10 watt, MBE GaAs FET
Power Amplifier
The authors describe a compact, 32% added efficiency, 10 watt, Class AB power
amplifier module using GaAs FETs. The devices are made using molecular beam
epitaxy technology.
Raymond Basset
Bernard Kraemer
Ding Day
Microwave Power Products
Avantek, Inc.
Santa Clara, California
62 APPiiED MICROWAVE Summer 1992
‘compact, X-band, high efficiency power
An capable of delivering 10 watts of
power has been designed for use in solid
state transmitters, electronic warfare systems and
active phased-array applications. The performance
in the 9.0-10.0 GHz band measured in CW oper-
ation combines +40 dBm of output power (Po), 19
Bf associated gain (GLS) and 32% power-added
efficiency (Eadd). This module also can be operat-
ed in a pulsed mode.
Hybrid and MMIC technology are combined to
realize the efficient, 10 watt, X-Band amplifier
module.
‘The amplifier uses hybrid technology and what
we believe to be state-of-the-art molecular beam
epitaxial (MBE) processing to realize its microwave
monolithic integrated circuits (MMICs) and dis-
crete GaAs FETS. The driver stage is a 2.5 watt,
two-stage, single-ended power MMIC consisting of
2.2mm driver FET and a 5.76mm power FET. The
power stage uses a pair of 6 watt, 12mm discretepower FETs combined in a balanced configuration
with Lange couplers. The off-chip matching circuits
and couplers are thin-film microstrip lines printed
on alumina or barium titanate substrates.
MMIC and discrete FET chips, capacitors and
substrates are eutectically bonded onto a multi-lev-
el gold-plated copper-molybdenum composite met-
al carrier. This module contains on-board gate and
drain bias circuits including decoupling and DC
blocking capacitors. Overall module dimensions
are 208mm x 7.6mm,
The goal was to meet the requirements for an
airborne system in which space and power are
limited.
The goal for the module is to meet the require-
ments for X-band airborne systems in which both
space and prime power are limited. The use of high-
efficiency active devices also minimizes device
channel temperature tise, to help increase the reli-
ability of the system. Applications for this module
include TWT replacement, transmitters for passive
phased-array systems and transmit/receive modules
for active phased-array radars.
The most important performance parameter for
high power devices is the power added efficiency
(Eadd). High module output power can be ob-
tained by combining several devices using parallel,
push-pull or other balancing techniques. The out-
put power (Pout) of cach MMIC or discrete chip is
‘maximized by using the largest possible gate width
for the power stage compatible with acceptable
production yields,
Efficient device performance results when gain
and breakdown voltage are optimized
simultaneous.
‘The key to efficient device performance is to op-
timize simultaneously gain and breakdown voltage.
The material structure plays a very important role
in this optimization. Generally, the gain increases.
with the doping level in the active channel layer.
However, increased doping results in a higher input
capacitance and a lower breakdown voltage. The
latter should be as large as possible for high Pout
and Eadd. One solution to providing high break-
down is to use a High-Low-High (H.L.H.) doping,
64 aPeniey MICROWAVE Sumner 1992
profile grown by molecular beam epitaxy. This is
our standard power FET process [1]
Five years ago, the best efficiency was realized
exclusively with hybrids, today a mixture of
hybrid and MMIC can be effectv
Amplifier Topology
Four to five years ago the most practical method
for producing a high performance power module
‘was to use hybrid technology with discrete tran:
tors exclusively. An example of such a first genera
tion design is a 5-W, X-Band module used for a
phased-array application [1,2], of which more than
2500 made by our firm. The typical CW perform-
ance in the 9.2-10.2 GHz band was +373 dBm
Pout, 33.2% Eadd, and 14.3 dB gain,
For the past two years, it has been practical to
produce second generation modules with improve-
‘ments in performance (particularly Eadd) and low-
ered costs, using an MMIC as a single-ended driver
followed by a balanced power stage using a pair of
discrete GaAs FETs. This is the design used for this
module (Figure 1). Future third-generation designs
most likely will be built entirely around MMICs.
‘The schematic diagram of the 10 watt module
using an MMIC as a single ended driver, followed
by a balanced power stage using a pair of discrete
GaAs FETs is shown in Figure 1. The off-chip
matching circuits and couplers are thin film micros-
trip lines printed on alumina or barium titanate
substrates
6W, 12mm FET
434 x
Bm
18 Gain
13 dB Gain
‘765 mA current
292 mA
0548
0 30
Loss dom
Figure 1. Schematic diagram of the amplifier module.
The driver is a two stage MBE monolithic power
amplifier chip [3]. The MMIC consists of a 2.2mm
FET driving a 5.76mm FET. The monolithicuses full interstage matching, partial matching at
the input, and no matching at the output. When
matched to 50 ohms at the input and the output
using off-chip circuitry, the MMIC provides +335
dBm Pout, 33% Eadd and 14.5 dB gain across the
9,0-10.0 GHz band in class AB operation, The chip
is very compact at 2.057mm x 1.778mm x 0.076mm,
accommodating a good yield of chips per wafer.
Figure 2 is a photograph of the MMIC die.
The small chip size of the driver stage affords
good wafer yields for the MMIC.
Figure 2. Photograph of the two stage MBE power ampli-
fier chip.
The 12mm power GaAs FET uses the H-L-H
doping profile (Figure 3). The geometry incorpo-
rates 120 fingers, each 100 microns wide and 0.35
microns long. The structure has 12 cells, each cell
consisting of a group of 10 fingers. Source pad via-
hole grounding is used to reduce the source-to-
ground inductance. The chip is 2.413mm x 0.457mm
x 0.076mm.
Figure 3. The 12mm power GaAs FET chip.
66 APPLE MICROWAVE Summer 1992
Module Performance
With X Band FETs for which the gain and the
breakdown voltage are relatively high, the optimal
Eadd is obtained in Class AB amplifier operation at
Vas =9.0 V and Tdsq=ldss/5. The Pout delivered
by this device at 10.2 GHz is typically +38.0 dBm
with an Eadd of 41%, for an input power of +30.7
dBm. The best performance measured has been a
Pout of +38.5 dBm, and Eadd of 50 %. This corre-
sponds to a power density of 590: mW/mm. The
power and gain results reported in this paper were
not de-embedded to correct for test fixture losses,
and were measured under CW operation
For measurement accuracy, the low impedance
of the power chip was determined by measuring
a smaller area scale model of the FET.
Device Characterization and Modeling
To obtain accurate device models, the power
FET must be characterized using both large-signal,
non-linear and small-signal linear methods. To ob-
tain better accuracy in our measurements, a small
FET with dimensions a known fraction of those of
the large FET is used for modeling. For small-sig-
nal information, standard S-parameter measur
ments were performed on a 1.8mm PET. For large-
signal characterization, a load-source pull system
using fully-automatic coaxial tuners, switches, and
an HP 8510 network analyzer was used. From these
measurements a simplified unilateral broadband
equivalent circuit was derived for the 1.8mm device.
‘The equivalent one-port model for the 12mm de-
vice was calculated using lincar sealing transforma-
tions from the 1.8mm FET. The equivalent circuit
and the impedance ratios are shown in Figure 4.
Input Output
Gq = 0.91 pFimm
Coup = 0.22 pFimm
Ry =43Q+mm Roy: = 50.4.2 mm
Figure 4. Simplified equivalent circuit for the 12mm pow-
er FET at VDS =9.0 V, biased for class AB operation.