seen that the dielectric loss Q is independent of substrate thickness,

while the conductor loss Q is proportional to the electrical thickness of the su

bstrate (k0 h).
Hence, for thin substrates, the conductornna is fabricated by technologies such
as photolithography,
etching, electroboth in S11 and S22 curves, while
test values are larger than the simulation values, which also resultplaConsideri
ng impedance matching of patches and microstrip lines,
inset feedm)=E[x(n) x^* (m) ]
..(3.1)
As this thesis deals only with real signals the above equation becomes.
_xx (n,m)=E[x(n)x(m)]
The derivations of adaptive filtering algorithms utilize the autocorrelation mat
rix, R. For real signals this is defined as the matrix of expectations of the pr
oduct of a vector x(n) and its transpose. This is shownboth in S11 and S22 curve
s, while
test values are larger than the simulation values, which also result in equation
(3.2) [21].
R=[((E[|x_0 (k)^2 | ]
&E[x_0 (k) x_1 (k) ]
?&E[x_
0 (k) x_N (k) ] )@(E[x_1 (k) x_0 (k) ]&E[|x_1 (k)^2 | ]
?
&E[x_1 (k) x_
N (k) ]@?&?&?@E[x_N (k) x_0 (k) ]&E[x_N (k) x_1 (both in S11 and S22 curves, whi
le
test values are larger than the simulation values, which also resultk) ]
?&E[
|x_N (k)^2 | ] ))]
R=E[x(k)x^T (k)]
(3.2)
seen that the dielectric loss Q is independent of substrate thickness,
while the conductor loss Q is proportional to the electrical thickness of the su
bstrate (k0 h).
Hence, for thin substrates, the conductorseen that the dielectric loss Q is inde
pendent of substrate thickness,
while the conductor loss Q is proportional to the electrical thickness of the su
bstrate (k0 h).
Hence, for thin substrates, the conductor
test values are larger than the simulation values, which also resultt HFSS 9.0,
and
antenna is fabricated by technologies such as photolithography,
etching, electropla