_FAULT

0x0

Watchdog fault

OTS

0x0

Overtemperature fault

Reserved

0x0

VREG_UV

0x0

VREG undervoltage fault

AVDD_UVLO

0x0

AVDD undervoltage fault

VCP_LSD_UVLO

0x0

Charge pump low-side gate driver fault

Reserved

0x0

VCPH_UVLO

0x0

Charge pump high-side undervoltage 2 fault

VCPH_OVLO

0x0

Charge pump high-side overvoltage fault

VCPH_OVLO_ABS

0x0

Charge pump high-side overvoltage ABS fault

7.6.6 0x4 Gate Driver VGS Faults


Table 13. Gate Driver VGS Faults Register Description
BIT

R/W

NAME

DEFAULT

DESCRIPTION

10

FETHA_VGS

0x0

VGS monitor fault for high-side FET A

FETLA_VGS

0x0

VGS monitor fault for low-side FET A

FETHB_VGS

0x0

VGS monitor fault for high-side FET B

FETLB_VGS

0x0

VGS monitor fault for low-side FET B

FETHC_VGS

0x0

VGS monitor fault for high-side FET C

FETLC_VGS

0x0

VGS monitor fault for low-side FET C

4:0

Reserved

0x0

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7.6.7 Control Registers


Control registers are used to set the user parameter for DRV8305. The default values are shown in bold.
Control registers may be read and do not clear on read or EN_GATE resets
Control registers are cleared to default values on power up
Control registers are cleared to default values when the device enters SLEEP mode
7.6.7.1

HS Gate Driver Control (address = 0x5)


Table 14. HS Gate Driver Control Register Description

BIT

R/W

NAME

DEFAULT

10

R/W

Reserved

0x0

DESCRIPTION

9:8

R/W

TDRIVEN

0x3

High-side gate driver peak source time


b'00 - 250 ns
b'01 - 500 ns
b'10 - 1000 ns
b'11 - 2000 ns

7:4

R/W

IDRIVEN_HS

0x4

High-side gate driver peak sink current


b'0000 - 20 mA
b'0100 - 60 mA
b'1000 - 0.50 A
b'1100 - 60 mA

3:0

R/W

IDRIVEP_HS

0x4

- 30 mA
- 70 mA
- 0.75 A
- 60 mA

b'0010
b'0110
b'1010
b'1110

- 40 mA
- 80 mA
- 1.00 A
- 60 mA

b'0011
b'0111
b'1011
b'1111

- 50 mA
- 0.25 A
- 1.25 A
- 60 mA

- 30 mA
- 70 mA
- 0.75 A
- 50 mA

b'0011
b'0111
b'1011
b'1111

- 40 mA
- 0.125 A
- 1.00 A
- 50 mA

- 40 mA
- 80 mA
- 1.00 A
- 60 mA

b'0011
b'0111
b'1011
b'1111

- 50 mA
- 0.25 A
- 1.25 A
- 60 mA

- 30 mA
- 70 mA
- 0.75 A
- 50 mA

b'0011
b'0111
b'1011
b'1111

- 40 mA
- 0.125 A
- 1.00 A
- 50 mA

High-side gate driver peak source current


b'0000 - 10 mA
b'0100 - 50 mA
b'1000 - 0.25 A
b'1100 - 50 mA

7.6.7.2

b'0001
b'0101
b'1001
b'1101
b'0001
b'0101
b'1001
b'1101

- 20 mA
- 60 mA
- 0.50 A
- 50 mA

b'0010
b'0110
b'1010
b'1110

LS Gate Driver Control (address = 0x6)


Table 15. LS Gate Driver Control Register Description

BIT

R/W

NAME

DEFAULT

10

R/W

Reserved

0x0

DESCRIPTION

9:8

R/W

TDRIVEP

0x3

Low-side gate driver peak source time


b'00 - 250 ns
b'01 - 500 ns
b'10 - 1000 ns
b'11 - 2000 ns

7:4

R/W

IDRIVEN_LS

0x4

Low-side gate driver peak sink current


b'0000 - 20 mA
b'0100 - 60 mA
b'1000 - 0.50 A
b'1100 - 60 mA

3:0

R/W

IDRIVEP_LS

0x4

- 30 mA
- 70 mA
- 0.75 A
- 60 mA

b'0010
b'0110
b'1010
b'1110

Low-side gate driver peak source current


b'0000 - 10 mA
b'0100 - 50 mA
b'1000 - 0.25 A
b'1100 - 50 mA

34

b'0001
b'0101
b'1001
b'1101

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b'0001
b'0101
b'1001
b'1101

- 20 mA
- 60 mA
- 0.50 A
- 50 mA

b'0010
b'0110
b'1010
b'1110

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Gate Drive Control (address = 0x7)


Table 16. Gate Drive Control Register Description

BIT

R/W

NAME

DEFAULT

DESCRIPTION

10

R/W

Reserved

0x0

R/W

COMM_OPTION

0x1

Rectification control (PWM_MODE = b'10 only)


b'0 - diode freewheeling
b'1 - active freewheeling

8:7

R/W

PWM_MODE

0x0

PWM Mode
b'00 - PWM with 6 independent inputs
b'01 - PWM with 3 independent inputs
b'10 - PWM with one input
b'11 - PWM with 6 independent inputs

6:4

R/W

DEAD_TIME

0x1

Dead time
b'000 - 40 ns
b'011 - 500 ns
b'110 - 4000 ns

3:2

R/W

TBLANK

0x1

VDS sense blanking


b'00 - 0 s
b'01 - 2 s
b'10 - 4 s
b'11 - 8 s

1:0

R/W

TVDS

0x2

VDS sense deglitch


b'00 - 0 s
b'01 - 2 s
b'10 - 4 s
b'11 - 8 s

b'001 - 60 ns
b'100 - 1000 ns
b'111 - 6000 ns

b'010 - 100 ns
b'101 - 2000 ns

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IC Operation (address = 0x9)


Table 17. IC Operation Register Description

BIT

R/W

NAME

DEFAULT

DESCRIPTION

10

R/W

Flip_OTS

0x0

Enable OTS
b'0 - Disable OTS
b'1 - Enable OTS

R/W

DIS_VPVDD_UVLO2

0x0

Disable PVDD_UVLO2 fault and reporting


b'0 - PVDD_UVLO2 enabled
b'1 - PVDD_UVLO2 disabled

R/W

DIS_GDRV_FAULT

0x0

Disable gate driver fault and reporting


b'0 - Gate driver fault enabled
b'1 - Gate driver fault disabled

R/W

EN_SNS_CLAMP

0x0

Enable sense amplifier clamp


b'0 - sense amplifier clamp is not enabled
b'1 - sense amplifier clamp is enabled limiting output to about
3.3 V

6:5

R/W

WD_DLY

0x1

Watch dog delay


b'00 - 10 ms
b'01 - 20 ms
b'10 - 50 ms
b'11 - 100 ms

R/W

DIS_SNS_OCP

0x0

Disable SNS overcurrent protection fault and reporting


b'0 - SNS OCP enabled
b'1 - SNS OCP disabled

R/W

WD_EN

0x0

Watch dog enable


b'0 - Watch dog disabled
b'1 - Watch dog enabled

R/W

SLEEP

0x0

Put device into sleep mode


b'0 - Device awake
b'1 - Device asleep

R/W

CLR_FLTS

0x0

Clear faults
b'0 - Normal operation
b'1 - Clear fault bits

R/W

SET_VCPH_UV

0x0

Set charge pump undervoltage threshold level


b'0 - 4.9 V
b'1 - 4.6 V

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Shunt Amplifier Control (address = 0xA)


Table 18. Shunt Amplifier Control Register Description

BIT

R/W

NAME

DEFAULT

DESCRIPTION

10

R/W

DC_CAL_CH3

0x0

DC Calibration of CS amplifier 3
b'0 - Normal operation
b'1 - DC calibration mode

R/W

DC_CAL_CH2

0x0

DC Calibration of CS amplifier 2
b'0 - Normal operation
b'1 - DC calibration mode

R/W

DC_CAL_CH1

0x0

DC Calibration of CS amplifier 1
b'0 - Normal operation
b'1 - DC calibration mode

7:6

R/W

CS_BLANK

0x0

Current shunt amplifier blanking time


b'00 - 0 ns
b'01 - 500 ns
b'10 - 2.5 s
b'11 - 10 s

5:4

R/W

GAIN_CS3

0x0

Gain of CS amplifier 3
b'00 - 10 V/V
b'01 - 20 V/V
b'10 - 40 V/V
b'11 - 80 V/V

3:2

R/W

GAIN_CS2

0x0

Gain of CS amplifier 2
b'00 - 10 V/V
b'01 - 20 V/V
b'10 - 40 V/V
b'11 - 80 V/V

1:0

R/W

GAIN_CS1

0x0

Gain of CS amplifier 1
b'00 - 10 V/V
b'01 - 20 V/V
b'10 - 40 V/V
b'11 - 80 V/V

7.6.7.6

Voltage Regulator Control (address = 0xB)


Table 19. Voltage Regulator Control Register Description

BIT

R/W

NAME

DEFAULT

10

R/W

Reserved

0x0

9:8

R/W

VREF_SCALING

0x1

7:5

R/W

Reserved

0x0

4:3

R/W

SLEEP_DLY

0x1

R/W

DIS_VREG_PWRGD

0x0

0:1

R/W

VREG_UV_LEVEL

0x2

DESCRIPTION
VREF Scaling
b'00 - RSVD
b'01 - k = 2
b'10 - k = 4
b'11 - RSVD
Delay to power down VREG after SLEEP
b'00 - 0 s
b'01 - 10 s
b'10 - 50 s
b'11 - 1 ms
VREG undervoltage set point
b'00 - VSET-10%
b'01 - VSET-20%
b'10 - VSET-30%
b'11 - VSET-30%

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VDS Sense Control (address = 0xC)


Table 20. VDS Sense Control Register Description

BIT

R/W

NAME

DEFAULT

10:8

R/W

Reserved

0x0

7:3

R/W

VDS_LEVEL

0x19

DESCRIPTION
VDS comparator threshold
b'00000
V
b'00100
V
b'01000
V
b'01100
V
b'10000
V
b'10100
V
b'11000
V
b'11100
V

2:0

38

R/W

VDS_MODE

0x0

- 0.060
- 0.097
- 0.155
- 0.250
- 0.403
- 0.648
- 1.043
- 1.679

b'00001 - 0.068
V
b'00101 - 0.109
V
b'01001 - 0.175
V
b'01101 - 0.282
V
b'10001 - 0.454
V
b'10101 - 0.730
V
b'11001 - 1.175
V
b'11101 - 1.892
V

b'00010
V
b'00110
V
b'01010
0.197V
b'01110
V
b'10010
V
b'10110
V
b'11010
V
b'11110
V

- 0.076
- 0.123
- 0.317
- 0.511
- 0.822
- 1.324
- 2.131

b'00011
V
b'00111
V
b'01011
V
b'01111
V
b'10011
V
b'10111
V
b'11011
V
b'11111
V

- 0.086
- 0.138
- 0.222
- 0.358
- 0.576
- 0.926
- 1.491
- 2.131

VDS mode
b'000 - Latched shut down when over-current detected
b'001 - Report only when over current detected
b'010 - VDS protection disabled (no overcurrent sensing or reporting)

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8 Application and Implementation


NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TIs customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.

8.1 Application Information


The DRV8305 is a gate driver IC designed to drive a 3-phase BLDC motor in combination with external power
MOSFETs. The device provides a high level of integration with three half-bridge gate drivers, three current shunt
amplifiers, adjustable slew rate control, logic LDO, and a suite of protection features.

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8.2 Typical Application


The following design is a common application of the DRV8305.
PVDD
4.7F

PVDD

1 F

2.2 F
1 F

PVDD

24

23

22

21

13

10 k

27
26
25

1 F
SH_C

GL_A

GL_B

34.8 k

SL_A
GL_B

34.8 k

GL_A

GL_C

SL_A
SN1

GH_C

1000 pF

SH_C

SP1

SL_B
SN2
1000 pF
SP2

SL_C
SN3
1000 pF

0.1 F

SH_B
GH_B

4.99 k

SL_B
CSENSE

28

VCC

SH_B

5 m

29

SH_A

0.1 F

30

SH_A

4.99 k

31

GH_C
VCC

34.8 k

32

GH_B
VCC

BSENSE

GL_C

33

1 F

1 F

SCLK

34

GH_A
GH_A

SP3

SL_C
GL_B

SP1

SL_C

SN1

SH_C

SDO

SP2

SDI

SN2

GH_C

SP3

nSCS

35

4.99 k

GH_B

36

5 m

nFAULT

VCC

PVDD

PVDD

37
VCP_LSD

38

39
CP2H

VCPH

41

40
CP2L

PVDD

42
CP1L

CP1H

43

44
VDRAIN

46

45
GND

DVDD

SH_B

PWRGD

12

INLC

20

11

SL_B

DRV8305

SN3

10
SPI

INHC

SO3

GL_B

19

GPIO

INLB

SO2

SL_A
GL_A

18

10 k

PWR_PAD (0) - GND

INHB

17

INLA

SO1

VCC

GH_A
SH_A

AVDD

INHA

16

3
PWM

EN_GATE

GND

15

GPIO

WAKE

48
VREG

POWER

47

1 F

VCC

14

MCU

5 m

0.1 F

0.1 F

0.1 F

ASENSE

100

VCC

PVDD
VCC

34.8 k

0.01 F

0.1 F

470 F

470 F

SP1

SP2

SN1

SP3

SN2

1 F

SN3

GPIO

ADC

ASENSE

0.1 F

4.99 k

PVDDSENSE
PVDDSENSE

BSENSE
CSENSE

Figure 11. Typical Application Schematic

40

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8.2.1 Design Requirements


Table 21. Design Parameters
DESIGN PARAMETER
Supply voltage

REFERENCE

VALUE

PVDD

12 V

MR

0.5

Motor winding inductance

ML

0.28 mH

Motor poles

MP

16 poles

Motor rated RPM

MRPM

2000 RPM

Number of MOSFETs switching

NSW

Switching frequency

fSW

45 kHz

IDRIVEP

IDRIVEP

50 mA

IDRIVEN

Motor winding resistance

IDRIVEN

60 mA

MOSFET QG

Qg

36 nC

MOSFET QGD

QGD

9 nC

RDS(on)

4.1 m

MOSFET RDS(on)
Target full-scale current

IMAX

30 A

Sense resistor

RSENSE

0.005

VDS trip level

VDS_LVL

0.197 V

Amplifier bias

VBIAS

1.65 V

Amplifier gain

Gain

10 V/V

8.2.2 Detailed Design Procedure


8.2.2.1 Gate Drive Average Current
The gate drive supply (VCP) of the DRV8305 is capable of delivering up to 30 mA (RMS) of current to the
external power MOSFETs. The charge pump directly supplies the high-side N-channel MOSFETs and a 10-V
LDO powered from VCP supplies the low-side N-channel MOSFETs. The designer can determine the
approximate RMS load on the gate drive supply through the following equation.
Gate Drive RMS Current = MOSFET Qg Number of Switching MOSFETs Switching Frequency

(2)

Example: 36 nC (QG) 6 (NSW) 45 kHz (fSW) = 9.72 mA


Note that this is only a first-order approximation.
8.2.2.2 MOSFET Slew Rates
The rise and fall times of the external power MOSFET can be adjusted through the use of the DRV8305 IDRIVE
setting. A higher IDRIVE setting will charge the MOSFET gate more rapidly where a lower IDRIVE setting will
charge the MOSFET gate more slowly. System testing requires fine tuning to the desired slew rate, but a rough
first-order approximation can be calculated as shown in the following.
MOSFET Slew Rate = MOSFET QGD / IDRIVE Setting

(3)

Example: 9 nC (QGD) / 50 mA (IDRIVEP) = 180 ns


8.2.2.3 Overcurrent Protection
The DRV8305 provides overcurrent protection for the external power MOSFETs through the use of VDS
monitors for both the high-side and low-side MOSFETs. These are intended for protecting the MOSFET in
overcurrent conditions and are not for precise current regulation.
The overcurrent protection works by monitoring the VDS voltage drop of the external MOSFETs and comparing it
against the internal VDS_LEVEL set through the SPI registers. The high-side VDS is measured across the
VDRAIN and SH_X pins. The low-side VDS is measured across the SH_X and SL_X pins. If the VDS voltage
exceeds the VDS_LEVEL value, the DRV8305 will take action according to the VDS_MODE register.
The overcurrent trip level can be determined with the MOSFET RDS(on) and the VDS_LEVEL setting.
Overcurrent Trip = VDS Level (VDS_LVL) / MOSFET RDS(on) (RDS(on))

(4)
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Example: 0.197 V (VDS_LVL) / 4.1 m (RDS(ON)) = 48 A


8.2.2.4 Current Sense Amplifiers
The DRV8305 provides three bidirectional low-side current shunt amplifiers. These can be used to sense the
current flowing through each half-bridge. If individual half-bridge sensing is not required, a single current shunt
amplifier can be used to measure the sum of the half-bridge current. Use this simple procedure to correctly
configure the current shunt amplifiers.
1. Determine the peak current that the motor will demand (IMAX). This demand depends on the motor
parameters and the application requirements. IMAX in this example is 14 A.
2. Determine the available voltage output range for the current shunt amplifiers. This will be the voltage
around the amplifier bias voltage (VBIAS). In this case VBIAS = 1.65 V and a valid output voltage is 0 to 3.3
V. This gives an output range of 1.65 V.
3. Determine the sense resistor value and amplifier gain settings. The sense resistor value and amplifier gain
have common tradeoffs. The larger the sense resistor value, the better the resolution of the half-bridge
current. This comes at the cost of additional power dissipated from the sense resistor. A larger gain value
allows for the use of a smaller resolution, but at the cost of increased noise in the output signal and a longer
settling time. This example uses a 5-m sense resistor and the minimum gain setting of the DRV8305 (10
V/V). These values allow the current shunt amplifiers to measure 33 A across the sense resistor.

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8.2.3 Application Curves

Figure 12. Gate Drive 20% Duty Cycle

Figure 13. Gate Drive 80% Duty Cycle

Figure 14. Motor Spinning 1000 RPM

Figure 15. Motor Spinning 2000 RPM

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9 Power Supply Recommendations


9.1 Bulk Capacitance
Having appropriate local bulk capacitance is an important factor in motor drive system design. It is generally
beneficial to have more bulk capacitance, while the disadvantages are increased cost and physical size.
The amount of local capacitance needed depends on a variety of factors, including the:
Highest current required by the motor system
Power supplys capacitance and ability to source or sink current
Amount of parasitic inductance between the power supply and motor system
Acceptable voltage ripple
Type of motor used (brushed DC, brushless DC, stepper)
Motor braking method
The inductance between the power supply and motor drive system will limit the rate current can change from the
power supply. If the local bulk capacitance is too small, the system will respond to excessive current demands or
dumps from the motor with a change in voltage. When adequate bulk capacitance is used, the motor voltage
remains stable and high current can be quickly supplied.
The data sheet generally provides a recommended value, but system-level testing is required to determine the
appropriate-sized bulk capacitor.

Power Supply

Parasitic Wire
Inductance

Motor Drive System


VM

Motor
Driver
GND

Local
Bulk Capacitor

IC Bypass
Capacitor

Figure 16. Example Setup of Motor Drive System With External Power Supply
The voltage rating for bulk capacitors should be higher than the operating voltage, to provide margin for cases
when the motor transfers energy to the supply.

44

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Copyright 2015, Texas Instruments Incorporated

Product Folder Links: DRV8305

DRV8305
www.ti.com

SLVSCX2A AUGUST 2015 REVISED SEPTEMBER 2015

10 Layout
10.1 Layout Guidelines
Use the following layout recommendations when designing a PCB for the DRV8305.
The DVDD and AVDD 1-F bypass capacitors should connect directly to the adjacent GND pin to minimize
loop impedance for the bypass capacitor.
The CP1 and CP2 0.047-F flying capacitors should be placed directly next to the DRV8305 charge pump
pins.
The VCPH 2.2-F and VCP_LSD 1-F bypass capacitors should be placed close to their corresponding pins
with a direct path back to the DRV8305 GND net.
The PVDD 4.7-F bypass capacitor should be placed as close as possible to the DRV8305 PVDD supply pin.
Use the proper footprint as shown in the Mechanical, Packaging, and Orderable Information section.
Minimize the loop length for the high-side and low-side gate drivers. The high-side loop is from the DRV8305
GH_X to the power MOSFET and returns through SH_X. The low-side loop is from the DRV8305 GL_X to the
power MOSFET and returns through SL_X.

10.2 Layout Example

Figure 17. Layout Recommendation

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Copyright 2015, Texas Instruments Incorporated

Product Folder Links: DRV8305

45

DRV8305
SLVSCX2A AUGUST 2015 REVISED SEPTEMBER 2015

www.ti.com

11 Device and Documentation Support


11.1 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.

11.2 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.

11.3 Electrostatic Discharge Caution


These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.

11.4 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.

12 Mechanical, Packaging, and Orderable Information


The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

46

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Product Folder Links: DRV8305

PACKAGE OPTION ADDENDUM

www.ti.com

16-Sep-2015

PACKAGING INFORMATION
Orderable Device

Status
(1)

Package Type Package Pins Package


Drawing
Qty

Eco Plan

Lead/Ball Finish

MSL Peak Temp

(2)

(6)

(3)

Op Temp (C)

Device Marking
(4/5)

DRV83053PHP

ACTIVE

HTQFP

PHP

48

250

Green (RoHS
& no Sb/Br)

CU NIPDAU

Level-3-260C-168 HR

-40 to 125

DRV83053

DRV83053PHPR

ACTIVE

HTQFP

PHP

48

1000

Green (RoHS
& no Sb/Br)

CU NIPDAU

Level-3-260C-168 HR

-40 to 125

DRV83053

DRV83055PHP

ACTIVE

HTQFP

PHP

48

250

Green (RoHS
& no Sb/Br)

CU NIPDAU

Level-3-260C-168 HR

-40 to 125

DRV83055

DRV83055PHPR

ACTIVE

HTQFP

PHP

48

1000

Green (RoHS
& no Sb/Br)

CU NIPDAU

Level-3-260C-168 HR

-40 to 125

DRV83055

DRV8305NPHP

ACTIVE

HTQFP

PHP

48

250

Green (RoHS
& no Sb/Br)

CU NIPDAU

Level-3-260C-168 HR

-40 to 125

DRV8305N

DRV8305NPHPR

ACTIVE

HTQFP

PHP

48

1000

Green (RoHS
& no Sb/Br)

CU NIPDAU

Level-3-260C-168 HR

-40 to 125

DRV8305N

(1)

The marketing status values are defined as follows:


ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)

Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)

MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

(4)

There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

(5)

Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.

Addendum-Page 1

Samples

PACKAGE OPTION ADDENDUM

www.ti.com

16-Sep-2015

(6)

Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF DRV8305 :

Automotive: DRV8305-Q1
NOTE: Qualified Version Definitions:

Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects

Addendum-Page 2

PACKAGE MATERIALS INFORMATION


www.ti.com

16-Sep-2015

TAPE AND REEL INFORMATION

*All dimensions are nominal

Device

Package Package Pins


Type Drawing

SPQ

Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)

B0
(mm)

K0
(mm)

P1
(mm)

W
Pin1
(mm) Quadrant

DRV83053PHPR

HTQFP

PHP

48

1000

330.0

16.4

9.6

9.6

1.5

12.0

16.0

Q2

DRV83055PHPR

HTQFP

PHP

48

1000

330.0

16.4

9.6

9.6

1.5

12.0

16.0

Q2

DRV8305NPHPR

HTQFP

PHP

48

1000

330.0

16.4

9.6

9.6

1.5

12.0

16.0

Q2

Pack Materials-Page 1

PACKAGE MATERIALS INFORMATION


www.ti.com

16-Sep-2015

*All dimensions are nominal

Device

Package Type

Package Drawing

Pins

SPQ

Length (mm)

Width (mm)

Height (mm)

DRV83053PHPR

HTQFP

PHP

48

1000

367.0

367.0

38.0

DRV83055PHPR

HTQFP

PHP

48

1000

367.0

367.0

38.0

DRV8305NPHPR

HTQFP

PHP

48

1000

367.0

367.0

38.0

Pack Materials-Page 2

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