Sr.

No.
1

Sample detail

Characterization

Silver negative ion

a.
b.
implantation of RF
sputtering deposited TiO2
thin films

UV-visible spectroscopy
Raman spectroscopy
c. XRD
d. RBS
e. Surface SEM/ Cross sectional
TEM/SEM

Annealing study before

cross sectional TEM
2

Annealing study of MRF

series

B7, B8, B9, B10 series

Annealing study
4

MEX Irradiated with 90

MeV NI
Ag-TiO2

UV-visible spectroscopy

a.
b.
c.
d.

UV-visible spectroscopy
RBS
XRD
TEM

a.
b.
c.
d.

UV-visible spectroscopy
RBS
XRD
Surface SEM/ Cross sectional
TEM/SEM

1. Repeat UV-visible of imp 4.

2. UV-visible of samples 10,11,9 (RF sputtering deposited) also check
transmittance in 300 to 450 nm range separately.
3. Repeat side D 55 MeV Si Series.
4. Ag-TiO2 spin coating UV