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Diagnostic - Dark Current Test

23-Apr-14
Specification
Date: 4/23/2014; Time: 3:19:21 PM
Dark Current Maximum Value
Dark Current Minimum Value

<= 12000 cts


> 0 cts

24-Apr-14
Specification
Date: 4/24/2014; Time: 10:44:39 AM
Dark Current Maximum Value
Dark Current Minimum Value

<= 12000 cts


> 0 cts

ent Test

Measured
4080.0 cts
2259.0 cts

Measured
3268.0 cts
2733.0 cts

Result
Test passed
Test passed

Result
Test passed
Test passed

Diagnostic - Intensity
23-Apr-14
Specification
Date: 4/23/2014; Time: 3:22:04 PM
Lowest intensity in range 190nm - 220nm:
Lowest intensity in range 220nm - 350nm:
Lowest intensity in range 350nm - 500nm:
Lowest intensity in range 500nm - 950nm:
Lowest intensity in range 950nm - 1100nm:

> 2000 cts


> 5000 cts
> 2000 cts
> 4000 cts
> 200 cts

24-Apr-14
Specification
Date: 4/24/2014; Time: 10:45:47 AM
Lowest intensity in range 190nm - 220nm:
Lowest intensity in range 220nm - 350nm:
Lowest intensity in range 350nm - 500nm:
Lowest intensity in range 500nm - 950nm:
Lowest intensity in range 950nm - 1100nm:

> 2000 cts


> 5000 cts
> 2000 cts
> 4000 cts
> 200 cts

ty

Measured
27733
31848
23012
34380
957

Result
cts
cts
cts
cts
cts

Measured
29278
31507
22743
33486
910

Test
Test
Test
Test
Test

passed
passed
passed
passed
passed

Result
cts
cts
cts
cts
cts

Test
Test
Test
Test
Test

passed
passed
passed
passed
passed

Diagnostic - Stability
23-Apr-14
Specification
Date: 4/23/2014; Time: 3:25:00 PM
Stability test intensity at 340 nm

<= 100 cts

24-Apr-14
Specification
Date: 4/24/2014; Time: 10:47:13 AM
Stability test intensity at 340 nm

<= 100 cts

ability

Measured

Result

19.0 cts

Test passed

Measured

Result

18.0 cts

Test passed

HASIL VERIFICATION & DIAGNOSTIC


Instrument Self Test

22-Apr-14
Test
Filter and shutter test
Dark current test
Min. intensity (190nm - 220nm)
Min. intensity (220nm - 350nm)
Min. intensity (350nm - 500nm)
Min. intensity (500nm - 950nm)
Min. intensity (950nm - 1100nm)
Wavelength at 486.0nm
Wavelength at 656.1nm
RMS Noise
RMS Baseline flatness

Specification
< 500 msec
0..12000 cts
> 2000 cts
> 5000 cts
> 2000 cts
> 4000 cts
> 200 cts
485.5..486.5 nm
655.6..656.6 nm
< 0.0002
< 0.001

Measured
50 msec
2961..3258 cts
31412 cts
32322 cts
23325 cts
33193 cts
892 cts
485.942 nm
656.031 nm
0.000048
0.000157

Filter and shutter test


Dark current test
Min. intensity (190nm - 220nm)
Min. intensity (220nm - 350nm)
Min. intensity (350nm - 500nm)
Min. intensity (500nm - 950nm)
Min. intensity (950nm - 1100nm)
Wavelength at 486.0nm
Wavelength at 656.1nm
RMS Noise
RMS Baseline flatness

Specification
< 500 msec
0..12000 cts
> 2000 cts
> 5000 cts
> 2000 cts
> 4000 cts
> 200 cts
485.5..486.5 nm
655.6..656.6 nm
< 0.0002
< 0.001

Measured
50 msec
2922..3192 cts
28869 cts
31960 cts
23116 cts
34402 cts
982 cts
486.002 nm
656.096 nm
0.000061
0.000184

Filter and shutter test


Dark current test
Min. intensity (190nm - 220nm)
Min. intensity (220nm - 350nm)

Specification
< 500 msec
0..12000 cts
> 2000 cts
> 5000 cts

Measured
50 msec
2961..3275 cts
29156 cts
31528 cts

23-Apr-14

Min. intensity (350nm - 500nm)


Min. intensity (500nm - 950nm)
Min. intensity (950nm - 1100nm)
Wavelength at 486.0nm
Wavelength at 656.1nm
RMS Noise
RMS Baseline flatness

> 2000 cts


> 4000 cts
> 200 cts
485.5..486.5 nm
655.6..656.6 nm
< 0.0002
< 0.001

22775 cts
33486 cts
915 cts
485.964 nm
656.052 nm
0.000046
0.000184

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

Result
Passed
Passed
Passed
Passed

Passed
Passed
Passed
Passed
Passed
Passed
Passed

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